UNIT-5
Comparators
 Comparator is another form of linear measuring
  method, which is quick and more convenient for
  checking large number of identical dimensions.
 During the measurement, a comparator is able to give
  the deviation of the dimension from the set dimension.
 Cannot measure absolute dimension but can only
  compare two dimensions.
 Highly reliable.
 To magnify the deviation, a number of principles are
  used such as mechanical, optical, pneumatic and
  electrical.
Fig. Principle of a comparator
                 GATE – 2007 (PI)
Which one of the following instruments is a
comparator ?
(a) Tool Maker’s Microscope
(b) GO/NO GO gauge
(c) Optical Interferometer
(d) Dial Gauge
      Mechanical Comparators
 The Mikrokator principle
 greatly    magnifies      any
 deviation in size so that
 even    small      deviations
 produce large deflections of
 the pointer over the scale.
   Sigma Mechanical Comparator
The Sigma Mechanical Comparator uses a partially
wrapped band wrapped about a driving drum to turn a
pointer needle. The assembly provides a frictionless
movement with a resistant pressure provided by the
springs.
Sigma Mechanical Comparator
       Mechanical Comparators
 The Eden-Rolt Reed system uses a
 pointer attached to the end of two
 reeds. One reed is pushed by a
 plunger, while the other is fixed. As
 one reed moves relative to the other,
 the pointer that they are commonly
 attached to will deflect.
           Optical Comparators
 These devices use a plunger to rotate a mirror. A light
 beam is reflected off that mirror, and simply by the
 virtue of distance, the small rotation of the mirror can
 be converted to a significant translation with little
 friction.
          Pneumatic Comparators
 Flow type:
   The float height is essentially proportional to the air
    that escapes from the gauge head
   Master gauges are used to find calibration points on
    the scales
   The    input   pressure   is   regulated    to   allow
    magnification adjustment
Pneumatic Comparators
Measurement of Surfaces
                      Surfaces
 No surface is perfectly smooth, but the better the
 surface quality, the longer a product generally lasts,
 and the better is performs.
 Surface   texture   can      be   difficult   to   analyse
 quantitatively.
 Two surfaces may be entirely different, yet still provide
 the same CLA (Ra) value.
 Surface geometry can be quantified a few different
 ways.
 Real surfaces are rarely so flat, or smooth, but most
 commonly a combination of the two.
 Roughness height: is the parameter with which
  generally the surface finish is indicated. It is specified
  either as arithmetic average value or the root mean
  square value.
 Roughness width: is the distance parallel to the
  nominal part surface within which the peaks and
  valleys, which constitutes the predominant pattern of
  the roughness.
 Roughness width cut-off: is the maximum width of
  the surface that is included in the calculation of the
  roughness height.
 Waviness: refers to those surface irregularities that have
  a greater spacing than that of roughness width.
    Determined by the height of the waviness and its
     width.
    The greater the width, the smoother is the surface and
     thus is more desirable.
 Lay direction: is the direction of the predominant
  surface pattern produced on the workpiece by the tool
  marks.
 Flaw: are surface irregularities that are present which are
  random and therefore will not be considered.
               Lay
Diagram   Symbol Description
                 Parallel lay: Lay parallel to
                 the Surface. Surface is
                 produced      by    shaping,
                 planning etc.
                 Perpendicular lay: Lay
                 perpendicular      to    the
                 Surface. Surface is produced
                 by shaping and planning
                 Crossed lay: Lay angular in
                 both directions.
                 Surface is produced by
                 knurling, honing.
             Lay                      Contd..
Diagram   Symbol   Description
                   Multidirectional lay: Lay
                   multidirectional. Surface is
                   produced by grinding,
                   lapping, super finishing.
                   Circular lay:
                   Approximately         circular
                   relative to the center.
                   Surface is produced by
                   facing.
                   Radial lay: Approximately
                   radial relative to the center
                   of the nominal surface.
Representation of Surface Roughness
Roughness     Roughness Grade   Roughness Symbol
   Ra ( m)      Number
    50              N12                -
    25              N11
   12.5             N10
                                      
    6.3             N9
    3.2             N8              
    1.6             N7
    0.8             N6
    0.4             N5              
    0.2             N4
    0.1             N3
   0.05             N2             
   0.025            N1
 Waviness height - the distance from a peak to a valley
 Waviness width - the distance between peaks or
  valleys
 Roughness width cutoff - a value greater than the
  maximum roughness width that is the largest
  separation of surface irregularities included in the
  measurements. Typical values are (0.003”, 0.010”,
  0.030”, 0.100”, 0.300”)
 Lay - the direction the roughness pattern should
  follow
    Stylus travel is perpendicular to the lay specified.
  Evaluation of Surface Roughness
1. Centre line average (CLA) or arithmetic mean
   deviation denoted as Ra.
2. Root mean square value (Rg) : rms value
3. Maximum peak to valley roughness (hmax)
4. The average of the five highest peak and five deepst
   valleys in the sample.
5. The average or leveling depth of the profile.
      Determination of Mean Line
 M-System: After      plotting the characteristic of any
 surface a horizontal line is drawn by joining two points.
 This line is shifts up and down in such a way that 50%
 area is above the line and 50% area is below the line
      Determination of Mean Line
 E-System: (Envelop System) A sphere of 25 mm
 diameter is rolled over the surface and the locus of its
 centre is being traced out called envelope. This envelope
 is shifted in downward direction till the area above the
 line is equal to the area below the line. This is called
 mean envelope and the system of datum is called E-
 system.
  Arithmetical Average:
 Measured for a specified area and the figures are added
  together and the total is then divided by the number of
  measurements taken to obtain the mean or
  arithmetical average (AA).
 It is also sometimes called the centre line average or
  CLA value. This in equation form is given by
               L
         1              1
     Ra   y ( x) dx 
         L0             N
                                    y     i
                 GATE-2016 (PI)
The roughness profile of a surface is depicted below.
The surface roughness parameter Ra (in μm) is _______
 The other parameter that is used sometimes is the root
 mean square value of the deviation in place of the
 arithmetic average , This in expression form is
                          1
            RRMS 
                          N
                              2
                              yi
               Fig. Surface roughness parameters
Methods of measuring Surface Roughness
 There are a number of useful techniques for measuring
 surface roughness:
 Observation and touch - the human finger is very
 perceptive to surface roughness
 stylus based equipment - very common
 Interferometry - uses light wave interference patterns
 (discussed later)
          Observation Methods
 Human perception is highly relative.
 To give the human tester a reference for what they are
 touching, commercial sets of standards are available.
 Comparison    should   be made against matched
 identical processes.
 One method of note is the finger nail assessment of
 roughness and touch method.
              Stylus Equipment
 uses a stylus that tracks small changes in surface
  height, and a skid that follows large changes in surface
  height.
 The relative motion between the skid and the stylus is
  measured with a magnetic circuit and induction coils.
 One example of this is the Brown & Sharpe Surfcom
  unit.
                 Profilometer
 Measuring instrument used to measure a surface's
 profile, in order to quantify its roughness.
 Vertical resolution is usually in the nanometre level,
 though lateral resolution is usually poorer.
          Contact profilometers
 A diamond stylus is moved vertically in contact with a
  sample and then moved laterally across the sample for
  a specified distance and specified contact force.
 A profilometer can measure small surface variations in
  vertical stylus displacement as a function of position.
 The radius of diamond stylus ranges from 20
  nanometres to 25 μm.
     Non-contact Profilometers
 An optical profilometer is a non-contact method for
 providing much of the same information as a stylus
 based profilometer.
 There are many different techniques which are
 currently being employed, such as laser triangulation
 (triangulation sensor), confocal microscopy and digital
 holography.
 Advantages of optical Profilometers
 Because the non-contact profilometer does not touch
 the surface the scan speeds are dictated by the light
 reflected from the surface and the speed of the
 acquisition electronics.
 Optical profilometers do not touch the surface and
 therefore cannot be damaged by surface wear or
 careless operators.
                 Optical Flats
 Optical-grade clear fused quartz or glass structures
  lapped and polished to be extremely flat on one or
  both sides.
 Used with a monochromatic light to determine the
  flatness of other optical surfaces by interference.
 When a flat surface of another optic is placed on the
  optical flat, interference fringes are seen due to
  interference in the tiny gap between the two surfaces.
 The spacing between the fringes is smaller where the
  gap is changing more rapidly, indicating a departure
  from flatness in one of the two surfaces, in a similar
  way to the contour lines on a map.
 When the fringes are perfectly straight and same fringe
  width for dark and bright band we conclude that the
  surface is perfectly flat.
 For convex surface the fringes curve around the point of
  contact.
 For concave surface the fringes curve away from the point
  of contact.
                                                                         
  The distance of air gap between two successive fringes is given by 
                                                                         2
                                                             n
  Distance of air gap of interference fringe of n order is 
                                                th
                                                              2
                 GATE-2016
Two optically flat plates of glass are kept at a small
angle θ as shown in the figure. Monochromatic light
is incident vertically.
If the wavelength of light used to get a fringe
spacing of 1 mm is 450 nm, the wavelength of light
(in nm) to get a fringe spacing of 1.5 mm is _______
For IES Only
Optical flat as a comparator
                nl
           h 
                 2
Where l  separation of edges
     n  number of fringes / cm
    h  The difference of height between gauges
       wevlength of monochomatic light
                     Talysurf
 It is based upon measuring the generated noise due to
  dry friction of a metallic blade which travels over the
  surface under consideration.
 If the frictional force is made small enough to excite
  the blade, and not the entire system, then the noise
  will be proportional to surface roughness, and
  independent of the measured specimen size and
  material.
 The specimen surface roughness was measured by a
  widely used commercial instrument (Talysurf 10), and
  the prototype transducer.