AdvDistance1:
. .
Test Object - Device Settings
. . .
Substation/Bay:
Substation: jamtara Substation address:
Bay: 132 Bay address:
. . .
Device:
Name/description: jamtara /132 Manufacturer:
Device type: 7SA522 Device address:
Serial/model number:
Additional info 1:
Additional info 2:
. . .
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 110.0 V V primary: 110.0 V
I nom (secondary): 1.000 A I primary: 1.000 A
. . .
Residual Voltage/Current Factors:
VLN / VN: 1.732 IN / I nom: 1.000
. . .
Limits:
V max: 120.0 V I max: 10.00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 5.000 ms Deglitch time: 0.000 s
. . .
Overload Detection:
Suppression time: 50.00 ms
Test Object - Other RIO Functions
.
CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %
Test Object - Distance Settings
. . . .
System parameters:
Line length: 1.000 Ω Line angle: 67.00 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 1.000 %
Tol. T abs. +: 300.0 ms Tol. T abs. -: 30.00 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 100.0 mΩ
. . . .
Grounding factor:
RE/RL: 0.497000 XE/XL: 1.069000
Separate arc resistance: no
Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1 Tripping L-L 0.000 s 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z1 Tripping L-E 0.000 s 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z1B extended L-L 0.000 s 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z1B extended L-E 0.000 s 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z2 Tripping L-L 350.0 ms 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z2 Tripping L-E 350.0 ms 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z4 Tripping L-L 500.0 ms 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z4 Tripping L-E 500.0 ms 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z3 Tripping L-L 800.0 ms 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Z3 Tripping L-E 800.0 ms 1.000 % 300.0 ms 30.00 ms 5.000 % 100.0 mΩ
Linked XRIO References
Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 110.00 V RIO/Device/Nominal Values/V nom
Comment
. .
Test Module
Name: OMICRON Advanced Distance Version: 3.00
Test Start: 06-Nov-2019 15:06:28 Test End: 06-Nov-2019 15:10:26
User Name: Manager:
Company:
Test Settings
.
Test model:
Test model: constant test current ITest 2.000 A
Allow reduction of no kS = kL: no
ITest/VTest:
ZS mag.: 0.000 Ω ZS angle: 0.00 °
kS mag.: 1.000 kS angle: 0.00 °
.
Fault Inception:
Mode: random
DC-offset: no
.
Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception
.
Other:
Extended zones: not active Switch off at zero crossing: yes
Load current enabled: no Load current:: n/a
.
Search Settings:
Search res. rel.: 1.000 % Search res. abs.: 50.00 mΩ
Ignore nominal no
characteristics:
Search interval: 200.0 mΩ
.
Auxiliary Binary Outputs:
Name Fault inception Slope Trip Delay time Slope
Delay time
Ext. zones active n/a Open n/a Open
Test Results
Shot Test: Fault Type L1-E
|Z| Phi % % of t nom t act. Dev. ITest Result
2.732 Ω 80.00 ° n/a 0.000 s 168.3 ms 168.3 ms 2.000 A Passed
4.000 Ω 40.00 ° n/a 0.000 s 216.0 ms 216.0 ms 2.000 A Passed
5.250 Ω 10.00 ° n/a 0.000 s 250.5 ms 250.5 ms 2.000 A Passed
5.957 Ω -10.00 ° n/a 0.000 s 73.40 ms 73.40 ms 2.000 A Passed
5.476 Ω 105.36 ° n/a 350.0 ms 605.0 ms 72.85 % 2.000 A Passed
5.489 Ω 67.00 ° n/a 350.0 ms 358.9 ms 2.556 % 2.000 A Passed
8.000 Ω 37.00 ° n/a 350.0 ms 325.3 ms -7.055 % 2.000 A Passed
11.10 Ω 4.79 ° n/a 350.0 ms 587.0 ms 67.72 % 2.000 A Passed
12.00 Ω -10.00 ° n/a 350.0 ms 425.3 ms 21.52 % 2.000 A Passed
8.000 Ω 100.00 ° n/a 800.0 ms 915.2 ms 14.4 % 2.000 A Passed
9.119 Ω 54.37 ° n/a 800.0 ms 1.093 s 36.62 % 2.000 A Passed
13.21 Ω 34.62 ° n/a 800.0 ms 1.093 s 36.58 % 2.000 A Passed
16.00 Ω 27.84 ° n/a 800.0 ms 930.0 ms 16.25 % 2.000 A Passed
21.00 Ω 3.03 ° n/a 800.0 ms 855.5 ms 6.938 % 2.000 A Passed
4.000 Ω 170.00 ° n/a 500.0 ms 544.4 ms 8.875 % 2.000 A Passed
14.43 Ω 178.16 ° n/a 500.0 ms 531.7 ms 6.335 % 2.000 A Passed
22.39 Ω -178.81 ° n/a 500.0 ms 695.7 ms 39.14 % 2.000 A Passed
8.596 Ω -176.91 ° n/a 500.0 ms 524.3 ms 4.865 % 2.000 A Passed
Shot Test: Fault Type L2-E
|Z| Phi % % of t nom t act. Dev. ITest Result
2.732 Ω 80.00 ° n/a 0.000 s 191.4 ms 191.4 ms 2.000 A Passed
4.000 Ω 40.00 ° n/a 0.000 s 278.4 ms 278.4 ms 2.000 A Passed
5.250 Ω 10.00 ° n/a 0.000 s 117.4 ms 117.4 ms 2.000 A Passed
5.957 Ω -10.00 ° n/a 0.000 s 265.5 μs 265.5 μs 2.000 A Passed
5.476 Ω 105.36 ° n/a 350.0 ms 363.3 ms 3.79 % 2.000 A Passed
5.489 Ω 67.00 ° n/a 350.0 ms 545.3 ms 55.79 % 2.000 A Passed
8.000 Ω 37.00 ° n/a 350.0 ms 349.0 ms -0.2872 % 2.000 A Passed
11.10 Ω 4.79 ° n/a 350.0 ms 451.5 ms 29 % 2.000 A Passed
12.00 Ω -10.00 ° n/a 350.0 ms 469.0 ms 33.99 % 2.000 A Passed
8.000 Ω 100.00 ° n/a 800.0 ms 772.7 ms -3.408 % 2.000 A Passed
9.119 Ω 54.37 ° n/a 800.0 ms 788.5 ms -1.441 % 2.000 A Passed
13.21 Ω 34.62 ° n/a 800.0 ms 1.080 s 35 % 2.000 A Passed
16.00 Ω 27.84 ° n/a 800.0 ms 1.046 s 30.71 % 2.000 A Passed
21.00 Ω 3.03 ° n/a 800.0 ms 892.1 ms 11.51 % 2.000 A Passed
4.000 Ω 170.00 ° n/a 500.0 ms 497.2 ms -0.5656 % 2.000 A Passed
14.43 Ω 178.16 ° n/a 500.0 ms 734.2 ms 46.84 % 2.000 A Passed
22.39 Ω -178.81 ° n/a 500.0 ms 717.4 ms 43.49 % 2.000 A Passed
8.596 Ω -176.91 ° n/a 500.0 ms 736.5 ms 47.29 % 2.000 A Passed
Shot Test: Fault Type L3-E
|Z| Phi % % of t nom t act. Dev. ITest Result
2.732 Ω 80.00 ° n/a 0.000 s 161.3 ms 161.3 ms 2.000 A Passed
4.000 Ω 40.00 ° n/a 0.000 s 66.45 ms 66.45 ms 2.000 A Passed
5.250 Ω 10.00 ° n/a 0.000 s 128.4 ms 128.4 ms 2.000 A Passed
5.957 Ω -10.00 ° n/a 0.000 s 10.93 ms 10.93 ms 2.000 A Passed
5.476 Ω 105.36 ° n/a 350.0 ms 585.0 ms 67.15 % 2.000 A Passed
5.489 Ω 67.00 ° n/a 350.0 ms 529.4 ms 51.25 % 2.000 A Passed
8.000 Ω 37.00 ° n/a 350.0 ms 461.0 ms 31.72 % 2.000 A Passed
11.10 Ω 4.79 ° n/a 350.0 ms 344.0 ms -1.703 % 2.000 A Passed
12.00 Ω -10.00 ° n/a 350.0 ms 488.0 ms 39.42 % 2.000 A Passed
8.000 Ω 100.00 ° n/a 800.0 ms 1.037 s 29.58 % 2.000 A Passed
9.119 Ω 54.37 ° n/a 800.0 ms 1.073 s 34.18 % 2.000 A Passed
13.21 Ω 34.62 ° n/a 800.0 ms 1.093 s 36.59 % 2.000 A Passed
16.00 Ω 27.84 ° n/a 800.0 ms 954.7 ms 19.34 % 2.000 A Passed
21.00 Ω 3.03 ° n/a 800.0 ms 1.048 s 30.97 % 2.000 A Passed
4.000 Ω 170.00 ° n/a 500.0 ms 779.6 ms 55.93 % 2.000 A Passed
14.43 Ω 178.16 ° n/a 500.0 ms 739.0 ms 47.79 % 2.000 A Passed
22.39 Ω -178.81 ° n/a 500.0 ms 604.5 ms 20.91 % 2.000 A Passed
8.596 Ω -176.91 ° n/a 500.0 ms 588.5 ms 17.7 % 2.000 A Passed
Shot Test: Fault Type L1-L2
|Z| Phi % % of t nom t act. Dev. ITest Result
2.678 Ω 100.00 ° n/a 0.000 s 90.00 ms 90.00 ms 2.000 A Passed
2.662 Ω 67.00 ° n/a 0.000 s 124.4 ms 124.4 ms 2.000 A Passed
2.158 Ω 30.00 ° n/a 0.000 s 165.1 ms 165.1 ms 2.000 A Passed
3.513 Ω 0.00 ° n/a 0.000 s 222.4 ms 222.4 ms 2.000 A Passed
5.577 Ω 110.00 ° n/a 350.0 ms 457.7 ms 30.77 % 2.000 A Passed
5.937 Ω 55.70 ° n/a 350.0 ms 332.6 ms -4.957 % 2.000 A Passed
8.761 Ω 24.06 ° n/a 350.0 ms 556.0 ms 58.86 % 2.000 A Passed
8.000 Ω -10.00 ° n/a 350.0 ms 566.3 ms 61.8 % 2.000 A Passed
8.000 Ω 110.00 ° n/a 800.0 ms 1.009 s 26.07 % 2.000 A Passed
7.521 Ω 84.80 ° n/a 800.0 ms 947.1 ms 18.38 % 2.000 A Passed
16.80 Ω 10.00 ° n/a 800.0 ms 1.002 s 25.23 % 2.000 A Passed
22.42 Ω 18.25 ° n/a 800.0 ms 887.0 ms 10.88 % 2.000 A Passed
3.577 Ω 170.00 ° n/a 500.0 ms 775.6 ms 55.11 % 2.000 A Passed
17.97 Ω 178.35 ° n/a 500.0 ms 501.8 ms 0.3549 % 2.000 A Passed
5.837 Ω -175.84 ° n/a 500.0 ms 588.1 ms 17.62 % 2.000 A Passed
16.48 Ω -178.53 ° n/a 500.0 ms 532.7 ms 6.535 % 2.000 A Passed
Shot Test: Fault Type L2-L3
|Z| Phi % % of t nom t act. Dev. ITest Result
2.678 Ω 100.00 ° n/a 0.000 s 244.1 ms 244.1 ms 2.000 A Passed
2.662 Ω 67.00 ° n/a 0.000 s 50.58 ms 50.58 ms 2.000 A Passed
2.158 Ω 30.00 ° n/a 0.000 s 190.9 ms 190.9 ms 2.000 A Passed
3.513 Ω 0.00 ° n/a 0.000 s 106.0 ms 106.0 ms 2.000 A Passed
5.577 Ω 110.00 ° n/a 350.0 ms 592.0 ms 69.14 % 2.000 A Passed
5.937 Ω 55.70 ° n/a 350.0 ms 541.8 ms 54.8 % 2.000 A Passed
8.761 Ω 24.06 ° n/a 350.0 ms 397.6 ms 13.6 % 2.000 A Passed
8.000 Ω -10.00 ° n/a 350.0 ms 326.5 ms -6.701 % 2.000 A Passed
8.000 Ω 110.00 ° n/a 800.0 ms 803.9 ms 0.4925 % 2.000 A Passed
7.521 Ω 84.80 ° n/a 800.0 ms 791.7 ms -1.035 % 2.000 A Passed
16.80 Ω 10.00 ° n/a 800.0 ms 1.020 s 27.43 % 2.000 A Passed
22.42 Ω 18.25 ° n/a 800.0 ms 979.6 ms 22.45 % 2.000 A Passed
3.577 Ω 170.00 ° n/a 500.0 ms 557.6 ms 11.53 % 2.000 A Passed
17.97 Ω 178.35 ° n/a 500.0 ms 596.8 ms 19.37 % 2.000 A Passed
5.837 Ω -175.84 ° n/a 500.0 ms 757.7 ms 51.53 % 2.000 A Passed
16.48 Ω -178.53 ° n/a 500.0 ms 490.7 ms -1.851 % 2.000 A Passed
Shot Test: Fault Type L3-L1
|Z| Phi % % of t nom t act. Dev. ITest Result
2.678 Ω 100.00 ° n/a 0.000 s 175.5 ms 175.5 ms 2.000 A Passed
2.662 Ω 67.00 ° n/a 0.000 s 249.1 ms 249.1 ms 2.000 A Passed
2.158 Ω 30.00 ° n/a 0.000 s 138.9 ms 138.9 ms 2.000 A Passed
3.513 Ω 0.00 ° n/a 0.000 s 156.4 ms 156.4 ms 2.000 A Passed
5.577 Ω 110.00 ° n/a 350.0 ms 590.3 ms 68.67 % 2.000 A Passed
5.937 Ω 55.70 ° n/a 350.0 ms 325.6 ms -6.96 % 2.000 A Passed
8.761 Ω 24.06 ° n/a 350.0 ms 384.1 ms 9.744 % 2.000 A Passed
8.000 Ω -10.00 ° n/a 350.0 ms 535.9 ms 53.11 % 2.000 A Passed
8.000 Ω 110.00 ° n/a 800.0 ms 902.8 ms 12.85 % 2.000 A Passed
7.521 Ω 84.80 ° n/a 800.0 ms 920.1 ms 15.01 % 2.000 A Passed
16.80 Ω 10.00 ° n/a 800.0 ms 934.2 ms 16.78 % 2.000 A Passed
22.42 Ω 18.25 ° n/a 800.0 ms 962.1 ms 20.26 % 2.000 A Passed
3.577 Ω 170.00 ° n/a 500.0 ms 540.9 ms 8.188 % 2.000 A Passed
17.97 Ω 178.35 ° n/a 500.0 ms 593.9 ms 18.78 % 2.000 A Passed
5.837 Ω -175.84 ° n/a 500.0 ms 613.5 ms 22.7 % 2.000 A Passed
16.48 Ω -178.53 ° n/a 500.0 ms 560.4 ms 12.08 % 2.000 A Passed
Shot Test: Fault Type L1-L2-L3
|Z| Phi % % of t nom t act. Dev. ITest Result
2.678 Ω 100.00 ° n/a 0.000 s 196.0 ms 196.0 ms 2.000 A Passed
2.662 Ω 67.00 ° n/a 0.000 s 146.8 ms 146.8 ms 2.000 A Passed
2.158 Ω 30.00 ° n/a 0.000 s 120.9 ms 120.9 ms 2.000 A Passed
3.513 Ω 0.00 ° n/a 0.000 s 25.77 ms 25.77 ms 2.000 A Passed
5.577 Ω 110.00 ° n/a 350.0 ms 391.1 ms 11.75 % 2.000 A Passed
5.937 Ω 55.70 ° n/a 350.0 ms 572.9 ms 63.69 % 2.000 A Passed
8.761 Ω 24.06 ° n/a 350.0 ms 371.9 ms 6.245 % 2.000 A Passed
8.000 Ω -10.00 ° n/a 350.0 ms 587.1 ms 67.75 % 2.000 A Passed
8.000 Ω 110.00 ° n/a 800.0 ms 877.6 ms 9.696 % 2.000 A Passed
7.521 Ω 84.80 ° n/a 800.0 ms 1.046 s 30.75 % 2.000 A Passed
16.80 Ω 10.00 ° n/a 800.0 ms 807.7 ms 0.9633 % 2.000 A Passed
22.42 Ω 18.25 ° n/a 800.0 ms 794.1 ms -0.7375 % 2.000 A Passed
3.577 Ω 170.00 ° n/a 500.0 ms 671.9 ms 34.39 % 2.000 A Passed
17.97 Ω 178.35 ° n/a 500.0 ms 504.2 ms 0.8423 % 2.000 A Passed
5.837 Ω -175.84 ° n/a 500.0 ms 605.2 ms 21.04 % 2.000 A Passed
16.48 Ω -178.53 ° n/a 500.0 ms 615.6 ms 23.13 % 2.000 A Passed
Shot Details:
.
Parameters:
Fault Type: L1-L2-L3
| Z |: 16.48 Ω Phi: -178.53 °
R: -16.48 Ω X: -423.4 mΩ
%: n/a % of:
ITest 2.000 A
.
Results:
t act.: 615.6 ms Assessment: Passed
t nom: 500.0 ms Dev.: 23.13 %
t min: 470.0 ms t max: 800.0 ms
. .
Fault Quantities (natural): Fault Quantities (symmetrical):
VL1: 32.97 V 0.00 ° V0: 0.000 V n/a
VL2: 32.97 V -120.00 ° V1: 32.97 V 0.00 °
VL3: 32.97 V 120.00 ° V2: 0.000 V n/a
IL1: 2.000 A 178.53 ° I0: 0.000 A n/a
IL2: 2.000 A 58.53 ° I1: 2.000 A 178.53 °
IL3: 2.000 A 298.53 ° I2: 0.000 A n/a
VFault: 32.97 V 0.00 °
IFault: 2.000 A 178.53 °
.
Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 615.6 ms <none> n/a
C2 - C1 615.6 ms n/a
.
Test State:
Test passed
Test performed offline: Test results are simulated!
