CERTIFICATE OF ACCREDITATION

ANSI National Accreditation Board

11617 Coldwater Road, Fort Wayne, IN 46845 USA

This is to certify that

Fox Valley Metrology, Ltd.

30447 Stacy Pond Drive
Stacy MN 55079
has been assessed by ANAB and meets the requirements of international standard

ISO/IEC 17025:2017
and national standards
ANSI/NCSL Z540-1-1994 (R2002) and
ANSI/NCSL Z540.3-2006 (R2013)
while demonstrating technical competence in the fields of
CALIBRATION and DIMENSIONAL MEASUREMENT
Refer to the accompanying Scope of Accreditation for information regarding the types of
activities to which this accreditation applies

ACT-1272.03
Certificate Number

Certificate Valid Through: 06/15/2021

Version No. 004 Issued: 07/19/2019

This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017.
This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory
quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017,
ANSI/NCSL Z540-1-1994 (R2002) AND ANSI/NCSL Z540.3-2006 (R2013)

Fox Valley Metrology, Ltd.

30447 Stacy Pond Drive
Stacy, MN 55079
Chris Kuczynski 651-424-0035

CALIBRATION AND DIMENSIONAL MEASUREMENT

Valid to: June 15, 2021 Certificate Number: ACT-1272.03

CALIBRATION
Acoustics and Vibration
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Sound Level – Source1
Gen Rad 1562-A Sound
100 Hz, 250 Hz, 500 Hz, 114 dB 0.6 dB
Level Calibrator
1 000 Hz, 2 000 Hz

Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
pH Meters1 (4.01, 7, 10) pH 0.02 pH pH Buffer Solutions
12.85 mS/cm 0.18 mS/cm
Conductivity Meters1 Conductivity Solutions
1408 µS/cm 14 µS/cm
Refractometers1 (0.0, 18.0, 29.7) Brix 0.24 Brix Refractive Index Solutions

Electrical – DC/Low Frequency

Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
DC Voltage - Source1 Fluke 732B Voltage
10 V 0.8 µV/V
Fixed Value Standard

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 220 mV 12 µV/V + 0.4 µV
220 mV to 2.2 V 5.8 µV/V + 0.7 µV
(2.2 to 11) V 4.2 µV/V + 2.5 µV Fluke 5720A Multiproduct
DC Voltage - Source1
(11 to 22) V 4.1 µV/V + 4 µV Calibrator
(22 to 220) V 5.8 µV/V + 40 µV
220 V to 1.1 kV 7.6 µV/V + 0.4 mV
Up to 100 mV 7.8 µV/V + 0.8 µV
100 mV to 1 V 5.7 µV/V + 0.8 µV
Agilent 3458A Opt 002
DC Voltage - Measure1 (1 to 10) V 5.6 µV/V + 1 µV
Multimeter
(10 to 100) V 7.9 µV/V + 80 µV
100 V to 1 kV 7.9 µV/V + 0.15 mV
Up to 200 mV 5 µV/V + 0.10 µV
200 mV to 2 V 3.5 µV/V + 0.4 µV
DC Voltage - Measure1 (2 to 20) V 3.5 µV/V + 4 µV Fluke 8508A Multimeter
(20 to 200) V 5.5 µV/V + 40 µV
200 V to 1.05 kV 5.5 µV/V + 500 µV
(1 to 10) kV 60 V Hipotronics KVM-100
DC High Voltage - Measure1
(10 to 100) kV 0.6 kV High Voltage Meter
Up to 220 µA 0.12 mA/A + 6 nA
220 µA to 2.2 mA 42 µA/A + 7 nA
Fluke 5720A Multiproduct
DC Current - Source1 (2.2 to 22) mA 41 µA/A + 40 nA
Calibrator
(22 to 220) mA 52 µA/A + 0.7 µA
220 mV to 2.2 A 93 µA/A + 12 µA
(2.2 to 11) A 0.58 mA/A + 0.5 mA Fluke 5520A Multiproduct
DC Current - Source1
(11 to 20.5) A 1.2 mA/A + 0.75 mA Calibrator
Fluke 5520A Multiproduct
DC Current - Source1 (20.5 to 1 000) A 86 mA/A + 0.5 A Calibrator with 50-turn
Coil
Up to 100 nA 48 µA/A + 65 pA
100 nA to 1 µA 35 µA/A + 65 pA
(1 to 10) µA 35 µA/A + 0.15 nA
(10 to 100) µA 35 µA/A + 1.3 nA Agilent 3458A Opt 002
DC Current - Measure1
100 µA to 1 mA 35 µA/A + 10 nA Multimeter
(1 to 10) mA 36 µA/A + 0.1 µA
(10 to 100) mA 15 µA/A + 1 µA
100 mA to 1 A 0.14 mA/A + 20 µA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 200 µA 12 µA/A + 0.4 nA
200 µA to 2 mA 12 µA/A + 4 nA
(2 to 20) mA 14 µA/A + 40 nA
DC Current - Measure1 Fluke 8508A Multimeter
(20 to 200) mA 48 µA/A + 0.8 µA
200 mA to 2 A 0.19 mA/A + 16 µA
(2 to 20) A 4 mA/A + 0.4 mA
DC Current - Measure1 (1 to 10) A 2.4 mA/A + 0.7 mA Fluke Multimeter
Up to 2 Ω 17 µΩ/Ω + 4 µΩ
(2 to 20) Ω 9.5 µΩ/Ω + 14 µΩ
(20 to 200) Ω 8 µΩ/Ω + 50 µΩ
200 Ω to 2 kΩ 8 µΩ/Ω + 0.5 mΩ
Resistance - Measure1
(2 to 20) kΩ 8 µΩ/Ω + 5 mΩ Fluke 8508A Multimeter
Normal Mode
(20 to 200) kΩ 8 µΩ/Ω + 50 mΩ
200 kΩ to 2 MΩ 9 µΩ/Ω + 1 Ω
(2 to 20) MΩ 20 µΩ/Ω + 0.1 kΩ
(20 to 200) MΩ 0.12 mΩ/Ω + 10 kΩ
(2 to 20) MΩ 17 µΩ/Ω + 10 Ω
Resistance - Measure1 (20 to 200) MΩ 65 µΩ/Ω + 1 kΩ
Fluke 8508A Multimeter
High Voltage Mode 200 mΩ to 2 GΩ 0.18 mΩ/Ω + 0.1 MΩ
(2 to 20) GΩ 15 mΩ/Ω + 10 MΩ
0Ω 0.11 mΩ
1Ω 0.11 mΩ
1.9 Ω 0.21 mΩ
10 Ω 0.27 mΩ
19 Ω 0.51 mΩ
100 Ω 1.4 mΩ
190 Ω 2.6 mΩ
1 kΩ 11 mΩ Fluke 5720A Multiproduct
Resistance - Source1
1.9 kΩ 21 mΩ Calibrator
10 kΩ 0.11 Ω
19 kΩ 0.21 Ω
100 kΩ 1.3 Ω
190 kΩ 2.7 Ω
1 MΩ 24 Ω
1.9 MΩ 48 Ω
10 MΩ 0.48 kΩ

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
19 MΩ 1.1 kΩ Fluke 5720A Multiproduct
Resistance - Source1
100 MΩ 23 kΩ Calibrator
1 GΩ 1.9 MΩ
IET Labs HRRS
Resistance - Source1 10 GΩ 47 MΩ
Decade Box
100 GΩ 0.95 GΩ
Up to 10 Ω 24 µΩ/Ω + 0.1 mΩ
(10 to 100) Ω 20 µΩ/Ω + 1 mΩ
100 Ω to 1 kΩ 18 µΩ/Ω + 1 mΩ
(1 to 10) kΩ 18 µΩ/Ω + 10 mΩ
Agilent 3458A Opt 002
Resistance - Measure1 (10 to 100) kΩ 18 µΩ/Ω + 0.1 Ω
Multimeter
100 kΩ to 1 MΩ 24 µΩ/Ω + 7 mΩ
(1 to 10) MΩ 87 µΩ/Ω + 0.2 Ω
(10 to 100) MΩ 0.73 mΩ/Ω + 2 Ω
100 MΩ to 1 GΩ 7.2 mΩ/Ω + 20 kΩ
Up to 2.2 mV
(10 to 20) Hz 2.4 mV/V + 4 µV
(20 to 40) Hz 2.4 mV/V + 4 µV
40 Hz to 20 kHz 2.2 mV/V + 4 µV
(20 to 50) kHz 2.2 mV/V + 4 µV
(50 to 100) kHz 2.3 mV/V + 5 µV
(100 to 300) kHz 2.5 mV/V + 10 µV
(300 to 500) kHz 2.7 mV/V + 20 µV
500 kHz to 1 MHz 3.8 mV/V + 20 µV
(2.2 to 22) mV
(10 to 20) Hz 0.61 mV/V + 4 µV
(20 to 40) Hz 0.56 mV/V + 4 µV
40 Hz to 20 kHz 0.36 mV/V + 4 µV
Fluke 5720A Multiproduct
AC Voltage - Source1 (20 to 50) kHz 0.42 mV/V + 4 µV
(50 to 100) kHz 0.7 mV/V + 5 µV Calibrator
(100 to 300) kHz 1.3 mV/V + 10 µV
(300 to 500) kHz 1.7 mV/V + 20 µV
500 kHz to 1 MHz 3.4 mV/V + 20 µV
(22 to 220) mV
(10 to 20) Hz 0.29 mV/V + 12 µV
(20 to 40) Hz 0.13 mV/V + 7 µV
40 Hz to 20 kHz 0.11 mV/V + 7 µV
(20 to 50) kHz 0.24 mV/V + 7 µV
(50 to 100) kHz 0.54 mV/V + 17 µV
(100 to 300) kHz 1.1 mV/V + 20 µV
(300 to 500) kHz 1.6 mV/V + 25 µV
500 kHz to 1 MHz 3.3 mV/V + 45 µV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(0.22 to 2.2) V
(10 to 20) Hz 0.28 mV/V + 40 µV
(20 to 40) Hz 0.11 mV/V + 15 µV
40 Hz to 20 kHz 55 µV/V + 8 µV
(20 to 50) kHz 0.12 mV/V + 10 µV
(50 to 100) kHz 0.13 mV/V + 30 µV
(100 to 300) kHz 0.49 mV/V + 80 µV
(300 to 500) kHz 1.2 mV/V + 0.2 mV
500 kHz to 1 MHz 2.0 mV/V + 0.3 mV
(2.2 to 22) V
(10 to 20) Hz 0.28 mV/V + 0.2 mV
(20 to 40) Hz 0.11 mV/V + 0.15 mV
40 Hz to 20 kHz 56 µV/V + 50 µV
(20 to 50) kHz 0.12 mV/V + 0.1 mV
(50 to 100) kHz 0.12 mV/V + 0.2 mV Fluke 5720A Multiproduct
AC Voltage - Source1 (100 to 300) kHz 0.32 mV/V + 0.6 mV Calibrator
(300 to 500) kHz 1.2 mV/V + 2 mV
500 kHz to 1 MHz 1.8 mV/V + 3.2 mV
(22 to 220) V
(10 to 20) Hz 0.28 mV/V + 4 mV
(20 to 40) Hz 0.11 mV/V + 1.5 mV
40 Hz to 20 kHz 65 µV/V + 0.6 mV
(20 to 50) kHz 0.12 mV/V + 1 mV
(50 to 100) kHz 0.18 mV/V + 2.5 mV
(100 to 300) kHz 1.1 mV/V + 16 mV
(300 to 500) kHz 5.1 mV/V + 40 mV
500 kHz to 1 MHz 9.3 mV/V + 80 mV
220 V to 1.1 kV
(15 to 50) Hz 0.35 mV/V + 16 mV
50 Hz to 1 kHz 88 µV/V + 3.5 mV
AC Voltage Harmonics –
Source
(2nd to 50th) 1
(10 to 45) Hz 32 mV to 33 V 0.35 mV/V + 16 µV Fluke 5520A Multiproduct
(45 to 65) Hz 33 mV to 1 kV 0.21 mV/V + 16 µV Calibrator
(65 to 500) Hz 33 mV to 1 kV 0.21 mV/V + 16 µV
500 Hz to 5 kHz 330 mV to 1 kV 0.21 mV/V + 0.21 mV
(5 to 10) kHz 3.3 V to 1 kV 0.21 mV/V + 1.2 mV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 10 mV
(1 to 40) Hz 0.46 mV/V + 13 µV
40 Hz to 1 kHz 0.35 mV/V + 11 µV
(1 to 20) kHz 0.46 mV/V + 11 µV
(20 to 50) kHz 1.3 mV/V + 11 µV
(50 to 100) kHz 5.9 mV/V + 11 µV
(100 to 300) kHz 46 µV/V + 12 µV
(10 to 100) mV
(1 to 40) Hz 0.14 mV/V + 4.5 µV
40 Hz to 1 kHz 0.14 mV/V + 2.5 µV
(1 to 20) kHz 0.22 mV/V + 2.5 µV
(20 to 50) kHz 0.41 mV/V + 2.5 µV
(50 to 100) kHz 0.99 mV/V + 2.5 µV
(100 to 300) kHz 3.5 mV/V + 11 µV
300 kHz to 1 MHz 12 mV/V + 11 µV
(1 to 2) MHz 18 mV/V + 11 µV
100 mV to 1 V
(1 to 40) Hz 0.14 mV/V + 45 µV
40 Hz to 1 kHz 0.14 mV/V + 25 µV
(1 to 20) kHz 0.22 mV/V + 25 µV
AC Voltage - Measure1 (20 to 50) kHz 0.41 mV/V + 25 µV Agilent 3458A Opt 002
Bandwidth < 2 MHz (50 to 100) kHz 0.99 mV/V + 25 µV Multimeter
(100 to 300) kHz 3.5 mV/V + 0.11 mV
300 kHz to 1 MHz 12 mV/V + 0.11 mV
(1 to 2) MHz 18 mV/V + 0.11 mV
(1 to 10) V
(1 to 40) Hz 0.14 mV/V + 0.45 mV
40 Hz to 1 kHz 0.14 mV/V + 0.25 mV
(1 to 20) kHz 0.22 mV/V + 0.25 mV
(20 to 50) kHz 0.41 mV/V + 0.25 mV
(50 to 100) kHz 0.98 mV/V + 0.25 mV
(100 to 300) kHz 3.5 mV/V + 1.1 mV
300 kHz to 1 MHz 12 mV/V + 1.1 mV
(1 to 2) MHz 18 mV/V + 1.1 mV
(10 to 100) V
(1 to 40) Hz 0.29 mV/V + 4.5 mV
40 Hz to 1 kHz 0.29 mV/V + 2.5 mV
(1 to 20) kHz 0.29 mV/V + 2.5 mV
(20 to 50) kHz 0.29 mV/V + 2.5 mV
(50 to 100) kHz 1.5 mV/V + 2.5 mV
(100 to 300) kHz 4.7 mV/V + 11 mV
300 kHz to 1 MHz 18 mV/V + 11 mV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
100 V to 1 kV
(1 to 40) Hz 0.52 mV/V + 45 mV
AC Voltage - Measure1 40 Hz to 1 kHz 0.52 mV/V + 25 mV Agilent 3458A Opt 002
Bandwidth < 2 MHz (1 to 20) kHz 0.75 mV/V + 25 mV Multimeter
(20 to 50) kHz 1.5 mV/V + 25 mV
(50 to 100) kHz 3.5 mV/V + 25 mV
(1 to 10) kV
AC Voltage - Measure1 (50 to 60) Hz 0.12 kV Hipotronics KVM-100
Bandwidth < 2 MHz (10 to 100) kV High Voltage Meter
(50 to 60) Hz 1.2 kV
Up to 10 mV
45 Hz to 100 kHz 1.2 mV/V + 6 µV
100 kHz to 1 MHz 14 mV/V + 5.1 µV
(1 to 4) MHz 83 mV/V + 7.1 µV
(4 to 8) MHz 0.24 V/V + 8.1 µV
(10 to 100) mV
45 Hz to 100 kHz 1.1 mV/V + 61 µV
100 kHz to 1 MHz 24 mV/V + 51 µV
(1 to 4) MHz 47 mV/V + 71 µV
(4 to 8) MHz 47 mV/V + 81 µV
(8 to 10) MHz 0.18 V/V + 0.1 mV
AC Voltage – Measure1 100 mV to 1 V Agilent 3458A Opt 002
Bandwidth > 2 MHz 45 Hz to 100 kHz 1.1 mV/V + 0.61 mV Multimeter
100 kHz to 1 MHz 24 mV/V + 0.51 mV
(1 to 4) MHz 47 mV/V + 0.71 mV
(4 to 8) MHz 47 mV/V + 0.81 mV
(8 to 10) MHz 0.18 V/V + 1 mV
(1 to 10) V
45 Hz to 100 kHz 1.2 mV/V + 6.1 µV
100 kHz to 1 MHz 24 mV/V + 5.1 µV
(1 to 4) MHz 47 mV/V + 7.1 µV
(4 to 8) MHz 47 mV/V + 8.1 µV
(8 to 10) MHz 0.18 V/V + 10 µV
(10 to 100) V
AC Voltage – Measure1 45 Hz to 100 kHz 1.5 mV/V + 2.5 mV Hipotronics KVM-100
Bandwidth > 2 MHz 100 V to 1 kV High Voltage Meter
45 Hz to 100 kHz 3.6 mV/V + 0.11 V

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 200 mV
(1 to 10) Hz 0.17 mV/V + 14 µV
(10 to 40) Hz 0.14 mV/V + 4 µV
(40 to 100) Hz 0.12 mV/V + 4 µV
100 Hz to 2 kHz 0.11 mV/V + 2 µV
(2 to 10) kHz 0.14 mV/V + 4 µV
(10 to 30) kHz 0.34 mV/V + 8 µV
(30 to 100) kHz 0.77 mV/V + 20 µV
200 mV to 2 V
(1 to 10) Hz 0.15 mV/V + 0.12 mV
(10 to 40) Hz 0.12 mV/V + 20 µV
(40 to 100) Hz 90 µV/V + 20 µV
100 Hz to 2 kHz 75 µV/V + 20 µV
(2 to 10) kHz 0.11 mV/V + 20 µV
(10 to 30) kHz 0.22 mV/V + 0.84 mV
(30 to 100) kHz 0.57 mV/V + 0.2 mV
(100 to 300) kHz 3 mV/V + 2 mV
300 kHz to 1 MHz 10 mV/V + 2 mV
AC Voltage - Measure1 (2 to 20) V
Fluke 8508A Multimeter
Bandwidth < 1 MHz (1 to 10) Hz 0.15 mV/V + 1.2 mV
(10 to 40) Hz 0.12 mV/V + 0.2 mV
(40 to 100) Hz 90 µV/V + 0.2 mV
100 Hz to 2 kHz 75 µV/V + 0.2 mV
(2 to 10) kHz 0.11 mV/V + 0.2 mV
(10 to 30) kHz 0.22 mV/V + 8.4 mV
(30 to 100) kHz 0.57 mV/V + 2 mV
(100 to 300) kHz 3 mV/V + 20 mV
300 kHz to 1 MHz 10 mV/V + 20 mV
(20 to 200) V
(1 to 10) Hz 0.15 mV/V + 12 mV
(10 to 40) Hz 0.12 mV/V + 2 mV
(40 to 100) Hz 90 µV/V + 2 mV
100 Hz to 2 kHz 75 µV/V + 2 mV
(2 to 10) kHz 0.11 mV/V + 2 mV
(10 to 30) kHz 0.22 mV/V + 84 mV
(30 to 100) kHz 0.57 mV/V + 20 mV
(100 to 300) kHz 3 mV/V + 0.2 V
300 kHz to 1 MHz 10 mV/V + 0.2 V

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
200 V to 1.05 kV
(1 to 10) Hz 0.15 mV/V + 70 mV
AC Voltage - Measure1 (10 to 40) Hz 0.12 mV/V + 20 mV
40 Hz to 10 kHz 0.12 mV/V + 20 mV Fluke 8508A Multimeter
Bandwidth < 1 MHz
(10 to 30) kHz 0.23 mV/V + 40 mV
(30 to 100) kHz 0.58 mV/V + 0.2 V
Up to 220 μA
(10 to 20) Hz 0.30 mA/A + 16 nA
(20 to 40) Hz 0.20 mA/A + 10 nA
40 Hz to 1 kHz 0.16 mA/A + 8 nA
(1 to 5) kHz 0.22 mA/A + 12 nA
(5 to 10) kHz 1.3 mA/A + 65 nA
220 μA to 2.2 mA
(10 to 20) Hz 0.31 mA/A + 40 nA
(20 to 40) Hz 0.22 mA/A + 35 nA
40 Hz to 1 kHz 0.15 mA/A + 35 nA
(1 to 5) kHz 0.24 mA/A + 0.11 µA
(5 to 10) kHz 1.3 mA/A + 0.65 µA
(2.2 to 22) mA
(10 to 20) Hz 0.32 mA/A + 0.4 µA
(20 to 40) Hz 0.23 mA/A + 0.35 µA
40 Hz to 1 kHz 0.15 mA/A + 0.35 µA Fluke 5720A Multiproduct
AC Current - Source1 (1 to 5) kHz 0.24 mA/A + 0.55 µA Calibrator
(5 to 10) kHz 1.3 mA/A + 5 µA
(22 to 220) mA
(10 to 20) Hz 0.30 mA/A + 4 µA
(20 to 40) Hz 0.20 mA/A + 3.5 µA
40 Hz to 1 kHz 0.15 mA/A + 2.5 µA
(1 to 5) kHz 0.24 mA/A + 3.5 µA
(5 to 10) kHz 1.3 mA/A + 10 µA
220 mA to 2.2 A
20 Hz to 1 kHz 0.31 mA/A + 35 µA
(1 to 5) kHz 0.53 mA/A + 80 µA
(5 to 10) kHz 8.1 mA/A + 0.16 mA
(2 to 3) A
(10 to 45) Hz 2.1 mA/A + 0.1 mA
40 Hz to 1 kHz 0.75 mA/A + 0.1 mA
(1 to 5) kHz 6.9 mA/A + 1 mA
(5 to 10) kHz 29 mA/A + 5 mA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(3 to 11) A
(45 to 100) Hz 0.74 mA/A + 2 mA
(0.1 to 1) kHz 1.2 mA/A + 2 mA
(1 to 5) kHz 35 mA/A + 2 mA Fluke 5520A Multiproduct
AC Current - Source1
(11 to 20.5) A Calibrator
(45 to 100) Hz 1.4 mA/A + 5 mA
(0.1 to 1) kHz 1.8 mA/A + 5 mA
(1 to 5) kHz 35 mA/A + 5 mA
(20.5 to 1 000) A
(45 to 65) Hz 90 mA/A + 0.5 A Fluke 5520A Multiproduct
AC Current - Source1 (20.5 to 150) A Calibrator w/ 50-turn Coil
(65 to 440) Hz 0.55 mA/A + 0.5 mA
AC Current Harmonics -
Source1
(2nd to 50th)
(10 to 45) Hz 3.3 mA to 3 A 1.1 mA/A + 4 µA Fluke 5520A Multiproduct
(45 to 65) Hz 3.3 mA to 20.5 A 0.5 mA/A + 4 µA Calibrator
(65 to 500) Hz 33 mA to 20.5 A 1.2 mA/A + 0.1 mA
500 Hz to 5 kHz 33 mA to 20.5 A 2.3 mA/A + 0.2 mA
(5 to 10) kHz (33 to 330) mA 4.6 mA/A + 0.4 mA
Up to 100 µA
(10 to 20) Hz 4.8 mA/A + 30 nA
(20 to 45) Hz 1.9 mA/A + 30 nA
(45 to 100) Hz 0.83 mA/A + 30 nA
100 Hz to 5 kHz 0.83 mA/A + 30 nA
100 µA to 1 mA
(10 to 20) Hz 4.9 mA/A + 0.2 µA
(20 to 45) Hz 1.9 mA/A + 0.2 µA
(45 to 100) Hz 0.83 mA/A + 0.2 µA
100 Hz to 5 kHz 0.47 mA/A + 0.2 µA
Agilent 3458A Opt 002
AC Current - Measure1 (5 to 20) kHz 0.83 mA/A + 0.2 µA
Multimeter
(20 to 50) kHz 4.9 mA/A + 0.4 µA
(50 to 100) kHz 6.6 mA/A + 1.5 µA
(1 to 10) mA
(10 to 20) Hz 4.9 mA/A + 2 µA
(20 to 45) Hz 1.9 mA/A + 2 µA
(45 to 100) Hz 0.83 mA/A + 2 µA
100 Hz to 5 kHz 0.47 mA/A + 2 µA
(5 to 20) kHz 0.83 mA/A + 2 µA
(20 to 50) kHz 4.9 mA/A + 4 µA
(50 to 100) kHz 6.6 mA/A + 15 µA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(10 to 100) mA
(10 to 20) Hz 4.9 mA/A + 20 µA
(20 to 45) Hz 1.9 mA/A + 20 µA
(45 to 100) Hz 0.83 mA/A + 20 µA
100 Hz to 5 kHz 0.47 mA/A + 20 µA
(5 to 20) kHz 0.47 mA/A + 20 µA
(20 to 50) kHz 4.9 mA/A + 40 µA
Agilent 3458A Opt 002
AC Current - Measure1 (50 to 100) kHz 6.6 mA/A + 0.15 mA
100 mA to 1 A Multimeter
(10 to 20) Hz 4.8 mA/A + 0.2 mA
(20 to 45) Hz 2 mA/A + 0.2 mA
(45 to 100) Hz 1.1 mA/A + 0.2 mA
100 Hz to 5 kHz 1.3 mA/A + 0.2 mA
(5 to 20) kHz 3.7 mA/A + 0.2 mA
(20 to 50) kHz 12 mA/A + 0.4 mA
(1 to 10) A
AC Current - Measure1 (20 to 50) Hz 0.23 A/A + 10 mA Fluke Multimeter
50 Hz to 2 kHz 36 mA/A + 10 mA
Up to 200 µA
(1 to 10) Hz 0.31 mA/A + 20 nA
10 Hz to 10 kHz 0.3 mA/A + 20 nA
(10 to 30) kHz 0.71 mA/A + 20 nA
(30 to 100) kHz 4 mA/A + 20 nA
200 µA to 2 mA
(1 to 10) Hz 0.31 mA/A + 0.2 µA
10 Hz to 10 kHz 0.3 mA/A + 0.2 µA
(10 to 30) kHz 0.71 mA/A + 0.2 µA
AC Current - Measure1 (30 to 100) kHz 4 mA/A + 0.2 µA Fluke 8508A Multimeter
(2 to 20) mA
(1 to 10) Hz 0.31 mA/A + 2 µA
10 Hz to 10 kHz 0.3 mA/A + 2 µA
(10 to 30) kHz 0.71 mA/A + 2 µA
(30 to 100) kHz 4 mA/A + 2 µA
(20 to 200) mA
(1 to 10) Hz 0.31 mA/A + 20 µA
10 Hz to 10 kHz 0.3 mA/A + 20 µA
(10 to 30) kHz 0.63 mA/A + 20 µA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
200 mA to 2A
10 Hz to 2 kHz 0.62 mA/A + 0.2 mA
(2 to 10) kHz 0.73 mA/A + 0.2 mA
AC Current - Measure1 (10 to 30) kHz 3 mA/A + 0.2 mA Fluke 8508A Multimeter
(2 to 20) A
10 Hz to 2 kHz 0.82 mA/A + 2 mA
(2 to 10) kHz 2.5 mA/A + 2 mA
Capacitance - Measure1
0.32 pF to 370 mF 1.1 mF/F Hioki 3532-50 LCR Meter
42 Hz to 5 MHz
130 pF to 3.3 nF 5.8 mF/F + 10 pF
(3.3 to 11) nF 2.9 mF/F + 10 pF
(11 to 110) nF 2.9 mF/F + 0.1 nF
(110 to 330) nF 2.9 mF/F + 0.3 nF
330 nF to 1.1 µF 2.9 mF/F + 1 nF
(1.1 to 3.3) µF 2.9 mF/F + 3 nF Fluke 5520A Multiproduct
Capacitance - Source1
(3.3 to 11) µF 2.9 mF/F + 10 nF Calibrator
(11 to 33) µF 4.7 mF/F + 30 nF
(33 to 110) µF 5.3 mF/F + 0.1 µF
(110 to 330) µF 1 mF/F + 0.3 µF
330 µF to 1.1 mF 6 mF/F + 1 µF
(1.1 to 3.3) mF 5.3 mF/F + 3 µF
(3.3 to 11) mF 5.3 mF/F + 10 µF
Fluke 5520A Multiproduct
Capacitance - Source1 (11 to 33) mF 8.9 mF/F + 30 µF
Calibrator
(33 to 110) mF 13 mF/F + 0.1 mF
(0 to 360) °
10 Hz to 2 kHz 0.026 °
(2 to 5) kHz 0.036 °
(5 to 10) kHz 0.048 °
(10 to 50) kHz 0.059 °
(50 to 60) kHz 0.07 ° Clark Hess 6000A Phase
Phase - Measure1
(60 to 70) kHz 0.082 ° Meter
(70 to 80) kHz 0.093 °
(80 to 90) kHz 0.1 °
(90 to 100) kHz 0.12 °
(100 to 500) kHz 0.58 °
500 kHz to 1 MHz 1.2 °

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Page 12 of 27
Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Oscilloscopes1
DC Voltage (50 Ω) 1 mV to 6.6 V 2.9 mV/V + 40 µV
DC Voltage (1 MΩ) 1 mV to 130 V 0.55 mV/V +40 µV

AC Voltage (50 Ω) 1 mV to 6.6 V 2.9 mV/V + 40 µV

AC Voltage (1 MΩ) 1 mV to 130 V 1.1 mV/V + 40 µV

Leveled Sine Wave

50 kHz to 1.1 GHz 5 mV to 5.5 V 51 mV/V + 0.1 mV

Time Markers 1 ns to 5 s 6.4 µs/s Fluke 5520A SC1100

Multiproduct Calibrator
Wave Generator (50 Ω) 1.8 mV to 2.5 V p-p 35 mV/V + 0.10 mV
Wave Generator (1 MΩ) 1.8 mV to 55 V p-p 35 mV/V + 0.10 mV

Pulse Generator - Width (4 to 45) ns 58 ms/s + 0.5 ns

(45 to 500) ns 58 ms/s + 4 ns

Pulse Generator - Period 200 ns to 20 ms 58 ms/s + 0.2 µs

Input Impedance Measure (50 o 60) Ω 1.2 mΩ/Ω

50 Ω to 1 MΩ 1.2 mΩ/Ω
10 mW to 330 W 0.27 mW/W
Fluke 5520A Multiproduct
DC Power - Source1 330 W to 3 kW 0.26 mW/W
Calibrator
(3 to 20.5) kW 0.82 mW/W
100 µW to 9 W 1.7 mW/W
(9 to 33) W 1.2 mW/W
(33 to 90) W 1.7 mW/W Fluke 5520A Multiproduct
AC Power - Source1
(90 to 330) W 1.2 mW/W Calibrator
(330 to 900) W 11 mW/W
900 W to 2.2 kW 4.6 mW/W
Pt 385, 100 Ω
(-200 to -80) °C 0.05 °C
(-80 to 0) °C 0.05 °C
Electrical Simulation of RTD (0 to 100) °C 0.07 °C Fluke 5520A Multiproduct
Instrumentation1 (100 to 300) °C 0.09 °C Calibrator
(300 to 400) °C 0.1 °C
(500 to 630) °C 0.12 °C
(630 to 800) °C 0.23 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Pt 3926, 100 Ω
(-200 to -80) °C 0.05 °C
(-80 to 0) °C 0.05 °C
(0 to 100) °C 0.07 °C
(100 to 300) °C 0.09 °C
(300 to 400) °C 0.1 °C
(500 to 630) °C 0.12 °C
Pt 3916 (JIS) 100 Ω
(-200 to -190) °C 0.25 °C
(-190 to -80) °C 0.04 °C
(-80 to 0) °C 0.05 °C
(100 to 260) °C 0.06 °C
(260 to 300) °C 0.07 °C
(300 to 400) °C 0.09 °C
(400 to 600) °C 0.1 °C
(600 to 630) °C 0.23 °C
Electrical Simulation of RTD Pt 385, 200 Ω Fluke 5520A Multiproduct
Instrumentation1 (-200 to -80) °C 0.04 °C Calibrator
(-80 to 0) °C 0.04 °C
(0 to 100) °C 0.04 °C
(100 to 260) °C 0.05 °C
(260 to 300) °C 0.12 °C
(300 to 400) °C 0.13 °C
(400 to 600) °C 0.14 °C
(600 to 630) °C 0.16 °C
Pt 385, 500 Ω
(-200 to -80) °C 0.04 °C
(-80 to 0) °C 0.05 °C
(0 to 100) °C 0.05 °C
(100 to 260) °C 0.06 °C
(260 to 300) °C 0.08 °C
(300 to 400) °C 0.08 °C
(400 to 600) °C 0.09 °C
(600 to 630) °C 0.11 °C

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Page 14 of 27
Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Pt 385, 1 000 Ω
(-200 to -80) °C 0.03 °C
(-80 to 0) °C 0.03 °C
(0 to 100) °C 0.04 °C
(100 to 260) °C 0.05 °C
(260 to 300) °C 0.06 °C
(300 to 400) °C 0.07 °C
Electrical Simulation of RTD Fluke 5520A Multiproduct
(400 to 600) °C 0.07 °C
Instrumentation1 Calibrator
(600 to 630) °C 0.23 °C
PtNi 385, 120 Ω, Ni 120
(-80 to 0) °C 0.08 °C
(0 to 100) °C 0.08 °C
(100 to 260) °C 0.14 °C
Cu 427, 10 Ω
(-100 to 260) °C 0.03 °C
Type K
(-200 to -100) °C 0.33 °C
(-100 to -25) °C 0.18 °C
(-25 to 120) °C 0.16 °C
(120 to 1 000) °C 0.26 °C
(1 000 to 1 372) °C 0.4 °C
Type J
(-210 to -100) °C 0.27 °C
(-100 to -30) °C 0.16 °C
(-30 to 150) °C 0.14°C
Electrical Simulation of (150 to 760) °C 0.17°C
Fluke 5520A Multiproduct
Thermocouple (760 to 1 200) °C 0.23°C
Calibrator
Instrumentation1 Type E
(-250 to -100) °C 0.5 °C
(-100 to -35) °C 0.16 °C
(-25 to 350) °C 0.14°C
(350 to 650) °C 0.16°C
(650 to 1 000) °C 0.21°C
Type T
(-250 to -150) °C 0.63 °C
(-150 to 0) °C 0.24 °C
(0 to 120) °C 0.16 °C
(120 to 400) °C 0.14 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Type S
(0 to 250) °C 0.47 °C
(250 to 1 000) °C 0.36 °C
(1 000 to 1 400) °C 0.37 °C
(1 400 to 1 767) °C 0.46 °C
Type B
(600 to 800) °C 0.44 °C
(-100 to -25) °C 0.34 °C
(-25 to 120) °C 0.3 °C
(120 to 1 000) °C 0.33 °C
Type C
(0 to 150) °C 0.3 °C
(150 to 650) °C 0.26 °C
(650 to 1 000) °C 0.31 °C
(1 000 to 1 800) °C 0.5 °C
(1 800 to 2 316) °C 0.84 °C
Electrical Simulation of
Type L Fluke 5520A Multiproduct
Thermocouple
(-200 to -100) °C 0.37 °C Calibrator
Instrumentation1
(-100 to 800) °C 0.26 °C
(800 to 900) °C 0.17 °C
Type N
(-200 to -100) °C 0.4 °C
(-100 to -25) °C 0.22 °C
(-25 to 120) °C 0.19 °C
(120 to 410) °C 0.18 °C
(410 to 1 300) °C 0.27 °C
Type R
(0 to 250) °C 0.57 °C
(250 to 400) °C 0.35 °C
(400 to 1 000) °C 0.33 °C
(1 000 to 1 767) °C 0.4 °C
Type U
(-200 to 0) °C 0.56 °C
(0 to 600) °C 0.27 °C
(1 to 10) mH 22 mH/H
(10 to 100) mH 11 mH/H General Radio 1490-D
Inductance - Source1
100 mH to 1 H 6 mH/H Decade Inductor
(1 to 10) H 3 mH/H
Ionizers1
Trek 156A Charged Plate
Decay Time (0.1 to 999.9) s 0.2 s
Monitor
Float Voltage (-1 100 to 1 100) V 3.1 V

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Page 16 of 27
Electrical - RF/Microwave
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
RF Power - Measure1
Absolute Level
100 kHz to 3 GHz 0.37 dB
(3 to 18) GHz (+20 to +30) dBm 0.39 dB Agilent N5531S
(18 to 26.5) GHz 0.4 dB Measuring Receiver with
N5532A Sensor Modules
100 kHz to 3 GHz 0.15 dB
(3 to 18) GHz (-20 to +20) dBm 0.18 dB
(18 to 26.5) GHz 0.21 dB
Amplitude Modulation
- Source1 Agilent E8257D Signal
250 kHz to 40 GHz 7.1 % of setting + 1 %
Rate: DC to 100 kHz Generator
Depths: 0 % to 100 %
Amplitude Modulation
- Measure1
100 kHz to 10 MHz Rate: 50 Hz to 10 kHz
Depths: 5 % to 99 % 2.2 % of reading

10 MHz to 3 GHz Rate: 50 Hz to 100 kHz Agilent N5531S

Depths: 20 % to 99 % 1.2 % of reading Measuring Receiver with
N5532A Sensor Modules
10 MHz to 3 GHz Rate: 50 Hz to 100 kHz
Depths: 5 % to 20 % 4.2 % of reading

(3 to 26.5) GHz Rate: 50 Hz to 100 kHz

Depths: 20 % to 99 % 3.5 % of reading
Amplitude Modulation Agilent N5531S
- Measure1 Rate: 50 Hz to 100 kHz Measuring Receiver with
(3 to 26.5) GHz Depths: 5 % to 20 % 6 % of reading N5532A Sensor Modules
Phase Modulation
Agilent E8257D Signal
- Source1 250 kHz to 40 GHz 5.9 % setting + 0.1 rad
Generator
Rate: DC to 100 kHz

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Electrical - RF/Microwave
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Phase Modulation
- Measure1
Rate: 200 Hz 20 kHz
100 kHz to 6.6 GHz Dev.: > 0.7 rad 1.2 % of reading
Rate: 200 Hz 20 kHz
100 kHz to 6.6 GHz Dev.: > 0.3 rad 3.6 % of reading
Agilent N5531S Measuring
Rate: 200 Hz 20 kHz
Receiver with N5532A
(6.6 to 13.2) GHz Dev.: > 2.0 rad 1.2 % of reading
Sensor Modules
Rate: 200 Hz 20 kHz
(6.6 to 13.2) GHz Dev.: > 0.6 rad 3.6 % of reading
Rate: 200 Hz 20 kHz
(13.2 to 26.5) GHz Dev.: > 2.0 rad 1.2 % of reading
Rate: 200 Hz 20 kHz
(13.2 to 26.5) GHz Dev.: > 0.6 rad 3.6 % of reading
Tuned RF Level
- Measure1
Absolute Level
(+16 to +30) dBm 0.37 dB + 0.005 dB/10 dB
500 kHz to 3.05 GHz (-106 to +16) dBm 0.15 dB + 0.005 dB/10 dB
(-129 to –106) dBm 0.15 dB + 0.12 dB/10 dB

(+20 to +30) dBm 0.39 dB + 0.005 dB/10 dB

(3.05 to 6.6) GHz (-90 to +20) dBm 0.18 dB + 0.005 dB/10 dB
(-114 to -90) dBm 0.23 dB + 0.12 dB/10 dB
Agilent N5531S
Measuring Receiver with
(+20 to +30) dBm 0.39 dB + 0.005 dB/10 dB
N5532A Sensor Modules
(6.6 to 13.2) GHz (-81 to +20) dBm 0.18 dB + 0.005 dB/10 dB
(-104 to -81) dBm 0.23 dB + 0.12 dB/10 dB

(+20 to +30) dBm 0.4 dB + 0.005 dB/10 dB

(13.2 to 19.2) GHz (-70 to +20) dBm 0.21 dB + 0.005 dB/10 dB
(-93 to -70) dBm 0.25 dB + 0.12 dB/10 dB

(+20 to +30) dBm 0.4 dB + 0.005 dB/10 dB

(19.2 to 26.5) GHz (-62 to +20) dBm 0.21 dB + 0.005 dB/10 dB
(-85 to -62) dBm 0.24 dB + 0.12 dB/10 dB
Tuned RF Level
- Measure1
Agilent N5531S
Relative Level
Measuring Receiver with
(-90 to +30) dBm 0.026 dB + 0.005 dB/10 dB
500 kHz to 3.05 GHz (-106 to -90) dBm 0.067 dB + 0.12 dB/10 dB N5532A Sensor Modules
(-129 to -106) dBm 0.076 dB + 0.12 dB/10 dB

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Electrical - RF/Microwave
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
RF Power Sensors- Tegam 1827 Power Sensor
Calibration Factor1 Calibrator, Agilent 3458A
Multimeter, Agilent
100 kHz to 10 MHz 1.5 %CF E8257D Signal Generator,
10 MHz to 10 GHz (-20 to +14) dBm 1.5 %CF Agilent E4419B Power
(10 to 18) GHz 1.7 %CF Meter, Agilent 3325B
Function Generator
Frequency Modulation
- Measure1
Rate: 20 Hz to 10 kHz Agilent N5531S Measuring
250 kHz to 10 MHz Dev.: ≤ 40 kHz peak 3.1 % of reading Receiver with N5532A
Sensor Modules
Rate: 20 Hz to 200 kHz
10 MHz to 3 GHz Dev.: ≤ 400 kHz peak 3.1 % of reading
Frequency Modulation
Agilent N5531S Measuring
- Measure1
Receiver with N5532A
Rate: 20 Hz to 200 kHz
Sensor Modules
(3 to 26.5) GHz Dev.: ≤ 400 kHz peak 7.7 % of reading
Frequency Modulation 1 dB Rate: DC to 100 kHz
Agilent E8257D Signal
- Source1 3 dB Rate: DC to 10 MHz 4.2 % setting + 20 Hz
Generator
250 kHz to 40 GHz Dev: ≤ (N X 800 kHz)
Pulse Generation
- Measure1
DC to 225 MHz Agilent 53132A Counter
Pulse Width 5 ns to 105 s 1.1 ns
Rise/Fall Time 5 ns to 105 s 1.1 ns
Pulse Generation
- Source1
Agilent E8257D Signal
Repetition Frequency: 0.024 10 ns to 42 s 17 ns
Generator
Hz to 14.28 MHz
Period: 70 ns to 42 s
Pulse Modulation
- Source1 Agilent E8257D Signal
Level (0 to 9) dBm 0.59 dB Generator
Rise/Fall Time 10 MHz to 40 GHz 12 ns

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Page 19 of 27
Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
LabMaster Universal
Gage Blocks2 Up to 10 in (3.9 + 1.3L) µin Measuring Machine
Per ASME B89.1.9
ULM 600
Gage Blocks2 (10 to 20) in (8.5 + 1L) µin Measuring Machine
Per ASME B89.1.9
Mahr 828 Measuring
Gage Blocks2 Up to 20 in (3.9 + 1.3L) µin Machine
Per ASME B89.1.9
Length Standards2 Up to 9 in (39 + 0.4L) µin P&W Supermicrometer
ULM 600
Length Standards2 (9 to 24) in (12 + 1L) µin
Measuring Machine
Length Standards2 (24 to 70) in (390 + 2.6L) µin CMM
LabMaster Universal
2 (0.25 to 8) in (13 + 1.3D) µin
Cylindrical Rings ULM 600
(0.025 to 12) in (13 + 1.8D) µin
ASME B89.1.6
Fowler Lab Concept
Cylindrical Rings1,2 (0.25 to 8) in (12 + 3D) µin Measuring Machine
ASME B89.1.6
Cylindrical Plugs2 (0.010 to 8) in (2.7 + 6D) µin LabMaster Universal

Cylindrical Plugs1,2 (0.010 to 4) in (53 + 0.4D) µin Plug gage Comparator

ULM 600 Measuring
Thread Wires2 (0.005 to 0.5) in (11 + 1.5D) µin Machine
ASME B89.1.17
Setting Plug Gages
Thread Rings2
ULM 600 Measuring
Pitch Diameter Up to 8 in (240 + 0.3D) µin
Machine
Pitch Diameter Up to 8 in 38 µin
ID Bore Gages
Minor Diameter Up to 8 in 120 µin
ASME B1.2
NPT Plugs,
NPT Rings
(0.062 5 to 6) in 250 µin P&W LabMaster
Standoff and Basic Length
ASME B1.20.5
NPT Rings,
NPT Plugs
(0.062 5 to 6) in 490 µin P&W LabMaster
Standoff and Basic Length
ASME B1.20.5

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Page 20 of 27
Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Universal
Tapered Thread Gages2 (0.25 to 5) in (53 + 6.2D) µin Supermicrometer
ASME B1.20.5
Threaded Plugs2 P&W Supermicrometer,
Pitch Diameter (0.01 to 10) in (73 + 0.9D) µin Thread Measuring Wires
Major Diameter (0.01 to 10) in (40 + 1.2D) µin ASME B1.2
Threaded Plugs1,2
Pitch Diameter (0.01 to 4) in (73 + 3.2D) µin Plug gage Comparator
Major Diameter (0.01 to 4) in (53 + 4.1D) µin
Calipers1,2 Up to 80 in (380 + 15L) µin Gage Blocks

Indicators1,2 Up to 4 in (36 + 10L) µin Indicator Checker

Test Indicators1 Up to 0.06 in 39 µin Indicator Checker

OD Micrometers1,2 Up to 60 in (72 + 12L) µin Gage Blocks

ID Micrometer1,2 (1.5 to 40) in (370 + 7L) µin Gage Blocks

Height Gages1,2 Up to 40 in (96 + 14L) µin Gage Blocks

Bore Gages1 (0.25 to 12) in 350 µin Cylindrical Rings

1
Crimpers
Die Check (0.011 to 0.5) in 230 µin Pin Gages
Crimp Height (0.01 to 0.5) in 0.001 2 in Micrometer
Profilometers1 Roughness Specimen
(2 to 300) µin Ra 2.2 µin
Surface Plates1,2
Repeat Reading (4 to 34) inD (30 + 0.2D) µin Repeat – O – Meter
Overall Flatness (34 to 175) inD (66 + 0.2D) µin Electronic Levels
CMM Calibration1,2 Ball Bars
Volumetric (5 to 40) in (12 + 14L) µin Step Gage
Linearity (1 to 60) in (7 + 14L) µin Renishaw Laser System
Linearity Above 60 in (20 + 0.4L) µin B89.4.1
Linear Measurements1,2 Up to 1 560 in (38 + 0.5L) µin Laser
Optical Comparators1,2 Up to 12 in Glass Scale
Linearity 10x, 20x, 31.25x, 50x, (97 + 12L) µin Precision Balls
Magnification 62.5x, 100x, 200x 0.000 46 in Calibration Sphere

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Page 21 of 27
Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Roundness Testers1
Axial Error (-1 000 to 1 000) µm 0.15 µm Test Sphere
Radial Error 0.15 µm
ULMs1
(1 to 100) mm 0.19 µm Gage Blocks
Length
Film Thickness Gages1 (0.01 to 0.06) in 380 µin Film Thickness Standards

Brinell Scopes1 (1 to 6) mm 11 µm Stage Micrometer

Mass and Mass Related

Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
NIST 105 Class F Weights
Bench and Floor Scales1 (0.001 to 5 000) lb 0.000 7 lb/lb
NIST Handbook 44
ASTM E617 Class 1
Analytical Balances1 (0.001 mg to 13 kg) 0.19 µg/g Weights
NIST Handbook 44
(-13 to 300) psi 0.1 psi
Pressure1 Pressure Calibrator
(300 to 1 000) psi 1.3 psi
Pressure1 (1 000 to 10 000) psi 3.9 psi Pressure Transducers
Environmental
(0 to 100) inH 2 O 0.017 inH 2 O Pressure Module
Pressure Gage1
Durometers1 Direct Verification per
ASTM D2240
Up to 100 duro 0.35 duro Durometer Calibrator

Spring Force (0.1 to 45) N 0.05 N Triple Beam Balance,

Indenter Angle (20 to 40) ° 0.07 ° Video Measuring Machine
Indenter Radius (0.05 to 0.1) in 340 µin

Indenter Length (0.049 to 0.198) in 330 µin Gage Blocks

Brinell Hardness Testers1 (500, 750, 1 500,
Verification of Test Force 2 000, 3 000) kgf 7.2 Kgf Direct Verification per
ASTM E10 using
Verification of Indenter Mean 10 mm 0.002 mm Morehouse Proving Ring
Diameter 5 mm 0.002 mm

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Page 22 of 27
Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Indirect Verification per
ASTM E10 using Brinell
Brinell Hardness Testers1 (1 to 7) mm 0.03 mm
Test Blocks & Brinell
Scope
Indirect Verification per
Knoop and Vickers Hardness (1 to 200) µm 0.25 µm
ASTM E384 using Knoop
Testers1 (1 to 200) µm 0.17 µm
& Vickers Test Blocks
Indirect Verification per
Leeb Hardness Tester1 550 LD, 836 LD 20 LD ASTM A596 using Leeb
Test Block
HRA Low 1.2 HRA
HRA Med 1.2 HRA
HRA High 0.75 HRA

HRBW Low 1.4 HRBW

HRBW Med 1.4 HRBW
HRBW High 1.3 HRBW

HRC Low 1.2 HRC

HRC Med 1.2 HRC
HRC High 0.7 HRC Indirect Verification per
Rockwell Hardness Testers1 ASTM E18 using Rockwell
HRE Low 1.3 HRE Test Blocks
HRE Med 1.4 HRE
HRE High 1.4 HRE

HRF Low 1.4 HRF

HRF Med 1.4 HRF
HRF High 1.4 HRF

HRH Low 1.4 HRH

HRH Med 1.4 HRH
HRH High 1.4 HRH

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Page 23 of 27
Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
HRKW Low 1.4 HRKW
HRKW Med 1.3 HRKW
HRKW High 1.3 HRKW

HRMW Low 1.4 HRMW

HRMW Med 1. 4 HRMW
HRMW High 1.3 HRMW

HR15N Low 1.5 HR15N

HR15N Med 1.3 HR15N
HR15N High 0.9 HR15N

HR30N Low 1.3 HR30N

HR30N Med 1.3 HR30N
HR30N High 0.9 HR30N Indirect Verification per
Rockwell Hardness Testers1 ASTM E18 using Rockwell
HR45N Low 1.4 HR45N Test Blocks
HR45N Med 1.3 HR45N
HR45N High 0.95 HR45N

HR15TW Low 2 HR15TW

HR15TW Med 1.4 HR15TW
HR15TW High 1.5 HR15TW

HR30TW Low 2 HR30TW

HR30TW Med 1.5 HR30TW
HR30T High 1.3 HR30TW

HR45TW Low 2 HR45TW

HR45TW Med 1.3 HR45TW
HR45TW High 1.4 HR45TW
(0.001 to 200) lb 0.05 % of reading Dead Weight
1 (200 to 10 000) lb 0.07 % of reading Load Cell
Force
(10 000 to 50 000) lb 0.1 % of reading Load Cell
Torque Tools1 4 lbf⋅in to 2 500 lbf⋅ft 0.3 % of reading AKO Torque System
Viscosity 500 cP Viscosity Solutions,
0.02 cP/cP
Rotational Viscometers 5 000 cP Temperature Bath

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Viscosity Solutions,
17.82 cP
Temperature Bath,
Viscosity Cups 65.28 cP 0.03 cP/cP
Stopwatch
231 cP
ASTM D4212

Photometry and Radiometry

Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Optical Power
Agilent 81533B Interface,
- Measure1
81525A Optical Head
(800 to 1 650) nm (-70 to +20) dBm 0.03 dB/dBm
Agilent 81554SM Laser
Source Module, 81533B
Optical Power Interface, 81525A Optical
- Source1 Head, 81655A Laser
(-60 to 0) dB 0.05 dB/dB
(820, 1 310, 1 550) nm Module, 81570A Optical
Attenuator, and 81578A
Optical Attenuator
Optical Attenuation Agilent 81570A and
- Source1 81578A Optical
(700 to 1 650) nm (-60 to 0) dB 0.04 dB/dB Attenuators
Optical Wavelength Agilent 86120B Multi-
(700 to 1 650) nm 0.05 nm
- Measure1 Wavelength Meter

Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Fluke 9190A Drywell
Immersion Probes1 (-95 to 140) °C 0.03 °C
with PRT
Hart Scientific 1502
Temperature - Measure1 (-30 to 600) °C 0.03 °C Indicator
with PRT
System Accuracy Test1 (SAT) (0 to 2 200) °F 2.6 °F Certified Thermocouple

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Temperature Uniformity MV 1000 Data Logger or
(0 to 2 200) °F 4.9 °F
Survey1 (TUS) Equivalent

Time and Frequency

Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Agilent 53132A Counter &
1
Time Interval (1 to 86 400) s 0.000 45 s Spectracom 8197B GPS
Oscillator
Agilent 53132A Counter &
Frequency Measure1 0.1 Hz to 225 MHz 6.7 parts in 10-11 Hz Spectracom 8197B GPS
Oscillator
Agilent N5531S Measuring
6.7 parts in 10-11 Hz
Frequency Measure1 0.1 Hz to 26.5 GHz Receiver, SRS FS725
Frequency Standard
SRS FS725 Frequency
Frequency Source1 10 MHz 6.7 parts in 10-11 Hz
Standard
Agilent 3325B Function
Generator, Agilent E8257D
Frequency Source1 0.1 mHz to 40 GHz 6.7 parts in 10-11 Hz
Signal Generator, SRS
FS725 Frequency Standard
Tachometers1
King Nutronics 3711-B
Contact (1 to 6 500) rpm 0.08 % of reading
Tachometer Test Set
Non-Contact (500 to 40 000) rpm
Tachometers1 Fluke 5520A Multiproduct
(0.01 to 100 000) rpm 0.005 % of reading
Non-Contact Calibrator

DIMENSIONAL MEASUREMENT
2 Dimensional
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
Dimensional Inspection,
Non - Contact Up to (12 x 8) in (210 + 5.2L) µin Vision System
Linear

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2 Dimensional
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
Surface Finish, (Ra) (0.01 to 300) µin 2.1 µin Profilometer

3 Dimensional
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
Dimensional Inspection,
Contact Coordinate Measuring
Volumetric Up to (12 x 8 x 8) in 320 µin Machine (CMM)
Linear Up to (12 x 8 x 8) in (38 + 5.2L) µin
Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and
reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a
coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.
Notes:
1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement
uncertainties are expected on-site than what is reported on the accredited scope.
2. D = diameter in inches, L = length in inches.
3. This scope is formatted as part of a single document including Certificate of Accreditation No. ACT-1272.03.

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