Aop 1 1 107 PDF
Aop 1 1 107 PDF
Received August 21, 2008; revised November 17, 2008; accepted November 17, 2008;
posted November 18, 2008 (Doc. ID 100357); published January 30, 2009
1. Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
2. Manufacture of OFNs and OFMs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
3. Properties of OFNs and OFMs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
3.1. Loss. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
3.2. Spot Size and Mode Confinement. . . . . . . . . . . . . . . . . . . . . . . . . . 111
3.3. Mechanical Strength. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
3.3a. The Big Issue. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
3.3b. Embedding. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
4. Applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
4.1. High-Q Resonators. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
4.1a. Single-Loop Resonators. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
4.1b. Coil Resonators. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
4.2. Particle Manipulation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128
4.3. Sensors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
4.3a. Resonating Sensors: Schematic and Manufacture. . . . . . . . . 132
4.3b. Resonating Sensors: Theory. . . . . . . . . . . . . . . . . . . . . . . . . . 134
4.3c. Resonating Sensors: Sensitivity. . . . . . . . . . . . . . . . . . . . . . . 136
4.3d. Resonating Sensors: Detection Limit. . . . . . . . . . . . . . . . . . . 139
4.3e. Resonating Sensors: Experimental Demonstration. . . . . . . . . 140
4.4. Supercontinuum Generation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 142
4.5. Particle Trapping. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 144
4.6. Mode Filtering. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 147
4.6a. Mode Filtering: Theory. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150
5. Conclusions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
Acknowledgments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
References. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
1. Introduction
In the past decade nanowires have attracted much attention because of the
unique properties that materials display on the nanoscale [1]. A vast variety of
materials have been studied, including carbon nanotubes [2], single-element
nanowires (Si, Ge, Cu, Au, and Ag [3–7]), multicomponent structures (GaAs,
GaN, InP, CdS, SiC, Si3N4, SiO2, Al2O3, ZnO, SnO2, In2O3 [8–18]), and
even organic materials [19,20]. Nanowires have been manufactured by using a
wide range of techniques: electron beam lithography [21], laser ablation
[22], template-based methods [23], bottom-up methods such as vapor–liquid–
solid techniques [24], chemical and physical vapor deposition [8,25], solgel
methods [26], and top-down techniques such as fiber pulling [27–31] or direct
draw from bulk materials [20,32].
Prior to 2003 only two attempts to manufacture submicrometer wires by using
a top-down process were reported in the literature [33,34]. Interest in optical
fiber nanowires (OFNs) has been limited mainly because of the perceived
difficulties in manufacturing suitably low-loss structures. Although several
OFNs were fabricated by using a variety of bottom-up methods [35–42], all of
them exhibited an irregular profile and a surface roughness that appear to
have limited the loss levels that could be reliably achieved [43,44]. In 2003 a
two-step process to fabricate low-loss submicrometric silica wires was presented
[27]; it involved wrapping and drawing a pretapered section of standard
fiber around a heated sapphire tip. Although the measured loss was orders of
magnitude higher than that achieved later with flame-brushing techniques
[28–31], it was low enough to allow the use of OFNs for optical devices and
ignite interest in the technology. In the following years a spate of publications
investigated novel properties and applications of OFNs. It has become
commonly accepted to define optical fiber nanowires (or photonic nanowires)
as fiber waveguides with a submicrometric diameter. In this paper wires
with diameter bigger than 1 µm will be referred to as optical fiber microwires
(OFMs)
OFNs and OFMs are of interest for a range of emerging fiber optic applications,
since they offer a number of enabling optical and mechanical properties,
including the following:
1. Strong confinement. Light can be confined to a very small area over long
device lengths, allowing the ready observation of nonlinear interactions, such as
In the next sections the properties of OFNs and OFMs will be introduced and
the fabrication methodologies discussed. Applications ranging from mode
filters to high-Q resonators and to sensors will be presented.
OFN and OFM tapers are made by adiabatically stretching a heated fiber,
forming a structure comprising a narrow stretched filament (the taper waist),
each end of which is linked to an unstretched fiber by a conical section (the taper
transition region), as shown in Fig. 1.
In the past few years, three different methodologies have been used to fabricate
OFNs and OFMs from optical fibers:
1. Tapering the fiber by pulling it around a sapphire rod heated by a flame,
2. The flame-brushing technique,
3. The modified flame-brushing technique.
The flame-brushing technique has been previously used for the manufacture of
fiber tapers and couplers [68]. A small flame moves under an optical fiber
that is being stretched: because of mass conservation, the heated area
experiences a diameter decrease. Controlling the flame movement and the fiber
Figure 1
3.1. Loss
For diameters of the minimum waist region comparable with the wavelength
of the radiation propagating in the OFNs, light is strongly guided. When
, the mode is strongly affected by diameter fluctuations. It has been shown
[70] that for very small the propagation loss ␣ is related to the propagation
constant k, the absolute value of the transversal component of the
propagation constant ␥ and the characteristic length of diameter fluctuations Lf
by
␣=
1
4␥
冑 冉
k
LF
exp −
L f␥ 2
k
冊 . 共1兲
2
V= NA, 共2兲
2
where NA denotes the numerical aperture. Equation (2) provides the cladding
共Vcl兲 or core 共Vco兲 V numbers, when the cladding or the core co diameters
are used, respectively. The relationship between the spot size and Vcl during
10 Method 1
Method 2
Method 3
1
Loss α (dB/mm)
0.1
0.01
0.001
Summary of optical loss ␣ achieved in OFNs and OFMs for the three
manufacturing techniques presented in Section 2: 1, the two stage process
involving a sapphire rod heated by a flame [27]; 2, the flame-brushing technique
[28–31]; 3, the modified flame-brushing technique [this work, 30, 71].
tapering for a standard single-mode fiber (SMF) is shown in Fig. 3. Vcl has
been calculated from Eq. (2) for a mode confined by the silica–air interface
(NA⬃ 1 if the silica and air refractive indices are taken to be 1.444 and 1,
respectively).
A conventional optical fiber falls at the right in this figure. The label SMF in
Fig. 3 represents the value of Vco for a telecom optical fiber at 1.55 µm. When the
optical fiber diameter decreases, V decreases and initially decreases until
a minimum point (B) is reached. After that, the mode is no longer guided in the
core, and suddenly increases to a maximum associated with cladding
guiding. For even smaller diameters decreases with decreasing V until it
reaches a minimum (A) for Vcl ⬃ 2, and then it increases again. This region at
Vcl ⬍ 2 is typical of OFNs: the mode is only weakly guided by the
waveguide, can be orders of magnitude bigger than the physical diameter of
the OFN, and a larger fraction of the power resides in the evanescent field.
Figure 4 shows the evanescent field at the surface of an OFN with various waist
diameters simulated by using the beam propagation method. Simulations were
carried out by using a full 3D vectorial method, and the electric field E was
normalized to unit power. The propagating mode of untapered optical fiber is
completely confined within the physical boundary of the fiber, and when
the fiber is tapered below a certain diameter a considerable fraction of the power
propagates in the surrounding medium. The electric field at the interface
shows a maximum around the waist diameter of about 0.7 µm, below which
it sharply decreases. This can be explained by the increased , which
effectively decreases the power density in the OFN. The decrease at larger is
ascribed to the increasing mode confinement into the core.
It is interesting to note that the minimum beam waist depends on the
cladding material, and the minimum beam size is ultimately limited by
ω (µm)
10
A
1
1 OFN 10 100
Vcl
Relationship between the spot size (defined as the radius where the intensity
has dropped to 1 / e2 [71]), the cladding 共Vcl兲 and core 共Vco兲 V numbers of a
tapered telecom fiber. Labeled points are the points of maximum confinement,
A, in the cladding and, B, in the core and, C, the beginning of cladding
guiding. Vcl and Vco are related to the cladding and core co diameters by Eq.
(2). SMF and OFN represent the V numbers of a common telecom optical
fiber and an optical fiber nanowire with r = 500 nm in air at 1.55 µm.
Figure 4
0.8
Normalised E-field at surface
(a)
0.6
0.4
0.2
0.0
0.0 0.5 1.0 1.5 2.0
φ (μm)
SMOW diameter (μm)
Relationship between the electric field at the OFN surface and the OFN
diameter . The wavelength and the refractive indices of the silica OFN were
taken to be 1.047 µm and 1.45, respectively. Water was taken as the
surrounding medium with a refractive index of 1.33.
2 n2
␥= . 共3兲
共2/4兲
A standard telecom SMF has ␥ ⬃ 1 W−1 km−1, while typical silica OFMs can
have ␥ as high as 100 W−1 km−1. OFNs made from highly nonlinear
materials such as lead silicate, bismuth silicate, and chalcogenide glasses can
be used to produce OFNs with maximum values of ␥ of the order of 1000,
6000, and 80,000 W−1 km−1 respectively. OFMs with diameters in this region
can be used for a wide range of nonlinear applications, including
supercontinuum generation, particle trapping at the nanowire end facet, and
nonlinear switching (see Subsections 4.4 and 4.5).
Figure 5
10
II I
ω (µm)
Silica
F2 (Lead-silicate)
BS (Bismuth-silicate)
0.1
0.1 1
φ (µm)
Relationship between the spot size and the OFM–OFN diameter for three
different fiber materials: silica (refractive index at = 1.55, nSiO2 = 1.444), a
lead silicate glass 共nF2 = 1.597兲, and a bismuth silicate glass 共nBS = 2.02兲. For
increasing refractive indexes, the minimum becomes smaller and occurs
at smaller diameters .
By contrast, in the evanescent field region OFMs and OFNs have diameters
smaller than the waist of the propagating modes. can be orders of magnitude
bigger than , and a considerable fraction of the power propagates in the
evanescent field outside the fiber physical boundary. OFMs and OFNs with
diameters in this region can be used for high-Q resonators (knot, loop, and coil),
particle manipulation, and sensing (Subsections 4.1–4.3).
m m
fract = = , 共4兲
A 共2/4兲
Figure 6
18
16
Ultimate strength σf (GPa)
14
12
10
8
6
4
2
0
0 50 100 150 200 250 300
Radius r (nm)
3.3b. Embedding
The acrylic coating used to protect optical fibers has a higher refractive index
than silica because it has the additional purpose of stripping the modes
propagating in the cladding. In OFNs the propagating mode has a significant
intensity at the interface between silica and air, and the only approach to avoid
confinement losses is to use low-refractive-index materials, such as silicone
rubber [77], Efiron halogenated polymers, [78,79] and Teflon [66,80], which
4. Applications
Applications of OFMs and OFNs can be classified into three main groups
according to what property they exploit:
Evanescent field
Confinement
Transition regions
Evanescent field applications take advantage of the power propagating outside
the physical boundary of the wire and include high-Q knot, loop, and coil
resonators (Subsection 4.1), particle manipulation (Subsection 4.2), and sensors
(Subsection 4.3).
Applications exploiting the confinement properties of OFMs correspond
approximately to region I in Fig. 5 and include supercontinuum generation
(Subsection 4.4), particle trapping (Subsection 4.5), and nonlinear switching or
bistability [83,84].
Finally, transition regions have been exploited to convert and filter modes.
Applications will be presented in Subsection 4.6.
Schematic of a spectrum with the related notation for FWHM, free spectral
range (FSR), and resonant wavelength 共res兲.
res
Q= , 共6兲
FWHM
where res is the resonance wavelength and FWHM its full width at
half-maximum. The typical Q of OFN single-loop resonators is in the range
103 – 106 [60,66,78,79].
The FSR is the inverse of the round-trip time (round-trip group delay) of an
optical pulse. In the loop resonator spectrum, the FSR is the wavelength or
frequency period of the peaks as shown in Fig. 7. It can be expressed as
[86]
c
FSR共Hz兲 = 共7兲
2neffL
(where c is the light’s speed, neff the effective index of the mode propagating in
the OFM, and L the loop length). FSR can also be expressed as the difference
⌬ of two adjacent resonator wavelengths near res:
2
FSR ⬇ ⌬ ⬇ . 共8兲
4neffL
Finally, f can be evaluated from the ratio between FSR and FWHM [86]:
FSR
f= . 共9兲
FWHM
brittle and ultimately does not protect OFMs and OFNs from degradation in
the same way as the polymers considered in Subsection 3.3b.
The loop resonator transmission coefficient can also be obtained analytically
[60] by considering the output to be the sum of two interfering contributions: the
Figure 10
after 1 hour
-54 after 2 hours
after 12 hours
-55
-56
Transmission (dBm)
-57
-58
-59
-60
-61
-62
where a1 and a2 represent the amplitudes of the two fractions of the beam, L
the coil length, and k the propagation constant.
Figure 11
Optical fiber nanowire microcoil resonator (OMR). Light can both propagate
along the OFN (red arrow) or be coupled into an adjacent coil (green arrow).
Cylindrical coordinates system used for the analytical description of the OMR.
The angle continuously increases along the coil.
冢冣
A1
A2
¯
d
Am
d
¯
AM−1
AM
冢 冣
0 R1共兲12共兲 0 ¯ 0 0 0
R2共兲21共兲 0 R2共兲23共兲 ¯ 0 0 0
0 R3共兲32共兲 0 ¯ 0 0 0
=i ¯ ¯ ¯ ¯ ¯ ¯ ¯
0 0 0 ¯ 0 RM−2共兲M−1M−2共兲 0
0 0 0 ¯ RM−1共兲M−2M−1共兲 0 RM−1共兲M−1M共兲
0 0 0 ¯ 0 RM共兲MM−1共兲 0
冢冣
A1
A2
⫻ Am , 共11兲
¯
AM−1
AM
where pq is the coupling between turns p and q of the resonator, defined as
0
p共兲Rp共兲d − i 冕 0
2
冊
q共兲Rq共兲d . 共12兲
p is the propagation constant in the pth turn, and pq is the coupling coefficient
between the pth and qth turns that is due to the overlap of the field modes
between neighboring turns [59].
Defining the average coil radius R0 as
兺m−1
M
兰20Rm共兲d
R0 = , 共13兲
2M
the average coupling parameter Kpq can be written as
T=
Am共2兲
A1共0兲
再冕
exp i
2
0
M共兲Rm共兲d , 冎 共15兲
and it is calculated from Eqs. (11)–(15), assuming field continuity between the
turns:
Am+1共0兲 = Am共2兲exp i 再冕 2
0
M共兲Rm共兲d 冎 共16兲
for m = 1 , 2 . . . M − 1.
The OMR spectrum is strongly dependent on its geometry; in particular, the
resonance FWHM and FSR depend on the OMR geometry and the OFN size
through K.
OMR Geometry and Coupling. The Q of the uniform OMR presented in
Subsection 4.1b is extremely sensitive to the coupling strength. In theory, the
highest Q can be achieved by selecting a K for which the FWHM is
minimized, but in practice this is difficult to realize because the FWHM
fluctuates considerably for small changes in K, and K has an exponential relation
to the pitch [48–50,54–56]. It is therefore desirable to find a geometry for
R
H V X III T
III
V 共conical兲, R m共 兲 = R 0 −
M
2
冉
dR + m − 1 +
2
冊 dR, Kpp+1共兲 = Kc.
共18兲
X 共biconical兲, R m共 兲 = R 0 + 冏 M+1
2
−m+
−
2
冏 dR −
M
4
dR,
p − 1 + 共/2兲
I 共incrementing兲, R m共 兲 = R 0, Kpp+1共兲 = Kc . 共20兲
M−1
共21兲
where m = 1 , 2 , . . . , M; p = 1 , 2 . . . M − 1; dR / R0 1; dR = 兩Rm+1共兲 − Rm共兲兩 for
any two adjacent turns; Kmn is the coupling coefficient between turns n and m;
and Kc is the maximum coupling parameter.
These geometries can be realized by wrapping an OFN around a low-refractive
index rod, which is angled for the V and X geometries. Simulations showed
that the optimum fabrication tolerances are achieved with symmetric
geometries, where the coil diameter increases from the center toward the
extremities (X) or where the coupling is maximum at the center of the coil and
decreases toward the extremities (T). For best performance, OMRs with
larger numbers of turns are preferred, which imposes additional fabrication
difficulties. Still, simulations on the T geometry showed that high-Q resonators
can be obtained for nearly every value of the maximum coupling coefficient,
even for resonators with only three or four turns [65]. However, the fabrication of
OMRs with well-defined varying pitch is likely to be a very challenging
task.
Figure 14
OMR Internal Field Distribution. The field distribution inside an OMR has
been found to depend strongly on the OMR geometry. Simulations were
performed assuming an OFM with r = 1 µm, n = 1.457, the effective index neff
= 1.182 at 1.55 µm, coil radius R0 = 62.5 µm, dR = 0.05 µm, and K in the
range 0–20. The field amplitudes A1共兲, A2共兲, and A3共兲 were calculated for
M for profiles H, V, and X in Fig. 13, choosing the wavelength and K that
maximize the field amplitude. Figure 15 shows the dependence of the internal
field distributions on the angle in three coils.
The internal field amplitude in the H and X profiles is much larger than that in
the V profile, meaning that more energy can be stored in OMRs with the H
and X geometries.
OMR Manufacture. OMRs have been demonstrated in a liquid [79], in air [87],
and in Teflon [66]. In all cases an OFM and a support rod were used. In fact,
because of the high value of the support rod refractive index or of the liquid or
Teflon refractive index, the V value experienced by the mode propagating in
the wire is low, and the fraction of power in the evanescent field is large even for
relatively large diameters.
To test the resonator properties in real time during fabrication, the OFM had
its pigtails connected to an erbium-doped fiber amplifier (EDFA) and an optical
spectrum analyzer (OSA). Although early experiments were carried out by
coiling the OFM on a low-refractive-index rod by hand with the aid of a
microscope [Fig. 16(a)], the demands of continuous uniform coupling over the
entire coil length necessitated the use of automated setups including a rotation
stage (which controls the actual coiling) and a translation stage (which
controls the coil pitch). It is clear from Fig. 16 that the coil uniformity is
considerably better in the latter case. In the last stage of fabrication, the OFM
Amplitude
Amplitude
3
Amplitude
2.5
2
5
1.5
HI 1
0.5
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
θ/(2π)-(M-1) θ/(2π)-(M-1)
16
c
14
A1
12 A2
A3
10
Amplitude
Amplitude
4
XIII
2
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Angle(x2Pi)
θ/(2π)-(M-1)
Internal field amplitude in three-turn OMRs for profiles H, V, and X (Fig. 13).
pigtails were fixed to 3D stages and were tuned to find the optimum resonator
spectrum.
If the coil was to be embedded, the fine tuning of the OFM pigtails was
performed on uncured polymer, and the curing was carried out by checking the
resonator properties in real time as the pigtails were adjusted. The polymer
was then cured when the suitable adjustment had been completed. OMRs were
wrapped on a low-refractive-index support rod to maximize the OMR
temporal stability and robustness. Losses can be significant because of
microbends and confinement losses. However, the loss can be minimized by
increasing the microfiber thickness and the rod diameter, by using a
low-refractive-index material for the rod, and by improving the smoothness of
the rod surface. It was found [87] that using a rod coated with Teflon AF
(DuPont, United States) or UV373 (Luvantix, Korea) provided good
confinement because of the polymer’s low refractive index at the interface with
the microfiber (n ⬃ 1.3 and n ⬃ 1.37 at ⬃1.55 µm, respectively). Support
rods as small as 250 µm have been used without any significant observed loss.
Most recent results seem to show that the particulate nature of the Teflon
used in these experiments might induce higher losses than those observed for
UV-curable fluoropolymers. Micrometer-size Teflon particles can in fact
increase the Mie scattering and the overall OFM transmission loss [80].
OMRs manufactured (a) by hand and (b) by an automated stage. The number
of turns is three in (a) and two in (b).
Figure 17
CCD
Microscope
PC
10x
Water
Polystyrene spheres
Laser
MgF2 Substrate
surface of the OFN has been evaluated, and Fig. 4 shows how there is a
maximum at = 0.7 mm. For a laser output of 500 mW, the average velocity of
3 µm particles was ⬃9 µm / s along the OFN, compared with the ⬃2.6 µm / s
observed along glass waveguides [95]. The larger velocity observed in Fig. 18
with respect to the glass planar waveguide can be explained in terms of a
better source or waveguide coupling and/or a larger evanescent field and higher
field intensity at the interface between the optical guide and the water–
particle suspension.
Figure 20 presents a comparison of the evanescent fields near the surface for
three waveguides used in propulsion experiments: an OFN, a Si3N4 ridge
waveguide [96], and a glass waveguide [95]. Simulations were carried out by
using the beam propagation method as before. The waveguide width and
depth were taken to be 3 and 1 µm for the glass waveguide [95] and 1 and 0.2 µm
for the Si3N4 waveguide [96]. The refractive indices of the glass substrate,
glass waveguide, Si3N4 waveguide, and its substrate were taken to be 1.55, 1.58,
1.97, and 1.45 respectively. From Fig. 20 it is clear that the E field at the
interface of the OFN is several times larger than that experienced in the glass
planar waveguide, but about half of that calculated for the Si3N4 ridge
waveguide. This can be easily explained by the mode confinement geometry:
while in planar waveguides the mode can leak into the substrate (which
Figure 19
(b) Si3NSi
1 4 waveguide
N Waveguide
3 4
OFNSMOW
Ion-exchanged glass
Ion-exchanged waveguide
Glass Waveguide
E-field
Normalised E-field
0.1
Normalised
0.01
E field distribution in an OFN and planar waveguides in the space adjacent the
surface. The E field was normalized per unit power traveling in the
waveguide.
can host a large fraction of the power), in the OFN the mode can only extend
into the solution because of its cylindrical symmetry. Moreover, mode
confinement is related to the numerical aperture of the optical waveguide:
since the Si3N4 waveguide has an extremely high refractive index 共nSi3N4
⬃ 1.97兲, the numerical aperture that the waveguide has with respect to water
共nH2O ⬃ 1.33兲 and to the substrate 共nSub ⬃ 1.45兲 is considerably larger than that
experienced by the modes propagating in the glass waveguide and OFN.
However, the evanescent field in the planar waveguides decreases more sharply
than in the OFN; in fact, although the Si3N4 waveguide has a stronger field
up to 250 nm from the interface, at distances longer than 250 nm the OFN E field
is consistently larger and even extends beyond 2 µm above the surface. In
addition, the OFN exhibits the great advantage of manipulating particles in 3D.
4.3. Sensors
The great majority of optical biochemical sensors can be classified according
to two sensing approaches: homogeneous sensing and surface sensing
[97]. In homogeneous sensing, the device is typically surrounded by an analyte
solution, and the homogeneously distributed analyte in the solution modifies
the bulk refractive index of the solution. In surface sensing, the optical device is
pretreated to have receptors or binding sites on the sensor surfaces, which
can selectively bind the specific analyte [97].
Surface sensors based on OFNs have been predicted [67] and experimentally
realized for the detection of hydrogen [53] by coating an OFM with
palladium. Because of the reduced sensor dimensions, the ultrathin palladium
film allowed sensor response times of approximately 10 s, up to 15 times
faster than that of most optical and electrical hydrogen sensors reported so far.
The detection range was 0.05%–5%, enough to detect hydrogen at the
lower explosion limit for gas mixtures. The sensor worked by checking the
absorption changes with a simple transmission measurement setup that
Schematics of (a) a coated microfiber coil resonator sensor (CMCRS) and (b)
an embedded optical nanowire loop resonator refractometric sensor
(ENLRS). Figures are not to scale.
green. The CMCRS is a compact and robust device with an intrinsic fluidic
channel to deliver samples to the sensor. In Fig. 21(b) a very thin polymer layer
covers the OFM loop of the ENLRS, while a thick coating deposit is used to
fix the two fiber pigtails. In the ENLRS two sides are exposed to the liquid to be
sensed. In both cases the embedded OFM has a considerable fraction of its
mode propagating in the fluidic channel; thus any change in the analyte
properties is reflected in a change of the mode properties at the sensor output.
When OFNs are used instead of OFMs, an even greater fraction of the
mode propagates in the evanescent field, thus increasing the overall sensitivity.
Since OFMs–OFNs are fabricated from a single tapered optical fiber, light
can be coupled into the sensor with essentially no insertion loss, which is a huge
advantage over other types of resonator sensors.
The CMCRS can be fabricated from a microcoil resonator (Subsection 4.1b)
by using an expendable rod, which is then removed. A candidate for the rod
material is PMMA (polymethyl methacrylate), which is a polymer with an
amorphous structure and which is soluble in acetone. In a similar way the
ENLRS can be made by using two substrates fabricated with disposable
materials such as PMMA coated with a thin layer of a low-loss,
low-refractive-index polymer such as Teflon. Once the OFM loop resonator
(Subsection 4.1b) is manufactured on one of the substrates, the other substrate
is placed on top of the nanowire resonator and glued with the same low
refractive-index polymer, and the expendable materials are removed, leaving a
thin layer of low-refractive-index material on the nanowire. The use of a
where  is the real part of the propagation constant, ␣ the loss coefficient, and
K = L the coupling parameter for coupling coefficient and coil length L.
Resonances occur if K and  satisfy
Figure 22
neffL 2
冏
− arcsin 冋 e2aL + e−2aL
2共e2aL + e−2aL兲 − 2
册冏
⬇
res
2
neffL
冑 共e2aL + e−2aL兲 − 2
共e2aL + e−2aL兲 − 1
⬇
res
2
neff
␣
, 共25兲
The mode properties are particularly affected by the OFN radius r = / 2 and
the distance d between the OFN and the analyte (coating thickness). The sensor
response has been determined by calculating neff (using the
finite-element-method software COMSOL3.3 with perfectly matched layers)
and the related shift of res as a function of the analyte concentration. neff has
been evaluated for a nanowire embedded in Teflon and coiled around a
microfluidic channel. The fundamental mode, which has the largest propagation
constant, is the only mode that is well bounded in the vicinity of the fiber
core [109,110]; thus it is the only mode considered here. Since neff is a function
of r and d, res also varies with r and d through Eq. (24). Figure 23 shows
the intensity distribution of the fundamental mode for two different analyte
refractive indices [Fig. 23(a)] na = 1 and [Fig. 23(b)] na = 1.37 when nOFN
= 1.451, nTeflon = 1.311, d = 100 nm, r = 500 nm, = 1550 nm. When na is small
[Fig. 23(a)] the field is still bound within the OFN physical boundary,
while it shifts into the coating and leaks into the analyte when na is large [Fig.
23(b)].
Figure 24 shows the dependence of neff on the analyte refractive index na. The
OFN radius has been assumed constant at r = 500 nm, while three values 10,
100, and 500 nm have been considered for d. Generally, neff increases with na and
increases more quickly with smaller d, since in this case a larger fraction of
the mode is propagating in the analyte, as shown in Fig. 23. If na = nTeflon, light
cannot see the boundary between Teflon and the analyte solution; thus neff
is the same at any d, and in Figs. 24(a)–24(d) there is a crossing point for
different diameters. It is interesting that this behavior is independent of
Figure 23
1.415
1.4145
neff
eff
1.41
n
1.414
1.405 bare OFN
d=10nm, 2 surfaces
d=100nm 2 surfaces
d=10nm, 1 surface
d=100nm, 1 surface
1.4135 1.4
1 1.1 1.2 1.3 1.4 1 1.1 1.2 1.3
na
na
1.375
(b) d=10nm
d=100nm
(d)
d=500nm
1.36
1.37
n eff
eff
n
1.34
1.365
Bare OFN
d=10nm, 2 surfaces
1.32 d=100nm, 2 surfaces
d=10nm, 1 surface
d=100nm, 1 surface
1.36
1 1.05 1.1 1.15 1.2 1.25 1.3 1.35 1 1.1 1.2 1.3
n
a
na
Dependence of the effective index of a coated OFN neff on the index of the
analyte na for nTeflon = 1.311, nOFN = 1.451, r = 500 nm, for several distances
between OFN and analyte in a (a), (b) CMCRS and (c), (d) an ENLRS. The
wavelength of the propagating mode is = 600 nm in (a) and (c) and
= 970 nm in (b) and (d). A bare OFN is reported in (c) and (d) for reference.
the sensor geometry, to the degree that the overlap between analyte and mode
propagating in the OFN is the same: the CMCRS has the same overlap
with the analyte as the ENLRS with one surface interface [Fig. 22(b)]; thus
they have the same dependence of neff on na. The ENLRS with two interface
surfaces [Fig. 22(c)] has an overlap that is twice as large, and thus the
dependence of neff on na is twice as strong.
Figure 25
4
4
10 10
d=10nm (c)
(a) d=100nm
2 d=500nm d=10nm , 2 surfaces
10 2 d=100nm, 2 surfaces
10
d=500nm , 2 surfaces
d=10nm, 1 surface
0
S (nm/RIU)
10 d=100nm, 1 surface
S (nm/RIU)
0 d=500nm, 1 surface
10
-2
10
-2
-4 10
10
-6
10 -4
200 600 1000 1400 1800 10
200 400 600 800 1000 1200 1400 1600 1800 2000
r (nm) r (nm)
3 4
10 10
(b) d=10nm (d)
d=100nm
3
2 d=500nm 10 d=10nm, 2 surfaces
10 d=100nm, 2 surfaces
d=500nm, 2 surfaces
2
S (nm/RIU)
10 d=10nm, 1 surface
1 d=100nm, 1 surface
10
S (nm/RIU)
d=500nm, 1 surface
1
10
0
10
0
10
-1
10 -1
10
-2
10
400 800 1200 1600 2000 200 400 600 800 1000 1200 1400 1600 1800 2000
r (nm) r (nm)
Dependence of the sensitivity S on the OFN radius r for nTeflon = 1.311, nOFN
= 1.451, and several coating thicknesses d in (a), (b) a CMCRS and (c), (d) an
ENLRS. The wavelength of the propagating mode is = 600 nm in (a) and
(c) and = 970 nm in (b) and (d). Schematics of the ENLRS with one or two
surfaces are shown in Figs. 22(b) and 22(c).
Figure 26
2
10
(a) d=10 nm
d=100 nm
1
10 d=500 nm
0
10
S (nm/RIU)
-1
10
-2
10
-3
10
-4
10
400 800 1200 1600 2000
r (nm)
2
10
(b)
d=10nm
d=100nm
1 d=500nm
10
S (nm/RIU)
0
10
-1
10
-2
10
400 800 1200 1600 2000
r (nm)
Dependence of the sensitivity S on the OFN radius r for nUV375 = 1.375, nOFN
= 1.451, and several coating thicknesses d in a CMCRS for (a) = 600 nm and
(b) = 970 nm.
␦0
DL = . 共28兲
S
␦0 is generally limited by the instrument resolution and is empirically
assumed to be 1 / 20 of the resonance FWHM [104]. The FWHM depends on
the resonator coupling and loss. Losses in the CMCRS and the ENLRS arise
from surface scattering, material (analyte, coating, and fiber) absorption,
and bending. The smallest reported OFN loss is about ␣ = 0.001 dB/ mm with
radii in the range of hundreds of nanometers (Subsection 3.1). Water
absorption can be reduced to levels well below 0.0001 dB/ mm by operating at
short wavelengths (Subsection 4.3c). Low-loss embedding materials (such
as Teflon or UV375) can be used: losses of 1 dB/ m have been reported [116,117]
for water-core Teflon waveguides. Bend losses can be estimated from [70]
␣bend =
U2
2VclWK1共W兲 r
冉冊 冋 冉
exp −
4W
3Vcl
1−
2
nOFN
n2Teflon
冊册
r
, 共29兲
where is the bend curvature radius, r the OFN radius, and U, Vcl, and Wthe
normalized modal parameters defined by Eqs. (2), (29), and (30):
2r
U= 共nOFN
2
− n2eff兲1/2 , 共30兲
2r
W= 共n2eff − n2Teflon兲1/2 . 共31兲
For r = 200 nm and R = 250 µm, ␣bend ⬃ 0.0001 dB/ mm at = 600 nm, which
quickly decreases further with increasing coil size. Assuming ␣ = 0.01 dB/ mm,
the other losses can be neglected, and for a CMCRS or an ENLRS with r
= 200 nm at = 600 nm, Eq. (22) gives FWHM⬃ 410−4 nm and DL⬃ 10−6
− 10−7 RIU, which is comparable with the best reported experimental results
[55,118–121]. Although these values of FWHM can be easily measured
with a high-resolution OSA, cost and practical considerations limit the
resolution to few picometers, leading to a practical detection limit of the order
of several 10−6 RIU (see Table 1).
In traditional microresonators input–output coupling occurs via a prism,
antiresonant reflecting waveguides, or a fiber taper [102–106]. With probably
only the exception of fiber taper coupling, which has been proved to be
reasonably efficient [124], coupling to a microresonator has considerably
complicated device design and/or has resulted in a significant increase in the
S res FWHM DL
Type of Sensor (nm/RIU) (nm) (nm) (RIU) Ref.
a
res represents the resonating working wavelength.
b
ARROW, antiresonant reflective optical waveguide.
Figure 27
Microscope picture of a CMCRS. The yellow dashed lines and red arrows
show the fluidic channel and input–output pigtails, respectively.
Figure 28
Wavelength Shift(nm)
Simulations
d=500nm
0.45
0.40 d=0 nm
0.35
0.30
1.345 1.346 1.347 1.348 1.349
Analyte refractive index na
little space for the coating to fill. The small difference observed in Fig. 29 has
been attributed to the unevenness in the OFM diameter profile, to the
imprecision in the coil winding, to the channel roughness, and to the uneven
coating thickness (OFM distance from the microfluidic channel). S was obtained
from the line slope as ⬃40 nm/ RIU. This value is comparable with those
reported previously for microsphere, microring, and liquid-core resonators
[103,104,108], but smaller than recently reported values for a slot waveguide
(212.13 nm/ RIU) [126]. The relatively low value of S can be attributed to
the small overlap between the mode propagating in the OFM and the analyte.
In fact, S has been shown to increase by orders of magnitude for increasing
na [108]. Another factor that has probably contributed to the degraded S is the
surface roughness of the device in contact with the analyte, possibly caused
by the PMMA support rod. This roughness might also be responsible for the
moderately low Q factor 共Q ⬃ 104兲 observed.
D=
1 dng
c d
−
2
冋
2⌬ n2gVcl 2共Vclb兲
n dV2cl
+
dng 共Vclb兲
d dVcl
册 , 共32兲
where Vcl is defined by Eq. (2) and is dependent on the OFM radius r. Figure
30(b) shows the dependence of the (first) zero-dispersion wavelength on r.
To generate a supercontinuum, the OFM radius was chosen as r ⬃ 1.6 µm so that
its zero-dispersion wavelength coincided with the pump central wavelength
at 1.63 µm [Fig. 30(b)]. Femtosecond laser pulses at this wavelength from an
optical parametric amplifier (Coherent Opera pumped by Coherent Legend)
were injected into the OFM by using a 10⫻ microscope objective 共NA⬃ 0.2兲.
The pulse duration and repetition rate were ⬃120 fs and 1 kHz, respectively.
The output spectra were measured by using an OSA for the wavelength range
0.85– 1.75 µm and an extended InGaAs detector with a monochromator for
the range 1.55– 2.4 µm.
Figure 31 compares the spectra of laser pulses at the laser output and at the
OFM output for pumping at ⬃1.63 µm. With a laser output pulse energy of Ep
⬃ 5 nJ, a supercontinuum spectrum has been generated extending from 1 to
⬎2.3 µm, with a 3 dB spectral width of 700 nm. It is interesting to note that the
supercontinuum profile is remarkably flat with ⬍5 dB variation over the
spectral range 1.2– 2 µm. Moreover, the spectrum is more than 1000 nm broad
Comparison of output spectra from the laser source and the OFN for pulse
energies of 5 and 3 nJ. The spectra have been shifted vertically for clarity.
as a consequence of the optical field; thus they are shifted toward the focus by
intensity gradients in the electric field [140]. In contrast, large objects are
depicted as acting as lenses, refracting the rays of light and redirecting the
momentum of their photons; this reaction moves them toward a focus, where the
intensity peaks [139]. In free space, beam focusing is limited by diffraction:
the minimum focal spot size is typically half of the wavelength (of the order of
a fraction of a micrometer, typically). Metallic probes have also been
proposed to trap small particles [141,142], where strong field enhancement
from light scattering at a metallic tip could generate a trapping potential deep
enough to overcome Brownian motion and to capture a nanometric particle
[141]. Alternatively, a combination of evanescent illumination from a substrate
and light scattering at a tungsten probe apex is used to shape the optical
field into a localized, 3D optical trap [142]. All these approaches require high
powers for the illumination (well above 1 W) and are difficult to integrate
in conventional microscopy instruments. Lensed optical fibers have
been demonstrated to be highly efficient optical traps [143–145] and can easily
be integrated with microscope technology but have the drawback of a large
size, difficult end face processing, and large mode field diameter (typically of the
order of 10 µm).
Short adiabatic tips can be manufactured by breaking an OFN at its minimum
waist region. These tips can be used to trap 1 µm polystyrene particles in
water with low powers 共⬃10 mW兲. The use of an OFN allows for small probe
size and optimal confinement (submicrometer spots) and potentially reduces
the trapping power by orders of magnitude. Trapping experiments were carried
out at ⬃1.5 µm by connecting an OFN to an EDFA capable of delivering
0.2 W of maximum power. The OFN tip was immersed in a solution containing
silica microspheres with 1 µm diameter and was analyzed by using an
optical microscope. The EDFA power was increased in steps of 0.1 mW, and
pictures were taken every ⬃1 s. At low powers, because of Brownian motion and
other environmental factors, the microparticles move quickly, and no trapping
was observed. With powers of ⬃10 mW, single particles were trapped at
Electric field profile at an OFM cleaved end (a). Cross sections at different
distances along the z direction. (b) The OFN cleaved end is positioned
at ⬃3.2 µm. Simulations were carried out using a beam propagation method.
the OFN tip. Figures 33(a) and 33(b) present photos taken at an ⬃1 s interval
where one particle is clearly trapped at the fiber tip while the others move
within the liquid. When the power was reduced [Fig. 33(c)], the particle was
released from the optical trap at the OFN tip. When the power was increased
again, other particles were trapped at the fiber tip when the EDFA power
was of the order of 10 mW.
This experiment demonstrated that optical trapping with OFN and adiabatic
tapers uses lower intensities 共⬃10 mW兲 than that used in free space 共⬃1 W兲
[146] or with lensed fibers 共22 mW兲 [145]).
+
Adiabatic Uniform Adiabatic
Transition Waist Transition
(LP01, LP11)
LP01 LP01
in core in clad
LP11 LP11
in core In clad
Figure 35
for various outer diameters during fabrication. Figure 37 shows the spectral
output of an SMF28 for different radii r in the uniform waist region.
As r decreases from 62.5 to 35 µm, intermodal interference appears in the
multimode spectral region, while no change is observed above 1250 nm
(single-mode operation region). This can be explained by the interference and
Figure 37
Figure 38
r r共1 − 2兲
⍀= = . 共33兲
zb 2
Figure 39
1.454
LP01
1.452
Effective index, neff
LP02
LP03
nclad
1.450
1.448
0.83
Mode effective index versus core V number [Vco, Eq. (2)] for the first three
LP0m modes. nclad and neff represent the cladding and the mode effective indices,
respectively. V = 0.83 corresponds to point C in Fig. 3.
LP11
1.452
LP12
1.448
2.405
Mode effective index versus core V number [Vco, Eq. (2)] for the first three
LP1m modes. nclad and neff represent the cladding and the mode effective indices,
respectively. V = 2.405 corresponds to the LP11 cutoff.
Figure 41
10
-2 Lossy
Lossless
LPLP
01 01
Lossy
Lossless
Core taper angle, Ω
LPLP
11 11
-3
10
Taper profile
-4
10
0.0 0.2 0.4 0.6 0.8 1.0
Inverse taper ratio, ρ (z)/ρ0
Adiabatic profiles for LP01 and LP11 modes obtained from Eq. (33) and Figs.
39 and 40. The dashed blue curve represents the profile of the transition region.
Since between inverse taper ratios r共z兲 / r0 = 0.65 and r共z兲 / r0 = 0.8 it is above
the LP11 adiabatic curve, the LP11 mode will not experience adiabatic conversion
for r共z兲 / r0 ⬍ 0.8 and will be converted in LP1m 共m ⬎ 1兲 modes.
5. Conclusions
Acknowledgments
The authors acknowledge financial support from the Engineering and Physical
Sciences Research Council (UK, EPSRC). G. Brambilla gratefully
acknowledges the Royal Society (London, UK) for his research fellowship.
References