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SRAM Architecture & Design Guide

This document summarizes SRAM architecture and design. It discusses the SRAM cell, which uses a 6T design to store data in cross-coupled inverters. During reads, one bitline is discharged based on the cell value. Writes require driving the bitlines to overwrite the cell. Other topics covered include SRAM layout techniques to reduce cell size, decoder design, predecoding, bitline conditioning, and sense amplifiers. Sense amplifiers are needed to quickly detect the small voltage difference on the bitlines from a cell during reads.

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Ravi megha Voora
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0% found this document useful (0 votes)
46 views21 pages

SRAM Architecture & Design Guide

This document summarizes SRAM architecture and design. It discusses the SRAM cell, which uses a 6T design to store data in cross-coupled inverters. During reads, one bitline is discharged based on the cell value. Writes require driving the bitlines to overwrite the cell. Other topics covered include SRAM layout techniques to reduce cell size, decoder design, predecoding, bitline conditioning, and sense amplifiers. Sense amplifiers are needed to quickly detect the small voltage difference on the bitlines from a cell during reads.

Uploaded by

Ravi megha Voora
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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Lecture 19:

SRAM
Outline
  Memory Arrays
  SRAM Architecture
–  SRAM Cell
–  Decoders
–  Column Circuitry

19: SRAM CMOS VLSI Design 4th Ed. 2


Memory Arrays

19: SRAM CMOS VLSI Design 4th Ed. 3


Array Architecture
  2n words of 2m bits each
  If n >> m, fold by 2k into fewer rows of more columns

  Good regularity – easy to design


  Very high density if good cells are used

19: SRAM CMOS VLSI Design 4th Ed. 4


6T SRAM Cell
  Cell size accounts for most of array size
–  Reduce cell size at expense of complexity
  6T SRAM Cell
–  Used in most commercial chips
–  Data stored in cross-coupled inverters
  Read:
–  Precharge bit, bit_b
–  Raise wordline
  Write:
–  Drive data onto bit, bit_b
–  Raise wordline
19: SRAM CMOS VLSI Design 4th Ed. 5
SRAM Read
  Precharge both bitlines high
  Then turn on wordline
  One of the two bitlines will be pulled down by the cell
  Ex: A = 0, A_b = 1
–  bit discharges, bit_b stays high
–  But A bumps up slightly
  Read stability
–  A must not flip
–  N1 >> N2

19: SRAM CMOS VLSI Design 4th Ed. 6


SRAM Write
  Drive one bitline high, the other low
  Then turn on wordline
  Bitlines overpower cell with new value
  Ex: A = 0, A_b = 1, bit = 1, bit_b = 0
–  Force A_b low, then A rises high
  Writability
–  Must overpower feedback inverter
–  N2 >> P1

19: SRAM CMOS VLSI Design 4th Ed. 7


SRAM Sizing
  High bitlines must not overpower inverters during
reads
  But low bitlines must write new value into cell

19: SRAM CMOS VLSI Design 4th Ed. 8


SRAM Column Example
Read Write

19: SRAM CMOS VLSI Design 4th Ed. 9


SRAM Layout
  Cell size is critical: 26 x 45 λ (even smaller in industry)
  Tile cells sharing VDD, GND, bitline contacts

19: SRAM CMOS VLSI Design 4th Ed. 10


Thin Cell
  In nanometer CMOS
–  Avoid bends in polysilicon and diffusion
–  Orient all transistors in one direction
  Lithographically friendly or thin cell layout fixes this
–  Also reduces length and capacitance of bitlines

19: SRAM CMOS VLSI Design 4th Ed. 11


Commercial SRAMs
  Five generations of Intel SRAM cell micrographs
–  Transition to thin cell at 65 nm
–  Steady scaling of cell area

19: SRAM CMOS VLSI Design 4th Ed. 12


Decoders
  n:2n decoder consists of 2n n-input AND gates
–  One needed for each row of memory
–  Build AND from NAND or NOR gates

Static CMOS Pseudo-nMOS

19: SRAM CMOS VLSI Design 4th Ed. 13


Decoder Layout
  Decoders must be pitch-matched to SRAM cell
–  Requires very skinny gates

19: SRAM CMOS VLSI Design 4th Ed. 14


Large Decoders
  For n > 4, NAND gates become slow
–  Break large gates into multiple smaller gates

19: SRAM CMOS VLSI Design 4th Ed. 15


Predecoding
  Many of these gates are redundant
–  Factor out common
gates into predecoder
–  Saves area
–  Same path effort

19: SRAM CMOS VLSI Design 4th Ed. 16


Column Circuitry
  Some circuitry is required for each column
–  Bitline conditioning
–  Sense amplifiers
–  Column multiplexing

19: SRAM CMOS VLSI Design 4th Ed. 17


Bitline Conditioning
  Precharge bitlines high before reads

  Equalize bitlines to minimize voltage difference when


using sense amplifiers

19: SRAM CMOS VLSI Design 4th Ed. 18


Sense Amplifiers
  Bitlines have many cells attached
–  Ex: 32-kbit SRAM has 128 rows x 256 cols
–  128 cells on each bitline
  tpd ∝ (C/I) ΔV
–  Even with shared diffusion contacts, 64C of
diffusion capacitance (big C)
–  Discharged slowly through small transistors
(small I)
  Sense amplifiers are triggered on small voltage
swing (reduce ΔV)

19: SRAM CMOS VLSI Design 4th Ed. 19


Differential Pair Amp
  Differential pair requires no clock
  But always dissipates static power

19: SRAM CMOS VLSI Design 4th Ed. 20


Clocked Sense Amp
  Clocked sense amp saves power
  Requires sense_clk after enough bitline swing
  Isolation transistors cut off large bitline capacitance

19: SRAM CMOS VLSI Design 4th Ed. 21

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