Tessent ATPG Simulation Mismatch Debug
Student Workbook
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Table of Contents
Module 1: ATPG Essentials.................................................................................. 13
Objectives ........................................................................................................................................... 14
Test Procedure File............................................................................................................................. 15
Test Procedure File: Timeplates ......................................................................................................... 16
Test Procedure File: Timeplates (Cont.) ............................................................................................ 17
Test Procedure File: Setup, Load_Unload, Shift ................................................................................ 18
Test Procedure File: Capture .............................................................................................................. 19
Test Procedure File: Capture (Cont.) ................................................................................................. 20
Test Procedure File: Capture (Cont.) ................................................................................................. 21
Test Procedure File: Capture (Cont.) ................................................................................................. 22
Test Procedure File: Capture (Cont.) ................................................................................................. 23
Test Procedure File: Capture (Cont.) ................................................................................................. 24
Test Procedure File (Example with Timing) ...................................................................................... 25
Pattern Types: Basic ........................................................................................................................... 26
Pattern Types: Basic (Cont.) .............................................................................................................. 27
Pattern Types: Basic (Cont.) .............................................................................................................. 28
Pattern Types: Basic (Cont.) .............................................................................................................. 29
Pattern Types: Basic (Cont.) .............................................................................................................. 30
Pattern Types: Basic (Cont.) .............................................................................................................. 31
Pattern Types: Basic (Cont.) .............................................................................................................. 32
Pattern Types: Basic (Cont.) .............................................................................................................. 33
Pattern Types: Clock Sequential ........................................................................................................ 34
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 35
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 36
Tessent ATPG Simulation Mismatch I
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Pattern Types: Clock Sequential (Cont.) ............................................................................................ 37
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 38
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 39
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 40
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 41
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 42
Pattern Types: Clock Sequential (Cont.) ............................................................................................ 43
Pattern Types: Multiple Load ............................................................................................................. 44
Pattern Types: Multiple Load (Cont.) ................................................................................................ 45
Pattern Types: Multiple Load (Cont.) ................................................................................................ 46
Pattern Types: Multiple Load (Cont.) ................................................................................................ 47
Pattern Types: Reporting .................................................................................................................... 48
ATPG Simulation: What Is Simulated ............................................................................................... 49
ATPG Simulation: Clock Pulse Representation................................................................................. 50
ATPG Simulation: DFF and Latch Event Simulation ........................................................................ 51
Getting Help With Tessent Tools ....................................................................................................... 52
Getting Help With Tessent Tools (Cont.) .......................................................................................... 53
Getting Help With Tessent Tools (Cont.) .......................................................................................... 54
Tessent Bookcase: Accessing Manuals .............................................................................................. 55
SupportNet ......................................................................................................................................... 56
Lab1 .................................................................................................................................................... 57
Module 2: Simulation Mismatch Debug Basics .................................................. 59
Objectives ........................................................................................................................................... 60
Debug Steps........................................................................................................................................ 61
Tessent ATPG Simulation Mismatch II
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What Files to Save After ATPG ......................................................................................................... 62
ASCII/Binary Pattern Format ............................................................................................................. 63
ASCII/Binary (Cont.) ......................................................................................................................... 64
ASCII/Binary (Cont.) ......................................................................................................................... 65
ASCII/Binary (Cont.) ......................................................................................................................... 66
ASCII/Binary (Cont.) ......................................................................................................................... 67
Verilog Testbenches ........................................................................................................................... 68
Verilog Testbench .............................................................................................................................. 69
Verilog Testbench Files ..................................................................................................................... 70
Verilog Testbench (Cont.) .................................................................................................................. 71
Parallel Verilog Testbench ................................................................................................................. 72
Parallel Verilog Testbench (Cont.)..................................................................................................... 73
Parallel Verilog Testbench (Cont.)..................................................................................................... 74
Serial Verilog Testbench .................................................................................................................... 75
Serial Verilog Testbench (Cont.) ....................................................................................................... 76
Debug Tools ....................................................................................................................................... 77
Parameters .......................................................................................................................................... 78
Creating Special Debug Waveforms .................................................................................................. 79
Report Patterns ................................................................................................................................... 80
report_patterns: Switches ................................................................................................................... 81
report_patterns: Switches (Cont.) ....................................................................................................... 82
report_patterns: Switches (Cont.) ....................................................................................................... 83
set_gate_report: Switches ................................................................................................................... 84
What Testbench Should I use to Debug Mismatches? ....................................................................... 85
Debug Steps........................................................................................................................................ 86
Tessent ATPG Simulation Mismatch III
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Required Debug Files ......................................................................................................................... 87
Shift or Capture Problem? .................................................................................................................. 88
Shift or Capture Problem? (Cont.) ..................................................................................................... 89
Parallel Testbench Mismatch ............................................................................................................. 90
Parallel Testbench Trace Back ........................................................................................................... 91
Parallel Testbench Trace Back (Cont.) .............................................................................................. 92
Parallel Testbench Trace Back (Cont.) .............................................................................................. 93
Parallel Testbench Trace Back (Cont.) .............................................................................................. 94
Serial Testbench Trace Back .............................................................................................................. 95
Serial Testbench Mismatch ................................................................................................................ 96
Serial Testbench Trace Back .............................................................................................................. 97
Serial Testbench Trace Back (Cont.) ................................................................................................. 98
Debug Steps........................................................................................................................................ 99
Typical Distribution of Problem Types ............................................................................................ 100
Timing 60% ...................................................................................................................................... 101
Timing 60% (Cont.) ......................................................................................................................... 102
Clock Skew Example ....................................................................................................................... 103
Lab 2 ................................................................................................................................................. 104
Module 3: Pattern and Test Bench Options ..................................................... 105
Objectives ......................................................................................................................................... 106
Write Patterns Command ................................................................................................................. 107
Pattern Types .................................................................................................................................... 108
Pattern Types: ATE Based .............................................................................................................. 109
Pattern Types: ATE Based (Cont.) ................................................................................................... 110
Tessent ATPG Simulation Mismatch IV
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Pattern Types: Internal ..................................................................................................................... 111
Pattern Types: Internal (Cont.) ......................................................................................................... 112
Pattern Types: Internal (Cont.) ......................................................................................................... 113
Pattern Types: External .................................................................................................................... 114
Pattern Types: External (Cont.) ........................................................................................................ 115
Pattern Types: External (Cont.) ........................................................................................................ 116
Pattern Type: Scan Cell Information Based Patterns ....................................................................... 117
Pattern Type: Scan Cell Information Based Patterns (Cont.) ........................................................... 118
Verilog Testbench and Internal Pins ................................................................................................ 119
Write Patterns Switches and Verilog Defaults ................................................................................. 120
Verilog Testbench ............................................................................................................................ 121
Serial Verilog Testbench .................................................................................................................. 122
Serial Verilog Testbench (Cont.) ..................................................................................................... 123
Serial Verilog Testbench (Cont.) ..................................................................................................... 124
Serial Verilog Testbench (Cont.) ..................................................................................................... 125
Applying Serial Shifts in Parallel Testbench ................................................................................... 126
Applying Serial Shifts in Parallel Testbench (Cont.) ....................................................................... 127
Post Shifts in Parallel Testbench ...................................................................................................... 128
Post Shifts in Parallel Testbench: Shadow Cells .............................................................................. 129
Post Shifts in Parallel Testbench: D12 DRC 痴 ............................................................................... 130
Sub Chains in Parallel Testbench ..................................................................................................... 131
Scan Chain Serial Shift .................................................................................................................... 132
Scan Chain Parallel Shift.................................................................................................................. 133
Applying Serial Shifts in Parallel Testbench (Cont.) ....................................................................... 134
Tessent ATPG Simulation Mismatch V
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Scan Chain Parallel Shift with Two Pre and Post Shift ................................................................... 135
Parallel versus Serial Testbench ....................................................................................................... 136
Which Test Bench to Use? ............................................................................................................... 137
Identifying Test Bench Types .......................................................................................................... 138
Parallel Testbench Pre Shift Mismatch ............................................................................................ 139
Parallel Testbench Post Shift Mismatch........................................................................................... 140
Parallel Testbench Pre and Post Shift Mismatch ............................................................................. 141
Which Scan Cells do I Need to Investigate? .................................................................................... 142
Debug Tools ..................................................................................................................................... 143
Controlling Messaging ..................................................................................................................... 144
Restricting Run Time (Cont.) ........................................................................................................... 145
Restricting Run Time (Cont.) ........................................................................................................... 146
Specifying New Path to Pattern Data File ........................................................................................ 147
Recording Mismatch Data ................................................................................................................ 148
Recording Mismatch Data (Cont.) ................................................................................................... 149
Recording Mismatch Data (Cont.) ................................................................................................... 150
Recording Mismatch Data (Cont.) ................................................................................................... 151
Recording Mismatch Data (Cont.) ................................................................................................... 152
Recording Mismatch Data (Cont.) ................................................................................................... 153
Recording Mismatch Data (Cont.) ................................................................................................... 154
Recording Mismatch Data (Cont.) ................................................................................................... 155
Recording Mismatch Data (Cont.) ................................................................................................... 156
Lab Preview...................................................................................................................................... 157
On-Chip Clock Control .................................................................................................................... 158
Debug Steps...................................................................................................................................... 159
Tessent ATPG Simulation Mismatch VI
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Typical Distribution of Problem Types ............................................................................................ 160
OCC/NCP and Internal Pins 35% .................................................................................................... 161
OCC/NCP and Internal Pins 35% (Cont.) ........................................................................................ 162
Lab 3 ................................................................................................................................................. 163
Module 4: DRC Violations and Internal Constraints ...................................... 165
Objectives ......................................................................................................................................... 166
DRC Violations ................................................................................................................................ 167
C6 DRC Violation Mismatches........................................................................................................ 168
C6 DRC Violation Mismatches (Cont.) ........................................................................................... 169
T24 DRC Violation Mismatches ...................................................................................................... 170
T24 DRC Violation Mismatches (Cont.) ......................................................................................... 171
Internal Constraints .......................................................................................................................... 172
Black Boxes...................................................................................................................................... 173
Black Boxes (Cont.) ......................................................................................................................... 174
Black Boxes (Cont.) ......................................................................................................................... 175
Black Boxes (Cont.) ......................................................................................................................... 176
Black Boxes (Cont.) ......................................................................................................................... 177
Internal 撤 rimary Inputs .................................................................................................................. 178
Other Settings ................................................................................................................................... 179
Incorrect Cell Constraints ................................................................................................................. 180
Incorrect Cell Constraints (Cont.) .................................................................................................... 181
Incorrect Cell Constraints (Cont.) .................................................................................................... 182
Cell Constraints – C1, C0, CX ......................................................................................................... 183
Cell Constraints – OX, TX, XX ....................................................................................................... 184
Tessent ATPG Simulation Mismatch VII
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Cell Constraint Types ....................................................................................................................... 185
False and Multicycle Paths ............................................................................................................... 186
False Multicycle Paths (Cont.) ......................................................................................................... 187
False Multicycle Paths (Cont.) ......................................................................................................... 188
False and Multicycle Paths (Cont.) .................................................................................................. 189
Chain Test Capture Cycle ................................................................................................................ 190
Chain Test Capture Cycle (Cont.) .................................................................................................... 191
Lab Preview...................................................................................................................................... 192
Debug Steps...................................................................................................................................... 193
Typical Distribution of Problem Types ............................................................................................ 194
DRC 2% ........................................................................................................................................... 195
DRC 2% (Cont.) ............................................................................................................................... 196
Summary .......................................................................................................................................... 197
Lab 4 ................................................................................................................................................. 198
Module 5: Tool and Test Bench Settings ........................................................... 199
Objectives ......................................................................................................................................... 200
Tool Settings that Affect Expected Values ...................................................................................... 201
X to Binary Mismatches ................................................................................................................... 202
Weak Pulls........................................................................................................................................ 203
BIDI Pads ......................................................................................................................................... 204
X 佑 lock Handling .......................................................................................................................... 205
Set/Reset and Clocks ........................................................................................................................ 206
Set/Reset and Clocks (Cont.) ........................................................................................................... 207
MUX Enable X................................................................................................................................. 208
Tessent ATPG Simulation Mismatch VIII
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Bus Enable X .................................................................................................................................... 209
Z Handling........................................................................................................................................ 210
ROM and RAM Initialization .......................................................................................................... 211
ROM and RAM Initialization Data .................................................................................................. 212
ROM and RAM Initialization Data (Cont.) ..................................................................................... 213
Parallel Testbench Parameters ......................................................................................................... 214
Modify Delay in Parallel Testbench ................................................................................................. 215
Modify Delay in Parallel Testbench (Cont.) .................................................................................... 216
Modify Delay in Parallel Testbench (Cont.) .................................................................................... 217
Modify Delay in Parallel Testbench (Cont.) .................................................................................... 218
Modify Delay in Parallel Testbench (Cont.) .................................................................................... 219
Modify Delay in Parallel Testbench (Cont.) .................................................................................... 220
Modify Delay in Parallel Testbench (Cont.) .................................................................................... 221
Debug Steps...................................................................................................................................... 222
Typical Distribution of Problem Types ............................................................................................ 223
Tool Settings and Library 2% .......................................................................................................... 224
Tool Settings and Library 2% (Cont.) .............................................................................................. 225
Lab 5 ................................................................................................................................................. 226
Module 6: Addendum: Debug Flow .................................................................. 227
Objectives ......................................................................................................................................... 228
Debug Steps...................................................................................................................................... 229
Required Debug Files ....................................................................................................................... 230
Debug Steps...................................................................................................................................... 231
Shift or Capture Problem? ................................................................................................................ 232
Tessent ATPG Simulation Mismatch IX
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Table of Contents
Shift or Capture Problem? (Cont.) ................................................................................................... 233
Shift or Capture Problem? (Cont.) ................................................................................................... 234
Parallel Testbench Mismatch ........................................................................................................... 235
Parallel Testbench Pre Shift Mismatch ............................................................................................ 236
Parallel Testbench Post Shift Mismatch........................................................................................... 237
Parallel Testbench Pre and Post Shift Mismatch ............................................................................. 238
Serial Testbench Mismatch .............................................................................................................. 239
Debug Steps...................................................................................................................................... 240
Trace Back ........................................................................................................................................ 241
How to Trace Back the Problem? .................................................................................................... 242
Which Scan Cells do I Need to Investigate? .................................................................................... 243
Debug Steps...................................................................................................................................... 244
Typical Distribution of Problem Types ............................................................................................ 245
Timing 60% ...................................................................................................................................... 246
OCC/NCP and Internal Pins 35% .................................................................................................... 247
DRC 2% ........................................................................................................................................... 248
Tool Settings and Library 2% .......................................................................................................... 249
Setup and Design 1% ....................................................................................................................... 250
Debug Steps...................................................................................................................................... 251
Implement Solution .......................................................................................................................... 252
Timing 60% ...................................................................................................................................... 253
OCC/NCP and Internal Pins 35% .................................................................................................... 254
DRC 2% ........................................................................................................................................... 255
Tool Settings and Library 2% .......................................................................................................... 256
Setup and Design 1% ....................................................................................................................... 257
Tessent ATPG Simulation Mismatch X
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Complete Table of Problem and Solution ........................................................................................ 258
Tessent ATPG Simulation Mismatch XI
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