MIL-STD-1576 (USAF) 31 JULY 1984 MILITARY STANDARD ELECTROEXPLOSIVE SUBSYSTEM SAFETY REQUIREMENTS AND TEST METHODS FOR SPACE SYSTEMS NO DELIVERABLE DATA REQUIRED BY THIS DOCUMENT AREA SAFTMIL-STD-1576 (USAF) 31 July 1984 DEPARTMENT OF THE AIR FORCE Washington, D C 20330 Electroexplosive Subsystems Safety Requirements and Test Methods for Space Systems MIL-STD-1576 (USAF). 1, This Military Standard is approved for use by the Department of the Air Force, and is available for use by all Departwents aud Agencies of the Department of Defence. 2 Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Hq SD/ALM, Box 92960, Los Angeles, CA 90009 by using the self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by Lecter. iiMIL-STD-1576 (USAF) 31 July 1984 FOREWORD This Standard establishes the general requirements and test methods for the design and development of electroexplosive subsystems to preclude hazards from unintentional initiation and from failure to fire. These requirements apply to all subsystems utilizing electrically initiated explosive or pyrotechnic components. This Standard applies Lo all space vehicle systems (e7 » launch vehicles, upper stages, boosters, payloads, and related systens)+ iiiMIL-STD-1576 (USAF) 31 July 198% THIS PAGE LEFT BLANK INTENTIONALLYMIL-STD-1576 (USAF) 31 July 1984 ‘conTENTS Page ea 1 Pops tne esi ena 1 TestiHethoda ds Hine aa Mant sien aetna ewe Meee 1 Revision of Test Methods... 2... + eee eee 1 De a ee a aaa aa 1 Minimum Requiremcutos] ots cg ng 2 REFERENCED DOCUMENTS. . ee ee ee ee ee eee 3 a ae 3 Other Publications) sais nieve eno tice e ee eta DEFINITIONS stietietisite st stet cd tenants cat Terms used s+ 2 eee eee eats ete ‘Acw/Disucw (A/D) Device se eae ee ee eine ne een ee Bridessiee ttt enti is Catastrophic Hazard. ee ee ee ee ee ee Conductive Mix... eee eee . Conductive Mix EED. see eee eet eee Critical Warardscm sae cde seet chat eee ca attra Dudding hie etter ee ieee een tt et anieas Electroexplosive Device (FED)... +e ee eee Electroexplosive Subsystem (EES). ss ee eee eee Electromagnetic Environment . fee ae Exploding Bridgewire (EBW) Device ss + sss ++ Exploding Foil Device... ee ee eee ee eee Explosive Train (Explosive Transfer Assembly) + + Fee ee ee ee att Firing Control Circuit. - +--+ ++ eae Firing Output Circuit...) eee ee eee iring G0urce @ ig Firing Source Circuit... 00.022 ee ee ose Vehicles eee ee eee ee Isolation Filter/Isolation Filter Connection 2 0 OO OO ONS Radio Frequency (RF)s eee ee ee eee es 10 Maximum No-Fire Level... 5 + ee ee ee ee eee 10 Minimum All-Fire Levels «sess eee eee eee 10 Mentece(otecuceliciisiann tsi atcistet si tient at cl] io NASA Standard Initiator (NSE). ee 10 Non-Standard Parts, Materials, and Processes... .. 10 Opcieat Coverspen 0 te: 0 Baylond ee es Cl Productionio 2 ee ee 10 Rocoribends te ae eo Safety Critical Function. +s sss sere reese 10 Safe aud Arm (86A) Device se ee eee patel Olas ieee ene ea ocean Pitt Safe/Arm Plug... ee ee eee ee ee eee eee OUMIL~STD-1576 (USAF) 31 July 1984 CONTENTS (Continued) Page 3.1.35 Satery Device 311.36 Servicetriees | 8 og 0 ee it 3.1637 Single Point Ground». ++ ser eee eee rece Ul 3.1.38 eolia cratejmeiayis oe eee eee 3.1.39 Standard Parts, Materials, and Procedures. +++ ++ UL 311240 Static Bleed Resistor... e+ eee eee ee eee 1D 3.1.41 Suicches and Malays eh C0 Celene SLU GG“ fal Gora Oeste UL 4.2 Eaule Colermnced 0 42d General Requirements) +--+ eee ee eee ee ee 2B 4.2.2 taplencarecion yt 4.203 Extent of Applicability sss seer rece cess 43 Bona ls oo Electroexplosive Subsystems Electromagnetic Compatibility (EMC)... eee eee ee eee ee eee 1S bed Inadvertent Activation. «s+ ee ee eee eee ee 1S 442 Direct Coupling to the FED and EES... ....... 15 45 system Effectiveness Requirements... ++ ++++-++++ 16 4.5.1 Parts, Materials, and Processes (PMP)... +++ ++ 16 4.5.2 Program PMP Selection List... ++ +++++ee++ 16 42523 Program PMP Approval... eee eee eee eee ee 16 4.5.4 Non-Standard PMP Approval». ++ eee eee ees 16 4.5.5 te ela 4.5.6 Raliebilicy | Ges oe 4.5.7 Materials Compatibility... 2.22 eee ee eee 17 4.5.8 fuseneeccors ee ee 46 Tecomblity CU 5.0 DETAIL DESIGN CRITERIA. eee eee ee eee eee ees 1D 5a Power Source ss se ee ee ee eee ee ee 1D 5.2 eeieide ee Cl 533 Shielding Gaps. 1 ee ee ee ee ee sO 5.4 Cale CU 5.5 Insulation Resistance... ee ee ee ee ee 20 5.6 Post Firing Short-Circuit Protection. +++ +++ +++ 20 5.7 Firing Circuito, ss ese ete e se ee ete eee 20 5.741 Wiring 0 5.7.2 Electrical Isolation... 6 ee eee eee eee OL 5.7.3 Physical Separation» + +++ eceee ese e eee 2b 5i7k Electrostatic Protection. ss. eee eee eee OE 5.7.5 Monitor Circuits. see eee ee ee eee ee OL 5.706 Control Circuits... 2 ee ee eee eee eee oD 5.8 Gonmectors ss ese ee eee ee ee eee teens BR 528.1 Tee el 5.8.2 Pin Assignnents sv vee reer ee eee eee 2MIL-STD=1576 (USAF) 31 July 1984 CONTENTS (Continued) Paragraph Page 5.8.3 fecking 22 5.8.4 Misting 5.8.5 Separate Connectors ss see ee ee tee ee es 22 5.9 Firing Switches and Relays... eee eee eee eee 22 5.10 Mechanical Requirements. +++ ee eee rere ree 23 5.10.1 Une 5.10.2 Mechanical Integritys ss eee eee eee eee ee 23 sm Electroexplosive Device Electrical Design Requirements .. 23 5.1L lige Bridgewixes@tet a eee easier reee et 23 S111 No-Fire Sensitivity 2... 6. see eee ee 23 5eMLe1.2 Minimum All-Fire Current s+ eee ee eee) 2B Sus Capacitor Discharge Firing... 2... ee. 0 23 5.11.2 Carbon Bridge FEDS. ©. + eee eee eee ees 2B 5213 Conductive Mix FEDS... ee ee eee ee 28 5.11.4 ‘Temperature Endurance oe 2 5.12 Safe and Arm (S6A) and Arn/Disarm (A/D) Devices»... . 26 5.12.1 Electrically Actuated». eee eee eee eee ee 2% Suz Gyelicitee oe 5.12.1.2 RF Susceptibility... +s eee eee eee ee 5e12.13 Electrical Arming and Sating Time... ..... 24 5.12.14 Electrical Contacts. ++ e+ ee ee eee ee 2H 5.12.2 Mechanically Actuated 86A2.- 1. ee ee eee eee 2S 5012.3 Safety Provisions... eee eee eee eee 2S 5.12.3.1 Safe and Arm (S6A) Safety Provisions»... +. 25 5.12.32 Arn/Disarm (A/D) Safety Provisions... ++ ++ 26 S112 Safe and Arm (S6A) Lock/Safing Pin... +... + +. 26 5.12.5 Safe and Arm Safing Pin Streamer... +. +++ +++ 26 5.12.6 Status Indication... sees eee eee ees 26 5.1267 Safe and Arm Simulator Resistore- --- +--+ +: 2 5.12.8 Safe and Arm (S&A) Components... . 2.2... +4. 27 5.412.801 eee ees ct ete eee ate etter et 2d; 5212:8.2 Safe & Arm Rotor Leads... ee ee ee ee OT 5.13 Safe and Arm Plug Devices... ++ ee eee ees 27 5.14 Environmental Requirements... 2. +. eee eee 28 5.15 Hernetic Sealing . see eee eee eee e eee e 28 5.16 Ce 6.0 QUALITY ASSURANCE PROVISIONS... es eee eee eee eee 29 6.1 plicable teste) cot te ee 29. 6.2 Responsibility for Tests and Inspections. ++ +++ +++ 29 63 Mescisequencea ce eet 20 6.4 Classification of Inspection.» + +++ eee eee eee 29 6.5 Hazard Classification Testa... eee ee ee ee ee 8 6.6 Safety Reliability Demonstrations... - ++ +e esse 29 6.7 Qualification Inspections and Tests... +++ +++ +++ 29 6.761 Requalification Testing + see +e eee ee eee s 30 6:8 Lot Acceptance Sampling, Inspections and Tests... .. + 30MIL-STD-1576 (USAF) 31 July 1984 CONTENTS (Cont inued) Paragraph Page 6.841 Electroexplosive Devices) +e eee ee ee ees 30 6.8.2 Safe and Arm Devices.» 2... eee eee eee 30 6.8.3 Arm/Disarm Devices. ee eee eee eee eee 30 6.8.4 Electroexplosive Subsystems»... ee eee ee 30 6.8.5 Service Lifeltacces( ces) cfc cs cf ses cay ses 20 6.9 Systems Effectiveness... ee eee eee eee eee 30 6.961 Parts, Materials, and Processes (PMP) Contrvls. . . + 30 6.9.2 Parte, Materials, and Processes (PHP) Qualification. 31 6.10 Electromagnetic Compatibility (EMC) Verification... .. 31 6. Documentations eta ese ri APPENDIX Page 10. CEN eet Aa! 10-1 Scopes og ge ct 10.2 Overview and Application» sss eee ee eee ees Aad 20. REFERENCE DOCUMENT. © eee ee ee AD 30. Deer 40. GENERAL DESCRIPTION © oe ee AD 40.1 licse(Computers(¢ ese ae forte Besertpeion, | 2 a 40.1.2 Power-Up Procedures se eee eee eee ee eee AD 40.2 EEDAT Program Protocol». sss sec ceeeee e AnD 10.2.1 a ey LN A Te aa An? 40.2.2 Waerleeponsena cece ee ae 40.2.3 Baca eiteee es ee 40.2.3.1 Deraule Folens 6 oo ee 40.2.3.2 User Defined Files ss eee eee ee ee ee AD 40.2.4 EEFOr ROCOVELY. ee ee ANS 50. DETAILED DESCRIPTION 1 eee ee eee ee ee ee ee AS 50.1 Program Exec .cive. oe ee ee ee AD 50.2 Electromagnetic Environment Input. s+ ee ee ee ee es ATS 50-241 Option (1): USE DEFAULT FILE se ee ad 50.2141 Option La: INDIVIDUAL SOURCES»... 2... + AMS 50.2.1.2 Option 1b: SEPCTRUM SPECIFICATION... 2... a6 50.26163 Option le: MIL-STD-1512 DEFAULT LEVEL... + A~7 50.2.1.4 Option 1d: RETURN TO MAIN MENU. . 2... ee ACT 50.2.2 Option (2): USE EXISTING FILE... . . eae 50.2.3 Option (3): CREATE NEW FILE. 2 2a?MIL-STD-1576 (USAF) 31 July 1984 APPENDIX (Continued) Page 50.3 Select and Run Analysis Model... ee eee ee ee ee AB 50.3.1 Data Requirements se ee ee AB 50.3.161 wtpnt Data File Selection «2 2 2 2 2 ee ee AB 50.3.1.2 Analysis Model Selection and Spectrum... 4... A-B 50.3.1.3 EED RF Sensitivity Data. ++ se ee ee ee AD 50.31.31 Default or New EED Sensitivity Data... . A-9 50.3-1e3eed Option 3a: CONSTANT SENSITIVITY . . . 9 5003.163.1.2 Option 3b: SENSITIVITY SPECTRUM SPECIFICATION. «ee eee ee ee ee AD 50.34163.163 Option 3c: NSI-1's RF SENSITIVITY . . 4-10 50.3.1.3.2 Proviously Entered EED Sensitivity Data . - A-10 50.3.1.4 Shielding Data File... 2... 2... e +++ An10 50.3.1.4.1 Previously Entered Shield Data... . ++ A-10 50.3/1.4.2 Default or New Shield Data... ~~... Arl0 50.3165 Impedance Data File... ee eee ee eee ee AO 30.3.146 Geometry of Connecting Leads...) see ee ATLL 50.3.2 Model Execution... eee ee eee ee ee ee Add 50.4 Output Format Processor...) 2. ee ee ee ee ee ee AML 60. POWER EQUATIONS «os es eet eee tee ee eee tees Ald 60.1 Case 1: Pin-to-Pin, Continuous Incident Spectrum... ~~~. AnI2 60.2 Case 2: Pin-to-Pin, Discrete Incident Spectrum... «+++ + Anl4 60:3 Cane: 32) Pinater canes taints: resists ualtn sy oc] ges cy AeTG) 70. ProchaMictstines oii eiu ie ete eect steel sier SitAShs) 70:1 Program Listing for EED ANALYSIS PROGRAM. ©... 2... AW1S 70.2 Program Listing for FENTER ee eee ee ee ee ACME 70.3 Program Listing for FRANK2. 6... eee ee ee eee AMZL 70.4 Program Listing for LPLOTS . see ee eee ee ee ee + AMO 80. EXAMPLES OF OUTPUT. © 6. ee eee eee ee ee ee AB 30.1 Case 1: Pin-to-Pin Mode ss bbb eee te ee AS 80.2 Case 2: Pin-to-Pin Mode se ee ee ee ee AB 80.3 Case 3: Pin-to~Case Modo. =. 1 ee ee ANB FIGURES Number Title Page Typical Firing Circuit Diagrams... eee eee ee 9 Cross-Reference of FED Requirements to Quality Assurance Provisions... +++. eee ee ee 33 2205-1 Static Discharge Test Circuit... +e eee ee ee 2205-1Number Ber he Number II TIA qr ILIA wv VE vit VIIT ALLi-1, 2207-1, 2208-1 A-2 a3 MIL-STD-1576 (USAF) 31 July 1986 FIGURES (Continued) Title Overall Flow Chart. ++ e+e e ee ee Antenna Directivitys ss. eee ee ee ee Sample Output - Pin-to-Pin Modes + + + + Sample Output ~ Pin-to-Pin Discrete Spectrum Sample Output - Pin-to-Case Mode... + ‘TABLES Title EED Lot Acceptance Non-Destructive Tests BED Qualification Testing -..++ + + Lot Sample Allocation For Firing Tests . EED Acceptance Testing». +++ +++ + Lot Sample Allocation F emperature iring | fest ttt eet EED Accelerated Aging Teot +... ss EED Surveillance Test - 2-2-2. + + Safe & Arm Device Qualification .... Safe & Arm Devices Acceptance .. - Safe & Arm Device Rotor Lead Acceptance Testing Helium Bombing... esse eee eee Default Test Frequencies and Modulations « « Two Tailed Value of T for 5% Probability . Sample Output - Pin-to-Pin Mode. . . Sample Output - Pin-to-Pin Discrete Spectrum . . Sample Output - Pin-to~Case Mode... . +--+ + Page At ani 4-39 AMG Anh, Page 36 37 38 40 42 43 44 45 45 wut 2207-2 2208-3 4-40. A483. A~45Group 1000: non 1102 1103 LiL 1404 Group 2000: 2ui7 2201 2203 2204 2205 2207 2208 2402 2405 2406 2407 2410 241L Group 3000: 313 3114 3401 3403 3407 3408 3a09 Group 4000: 4303 MIL-STD-1576 (USAF) 31 July 1984 ‘TEST METHODS Non-Destructive Test Methods Visual Inspection... eee eee ee Dinenalonalte eet cH teeta oatie X-Ray Radiographic Inspection... . « Teak Test ee Neutron Radiographic Inspection. . . + Electrical/Ordnance Device Test Methods Insulation Resistance... .-... Bridgewire Resistance. +++ +++ ++ Direct Current Sensitivity... 0... Radio Frequency (RF) Impedance. » + + static Discharge Sensitivity... . . . Kadio Frequency (RF) Sensitivity. «+ + Radio Frequency (RF) Dudding Evaluation No-Fire Verification.» +--+ +++ + Firing Test (EED) 2... ee ee eee S&A Device Bench Testing. «. +++ + + Safe and Arm Device Firing Test... « Darrieritest sede tee S&A Rotor Lead Firing Test... 2. ss Environmental Test Methods Random Vibration... see eee eee Pee ee ree eee eeren ea High Temperature Exposure... 2. ss High Temperature Storage (Accelerated Life) « Temperature Cycling. s+ se eevee Twenty Foot Drop Test se eet eee SieiPootibropiese ts gi ceen a state Analytical Evaluation Worst-Case Electromagnetic Hazard Analysis. «MIL~STD-1576 (USAF) 31 July 1984 THIS PAGE LEFT BLANK INTENTIONALLYMIL-STD-1576 (USAF) 31 July 198% 1.1 Purpose The purpose of this document is to insure the safety of personnel, Taunch site tacilities, and space vehicles from the hazards resulting from electroexplosive subsystem unintentional initiation or failure fo fire. The requirements and test methods contained in this ducument are aut intended to insure all electroexplosive subsystem performance requirements except in those cases where failure to perform would create a hazard to the items listed above. The electroexplosive subsystem is composed of all components from the power source to, and including, the EED (electroexplosive device); Safe and Arm devices, Arm/Disarm switches, relays and all electrical wiring used to monitor, control, arm and fire ordnance are specifically included. This Standard applies to all space vehicle systems (e.g., launch vehicles, upper stages, boosters, payloads, and related systems using EEDs). 1,2 Test Methods. The test methods described herein have been prepared to: a. Specify laboratory test conditions for electroexplosive subsystems and components which will produce test results that are equivalent to those which would be experienced in the actual operational environ- ment and which will permit reproducibility of test results. b. Describe all test methods for clectrocxplosive subsystems and components needed to ensure compliance with the requirements of the specification. Provide Test Method 2208 as a Standard method for RF dudding evaluation if required by the procuring activity. 1.2.1 Revision of Test Methods. Revisions of each test method shall be indicated by a revision number following the method number. For example, the first revision of Test Method 1101 would be 1101-1, the second revision would be 1101.2, et cetera. 1.3. Application. This Standard is applicable to the entire electroexplosive subsystem life cycle, up to the time when the electroexplosive subsystem no longer presents a hazard to personnel, launch sice facilities and manned or reusable pace systems. Thic Standard aleo applies to expendable Launch vehicles which present these types of hazards. a. This Standard is intended to be used by procuring activities for establishing all of the electroexpiosive subsystem safety requirements to be included in specifications for the design and development of new hardware for new or old space systems. bs This Standard is intended co be used by procuring activities and government safety organization for a eafety evaluation of previously uged hardware on new space systems as well as for a safety evaluation of new hardware on new or old space systems.MIL~STD-1576 (USAF) 31 July 1984 cs This Standard is not intended to be used by procuring activities for establishing all of the performance (as opposed to safety) requirements to be included in specifications for the design and development of new ordnance system hardware tor new or old space systeus, but it can be used ty establish many electroexplosive subsystem performance requirements. This Standard docs not address elements of explosive trains which exist beyond an EED, except for S6A configurations. d. This Standard is intended to be used by space system procuring activities in lieu of MIL~STD-1512, "Electroexplosive Subsystems, Electrically Initiated, Design Requirements and Test Methods." MIL-STD-1512 contains requirements applicable to non-space systems, such as aircraft weaponry, and hay not been superceded by this Standard. 1.4 Minimum requirements. When the scope and magnitude of a program does not warrant imposition of all the requirements specified herein, the procuring activity shall obtain approval from the appropriate government safety organization(s) and shall specify to the contractor the minimum acceptable program requirements.MIL-STD-1576 (USAF) 31 July 1984 2.0 REFERENCED DOCUMENTS 2.1 Lssues of Documents. ‘The following documents in effect on the date of invitation for bids or request for proposal form a part of this Standard to the extent opecified herein (parenthetical references are tu the Leat where the document is implemented): SPECIFICATIONS Federal QQ-B-575, Braid, Wire, (Copper, Tin-coated, or Silver Coated, Tubular, or Flat) (5.2) litary DOD-E-8983 Electronic Equipment, Aerospace, Extended Space Environment, General Specification For i138, 4.541, 6.962, 669-2) bon-8-83578 Explosive Ordnance for Space Vehicles, General Specification For (3.1.38, 4.5.1, 6.9.1, 6.9.2) STANDARDS Federal FED-STD-228 Cable and Wire, Insulated; Methods of Testing (5.2) FED-STD-595 Colors (5.12.6) Mili MIL~STO-202 Test Methods for Electronic and Electrical Component Parts (Method 1111) MIL~STD~410 Nondestructive Testing Personnel Qualification and Certification (Eddy Current, Liquid Penetrant, Magnetic Particle, Radiographic and Ultrasonic) (Method 1404). MIL-S1D~453 Inspection, Radiographic (Method 1103) MIL-STD-1167 Ammunition Data Gard (4.6) MIL~STD-1168 Lot Numbering of Ammunition (4.6)MIL-STD-1576 (USAF) 31 July 1984 MIL~STD-1512 Electroexplosive Subsystems, Electrically Initiated, Design Requirements and Test Methods (1.3.d, Appendix 50.2.1, 50.2.1.3) MIL-STD-1546 Parts, Materials, and Processes Standardization, Control and Management Program for Spacecraft and Launch Vehicles (3.1.38, 4.561, 4.543, 4.544, 6.901, 6.942) MIL-STD-1547 Technical Requirements for Parts, Materials, and Processes for Spacecraft and Launch Vehicles (6.8.3) PUBLICATIONS DoD 5154.48 Ammunition and Explosive Safety Standards (6.5) DOD ADL~TD-3 DOD Authorized Data List (6.11) APTO 11A-1-47 Explosive Hazard Classification Procedures (6.5) (Copies of specifications, standards, drawings, and publications required by contractors in connection with specific procurement functions should be obtained from the contracting activity or as directed by the contracting officer). 2.2 Other Publications. The following documents form a part of this standard to the extent specified herein. linless otherwise indicated, the issue in effect on date of invitation for bids or request for proposal shall apply. AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM) ASTM 5-545 Determining Image Quality in Thermal Neutron Radiographic Testing (Method 1404) SNT-TC-1 Personnel Qualification and Certification in Nondestructive Testing (Method 1404) (application for copies of ASTM publications should be addressed to the Anerican Society for Testing and Materials, 1916 Race Street, Philadelphia, Pennsylvania 19103). M-c2210-1 Monograph on Computation of RF Hazards, Monograph M-C2210-1, Franklin Research Center (Method 4303, Appendix 20.) (Application for copies of this publication should be addressed to the Franklin Research Center, 20th Street and Race, Philadelphia, Pennsylvania 19103)MIL-STD-1576 (USAF) AMP 101-1, SRC-P No. 40 31 July 1984 W. J. Dixon and F. J, Massey, “Introduction to Statistical Analysis," McGraw-Hill, N.Y.) N.¥., 1957. (Method 2203) (Reference Only) "Statistical Analysis for a New Procedure in Sensitivity Experiments," Bruceton Laboratory, Princeton New Jersey, July 1944 (Method 2263) (Reference Only) W.J. Dixon and A. M. Mood, "A Method for Obtaining and Analyzing Sensitivity Data, Journal of American Statistical Association, March, 1948. (Method 2203) (Reference Only) Technical society and technical association specifications and standards are generally available for reference from libraries. They are also discribuced anong technical groups and using Federal agencies.MIL=S7D-1576 (USAF) 31 July 1984 THIS PAGE LEFT BLANK INTENTIONALLYMIL-STD-1576 (USAF) SL July 1984 3.0 DEFINITIONS J. Lerms used, ‘The following are derinitions of terms as used in this Standard: 4.11 Arm/pisarm (A/D) Dei An Arm and Disarm Device is an electrically or mechanically a¢tuated switch which can make or break one or more electro- explosive tiring circuits. A/D devices do not physically interrupt the explosive train. 3.1.2 Arm Plug. A plug that makes the tiring circuit continuous when inserted in a connector. S:Le5 Bridgevire. A bridgewire is defined as a resistance element within the electroexplosive device which is the final electrical element at the electrical/explosive interface. 3.1.4 Catastrophic Hazard. A catastrophic hazard 1s a hazard that has the potential for personnel fatality, loss of launch site tacilities, or loss of reusable or manned launch vehicles. This definition also applies to expendable Launcn venicles which present these types of hazards. 3.1,5 Conductive Mix. A conductive mix refers to the thermal conductivity of the prime mix of an feb. Prime mixes with high thermal conductivity are used co conduct heat avay from a bridyewire to permit higher no fire current levels. See paragraph 3.1.0. Js1.6 Conductive Mix BED. A conductive mix EED is one that does not use a bridgewire ot any type. The Firing power flows through the mix itself and heats the mix directly for firing. 3.1.7 Critical Hazard. A critical nazard is a hazard that has the potential for personnel injury, damage to launch site facilities, or damage to reusable or manned Launch vehicles. this definition also applies to expendable launch venicles which present these types of hazards. 3.1.8 Dudding. Dudding is the process of permanently degrading an electro explosive device to a state where it cannot perform its designed function. 4.1.9 Electroexplosive Device (bED). The electroexplosive device is the first device in an explosive train which is designed to transtorm an electrical input into an explosive reaction. Detonators, electrical matches, squids, Exploding bridge Wire (EbWs) devices, and electrical initiators are examples ot EEDs.MIL=STD-1576 (USAF) 31 July 1984 3.1.10 Electroexplosive Subsystem (EES). The term electroexplosive subsystem is intended to include all components from the power source to, and including, the EED. Safe & Arm devices, Arm/Disarm switches, relays and all electrical wiring used co monitor, arm and fire ordnance functions are specifically included. 3.1.11 Electromagnetic Environment. Electromagnetic environment is defined ert =Ss—=—=S—”=i‘—e™OOCOCzsCSCds«CCSCSsCsCs«SCis explosive subsystem will be subjected. 3.1.12 Exploding Bridgewire (£8W) Device. an exploding bridgewire device is defined as an electroexplosive device in which the bridgewire is designed to be exploded (disintegrated) by a high energy electrical discharge which in turn causes the explosive charge to react. 3.1.13 Exploding Foil Device. An exploding foil initiator shall be considered to have the same functional characteristics and requirements as the exploding bridgewire device except that the exploding foil accelerates a disc which strikes and shock-initiates the explosive mix. 3.1.14 Explosive Train (Explosive Transfer Assembly). An arrangement of a series of explosive or combustible elements used to perform or transfer energy to perform an end function. When an explosive train is used to transfer energy from one point to an end function it may be called an “explosive transter assembly". 3.1.15 Firing Circuit. A firing circuit is composed of the firing source circuit, the firing output circuit, the Firing control circuit and the monitor circuit. (See Typical Firing Circuit Diagram, Figure 1). 3.1.16 Firing Control Circuit. A firing control circuit is defined as that part of the electroexplosive subsystem which actuates the arming and firing devices. (See Typical Firing Circuit Diagram, Figure 1). 3.1.17 Firing Output Circuit. A firing output circuit is defined as that part of the firing circuit between the EED and the switching device which causes the EED to fire. (See Typical Firing Circuit Diagram, Figure 1). 3.1.18 Firing Source. A firing source is defined as the junction in the electrical system which provides energy to EED loads exclusively. This source is typically a dedicated ordnance bus. (See Typical Firing Circuit Diagram, Figure 1). 3.1.19 Firing Source Circuit. A firing source circuit is defined as that part of the firing circuit from the firing source to the firing output circuit. (See Typical Firing Circuit Diagram, Figure 1). 3.1.20 Host Vehicle. Space systems consist of host vehic’2s and payloads, in other words, carriers and the items to be carried. For example, the first stage of a launch vehicle is the host vehicle for the second stage; the second stage of a launch vehicle is the host vehicle for the third stage; etc.MIL=STD=1576 (USAF) 31 July 1984 suo12aNNoa (soma) yoy iytose suino¥19 SLIN9YI9 TOXNOD ONTYTS —-YOLINOW — AN1Od volozwmog N7LYT0ST anno : WaiSAS a i swisisza! : 203378 W151 ayy a \ 4 s¥3L114 NoLLv10sI 7 hay wey “34d i 2 — sousisas ol s10i4 1 auetd sacns outta idan r ' Ocoee eee ee ea Lanoata Arainoanruts ——-pfe——— Linoat9 008 ont ree LINDYTD NITE (waLsAsens 3N1S074x3 0¥19373 OJ INICd NOILNETYASI0) 304N0S ONTYIS Figure 1 TYPICAL FIRING CIRCUIT DIAGRAM This is a typical circuit for purposes of illustration of NOTE the various parts of the electroexplosive subsystem and is not intended as a required design.MIL-9TD-1576 (USAF) 31 July 1984 3.1.21 Isolation Filter/Isolation Filter Connection, Radio Frequency (RF). a. Isolation Device: Any device which prevents conduction of electro- magnetic energy into a shiclded system. Selection of isolators take into consideration the variation in source and load impedances with frequency and physical placement of the isolator in the system. b. Absorbtive Device: A type of isolation device that precludes propagation of electromagnetic energy through the device. The minimum isolation provided by such a device is independent of the source and load impedance for the device. A conventional filter vr other device can be used as an absorbtive isolator provided that the rated minimum isolation is independent of source and load impedances. 3.1,22 Maximum No-Fire Level. Maximum no-fire level is defined as the maximum DC or RF level at which an electroexplosive device shall not fire with a probability of .999 at a confidence level of 95 percent as determined by Test Method 2203 (Bruveton Lesting). 3.1.23 Minimum AlI-Fire Level all-fire is defined as the least DC current which causes initiation with a probability of .999 at a confidence level of 95 percent as determined by Test Method 2203 (Bruceton testing). Minim 3.1.24 Monitor Circuit. A monitor circuit is detined as that part of the electroexplosive subsystem which indicates the status of the firing circuirs. (See Typical Firing Circuit Diagram, Figure 1). 3.1.25 NASA Standard Initiator (NST) An EED approved or supplied by NASA with the part number SEB 26100001. 3.1.26 Non~Standard Parts, Materials and Processes. A part, material, or process other than program standard parts, materials, and processes as defined in 3.1.38. 3.1.27 Optical Coverage. Optical coverage is the percentage of the surface area of the cable core insulation covered by a shield. 3.1.28 Payload. Any item which is carried upon a host vehicle which is not an integral parc of the host venicie. 3.1.29 Production Lot. A group of assemblies or devices of a single type and ze fabricated at one place in a continuous manufacturing process using the same tooling and the same material batches. 3.1.30 Rotor Lead. An explosive component used in some S&A designs to transfer detonation from the KEV to the next explosive charge in the train. 3.1.31 Safety Critical Function. A safety critical function is any function performed or supported by the electroexplosive subsystem which can cause a critical or catastrophic hazard either by inadvertent firing or failure to fire. -10-MIL-STD-1576 (USAF) 31 July 1984 3.1.32 Safe and Arm ($ & A) Device. ‘These devices provide for a) mechanical interruption (safe) or alignment (arm) of the explosive train, b) electrical interruption (safe) or connections (arm) of the firing circuit, and c) shorting and grounding of the EED leads in the safe mode. 3.1.33 Safe Plug. A plug that shorts EED pins together and connects to ground through a resistor which provides electromagnetic and electrostatic Protection as appropriate. Safe plugs, by definition, are used in conjunction with Arm Plugs. 3.1.34 Safe/Arm Plug. Safe/Arm plug is a single plug which when installed is intended as an Arm Plug and when removed, built-in features of the firing circuit perform the same function as a Safe Plug. 3.1.35 Safety Device. A safety device is a device which by interruption of the firing circuits or explosive train is intended to prevent the inadvertent ignition of any explosive device prior to its intended operation. The following are safety devices: safe and arm devices, safe/arm plugs, arm/ disarm devices, switches and relays. 3.1.36 Service Life. The service life of an explosive component begins with the successful completion of acceptance testing and extends through its final usage or disposal. 3.1.37. Single Point Ground. single point ground is a feature of a power distribution network wherein each conductively isolated segment (i.e., transformer-coupled or supplied from a separate source) of the distribution network has only one physical connection to ground. A 10k ohm or greater resistor placed between a circuit segment and ground does not violate the single point ground concept. 3.1.38 Solid State Relay. A semiconductor device with isolated input and vutput which operates by means of electronic components and without moving parte. Its primary function ie to open and close electrical cireuite in response to electrical controlling signals to effect the operation of other devices in the same or another electrical circuit. 3.1.39 Standard Parts, Materials and Processes. A program standard part, material, or process 1s one which Is completely defined by and meets the engineering requirements of this Standard or which is selected from: The parts as defined by MIL~STD-1546, or Parts, materials and processes certifiable to specifications listed in the general equipment specification DOD-E-8983 or ordnance specification DOD-£-83578, or An explicit list of parts, materials and processes identified in the contract as program standard parts, materials and processes. -u-MIL-STD-1576 (USAF) 31 July 1984 3.1.40 Static Bleed Resistor. Resistors which are placed between firing circuits and ground to prevent the build-up of static electricity on circuits. 3.1.41 Switches and Relays. These devices open or close circuits when acted upon by external stimuli such as electrical signal, physical force, material proximity, etc. These devices are normally contained in safety devices, but may be used independently for making or breaking (interrupting) the firing cireuit. Switches and relays may be electromechanical or solid state. aMIL-ST7D-1576 (USAF) 31 July 1984 4.0 GENERAL REQUIREMENTS 4.1 Coneral Design. Requirements peculiar to clectroexplosive subsystems are covered in this Standard. a, Those general requirements not peculiar to electrical components of electroexplosive subsystems shall be in accordance with applicable Standards as specified by the procuring activity. be Electroexplosive subsystems shall meet design requirements under specified environmental conditions. Environmental conditions are specified in either the individual design requirements or in test requirements. When designing to meet the environmental conditions in test requirements, one must consider not only a specific test method, but also the environmental conditioning the device receives due to the sequence in which test methods are accomplished. 4.2 Fault Tolerance. 4.2.1 General Requirements. The design of an electroexplosive subsystem performing a safety critical function (as defined in paragraph 3.1.31) shall tolerate a minimum number of credible failures or operator errors according to the following criteria: 4. If loss of function is safety critical or catastrophic, the design of the electroexplosive subsystem shall preclude single point failures and shall include at least two electroexplosive devices (EDs). b. If inadvertent firing is safety critical, the design of the electro explosive subsystem shall provide a condition such that no single failure or single operator error can cause a critical hazard aud uo combination of two failures or operator errors can cause a catastrophic hazard. 4.2.2 Implementation. This Standard shall be used to prepare requirements for inclusion in contract work statements. The contractor shall impose all requirements on his subcontractors, suppliers, and vendors to the extent of applicabilicy. a, Safety devices shall be used in each electroexplosive subsystem to provide an electrical interrupt between each EED and its firing b. Safety devices shall be designed to be reversible (i.e., from the arm to sate position) when performing safety critical functions. This requirement applies to devices that cau be activated prior to deployment from a manned vehicle, and in any situation in which danger to personnel and property exists. 13MIL-STD=1576 (USAF) 31 July 1984 S6A devices, or EBW firing umits as well as other devices intended to interrupt the explosive train, shall be used to prevent inadvertent Solid Rocket Motor ignition and destruct initiation. 4.2.3. Extent of Applicability. Each provision of this Standard shall be considered as applicable to each EED and subsystem. Requests for deviation, waiver, or supplementary requirements, shall be individually submitted to the procuring activity for approval. Where a requirement of this Standard would necessitate duplication wholly or in part, of valid design, analysis, test, or other such valid activity already specified by the procuring activity, those requirements, functions, and efforts shall be identified and utilized in demonstrating compliance with the respective requirements specified herein. Duplication is not required. The design and testing of electroexplosive subsystem elements which have been previously approved shall require an evaluation for each subsequent usage. This is of particular concern with respect to Previously approved EEDs (e.g, the NASA Standard Initiator) and S&A devices. Subsequent usage of previously approved devices shall require a comparison of the device's design and Lest specifications with thie Standard's design and test requirements. Thie comparicon Will yield three categories: Agreement between a design or test specification of the previously approved device with the corresponding Tequirement of this Standard, and documentation to that effect. 2. Disagreement between a design or test epccification of the previously approved device with the corresponding requirement of this Standard (e.g., the NSI does not meet the insulation resistance requirements of this Standard nor do all NSIs go through the complete acceptance test program in Table L11 or through the aging or surveillance test program of Tables IV or V). Additional testing (of each manufacturing lot) shall be conducted to comply with the Tequirements of this Standard or documentation of the procuring activity's unconditional approval of each deficient area is required prior to any subsequent us-ge. Comparisons which can only be made between the device's design and test specification and the procuring activity's design and test requirements for each application (e.g. the environmental testing of the NSI may not be suffic to demonstrate environmental survivability of the NSI in a particular application or the NSIs case material may not be compatible with its mating connector in a particular application). ocumentation that the intended application is within the design and test requirements of the previously approved device is required. 1sMIL-STD-1576 (USAF) 31 July 1984 4. Requirements herein, that are relative to unintentional initiation, shall be applicable to all electroexplosive subsystems, unless otherwise specified by che procuring activity. If inadvertent initiation is uot safety-critical in itself and would not require @ hazardous activity (e.g., vehicle demating) to be performed as a result of that inadvertent initiation, these requirements need not apply. Requirements herein that are relative to failure-to-fire shall be applicable only if the resulting non-function is safety critical, unless otherwise specified by the procuring activity. e. The design and test requirements imposed by this Standard are applicable for all low voltage hot bridgewire initiators, but are not gufficient for all types of initiators, e.g, Exploding Bridgewire (EBW) devices, Exploding Foil devices, Percussion Activated devices, etc. The procuring activity will tailor this Standard and impose additional requirements for the design, selection and test of these items. These items may be considered for use, but they shall not be selected for use without prior approval and direction from the procuring activity. £. Conflicts between this document and other direction in the contract shall be brought to the attention of the procuring agency for resolution. 4.3 Bonding. The DC bonding resistance between connection points of the shielded system, metallic enclosures, and structural ground shall be 2.5 milliohms or less. 4.4 Electroexplosive Subsystems Electromagnetic Compatibility (EMC). 4.4.1 Inadvertent Activation. a, The electroexplosive subsystem shall be designed to limit the power produced at each EED by the electromagnetic environment acting on the Subsystem Lu a level ai least 200B below the maximum pin-to-pin DC novfire power of the BED. b. The electroexplosive subsystem shall be designed to limit the power produced at each device in the firing circuit that can complete any portion of the firing circuit to a level at least 6dB below the minimum activation power for each of the safety devices. 4.4.2 Direct Coupling to the EED and EES. EED's shall not fire in either the pin-to-pin or the pin-to-case mode due to direct coupling of the specified electromagnetic environment into the EES. 15 -MIL-STD-1576 (USAF) 31 July 1984 4.5 System Effectiveness Requirements. 4.9.1 Parts, Materials, and Processes (PMP). All PMP for use in the manufacture of electroexplosive subsystems shall comply with the requirements and provisions of this Standard and shall come under the cognizance of the procuring activity to the extent specified herein. a, Ordnance PMP. All ordnance PMP used in electroexplosive subsystems shall comply with the requirements as specified herein. Ordnance PHP which is not explicitly controlled by this Standard shall comply with the requirements and provisions of DOD-E~83578 or the approved PMP contractual document. b. Non-Ordnance PMP. All non-ordnance PMP used in electroexplosive subsystems shall comply with the requirements of 1) this standard, 2) MIL-STD-1546 or the Approved PMP Contractual Document, or 3) pon-E-8983 in that order of precedence. 4.9.2 Program PMP Selection List. The contractor shall ensure that all PMP used in the electroexplosive subsystem are included in the program approved PMP selection list. When a program approved PMP list is not required by contract, the contractor shall maintain a List of PMP used in the electro~ explosive subsystem and this list shall be approved by the procuring activity. The approved PMP list shall distinguish between Program standard and non-standard PMP. Non-standard PMP shall be handled in accordance with paragraph 4.5.4. 4.5.9 Program PMP Approval. When it is determined by the designer that che design of the electroexploaive aubsyatem required by the contract cannot be accomplished with program approved PMP, the designer shall take action to have the required PMP added to the program approved list (See 4.5.2). Approval of newly identified items shall be obtained using guidelines controlled by and procedures specified in MIL-STD~1546 or as otherwise specified by the procuring activity. Requests for approval shall include engineering analysis and test reports demonstrating that the newly identified item has performance, reliability, and quality characteristics satisfactory for the intended application. Contractor-prepared specifications and specification changes for PMP shall be reviewed and approved per the requirements of MIL-STO-1546 or otherwise specified by the procuring activity. 4.9.4 Non-Standard PMP Approval. Non-standard PMP shall not be used unless approved per the procedures established by MIL-STD-1546, or as otherwise established by the procuring activity. eeMIL-STD=1576 (USAF) 31 July 1984 4.5.5 Life. a. The electroexplosive subsystem shall have sufficient service life to ensure reliable operation at the appropriate points in che mission timelines. The contractor shall identify age-sensitive parts and materials and submit a surveillance plan to the procuring activity for review and approval. This plan shall address periodic surveillance requirements of age-sensitive parts and materials for service life requirements. The expected EED service life shall be demonstrated in accordance with Table IV or Table V. 4.5.6 Reliability. The design reliability of the electrocxplosive subsystem shall be at least .999 (with 90 percent confidence hased on the chi-square statistic of the ratio of the variance of the sample lot to the population variance) for safety critical functions both for the condition where (a) failure-to-fire is a hazard, and (b) inadvertent firing is a hazard (see paragraph 6.6). Note: The use of solid state devices as series inhinits and their associated impact upon overall subsystem reliability will be evaluated by the procuring activity on a case-by-case hasis. 4.5.7 Materials Compatibility. All materials (metallic and non-metallic) inciuaing detonable, deflagratable, pyrogen, and propellant substances shall be compatible with each other and with the components, materials, and chemicals which they could contact. For continued exposure to the predicted environmental conditions, there shall be no degradation in performance oF increased sensitivity uhich may result in a hazard 4.5.8 Human Factors. The electroexplosive subsystem shall be designed to enhance functional performance and to minimize hazards to personnel involved in assembling, transporting, installing, removing, maintaining, and testing systems involving the use of electroexplosive devices. As 4 minimum, the design shall include, but nut be Limited to, the following requirements: a. Ensure all circuits are capable of being physically disconnected between the ordnance device and its power supply as close to the ordnance item as possible throughout all phases of ground operation. b. Ordnance items and associated circuitry shall be accessible to facilitate electrical checkout and final electrical connection as late as possible in the spacecraft or vehicle processing sequence. cs Safe and arm indications an § & A devices shall he visible in a completely assembled configuration. Safing pins shall be capable of installation into, and removal from, a completely assembled spacecraft or vehicle. -1-MIL-STD-1576 (USAF) 31 July 198% e. Ordnance circuits shall be capable of being manually safed during any phase of ground operation. f. If the $ & A is to undergo a cycling verification test during any phase of ground operations, there shall be a capability to access and disconnect the explosive train from the safe and arm device. 4.6 Traceability. In order to provide traceability of explosive components ftom maqutacture-chrough usage of disposal, numbering of components shall be per MIL-STD-1168 and documented per MIL-STD-1167. Equivalent numbering systems may be used if approved by the procuring activity. - 18 -5.1 5.2 MIL-STD-1576 (USAF) 31 July 1984 5.0 DETAIL DESIGN CRITERIA Power Source. a Separate and dedicated power distribution points shall be used for the electroexplosive subsystem firing sources. A firing source can share the same power source with other loads, but all currents flowing from the firing source point shall be for firing circuits only. If the host vehicle supplies power to the Firing Saurce Girenit, one of the following options shall be employed: 1) The return side of the Firing Source Circuit shall not be grounded on the payload side of the interface, and shall be Ysolated from payload structure by at least 10k ohms measured ac 1.5 times the bus voltage or greater, or equivalent isolation. 2) Isolation transformers shall be employed in the Firing Source Circuit to provide at least 10k ohms isolation between the payload return circuit and the host vehicle return circuit when measured at 1.5 times the bus voltage or greater. shields. b. The firing circuit including the EED shall be completely shielded, or shielded from the FED hack to a point in the firing circuit at which isolators eliminate RF entry into the shielded portion of the system. Isolators which provide 20 dB attenuation (regardless of source and load impedances) at all frequencies of the expected electromagnetic environment shall be considered acceptable. The adequacy of the RF protection provided by these isolators can also be demonstrated by test or analysis for each specific usage (i.e., the necessary protection is dependent on the configuration of unshielded circuits connected at this paint and the expected electromagnetic euvironment). Cable shielding shall provide a minimum of 89 percent of optical coverage. The method for determining optical coverage shall be in accordance with FED-STD-228 or Federal Specification QQ-B-575- With the exception of cable shielding there shall be no gaps or discontinuities in the shielding, including the termination at the back faces of the connectors, nor apertures in any container which houses elements of the firing circuit. Shields terminated at a connector shall provide 360° continuous shield continuity without gaps. iMIL-STD-1576 (USAF) 31 July 1984 e. Shields shall not be used as intentional curres but may be multiple-point grounded to structure. -earrying conductors, + Multiple point grounding of shields to structure is recommended. 5.3. Shielding Caps. All electroexplosive devices and safe and arm devices shall have shielding caps attached during storage, handling, cransporting, and inetallation, The shielding cap shall have a solid metal outer chell which makes electrical contact with the FED case in the same manner as the mating connector for the EED. 5.4 Cables. a, Electrical cableo may be fabricated ouch that several clectro~ explosive subsystem circuits are contained in a common shielded cable bundle, provided that the requirements of paragraph 5.7.2a are met. b. There shall be no splices used to join elements of ordnance cables. + A connector shall be provided wherever mating or demating of a cirenit is required. + All cable runs shall be routed as close to metal structure as feasible. 5.5 Insulation Resistance. a. All current-carrying components and conductors shall be electrically insulated from each other and system ground. + The insulation resistance between all insulated parts, at a potential of 500V, minimum, DC, shall be greater than 2 megohms after exposure to the environment specified herein. (For the NSI, the potential shall not exceed 250V, DC and only one 250V, DC test shall be permitted. All other NSI testing should be’at 50V, DC). Electroexplosive subsystem shall 5.6 Post Firing short-Circuit Protecti ihelude- positive provection for Line-torTine and line-to-ground shorts which may develop within a fired FRD. Relays, fuses or current limiting resistors may be used to satisfy this requirement. 5.7 Firing Circuits. 5.7.1 Wiring. Shielded twisted pairs shall be used unless other configurations can be shown to be more effective.MIL-STD-1576 (USAF) 31 July 1984 >. Any grounding ot the firing circuits shall be done at one point only. The return path, on all circuits, shall be selected to minimize voltage buildup and transients on the firing circuie recura with reopect £0 the single point ground. + Ungrounded firing output circuits shall be connected to structure by static bleed resistors. Structural ground shall not be used as return for ordnance circuitry. e. The source circuits shall terminate in a connector with socket contacts. f. The design shall preclude sneak circuits and unintentional electrical paths. 5.7.2 Electrical Isolation. a. Firing circuits that do not ohare a common fire command shall be electrically isolated from one another such that current in one firing circuit does not induce a current greater than 20 dB below the no-fire current level in any firing output circuit. >. Control circuits shall be electrically isolated so that a stimulus in one circuit does not induce a stimulus greater than 20 dB of the actuation level in any firing circuit. 5.7.3 Physical Separation. Firing output circuits shall be physically acparated-Trow all other types of circuits. 5.7.4 Electrostatic Protection. Electroexplosive devices shall be protected from electrostatic hazards by the placement of resistors from line-to-line and from line-to-ground (structure). The placement of line-to-structure static bleed resistances is not considered to violate the single-point ground requirements of this Standard a2 long ac the parallel combination of these resistors are 10k ohms or more. 5.7.5 Monitor Circuits (Portable or Built-In). 4. Application of operational voltage to the monitor circuit shall not compromise the safety of the firing circuit nor cause the electroexplocive oubsyetem to be armed. b. Monitoring currents shall be limited to one-tenth of the no-fire current level of the EED or 50 milliamps whichever is less. + Monitor circuits and test equipment that applies current to the bridgewire shall be designed to limit the open circuit output voltage to one volt. 4. Fault tolerance requirements af paragraph 4.2 shall apply to monitor circuits and associated equipment. aieMiL-St0-1576 (USAF) 31 July 1984 5.7.6 Control Circuits. It must be demonstrated that command and control interfaces with the host vehicle that are used for any arming or firing functions in the payload cannot be actuated or triggered by return currents Elowing in the host vehicle or payload structure. Use of differential drivers and receivers, transformers or optical couplers, or other floating control circuits are possible means of accomplishing this. 5.8 Connectors, 5.8.1 Type. All connectors used with the electroexplosive devices shall: 4) be approved by the procuring activity, b) have a stainless steel shell or suitable electrically conductive finish, c) complete the shell-to-shell connection before the pins connect, and d) provide for 360° shield continuity. 5.8.2 Pin Assignments. a. The circuit assignments and isolation of pins within any KES circuit connector shall be such that any single short circuit occurring as a result of a bent pin or contamination will not result in more than 50 milliamperes or one-tenth of the no fire current whichever is less applied to any electroexplosive device. b. There shall be only one wire per pin, and in no case shall a connector pin be used as a terminal or tie-point for multiple ¢. Spare pins are prohibited in connectors which are part of firing output circuitry. 5.8.3 Locking. Connectors shall be selected such that they are not subject to demating when exposed to the maximum anticipated environment. Connectors that twist and lock into position are preferred. 5.8.4 Mismaring. Firing circuit connectors shall not be capable of being Riemscelneae 5.8.5 Separate Connectors. Where redundant circuits are required to meet fault tolerance requirements, separate connectors shall be used. 5.9 Firing Switches and Relays. a. Electromechanical and solid-state switches and relays shall be capable of delivering the maximum firing circuit current for a time interval equal to ten times the duration of the intended firing pulse. These switches and relays shall be capable of breaking the post-fire short circuit current without excceding any steady-state or trancient Limits of the solid-state or electromechanical device used. c. The use of a solid-state device to provide isolation between the firing circuit and ground/structure requires specific approval from the procuring activity. -~2-MIL-STD-1576 (UISAF) 31 July 1984 5.10 Mechanical Requirements. 5.10.1 Mounting. Relays that are series inhibits shall be mounted on axes to minimize the potential of vibration or shock activating more than one of the relays simultaneously. 5.10.2 Mechanical Integrity. The EEDs, when installed in higher level devices such as pin pullers, wire cutters, gas generators, ete., shall be designed to withstand the maximum back pressure from the operation of these upper level devices. 5.11 Electroexplosive Devices Electrical Design Requirements. 5.11.1 Hot Bridgewire. 5.11.1.1 No-fire Sensitivity. a. Unless otherwise specified electroexplosive devices shall be designed to withstand a constant direct current firing pulse of up to 1 ampere and 1 watt power (minimum) for a period of 5 minutes (minimum) duration without initiation or deterioration of performance (dudding). The DC no-fire shall be determined by Test Method 2203 (Bruceton Test) at room temperature (23 degrees C). The EED should be held in a mounting device to minimize heat transfer avay from the initiator. Test Method 2203 (Bruceton test) shall indicate that the 0.1% firing level (with 95% confidence) is 1 ampere or more. bs EEDs shall not fire, dud, or deteriorate in performance as a result of being subjected to an electrostatic discharge of 25,000 volts from a 500 picofarad capacitor applied in the pin-to-case mode with no series resistor and in the pin-to-pin mode with a 5K ohm resistor in series. EEDs using an external spark gap require procuring activity approval. 5.11.1,2 Minimum All-Fire Current, The minimum all-fire current levels as determined by Test Nethod 2203 (Bruceton test) shall be at 99.9 percent firing level with a 95 percent confidence level. 5.11.1.3 Capacitor Discharge Firing. The requirements for determining the firing characteristics of FEDs to be used in capacitor discharge firing systems shall be specified by the procuring activity. 5.11.2 Carbon Bridge EEDs. Electroexplosive devices using carbon bridges are prohibited. 5.11.3 Conductive Mix BEDe. Conductive mix EEDe that do not utilize a bridgewire are prohibited. 5.11.4 Temperature Endurance. a. EEDs shall not autoignite when exposed to thermal environments that are 30°C above the maximum predicted temperature during worst case service life. aeMIL-STD-1576 (USAF) 31 July 1984 b. EDs shall not decompose when exposed to thermal environments that are 30°C above the maximum predicted temperature and 10°C below the minimum predicted temperature during worst case service life, if decomposition or failure to function can create a hazard. 5.12 Safe and Arm (SSA) and Arm and Disarm (A/D) 5.12.1 Electrically Actuated. a. These devices shall incorporate a means of remote electrical arming and disarming trom any barrier position. b. Remote and manual disarming shall be accomplished without passing through the arm position. €. The devices shall not be capable of being manually armed, but shall be capable of being manually disarmed. 4. The devices shall remain mechanically secured in the selected position under all operational environments without the application of any electrical signal. e. There shall be no current flow exceeding 2 milliamperes in the disarm or safe command circuit during the arming cycle nor in the arm command circuit during disarm or safing. 5.12,1.1 Gyclic Life. All electrically actuated electroexplosive subsystem devices shall be designed to withstand repeated cycling from the armed to the disarmed positions for at least 1000 cycles without any malfunction, failure, or deterioration in performance. During this cyclic period, the devices shall be capable of being manually disarmed after any cycle. 3.12.1.2 RE Susceptibility. The protection for the EEDs shall be provided by a metallic enclosure which provides 360 degrees of coverage. 5.12.1.3 Electrical Arming and Safing Time. The time required to arm or to safe a safe and arm device, electrically actuated arm and disarm device, or other approved safing and controlling device(s) shall not exceed 1 second after application of the actuation signal. 5.12.1.4 Electrical Contacts. Electrical switching contacts shall be ed such that the specified vibration environment shall not cause an inadvertent make or break (chatter). Contacts which physically prevent closure (e.g., wiping type, disc-mounted) in the unarmed position are the preferred type of contact. oS512.2 MIL-STD-1576 (USAF) 31 July 1984 Mechanically Actuated Saas ‘These devices shall incorporate the same features as electrically actuated devices except that arming and safing is performed mechanically. Normally these devices are armed by a lift-off lanyard or by stage separation. Electrically actuated devices shall be used unless justification for mechanical actuation is provided and approved by the procuring activity. These devices shall be designed to withstand repeated cycling fror the armed to the aafe position for at least 300 cycles without malfunction, failure, or deterioration in performance. 5.12.3 Safety Provisions. 5.12.3.1, SGA Safety Provisions. The provisions that follow apply to all devices using mechanical barriers. c The safe and arm device shall contain a mechanical safety barrier between the EED and the explosive train when the SéA is in the safe (disarmed) position. In the armed position, the safe and arm safety barrier shall be aligned to permit ignition or detonation of the explosive train. In the safe (disarmed) position, inadvertent ignition of the EED shall not result in ignition or detonation of the subsequent explosive elements including any explosives within the S6A. This shall be demonstrated during the development stage using three mechanically and explosively similar devices in the 50 degree from safe position for rotating barriers and midway between the safe and the armed position for sliding barriers in accordance with Barricr Test Method 2410. In the safe (disarmed) position, both power and return lines shall be disconnected. In the safe (disarmed) position, the EEDs shall be shorted and the hort should be grounded through an appropriate resistance. Tf the resistor(s) remain connected to the firing circuit in the arm position, it shall be a minimum of 10K ohms. Establishing and breaking circuit continuity, and shorting and unshorting of the electrical initiators shall be accomplished by actuation of the device to align and disalign the EEDs with the rest of the explosive train. Transition of the barrier from the safe to the arm position for a rotating barrier shall require a minimum of 90 degrees rotation of the mechanical barrier. -3-MIL-STD-1576 (USAF) 31 July 1986 ‘The devices shall be designed to meet all performance requirements after the application of maximum operational arming voltages continuously for periods of up to 5 minutes with the safing pin installed. Stalling shall not create a hazardous condition when atming voltages are applied continuously for one hour with the safing pin installed. 5.12.3.2 Arm/Disarm (A/b) Safety Provisions. Arm/Disarm devices shall contain provisions for establishing and breaking circuit continuity, and shorting and unshorting the EED circuits. 5.12.4 be eB 5.12.5 Safe & Arm Lock/Safing Pin. All S8A devices shall have a positive mechanical lock and a safing pin. The mechanical lock within the device shall prevent inadvertent transfer from the unarmed (safe) to the armed position (and vice versa) under specified environmental condition: ‘The safing pin shall prevent inadvertent transfer from the unarmed (safe) to the armed position when an arming signal is applied. The safing pin shall be capable of installation into and removal from the device after the device is installed. The safing pin shall provide a means of attaching warning streamers. Mechanical retention of the safing pin shall be possible only when the S6A device is in the safe position. The safing pin shall be secured in position in the device by use of a detent or similar feature. Strength of the detent shall be sufficient to require at least three pounds but not more than 10 pounds for removal of the safing pin. For a rotating device, the torque shall be at least three inch-pounds but not more than 10 inch~pounds. A mechanism shall be incorporated which will prevent removal of the safing pin if the arming circuit is energized. The mechanism shall be capable of withstanding an applied force of at least 100 ibs. tension or a torque of at least 100 in-Ibs. without failure. Safe & Arm Safing Pin Streamer. All safing pins when installed shall be marked by a red streamer. 5.12.6 Status Indication. An integral part of the S&A design shall include a means for direct visual and remote monitoring of the arm or safe status. - 26 -ce 5.12.8 5.12.8.1 MIL~STD-1576 (USAF) 31 July 1984 The visual indicator shall be clearly and readily discernible at a minimum angle of 15 degrees from a line-of-sight normal to the center of the indicator. The safe condition shall be indicated by a white (FED~STD-595 color No. 27875) letter $ on a green (FED-STD-595 color No. 24108) background, and the armed condition shall be indicated by a black (FED-STD-595 color No. 27038) letter A on a red (FED-S1D-595 color No. 21105) background. Letters shall be readable from 5 feet considering the worst case illumination anticipated. Safe status shall not be indicated (visual or remote) until che barrier is within 10 degrees of the safe position for rotating barriers and within 10% of travel from the safe position for sliding barriers. Safe & Arm Simulator Resistor: S8A devices may contain a simulator resistor across each of the firing line circuits to permit testing of the firing circuit without energizing the electrical initiators. ‘The application of operational voltages to the resistor for a duration of 20 seconds, minimum, shall not cause degradation in performance of the device. Application of operational voltage for times in excess of 20 seconds shall not create a hazardous condition. Safe & Arm Components. EEDs. All EEDs used in the S6A devices shall be qualified and accepted as components in compliance with the requirements of this Standard. 5.12.8.2 Safe & Arm Rotor Leads. All lots of S&A rotor leads shall be acceptance tested as a separate component in compliance with the requirements of this standard. Rotor leads shall be qualified as an installed component in the S&A device. 5.13 Safe and Arm Plug Devices. Firing circuits that use Arming Plugs shall be designed to electrically interrupt the EED side of the firing circuit. They shall provide for the electrostatic protection of the EED as specified in Paragraph 5.7.4, with the Arm Plug removed. This protection may be achieved by installing a Safe Plug in the Arm Plug receptacle, or by intrinsic design of the firing circuits. If a safe plug is not required, a suitable conductive cap shall cover the Arm Plug receptacle. -27-MIL-STD-1576 (USAF) 31 July 1984 bs Arm and Sate Plugs or caps shall be designed to be positively identifiable vy color, shape and name. The natural (unpainted) body color of the Arm Plug is required. The Sate Plug or cap should be green and shall have a red remove-before~flight streamer attached. They shall be marked Arm ana Safe respectively. ce The design of the device and the tiring circuit shall ensure easy access for plug installation and removal during assembly and checkout in all prelaunch and post-launch processing facilities. d. Monitor and control circuits shall not be routed through Safe Plugs. e. These devices snali meet ali the shielding requirements of paragraph Dede 5.14 Environmental Requirements. Electroexplosive subsystems shall be capable of performing in the prescribed manner when fired in the operational environment after surviving the normal sequence of predicted transportation and nandling, storage, prelauncn, Launch, ascent and flight conditions. They must not inadvertently initiate after exposure to tne predicted environmental extremes of re-entry, landing, and post landing conditions where applicable. Designing components tor tne predicted environmental extremes shall include design tactors of safety or design margins to accommodate variations in production units and in testing. d.1> Mermetic Sealing. a. ALL EkDs shall be hermetically sealed in such a manner that after being exposed Lo the environmental conditions in the sequences specified herein, tne actual helium leakage rate shall not exceed 5xLU-© standard cubic centimeters per second at a differential pressure ot one atmosphere, minimum (see Test Method 1111). ALL non-electric explosive components contained within a sate & arm device which is not hermetically sealed shall be sealed to meet the same requirement. bs Organic materials snall not ve consiaered acceptable sealants. c. The closure(s) used to obtain hermetic sealing, and for other purposes, shall be designed to yield minimum devris as a result of firing; and tne debris, it any, snall not nave a detrimental effect on the item into wnich tne initiator fires. Selo bata. a. besign and test data that demonstrate compliance with this Standard shall be retained as specitied by the procuring activity. Data is normally retained for the life of the program, and longer if there is planned usage for tuture programs. bs Data for teat plans, procedures and results shall be formatted and delivered as tasked in the test section of the SOW and associated CORLS. aeMIL-STD-1576 (USAF) SL July 1984 ©.U QUALLTY ASSURANGE PROVISLONS 6.1 Applicable Tests. Unless otherwise specified by the procuring activity all electroexplosive subsystems and components shall pass the tests specified herein. A cross-reference from Section 4 and 5 requirements to Quality Assurance Provisions is given in Figure 2. .2 Responsibility for Tests and Inspections. Unless otherwise specitied in the contract or purchase order, the supplier is responsible for che performance of all inspection and tests as specified nerein. The supplier may use nis own or any other facilities suitable for tne performance of the inspection and test requirements specitied herein, unless disapproved by the procuring activity. The procuring activity reserves the right to perform any of the inspections and tests set fortn in this Standard wnere such inspections are deemed necessary to assure supplies and services conform to prescribed Fequireweuts. 6.4 Test Sequences. Unless othervise specitied by the procuring activity, tests snall be accomplished in sequential order as listed in tables I through viii. 0.4 Classification of Inspection. The inspection requirements specified herein are classified as follows: a. Qualification inspections aud Lests ss ee ee ee es See 67 b. Lot acceptance sampling inspections and rests... . . See 6.8 6.5 Hazard Classification. Ordnance items shall nave a Military Hazard Classification and Compatibility Grouping in accordance with DOD 5154.48. If not already classified, classification shall be in accordance with AFTO AIA~1-47., 6.6 Safety Reliability Demonstrations. The reliability of the safery features of the electroexplosive subsystem will be considered demonstrated with the successful completion of tne required qualitication and acceptance testing in accordance with paragraphs 6.7 and 6.8. The capability of the EED output in performing its intended function shall be verified. 6-7 Qualitication Inspections aud Tests. Qualification inspection of electroexplosive cubsysteme and componente chall be conducted in accordance with the following: a. Electroexplosive Devices. Perform the inspections and tests in Tables I and II. Devices. Perform the inspections and tests in Table VI. S&A EEDS snail be tested in accordance with paragraph 0.7.a. oyMIL-STD~1576 (USAF) SL July 1986 c. Electroexplosive subsystem. Pertorm the analysis per Test Method 4303, O.7sL Requalitication Testing. Lf any of the following events occur in the manufacture ana test of previously qualified electroexplosive devices (per paragraph 0.7), a review and analysis shall be made to determine what requalification tests, it any, snall be made. The analysis and any resulting proposed requalification test program shall be approved by the procuring activity. a. Critical components or materials are to be obtained from a source not previously qualified. b. Changes in methods, critical processes, or change in the production line (different line within the same facility or different facility). c. Experience indicates a deficiency in previous test methods. 0-8 Lot Acceptauce Sampling, luspectious aud Tests. Electrueaplusive subsystems, S&A devices and EEDs shall be acceptance tested in accoraance with the following: 6.8.1 Electroexplosive Devices. Test per Tables 1 and ILI. 0.4.2 Safe and Arm Devices. Test SaA devices per Table VII. Test SA rotor teaas per Table VIIT 6.4.4 Arm/Disarm Devices. Test per applicable section of MIL-STD-1547 or per detail specification as approved by the procuring activity. 6.8.4 Electroexplosive Subsystems. This Standard does not provide test requirements for the installed subsystem. The electroexplosive subsystem is normally tested in accordance witn the overall system test plan, or as specitied by the procuring activity. 6.8.5 Service Lite Teete. Service life of every lot ot EEDs shall be verified by con g fests outlined in Tables IV or V. Service life of S&A rotor leads shall be demonstrated yearly by repeating the acceptance lot sample test program by firing ten rotor leads. 0.9 Systems Ettectiveness. 6.9.1 Parts, Materials, and Processes (PMP) Controls. a. Ordnance PMP shall be controlled as defined within this Standard. When ordnance PMP are specified, which are not specifically controlled by this Standard, they shall be controlled in accordance with DOD-E-83578, or the approved PMP Contractual Document. hsMIL-STD-1576 (USAF) 31 July 1984 Non-ordnance PMP shall be controlled per the requirements of 1) this Standard, 2) MIL-STD-1546 or the Approved PMP Contractual Document, or 3) DOD-B-8983 in that order of precedence. 6.9.2 Parts, Materials, and Processes (PMP) Qualification. Ordnance PMP shall be qualified ae defined within this Standard. linen ordnance PMP are specified, which are not specifically covered by this Standard, they shall be qualified in accordance with Dov-E-83578, or the Approved PHP Contractual Document. Non-ordnance ¥MP shall be qualified per tne requirements of 1) tnis Stangard, 2) MIL“S1D-1940 or che Approved PMP Contractual Document, or 3) Dop-E~8983 in that order of precedence. oelu Blectromagnetic Compatibility (EMC) Verification. It snall be sown by analysis or test that the electroexplosive suosystem meets the requirements of paragraph 4.4.1.a. The analysis/test shall include not only the firing output circuits, but all of the firing circuit elements, in particular the control circuits that can couple power to the EED. The radiated and conducted electromagueLic environment will produce a peak AC power level at the EED and tnie Level must be compared to the maximum DC no fire power level of the RED, which is determined from the square of the DC no fire current times the nominal bridgewire resistance. Nore: This verification can be part of the normal EMC Conformance program used tor tne overall (completely assembled and powerea-up) payload systems, e.g., connect an ordiauce simulator or power measuring device to the firing output circuit. The monitoring device should be selected to minimize its eftects on the overall system. This DC detector must have the capability of detecting pulses at least as short as one millisecond. The ordnance simulator ‘and measuring device should be selected with sensitivities to levels far less than the no fire level of the EED so that a 20dB safecy margin can be demonstrated without irradiating the system at damaging Levee. --MIL-STD-1576 (USAF) 31 July 1984 It shall be shown by analysis or test (see NOTE above) that the electroexplosive subsystem meets the requirements of 4.4.1.b. If the electroexplosive subsystem is non-compliant with any of the requirements of this Standard which may have an impact on electro- magnetic environment susceptibility, or if the electroexplosive subsystem utilizes an EED which the procuring activity considers abnormally susceptible to the electromagnetic environment, then a worst case analysis (in accord with Test Method 4303) shall be performed on all firing circuits for all storage, handling, handheld, checkout and fully assembled configurations of the firing systems that can be exposed to the radiated electromagnetic environment. The worst case analysis must demonstrate that the electromagnetic environment, acting directly on the firing cirewit, will produce at the EED in each firing mode (e.g., pin-to-pin, pin-to-case) an RF level less than the maximum RF no-fire level of the EED. 6.11 Documentation. The procuring activity may require specialized documentation prior to the use of explosive items. a be Procedures shall be established for the safing and removal of ordnance items. Where Air Force Explosive Ordnance Disposal support is required, procedures shall be provided in accordance with Explosive Ordnance Disposal Directive (DOD ADL TD-3). aeMIL-STD~1576 (USAF) 31 July 1984 REQU LRA NT a GENERAL KEQUIRKEMENTS ae General Design 4.2 Fault Tolerance 4.2L General Requirements 4.2.2 Implementation 423 Extent of Applicability 43 Bonding 44 Electroexplosive subsystems Electromagnetic Compatibility Inadvertent Activation Direct Coupling to the EED & EES system Effectiveness Requirements pup Program PMP Selection List Program PMP Approval Non-Standard PMP Approval, Life Reliability Materials Compatibility Muman Factors Traceability ET "AIL DESIGN CRITERIA BH Power Source 22 shields 3 Shielding Caps 24, Gable: 25 6 Insulation Resistance Post Firing short-Circuit Protection Firing Circuito 1 Wiring 2 Electrical Isolation 3 Physical Separation oh Electrostatic Protection 5 Monitor Circuits 6 Control Circuits PICURE 2 (1 of 3) ' | 1 I | | 1 T 1 i i 1 1 : ' { | 1 | 1 I I i 1 I 1 | | | 1 \ 1 i 1 1 1 { I 1 \ ' { I 1 | 1 Quality Conformance Method x > xo x x T | | I T i | | | _ i ( i 1 I i i 1 | 1 It 1 \ 1 | | 1 i i I Il ! 1 | Il 1 (| Hl i | 1 | ' T g Ss T D E 4 o 1 | | I T 1 | It | 1 | { i i i | | 1 | 1 t I I 1 iH | 1 I i I 1 i ! 1 I I i I i i 1 i I n> => oe bene mene be be Be bene pe ie be * pede He ede METHOD * ae 2204,2207, + eee ees Crosa-teference of RED Requirements to Quality Assurance Provisions aeMIL~STD-1576 (USAF) 31 July 1984 REQUIREMENT 3. DETAIL DESIGN CRITERIA (continued) Connectors 1 ‘Type 2 Pin Assignments 3 Locking wy Mismating 35 Separate Connectors Firing Switches and Kelays 0 Mechanical Kequirements Wel Mounting 0.2 Mechanical Integrity 1 Electroexplosive Device Electrical Design Requirements Sellel Hot _Bridgewire SsLl.Lel No-Fire Sensitivity Selle1.2 Minimum All-Fire Current SitLs1.3 Capacitor Discharge Firing Selle2 Caroon sridge EEDs S114 Conductive Mix BEDS 5.11.4 Temperature Endurance 5.12 Sate and Arm and Arm/Disarm Devices Electrically Actuated cyclic Lite RF Susceptivility 1 L 1 L 1.4 Electrical Contacts Z Mechanically Actuated Seas 3 Safety Provisions 3.1 SéA Satety Provisions 3.2 A/D Satety Provisions 434A Lock/Safing Pin 586A Safing Pin Streamer 6 Status Indication 7 S6A Simulator Resistors 8 $&A Components Bel BEDS 8.2 SaA Rotor Leads FIGURE 2 (2 of Cross-Reference of EED Requirements to a5 1 z 4 Electrical Arming and Safing Time 4 Quality conformance Method be pee meee Il 1 : T I 1 ' I I 1 i i i 1 | ( | i 1 1 | I fl 1 | i : I : 1 | | 1 1 1 i ' 1 1 | I 1 ) 2406 3113 2410 * 2406 ion 1101 ality Assurance ProvisionsMIL-STD-1576 (USAF) 31 July 1984 | @eatity | | Conformance | |__wethoa | reTtToTal 1, ill bat Hol a a a a | REQUIREMENT LMI TLOLLI METHOD 5. DETAIL DESIGN CRITERIA (continued) oS a ae ! (io 5013 Safe and Arm Plug Devices fot ot txto* Paty Environmental Requirements 1 [ee [ae fe | ae 5.15 Hermetic Sealing eerie 5.16 Data es Se * = NOTE: An asterisk in the Method column indicates that uo test wethod has been specifically identified in this Standard. The applicable payload apecification and corresponding Quality Assurance Methods will apply in these cases. #* - NOTE: The double asterisk indicates that environments are not separately tested but are a requirement of each test, demonstration, or analysis. FIGURE 2 (3 of 3) Groco-Keference of KED Requirements to Quality Assurance Provisions -35-MIL-STD-1576 (USAF) 31 July 1984 Table I EED LOT ACCEPTANCE (NON DESTRUCTIVE) (rest PROCEDURE ‘QUANTITY Visual Inspection Method 1101 100% Dimensional Check Method 1102 00% Betdgewire Reststance * Method 2201 100% Teak Test Method 111L 100% State Discharge Method 2205 100% Taswlation Resistance Method 2117 100% Bridgewire Resistance Method 2201 100% ray Method 1103 100% N=ray Method 1405 TOOr * This bridgewire cest may be omicted if bridgewire cest was conducted after loading and before this stage, and recorded measurements are available. gtMIL-STD-1576 (USAF) 31 July 1984 vable 11 EED Qualification Testing jrest PROCEDURE a6 EEDS TESTED AS FOLLOWS INon=Dest Test® Table T DIOR US a5 6 10: IRF_Tmpedence Method 220% 10 IRF Sensitivity Method 2207 230 lbetermination om INo Fire Bruceton Method 9703 eS (5 minute constant lcurrent) cia [ALI Fire Bruceton Method 2203 ray (30 millisecond constant curreut) High Temperature Method 3401 lexposure FTesperatare Wethod 3007 THs cyetin Shock Method 31Te 5105, [Vibration Method 3113 105 |Drop Test (6 foot) Method 3409 eee Briagevire Hethod 2201 ss Resistance Tasulation Wethod TIT 53s fiesiarance Leak Test Heehod TL SamaanrlOs X-ray, Method 1103 5 FH 105 a Hethod 1404 Savas aari09 Ro Fire Method 2402 6 . 3 «105 verification brent Ae specified aes Pricing Toot aul Fire Per Method 2405 [Temperature Test per puss lPiring Tests Teble TIA * All EEDs submited to qualification must have passed non-destructive acceptance tests of Table I. ** 370 EEDs required for dual bridgewire testing. Total quantity - 586. NOTE - Double line (230) under number of EEDs tested indicates EEDs are considered destroye NOTE - Firing test requirements for EEDs to be used in a capacitor discharge firing system shall be specified by the procuring activity. -37-MIL-STD-1576 (USAF) 31 July 1984 TABLE ITA Lot Sample Allocation for temperature Firing Tests ing Temp All Fire Predicted® 22 Amps Current Operating Current Predicted Operating 5 15 3 [Temperature lHigh Temperature 15 15 5 [fou Tenperacure i. 15 5 A In the event that firing curcent cannot be predicted, these EEDs shall be tested at 2 times the specified All Fire Current. -38-MIL-STD-1576 (USAF) 31 July 1984 Table IIT EED Lot Acceptance Testing frest PROCEDURE QUANTITY |Won-Destructive Tests Table 1 100% of lot [Temperature Cycling Method 3607 Lot Sample * Shock Wethod 311% Tot Sample * \Vibratton Method 3113 Tot Sample * (Use qualification Level) rray Method 1103 Tot Sample * Wray (optional) Method 140% Tot Sample * [Bridgewire Method 2201 Tot Sanple * lResistance rnsulation Method 2117 Lot Sample * jesistance [beak Test Method 1111 Tot Sample * INo Fire Verification Method 2402 Tot Sample * |Firing Tests Method 2405 Tot Sanple* Per Table IIIA * Entire lot sample, which is 10% of Lot but no less than 30. NOTE - Firing tests requirements for EEDs to be used in a capacitor discharge firing system shall be specified by the procuring activity. - 39 -MIL-STD-1576 (USAF) 31 July 1984 TABLE ILIA Lot Sample Allocation For Firing Tests ‘ALL FIRE CURRENT ‘OPERATING CURRENT® Predicted Operating 176 1/6 Temperature Max. Predicted High Temp. 176 176 Max. Predicted Low Temp. 176 176 * In the event that the operating current cannot be predicted the test level current shall be twice the all fire current. NOTE - 1/6 refers to the division of Lot Sample. ~ 40 -MIL-STD-1576 (USAF) 31 July 1984 Table IV ELD Accelerated Aging Test NOTE: When accelerated aging tests are used to verify the service life requirement of 4.5.5, testing shall be conducted at time of lot acceptance. Successful completion of this testing merits a three year service life assignment. This procedure may be repeated at three year intervals to extend service life indefinitely. ESE PROCEDURE QUANTITY Non-Destructive Table T 10 Tests ftigh Temperature Method 3403 10 frorage hock Wathod 311e To ‘ibration Method 3113 10 (Use qualification level) =ray Method 1103 To : mray Method 140 10 [Bridgewire Method 2201 10 jesistance fasulation Method 2117 To Resistance Leak Test Method T1iT 10 No Fire Verification Method 2402 10 Firing Tests at Specified All Fire Current = At Predicted Operating Temp. Method 2405 4 At Max. Predicted High Temp. Method 2405 3 ~ At Max. Predicted Low Temp. Method 7405 3 * This quantity will undergo all of the tests given in Table IV, i.e. 10 units every three years. aneMIL-STD-1576 (USAF) 31 July 1984 Table V EED Surveillance Test NOTE: When surveillance tests are used to verify the service life requirements of 4.5.5, testing shall be conducted one year after lot acceptance testing and each year thereafter to extend service life indefinitely. (rest PROCEDURE QUANTITY Non-Destructive Table 1 5 Tests Temperature Cycling Method 3407 5 Shock Method 3114 5 Vibration Method 3113 5 (Use qualification evel) x-ray Method 1103 IN-ray Method 1406 5 Bridgewire Method 2201 5 Resistance Tasulation Method 2117 3 lkesistance jbeak Test Method IIIT 3 INo Fire Verification Method 2402 3 [Firing Test Fire at specified 3 Operating Temp all fire current per Method 2405 8MIL-STD-1576 (USAF) 31 July 1984 Table VI Safe and Arm Device Qualification frest PROCEDURE ‘QUANTITY Tsual Inspection Method 1101 7 imensional check Method 1102 7 asulation Reotetance Method 2117 7 [Leak Test ** Method TIL 7 Temperature Cycling Method 3407 7 wok Method 3116 T Tbration (Acceptance) Method 3113 7 ‘bration (Qualification) Method 3113 7 neulation Resistance Method 2117 7 ere Foe Method 2406 7 eak Test®® Method 1111 Z iring Test at Predicted perating Current fit Predicted Operating Temp. Method 2407 2 High Temp. Method 2407 2 ¢ Low Temp. Method 2407 2 [cycle Lites Paragraph 5.12.1.1 T lseati™ Paragraph 5.12.3.1h T wenty Foot Drop Test® Wethod 3408 Tsval Inspection® Tnspect for Hazardous Condition(s) Prior to Disposal * The device exposed to these tests shall not be fired. 4* For hermetically sealed units only. ~ 43MIL-STD-1576 (USAF) 31 July 1984 Table VIL Safe and Arm Devices Acceptance (rest PROCEDURE ‘QUANTITY isual Method 1101 100% imensTonaT Method 1102 100% ibration Method 311s TO0r Bench Test Method 2406 100% ‘2 Test® Wethod TIT TOOr * For hermetically sealed units only ** Do not exceed vibration levels given for acceptance testing in paragraph 3b in Method 3113. veMIL-STD-1576 (USAF) 31 July 1984 Table VIII S&A ROTOR LEAD ACCEPTANCE TESTING frest PROCEDURE QUANTITY \Wisual TaspectTon TIOL 100% of lot PiuensTonal cheek Ti0z T0OX oF Toe Kceak Test Tit T00E oF Tat rray T103 100% of lot fray Tao 100% of Tot LOT SAMPLING TEST* ‘emperature Oyeling 3e07 Entire Sample Leak Test iy Entire Sample Firing Test Za11 High Temp 1/2 Sample Low Temp 1/2 Sample * The sample consists of 10% of the lot, but not less than 10 units from the same lot. The samples are to be chosen at random.. 45 -MIL-STD-1576 (USAF) 31 July 1984 THIS PAGE LEFT INTENTIONALLY BLANKMIL-STD-1576 (USAF) 31 July 1984 GROUP 1000 NON-DESTRUCTIVE TEST METHODSMIL-STD-1576 (USAF) 31 July 1984 METHOD 1101 VISUAL INSPECTION 1, Purpose. To visually inspect the item before and after each manufacturing, handling, storage, and test operation. 2. Procedure. Visually inspect the item before and after each operation or test to insure that good workmanship has been employed and that the item is free of obvious physical defects. The final inspection shall be wade under 10x minimum magnification. Cracks, inclusions or voide shall be cause for rejection. ma METHOD 1101 31 JULY 198%MIL-STD-1576 (USAF) 31 July 1984 METHOD 1102 DIMENSIONAL 1. Purpose. Ta establish the dimensional accuracy of the furnished item to be tested. 2. Procedure. Each item to be tested shall be physically measured to insure that the accuracy of the configuration is within dimensional limits as specified in Lhe device procurement specification. mae METIIOD 1102 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 1103 X-RAY RADIOGRAPITC 1, Purpose. To nondestructively inspect the device for defects and improper placement in the metallic constituents of the component. 2, Procedure, The test shall be accomplished by the methods outlined in MIL-S1D-453, Units shall be X-rayed to quality level 2-2T of MIL-STD-453, unless otherwise specified in the individual specification. Te METHOD 1103 31 JULY 1984MIL-STN-1576 (USAF) 31 July 1984 MerHop 1111 LEAK TEST 1. Purpose. To determine the effectiveness of the seal of a component part which has an internal cavity which is either evacuated or contains air or gas. This test will detect leaks due to the use of inferior sealing terials, or mumufacturing processes used to form the seal. The degree of completences or the seal can be verified by testing in the "as received" condition or after submission €o other environmental or physical- characteristic tests, such as thermal shock, physical shack, or vibration + Test Description. NOTE: (The final (10x magnification) visual inspection performed in Method 1101 will serve to reject defective units which could result in a gross leaker. Method 1101 shall be performed prior to the leak teating per thie method). One of the following procedures shall be performed: Procedure 1. The completed device(s) shall be placed in a sealed chamber which is evacuated to a pressure of 25 millimeters of mercury (absolute) or less for a minimum of five minutes and then pressurized (bonbed) with helium for the time and pressure noted in Table 1111-1 below, based upon the device's internal free volune. TABLE 1111-1 HELIUM BOMBING INTERNAL FREE BOMBING PRESSURE BOMBING TIME VOLUME (cm3) (ATM ABSOLUTE) (HOURS) less than .05 3 33 05 to less than «10 3 +50 .10 to less than .20 3 1.00 1.20 to less than .30 3 1.50 -30 to less than .40 3 2.00 40 co less chan .50 3 2.50 +50 or greater 3 3.00 The pressure shall then be reduced to one atmosphere which shall be maintained until each specimen is transferred to another chamber or chambers which are connected to the evacuating system and mass-spectrometer-type leak detector. When the chamber(s) is (are) evacuated, any tracer gas which was previously forced into the specimen will thus be drawn out and indicated by the leak detector as a measured leak rate. The number of devices removed from -1- METHOD 1111 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 pressurization for leak testing shall be limited such hat the test of the last device can be completed within 10 minutes. The criterion for passing this test is an indicated measured leak rate less than or equal to 1xi0~6 standard cc/second of helium when measured at one atmosphere differential pressure, unless otherwise specified by the procuring activity. NOTE: (The values specified for this procedure are based on MIL-STD-202, Method 112 and will result in the acceptance of units with an actual leak rate of less than or equal to 5x10~6 STD cm3/sec of helium.) PROCEDURE 2 - The completed device shall be tested per radioactive gas procedures of MIL-STD-202, Method 112, and shall exhibit an actual leak rate less than or equal to 1x10-6 STD cm3/sec. of helium when converted from the measured Krypton-85 leak rate. MBTHOD 1111 -2- 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 1404 NEUTRON RADIOGRAPHIC INSPECTION 1, Purpose. To nondestructively inspect the internal nonmetallic components of the EED and S6A rotor leads. 2. Detinition: 2.1 Conversion Screen. A material placed in contact with radiographic film that absorbe neutrons and emite ionizing radiation, thereby expoaing the film. 2.2 Image Quality Indicator. A device or combination of devices whose image or images on a neutron radiograph provide visual or quantitative data or both concerning the radiographic sensitivity of the particular neutron radiograph. 2.3. Sensitivity Level, The level determined by the smallest standard discontinuity in any given sensitivity indicator observable in the radiographic film. Levels are defined by identification of type of indicator, size of defect, and the absorber thickness on which the discontinnity is observed. 2.4 Thermal Neutrons. Neutrons having energies less than 0.4 eV. 3. GENERAL REQUIREMENTS 3.1 Materials 3.1.1 Radiographic Film, Neutron original radiographs shall be made using Kodak type R single coated radiographic film or approved equivalent. Duplicate radiographs shall be made using Kodak X-Omat duplicating film or approved equivalent. 3.1.2 Film Cassettes. Film cassettes used shall provide a positive means of maintaining intimate contact between the conversion screen surface and film emulsion. 341.3 Conversion Screen. Conversion screens used shall provide optimum response to neutrons at thermal energies and shall produce radivgraphs that meet the film quality requirements of this Standard. 3.1.4 Beam Purity Indicators. The beam purity indicator conforming to figure 1 of ASTM E-545 shall be used for all exposures as a minimum. 3.1.5 Sensitivity Indicator. A sensitivity indicator conforming to figure 2 of ASTWE-545 shall be used for all exposures. -a- METHOD 1404 31 JULY 1984MIL-ST0=1576 (USAF) 31 July 1984 3.2 Personnel. Personnel pertorming radiographic inspection shall be certified in accordance with the qualification of experience requirements of MIL-STD-410. Certification requirements not addressed in MIL-STD-410 shall be in accordance with Recommended Practice No. SNT~TC~1. 3.3 Exposures. Exposures shall be made using the direct method with the plane of the film as perpendicular as possible to the neutron beam. Reference Standard components shall be included in each exposure, if required. 3.341 Configuration. areas of interest in adjacent parts shall be tufficigntly separated to readily permit interpretation of the radiograph and shall be free from extraneous materials that could interfere with film evaluation. 3 ‘graphic Image Quality Radiographs shall have an image quality of at least NC-H-G Category I, as defined in ASTM B-545. 3.5 Workmanship. Radiographs shall be free from blemishes and artifacts that could interfere with their interpretation. 3.6 Facilities and Equipment 3.6.1 Neutron Source. The neutron source and facility shall be capable of producing radiographs that mect all requiremcnta of thio teat method and chal Provide adequate radiation protection for operating personnel. 3.6.2 Film Processing. The film processing equipment and facilities shall be Capable oF producing radiographs that meet the film quality requirements of this test method. Processing of radiographs shall be within the time and Leuperalure range recommended by the equipment manufacturer. 3.6.3 Film Viewing. The film viewing area shall provide an optimum level of background lighting for viewing radiographs. The film viewing equipment shall provide optimum viewing sizes and intensities for interpreting radiographs in the 2.0 to 3.0 Hurter and Drifield (6D) density range. A 3X to 7X magnifying glass shall be available. 346.4 Densitometer, The densitometer shall be capable of accurately measuring the light level transmitted through a radiograph having a film density up to 3.0 HéD and shall have a density resolution of 0.02 H&D or better. A calibrated reference density strip shall be maintained. 4, DBTALL REQUIKEMENTS 4.1 Thermal Neutron Content (NC). Thermal neutron content of the beam shall be determined using densitometer data from the heam purity indicator image as outlined in ASTM E-545. The calculated value shall be 65.0 or greater. METHOD 1404 -2- 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 4.2 Sensitivity Level (i). The image of the 0.25 mm hole through the 1.28 mm gap, at all the absorber thicknesses, shall be visible on all radiographs. 4.3 Film Density. The background density of radiographs shall be between 2.0 and 3,0 H6D, and the background denaity variation across the film shall not exceed + 5 percent when measured in accordance with ASTM E-545. 4.4 Film Identification. Radiographs shall be permanently identified with the following information: a. Part Number Serial Number cs Date of Exposure d. Radiographic Facility e. Conversion Screen Used (S/N) 4.5 Radiographic Technique Sheet. Each part number shall have a technique ahect or cheete, approved by the contracting agency, containing the following information as 4 minimum: a. Film identification (see 4.4) b. Length of exposure c+ Number of t yes exposed d. Exposure rate of neutron and ganma radiation e. Facility beam resolution (L/D) f£. Film processing information g+ Special requirement or tooling h. Photographs or Sketches or both of radiographic setup is Signoff (approval) by performing agency quality assurance representative 4.6 Special Safety Provisions. All special precautions pertaining to an item (part) shall be specified by the contracting agency. 4.7 Accept/Reject Criteria. The neutron radiographic evaluation shall be in accordance with accept/reject criteria established by the applicable engineering drawings and specifications. -3- METHOD 1406 31 JULY 1984MIL~STD-1576 (USAF) 31 July 1984 GROUP 2000 ELECTRICAL/ORDNANCE DEVICE, ‘TEST METHODSMIL=STD-1576 (USAF) 31 July 1984 METHOD 2117 INSULATION RESISTANCE 1, Purpose. To measure the insulation resistance of electroexplosive subsysten/components. This test is primarily useful in detecting leakage current and other defects degrading safety. 2. Apparatus. Insulation resistance measurements shall be made on an apparatus suitable for the characteristics of the component to be measured such as a megohm bridge, megohm meter, insulation resistance test set, or other suitable apparatus. Unless otherwise specified, the measurement error at that insulation resistance value required shall not exceed 10 percent. Proper guarding techniques shall be used to prevent erroneous readings due to leakage along undesired paths. 3. Procedure. When special preparations or conditions such as special test fixtures, reconnections, grounding, isolation, low atmospheric pressure, humidity, or immersion in water are required, they shall be specified. Insulation resistance measurements shall be made between the mutually insulated points or between insulated points and ground, as specified. The insulation resistance measurements shall be made immediately after a period of uninterrupted test voltage application, unless otherwise specified. 4, Test Requirements. Unless otherwise specified by the procuring activity, the applied test voltage shall be a minimum of 500v, DC (all current carrying components and conductors shall be electrically insulated from each other and system ground. The insulation resistance between all insulated parts, at a potential of 500v minimum DC, shall be greater than 2 megohms after exposure to the environment specified herein.) (For the NSI, the potential shall not exceed 250v, DC and only one 250v, DC test shall be permitted. All subsequent NSI testing shall be at 50v, Dc.). i] METHOD 2117 31 JULY 198%MIL-STD-1576 (USAF) 31 July 1984 METHOD 2201 BRIDGEWIRE RESISTANCE 1. Purpose. To measure the resistance of the bridgewire. 2. Procedure. Bridgewire resistance shall be measured by applying a maximum current of 10 milliamps or 10 percent of the maximum no-fire current (as determined by Method 2203), whichever is less. An accuracy of at least 2 percent of the true value is required. The open circuit voltage of the test equipment shall not exceed one vole. -1- METHOD 2201 31 JULY 1984MIL-S1D-1576 (USAF) 31 July 1984 METHOD 2203 DIRECT GURRENT SENSITIVITY 1, Purpose. This test determines pin-to-pin direct current characteristics of electroexplosive devices based on an assumed current log normal density function. The primary use of the determined characteristics is anticipated to be the specification of a pin-to-pin “maximum no-fire level" for the EED that will be used to support dc or low frequency hazard analyses. It is recognized that uy swall sample, e-gs 40 items, Lest cau accurately determine # suall firing probability (ess than 102) with high confidence unless other information about the firing characteristic of the individual EED type is available or assumed. Thus the "maximum no-fire level" determined by this overall test is to be treated as an acceptable level for use in hazard analyses and not as a rigorously determined parameter. The test described below, uses a 5 minute constant current pulse as a stimulus. Other stimuli can be substituted for special purposes. For instance, the 5 minute stimulus is preferred for 2 maximum no-fire level determination whereas a 30 millisecond constant current pulse is preferred for all-fire level determinations and 1 millisecond constant current pulse is preferred for one of the tests in Method 2208. Bruceton tests using 5 minute continuous or pulsed RF stimuli can also be run using this procedure. 2. Number of Required Items. Forty-five or more electroexplosive devices are required for this test. Forty items are required for a Bruceton test. In addition, five items are normally used in estimating the mean and Standard deviation of the firing current. However, more items may be required depending on how well the initial estimates of the mean and standard deviation are made. Very bad choices of the mean and standard deviation cause a failure of the Bruceton test and will require another forty items. Environmental Conditions 3.1 Test temperature. The test should be performed under ambient (approximately 25°C) temperature conditions, or operational temperatures if conditions include exposure of the EED to potentially hazardous pin-to-pin stimuli at elevated temperatures. The BED and heat sink (intended to simulate actual installation) shall be allowed to come to thermal equilibrium at the test temperature before the stimulus is applied to the BED. 3.2 Heat sinking. The heat sinking environment of the BED shall approximate the predicted operational thermal environment. If the thermal environments for the EED usage are multiple or unknown, the minimum heat sinking should be used during the test. If hazards related to "hand held" environments are to be evaluated, the EED should be mounted ia a fixture that effectively insulates the EED against heat transfer to the environment. -a.- METHOD 2203 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 4, Procedure. 4.1 Test description. A 5 minute constant current pulse applied to the bridgewire of the EED shall be used aa the stimuius in a 40 item minimum Bruceton test. Five items, in addition to the 40 teat items are provided ta allow pretest exposures of the EEDs to the test stimuli. This shall provide an estimate of the mean and variance of the assumed log normal density function. The current pulse amplitudes to be used for the test are to be chosen such that neighboring tests vary by a logarithmic increment approximately equal (0.5 to 1.25) to the Standard deviation. In the event of a no-fire the EED will not be disconnected from the system. A current pulse large enough to ensure firing shall be applied to the EED. If the EED still fails to fire, the no-fire data point will be omitted from the test and the reason for the no-fire determined and reported. During testing each exposure shall be monitored to provide a permanent record (an oscilloscope picture, digital recording on floppy disk, etc.) of the voltage and current of the bridgewire during the 5 minute pulse. These records shall be retained by the facility performing the test. 4.2 Calculations. Computation of the Bruceton test results shall be made on both fire (X) and no-fire (0) data. Any deviation exceeding 10% between the X determined sigma and the 0 determined sigma will be sufficient to void the test and be cause for rerun of the test. The difference is computed by the ratio of the larger sigma to the smaller signa, and a ratio greater than 110% Will void the test. Tests showing less chan 4 or greater than 7 or more levels shall also be considered void and the test must be rerun. Confidence levels shall be calculated using the average of the Standard deviations and the average of the means (log) as determined by the X and 0 data. The actual computations of the Bruceton results should be performed by a computer program that is capable of demonstrating its accuracy by calculating log normal density function parameters from simulated Bruceton procedure rest results. These simulated results must be consistent with an assumed log normal density function. This verification, which consists of simulated test results, the assumed distribution parameters, and the Bruceton calculation, should be included with the test results. ‘The 0.001 (0.1%) firing level of the EED, in amperes with 95% confidence, shall be computed from the Bruceton test results. 4.3 Test equipment. Test equipment shall be checked for calibration before any data is taken and an estimate made of maximum errors that are possible in pulse amplitudes and durations. Bruceton Procedure References 1. "Sratisrical Analysis for a New Procedure in Sensitivity Experinents," AMP Report No. 101-18, SRG-P. No. 40, Bruceton Laboratory, Princeton, New Jersey, July 1944, (National Technical Information Center No. ATI-34558) METHOD 2203 -2- 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 2. W. J. Dixon and A. M. Mood, "A Method for Obtaining and Analyzing Sensitivity Data," Journal of the American Statistical Association, Vol. 43, pp 109-122 March 1948. 3. W. J. Dixon and F. J. Massey, "Introduction to Statistical Analysis," McGraw-Hill, N.Y. Ne¥., 1957. 3- METHOD 2203 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 2204 RADIO FREQUENCY (RF) IMPEDANCE. 1, Purpose. To measure the radio frequency impedance of electroexplosive devices.* 2. Apparatus. The impedance measuring equipment shall function at extremely low radio frequency power levels so that the electroexplosive devices are not subjected to heating effects. Automatic equipment is preferred. It ie suggested that no more than 1 millivatt be applied to the electroexplosive device in any firing mode during the measurements. The mounting apparatus used to connect the electroexplosive device to the impedance measuring apparatus will be constructed so that the impedance measurements refer to a point as close to the base of the electroexplosive device (exterior surface of the EED header) ao is possible. 3. Test environment. All tests will be run at room temperature (Gpproximately 25°C). 4, Number of items required. The minimum number of electroexplosive devices to be used in the impedance measurements is ten. These items may be reused in the Method 2207 or 2208 testing. 5. Firing modes. Impedances shall be measured for each potential firing mode of the electroexplosive device. Specifically, pin-to-pin and pin-to-case impedances will be measured for 2-pin conventional hot wire EEDs. For dual bridge wire EEDs measurements will be performed in the pin-to-pin, pin-to-case and bridge-to-bridge firing modes. 6. Frequencies. Impedance measurements will be performed at 10 frequencies between 1 and 1200 megahertz. The individual measurement frequencies should be selected so that neighboring frequencies differ from each other by an approximately equal Logarithmic increment. * During a worst case analysis of a system's susceptibility (Method 4303) to its electromagnetic environment, a worst-case parameter is used for the impedance (i.e. the DC resistance). Tf this worat-case resistance parameter causes a rejection of the worst-case analysis results, RF impedance can be used to reduce predicted analytical results. cilia METHOD 2204 31 JULY 1984MIL~STO-1576 (USAF) 31 July 1984 METHOD 2205 STATIC DISCHARGE SENSITIVITY 1, Purpose, To verify the insensitivity of an electroexplosive device under electrostatic discharge conditions. 2. Procedure: a, Discharge 25 kv from a 500-pfd capacitor applied (with uo series resistor) at the test points for a pin-to-case mode. Pins shall be shorted during this testing. Figure 2205-1 shows the static discharge test circuit. by Discharge 25 kv from a 50U-ptd capacitor applied through a 5 K ohm resistor at the test points for a pin-to-pin mode. c+ The method used for a and b above shall preclude external arcing. d, The EED shall not fire, dud, or deteriorate in performance as a result of this test. SPHERICAL CONTACT 220 Ma ee on 5Ka a i ° 1st ELECTROSTATIC VOLTMETER 500 pfd POINTS 0-25, 000 _| 2 VOLT POWER, SOURCE Figure 2205-1 Static Discharge Test Circuit sae METHOD 2205 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 MeTHOD 2207 RADIO FREQUENCY (RF) SENSITIVITY 1, Purpose, To measure the radio frequency sensitivity of electroexplosive devices and provide an RF no-fire level usable for RF hazard analys a Procedure. Number of electroexplosive devices required: (1) Single bridgewire type EEDs: 230 minimum (2) Dual bridgewire type EEDs: 370 minimum Basic radio frequency sensitivity probing test (1) At each radio frequency to be used in the test, the radio frequency power to be applied to the electroexplosive devices is determined from the mean de firing current measured in Method 2203 and de bridgewire resistance. This level shall be applied to the devices in each mode (i.e, pin-to-pin, pin-to case, bridgewire-to~bridgewire). (2) Equipment used in the tests shall provide a means to account for loss in the power supplying system. Applied powers shall be demonstrated to be those actually delivered to the input of the EED. Mounting hardware for the EED shall be constructed to allow measurement of power as close Co the EED (exterior surface of the EED header) base as possible. In addition the environmental conditions of Method 2203, paragraph 3, shall be complied with. (3) At least 10 frequencies shall be used in the probing tests. These frequencies should be chosen to cover the frequency range from 1 Witz to 32 Gilz and should include any frequency corresponding to a known high power density in the EEDs operational environment. Special consideration should be given to frequencies that correspond to transmitters associated with the overall system of which the EED is a part. If there are no specific requirements, the following approximate frequency and modulation stimuli shall be used. -1- METHOD 2207 31 JULY 1984MIL-STD=1576 (USAF) 31 July 1984 Frequency Modulation * | its a a 27.0 cw I ze 900.0 cw 8900.0 i | repetition rate of 1 KHz. CW = Continuous Wave. (4) At each test frequency, ten electroexplosive devices will be tested for 5 minutes in the pin-to-pin mode and ten in the Pin-to-cace mode. If the clectrocxplosive device hao dual bridgewires, test 10 more in this mode. Up to five electroexplosive devices that did not fire in the pin-to-pin test can be reused in the pin-to-case test. Thus RF probing tests require, at each frequency, 15 items for a two-pin single bridge device and 25 items for a dual bridge device. (5) Count the number of firings at each frequency. At any particular frequency, if two or less fire, it can be stated with very small risk that the electroexplosive devices are less sensitive to the test condition than they are to direct current, and the direct current sensitivity level can be used for subsequent analysis. If from three to seven electroexplosive devices fire, they can be considered to be of the same order of sensitivity to the Lest condition as to the direct current susceptibility level, and the direct current level can be used in subsequent calculations with a risk of approximately 11 percent. If eight or more fire, there is little doubt that the electroexplosive device is more sensitive to the test conditions than to the direct current level. c. Statistical radio frequency tests. (1) From the data obtained in the probing tests described above, determine the most sensitive frequency/nodulation stimulus for each firing mode, in other words, determine the frequency which had the most firings and specify the modulation (pulsed or GW). METHOD 2207 -2- 31 JULY 1984MIL-STD-1576 (USAF) 31 July 198% (2) A 5 minute, 40 item Bruceton test as described in Method 2203, a) shall be performed at the most sensitive frequency/modulation stimulus for each mode. The equipment used shall be the same equipment as used in the probing tests. Forty items are required for each firing mode of the device being tested. Thus 80 items are required for a two-pin single bridge device and 120 items for a dual bridge device. METHOD 2207 31 JULY 1984MIL=8TD-1576 (USAF) 31 July 1984 METHOD 2208 * RADIO FREQUENCY (RF) DUDDING EVALUATION 1. Purpose. This test is used to evaluate the possibility of RF Dudding for EEDs. If RF energy applied to an EED in the pin-to-pin (normal) firing mode can desensitize the EED, then mission reliability can be compromised. This test evaluates the RF dudding susceptibility at the 10% firing level (Probability) at the most sensitive frequency. Essentially the method compares de pulse Bruceton test results (see Method 2203) for virgin items and for EEDs expoocd to the 10% pin-to-pin firing level (1.2816 Sigma below the mean) as determined in Method 2207. Since dudding effects can vary with firing pulse time, the method requires comparison of Bruceton data on RF exposed and non-RF exposed groups for two de pulse times of 5 minutes and 1 millisecond. These are chosen to be long and short, respectively, in relation to the thermal time constant of the EED bridgewire. 2. Nuuber of devices reyuired. A total of 120 devices are required if che results of Method 2203 are available; if not, 165 devices are required. 3. Procedure. The following tests must be performe: (a) Method 2203 must have been performed on 40 units using a 5 minute pulse prior to the tests which tollow. (>) Perform test 2203 on a second group of 40 units using a 1 millisecond dc pulse. (c) A third group of 80 virgin EEDs shall be exposed pin-to-pin using the equipment of Method 2207 to the 10% firing level (probability) as calculated from the pin-to-pin RF Bruceton test of Method 2207. This exposure shall be for 5 minuces. It is expected that several items will fire. (4) The items remaining from the RF exposure shall be divided into two approximately equal groups. One group shall be used to rerun the 1 millisecond Bruceton described in 3(b) above; the other group shall be used to rerun the 5 minute Bruceton performed in accordance with Method 2203 mal density parameters shall be compared for virgin and exposed items for both the 1 millisecond and 5 minute tests. Any large differences in the mean indicate a propensity for RF dudding, or possibly RF sensitization. * This test is not recommended if the electroexplosive devices will not be exposed to RF levels greater than the RF no-fire level, as determined by Method 2207. The maximum RF exposure level is that maximum level determined by Method 4303. -1- METHOD 2208 31 JULY 1984MIL-sTD-1576 (USAF) 31 July 1984 To determine if tne RF exposure ot the EEDs has altered the DC firing characteristics tor either the 5 minutes or 1 millisecond exposure, separately compute: ce ue 7 2 feasts x] Mee (My No > 2) t aeiaiia yaa Tn (is? + Ns,") Ny +N wnere TX¢= Logio (mean ot the control test (amps)) TXg= Logiu (mean of the post-exposure test (amps)) Nc = 1/2 the number of items used in tne control test, rounded to the lowest integer Ny = 1/2 number of items used in the post-exposure test, rounded to the lowest integer a sigma squared for the control test 8,2 = cigma squared of the post-exposure test and compute DE = Ne + nc ~ 2 Note: If Nc = Ny = Now consult Table 2208-1 below and determine the value of t associated with DF (degrees ot treedom) and a “two tailed" probability of a deviation greater than t of .05. Call the value from the table te (for critical t). If te is less tnan or equal to te, we can assume, with 95% confidence, that the KF exposure has not altered the DC tiring characteristics of the devices. The above test is based on a comparison of the mean tiring level of the devices as determined by the two sruceton tests. METHOD 2208 : 31 JULY 1984MIL-STO-1576 (USAF) 31 July 1984 TABLE. 2208-1 ‘TWO TAILED VALUE, OF T FOR 9% PROBASTLUTY* 7 2.5760 30 2.0423 | cy 2.1450 2.0232 a 2.0800 46 2.0148 24 2.0540 49 2.0116 * Values are linear interpolations from commonly published data. -3- METHOD 2208 31 JULY 1984MIL~STD~1576 (USAF) 31 July 1984 METHOD 2402 NO FIRE VERIFICATION 1, Purpose. To verify that the FED will not fire or degrade when subjected to the No Fire Current. 2. Procedure. Test EkVs shall be subjected to the specitied no tire DC current, +5%/-0% for 5 minuces at laboratory ambient conditions. The EEDs The EEDs shall not degrade, ae shown shall not fire av a result of thie test. by firing tests of Method 2405. No external heat sinks are to be used in this test. -1- METHOD 2402 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 2405 FIRING TESTS (EED) 1. Purpose. To verify that the EED will fire upon application of a specified current after being subjected to a specified preconditioning and to verify that the output of the electroexplosive device meets the requirements of the component specitications. 2. Procedure. Detailed procedures shall be specified in the BED component epecification. However, as a minimum, the following shall be required: a, Gas producing EEDs shall be fired in a closed bomb. The following yarameters shall be measured: 1) Time from application of current to bridgewire burn out. (2) Time from application of current to first indication of pressure. (3) Time from first indication of pressure to peak pressure. (4) Peak pressure. b. Detonating EEDs shall be tested using a metal witness plate to record output through a dent depth measurement technique. Specific requirements of this test shall be included in the component specification. NOTE - Firing test requirements for EEDs to be used in a capacitor discharge firing system shall be specified by the procuring activity. -a- METHOD 2405 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 2406 3 & A DEVICE BENCH TESTING 1. Purpose. To verity tnat the device is capable of cycling within its specified operating time. Insulation resistances are verified in each operating mode. The capability to manually safe the device is verified. Safing pin removal effort and retention capability are also confirmed. Procedure a. Remove cafing pin and measure force/torque required for removal (Ref para 5.12.4.g). b. Arm device remotely and measure cycle time (Ref para 5.12.1.3). * c, Measure insulation resistance(s) per Method 2117. d. Safe device remotely. * e. Measure insulation resistance(s) per Method 2117. f. Cycle the device 25 more times and measure each cycle time (safe to arm and arm to safe). g- Return device to safe configuration remotely. * n, Measure insulation resistance per Method 2117. i, Arm device remotely and measure cycle time. * j, Measure insulation resistance per Method 2117. k. Manually safe the device and measure angular displacement of safe rotation as required (Ref para 5.12.3.1.g)- 1, Verity 96a sating pin can be inserted and removed without binding. Install safing pins n, Measure safe pin retention when unit is in safe position and arming current is applied (Kef para 5,12.4.h). * If EkDs or simulator resistors are installed, measure resistance(s) to verity continuity of circuits. -1- METHOD 2406 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 2407 SAFE AND ARM DEVICE FIRING TEST 1, Purpose. To verify that the safe and arm device will fire upon application of a specified current and to verify that the output of the device will initiate a specified explosive train. 2. Procedure. ‘The safe and arm devices shall be fired using the predicted operating current. In the event the operating current is unknown, the specified All Fire current shall be ued. Walf of the devices shall be tested with both detonators receiving current similtaneously, Half of the devices shall be tested with the detonators receiving current sequentially to demonstrate complete redundancy. A minimum of one minute shall be provided between the sequenced detonator tirings. ‘The output of the safe and arm device shall be demonstrated through initiation of the next explosive component in the train. This explosive component shall be mated with the safe and arm device in the normal manner. A witness target shall be used to verify successful initiation. -1- METHOD 2407 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 2410 BARRIER TEST Purpose. To verify that the S6A barrier will prevent initiation of subsequent explosive charges in the event of an inadvertent firing of the detonator when the device is in the safe condition. Apparatus: A test unit shall be used which duplicates all dimensions; Shelading gaps between explosive components, free volune and diaphraga thickness; of the operational S6A which is to be supplied to the procuring activity. The explosive charge normally mated to the S6A for detonation transfer shall be in place. Procedure: a. For rotating barriers, the test unit rotor shall be positioned 50° or greater from the full safe position. For sliding barriers the test unit barrier shall be positioned midway between the safe and the arm position. c+ One test unit shall be fired at 71.1°C (+160°F). One test unit shall be fired at ambient (approximately 25°C) temperature. One test unit shall be fired at -53.9°C (-65°F). Temperature conditioning of at least 4 hours is required. e. The temperature of the test unit shall be measured and recorded at the time of the test unit firing. Results a, S&As which use rotor leads shall not have their rotor leads undergo a low or a high order explosion as the result of the test unit firing. S6As which couple the detonator directly to an external ordnance train shall not have that external ordnance train undergo a low or 4 high order explosion as the result of the test unit firing. The external ordnance train and its specified standoff shall be an integral part of the S6As specification. Minimum standoffs shall be used for the test firing. 7 METHOD 2410 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 2411 S6A ROTOR LEAD FIRING TEST Purpose. To verify that the rotor leads will fire when subjected to the detonating output of the specified initiating component and to verify that the output of the rotor leads meet the requirements of the component specification. 2. Procedure: a. Five percent of each lot of rotor leads, but not less than five units, shall be stabilized and tested at 71.1°C (+160°F). These units shall be fired using the specified detonator at = nominal detonator to rotor lead gap. b. Five percent of each rotor lead lot, but not less than five units, shall be stabilized and tested at -53.9°C (-65°F). These units shall be fired using the specified detonator at the maximum specified detonator rotor lead gap plus 202. Rotor lead output shali be measured as in paragraph 2.a. ¢. Rotor lead output shail be tested using a metal witness plate to record output through a dent depth measurement technique. Specific requirements of this test shall be included in the component specification. sa MBTHOD 2411 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 GROUP 3000 ENVIRONMENTAL TEST METHODSMIL~STD-1576 (USAF) 31 July 1984 METHOD 3113 RANDOM VIBRATION 1. Purpose. To demonstrate the ability of the component to withstand the predicted random vibration environment which is imposed upon the component in flight, plus a design margin of safety. 2. Test description. The component shall be mounted to a rigid fixture through the normal mounting points of the component. The component shall be tested in each of three mutually perpendicular axes. 3. Test levels. a. The qualification test level (in g rms units) shall be no less than 6 4B greater than the maximum predicted vibration response level. This minimum test level shall not be less than 12 g rms. b. The acceptance test shall be run at the maximum predicted vibration response level, but not less than 6 g rms. 4. Duration. The qualification test duration in each of the three orthogonal axes shall be three times the expected flight exposure time to the maximum predicted environment, but not less than 3 minutes per axis. The acceptance test duration shall be the expected flight exposure duration, but not less than one minute. -1- METHOD 3113 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 METHOD 3114 skOCK 1. Purpose. To demonstrate the capability of the component to withstand the predicted transient shock environment imposed upon the component in flight, Plus a design margin of safety. 2. Test description. The component shall be mounted to a rigid fixture through the normal mounting points of the component. Transient shocks shall be applied to the component three times in each direction along each of three mutually perpendicular axes. Test methods may include techniques such as shaped pulses, complex decaying sinusoids, or electrodynamic shaker systems to synthesize the waveform. The damage potential of the synthesized waveform and the flight transient are the same when the shock response spectra are equal. The test shock waveform shall be applied and measured at the interface of the component being tested and the test fixture. 3. Test levels. The test shock spectrum shall be 6 dB above the maximum predicted transient shock response spectrum. In absence of more definitive data, the test shock waveform shall approximate a one-half sinusoid measured at the interface of the component being tested and the test fixture. The peak level and duration of the pulse shall be sufficient to cover the severity of the maximum expected flight shock environment plus a 6 dB margin of safety. -1- METHOD 3114 31 JULY 1986MIL=s7D-1576 (USAF) 31 July 1984 METHOD 3401 HIGH TEMPERATURE EXPOSURE 1. Purpose. To determine the ability of the device to withstand exposure to specified high temperature. 2. Procedure: EEDs shall be placed in an oven preheated to 30°C (54°F) above the waxinum predicted temperature during service life, but uot less than T1.1°C (4160°F), for a period of 1 hour. The EEDe shall not autoignite aor decompose as a result of this exposure. The lack of decomposition shall be verified by dissecting the item and visually inspecting for any decomposit ion/degradat ion. =2- METHOD 3401 31 JULY 1984MIL-S1D-1576 (USAF) 31 July 1984 METHOD 3403 HIGH TEMPERATURE STORAGE (ACCELERATED AGING) 1. Purpose. To subject the EED to an extreme storage environment as part of an accelerated aging test. Subsequent testing will determine the existence of an anomalous condition introduced by material variation or assembly procedures ) would shorten the service Life of an explosive compouent. whi 2. Procedure. Store explosive components at #71.1°C (+160°F) and 40 to 60 percent humidity for 30 days. METHOD 3403 31 JULY 1986 aeMIL-STD-1576 (USAF) 31 July 1984 METHOD 3407 ‘TEMPERATURE CYCLING 1, Purpose. To decermine che ability of an electroexplosive subsystem component to resist cyclic exposure to extremes of high aud low temperatures. 2. Apparatus. The test apparatus shall be capable of inducing a temperature transient in che component(s) equal to the worst case predicted thermal transient but not less than 3°C (5.4°F) per minute. The apparatus shall have the capability of maintaining the component at the high and low temperature plateau for no less than two hours. 3. Procedure. The high temperature shall be che maximum predicted under vorst case conditions plus an 11°C (20°F) margin, but not less than 71.1°C (160°F). The low temperature shall be the minimum predicted under worst case conditions with a margin af -11°C (-20°F) or -53.9°C (65°F) whichever is the colder. a. The minimum number of cycles shall be eight. Each cycle shall have a 2 hour or longer dwell at the high and low temperature levels. The transitions between high and low temperatures shall be at the maximum predicted thermal transient for the components, but not less than 3°C (5.4°F) per minute. Failures shall be based on measurements and visual inspection made after the specimen has reached thermal stability at room temperature following the last cycle. -1- METHOD 3407 31 JULY 1984MIL~STD-1576 (USAF) 31 July 1984 METHOD 3408 TWENTY FOOT DROP TEST 1, Purpose. To demonstrate the capability of the Safe & Arm Device to survive a fall of twenty feet. 2. Apparatus. The Safe & Arm device shall be dropped on to a 1/2" thick steel plate froma height of twenty feets The device shall not fire ac a result of the impact, and shall be safe to handle for aubsequent disposal. The device need not be functional following this test. 1S METHOD 3408 31 JULY 1984lL. Purpose: Procedure height of MIL-STD-1576 (USAF) 31 July 1984 METHOD 3409 SIX FOOT DROP TEST To demonstrate that the EED will not initiate when dropped from ix feet and will perform to specification after impact. The EED shall be dropped on to a 1/2" thick steel plate from a six feet. Two drops of each initiator shall be conducted. The first drop shall cause the initiator to impact on the output end. The second drop shall cause the initiator to impact on the cide. The EED shall not test. fire, dud, or deteriorate in performance as a result of this -a1- METHOD 3409 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 cRouP 4000 ANALYTICAL EVALUATIONMIL-STD-1576 (USAF) 31 July 1984 METHOD 4303 WORST CASE ELECTROMAGNETIC HAZARD ANALYSIS 1. Purpose. To provide an analytical method for evaluating potential RF hazards to EEDs. 2. Information Required. b. Electroexplosive device characteristics: (1) The Results of Direct Current Sensitivity Method 2203 (2) The Results of Radio Frequency Impedance Method 2204 (3) The Results of Radio Frequency Sensitivity Method 2207 Electroexplosive subsystem component characteristics 3. Configurations to be analyzed. All configurations in which premature initiation could result in a hazard shall be analyzed. Most electroexplosive devices used in electroexplosive subsystems are subject to the following configurations of concern: be Installed: electroexplosive device installed in its subsystem and all systems fully assembled. Check out: electroexplosive device installed in its subsystem and additional non-flight-test equipment attached to the electroexplosive subsystem for checkout. Partially assembled: electroexplosive device installed in a partially assembled electroexplosive subsysten. Installation and Hook-up: Installation and electrical connection of the electroexplosive device in the electroexplosive subsystem. Hand held: the electroexplosive device literally "hand held" prior to installation. In each of these configurations, and perhaps other configurations, the electroexplosive device may be subject to premature ignition due to coupling of electromagnetic energy from the electromagnetic environment to the electroexplosive device. ae METHOD 4303 31 JULY 1984MIL-STD-1576 (USAF) 31 July 1984 4, Electromagnetic environment. The electromagnetic environment to be assumed incident upon the electroexplosive device or electroexplosive subsystem shall be dictated by the actual environment to be experienced. in Lieu of knowledge of the actual environment to be experienced by a particular electroexplosive subsystem, an electromagnetic environment of 2 watts per square meter, from 1 megahertz to 50 megahertz, and 100 watts per square meter from 50 megahertz to 32 gigahertz, shall be assumed. 5. General analytical approach. All analyses shall be carried out in accord witn "Monograph on Computation of KF Hazards", Monograph M-C2210-1, prepared by the Applied Physics Laboratory of the Franklin Research Ceuters 6. Specific analysis performance. The specific analysis shall demonstrate an overall understanding of the handling and sequence of events in the electroexplosive system buildup in electromagnetic environments that may lead to critical or catastrophic hazards. All critical and catastrophic hazard configurations must be analyzed. Although simple calculations of coupling through shielding and aperture penetration may be presented in simple derivative form, all calculations of antenna aperture shall be systematized with a computer program that has been demonstrated to conform with "Monograph on Computation of RF Hazards". (See Appendix for a sample program.) All computations shall be formalized using an aperture parameter so that evaluation of power delivered to the electroexplosive device results from a simple multiplication of the assumed electromagnetic environment and the aperture as a function of frequency. The results of chis calculation, the worst case power to the EED, as a function of frequency shall be compared with the RF no-fire level (as determined in Method 2207) for the particular firing mode under consideration. The results of this comparison shall be presented as a dB of safety parameter. This dB of safety parameter is a function of frequency and is defined as P, dB = 10 logig "NE BED where PNF is the no-fire level from Metnod 2207, ana Peep is the calculated worst case power delivered to the BED. The dB of safety parameter shall be plotted on 8-1/2" x 11" paper for a frequency range from 1 megahertz to 32 gigahertz on semilogarithmic graph paper, The impedance results of Method 2204 can be used in the calculation of the pickup for the frequency range from 1 to 1200 megahertz. The dB values less than 0 are to be con electroexplocive subsystem redesign. idered hazardous and require METHOD 4303 -2- 31 JULY 1984MIL-S1D-1576 (USAF) 31 July 1984 APPENDIX EXAMPLE EEO ANALYSIS TOOL 10, GENERAL. 10.1 Scope. This appendix is included as part of this Standard for the purposes of providing an example analysis tool to assess the safety of clectroexplosive devices (LLDs) in environments with stray electromagnetic signals. Use of this technique to satisfy the requirements of paragraph 6.10.c and Test Method 4303 is not mandatory as other techniques and mechanizations are available. Consequently, the user of this tool assumes full responsibility for his results. 10.2 Overview and Application. This analysis tool pertorms a "worst case" analysis of the EED subsystem to determine if the EEDs are safe in the payload's RF environment. If this analysis shows a system is safe, then it is quite safe. On the other hand, an indication of "not safe" from the analysis does not prove that the system is unsafe, but that more specific analysis or testing is required for the system safety to be established. 20, REFERENCE DOCUMENT. ‘The methods used in tne analysis tool are based on analytical models discussed in the following document: M-CZz10-1 Monograph on Computation of RF Hazards, Monograph M-C2210-1, Franklin Research Center (application for copies of this publication should be addressed to the Franklin Research Center, 20tn Street and Race, Philadelphia, Pennsylvania 19103) 30. DEFINITIONS. Not applicable.MIL-STD-1576 (USAF) 31 July 1984 4U. GENERAL DESCRIPTION 40.1 Host Computer. 40.1.1 Deseripeion. This EED Analysis Tool is implemented on an HP=R5 Personal Computing System. Peripheral equipment includes a HP82901M Dual Flexible Disk Drive, HP7225A Plotter, and HP2613B Line Printer. The HP-85 ust have at least 32K of internal memory and be programmable in BASIC. 4U.1.2 Power-up Procedures. a. Turn equipment on: First turn on all peripherals to be used (disk drive, printer, plotter). Then turn on the HP-85 unit. b, Insert program diskette into Drive 0 and data diskette into Drive 1. c. Run Program: the program is run by loading and running a tile named MANAGER. Type: GHAIN "MANAGER" and press [End Line]. No further user initialization is required. 4U.2 EEDAT Program Protocol. 40.2.1 System Prompts. Whenever the software reaches a point requiring user input, it displays a descriptive phrase followed by "?" as follows: ENTER FOWER DENSITY [W/m] 40.2.2 User Responses. The user should type the appropriate entry and press {end Line]. 40.2.3 Data Files. Data files are created at several points in the program. At each of these points the user is given 3 options: a. Use the default file b. Use an exieting file c. Create a new file 40.2.3.1 Default Files output file. These are: Default files exist for four data files and the DEFAULT FILE: USED FOR ‘TEMP EM Environment Data EXDSEN Sensitivity Data EEDIMP Impedance Data SHIELD Shielding Daca ourpuT Output Data the default files are appropriate if uecr ie not concerned about losing daca files on subsequent runs. Files which are ro be re-used should be entered via the "Create" option and given a unique name.MIL-STD-1576 (USAF) 31 July 1984 40.2.3.2 User Detined Files. The user must insure that correct bookkeeping is followed. Two cautions regarding user defined files are appropriate: (a) there is no check to insure that data files are properly used; ives, no test is made to assure that an impedance file is being used for impedance tata and (>) improper naming of files can cause a halt in program execution; e.g., creating a new file with a name already being used to name an existing file or attempting to recall a data file which doesn't exist are fatal errors. 40.2.4 Error Recovery. To recover froma fatal error, the user must type CHAIN "MANAGER" [End Tine] and start over. 50. DETAILED DESCRIPTION. 50.1 Program Executive. There are three basic functions from which the user may select: environment specification, model selection and output. The top level flow chart which shows relationship between the various functions and files is shown in Figure A-l. The executive which calls the principal subroutines is named MANAGER. MANAGEK causes the appropriate function to be executed based on keyboard input by the user. User prompting is provided through the Main Menu of MANAGER as shown below: EED ANALYSIS PROGRAM (1) ELECTROMAGNETIC ENVIRONMENT (2) PROCESS DATA FILE FOR OUTPUT (3) SELECT + RUN ANALYSIS MODEL (4) PROCESS PROGRAM OUTPUT (5) END PROGRAM 50.2 Electromagnetic Environment Input. This function is accessed by selecting subroutine (1) of the Main Menu. The user specifies the electromagnetic environment in which the ED is to be analyzed, following the computer prompt: DATA FILE SELECTION ELECTROMAGNETIC ENVIRONMENT (1) USE DEFAULT FILE (2) USE EXISTING FILE (3) CREATE NEW FILE (4) RETURN TO MAIN MENU options (1) through (3) give the user some flexibility in handling the EM environment data. New environment data is input to either a temporary file using option (1), or to a permanent tile using option (3). An existing permanent file containing the desired EM environment data can be accessed by exercising option (2).MIL-S7D-1576 (USAF) 31 July 1984 INPUT FUNCTION OUTPUT 8 PRs ELecTROWGNETIC usta tens Sonia |__| eae ao >| ir sont ron awe be ewan ste seucerio are ED USER ENTERS: ‘SYSTEM DATA ee EED SYSTEX APPROPRIATE. oe DATA TO MODEL rm veer omens —— es exe £20 EF wecomce ‘ATA AS REQUIRED >_> ee ELgcTnomaneric Evingwent om rite PROG cova BA FILE tx BE ecoance one Be sexsttivity DATA FILE swe Arreaation outa FILE SER SELECTION Pagcaan cont DAA Fe DIA FILE Sensitivity eo SHIELD ‘Srromulrioe 0 parkas Pr sexsrrivarr memuineo, Ban FILE Br LYSIS rove CHOSE — ‘oun Arrouarion OMA FILE Exp systox orn —| aursls San ru ono rue ore oun rie (Bc EntoweR) 00 FIGURE A-1 Overall ans ranaan Porro Flow ChartMIL-STD-1576 (USAF) 31 July 1984 If the user selects either option (1) or option (3) he has the further option of entering the data in power density or field strength, and will be prompted as follows: DO YOU WISH TO INPUT AS FIELD STRENGTH (V/M) OR POWER DENSITY w/t) ¢ ENTEK 'V' oR ‘Ww! ? 50.2.1 Option (1): USE DEFAULT FILE. This option enables the user to define EM environment data in the default file TEMP. This option will overwrite any data previously stored in the default file. ‘The following menu appears after option (1) above 1s selected: ELECTROMAGNETIC ENVIRONMENT SPECIFICATION loption 1a:J (1) INDIVIDUAL SoUKCES lOption 1b:] (2) SPECTRUM SPECIFICATION loption le: (3) NIL-STD-1512 DEFAULT LEVEL (2 Wwe Soxn2-Sumiz| (00 w/w#M SuMHZ-4oGHZ.| (4) RETURN TO MAIN MENU luption 1a: 5.2.1.1 Option la: INDIVIDUAL SUUKCES. Uption (1a) permits specification of the environment as a sum of inputs of up to 100 discrete sources, each of which has a name, a frequency, and signal strength in volts-per-meter or watts-per-square-meter. The following is an example of entry for one source: ENTER INDIVIDUAL RF SOUKCE MAXIMUM OF 12 CHARACTERS ENTEX SOURCE NAME OR ID: 2 [User Kesponse:] —FPS-67 ENTER FREQUENCY OF SOURCE [MHZI: [User Kesponse:] 2900 ENTER FIELD STRENGTH V/M OF SOURCE AT THE EED: lUser Response:] 1 ENTER ANOTHER SOUKCE [Y OR NJMIL-STD=1576 (USAF) 31 July 1984 Additional sources may be entered by entering "Y" (tor Yes) to the last question. Each source may be entered in any order, not necessarily by ascending frequency. When all sources have been entered, enter "N" (for No). Program execution will then return to the Main Menu. 50.2.1.2 Option 1b: SPECTRUM SPECIFICATION. Option (1b) permits specification of the environment as a continuous spectrum. The lowest frequency and its signal strength, the highest frequency and its signal strength, and exactly eight intermediate points on the spectrum in an ascending frequency order are specified. A partial example of the data entry eyele for thie option is presented below: SPECTRUM SPECIFICATION SPECTRUM WILL BE SPECIFIED BY ENTRY OF LOWER AND UPPER FREQUENCY BOUND AND 8 INTER MEDIATE FREQUENCIES EACH WITH AN ASSOCIATED POWER. BETWEEN ENTRIES, VALUES WILL BE LINEARLY INTERPOLATED. ENTER LOW FREQUENCY BOUND (HZ J: [User Response:} -v1 ENTE POWER DENSITY [W/H*M]: [User Kesponse:} «1 ENTEK TOP FREQUENCY BOUND [MHZ]: ser Kesponse:/ 4u000 ENTER POWER DENSITY (W/M*M|: UUser Kesponse:] 205 ENTEX INTERMEDIATE FREQ 1 [MHZ]: lUser Kesponse:] 2800 ENTER POWER DENSITY [W/M*M): [User Response: | ENTEK INTERMEDIATE FREQ 2 [1H]: [User Response:} 2801 ENTER POWER DENSITY [W/MAM] + [User Response:} 1MIL-STD-1576 (USAF) 31 July 1984 ENTER INTEKMEDIATE FREQ 3 [MHZ [User Response:} 2802 ENTER POWEK DENSITY (w/M*M|: [User Response:] 10 ENTER INTERMEDIATE FREQ 4 (MHZ): [User Keaponse:| 2805 ENTER POWER DENSITY (W/M%M] : lUser Response:] 1 ENTER INTERMEDIATE FREQ > [MHZ J: [User Response:] 2806 ENTER POWER DENSITY [W/w*M] : 2 [User Response: | 50.2.1.3 Option le: MIL~STD-1512 DEFAULT LEVEL. Option (1c) is the default level identified in MIL-STD-1512, and corresponds to the maxinum safe radiation level for personnel. It ia a apectrum opecification, defined as a level of 2 watts per square meter between 50 KHz and 50 MHz and 100 watta per square meter between 50 Miz and 40 GHz. 50.2.1.4 Option 1d: RETURN TO MAIN MENU. After data entry for each of the three options ts-completed, Control automatically returns Co MANAGEK and the Main Menu is displayed. Also, RETURN TO MAIN MENU may be commanded at any time it is visible on the monitor screen. 50.2.2 Option (2): USE EXISTING FILE. This system allows the user to use data in a file which was previously created via option (3) (see 50.2.3). After selecting option (2), user is prompted with ENTER EXACT EXISTING FILE NAME Now enter the file name of the existing file containing EM environment data. If a matching file is found this file becomes the environments file used in the analysis, program control returns to MANAGER, and the Main Menu is again displayed. If no file name is found to match the name internal, the following message appears: Error 67 on Line 657 : FILE NAME Program execution ceases and the user must re-initialize by typing CHAIN "MANAGER" [End Line]. 50.2.3 Option (3): CREATE NEW FILE. This option requires the user to input anew file name and data. ATMIL-STD-1576 (USAF) 31 July 1984 The user is prompted wicn: ENTEK NEW FILE NAME (if user enters the name of an existing file, the following error message Error 63 on line 560 : DUP NAME will appear, program execution ceases and the user must re- typing CHAIN "MANAGER" [End Line].) nitialize by From this point through completion of entry of EM environment, the data entry procedures are identical with those of the Default File, option (1) (see 50.261). 50.3 Select & Run Analysis Model. This function is accessed when subroutine (3) of the Rain Menu is selected. 1c contains routines for input of EED data and computes the power coupled into that EED as a function of frequency. The user epecifies the physical parameters of the EED cubsystem and chooses the type of analysis. The program stores results on output data files. 50.3-1 Data Kequirements. A file for storing output data, data which specifies the EED radio frequency (KF) sensitivity, the impedance of the EED, and the physical measurements ot the installation are required tor all analyses. In addition, other data may be required depending on the type of analysis being accomplished, such ao information relating to the chielding of the input leads. 50.3.1.1 Qutput Data File Selection. The user must first specify the name of the output data file where output of the analysis is stored. The following prompt 1s displayed: DATA FILE SELECTION ANALYSIS OUTPUT DATA FILE (2) USE DEFAULT FILE (2) USE EXISTING FILE (3) CREATE NEW FILE (4) RETURN TO MAIN MENU SELECT FROM ABOVE ‘The selections listed here are executed similarly to those described in a 3.1.2 Analysis Model Selection and Spectrum. Selection of the analysis model is driven by the physical properties of the system to be analyzed. The single bridgewire E&D has two basic modes of RF seusitivity: Pin-te-Pi: which is the normal bridgewire heating firing mode, and Pin-to-Case, which involves various other firing mechanisms. Also, a system may he either A-8MIL-STD~1576 (USAF) 31 July 1984 shielded or unshielded. These variations are addressed in the Model Selection Page which is displayed when the user has completed naming the output file, eget FRANKLIN INSTITUTE WORST CASE APERTURE MODEL (Model 1:] (1) UNSHIELDED PIN-TO-PIN {Model 2:) (2) SHIELDED PIN-TO-PIN [Model 3:] (3) PIN-TO-CASE (4) RETURN TO MAIN MENU SELECT FROM (1-4) 50.3.1.3 BED RF Sensitivity Data File. Once a model has been selected, the user must identify the name of an RF Sensitivity Data File and will be prompted with the following display: DATA FILE SELECTION PIN-TO-PIN BED RF SENSITIVITY DATA FILE (option 2a:] (1) USE DEFAULT FILE {option 2b:] (2) USE EXISTING FILE (option 2c:] (3) OREATE NEW FILE SELECT FROM ABOVE (1£ model 3, the pin-to-case model, is being used, "PIN-TO-CASE" appears in place of "PIN-TO-PIN"). 50.3.1.3.1 Default or New EED Sensitivity Data. If user selected options 2a or 2c then he will now enter EBD RF sensitivity data as follows: ELECTROEXPLOSIVE DEVICE RF SENSITIVITY SPECIFICATION (option 3a:] (1) CONSTANT SENSITIVITY [option 3b] (2) SENSITIVITY SPECTRUM SPECIFICATION [Option 3c:] (3) NSI-1'S RF SENSITIVITY 50.3.1+3-1+1 Option 3a: CONSTANT SENSITIVITY. Option (3a) CONSTANT SENSITIVITY can be chosen if more detailed data is unavailable. User would then be requested to specify a value for the sensitivity: ENTER CONSTANT RF SENSITIVITY (warTs | 90.3.1.3.1.2 Option 3b: SENSITIVITY SPECTRUM SPECIFICATION. Option (3b) SENSITIVITY SPECTRUM SPECIFICATION enables user to specify a sensitivity at ten frequencies, in a manner similar to that described previously for the spectrum £M environment (see 50.2.1).MIL-ST0=1576 (uISAF) 31 July 1986 5U.3.1.3.143 Uption Je: NOIML"s KF SENSITIVITY. opcion (3c) NSIM1's RF SENSITIVITY may be selected if the NASA Standard Initiator-1 (NSI-1) is the HED boing analyzed 50.3.1.3.2 Previously Entered BED Sensitivity Data. If instead of choosing the Detault File or creating a new file, the user elected to use an existing file, he would be prompted to name an existing file, and the program would continue directly to the next portion of the program. 50.3 .4 Shielding Data File. If user has chosen a model requiring shielding data, the user will be prompted with the choices: SHIELD ATTENUATION DATA FILE (option 4a:} (1) USt DEFAULT FILLE loption 4b:] (2) USE EXISTING FLLE lopeion 4e:} (3) CREATE NEW PILE SELECT FROM ABOVE, 50.3.1.4.1 Previously Entered Shield Data. Option 4b USE EXISTING FILE will employ the results of a previously created and named tile. 5U.3.1.4.2 Default or New Shield Data. Option 4a and 4c will be followed by the prompt SHIELD ATTENUATION SPECIFICATION [Option da:] (1) CONSTANT ATTENUATION Loption (2) ATTENUATION VS. FREQUENCY Lopeion (3) "ercuRE 2" SHIELD DATA loption (4) DEFAULT (20dB CONSTANT) SELECT FROM ABOVE options (Sa) and (5b) are exercised similarly to the spectrum and sensitivity specification options (see 50.2.1 or 5U.3.1.3)- Option (5c) "FIGURE 2" SHIELD DATA is composite data created for a specific program. It is provided for illustrative purposes only and should not be used indescriminately. Option (54) uses a constant 20 dB attenuation. 50.3.1.5 Impedance Data File. A data file is now identified and values entered. First the prompt for file choice appear: EED RF IMPEDANCE DATA PILE [option 6a:| (1) USE DEFAULT FILE [option 6b:] (2) USE EXISTING FILE loption 6c:] (3) CREATE NEW FLLE SELECT FROM ABOVEMIL-STD-1576 (USAF) SL July 1994 Option (6b) Ust EXISTING FILE will employ the results of a previously created and named file. Options (6a) and (6c) are followed by a prompt to specity frequency as a constant across the frequency band, or as a spectrum specitication, as follows: ELECTRUEXPLOSIVE. DEVICE KF IMPEDANCE SPECIFICATION (1) CONSTANT IMPEDANCE (2) SPECTRUM SPECIFICATION SELECT FROM ABOVE bata input is similar to that previously described in paragraph 50.2.1 or 50.3.1.3. 50.3.1.6 Geometry of Connecting Leads. A critical point in the physics of euergy coupling is Che physical size and arrangement of the leads connected Lo the EED. The data describing the arrangement of the leads may be input in two ways: (a) as length and width of a presumed rectangular aperture, or (bh) as the area and perimeter of an aperture. The equations for power coupling use area or perimeters, so the user should use length and width with care. An example of the data input sequence is shown below: ENTER AREA OF LOOP (CMSQ) ENTER 'U' IF NOT KNOWN. IUser Response:] 9.5 ENTER PEKIMETER OF LOUP [CM]. ENTER 'U' IF NOT KNOWN. lUser Kesponse:] 30.4 ENTER WIDTH OF LOOP (CM). ENTER 'U' IF NOT KNOWN. [User Response:} 0 ENTER LENGTH OF LOOP (CMJ. ENTER '0" IF NOT KNOWN. [User Response:] 0 50.3.2 Model Execution. Following entry of the geometry data, the program computes power coupled into the EED, stores the results on the data diskette and returns control to the main ment. The equations used in the computations are described in paragraph 60. 50.4 Output Format Processor. Any of the data files created during program execution may be output to the plotter, line printer or both devices upon user command. Data files for electromagnetic environment, EED sensitivity or impedance are accessed through selection of subroutine (2) in the Main Menu. ALLMIL-S1D~13/6 (USAF) 31 July 1984 The analysis output file containing the results of the power calculations is processed tor output through selection of subroutine (4) in the Main Menu. ‘Tne following cnoices are available for the user: a. Title of plot or Listing b. Scale range (plotter only) cs Axes labels (plotter only) 4. Linear or logarithmic axes (plotter only) Needed uset actions are clearly indicated in the instructions displayed for each entry. The program requests specitic choices and responds appropriately to user comands during the course of the execution. 60. POWER EQUATIONS. kquations used in this program were developed by Franklin Kesearch Institute and adapted for this program as follows: 60.1 Gase 1: Pin-to-Pin, Continuous Incident Spectrum. For an aperture of small size with respect to wavelength (lambda/2 greater than P) the power coupled to the EED as a function of frequency may be expressed as W (£) = 4.67 * 16 * 2 *B (£) pi * (lambda)? ty. where: W (£) = power spectral density coupled to the EED (Watts/Hz) A Area of aperture formed by input leads to EED (meters squarea) P, (£) = power spectral density incident on EED leads (Watts/meter squared/Hz) lambda = wavelengeh at frequency £ (lambda ~ 3 x 104 meters) kp termination resistance of EED (ohms) e = perimeter of aperture (meters) f = frequency (Hz) For an aperture of large size (P greater than lambda/2) W (£) = DUambda)? Pi (£) 4 pi where: > directivity of loop. For worst case calculations, a composite directivity of 3 antennas is used. The composite as given in the reference document is shown here as Figure A-2. aniMIL-STD-1576 (USAF) 31 July 1984 STRAIGHT LINE APPROXIMATION peosders £17 pr aak £217 y = y z y | 5 y S| straror vine y z APPROXIMATION 3) To MAXIMUM g] bisecriviry Ovens Lead LenaTa, © MAXIMUM DIRECTIVITY OF THREE KNOWN ANTENNA CONFIGURATIONS the unterminated rhombic, the long wire, and the circular loop. FIGURE A-2 Antenna Directivity an13.MIL-STD=1576 (USAF) 31 July 1984 bU.2 Case 2: _Pin-to-Pin, Discrete Incident Spectrum. The same equations apply except that W (f) and Pi (f) have units of watts and watts per meter squared, reopectively. 60.3 e 3: Pin-to-Case. For high frequencies. W Cf) = Py Cf) 1.64Clambda)? 4% pi ‘The directivity of the loop is ascumed to be that of a half dipole (1.64). For low frequencies, w(£) =P; (£2 12_z, RelepgI where: 1 = lead length in meters we) = power coupled to the EED (vatts) Puce) = power incident on FED leads (watts/meter aquared) Zo impedance of free space (ohms) RelZpe(£)] = real part of the pin-to-case impedance at a particular frequency (ohms). 70. PROGRAM LISTINGS. ‘The following pages contain listings for tne four programs used to support the BED Analysis Tool. All programs have been written in BASIC for the HP-85 Compucer-70.1 MIL~STD-1576 (USAF) 31 July 1984 Program Listing For EED ANALYSIS PROGRAM 10 REM LED ANALYSIS PROGRAM 20 REM 30 REM io REM 50 REM 60 REM 70 REM THIS IS THE MANAGER FOR THE EED ANALYSIS PROGRAM 80 ASSIGN# 2 TO "PFLAGS:D701" 90 ASSIGN# 5 TO *TEMP:D701" 100 REM 110 CLEAR 120 BEEP @ WAIT 200 @ BEEP @ WAIT 200 @ BEEP 130 DISP * EED ANALYSIS PROGRAM" 1Ho DISP 150 DISP "(1) ELECTROMAGNETIC ENVIRONMENT® 160 DISP 170 DISP "(2) PROCESS DATA FILE FOR OUTPUT® 180 DISP 190 DISP "(3) SELECT + RUN ANALYSIS MODEL" 200 DISP 210 DISP "(4) PROCESS PROGRAM OUTPUT" 220 DISP 230 DISP *(5) END PROGRAM" 2u0 DISP 250 DISP " SELECT FROM (1-5) 260 INPUT St 270 REM BRANCH BASED ON CHOICE 280 IF S1=1 THEN GOSUB 340 290 IF Si=2 THEN GOSUB 720 @ CHAIN "LPLOTS" 300 IF S1=3 THEN GOSUB 340 @ GOSUB 1050 @ CHAIN "FRANK2" 310 IF St=4 THEN GOSUB 340 @ CHAIN "LPLOTS" 320 IF S1=5 THEN END 330 BEEP @ GOTO 110 340 REM FILE SELECTION 350 CLEAR 360 DISP * DATA FILE SELECTION" 370 DISP 380 IF St=1 THEN DISP " ELECTROMAGNETIC ENVIRONMENT" 390 IF S1=3 THEN DISP " ANALYSTS OUTPUT DATA FILE” 400 IF S1= THEN DISP "OUTPUT DATA FILE TO BE PROCESSED" 410 DISP 420 DISP "(1) USE DEFAULT FILE" 430 DISP "(2) USE EXISTING FILE” 4uO IF S1#4 THEN DISP "(3) CREATE NEW FILE" 450 DISP "(4) RETURN TO MAIN MENU" N60 DISP 470 DISP * SELECT FROM ABOVE" 480 INPUT S2 490 REM An15,70.1 MIL-STD~1576 (USAF) 31 July 1984 (Continuea) 500 IF $2=1 AND S. 510 IF S2=1 AND S1=3 THEN U1$="OUTPUT" 520 IF S2=1 AND S1=4 THEN U1$="OUTPUI" 530 IF $2=2 THEN DISP "ENTER EXACT EXISTING FILE NAME" @ INPUT U1S 54U L¥ $23 AND S1#4 THEN DISP "ENTER NEW FILE NAME" @ INPUT U1$ 550 REM CREATE PILE 560 IF $2=3 AND S. 570 IF S2=3 AND §. 580 IF $24 THEN 110 590 REM STORE FILES IN PFLAGS 600 IF S1=1 THEN PRINT# 2,20 ; ULB 610 IF S1=3 THEN PRINT# 2,24 ; ULB 620 IF $1=4 THEN PRINT 2,24 3 ULb 630 ! 040 IF S1=1 AND S2#2 THEN CHAIN "FENTER" 650 ! 660 ! TEST EXISTING FILE NAME 670 ! TO BE SURE IT EXISTS THEN UL$="eDaTA" THEN CREATE U16" THEN CREATE ULBA" D7U1", 102,40 D701", 1000, 32 SIGN# 1 TO U1$6"":D701" 720 PROCESS FILE 730 740 CLEAR 750 DISP"" PROCESS FILE FUR OUTPUT" 760 VISE 770 DISP "SELECT DAYA FILE TO ¥E PROCESSE! 780 DISP (1) DEFAULT SENSITIVITY DATA" 790 DISP " (2) DEFAULT SHIELD DATA" 800 DISP " (3) DEFAULT IMPEDANCE DATA" B10 DISP " (4) SOME OTHER DATA FILE" 82U DISP " (5) RETURN TO MAIN MENU" 830 INPUT 83 840 IF S3-5 THEN 110 850 IF $3=1 THEN UL$="EEDSEN" & GOTO 910 860 IF S3*2 THEN ULS="SHIELD" 6 GOTO 910 870 IF $33 THEN ULB="EDIMe" & GOTO 910 880 IF S3#4 THEN GOTO 720 89U DISP @ DISP "ENTER EXACT FILE NAME" 900 INPUT ULS 910 ASSIGN# 9 TO U1L$6":D701" 920 REM STORE TEMP AS OUTPUT FILE IN PFLAGS 930 PRINT# 2,24 ; "TEMP" 940 PRINT# 2,3 5 10 950 REM PROCESS’ FILE 960 READF 2,2 ; De READF 2,3 5 Q 970 FOK G=1'T0'Q } T HOPE 980 IF D1 THEN READ? ¥,G 5 S6,F,P6 GOTO 1000 990 READ# 9,G ; F,P @ Ise A-16MIL-STD-1576 (USAF) 31 July 1984 70.1 (Continued) 1000 1010 1020 1030 1040 1050 1060 1070 1080 1090 1100 1110 1120 1130 1140 1150 1160 1170 1180 1190 1200 1210 1220 1230, 1240 1250 1260 1270 1280 1290 1300 1310 1320 1330 1340 IF P=0 THEN DO=0 ELSE DO=LGT(1000xP) ! dB aW PRINT? 5,6 5 F,P,P,D0 NEXT G RETURN : SELECT MODEL CLEAR DISP " FRANKLIN INSTITUTE WORST CASE" DIsP ” APERTURE MODEL" DISP. DISP. DISP "(1) UNSHIELDED PIN-TO-PIN" DISP. bIsP. DISP. DISP "(3) PIN-TO-case" bIsP. DISP "(4) RETUKN TO MAIN MENU" DIsP. DISP. DISP" SELECT FROM (1-4)"; DISP. INPUT SL Ip sls4 THEN 110 IF S1<1 OK $1>3 THEN 1200 PRINT# 2,1 ; SL REM MODEL CHOICE STORED DISP USING 1290 ; Si IMAGE 9X,"MODEL"K, "CHOSEN" RETURN ASSIGN 2 TO * ASSIGN# 5 TO * ASSIGNE 9 TO * END (2) SHIELDED PIN-T0-P1 A-lT0.2 MIL=S7D~1576 (USAF) 31 July 1984 Program Listing For FENTER 10 REM PENTER--EM ENVIRONMENT DATA ENTRY 20 PRINTER IS 2 30! 40 ASSIGN# 2 TO “PFLAGS:D701" 50! 60 READ# 2,20 ; HIS 70 ASSIGN# 8 TO H1Ss":D701" wot 90 DIM F1(9),P1(9),86(12) 100 CLEAR 110 BEEP @ WAIT 200 @ BEEP @ WAIT 200 BEEP 120 DISP "ELECTROMAGNETIC ENVIRONMENT" 130 DISP. SPECIFICATION" 140 DISP 150 DISP "(1) INDIVIDUAL SOURCES" 160 DISP. 170 ISP. SPECTRUM SPECIFICATION" 180 DISP. 190 DISP. MIL-STD-1512 DEPAULT LEVEL" 200 bISP [2 W/Mxt SOKHZ~SOMHZ J" 210 DISP " (100 W/met 50MHZ-4oGHZ |" 220 DISP 230 DISP "(4) RETURN TO MAIN MENU" 240 DISP 250 DISP "SELECT FROM (1-4) ABOVE" 260 REM 270 INPUT A 280 IF A=1 THEN PRINT# 2,2 ; 1 @ GOTO 330 290 IF A=2 THEN PRINT# 2,2 ; U @ PRINT# 2,3 ; 10 © GoTO 640 300 IF A=3 THEN PRINT# 2,2 ; 0 @ PRINT# 2,3 ; 10 @ GOTO 1110 310 IF A&4 THEN CHAIN "MANAGER" 320 GOTO 250 @ REM INVALID 330 REM INDIVIDUAL SOURCES 340 N=L 350 PRINT# 2,3 5 N 36U CLEAR 370 DISP_ " DO YOU WISH TO INPUT AS FIELD STRENCTH (V/M) OR POWER DENSITY (W/Mxt) 2" 380 DISP "ENTER 'V' OR 'W'." W INPUT L§@ LF LBS"V" AND LB§"W" THEN GOTO 360 390 DISP "| ENTEK INDIVIDUAL RF SOURCE" 4U0 DISY " (MAXIMUM UF 12 CHAKACTEKS)" 410 DISP 420 DISP "ENTER SOUKCE NAME OK LD, 430 INPUT sé 44U DISP 450 DISP "ENTER FREQUENCY OF SOURCE (MHZ): 460 INPUT F 470 IF LB="W" THEN DISP @ DISP "ENTER POWER DENSITY W/MxM UF" 480 IF LB="V" THEN GOTO 500 490 COTO 510 Ar1870.2 MIL-STD-1576 (USAF) 31 July 1984 (Continued) 500 DISP @ DISP "ENTER FIELD STRENGTH V/M OF" 510 DISP "SOURCE AT THE EED:" 520 INPUT PB 530 LF LS="v" THEN P=PA2/377 540 PRINT? 8,N ; S$,P,P 550 DISP 560 DISP 570 DISP "ENTER ANOTHER SOURCE [Y OR N]" 580 INPUT AS 590 IF AS="Y" THEN N=N¢l @ GOTO 390 600 IF Ag#"N" THEN 550 610 PRINT# 2,3 5 N 620 REM RETURN TO MAIN 630 Goro 1210 640 REM SPECTRUM 650 CLEAR 660 DISP " DO YOU WISH TO INPUT AS FIELD STRENGTH (V/M) OR POWER DENSITY afm)?" 670 DISP "ENTER 'V' OR 'W'." @ INPUT LE 680 IF L$#"V" AND L$0"W" THEN GOTO 650 690 DISP'" ‘SPECTRUM SPECIFICATION" 700 DISP. 710 DISP “ SPECTRUM WILL BE SPECIFIED BY" 720 DISP “ENTRY OF LOWER AND UPPER" 730 DISP "FREQUENCY BOUND AND 8 INTER-" 740 DISP “MEDIATE FREQUENCIES EACH WITH" 750 DISP "AN ASSOCIATED POWER." 760 DISP "BETWEEN ENTRIES, VALUES WILL" 770 DISP “BE LINEARLY INTERPOLATED." 780 N=0 790 DISP. 800 DISP "ENTER LOW FREQUENCY BOUND [MHZ] 810 INPUT F1(N) 820 IF L$="V" THEN DISP "ENTER FIELD STRENGTH [V/M]:" @ GOTO 840 830 DISP "ENTER POWER DENSITY [W/M*M| 840 INPUT P1(N) 850 IF L$="v" THEN P1(N)=P1(N)A2/377 860 PRINT? 8,1 ; F1(N),PL(N) 870 DISP 880 DISP "ENTER TOP FREQUENCY BOUND [MHZ] :" 890 INPUT F1(9) 900 IF F1(9)F1(9) THEN BEEP @ DISP "ENTRY OUT OF BOUNDS REENTER" @ COTO 980 1030 IF L$="V" THEN DISP "ENTER FIELD STRENGTH [V/M]:" @ GOTO 1050 1040 DISP "ENTER POWER DENSITY (W/w*4] : 1050 INPUT P1(N) 1060 LF _L$="V" THEN P1(N)=P1(N)A2/377, 1070 PRINT# 8,N+1 5 FICN),PL(N) 1080 IF N 10 AND D1=0 THEN N=10 270 Q=N 280 | 290 300 310 320! 330 Z1=2 @ GosuB 2120 340 IF JO=-1 THEN GOTO 360 350 JO=1 @ GoSUB 2570 360 ! ENTER DATA FILE INFO AS IS APPROPRIATE TO MODEL EED RF SENSITIVITY DATA FILE [ALL MODELS] EED RF IMPEDANCE DATA FILE [ALL MODELS] 390 Z1=3 @ GosuB 2120 400 IF JO=-1 THEN GOTO 420 410 JO=0 @ GosuB 2570 420! 430 { EED RF SHIELDING DATA [MODELS #2 AND #3] 440 t 450 IF G9 > 1 THEN 21-4 @ cosuB 2120 460 IF JO=-1 THEN GOTO 480 470 IF G9 > 1 THEN JO=2 @ GPSIB 2570 480 ! 490 ! ENTER LEAD DIMENSIONS An2LMIL-STD-1576 (USAF) 31 July 1984 70.3 (Continued) 500 510 520 530 540 550 560 570 580 590 600 610 620 630 640 650 660 670 680 ! 690 700 70 720 730 740 750 760 770 780 790 800 810 820 830 840 850 860 870 880 890 yoo 910 920 930 940 950 960 970 980 990 GosuB 1270 REM DISCRETE FREQUENCIES IF D1=0 THEN 750 DISCRETE FREQUENCY [MAIN LOOP] PRINT# 2,3 ; Q FOR I=1 70 Q READ# 8,1 ; S$,FO,P9 { CALL FRANKLIN CALC FaeFO @ Al=l IF G9=1 THEN GOSUB 1590 @ GOTO 690 IF G9=2 THEN Fl=0 @ B9=7 @ GOSUB 4330 @ GOSUB 1590 IF G9=3 THEN Fl=0 @ B9=7 @ GOSUB 4330 PRINT# 1,1 ; F4,P9,P8,D0 NEXT I GoTo 1060 ! END : CONTINUOUS SPECTRUM [MAIN LOOP] ql FOR I1 70 N-1 READ@ 8,1 FO,P9 READ@ 8.161 ; F3,P3 REM CHECK FOR CLOSE DATA IF FO+10 > F3 THEN HO=1 @ S=F3-FO @ GOTO 850 S=(F3-FO)/10 Ho=10 F4=F0 @ F1=0 FOR Jel TO HO { INTERPOLATE POWER AT FO B9*8 @ F1=0 cosus 4330 PAL ! INTERPOLATED POWER @ al-1 THEN GOSUB 1590 IF G9=2 THEN F1=0 @ B9=7 @ GOSUB 4330 @ GosUB 1590 IF G9=3 THEN Fl=0 @ B9=7 @ GOSUB 4330 A-22MIL-STD-1576 (USAF) 31 July 1984 70.3 (Continued) 1000 PRINT# 1,Q ; F4,P9,P8,D0 1010 Q=Qe1 1020 Fa=P4es 1030 NEXT J 1040 NEXT 1 1050 Q=Q-1 @ PRINT? 2,3 ; Q 1060 REM TOTAL POWER 1070 ! T7=0 1080 ! IF D1=0 THEN GosuB 1910 1090 ! IF DI=1 THEN GosuB 2070 1100 ! PRINT USING 1080 ; 17 1110 ! IMAGE “TOTAL POWER AT EED = 1120 ! PRINT? 2,10 ; 77 ! STORE 1130 1140 $ END OF ANALYSIS 1150! CLOSE ALL DATA FILES 1160 ! 1170 ASSIGN# 1 TO * 1180 ASSIGN 2 TO * 1190 ASSIGN# 6 TO * 1200 IF G9 > 1 THEN ASSIGN 7 TO * 1210 ASSIGN# 8 TO * 1220 DIsP @ DISP " RETURNING TO MAIN MENU" @ CHAIN "MANAGER" 1230 END 1240 1250 1260} t n 1270 REM EED SYSTEM DATA INPUT 1280 CLEAR 1290 REM 1300 IF G9=1 THEN DISP " UNSHIELDED PIN TO PIN" 1310 IF G9=2 THEN DISP " ‘SHIELDED PIN TO PIN" 1320 IF G9=3 THEN DISP PIN TO CASE" 1330 CLEAR @ DISP " SYSTEM DATA ENTRY 1340 REM 1350 REM 1360 DISP @ DISP 1370 IF G9=3 THEN A8=1 @ A9=1 @ W=1 @ GOTO 1430 1380 DISP “ENTER AREA OF LOOP [CM]." @ DISP "ENTER '0' IF NOT KNOWN." @ INPUT A8 @ A8=A8/10000 1390 DISP "ENTER PERIMETER OF LOOP [cH]." @ DISP “ENTER 'O' IF NOT KNOWN." @ INPUT A9@ A9=A9/100 1400 IF ABO OR AI < 0 THEN GOTO 1330 1410 DISP “ENTER WIDTH OF LOOP [cH]." @ DISP "ENTER '0 INPUT W 1420 DISP "ENTER LENGTH OF LOOP [CM)." @ DISP "ENTER '9' IF NOT KNOWN, @ INPUT L@ GOTO 1440 1430 DISP “ENTER LEAD LENGTH (cM]." @ INPUT L SUBROUTINES IF NOT KNOWN." @ An2370.3 MIL-STD-1576 (USAF) BL July 1984 (Continued) 1440 IF (A9=0 OR A8=0) AND (L=O OR W=0) THEN 1460 1450 GOTO 1480 1460 BEEP @ CLEAR @ DISP “MORE DATA IS NEEDED TO CONTINUE." @ DISP PLEASE REENTER" 1470 WAIT 3000 @ coro 1330 1480 L=L/100 @ wew/100 1490 1500 1510 1520 : 1530 REM STORE PARAMS IN PFLAGS 1540 PRINT 2,6 ; L#100, W100 @ wo 1550 PRINT# 2,7 ; A8*10000,A9*100 1560 L9=2*L+2*W W IF A9#O THEN L9=A9 1570 RETURN 1580 REM 1590 REM FRANKLIN CALCULATIONS 1600 REM CONVERT F TO WAVELENGTH 1610 REM 1620 FO=F4 1630 L1=300000000/(F0*1000000) 1640 DISP 1650 REM HIGH OR LOW FREQUENCY 1060 REM APERTURE. HIGH IF 1670 REM L1 > 2*PERIMETER 1680 P=L9 1690 IF L1 < 24P THEN 1750 1700 REM LOW FREQUENCY APERTURE 1710 DISP'" LOW FREQUENCY APERTURE" 1720 GOSUB 4540 1730 A=46700%AB A 2/(3.14159¥L1 A Z*11) 1740 GoTo 1830 1750 REM HIGH FREQ. APERTURE 1760 DISP "HIGH FREQUENCY APERTURE" 1770 REM CALC DIRECTIVITY 1780 IF L9/L1<=1.7 THEN D=.353*(L9/L1)+1.5 1790 IF L9/L1 > 1.7 THEN D=1.24*(L9/L1) 1800 DISP USING 181U ; D 1810 IMAGE "D =",x,3D,5D 1820 A=DALL A 2/(4*3, 14159) 1830 REM WORST CASE POWER 1840 P8=AXPSRAL 1850 DO=-99.99 @ IF PB > 0 THEN DO=10*LGT(P8) 1860 RETURN 1870 REM 1680 REM INTEGRATE POWER OVER 1890 REM SPECTRUM TRAPEZOIDAL AnhMIL-STD-1576 (USAF) 31 July 1984 70-3 (Continued) 1900 1910 1920 1930 1940 1950 1960 1970 1980 1990 2000 2010 2020 2030 2040 2050 2060 2070 2080 2090 2100 2110 2120 2130 2140 2150 2160 2170 2180 Dx! 2190 2200 2210 2220 2230 2240 2250 2260 2270 2280 2290 2300 2310 2320 2330 2340 2350 2360 2370 2380 2390 REM FOR I=1 TO Q-1 READ# 1,1 ; FO,P,PO,D READE 1,I+1 ; FL,P,PL,D REM TRAPEZOID PARAMETERS IF PO > Pl THEN LO-P1 @ L1=PO IF PO=P1 THEN LO=PO @ L1=P0 IF PO< PL THEN LO=PO ¢ Li=Pl T1=(F1-FO)*LO+.5*(F1-FO) *(L1-L0) REM TI=AREA UNDER TRAPEZOID FROM FO TO FL T7=T74T1 ! RUNNING TOTAL NEXT 1 RETURN REM REM DISCRETE SUMMATION REM FOR I=1 TO Q READ# 1,1 ; FO,P,P8,D ‘T7=T74P8 NEXT 1 RETURN REM REM DATA FILE SELECTION SUBROUTINE REM REM 24=WHICH PILE TYPE REM CLEAR DIsP " DATA FILE SELECTION" SP IF Z1=1 THEN DISP " OUTPUT DATA PILE" IF 21=2 AND G9 <3 THEN DISP PIN TO PIN" IF 21=2 AND G9=3 THEN DISP " PIN TO CASE’ IF Z1=2 THEN DISP " EED RF SENSITIVITY DATA FILE" IF Z1=3 THEN DISP" EED RF IMPEDANCE DATA FILE" IF Z1=4 THEN DISP " SHIELD ATTENUATION DATA FILE" DISP DISP "(1) USE DEFAULT FILE’ DIsP "(2) USE EXISTING FILE" DISP "(3) CREATE NRW FILE DISP. DIsP " SELECT FROM ABOVE" INPUT 22 REM IF 21=1 AND 22=1 THEN US$="OUTPUT" IF 21-2 AND Z2=1 THEN U5§="EEDSEN IF 21=3 AND Z TR Z1=4 AND Z REM IF 222 THEN DISP “ENTER EXACT EXISTING FILE NAME" @ INPUT US$ IF 22=3 THEN DISP "ENTER NEW FILE NAME" @ INPUT US$ THEN US$ A-2510.3 MIL-STD-1576 (USAF) 31 July 1984 (Continued) 2400 IF Z2=3 AND Z1=1 THEN CREATE U5$&":D701", 1000, 32 2410 IF 2223 AND 211 THEN CREATE U5$&":D701", 102,40 2u20 REM 2U30 REM NOW STORE FILE NAME INTO PFLAGS ao 2450 PRINT# 2,24 ; U5$ 2460 PRINT# 2,22 ; 05$ 2470 PRINT# 2,21 ; U5$ 2480 PRINTS 2,23 ; 05$ 2490 Goto 2520 2500 2510 2520 2530 ASSIGN# 6 TO U5$4":D701" @ 250 ASSIGNE 5 TO U5$k":D701" @ 2550 ASSIGN 7 TO U5$4":D701" @ 2560 2570 2580 ‘SPECIFICATION 2590 2600 READE 2,21 ; J9$@ ASSIGNE 5 TO J9$e":D701" @ 5: 2610 READE 2,22 ; J9$@ ASSIGN# 6 TO J9$4":D701" @ S 2620 IF JO=2 THEN READ# 2,23 ; J9$@ ASSIGNE 7 TO J9$4":D701" @ S5= 2630 | 2640 CLEAR 2650 BEEP @ WAIT 200 @ BEEP @ WAIT 200 @ BEEP 2660 ‘THEN DISP " _ELECTROEXPLOSIVE DEVICE" 2670 THEN DISP " RF IMPEDANCE SPECIFICATION" 2680 THEN DISP " RF SENSITIVITY SPECIFICATION" 2690 THEN DISP "SHIELD ATTENUATION SPECIFICATION" 2700 2710 ‘THEN DISP "(1) CONSTANT IMPEDANCE" 2720 THEN DISP "(1) CONSTANT SENSITIVITY" 2730, THEN DISP "(1) CONSTANT ATTENUATION" 27H. 2750 2 THEN DISP " (2) SPECTRUM SPECIFICATION" 2760 THEN DISP " (2) ATTENUATION VS. FREQUENCY" 2770 2780 THEN DISP "(3) 'PIGURE 2" SHIELD DATA" @ DISP 2790 }=2 THEN DISP "(4) DEFAULT (20dB CONSTANT)" 2800 DISP @ DISP " SELECT FROM ABOVE" 2810 1 2820 INPUT S1 2830 IF Si > 4 THEN GOTO 2640 2840 IF JO=0 THEN PRINT IMPEDANCE DATA " @ PRINT " FREQ(MHZ) — IMP(OHMS)* 2850 IF JO=1 THEN PRINT " SENSITIVITY DATA" @ PRINT * FREQ(MHZ) —SENS(WATTS)" 2860 IF JO=2 THEN PRINT " SHIELDING DATA" @ PRINT " PREQ(MHZ) — SHIELD(4B)" 8-26MIL-STD-1576 (USAF) 31 July 1984 70.3 (Continued) 2870 IF S1=1 THEN 2970 2880 IF S1=2 AND JO=0 THEN 3760 2890 IF S1=2 AND JO > 0 THEN 3240 2900 IF $1=3 AND JO < 2 THEN 2640 2910 IF S1=3 AND JO=2 THEN 4160 2920 IF $1=4 AND JO=2 THEN $2=20 @ GOTO 3080 2930 GOTO 2640 2940 ! 2950 2960 2970 IF JO=0 THEN DISP “ENTER CONSTANT IMPEDANCE [OHMS]"* 2980 IF JO=1 THEN DISP "ENTER CONSTANT RF SENSITIVITY [WATTS]" 2990 IF JO=2 THEN DISP "ENTER CONSTANT ATTENUATION [48]" 3000 ! 3010 INPUT $2 3020 AND SZ <=0 THEN DISP "THE IMPEDANCE MAY NOT BE <= 0" @ DISP "PLEASE RENTER . . . ." 3030 IF J0-0 AND 62 <~0 THEN BEEP @ WAIT 100 @ GoTo 2950 3040 IF S2 <0 THEN DISP "ENTRY MUST NOT BE < 0" @ BEEP @ COTO 2750 3050 3060 3070 3080 s3=0 3090 IF JO=0 THEN $5=5 @ B=2 @ T=11 3100 IF JO=1 THEN $5=6 @ B=1 @ T=10 CONSTANT VALUES STORE CONSTANT SPECTRUM 3110 IF JO=2 THEN $5=7 @ Bel @ T-10 3120 ! 3130 $4=82 3140 If JO=2 THEN $4=1/10 A ($2/10) 3150 FOR I=B TO T 3160 PRINT USING 3170 ; 3,82 3170 IMAGE 4X,D.DB, 6x, 3D.30 3180 PRINTH 85,1 583,84 3190 $3=$3+10000000000 3200 NEXT T 3210 IF JO=0 THEN PRINT# S5,1 ; 10 3220 RETURN 3230 ! 3240 3250 3260 3270 THEN DISP "EEN RF SENSITIVITY SPRCTFTCATION" 3280 IF JO=2 THEN DISP "SHIELD ATTENUATION SPECIFICATION" 3290 DISP 3300 DISP " SPECTRUM WILL BE SPECIFIED BY" 3310 DISP "ENTRY OF A LOWER AND UPPER" 3320 DISP "FREQUENCY BOUND AND 8 INTER 3330 DISP "MEDIATE FREQUENCIES EACH WITH" 3340 IF JO-2 THEN DISP "AN ASSOCIATED ATTENUATION (MUST BE > coro 3360 SPECTRUM A-27MIL-STD-1576 (USAF) 31 July 1984 70.3 (Continued) 3350 3360 3370 3380 3390 3400 3410 3420 3430 3440 3450 3460 3470 3480 3490 3500 3510 3520 wore 3530 3540 3550 DISP "AN ASSOCIATED POWER (MUST BE >~=0) .” DISP " VALUES BETWEEN ENTRIES WILL BE" DISP "ESTIMATED BY THE PROGRAM VIA LINEAR INTERPOLATION." 10 DISP DISP "ENTER LOWER FREQ. BOUND [MHZ]" INPUT F1(I) IF JO=1 THEN DISP “ENTER EED RF SENSITIVITY [WATTS]" FI JO=2 THEN DISP "ENTER SHIELDING ATTENUATION [48]" INPUT P1(1)@ IF P1(I) < 0 THEN DISP "VALUE MAY NOT BE < O--REENTER" GOTO 3420 PRINT USING 3460 ; F1(1),P1(I) IMAGE 4X, 5D, 2D, 6X, 3D. 3D IF JO=2 THEN P1(I)=1/10 A (P1(1)/10) PRINT? 85,1 ; F1(1),P1(1) DISP. DISP "ENTER UPPER FREQ. BOUND [MHZ]" INPUT F1(9) IF F1(9) FL(9) THEN BEEP @ DISP "ENTRY OUT OF BOUNDS REENTER" @ GOTO 3600 365¢ 3660 3670 IF JO=] THEN DISP "ENTER EED RF SENSITIVITY (WATTS]" IF JO=2 THEN DISP "ENTER SHIELDING ATTENUATION (aB]" <0-- INPUT P1(I)@ IF P1(1) < 0 THEN DISP "VALUE MAY NOT BE < R" @ GOTO 3650 PRINT USING 3460 ; F1(I),P1(1) LF JO=2 THEN PL(I)=1/10 (PIC 1)/10) PRINT# S3,N¢L 5 F1(I),P1(1) IP 1 <8 THEN 3590 IF JO < 2 TIEN PRINT USING 3460 ; F1(9),P1(9) @ GoTO 3740 PRINT USING 3460 ; F1(9),~(1O*LGT(P1(9))) RETURN REM REM IMPEDANCE VS FREQUENCY REM DATA INPUT REM DISP " EED IMPEDANCE VS FREQUENCY" 4-2870.3 MIL-STD-1576 (USAF) 31 July 1986 (Continued) 3800 3810 3820 3830 3840 3850 3860 3870 3880 3890 3900 3910 3920 3930 3940 3950 3960 3970 3980 3990 4000 4010 4020 4030 4040 4050 4060 4070 4080 4090 4100 4110 4120 4130 4140 4150 4160 4170 4180 4190 4200 4210 4220 4230 4240 4250 DISP. DISP " SPECTRUM WILL BE SPECIFIED BY" DISP "THE ENTRY OF UP TO 10 PAIRS OF" DISP "IMPEDANCES AND THEIR ASSOCIATED" DISP “FREQUENCIES, ANY # of PAIRS MAY" DISP "BE ENTERED; THE ONLY CAVEAT IS" DISP "THAT ANY ONE FREQUENCY BE > DISP "THE PREVIOUS FREQUENCY, WIEN” DISP "FINTSHED, ENTER '-1' TO QUIT. DISP " VALUES BETWEEN ENTRIES WILL" DISP "BE DETERMINED VIA LINEAR INTER~' DISP "POLATION." 1=1 @ FU=0 DISP "ENTER FREQUENCY #""515"(MHZ]" INPUT F1@ IF Fl < 0 THEN 4070 IF F1> =F0 THEN coTO 3990 BEEP @ DISP " FREQUENCY < PREVIOUS FREQUENCY" DISP " PLEASE REENTER" WAIT 200 @ GoTo 3930 DISP "ENTER IMPEDANCE OF EED [OHMS]" INPUT F IF P <=0 THEN DISP “THE IMPEDANCE MAY NOT IF P < =0 THEN DISP * PLEASE REENTS! PRINT# $5,1+1 ; F1,P PRINT# $5,1 ; I I=I+] @ IF 1) > 10 THEN GOTO 4070 ELSE GOTO 3930 ! OUTPUT IMPEDANCE DATA READ# $5,1 ; J FOR I=2 TO J+1 READ $5, 5 F,P PRINT USING 4110 ; F,P IMAGE 4X, 5D. 2D, 6X, 3D.3D NEXT 1 RETURN REM REM "FIGURE 2" SHIELD DATA REM (USED FOR DEFAULT PURPOSES) REM FROM MIL-STD-1512 HANDBOOK REM FOR I=1 TO 10 READ F,P P=1/10A(P/10) PRINT# $5,1 5 F,P NEXT T DATA .1,30,.55,44,1,49,2-1,53,5.5,58, 17,59, 100,43, 200, 35,800, 30, La @ GoTo 3990 20000, 18 A-29MIL~STD-1576 (USAF) 31 July 1984 70.3 (Continued) 4260 4270 4200 4290 4300 4310 4320 4330 4340 4350 4360 4370 4380 4390 4400 4410 4420 4430 4440 4450 4460 4470 4480 4490 4500 4510 4520 4530 4540, 4550, 4360, 4570 4580 4590 4600 4610 4620 4630 4640 4650 4660 4670 4680 4690 4700 4no RESTORE FOR I=1 TO 10 READ F,P PRINT USING 4300 ; F,P IMAGE 4X, 5D.2D, 6X, 3D. 3D NEXT 1 RETURN REM REM LINEAR INTERFOLATION ROUTINE REM INPUTS: F4-FREQUENCY REM BOSBUFFER # REM RETURNS AI=INTERPOLATED VALUE REM FOR K=1 TO 10 READ BO,K 5 F2,X2 IF K=1 THEN’ X1=X2 IF F2 > =F4 THEN GOTO 4460 FI=B2 @ X1=X2 NEXT K IF K=11 THEN Al=X1 @ GOTO 4470 ALPXL+(R4=FL)*((X2-X1)/(F2-F1)) IF G9#3 THEN RETURN REM PIN-TO CASE POWER CALCULATIONS L1=300000000/(F4*1000000) IF LA2€L1/2 THEN GOSUB 4540 @ PB=PORALALA2#(377/11) @ GOTO 4520 PO=PO*AIAL. 64ALLA 2/(4*P1) IF P8=0 THEN DO=-99,99 ELSE DO=10*LGT(P8) RETURN REM REM LINEAR INTERPOLATION ROUTINE REM PIN TO-CASE IMPEDANCE REM INPUTS: F4~FREQUENCY REM S=BUF #=EEDINP REM RETURNS: TI=INTERPOLATED VALUE REM F7=0 READ# 5,1 ; NI ! # OF VALUES FOR X=2’TO N1+1 READ# 5,X 5 F3,X3 IF X-2 THEN XO-X3 TF F3 > =F4 THEN GOTO 4700 FI=F3 @ X0=K3 NEXT X IB X=N1+2 THEN 11=X0 @ RETURN T1=X0+(P4-F7)*((X3-X0)/(F3-F7)) RETURN a-30MIL-STD-1576 (USAF) 31 July 1984 70.4 Program Listing for LPLOTS lot LeLoTs 20! 30 GENERAL PURPOSE GRAPHING FOR EED ANALY 60 DIM L${80] ,L1$(32] ,128(32) 70 DIM F$(80],P$[80] 80 FS="FREQ(MIZ): @ PS="Re(zpe) [OHMS]: 90 CLEAR @ GCLEAR 100 ! 110 ASSIGN# 2 70 "PFLAGS:D701" 120 READ# 2,24 ; X1$ 130 ON ERROR GOTO 4080 140 x$=Xi$ 150 ASSIGN #1 TO x1$6 160 READ #2,20 5 x26 170 x$=x2$ 180 ASSIGN #8 TO x2$6' 190 READ #2,21 5 X36 200 x$=x3$ 210 ASSIGN #5 TO X3$6"":D701" 220 OFF ERROR 230 READ# 2,1 ; MODEL FLAG 240 READ# 2,2 ; D ! DIS/CONT FLAG 250 READ# 2,3 ; Q ! # OF PLOT POINTS 260 ! OUTPUT DEVICE SELECT 270 BEEP @ WAIT 200 @ BEEP @ WAIT 200 @ BEEP 701" 701" 280 DISP " OUTPUT SPECIFICATION" 290 DISP 300 DrIsP 310 DIsP TABULAR OUTPUT ONLY" 320 DISP PLOTTED OUTPUT ONLY" 330 DISP BOTH TABULAR AND PLOTTED" 340 DISP RETURN TO MAIN MENU" 350 DISP 360 DISP "SELECT FROM (1-4) ABOVE" 370 INPUT B 380 IF B=4 THEN CHAIN "MANAGER" 390 IF B< 1 OR B > 3 THEN BEEP @ GOTO 350 400 DISP 410 DISP 420 DISP "ENTER TITLE OF PLOT [80 CHARS]" 430 INPUT L$ 440 450 IF B=2 THEN 610 460 ! 470 CLEAR 480 DISP "TABULAR OUTPUT TO WHICH DEVICE" 490 DISP. A-3L70.4 MIL-STD=1576 (USAF) 31 July 1984 (Continued) 500 510 520 530 540 550 560 370 580 590 600 610 620 630 640 650 660 670 680 690 700 710 720 730 740 750 760 770 780 790 800 810 820 830 840 850 860 80 880 390 900 910 920 930 940 950 960 970 980 990 CRT SCREEN" ‘THERMAL PRINTER" LINE PRINTER" SELECT FROM (1-3) ABOVE" INPUT BL IF Bl < 1 OR Bl >3 THEN BEEP @ GOTO 530 THEN PRINTER 1S 1 IF B1=2 THEN PRINTER IS 2 IF Bl=3 THEN PRINTER 1S 701,80 CALL APPROP. ROUTINES IF B=1 THEN GoSUB 2720 IF B=2 THEN GOSUB 770 IF B=3 THEN GOSUB 770 @ GOSUB 2720 {CLOSE DATA FILES ASSIGN# 1 TO * ASSICN# 2 TO * ASSIGN# 8 TO * PRINTER IS 2 CHAIN "MANAGER" END PLOTTING SUBROUTINE CLEAR DEG GOSUB 3620} HIGH/LOW SORT ! F0,P0,DO IS MIN OF FILE F1,P1,D1 IS MAX X2=F1 @ X1=FO @ ¥2=P1 @ Y1=P0 DISP USING 910 ; "MINIMUM FREQUENCY :",FO DISP USING 910 ; “MAXIMUM FREQUENCY: DISP USING 910 5 “MINIMUM POWER (W) DISP USING 910 ; “MAXIMUM POWER (W):",PL DISP USING 910 ; "HINIMUM POWER (dBi) :",D0 DISP USING 910 ; "MAXIMUM POWER (4RW):",D1 IMAGE 20A,2X,5D.3D DISP DIsP " FORMAT OUTPUT" DISP DISP DISP “OUTPUT TO PLOTTER (¥/N)" INPUT A$ PLOTTER $1! DEFAULT TO CRT ‘THEN PLOTTER IS 705 @ GOTO 1020 A-32MIL-STD-1576 (USAF) 31 July 1984 (Continued) 1000 IF AS#"N" THEN BEEP @ GOTO 950 1010 TF AS="NY THEN xg="ni 1020 SCALE -20,236,-20,172 1030 ! 1040 DIsP 1050 DIsP " X-AXIS" 1060 DISP 1070 DISP "ENTER X-AXIS LABEL" 1080 INPUT LIB 1090 DISP 1100 T4=0 1110 DISP "LOG PLOT FOR X-AXIS (¥/N)" 1120 INPUT As. 1130 1140 1150 1160 1170 Disp " Y AXIS" 1180 DISP 1190 DISP "ENTER Y-AXIS LABEL" 1200 INPUT L26 1210 TS=0 1220 T6=0 1230 DISP 1240 DISP "PLOT IN WATTS [W] OR dBW [D]" 1250 INPUT AB 1260 IF As=" 1270 LF Age 1280 DISP 4290 DISP "LOG PLOT FOR Y-AXIS (¥/N)" 1300 INPUT A$ 1310 IF A§="N" THEN T5=1 @ GOTO 1330 1320 IF Ag#"Y" THEN BEEP @ GOTO 1200 1330 5 1340 IF Y1=0 THEN U2=0 ELSE U2=FLOOK(LET(Y1)) 1350 T2=CEIL(LET(¥2)) 1360 IF X1=0 THEN Ul=0 ELSE Ul=FLOOR(LGT(x1)) THEN T4=1 @ GOTO 1160 THEN BEEP @ GOTO 1090 " THEN T6=1 @ TS=1 @ ¥2=D1 @ Y1=DO @ GOTO 1360 THEN BEEP @ GOTO 1230 1370 T1=CETLCLeT(x2)) 1380 1390 ! CALL BOUNDING SUBROUTINE 1400 ! 1410 IF T4=0 THEN Z1=U1 @ 22=T1 @ L56: $1=230/(T1-U1) 1420 IF T4=1 THEN Z1=K1 @ 22=K2 @ L5G 81=230/(X2-x1) 1430 IF T5=0 THEN Z1=U2 @ 22=12 @ LSI 88=170/(T2-U2) 1440 IF TS=1 AND T6=0 THEN Z1=¥1 @ Z2=¥2 @ L58=' @ ¥2=Z2 @ $8=170/(¥2-Y1) 1450 IF T6=1 THEN Z1=D0 @ 22=D1 @ LSB=' 88=170/(¥2-¥1) @ GosuB 3780 @ Ul=z1 @ TI=z22 @ " @ GOSUB 3930 @ XI=Z1 @ X2=22 @ @ GosuB 3780 @ U2=21 @ T2=22 @ 'y" @ GOSUB 3940 @ ¥1=2Z1 @ GosuB 3940 @ Yi=Z1 @ ¥z=22 @ 4-33,MIL-STD-1576 (USAF) 31 July 1984 (Continued) 1460 1470 | SKIP AXIS PLOT 1480 1490 DISP 1500 DISP "PLOT AXES (¥/N) 1510 inpur Ag 1520 IF A$="N" THEN 2440 1530 IF Ag# "Y" THEN 1490 1540! Loc oR NOT 1550 IF T4=1 THEN 1770 1560! X AXIS LOG PLOT 1570 MOVE 0,-6 @ LABEL UL 1580 MOVE -2,~10 @ LABEL "LO" 1590 MovE 0,0 1600 x-0 @ ¥-0 1610 $1=230/(T1-U1) 1620 DISP U1,T1,S1 1630 FOR J=U1 TO T1-1 1640 160 D=2 ¢ 1660 FOR I=2 TO 10 1670 L=LGT(1)*S1 1680 DRAW X+L,Y 1690 If I=10 AND D=0 THEN O=3 AND v=160 1700 DRAW X+L,¥ 0 @ DRAW X+L,Y+V 1710 MOVE X+L,Y 1720 LF 1=10 THEN X=A+L @ MOVE X,Y-6 @ LABEL J+1 @ MOVE X-2,Y-10 @ LABEL "0" 1730 NEXT I 1740 MOVE X,Y 1750 NEXT J 1760 GoTo 1910 1770! LINEAR X-AXIS 1780 $1=230/(Xx2-x1) 1790 T1=CEIL((x2-X1)/10) 1800 T3=X1 ¢ X=0 @ 1810 MOVE X,Y 1820 FOR I=1 TO 10 1830 DRAW X,Y 1840 DRAW X,Y-3 1850 MOVE X-8,Y 10 1860 LABEL 13 1870 MOVE X,¥ 1880 T3*T3+T1 1890 1900 1910 1920 THEN 2130 1930 Y AXIS PLOT 1940 MOVE -8,0 @ LABEL U2 An34,MIL-STD-1576 (USAF) 31 July 1984 70.4 (Continued) 1950 MOVE -12, 2 @ LABEL "10" 1960 MOVE 0,0 1970 Xx=0 @ Y=0 1980 $8=170/(T2-u2) 1990 FOR J=U2 TO T2-1 2000 ! 2010 2020 FOR I=2 T0 10 2030 L=LGT(1)#S8 2040 DRAW X, Y+L. 2050 IF 1=10 THEN 0=3 2060 DRAW X-O,Y+L 2070 MOVE X,Y:L 2080 IF I=10 THEN Y=Y+L @ MOVE X-8,Y @ LABEL J+1 @ MOVE X-12,¥-2 @ LABEL to" 2090 NEXT I 2100 MOVE X,¥ 2110 NEXT J 2120 GoTo 2280 2130! LINEAR Y-AXIS. 2140 $8=170/(¥2-¥1) 2150 T8=(¥2-¥1)/10 2160 T3=¥1 @ X=0 @ ¥=0 2170 MOVE X,¥ 2180 FOR I=1 TO 11 2190 DRAW X,Y 2200 DRAW X-3,¥ 2210 MOVE X-15,Y-1 2220 LABEL USING 2230 ; 73 2230 IMAGE 4D.D 2240 MOVE X,Y 2250 T3=T34T8 2260 Y=¥+17 2270 NEXT I 2280 ! LABEL AXES 2290 LDIR 0 2300 MOVE 5,167 2310 LABEL L$ 2320 MOVE 15,70 2330 LDIR 90 2340 LABEL L2$ 2350 LDIR 0 2360 MOVE 90,-20 2370 LABEL L1$ 2380 REM PAUSE TO INSERT NEW PEN 2390 IF X$="N"" THEN GOTO 2440 2400 CLEAR @ DISP " IF YOU WISH TO PAUSE TO INSERTA DIFFERENT COLOR PEN, NOW'S THETIME." 2410 DISP " CHOOSE THE COLOR PEN YOU WANT AND PLACE IT IN THE PLOTTER ARH." A-35,MIL-STD-13/6 (USAF) 31 July 1984 70.4 (Continued) 2420 2430 2440 2450 2460 2470 2480 2490 2500 2510 2520 2530 2540 2550 2560 2570 2580 2590 2600 2610 2620 2630 2640 2650 2660 2670 2680 2690 2700 2710 2720 2730 2740 2750 2760 2770 2780 2790 2800 2810 2820 2830 2840 2850 2860 2870 2880 2890 DISP " PRESS 'C’ TO CONTINUE." INPUT X$@ IF X$#"C" THEN 2430 {BEGIN DATA PLOT READE 1,1 5 L,M0,M,0 MOVE 0,0 P4=0 FOR I=1 TO Q READ# 1,1 5 L,MO,M,O 1 PESSOTEMDARH EEE IE T4=U AND L=U THEN X=-U1 @ GOTO 2530 IF T4=0 THEN X=LCT(L) U1 IP T4=1 THEN X=L-X1 IF T5=0 AND M=0 THEN Y= U2 @ GOTO 2560 IF T5=0 THEN Y=LGT(M)-U2 IF TS=1 THEN Y=4-Y1 IF T6=1 THEN Y=0-Y1 ! CHECK FOR IN BOUNDS IF X*51<0 OR X#S17230 THEN P4=0 @ GOTO 2680 ! OUT OF BOUND IP Y*S8170 THEN P4-0 @ GOTO 2680 ! OUT OF BOUND ! DISCRETE OR CONTINUOUS IF P4=0 THEN MOVE X*S1,Y*S8 IF D=0 THEN DRAW X*S1,Y#S8 IF D=1 THEN MOVE X*S1,0 @ DRAW X*S1,Y*S8 P4al NEXT I PENUP RETURN {TABULAR OUTPUT ROUTINE READE 2,6 5 32,33 READ# 2,7 ; Q1,Q2 ! AREA, PERIMETER READ# 2,10 ; JS ! TOT POWER PRINT L$ PRINT IF M9=1 THEN PRINT "UNSHIELDED PIN-TO-PIN" IF M9=2 THEN PRINT "SHIELDED PIN-TO-PIN" IF M9+3 THEN PRINT "PIN-TO-CASE" PRINT PRINT * IMPEDANCE DATA" REM LEFT JUSTIFY IMPEDANCE VALUES FOR OUTPUT READ# 5,1 ; J ! # OF IMPEDANCE POINTS FOR I=2 TO J:1 READ# 5,1 ; F,P IF F=(1-2)#10000000000 THEN FS=FSSVAL§(1-2)&"E+10 " @ GOTO 2960MIL-S7D-1576 (USAF) 31 July 1984 70.4 (Continued) 2900 2910 2920 2930 2940 2950 2960 2970 2980 2990 3000 3010 3020 3030 3040 3050 3060 3070 3080 3090 3100 3110 3120 3130 3140 3150 3160 3170 3180 3190 3200 3210 3220 3230 3240 3250 3260 3270 3280 3290 3300 3310 3320 3330 3340 3350 3360 3370 3380 3390 FIS-VALS(F) @ L=LEN(FL$) IP Lel THEN F1g= '6F 1S, IF L=2 THEN FL! “orig IF L=3 THEN F1g=" "eFt$ IF L=4 THEN F1g" "sFis FS=F SSF IEE PL$=VAL$(P) @ L=LEN(P1$) IF L=1 THEN “aPIs LE L=2 THEN IF L=3 THEN IP L=4 THEN $5P 186" NEXT I PRINT F$ @ PRINT P$ IF M9=3 THEN PRINT USING 3050 IMAGE "LENGTH OF LEAD; ",K, IF J2#0 AND J3#0 THEN PRINT USING 3070 IMAGE "LOOP DIMENSIONS: ",K," X "JK," IF Ql¢0 THEN PRINT USING 3090 ; Q IMAGE "AREA OF LOOP: " sqR CH" IF Q2#0 THEN PRINT USING 3110 ; Q2 IMAGE "PERIMETER OF LOOP: ",K," CM" PRINT 1 LINE PRINTER LF B1=3 IF B1=3 THEN 3370 1 CRT OR THERMAL FOR I=1 TO Q PRINT USING 3180 ; T IMAGE "SOURCE # ",K IF D=1 THEN READ? 8,1 ; S$,L,M@ PRINT USING 3200 ; Sb IMAGE "I.D.:",K READ# 1,1 5 L,M0,M,0 PRINT USING 3230; L IMAGE "FREQ:",K," MIlZ" PRINT USING 3250 ; MO IMAGE "POWER;",K," W/MA PRINT PRINT "POWER CALCULATED AT EED IN:" PRINT USING 3290 ; 2 @ GOTO 3120 32,53 AMAGE "WATTS = ",K PRINT USING 3310°; 0 IMACE "BW PRINT PRINT NEXT I RETURN { LINE PRINTER FORMAT {TABLE FOR PRINTER 4-37MIL-8TD-1576 (USAF) 31 July 1984 70.4 (Continued) 3400 IF D=0 THEN PRINT" SOURCE FREQUENCY POWER CALCULATED POWER AT EED" 3410 IF D=1 THEN PRINT "SOURCE 1D FREQUENCY POWER CALCULATED POWER AT EED" 3420 IF D=0 THEN PRINT " # Maz wee, warTs Bi 3430 IF D=1 THEN PRINT" # MHZ W/MmM, waTTS BH" 3440 FOR I-1 TO Q 3450 LF D=1 THEN READ# 8,1 ; S$ 3460 READ# 1,1 5 L,MO,M,O 3470 3480 IF D=0 THEN PRINT " 3490 LF D=L THEN PRINT " 8 3540 IF D=0 THEN PRINT USING 3560 ; I,L,MO,M,O 3550 IF D=l THEN PRINT USING 3570 ; 1,S$,L,MO,M,O 3560 IMAGE 5X,3D,4X,6D.3D, 4X, 3D.2D, 6X, 4D.5D, 2X, 84D.2D 3570 IMAGE 3D,5X,12A, 1X, 5D.3D, 4X, 3D.2D, 6X,4D.5D, 2X, S4D. 2D 3580 } 3590 NEXT I 3600 RETURN HIGH/LOW SORT ROUTINE 3640 READ 1,1 ; L,MO,M,O 3650 FO=L @ Fl=L @ PO=M @ P1=M 3660 DO=0 @ D1=0 3670 FOR I=2 T0 Q 3680 READF 1,1 ; L,M0,M,O 3690 IF FO > L THEN FO=L 3700 IF FL< L THEN FI-L 3710 IF PO > M THEN PO=H 3720 IF Pl < M THEN P1=M 3730 IF DO > 0 THEN DO=0 3740 IF D1 < 0 THEN D1=0 3750 NEXT I 3760 RETURN LOG PLOT BOUND INPUT & 3800 CLEAR 3810 DISP USING 3820 ; L5$,21,22 3820 IMAGE "LOG ",K,"-AXIS TO BE PLOTTED FROM 10E",K," TO 10E",K 3830 DISP. 3840 DISP "CHANGE (¥) CONTINUE (c)" 4-38MIL-STD-1576 (USAF) 31 July 1984 70.4 (Continued) 3850 3860 3870 3880 3890 3900 3910 3880 3920 3930 39H0 3950 3960 3970 3960 3990 ooo 4010 4020 4030 4ollo 4020 4050 4060 4070 480 DISK. 4090 4100 INPUT A$ IF A$="C" THEN RETURN IF A$#"Y" THEN BEEP @ GOTO 3830 DISP "ENTER EXPONENT :LOWER, UPPER BOUND" INPUT 21,722 Z1s#LOOK(Z1) @ Z2=CEIL(Z2) IP 22<:Z1 THEN BEEP @ DISP " UPPER BOUND MUST BE > LOWER" @ GOTO GOTO 3810 {LINEAR PLOT BOUND CLEAR DISP USING 3960 ; L5$,21,2241 IMAGE "LINEAR ",K DISP "AXIS TO BE",/, "PLOTTED FROM:",K," TO: DISP * CHANGE (¥) CONTINUE (c)* INPUT A$ IF Ag-"C" THEN RETURN IF A$#"Y" THEN BEEP @ GOTO 3990 DISP "ENTER : LOWER,UPPER BOUND" INPUT 21,22 IF 21 > 222 THEN BEEP @ DISP "UPPER BOUND MIST BE > LOWER" @ GOTO GoTo 3950 ! DISP " THE FILE YOU REQUESTED, ";X$;", CANNOT BE FOUND ON THIS DISP DISP " PLEASE RECHECK YOUR FILE NAME AND BE SURE THE CORRECT DISK Is IN THE DRIVE." 4110 4120 41130 DISP @ DISP @ DISP @ DISP "ERROR NUMBER GENERATED = ";ERRN DISP "ERROR OCCURRED ON LINE # ";ERRL WAIT 5000 @ GOTO 720 An3980.2 80.3 MIL-STD-1576 (USAF) 31 July 1984 EXAMPLES OF OUTPUT. Case 1: Case 2: Case 3: Pin-to-Pin Mode. See Figure A-3 and Table A-l. Environment: 1 watt/aq meter from 1.5 Miz to 1300 Miz EED Impedance: Variable Shielding: none Lead dimensions: Area = 9.5 cm? Perimeter = 38.4 cm Pin-to-Pin Mode. See Figure A-4 and Table A-2. Environment: Discrete spectrum Impedance: Constant 1.4 ohms Lead dimensions: Area = 9.5 cm? Perimeter = 38.4 cm Shielding: None Pin-to-Case Mode. See Figure A-5 and Table A~3. Environment: 1 watt/sq- meter from 1-5 MHz to 1300 Mz EED Impedance: Variable Shielding: 24 dB, constant over spectrum Lead Dimensions: ‘Length = 100 caMIL-STD-1576 (USAF) 31 July 1984 TEST PLOT #3—PIN-TO-PIN CONTIMINUSS SPECTRIM—UNSHIELDED—V4 500 208 bee 1 250 fan 508 908 1300, FREQCHHE> ‘36 we FIGURE A-3 Sample Output - Pin-To-Pin Mode Anal EN ENVIRONMENT FREQUENCY 1 3 pata POUE! THP OHMS) 188 120 378 400 200 888MIL-STD-1576 (USAF) 31 July 1984 TABLE A-1 SAMPLE QUTPUT - PIN-T0-PIN MODE TEST PLOT #5 ~~ PIN-TU-PIN CONTINUOUS SPECTRUM UNSHIELDED VAR. IMP. UNSHIELDED PIN-TO-PIN IMPEDANCE DATA FREQ (MHZ): 1S 3 10 100-250 500 9001300 Re (2pc) (OHMS): ee ee ee ee ia AREA OF LOOP: 9.5 SQR CH PERIMETER OF LOOP: 36.4 CH soURCE FREQUENCY POWER CALCULATED POWER AT EED * Maz, wae warts dBW i 1.500 1.00 00000 65.16 2 1.300 1.00 00000 65.16 3 3.000 1.00 -00000 59.22 4 10.000 1.00 -00001 48.84 5 19.000 1.00 00004 43.57 6 28.000 1.00 00009 40.48 7 37.000 1.00 +0015 30.33 8 46.000 1.00 00021 36.69 9 55.000 1.00 00029 -35.38 10 64.000 1.00 +00037 -34.29 rr 73.000 1.00 +0046 33.36 12 82.000 1.00 00056 32.55 1B 91.000 1.00 00065 31.84 uu 100.000 1.00 00076 31.21 15 115.000 1.00 +0093 30.30 16 130.000 1.00 00112 -29.52 vv 145.000 1.00 00131 28.84 anaMIL-STD-1576 (USAF) 31 July 1984 TABLE A~1 (Continued) 18 160.000 1.00 +0150 28.24 19 175.000 00170 27.69 20 190.000 1.00 00190 27.21 22 220.000 1.00 00232 -26.35 23 235.000 1.00 00253 -25.77 24 250.000 1.00 00274 25.62 25 275.600 1.00 00062 -32.09 26 300.000 1.00 +00052 -32.84 27 325.000 1.00 +0044 -33.54 28 350.000 1.00 00038 34.18 29 375.000 1.00 00033 34.78 30 400.000 1.00 00029 ~35.34 31 425.000 1.00 00026 -35.87 a 32 450.000 1.00 00023 -36.37 33 475.000 1.00 00021 36.84 34 500.000 1.00 00019 37.28 35 540.000 1.00 00016 37.95, 36 580.000 1.00 00014 1-38.57 37 620.000 1.00 00012 39.15 38 660.000 1.00 00011 ~39.69 39 700.000 1.00 00010 40 740.000 1.00 00009 4 780.000 1.00 00008 WSs 42 820.000 1.00 00007 41.58 An43,MIL-STD-1576 (USAF) 31 July 1984 TABLE A-1 (Continued) 43 860.000 1.00 00006 41.99 4a 900.000 1.00 00006 42.39 45 900.000 1.00 00006 42.39 46 940.000 1.00 00005 42.76 47 980.000 1.00 00005, 43.13 49 1060.000 1.00 00004 43.81 50 1180.000 1.00 +0004 44.13 51 140.000 1.00 00004 44.44 22 1180.00 1.00 -vv0us 40.74 53 1220.000 1.00 00003 45.03 34 1260.000 1.00 00003 745.31we MIL-8T)-1576 (USAF) 31 July 1984 ‘TEST PLOT #2--PIN TO PIN DISCRETE CASE—UNSHIELDED EH ENVIRONMENT DATA SOURCE FREQUENCY POWER 10) HZ). HAREM acena 100, eera tee GANA DELTA EPSILON OMEGA c wt FREQUENCY IN He. FIGURE A-4 Sample Output - Pin-To-Pin Discrete Spectrum AW45MIL-STD-1576 (USAF) 31 July 1984 TABLE A-2 SAMPLE OUTPUT ~ PIN-TO~PIN DISCRETE SPECTRUM TEST PLOT #2 -- PIN-TO-PIN DISCRETE CASE -- UNSHIELDED UNSHIELDED PIN-TO-PIN IMPEDANCE DATA PFREQ( MHZ): OE+10 1+10 2£+10 36+10 4E+10 5E+10 68410 7E+10 8E+10 9E+10 Re (apc) Comms): 1641 DL LL JAREA OF LOOP: 9.5 SQR CM PERIMETER OF LOOP: 38.4 CM SOURCE 1D FREQUENCY POWER CALCULATED POWER AT EED| + MZ. w/e WATTS dBW 04944 5 EPSILON 500.000 6 OMEGA 000.000 1.00 100227 -26.43 AnhMIL-STD~1576 (USAF) 31 July 1984 4, JELO—VAR, A013 TEST PLOT 66-—PIN-TO-CASE CONTINUOUS SPECTRUM—24 a8 SHI We wpeonuce onra FREOCHE NE LRE Ons) se FE Ga 238357 358 13 e8 3 oe 188 18 808 28 2 oe 530.88 ine 308.98 1380.88 5 a 1. siicLoinc nye 'SHIELDcae> 24 B80. wt oy o FIGURE A-5 Sample Output ~ Pin-To-Case Mode AnaMIL-STD-1576 (USAF) 31 July 1984 TABLE A-3 SAMPLE OUTPUT ~ PIN-TO-CASE MODE TEST PLOT #6 -- PIN-TO-CASE CONTINUOUS SPECTRUM -24dB SHIELD -VAR. IMP. PIN-T0-CASE IMPEDANCE DATA 00420 1.00 00938 5 19.000 1.00 01031 6 28.000 1.00 201144 7 37,000 1.00 101285 8 46.000 1.00 101466 9 55.000 1.00 01706 10 64.000 1.00 +02039 12 82.000 1.00 +0695 4 100.000 1.00 +0468 16 130.000 1.00 00277 7 145.000 1.00 00222 18 160.000 1.00 00183 xa (mz, 1d SETA Uetttt oor 250 WH so} 174 900 1141300, Re (Zpe) (OHMS): 727 357160 167.25 3.17 2,82 9 LENGTH OF LEAD: 100 cH SOURCE FREQUENCY POWER CALCULATED POWER AT EED * MHZ. whe, WATTS dBW 1 1.500 1.00 00206 26.85 2 1.00 00206 726.85 |MIL-STD-1576 (USAF) 31 July 1984 TABLE A-3 (Continued) 19 175.000 1.00 00153 -28.16 22 220.000 1.00 00097 30.15 23 235.000 1.00 00085 1-30.72 24 250.000 1.00 00075 31.26 25 275.000 1.00 00259 25.87 26 300.000 1.00 +0252 25.98 27 325.000 1.00 +00251 26.01 28 350.000 1.00 00252 25.98 29 375.000 1.00 00256 -25.92 30 400.000 1.00 07523, 11.26 31 425.000 1.00 06709 11.73 450.000 1.00 06024 12.20 475.000 1.00 205443 35 540.000 1.00 +04283 -13.68 03751 36 580.000 37 620.000 1.00 +03317 714.79 02957 [ 8 660,000 3 700,000.00 voae5s abe 40 740-000 02399 16,20 aL 780.000 1.00 02181 16.61 42 820.000 1.00 01992 17.01 43 860.000 1.00 01829 17.38 An4gMIL-STD-1576 (USAF) 3 duly 1986 TABLE A~3 (Continued) 44 900.000 1.00 01686 -17.73 45 900.000 1.00 01686 “17.73 46 940.000 1.00 +01560 -18.07 47 980.000 1.00 +01449 ~18.39 48 1020,000 1.00 +01350 -18.70 49 1060.000 1.00 +01261 -18.99 50 1100.00 1.00 01182 19.27 SL 140.000 1.00 O11. 19.54 52 1180.00 1.00 101046 =19.81 3 1220.00 1.00 00987 =20.06 54 1260.00, 1.00 00934 =20.30 Custodian: Preparing Activity Air Force - 19 Air Force - 19 (Project SAFT - F vv7) 4-50INSTRUCTIONS: In a continuing effort to make our standardization documents better, the DoD provides this form for use in submitting commenta and suggestions for improvements. 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