‘Structure of materials : Unit cell a st calle tebnc epeaing ni tat define heey © Sire and frm of nicl areeprened by ming three ectars Re with fergade ec) reco eh Structure of materials cL ‘ay difracton mathod i an effective meth for determining the ert © Competed of tm ara a reps aeed patra te means © Hats er tanec gr than heise some separations © Imig erat third etend truth ete vom of materiel Structure of mater ‘crystal system and Bravais lattice 5 Seen ystems :cabc, etapa atari, rbombudra,hergpal, ‘mococine cle © Dire ryt srecars arbi on ramenork foe fhe Hava iatice aos w‘Structure of materials: crystal system and Bravais lattice LLL Tengen ae becaeBeror lomemsane —ssoecanpernar Son , ‘Structure of materials: Miler Indices LA ‘eas he crysagape ae Structure of materials : Miler Indices SS Paral plans of atoms itarscting the unt colar sed te die ‘Srecions and datancne nthe enya zecing defined a th tance between adjacent panes » The orantation and inteplaner spacing) of hee atic planes are etined by tee integers Mx ale Mie Indices 1 The ht) deslgnat crystal face ora family plane throughout crystal tates Structure of materials | can many nl sng etal ein eed pans SEhmtattcamanyecne ERE the atm arnt arrnge ina repr eral manner ge arom many plesX-Ray LL X-Ray Diffraction : wave interferences. Keay action methods are based on the phenomenon of wave itrernces © tntartrancs he superimposition of wo or more of hess scatred waves, ‘rodcinga resonant wave hats som ote avenaping wav eonbaont Waves are‘ phe’ when phase ference enh asa nope) X-Ray scattering LAA ey taction bya erst ann fom Xen esting by ini to the crystal Iman atom, the Xay ls scattered by electrons ‘An electron satrs the incident Xay beam tal rections in space. Wen there eno change in anergy between the Incfet photon an the ented photon thn satring i called late setting In naan seating he photon one. X-Ray Diffraction : wave interferences. Irie waves oe out of phase hen destructive traction occurs Temple setuctiveiterirenca ecurs nel oo Pave’ weenX-Ray Diffraction : Intensity LL Ditaction rom diferent pangs of toms produces difaction pat ‘veh contains information about te stom rangement hie cyt The aitraton itn rts on cllectv searing by al the atoms in the ena ‘Tera ntanaty of cron seating can be causa bythe following Bragg’s Law ew pam phe tpt lira» QT) Bao gel se brite Xcny mean ie SS mt oF SQFT 2nd 2a =m sec depends hen ah) ping ree he para un eh Diffraction : Bragg's Law » Xray mam nett on ett so wl tract teenage ‘Toe tata maven wil ben pas wna te oon rents eat X-ray diffractometer "The XRD instrument eclled an Xe iractometr > te ata, an Xen namo angle wave vedo » By continsousty changing the Iniént ange of te Xray beam, a spactrom ‘ot atracion tena vrcus the angle between iclert an tractionEssential Parts of the Diffractometer ay Tu Imctont-beam optics: condoning he Xay beam before thts he sample Goniometr: the platform that lds and moves the sample opis, he source of X Rays 1 Recelving-side optics contion ng the Xray Beem aerit has encountered vn eae) attr bythe same vane MS _—= Instrumentation tr iter » falta movamante among th ry ib, seciman ante dott the ‘Sto of amacrine ina ange a8 Instrumentation "eset pte ry te pa rh Sr wh Sater site are mad roma att lesa space pea a mata plata » Produced by colision of high-speed eleczons accelerated by high wotge wth meta are © On rap decstation of eectrons at the target kinetic nergy feetrons converts to energy of Xsayraclaton| 1 rye gunerted ung the Xray tbe.X-ray Radiation : X-ray tube rE igh otage maid acrees hee eetedes apd draws the lcs to ‘nc trode rg > Araya erotic tt pot tinct ont ran atc an aiid in LEB siser Meena ete omer more Characteristic X-rays ‘ote incge ~ Kaa nce ane le yan aan rata shal Ms SOOUSITR Sahih RanatatetACen ga ncn etc of Woe te rae remit © Theprbaty ota Leet leon ig te Khe ecney much ig tas tht of an Wallen ene he troy oH ape her tan ht op Continuous X-rays & Gharacteristie X-ays | © Keep spectra cart of j tne ad even rge wets wih azlriton vag feet X-ray Radiation : Characteristic X-rays 9 Kycontans two characte nes: Ky 20d Ky withthe tar wavelength sig sign ong tan te tomer » iy rediaton generated whan electrons fal rom the 1 K sel! "Re raditon generated when electrons fal rom the 10K sell "Ray arth the song chratrie Xray awd for NTEX-ray Radiation SS © avelngt fernce been Ky andy rsa ane eet esl os ors | “wavlangnegnertoy a copper age ate aprons he folowing SAK 03806 om S aRisesset » Kyand Kreations called K, double and ie mest widely uted monocrromaic iter mate can eectivlyabeor Ky and continuous Xray X-ray Absorption : filter system ee "Te obtain monochromatic Kafer system is necessary to itr out the ontnaour Xorye and othe characte nye » General, matte exhibit various abies to absorb Xa. ny absorption by materia function ofthe linear absorption ‘outlet and mace dena) ‘The Xray intent) passing through an absorption layer wth hckness x expreseed by a foomina caution ee hetn ‘xponentl ems ofp) ated the mas absorption coettent GONIOMETER SS ecru ssenty compromising srl ole, Sct an ards (Sonagntencti os potonane ute dt spl an th dlc retaen THETA 2-H) © samp ae anh abe ah eect tn CHETATHETA) THETA: 21HETA Conant, eX tbe ana the samp move by (Sig Tezra ee sts sanaany nave ese EN e THETATHETA grate sample tao he rao peor,Bragg - Brentano Focus Geometry GONIOMETER 2 ________ <_< » np lr anh entre in 1:2 tsi dated bea wt ‘ ‘Ny tcted on ceo coat nds athe ett moses nue Detectors Typical XRD instrumentPowder diffraction SE ______ Basic assumption of powder fraction i that for very et of planes here Ison equa mrbor ef crystals tht wil iat and that thes ‘atta ralvant numberof ystalts, not just one owe The traction pater the fingerprint of any erstaline phase Powder Diffraction File (POF) eet ee Daracton Fle POF} conan ator anand ot ‘The POF cava ovr 28,00 con pats est Fea stane wth reton andr arco ta uae yt tratiorl Corr fer Dtacton Dts {1004 aay pened nt epancetro tietne Modan intranet ah ane redone by computa Powder diffraction data Coe eeemsnessasemmeet! oma arco te caro coat photon rea vrs ater aeApplications © Spacing betwen lomie planes Phase Identification : titania ie = Rutile Tetragooal e a Neel wu Teepe TA i Aine ‘igre! XRD paners of the sia pales Applications: Phase Identification » Material canbe compost of mitre of several phases » Ditraton pat for vary phases unique a Angrpint 1 Monieation of esting subtance and erystaline phases in sample ‘ered by comparing te mpl pecan with spectra of noe ‘saline substance trom Powder Bitacion Pla PDP XRD: alumina - UL ram ASLXRD: zeolit i thaalhu Peak broadening A ea Bragg trctn peak ilo without with Inraatyftacton from a cyt specimen produces peak wih catia = The prak with can rept om 1 dan flc of the epee © rumen factors sitwiath imports focusing i = mitalgnment of lractometer | Quantitative Measurement Instr pest hrc taco ncenerdenty of tcl tlie sane ina pose mse stu pace mae © cm ce ntmaon © tmenty of atacton ra ah rom a pas aie ghonby (i! Sg ction pa pps mautnctone se {ip} mmr aboron ect er = coma fr gee ese ace ‘Sgt Pete oe eine Size effect CO TR SER ee ree eereerererenreeal Small crystals cause te peak to be widened dv to incompealy destructive Ineterence yng the Bragg © masacemae,hoert te neler ey ba a pee, ote veo 108, ‘hie dena slg om 8p i 6, and should not generate complatalyeg Sep winner an proce wet ‘vanaf proouce» corti ove af arson maneles wound te Vth pecrom and rsa isnng oe Soracton pe Determination of average crystallite size 7c mental broadaning analysis: Scherr formula Seharafommai assumes tha rosdenng of iraction peaks of alte manly depends on the characte of eyalies se ‘According to Scherer of rstalita sis, an be datomined by Peak wid rveraay ret to cysts nats peak with increases ‘wih decrening crete peril se Spacing between atomic planes of a crystal SS oon ang ara ies rac Fram Brags Law nh = 2 an 8 conning 2 site = Sat pee) w4e +r)Reference : ——— Lag, Matas chactatorodetn wo mlsasepe and pcos = shod Joba Wey sre, fee = Sam Zhang. iL toe Kama ature Caracreton Tachlgne, CRE Pras Wi Tehncl ratios aval by varius XROmanaacrs oa rch, Sag) spacing ss pat toner ein spac