Two channel high voltage differential probe for power
electronics applications
Alex Van den Bossche, Dimitar Bozalakov
Ghent University - EELAB
Sint-Pietersnieuwstraat 41
Gent, Belgium
Tel.: +32/9-264.34.19.
Fax: +32/9-264.35.82.
E-Mail: alex.vandenbossche@ugent.be, mitko.bozalakov@gmail.com
URL: http://www.ugent.be/en
Highlights: Test under rectangular pulses
- High voltage two channel differential probe for power electronics Fig .5 to Fig. 8 show rectangular input pulses (blue channel) and output pulses (yellow) from the probe.
- Bandwidth of at least 10MHz The input signal is about 33V peak to peak and the tested frequencies are - 1 kHz, 3 kHz, 10 kHz,
- Follow slew rate- 7.3V/ns at the input - typical in real power converters 30 kHz, 100 kHz and 300 kHz.
- The probe is tested by using high voltage source up to 8kV DC and no corona or
flashover were observed between the PCB layout and the components
and between the components as well. The active output of the generator is connected to the inverting input of the probe
Features
- Allows non ground referred measurements by avoiding the usage of expensive
galvanic insulated oscilloscopes
- Guaranties safety measurements up to ±3kV in differential measurement (category II)
- Two channels - cost effective per channel
Probe overview
Differential
input 1 Channel 1 BNC1
Power Grid
Screens supply connection
a) comparison at 1kHz Ch1 input, Ch2 output b) comparison at 3kHz Ch1 input, Ch2 output
Differential
input 2 Channel 2 BNC2
Fig. 1: Simplified block diagram of the probe
The accuracy of the high voltage resistors is 1% but they are checked for higher accuracy and 5% Fig.5: Wave form comparison with
for capacitors which are tuned by variable capacitor. different frequencies1kHz, 3kHz and
10kHz - аctive end of the generator
C_PCB1 C7 C9 is connected to the inverting input
R1 50MΩ R3 R5
VCC R8
C1 C3 C5 VCC
120pF 33pF IC1
Channel 1 BNC
R7
C2 C4 C6 c) comparison at 10kHz Ch1 input, Ch2 output
120pF 33pF R9
VSS IC2
R2 50MΩ R4 R6 VSS
C10
C_PCB2 C8
Fig. 2: Detailed schematic diagram of the probe
R1’ R1’’
C par1
C_PCB 1’ C_PCB 1’’
Copper path FR 4 PCB material a) comparison at 30kHz Ch1 input, Ch2 output b) comparison at 100kHz Ch1 input, Ch2 output
Fig. 3: PCB capacitor implemented in the internal capacitive divider
Experimental results
Fig.6: Wave form comparison with
Bandwidth of the probe different frequencies30kHz, 100kHz
The parasitic capacitors make the flat bandwidth difficult, so a derivation of 2-3% is achieved. and 300kHz - аctive end of the generator
One can obtain a somewhat higher bandwidth, but at the expense of the more complexity and more tuning is connected to the inverting input
c) comparison at 10kHz Ch1 input, Ch2 output
Fig. 4: Bandwidth of both channels of the probe
Two channel high voltage differential probe for power
electronics applications
The active output of the generator is connected to the non-inverting input of the probe CMRR test and CMRR under high dv/dt voltages
- With the current settings of the components in the probe common mode rejection is roughly 40dB.
The small spikes in Fig. 11 show that some more tuning of the forcing capacitors C7 and C8 is needed
but the amplitude is acceptable for at this level of design.
- Input voltage - 344V, output voltage is 1.88V multiplied by 50 from the scope, so we have abo ut
0.55V output per 100V input. Most of the gates driving pulses are above 10V, so in case of measurements
such signals on the top transistors in an inverter supplied with 300V the common mode voltage which
will appear is 1.5V, so the differential probe is appropriate and for this kind of measurements as well.
a) comparison at 1kHz Ch1 input, Ch2 output b) comparison at 3kHz Ch1 input, Ch2 output
Fig.5: Wave form comparison with
different frequencies1kHz, 3kHz and
Fig.11: CM rejection at high dV/dt
10kHz - аctive end of the generator
is connected to the noninverting input
Final design
- Symmetrical topology - similar performance between both channels
- Distance between the screens and the inputs - above 12mm which provides enough safety margins
for operational voltages up to +/-2kV.
c) comparison at 10kHz Ch1 input, Ch2 output
a) comparison at 30kHz Ch1 input, Ch2 output b) comparison at 100kHz Ch1 input, Ch2 output
Fig.6: Wave form comparison with
different frequencies30kHz, 100kHz
and 300kHz - аctive end of the generator
is connected to the noninverting input
c) comparison at 10kHz Ch1 input, Ch2 output
We don't observe any overshoot spikes in the rising and falling edges and the pulses are very closer to
Conclusions
-A probe with very good performance is developed, specially adapted to the needs of didactical and development
the original ones. This is an important feature in converters as one wants to know the peak voltage
use in power electronics.
occurring at the power components.
- The bandwidth is sufficient most of for power electronic applications, but special attention
has been given to dv/dt aspects. It follows the slew rate of 5V/ns at /50 and V/ns at highest
attenuation of /500 and it displays square waves without overshoot.
Pulse and edge comparison under high dV/dt source - The small input capacitance and the very good CMMR, allows MOSFET and IGBT gate measurements in
- Pulse source - DC chopper with amplitude of 330V and slew rate of 7.3V/ns real power converters.
- Used scope - Tektronix TDS2014 together with high voltage probe P5120 - The stand-by power is below 0.9W.
Acknowledgments
The work is in collaboration with the Belgian company more@mere, info@moreatmere.com, www.bgemc.com
References
[1]. http://www.farnell.com/datasheets/302311.pdf - TPS2014 model
[2]. Mark I. Montrose, Edward M. Nakauchi “Testing for EMC Compliance: Approaches
and Techniques” Wiley, 2004, ISBN 0-471-43308-X
[3]. Henry W. Ott “Electromagnetic Compatibility Engineering” Wiley, 2009,
ISBN 978-0-470-18930-6
[4]. R. Pallàs-Areny, O. Casas “A hands-on approach to differential circuit measurements”,
Measurement Vol. 40, Issue 1, January 2007, pp. 8–14
a) Pulse comparison - Ch1 output Ch2 input b) front comparison - Ch1 output Ch2 input [5]S.A. Witherspoon, J. Choma Jr. “The analysis of balanced linear differential circuits”
IEEE Transactions on Education, 38 (1) (1995), pp. 40–50
Fig.10: Wave form comparison at high dV/dt [6]. Water G. Jung “Op Amp Applications Handbook” Analog devices, 2004,
ISBN 0-7506-7844-5
[7]. Maloney, T.J. “Improving the balanced coaxial differential probe for high-voltage pulse
The dv/dt of the input signal is close to 7.3V/ns or 220V/30ns (channel 2 - blue) and as we can see the output measurements” Portland, OR, 11-13 Sept. 2001, ISBN: 978-1-5853-7039-9,
(channel 1 - yellow) voltage is capable of following such high dv/dt voltages. pp.396 – 405
