IRFR3709Z IRFU3709Z: V R Max QG
IRFR3709Z IRFU3709Z: V R Max QG
IRFR3709Z
IRFU3709Z
Applications HEXFET® Power MOSFET
l High Frequency Synchronous Buck
Converters for Computer Processor Power VDSS RDS(on) max Qg
l High Frequency Isolated DC-DC
30V 6.5m: 17nC
Converters with Synchronous Rectification
for Telecom and Industrial Use
Benefits
l Very Low RDS(on) at 4.5V VGS
l Ultra-Low Gate Impedance
l Fully Characterized Avalanche Voltage
and Current D-Pak I-Pak
IRFR3709Z IRFU3709Z
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 1.9 °C/W
RθJA Junction-to-Ambient (PCB Mount) g ––– 50
RθJA Junction-to-Ambient ––– 110
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06/23/03
IRFR/U3709Z
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
BVDSS Drain-to-Source Breakdown Voltage 30 ––– ––– V VGS = 0V, ID = 250µA
∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 22 ––– mV/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance ––– 5.2 6.5 mΩ VGS = 10V, ID = 15A e
––– 6.5 8.2 VGS = 4.5V, ID = 12A e
VGS(th) Gate Threshold Voltage 1.35 1.80 2.25 V VDS = VGS, ID = 250µA
∆VGS(th)/∆TJ Gate Threshold Voltage Coefficient ––– -5.6 ––– mV/°C
IDSS Drain-to-Source Leakage Current ––– ––– 1.0 µA VDS = 24V, VGS = 0V
––– ––– 150 VDS = 24V, VGS = 0V, TJ = 150°C
IGSS Gate-to-Source Forward Leakage ––– ––– 100 nA VGS = 20V
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -20V
gfs Forward Transconductance 51 ––– ––– S VDS = 15V, ID = 12A
Qg Total Gate Charge ––– 17 26
Qgs1 Pre-Vth Gate-to-Source Charge ––– 4.7 ––– VDS = 15V
Qgs2 Post-Vth Gate-to-Source Charge ––– 1.6 ––– nC VGS = 4.5V
Qgd Gate-to-Drain Charge ––– 5.7 ––– ID = 12A
Qgodr Gate Charge Overdrive ––– 5.0 ––– See Fig. 16
Qsw Switch Charge (Qgs2 + Qgd) ––– 7.3 –––
Qoss Output Charge ––– 10 ––– nC VDS = 16V, VGS = 0V
td(on) Turn-On Delay Time ––– 12 ––– VDD = 16V, VGS = 4.5V e
tr Rise Time ––– 12 ––– ID = 12A
td(off) Turn-Off Delay Time ––– 15 ––– ns Clamped Inductive Load
tf Fall Time ––– 3.9 –––
Ciss Input Capacitance ––– 2330 ––– VGS = 0V
Coss Output Capacitance ––– 460 ––– pF VDS = 15V
Crss Reverse Transfer Capacitance ––– 230 ––– ƒ = 1.0MHz
Avalanche Characteristics
Parameter Typ. Max. Units
EAS Single Pulse Avalanche Energy d ––– 100 mJ
IAR Avalanche Current c ––– 12 A
EAR Repetitive Avalanche Energy c ––– 7.9 mJ
Diode Characteristics
Parameter Min. Typ. Max. Units Conditions
IS Continuous Source Current ––– ––– 86 f MOSFET symbol D
VSD Diode Forward Voltage ––– ––– 1.0 V TJ = 25°C, IS = 12A, VGS = 0V e
trr Reverse Recovery Time ––– 29 44 ns TJ = 25°C, IF = 12A, VDD = 15V
Qrr Reverse Recovery Charge ––– 25 37 nC di/dt = 100A/µs e
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
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IRFR/U3709Z
10000 10000
VGS VGS
TOP 10V TOP 10V
5.0V 5.0V
1000 4.5V 4.5V
ID, Drain-to-Source Current (A)
10
10
1
2.25V
2.25V 1
0.1
20µs PULSE WIDTH 20µs PULSE WIDTH
Tj = 25°C Tj = 175°C
0.01 0.1
0.1 1 10 100 0.1 1 10 100
1000 2.0
RDS(on) , Drain-to-Source On Resistance
ID = 30A
VGS = 10V
ID, Drain-to-Source Current (Α)
100
1.5
(Normalized)
T J = 175°C
10
1.0
T J = 25°C
1
VDS = 15V
20µs PULSE WIDTH
0.1 0.5
0 1 2 3 4 5 6 7 8 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
100000 6.0
VGS = 0V, f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED ID= 12A
C rss = C gd VDS= 24V
4.0
Ciss
Crss
2.0
100
1.0
10 0.0
1 10 100 0 5 10 15 20 25
VDS, Drain-to-Source Voltage (V) QG Total Gate Charge (nC)
1000 1000
OPERATION IN THIS AREA
LIMITED BY R DS(on)
ID, Drain-to-Source Current (A)
ISD, Reverse Drain Current (A)
100
T J = 175°C
100
10
100µsec
10
T J = 25°C
1 1msec
Tc = 25°C
Tj = 175°C
VGS = 0V Single Pulse 10msec
0 1
0.0 0.5 1.0 1.5 2.0 2.5 0 1 10 100 1000
VSD, Source-to-Drain Voltage (V) VDS, Drain-to-Source Voltage (V)
100 2.5
90
70
60 1.5
ID = 250µA
50
40 1.0
30
20 0.5
10
0.0
0
-75 -50 -25 0 25 50 75 100 125 150 175
25 50 75 100 125 150 175
T C , Case Temperature (°C) T J , Temperature ( °C )
Fig 9. Maximum Drain Current vs. Fig 10. Threshold Voltage vs. Temperature
Case Temperature
10
Thermal Response ( Z thJC )
1 D = 0.50
0.20
0.10
0.1 0.05
R1
R1
R2
R2
R3
R3 Ri (°C/W) τi (sec)
τJ τC
0.02 τJ τ
0.810 0.000260
τ1 τ2 τ3
0.01 τ1 τ2 τ3 0.640 0.001697
Ci= τi/Ri 0.451 0.021259
0.01 SINGLE PULSE Ci= τi/Ri
( THERMAL RESPONSE ) Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.001
1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10
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IRFR/U3709Z
15V 450
100
V(BR)DSS
50
tp
0
25 50 75 100 125 150 175
D.U.T
Current Regulator
Same Type as D.U.T. VGS
Pulse Width < 1µs
Duty Factor < 0.1%
50KΩ
12V .2µF
.3µF
Fig 14a. Switching Time Test Circuit
+
V
D.U.T. - DS VDS
90%
VGS
3mA
10%
IG ID VGS
Current Sampling Resistors
td(on) tr td(off) tf
Fig 13. Gate Charge Test Circuit
Fig 14b. Switching Time Waveforms
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IRFR/U3709Z
VGS=10V *
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
- • Low Leakage Inductance
D.U.T. ISD Waveform
Current Transformer
+
Reverse
-
+
Recovery
Current
Body Diode Forward
Current
- di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD
Ripple ≤ 5% ISD
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
Vgs(th)
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IRFR/U3709Z
Power MOSFET Selection for Non-Isolated DC/DC Converters
+ (Qg × Vg × f )
MOSFET must still be turned on and off by the con-
trol IC so the gate drive losses become much more
significant. Secondly, the output charge Qoss and re-
Qoss
+ × Vin × f verse recovery charge Qrr both generate losses that
2 are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
This simplified loss equation includes the terms Qgs2 MOSFETs’ susceptibility to Cdv/dt turn on.
and Qoss which are new to Power MOSFET data sheets. The drain of Q2 is connected to the switching node
Qgs2 is a sub element of traditional gate-source of the converter and therefore sees transitions be-
charge that is included in all MOSFET data sheets. tween ground and Vin. As Q1 turns on and off there is
The importance of splitting this gate-source charge a rate of change of drain voltage dV/dt which is ca-
into two sub elements, Qgs1 and Qgs2, can be seen from pacitively coupled to the gate of Q2 and can induce
Fig 16. a voltage spike on the gate that is sufficient to turn
Qgs2 indicates the charge that must be supplied by the MOSFET on, resulting in shoot-through current .
the gate driver between the time that the threshold The ratio of Qgd/Qgs1 must be minimized to reduce the
voltage has been reached and the time the drain cur- potential for Cdv/dt turn on.
rent rises to Idmax at which time the drain voltage be-
gins to change. Minimizing Qgs2 is a critical factor in
reducing switching losses in Q1.
Qoss is the charge that must be supplied to the out-
put capacitance of the MOSFET during every switch-
ing cycle. Figure A shows how Qoss is formed by the
parallel combination of the voltage dependant (non-
linear) capacitances Cds and Cdg when multiplied by
the power supply input buss voltage.
Figure A: Qoss Characteristic
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IRFR/U3709Z
D-Pak (TO-252AA) Package Outline
Dimensions are shown in millimeters (inches)
2.38 (.094)
6.73 (.265) 2.19 (.086)
6.35 (.250) 1.14 (.045)
0.89 (.035)
-A-
5.46 (.215) 1.27 (.050) 0.58 (.023)
5.21 (.205) 0.88 (.035) 0.46 (.018)
6.45 (.245)
5.68 (.224)
6.22 (.245)
5.97 (.235) 10.42 (.410)
1.02 (.040) 9.40 (.370) LEAD ASSIGNMENTS
1.64 (.025) 1 2 3
1 - GATE
0.51 (.020) 2 - DRAIN
-B- MIN. 3 - SOURCE
1.52 (.060) 4 - DRAIN
1.15 (.045)
0.89 (.035)
3X
0.64 (.025) 0.58 (.023)
1.14 (.045) 0.46 (.018)
2X 0.25 (.010) M A M B
0.76 (.030)
AS S EMBLY
LOT CODE
Notes : T his part marking information applies to devices produced after 02/26/2001
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IRFR/U3709Z
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
1 2 3
-B- NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2.28 (.090) 9.65 (.380) 2 CONTROLLING DIMENSION : INCH.
1.91 (.075) 8.89 (.350) 3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).
AS S EMBLY
LOT CODE
Notes : T his part marking information applies to devices produced after 02/26/2001
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IRFR/U3709Z
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR TRR TRL
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
13 INCH
16 mm
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
Notes:
Repetitive rating; pulse width limited by Calculated continuous current based on maximum allowable
max. junction temperature. junction temperature. Package limitation current is 30A.
Starting TJ = 25°C, L = 1.4mH, RG = 25Ω,
When mounted on 1" square PCB (FR-4 or G-10 Material).
IAS = 12A. For recommended footprint and soldering techniques refer to
Pulse width ≤ 400µs; duty cycle ≤ 2%. application note #AN-994.
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TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 06/03
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/