Intel Pentium D Processor 900 Sequence and Intel Pentium Processor Extreme Edition 955, 965
Intel Pentium D Processor 900 Sequence and Intel Pentium Processor Extreme Edition 955, 965
January 2007
2 Datasheet
ContentsContents
1 Introduction ............................................................................................................ 11
1.1 Terminology ..................................................................................................... 12
1.1.1 Processor Packaging Terminology ............................................................. 12
1.2 References ....................................................................................................... 13
2 Electrical Specifications ........................................................................................... 15
2.1 Power and Ground Lands.................................................................................... 15
2.2 Decoupling Guidelines ........................................................................................ 15
2.2.1 VCC Decoupling ...................................................................................... 15
2.2.2 VTT Decoupling ...................................................................................... 15
2.2.3 FSB Decoupling...................................................................................... 16
2.3 Voltage Identification ......................................................................................... 16
2.4 Reserved, Unused, and TESTHI Signals ................................................................ 18
2.5 Voltage and Current Specification ........................................................................ 19
2.5.1 Absolute Maximum and Minimum Ratings .................................................. 19
2.5.2 DC Voltage and Current Specification ........................................................ 20
2.5.3 VCC Overshoot ...................................................................................... 24
2.5.4 Die Voltage Validation ............................................................................. 25
2.6 Signaling Specifications...................................................................................... 25
2.6.1 FSB Signal Groups.................................................................................. 26
2.6.2 GTL+ Asynchronous Signals..................................................................... 28
2.6.3 Processor DC Specifications ..................................................................... 28
2.6.3.1 GTL+ Front Side Bus Specifications ............................................. 31
2.7 Clock Specifications ........................................................................................... 32
2.7.1 Front Side Bus Clock (BCLK[1:0]) and Processor Clocking ............................ 32
2.7.2 FSB Frequency Select Signals (BSEL[2:0])................................................. 32
2.7.3 Phase Lock Loop (PLL) and Filter .............................................................. 33
2.7.4 BCLK[1:0] Specifications ......................................................................... 35
3 Package Mechanical Specifications .......................................................................... 37
3.1 Package Mechanical Drawing............................................................................... 37
3.2 Processor Component Keep-Out Zones ................................................................. 41
3.3 Package Loading Specifications ........................................................................... 41
3.4 Package Handling Guidelines............................................................................... 41
3.5 Package Insertion Specifications.......................................................................... 41
3.6 Processor Mass Specification ............................................................................... 42
3.7 Processor Materials............................................................................................ 42
3.8 Processor Markings............................................................................................ 42
3.9 Processor Land Coordinates ................................................................................ 43
4 Land Listing and Signal Descriptions ....................................................................... 45
4.1 Processor Land Assignments ............................................................................... 45
4.2 Alphabetical Signals Reference ............................................................................ 70
5 Thermal Specifications and Design Considerations .................................................. 81
5.1 Processor Thermal Specifications ......................................................................... 81
5.1.1 Thermal Specifications ............................................................................ 81
5.1.2 Thermal Metrology ................................................................................. 85
5.2 Processor Thermal Features ................................................................................ 85
5.2.1 Thermal Monitor..................................................................................... 85
5.2.2 On-Demand Mode .................................................................................. 86
5.2.3 PROCHOT# Signal .................................................................................. 86
5.2.4 FORCEPR# Signal................................................................................... 87
Datasheet 3
5.2.5 THERMTRIP# Signal ................................................................................88
5.2.6 TCONTROL and Fan Speed Reduction ...........................................................88
5.2.7 Thermal Diode........................................................................................88
6 Features ..................................................................................................................91
6.1 Power-On Configuration Options ..........................................................................91
6.2 Clock Control and Low Power States .....................................................................91
6.2.1 Normal State .........................................................................................92
6.2.2 HALT and Enhanced HALT Powerdown States..............................................92
6.2.2.1 HALT Powerdown State ..............................................................92
6.2.2.2 Enhanced HALT Powerdown State................................................93
6.2.3 Stop Grant State ....................................................................................93
6.2.4 Enhanced HALT Snoop or HALT Snoop State,
Stop Grant Snoop State...........................................................................94
6.2.4.1 HALT Snoop State, Stop Grant Snoop State ..................................94
6.2.4.2 Enhanced HALT Snoop State .......................................................94
6.2.5 Enhanced Intel® SpeedStep® Technology ..................................................94
7 Boxed Processor Specifications................................................................................95
7.1 Mechanical Specifications ....................................................................................95
7.1.1 Boxed Processor Cooling Solution Dimensions.............................................95
7.1.2 Boxed Processor Fan Heatsink Weight .......................................................97
7.1.3 Boxed Processor Retention Mechanism and Heatsink
Attach Clip Assembly...............................................................................97
7.2 Electrical Requirements ......................................................................................97
7.2.1 Fan Heatsink Power Supply ......................................................................97
7.3 Thermal Specifications........................................................................................99
7.3.1 Boxed Processor Cooling Requirements......................................................99
8 Balanced Technology Extended (BTX) Boxed Processor Specifications ................... 101
8.1 Mechanical Specifications .................................................................................. 102
8.1.1 Balanced Technology Extended (BTX) Type I and Type II Boxed Processor
Cooling Solution Dimensions .................................................................. 102
8.1.2 Boxed Processor Thermal Module Assembly Weight ................................... 104
8.1.3 Boxed Processor Support and Retention Module (SRM) .............................. 104
8.2 Electrical Requirements .................................................................................... 105
8.2.1 Thermal Module Assembly Power Supply .................................................. 105
8.3 Thermal Specifications...................................................................................... 107
8.3.1 Boxed Processor Cooling Requirements.................................................... 107
8.3.2 Variable Speed Fan ............................................................................... 108
9 Debug Tools Specifications .................................................................................... 111
9.1 Logic Analyzer Interface (LAI) ........................................................................... 111
9.1.1 Mechanical Considerations ..................................................................... 111
9.1.2 Electrical Considerations ........................................................................ 111
4 Datasheet
Figures
1 VCC Static and Transient Tolerance for 775_VR_CONFIG_05A (Mainstream) and
775_VR_CONFIG_05B (Performance) Processors .......................................................... 24
2 VCC Overshoot Example Waveform ............................................................................. 25
3 Phase Lock Loop (PLL) Filter Requirements .................................................................. 34
4 Processor Package Assembly Sketch ........................................................................... 37
5 Processor Package Drawing Sheet 1 of 3 ..................................................................... 38
6 Processor Package Drawing Sheet 2 of 3 ..................................................................... 39
7 Processor Package Drawing Sheet 3 of 3 ..................................................................... 40
8 Processor Top-Side Markings Example (Intel® Pentium® D Processor 900 Sequence) ........ 42
9 Processor Top-Side Markings Example (Intel® Pentium® Processor Extreme Edition 955,
965)....................................................................................................................... 43
10 Processor Land Coordinates and Quadrants (Top View) ................................................. 44
11 land-out Diagram (Top View – Left Side) ..................................................................... 46
12 land-out Diagram (Top View – Right Side) ................................................................... 47
13 Thermal Profile for 775_VR_CONFIG_05B Processors (Performance) ............................... 83
14 Thermal Profile for 775_VR_CONFIG_05A Processors (Mainstream)................................. 84
15 Case Temperature (TC) Measurement Location ............................................................ 85
16 Processor Low Power State Machine ........................................................................... 92
17 Mechanical Representation of the Boxed Processor ....................................................... 95
18 Space Requirements for the Boxed Processor (Side View: applies to all four side views) .... 96
19 Space Requirements for the Boxed Processor (Top View)............................................... 96
20 Space Requirements for the Boxed Processor (Overall View) .......................................... 97
21 Boxed Processor Fan Heatsink Power Cable Connector Description .................................. 98
22 Baseboard Power Header Placement Relative to Processor Socket ................................... 99
23 Boxed Processor Fan Heatsink Airspace Keep-out Requirements
(Side 1 View) ........................................................................................................ 100
24 Boxed Processor Fan Heatsink Airspace Keep-out Requirements
(Side 2 View) ........................................................................................................ 100
25 Mechanical Representation of the Boxed Processor with a Type I TMA ........................... 101
26 Mechanical Representation of the Boxed Processor with a Type II TMA .......................... 102
27 Requirements for the Balanced Technology Extended (BTX) Type I Keep-out Volumes ..... 103
28 Requirements for the Balanced Technology Extended (BTX) Type II Keep-out Volume ..... 104
29 Assembly Stack Including the Support and Retention Module ....................................... 105
30 Boxed Processor TMA Power Cable Connector Description ............................................ 106
31 Balanced Technology Extended (BTX) Mainboard Power Header Placement
(Hatched Area) ...................................................................................................... 107
32 Boxed Processor TMA Set Points............................................................................... 108
Datasheet 5
Tables
1 References ..............................................................................................................13
2 Voltage Identification Definition ..................................................................................17
3 Absolute Maximum and Minimum Ratings ....................................................................19
4 Voltage and Current Specifications..............................................................................20
5 VCC Static and Transient Tolerance for 775_VR_CONFIG_05A (Mainstream) and
775_VR_CONFIG_05B (Performance) Processors ..........................................................23
6 VCC Overshoot Specifications......................................................................................24
7 FSB Signal Groups ....................................................................................................26
8 Signal Characteristics................................................................................................27
9 Signal Reference Voltages .........................................................................................27
10 GTL+ Signal Group DC Specifications ..........................................................................28
11 GTL+ Asynchronous Signal Group DC Specifications ......................................................29
12 TAP Signal Group DC Specifications.............................................................................29
13 VTTPWRGD DC Specifications .....................................................................................30
14 BSEL[2:0] and VID[5:0] DC Specifications ...................................................................30
15 MSID [1,0] and BOOTSELECT DC Specifications............................................................30
16 GTL+ Bus Voltage Definitions .....................................................................................31
17 Core Frequency to FSB Multiplier Configuration.............................................................32
18 BSEL[2:0] Frequency Table for BCLK[1:0] ...................................................................33
19 Front Side Bus Differential BCLK Specifications .............................................................35
20 Processor Loading Specifications.................................................................................41
21 Package Handling Guidelines......................................................................................41
22 Processor Materials ...................................................................................................42
23 Alphabetical Land Assignments...................................................................................48
24 Numerical Land Assignment .......................................................................................59
25 Signal Description (Sheet 1 of 9) ................................................................................70
26 Processor Thermal Specifications ................................................................................82
27 Thermal Profile for 775_VR_CONFIG_05B Processors (Performance)................................83
28 Thermal Profile for 775_VR_CONFIG_05A Processors (Mainstream) .................................84
29 Thermal “Diode” Parameters using Diode Model ............................................................88
30 Thermal “Diode” Parameters using Transistor Model ......................................................89
31 Thermal “Diode” ntrim and Diode_Correction_Offset.......................................................90
32 Thermal Diode Interface ............................................................................................90
33 Power-On Configuration Option Signals .......................................................................91
34 Fan Heatsink Power and Signal Specifications ...............................................................98
35 TMA Power and Signal Specifications ......................................................................... 106
36 TMA Set Points for 3-wire operation of BTX Type I and Type II Boxed Processors ............ 109
6 Datasheet
Revision HistoryRevision History
Revision
Description Date
Number
-002 • Added specifications for Intel Pentium D processors 950, 940, 930, and 920 January 2006
-004 • Added specifications for Intel Pentium D processor 960 May 2006
-006 • Added specifications for Intel Pentium D processors 925 September 2006
-007 • Added specifications for Intel Pentium D processors 935 January 2007
§§
Datasheet 7
8 Datasheet
Intel® Pentium® D Processor 900 Sequence and Intel®
Pentium® Processor Extreme Edition 955, 965 Features
• Available at 3.46 GHz and 3.73 GHz (Intel • Enhanced branch prediction
Pentium processor Extreme Edition 955, 965
• Optimized for 32-bit applications running on
only)
advanced 32-bit operating systems
• Available at 3.60 GHz, 3.40 GHz, 3.20 GHz,
• Two 16-KB Level 1 data caches
3 GHz, and 2.80 GHz (Intel Pentium D
processor 900 sequence only) • Two 2 MB Advanced Transfer Caches (on-die,
® full-speed Level 2 (L2) cache) with 8-way
• Enhanced Intel Speedstep Technology
associativity and Error Correcting Code
(Intel Pentium D processor 900 sequence
(ECC)
only)
• 144 Streaming SIMD Extensions 2 (SSE2)
• Supports Intel® 64Φ architecture
instructions
• Supports Intel® Virtualization Technology
• 13 Streaming SIMD Extensions 3 (SSE3)
(Not on Pentium D processors 945, 925, and
instructions
915)
• Enhanced floating point and multimedia unit
• Supports Execute Disable Bit capability
for enhanced video, audio, encryption, and
• Binary compatible with applications running 3D performance
on previous members of the Intel
• Power Management capabilities
microprocessor line
• System Management mode
• Intel NetBurst® microarchitecture
• FSB frequency at 800 MHz (Pentium D • Multiple low-power states
processor 900 sequence only) • 8-way cache associativity provides improved
• FSB frequency at 1066 MHz (Pentium cache hit rate on load/store operations
processor Extreme Edition 955, 965 only) • 775-land Package
• Hyper-Pipelined Technology
• Advance Dynamic Execution
• Very deep out-of-order execution
The Intel® Pentium® D processor 900 sequence and Intel® Pentium® processor Extreme Edition 955,
965 deliver Intel's advanced, powerful processors for desktop PCs that are based on the Intel
NetBurst® microarchitecture. The processor is designed to deliver performance across applications
and usages where end-users can truly appreciate and experience the performance. These applications
include Internet audio and streaming video, image processing, video content creation, speech, 3D,
CAD, games, multimedia, and multitasking user environments.
Intel® 64Φ architecture enables the processor to execute operating systems and applications written
to take advantage of the Intel® 64 architecture. The processor supporting Enhanced Intel
Speedstep® technology allows tradeoffs to be made between performance and power consumption.
The Pentium D processor 900 sequence and Pentium processor Extreme Edition 955, 965 also include
the Execute Disable Bit capability. This feature, combined with a supported operating system, allows
memory to be marked as executable or non-executable.
The Pentium D processors 960, 950, 940, 930, and 920 and Pentium processor Extreme Edition 955,
965 support Intel® Virtualization Technology. Virtualization Technology provides silicon-based
functionality that works together with compatible Virtual Machine Monitor (VMM) software to improve
on software-only solutions.
§§
Datasheet 9
10 Datasheet
Introduction
1 Introduction
The Intel® Pentium® D processor 900 sequence and Intel® Pentium® processor
Extreme Edition 955, 965 are Intel’s first desktop dual-core products on the 65 nm
process. The processors use Flip-Chip Land Grid Array (FC-LGA6) package technology,
and plug into the LGA775 socket. The Pentium D processor 900 sequence and Pentium
processor Extreme Edition 955, 965, like the Intel® Pentium® D processor on 90 nm
process in the 775-land LGA package, use the Intel NetBurst® microarchitecture and
maintains the tradition of compatibly with IA-32 software.
Note: In this document, unless otherwise specified, the Intel® Pentium® D processor 900
sequence refers to Intel Pentium D processors 960, 950, 945, 940, 935, 930, 925, 920,
and 915.
Note: In this document the Intel Pentium D processor 900 sequence on 65 nm process in the
775-land LGA package and the Intel Pentium processor Extreme Edition 955, 965 on
65 nm process in the 775-land LGA package are referred to simply as “processor.”
The processor functions as two physical processors in one package. This allows a
duplication of execution resources to provide increased system responsiveness in
multitasking environments, and headroom for next generation multithreaded
applications and new usages.
The processor supports all the existing Streaming SIMD Extensions 2 (SSE2) and
Streaming SIMD Extensions 3 (SSE3). Streaming SIMD Extensions 3 (SSE3) are 13
additional instructions that further extend the capabilities of Intel processor technology.
These new instructions enhance the performance of optimized applications for the
digital home such as video, image processing, and media compression technology.
The processor’s Intel NetBurst® microarchitecture front side bus (FSB) uses a split-
transaction, deferred reply protocol like the Intel® Pentium® 4 processor. The Intel
NetBurst microarchitecture FSB uses Source-Synchronous Transfer (SST) of address
and data to improve performance by transferring data four times per bus clock (4X
data transfer rate, as in AGP 4X). Along with the 4X data bus, the address bus can
deliver addresses two times per bus clock and is referred to as a “double-clocked” or 2X
address bus. Working together, the 4X data bus and 2X address bus provide a data bus
bandwidth of up to 6.4 GB/s (800 MHz FSB) or 8.5 GB/s (1066 MHz FSB).
Intel will enable support components for the processor including heatsink, heatsink
retention mechanism, and socket. Manufacturability is a high priority; hence,
mechanical assembly may be completed from the top of the baseboard and should not
require any special tooling.
The processor also includes the Execute Disable Bit capability. This feature, combined
with a supported operating system, allows memory to be marked as executable or non-
executable. If code attempts to run in non-executable memory the processor raises an
error to the operating system. This feature can prevent some classes of viruses or
worms that exploit buffer over run vulnerabilities and can thus help improve the overall
security of the system. See the Intel® Architecture Software Developer's Manual for
more detailed information.
Datasheet 11
Introduction
The Intel Pentium D processor 900 sequence supports Enhanced Intel® SpeedStep®
technology that allows trade-offs to be made between performance and power
consumptions. This may lower average power consumption (in conjunction with OS
support).
The Pentium D processors 960, 950, 940, 930, and 920, and the Pentium processor
Extreme Edition 955, 965 support Intel® Virtualization Technology. Intel Virtualization
Technology provides silicon-based functionality that works together with compatible
Virtual Machine Monitor (VMM) software to improve upon software-only solutions.
Because this virtualization hardware provides a new architecture upon which the
operating system can run directly, it removes the need for binary translation. Thus, it
helps eliminate associated performance overhead and vastly simplifies the design of
the VMM, in turn allowing VMMs to be written to common standards and to be more
robust. See the Intel® Virtualization Technology Specification for the IA-32 Intel®
Architecture for more details.
The processor includes an address bus powerdown capability which removes power
from the address and data signals when the FSB is not in use. This feature is always
enabled on the processor.
1.1 Terminology
A ‘#’ symbol after a signal name refers to an active low signal, indicating a signal is in
the active state when driven to a low level. For example, when RESET# is low, a reset
has been requested. Conversely, when NMI is high, a nonmaskable interrupt has
occurred. In the case of signals where the name does not imply an active state but
describes part of a binary sequence (such as address or data), the ‘#’ symbol implies
that the signal is inverted. For example, D[3:0] = ‘HLHL’ refers to a hex ‘A’, and
D[3:0]# = ‘LHLH’ also refers to a hex ‘A’ (H= High logic level, L= Low logic level).
Front Side Bus” refers to the interface between the processor and system core logic
(a.k.a. the chipset components). The FSB is a multiprocessing interface to processors,
memory, and I/O.
1. Total accessible size of L2 caches may vary by one cache line pair (128 bytes), depending on
usage and operating environment.
12 Datasheet
Introduction
• Intel® 975X Express chipset — Chipset that supports DDR2 memory technology
for the processor.
• Processor core — Processor core die with integrated L2 cache.
• LGA775 socket — The processor mates with the system board through a surface
mount, 775-land, LGA socket.
• Integrated heat spreader (IHS) —A component of the processor package used
to enhance the thermal performance of the package. Component thermal solutions
interface with the processor at the IHS surface.
• Retention mechanism (RM) — Since the LGA775 socket does not include any
mechanical features for heatsink attach, a retention mechanism is required.
Component thermal solutions should attach to the processor via a retention
mechanism that is independent of the socket.
• FSB (Front Side Bus) — The electrical interface that connects the processor to
the chipset. Also referred to as the processor system bus or the system bus. All
memory and I/O transactions as well as interrupt messages pass between the
processor and chipset over the FSB.
• Storage conditions — Refers to a non-operational state. The processor may be
installed in a platform, in a tray, or loose. Processors may be sealed in packaging or
exposed to free air. Under these conditions, processor lands should not be
connected to any supply voltages, have any I/Os biased, or receive any clocks.
Upon exposure to “free air”(i.e., unsealed packaging or a device removed from
packaging material), the processor must be handled in accordance with moisture
sensitivity labeling (MSL) as indicated on the packaging material.
• Functional operation — Refers to normal operating conditions in which all
processor specifications, including DC, AC, system bus, signal quality, mechanical
and thermal are satisfied.
1.2 References
Material and concepts available in the following documents may be beneficial when
reading this document.
Table 1. References
Document Location
http://www.intel.com/
Intel® Pentium® D Processor 900 Sequence and Intel® Pentium®
design/pentiumXE/
Processor Extreme Edition 955, 965 Specification Update
specupdt/310307.htm
Intel® Pentium® D Processor, Intel® Pentium® Processor Extreme http://www.intel.com/
Edition, and Intel® Pentium® 4 Processor Thermal and Mechanical design/pentiumXE/
Design Guidelines designex/306830.htm
http://intel.com/design/
Voltage Regulator-Down (VRD) 10.1 Design Guide For Desktop and
Pentium4/guides/
Transportable LGA775 Socket
302356.htm
http://www.intel.com/
Intel® Virtualization Technology Specification for the IA-32 Intel®
technology/computing/
Architecture
vptech/index.htm
http://intel.com/design/
LGA775 Socket Mechanical Design Guide Pentium4/guides/
302666.htm
Balanced Technology Extended (BTX) System Design Guide www.formfactors.org
Datasheet 13
Introduction
Table 1. References
Document Location
§§
14 Datasheet
Electrical Specifications
2 Electrical Specifications
This chapter describes the electrical characteristics of the processor interfaces and
signals. DC electrical characteristics are provided.
Twenty-four (24) signals are denoted as VTT that provide termination for the front side
bus and power to the I/O buffers. A separate supply must be implemented for these
lands, that meets the VTT specifications outlined in Table 4.
Datasheet 15
Electrical Specifications
Individual processor VID values may be calibrated during manufacturing such that two
devices at the same core speed may have different default VID settings. This is
reflected by the VID Range values provided in Table 4. Refer to the Intel® Pentium® D
Processor 900 Sequence and Intel® Pentium® Processor Extreme Edition 955, 965
Specification Update for further details on specific valid core frequency and VID values
of the processor. Note that this differs from the VID employed by the processor during
a power management event (Enhanced Intel SpeedStep® technology or Enhanced
HALT State).
The processor provides the ability to operate while transitioning to an adjacent VID and
its associated processor core voltage (VCC). This will represent a DC shift in the load
line. It should be noted that a low-to-high or high-to-low voltage state change may
result in as many VID transitions as necessary to reach the target core voltage.
Transitions above the specified VID are not permitted. Table 4 includes VID step sizes
and DC shift ranges. Minimum and maximum voltages must be maintained as shown in
Table 5 and Figure 1 as measured across the VCC_SENSE and VSS_SENSE lands.
The VRM or VRD used must be capable of regulating its output to the value defined by
the new VID. DC specifications for dynamic VID transitions are included in Table 4 and
Table 5. Refer to the Voltage Regulator-Down (VRD) 10.1 Design Guide For Desktop
and Transportable LGA775 Socket for further details.
16 Datasheet
Electrical Specifications
VID5 VID4 VID3 VID2 VID1 VID0 VID VID5 VID4 VID3 VID2 VID1 VID0 VID
0 0 1 0 1 0 0.8375 0 1 1 0 1 0 1.2125
1 0 1 0 0 1 0.8500 1 1 1 0 0 1 1.2250
0 0 1 0 0 1 0.8625 0 1 1 0 0 1 1.2375
1 0 1 0 0 0 0.8750 1 1 1 0 0 0 1.2500
0 0 1 0 0 0 0.8875 0 1 1 0 0 0 1.2625
1 0 0 1 1 1 0.9000 1 1 0 1 1 1 1.2750
0 0 0 1 1 1 0.9125 0 1 0 1 1 1 1.2875
1 0 0 1 1 0 0.9250 1 1 0 1 1 0 1.3000
0 0 0 1 1 0 0.9375 0 1 0 1 1 0 1.3125
1 0 0 1 0 1 0.9500 1 1 0 1 0 1 1.3250
0 0 0 1 0 1 0.9625 0 1 0 1 0 1 1.3375
1 0 0 1 0 0 0.9750 1 1 0 1 0 0 1.3500
0 0 0 1 0 0 0.9875 0 1 0 1 0 0 1.3625
1 0 0 0 1 1 1.0000 1 1 0 0 1 1 1.3750
0 0 0 0 1 1 1.0125 0 1 0 0 1 1 1.3875
1 0 0 0 1 0 1.0250 1 1 0 0 1 0 1.4000
0 0 0 0 1 0 1.0375 0 1 0 0 1 0 1.4125
1 0 0 0 0 1 1.0500 1 1 0 0 0 1 1.4250
0 0 0 0 0 1 1.0625 0 1 0 0 0 1 1.4375
1 0 0 0 0 0 1.0750 1 1 0 0 0 0 1.4500
0 0 0 0 0 0 1.0875 0 1 0 0 0 0 1.4625
1 1 1 1 1 1 VR output off 1 0 1 1 1 1 1.4750
0 1 1 1 1 1 VR output off 0 0 1 1 1 1 1.4875
1 1 1 1 1 0 1.1000 1 0 1 1 1 0 1.5000
0 1 1 1 1 0 1.1125 0 0 1 1 1 0 1.5125
1 1 1 1 0 1 1.1250 1 0 1 1 0 1 1.5250
0 1 1 1 0 1 1.1375 0 0 1 1 0 1 1.5375
1 1 1 1 0 0 1.1500 1 0 1 1 0 0 1.5500
0 1 1 1 0 0 1.1625 0 0 1 1 0 0 1.5625
1 1 1 0 1 1 1.1750 1 0 1 0 1 1 1.5750
0 1 1 0 1 1 1.1875 0 0 1 0 1 1 1.5875
1 1 1 0 1 0 1.2000 1 0 1 0 1 0 1.6000
Datasheet 17
Electrical Specifications
In a system level design, on-die termination has been included by the processor to
allow signals to be terminated within the processor silicon. Most unused GTL+ inputs
should be left as no connects as GTL+ termination is provided on the processor silicon.
However, see Table 7 for details on GTL+ signals that do not include on-die termination.
Unused active high inputs, should be connected through a resistor to ground (VSS).
Unused outputs can be left unconnected; however, this may interfere with some TAP
functions, complicate debug probing, and prevent boundary scan testing. A resistor
must be used when tying bidirectional signals to power or ground. When tying any
signal to power or ground, a resistor will also allow for system testability. Resistor
values should be within ± 20% of the impedance of the motherboard trace for front
side bus signals. For unused GTL+ input or I/O signals, use pull-up resistors of the
same value as the on-die termination resistors (RTT). For details see Table 16.
TAP, GTL+ Asynchronous inputs, and GTL+ Asynchronous outputs do not include on-die
termination. Inputs and utilized outputs must be terminated on the motherboard.
Unused outputs may be terminated on the motherboard or left unconnected. Note that
leaving unused outputs unterminated may interfere with some TAP functions,
complicate debug probing, and prevent boundary scan testing.
All TESTHI[13:0] lands should be individually connected to VTT via a pull-up resistor
that matches the nominal trace impedance.
The TESTHI signals may use individual pull-up resistors or be grouped together as
detailed below. A matched resistor must be used for each group:
• TESTHI[1:0]
• TESTHI[7:2]
• TESTHI8 – cannot be grouped with other TESTHI signals
• TESTHI9 – cannot be grouped with other TESTHI signals
• TESTHI10 – cannot be grouped with other TESTHI signals
• TESTHI11 – cannot be grouped with other TESTHI signals
• TESTHI12 – cannot be grouped with other TESTHI signals
• TESTHI13 – cannot be grouped with other TESTHI signals
However, using boundary scan test will not be functional if these lands are connected
together. For optimum noise margin, all pull-up resistor values used for TESTHI[13:0]
lands should have a resistance value within ± 20% of the impedance of the board
transmission line traces. For example, if the nominal trace impedance is 50 Ω, then a
value between 40 Ω and 60 Ω should be used.
18 Datasheet
Electrical Specifications
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields.
Datasheet 19
Electrical Specifications
3
VID Range VID 1.200 - 1.3375 V
Processor number VCC for 775_VR_CONFIG_05B
(Performance)
20 Datasheet
Electrical Specifications
Datasheet 21
Electrical Specifications
22 Datasheet
Electrical Specifications
15. This is maximum total current drawn from VTT plane by only the processor. This specification does not include the
current coming from RTT (through the signal line). Refer to the Voltage Regulator-Down (VRD) 10.1 Design Guide For
Desktop and Transportable LGA775 Socket to determine the total ITT drawn by the system.
16.This is a steady-state ITT current specification, which is applicable when both VTT and VCC are high.
17.This is a power-up peak current specification, which is applicable when VTT is high and VCC is low.
Datasheet 23
Electrical Specifications
Icc [A]
0 10 20 30 40 50 60 70 80 90 100 110 120
VID - 0.000
VID - 0.019
VID - 0.057
VID - 0.076
VID - 0.095
Vcc [V]
Vcc Typical
VID - 0.114
VID - 0.133
Vcc Minimum
VID - 0.152
VID - 0.171
VID - 0.190
VID - 0.209
VID - 0.228
NOTES:
1. The loadline specification includes both static and transient limits except for overshoot
allowed as shown in Section 2.5.3.
2. This loadline specification shows the deviation from the VID set point.
3. The loadlines specify voltage limits at the die measured at the VCC_SENSE and
VSS_SENSE lands. Voltage regulation feedback for voltage regulator circuits must be taken
from processor VCC and VSS lands. Refer to the Voltage Regulator-Down (VRD) 10.1
Design Guide For Desktop and Transportable LGA775 Socket for socket loadline guidelines
and VR implementation details.
24 Datasheet
Electrical Specifications
VID + 0.050 V OS
T OS
Tim e
T O S : O vershoot tim e above VID
V O S : O vershoot above VID
NOTES:
1. VOS is measured overshoot voltage.
2. TOS is measured time duration above VID.
The GTL+ inputs require a reference voltage (GTLREF) that is used by the receivers to
determine if a signal is a logical 0 or a logical 1. GTLREF must be generated on the
motherboard (see Table 16 for GTLREF specifications). Termination resistors (RTT) for
GTL+ signals are provided on the processor silicon and are terminated to VTT. Intel
chipsets will also provide on-die termination, thus eliminating the need to terminate the
bus on the motherboard for most GTL+ signals.
Datasheet 25
Electrical Specifications
With the implementation of a source synchronous data bus comes the need to specify
two sets of timing parameters. One set is for common clock signals which are
dependent upon the rising edge of BCLK0 (ADS#, HIT#, HITM#, etc.) and the second
set is for the source synchronous signals which are relative to their respective strobe
lines (data and address) as well as the rising edge of BCLK0. Asychronous signals are
still present (A20M#, IGNNE#, etc.) and can become active at any time during the
clock cycle. Table 7 identifies which signals are common clock, source synchronous,
and asynchronous.
Synchronous to
GTL+ Strobes ADSTB[1:0]#, DSTBP[3:0]#, DSTBN[3:0]#
BCLK[1:0]
GTL+ Asynchronous A20M#, FORCEPR#, IGNNE#, INIT#, LINT0/INTR,
Input LINT1/NMI, SMI#, STPCLK#, PWRGOOD
GTL+ Asynchronous
FERR#/PBE#, IERR#, THERMTRIP#
Output
GTL+ Asynchronous
PROCHOT#
Input/Output
Synchronous to
TAP Input TCK, TDI, TMS, TRST#
TCK
26 Datasheet
Electrical Specifications
Synchronous to
TAP Output TDO
TCK
FSB Clock Clock BCLK[1:0], ITP_CLK[1:0]2
VCC, VTT, VCCA, VCCIOPLL, VID[5:0], VSS, VSSA,
GTLREF[1:0], COMP[7:6,5:4,3:2,1:0], RESERVED,
TESTHI[13:0], THERMDA, THERMDC, VCC_SENSE,
VCC_MB_REGULATION, VSS_SENSE,
Power/Other
VSS_MB_REGULATION, BSEL[2:0], SKTOCC#, DBR#2,
VTTPWRGD, BOOTSELECT, VTT_OUT_LEFT,
VTT_OUT_RIGHT, VTT_SEL, LL_ID[1:0], MSID[1:0],
FCx, IMPSEL
NOTES:
1. Refer to Section 4.2 for signal descriptions.
2. In processor systems where no debug port is implemented on the system board, these
signals are used to support a debug port interposer. In systems with the debug port
implemented on the system board, these signals are no connects.
3. The value of these signals during the active-to-inactive edge of RESET# defines the
processor configuration options. See Section 6.1 for details.
.
GTLREF VTT/2
Datasheet 27
Electrical Specifications
28 Datasheet
Electrical Specifications
VTT/ 8
IOL Output Low Current — A
[(0.50*RTT_MIN)+(RON_MIN)]
9
ILI Input Leakage Current N/A ± 200 µA
Output Leakage 10
ILO N/A ± 200 µA
Current
RON Buffer On Resistance 6 12 W
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. VIL is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.
3. LINT0/INTR and LINT1/NMI use GTLREF as a reference voltage. For these two signals VIH = GTLREF + (0.10 * VTT) and
VIL= GTLREF – (0.10 * VTT).
4. VIH is defined as the voltage range at a receiving agent that will be interpreted as a logical high value.
5. VIH and VOH may experience excursions above VTT. However, input signal drivers must comply with the signal quality
specifications.
6. The VTT referred to in these specifications refers to instantaneous VTT.
7. All outputs are open drain.
8. The maximum output current is based on maximum current handling capability of the buffer and is not specified into
the test load.
9. Leakage to VSS with land held at VTT.
10.Leakage to VTT with land held at 300 mV.
.
3, 4
VHYS Input Hysteresis 120 396 mV
PWRGOOD Input low-
0.5 * (VTT + VHYS_MIN 0.5 * (VTT + VHYS_MAX 5, 6
to-high threshold V
+ 0.24) + 0.24)
VT+ voltage
TAP Input low-to-high 5
0.5 * (VTT + VHYS_MIN) 0.5 * (VTT + VHYS_MAX) V
threshold voltage
PWRGOOD Input high- 5
0.4 * VTT 0.6 * VTT V
to-low threshold voltage
VT-
TAP Input high-to-low 5
0.5 * (VTT – VHYS_MAX) 0.5 * (VTT – VHYS_MIN) V
threshold voltage
5
VOH Output High Voltage N/A VTT V
IOL Output Low Current — 22.2 mA 7
8
ILI Input Leakage Current — ± 200 µA
3
ILO Output Leakage Current — ± 200 µA
RON Buffer On Resistance 6 12 W
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. All outputs are open drain.
3. Leakage to VTT with land held at 300 mV.
4. VHYS represents the amount of hysteresis, nominally centered about 0.5 * VTT, for all TAP inputs.
5. The VTT referred to in these specifications refers to instantaneous VTT.
6. 0.24 V is defined at 20% of nominal VTT of 1.2 V.
7. The maximum output current is based on maximum current handling capability of the buffer and is not specified into
the test load.
8. Leakage to Vss with land held at VTT.
Datasheet 29
Electrical Specifications
2,3
IOL Max Land Current 2.4 mA
IOH Output High Current 460 µA 2,3
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. These parameters are not tested and are based on design simulations.
3. IOL is measured at 0.10*VTT. IOH is measured at 0.90*VTT.
4. Refer to the appropriate platform design guide for implementation details.
30 Datasheet
Electrical Specifications
Valid high and low levels are determined by the input buffers by comparing with a
reference voltage called GTLREF. Table 16 lists the GTLREF specifications. The GTL+
reference voltage (GTLREF) should be generated on the system board using high
precision voltage divider circuits.
Table 16. GTL+ Bus Voltage Definitions
Symbol Parameter Min Typ Max Units Notes1
GTLREF_PU GTLREF pull up resistor 124 * 0.99 124 124 * 1.01 W 2
2
GTLREF_PD GTLREF pull down resistor 210 * 0.99 210 210 * 1.01 W
On die pull-up for 3
RPULLUP 500 — 5000 W
BOOTSELECT signal
60 Ω Platform Termination 4
51 60 66 W
Resistance
RTT
50 Ω Platform Termination
39 50 55 W 3
Resistance
60 Ω Platform Termination 5
59.8 60.4 61 W
COMP Resistance
COMP[7:6]
50 Ω Platform Termination 5
49.9 * 0.99 49.9 49.9 * 1.01 W
COMP Resistance
60 Ω Platform Termination 5
59.8 60.4 61 W
COMP Resistance
COMP[5:4]
50 Ω Platform Termination 5
49.9 * 0.99 49.9 49.9 * 1.01 W
COMP Resistance
60 Ω Platform Termination 5
59.8 60.4 61 W
COMP Resistance
COMP[3:2]
50 Ω Platform Termination 5
49.9 * 0.99 49.9 49.9 * 1.01 W
COMP Resistance
60 Ω Platform Termination 5
59.8 60.4 61 W
COMP Resistance
COMP[1:0]
50 Ω Platform Termination 5
49.9 * 0.99 49.9 49.9 * 1.01 W
COMP Resistance
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. GTLREF is to be generated from VTT by a voltage divider of 1% resistors (one divider for each GTLREF
land). Refer to the applicable platform design guide for additional implementation details.
3. These pull-ups are to VTT.
4. RTT is the on-die termination resistance measured at VTT/2 of the GTL+ output driver. The IMPSEL pin is used to
select a 50 Ω or 60 Ω buffer and RTT value.
5. COMP resistance must be provided on the system board with 1% resistors. COMP[3:0] resistors are to VSS.
COMP[7:4] resistors are to VTT.
Datasheet 31
Electrical Specifications
The processor uses a differential clocking implementation. For more information on the
processor clocking, contact your Intel field representative.
The Pentium D processor 900 sequence operates at 800 MHz FSB frequency (selected
by a 200 MHz BCLK[1:0] frequency). The Pentium processor Extreme Edition 955, 965
operate at 1066 MHz FSB frequency (selected by a 266 MHz BCLK[1:0] frequency).
32 Datasheet
Electrical Specifications
L L L 266 MHz
L L H RESERVED
L H H RESERVED
L H L 200 MHz
H H L RESERVED
H H H RESERVED
H L H RESERVED
H L L RESERVED
Datasheet 33
Electrical Specifications
0.2 dB
0 dB
–0.5 dB
Forbidden
Zone
Forbidden
Zone
–28 dB
–34 dB
Passband High
Frequency
Band
NOTES:
1. Diagram not to scale.
2. No specification for frequencies beyond fcore (core frequency).
3. fpeak, if existent, should be less than 0.05 MHz.
4. fcore represents the maximum core frequency supported by the platform.
34 Datasheet
Electrical Specifications
9
VTM Threshold Region VCROSS – 0.100 N/A VCROSS + 0.100 V
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Crossing voltage is defined as the instantaneous voltage value when the rising edge of BCLK0 equals the falling edge of
BCLK1.
3. The crossing point must meet the absolute and relative crossing point specifications simultaneously.
4. VHavg is the statistical average of the VH measured by the oscilloscope.
5. VHavg can be measured directly using “Vtop” on Agilent* oscilloscopes and “High” on Tektronix* oscilloscopes.
6. Overshoot is defined as the absolute value of the maximum voltage.
7. Undershoot is defined as the absolute value of the minimum voltage.
8. Ringback Margin is defined as the absolute voltage difference between the maximum Rising Edge Ringback and the
maximum Falling Edge Ringback.
9. Threshold Region is defined as a region entered around the crossing point voltage in which the differential receiver
switches. It includes input threshold hysteresis.
§§
Datasheet 35
Electrical Specifications
36 Datasheet
Package Mechanical Specifications
3 Package Mechanical
Specifications
The processor is packaged in a Flip-Chip Land Grid Array (FC-LGA6) package that
interfaces with the motherboard via an LGA775 socket. The package consists of a
processor core mounted on a substrate land-carrier. An integrated heat spreader (IHS)
is attached to the package substrate and core and serves as the mating surface for
processor component thermal solutions, such as a heatsink. Figure 4 shows a sketch of
the processor package components and how they are assembled together. Refer to the
LGA775 Socket Mechanical Design Guide for complete details on the LGA775 socket.
Capacitors
LGA775 Socket
System Board
NOTE:
1. Socket and motherboard are included for reference and are not part of processor package.
Datasheet 37
Package Mechanical Specifications
38 Datasheet
Package Mechanical Specifications
Datasheet 39
Package Mechanical Specifications
40 Datasheet
Package Mechanical Specifications
2, 4
Torque 3.95 N-m [35 lbf-in]
NOTES:
1. A shear load is defined as a load applied to the IHS in a direction parallel to the IHS top surface.
2. These guidelines are based on limited testing for design characterization.
3. A tensile load is defined as a pulling load applied to the IHS in a direction normal to the IHS surface.
4. A torque load is defined as a twisting load applied to the IHS in an axis of rotation normal to the IHS top
surface.
Datasheet 41
Package Mechanical Specifications
Component Material
Brand
Processor Number/ S-Spec/
Country of Assy
INTEL M ©'05
Frequency/L2 Cache/Bus/ PENTIUM® D
775_VR_CONFIG_05x 960 SLxxx [COO]
FPO 3.60GHZ/4M/800/05B
[FPO] e4
Pb-free 2LI Symbol Unique Unit
Identifier
2-D Matrix Mark ATPO Serial #
ATPO
S/N
42 Datasheet
Package Mechanical Specifications
Brand
Processor Number/ S-Spec/
Country of Assy INTEL m © ‘05
Frequency/L2 Cache/Bus/ XXXXXXXX
775_VR_CONFIG_05x 965 SLxxx [COO]
3.73GHZ/4M/1066/05B
FPO
[FPO] e4
Datasheet 43
Package Mechanical Specifications
VCC/VSS
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
AN AN
AM AM
AL AL
AK AK
AJ AJ
AH AH
AG AG
AF AF
AE AE
AD AD
AC AC
AB AB
Address/
AA AA Common Clock
Y
Socket 775 Quadrants
Y Async
W W
V
U
Top View V
U
T T
R R
P P
N N
M M
L L
K K
J J
H H
G G
F F
E E
D D
C C
B B
A A
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
§§
44 Datasheet
Land Listing and Signal Descriptions
Datasheet 45
Land Listing and Signal Descriptions
AN
VCC VCC VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AM VCC VCC VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AL VCC VCC VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AK VSS VSS VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AJ VSS VSS VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AH VCC VCC VCC VCC VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AG VCC VCC VCC VCC VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AF VSS VSS VSS VSS VSS VSS VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AE VSS VSS VSS VSS VSS VSS VSS VCC VCC VCC VSS VCC VCC VSS VSS VCC
J
VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC DP3# DP0# VCC
H
BSEL1 FC15 VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS DP2# DP1#
G BSEL2 BSEL0 BCLK1 TESTHI4 TESTHI5 TESTHI3 TESTHI6 RESET# D47# D44# DSTBN2# DSTBP2# D35# D36# D32# D31#
F RSVD BCLK0 VTT_SEL TESTHI0 TESTHI2 TESTHI7 RSVD VSS D43# D41# VSS D38# D37# VSS D30#
E VSS VSS VSS VSS VSS FC10 RSVD D45# D42# VSS D40# D39# VSS D34# D33#
D VTT VTT VTT VTT VTT VTT VSS F9 D46# VSS D48# DBI2# VSS D49# RSVD VSS
VCCIO
C VTT VTT VTT VTT VTT VTT VSS VSS D58# DBI3# VSS D54# DSTBP3# VSS D51#
PLL
B VTT VTT VTT VTT VTT VTT VSS VSSA D63# D59# VSS D60# D57# VSS D55# D53#
A VTT VTT VTT VTT VTT VTT VSS VCCA D62# VSS RSVD D61# VSS D56# DSTBN3# VSS
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15
46 Datasheet
Land Listing and Signal Descriptions
VCC VSS VCC VCC VSS VCC VCC FC12 VTTPWRGD FC11 VSS VID2 VID0 VSS AM
VCC VSS VCC VCC VSS VCC VCC VSS VID3 VID1 VID5 VSS PROCHOT# THERMDA AL
VCC VSS VCC VCC VSS VCC VCC VSS FORCEPR# VSS VID4 ITP_CLK0 VSS THERMDC AK
VCC VSS VCC VCC VSS VCC VCC VSS A35# A34# VSS ITP_CLK1 BPM0# BPM1# AJ
VCC VSS VCC VCC VSS VCC VCC VSS VSS A33# A32# VSS RSVD VSS AH
VCC VSS VCC VCC VSS VCC VCC VSS A29# A31# A30# BPM5# BPM3# TRST# AG
VCC VSS VCC VCC VSS VCC VCC VSS VSS A27# A28# VSS BPM4# TDO AF
VCC VSS VCC VCC VSS VCC SKTOCC# VSS RSVD VSS RSVD COMP7 VSS TCK AE
VTT_OUT_
VCC VSS VSS A23# A21# VSS LL_ID1 AA
RIGHT
BOOT
VCC VSS A19# VSS A20# COMP6 VSS Y
SELECT
FERR#/
VCC VSS ADSTB0# VSS A8# VSS COMP3 R
PBE#
VTT_OUT_
VCC VCC VCC VCC VCC VCC VCC VSS REQ4# REQ1# VSS FC22 COMP4 J
LEFT
H
VSS VSS VSS VSS VSS VSS VSS VSS VSS TESTHI10 RSP# VSS GTLREF1 GTLREF0
D29# D27# DSTBN1# DBI1# RSVD D16# BPRI# DEFER# RSVD FC7 TESTHI9 TESTHI8 COMP2 VSS G
D28# VSS D24# D23# VSS D18# D17# VSS IMPSEL RS1# VSS BR0# FC5 F
VSS D26# DSTBP1# VSS D21# D19# VSS RSVD RSVD FC20 HITM# TRDY# VSS E
RSVD D25# VSS D15# D22# VSS D12# D20# VSS VSS HIT# VSS ADS# RSVD D
C
D52# VSS D14# D11# VSS RSVD DSTBN0# VSS D3# D1# VSS LOCK# BNR# DRDY#
VSS FC19 D13# VSS D10# DSTBP0# VSS D6# D5# VSS D0# RS0# DBSY# VSS B
D50# COMP0 VSS D9# D8# VSS DBI0# D7# VSS D4# D2# RS2# VSS A
14 13 12 11 10 9 8 7 6 5 4 3 2 1
Datasheet 47
Land Listing and Signal Descriptions
48 Datasheet
Land Listing and Signal Descriptions
Datasheet 49
Land Listing and Signal Descriptions
50 Datasheet
Land Listing and Signal Descriptions
Datasheet 51
Land Listing and Signal Descriptions
52 Datasheet
Land Listing and Signal Descriptions
Datasheet 53
Land Listing and Signal Descriptions
54 Datasheet
Land Listing and Signal Descriptions
Datasheet 55
Land Listing and Signal Descriptions
56 Datasheet
Land Listing and Signal Descriptions
Datasheet 57
Land Listing and Signal Descriptions
58 Datasheet
Land Listing and Signal Descriptions
Datasheet 59
Land Listing and Signal Descriptions
60 Datasheet
Land Listing and Signal Descriptions
Datasheet 61
Land Listing and Signal Descriptions
62 Datasheet
Land Listing and Signal Descriptions
Datasheet 63
Land Listing and Signal Descriptions
64 Datasheet
Land Listing and Signal Descriptions
Datasheet 65
Land Listing and Signal Descriptions
66 Datasheet
Land Listing and Signal Descriptions
Datasheet 67
Land Listing and Signal Descriptions
68 Datasheet
Land Listing and Signal Descriptions
Datasheet 69
Land Listing and Signal Descriptions
70 Datasheet
Land Listing and Signal Descriptions
Datasheet 71
Land Listing and Signal Descriptions
D[15:0]# 0 0
D[31:16]# 1 1
D[47:32]# 2 2
D[63:48]# 3 3
DBI3# D[63:48]#
DBI2# D[47:32]#
DBI1# D[31:16]#
DBI0# D[15:0]#
72 Datasheet
Land Listing and Signal Descriptions
FC signals are signals that are available for compatibility with other
FCx Other
processors.
Datasheet 73
Land Listing and Signal Descriptions
74 Datasheet
Land Listing and Signal Descriptions
Datasheet 75
Land Listing and Signal Descriptions
76 Datasheet
Land Listing and Signal Descriptions
Datasheet 77
Land Listing and Signal Descriptions
78 Datasheet
Land Listing and Signal Descriptions
The VTT_SEL signal is used to select the correct VTT voltage level for
VTT_SEL Output
the processor.
The processor requires this input to determine that the VTT voltages
VTTPWRGD Input
are stable and within specification.
§§
Datasheet 79
Land Listing and Signal Descriptions
80 Datasheet
Thermal Specifications and Design Considerations
A complete thermal solution includes both component and system level thermal
management features. Component level thermal solutions can include active or passive
heatsinks attached to the processor Integrated Heat Spreader (IHS). Typical system
level thermal solutions may consist of system fans combined with ducting and venting.
For more information on designing a component level thermal solution, refer to the
Intel® Pentium® D Processor, Intel® Pentium® Processor Extreme Edition, and Intel®
Pentium® 4 Processor Thermal and Mechanical Design Guidelines.
Note: The boxed processor will ship with a component thermal solution. Refer to Chapter 7
for details on the boxed processor.
Datasheet 81
Thermal Specifications and Design Considerations
Pentium® Processor Extreme Edition, and Intel® Pentium® 4 Processor Thermal and
Mechanical Design Guidelines and the Processor Power Characterization Methodology
for the details of this methodology.
The case temperature is defined at the geometric top center of the processor. Analysis
indicates that real applications are unlikely to cause the processor to consume
maximum power dissipation for sustained time periods. Intel recommends that
complete thermal solution designs target the Thermal Design Power (TDP) indicated in
Table 26 instead of the maximum processor power consumption. The Thermal Monitor
feature is designed to protect the processor in the unlikely event that an application
exceeds the TDP recommendation for a sustained periods of time. For more details on
the usage of this feature, refer to Section 5.2. In all cases the Thermal Monitor
feature must be enabled for the processor to remain within specification.
Core Thermal
Minimum Maximum TC
Processor Number Frequency Design Notes
TC (°C) (°C)
(GHz) Power (W)
1, 2
Extreme Edition 955 3.46 GHz 130 5
See Table 27 1, 2
960 3.60 GHz 130 5
and Figure 13
1, 2
950 3.40 GHz 130 5
1, 2
940 3.20 GHz 130 5
1, 2
960 3.60 GHz 95 5
1, 2
950/945 3.40 GHz 95 5
See Table 28 1, 2
940/935 3.20 GHz 95 5
and Figure 14
1, 2
930/925 3 GHz 95 5
1, 2
920/915 2.80 GHz 95 5
NOTES:
1. Thermal Design Power (TDP) should be used for processor thermal solution design targets. The TDP is not the
maximum power that the processor can dissipate.
2. This table shows the maximum TDP for a given frequency range. Individual processors may have a lower TDP.
Therefore, the maximum TC will vary depending on the TDP of the individual processor. Refer to thermal profile
figure and associated table for the allowed combinations of power and TC.
82 Datasheet
Thermal Specifications and Design Considerations
65.0
60.0
y = 0.19x + 43.9
Tcase (C)
55.0
50.0
45.0
40.0
0 10 20 30 40 50 60 70 80 90 100 110 120 130
Power (W)
Datasheet 83
Thermal Specifications and Design Considerations
65.0
60.0
Tcase (C)
55.0
y = 0.21x + 43.4
50.0
45.0
40.0
0 10 20 30 40 50 60 70 80 90
Power (W)
84 Datasheet
Thermal Specifications and Design Considerations
37.5 mm
When the Thermal Monitor feature is enabled, and a high temperature situation exists
(i.e., TCC is active), the clocks will be modulated by alternately turning the clocks off
and on at a duty cycle specific to the processor (typically 30–50%). Clocks often will
not be off for more than 3.0 microseconds when the TCC is active. Cycle times are
processor speed dependent and will decrease as processor core frequencies increase. A
small amount of hysteresis has been included to prevent rapid active/inactive
transitions of the TCC when the processor temperature is near its maximum operating
temperature. Once the temperature has dropped below the maximum operating
temperature, and the hysteresis timer has expired, the TCC goes inactive and clock
modulation ceases.
With a properly designed and characterized thermal solution, it is anticipated that the
TCC would only be activated for very short periods of time when running the most
power intensive applications. The processor performance impact due to these brief
Datasheet 85
Thermal Specifications and Design Considerations
The duty cycle for the TCC, when activated by the Thermal Monitor, is factory
configured and cannot be modified. The Thermal Monitor does not require any
additional hardware, software drivers, or interrupt handling routines.
If PROCHOT# is configured as an output only, the FORCEPR# signal can be driven from
an external source to activate the TCC. This will prevent one core from asserting the
PROCHOT# signal of the other core and unnecessarily activating the TCC of that core.
Refer to Chapter 5.2.4 for details on the FORCEPR# signal.
86 Datasheet
Thermal Specifications and Design Considerations
Bi-directional PROCHOT# (if enabled) can allow VR thermal designs to target maximum
sustained current instead of maximum current. Systems should still provide proper
cooling for the VR, and rely on bi-directional PROCHOT# only as a backup in case of
system cooling failure. The system thermal design should allow the power delivery
circuitry to operate within its temperature specification even while the processor is
operating at its Thermal Design Power. With a properly designed and characterized
thermal solution, it is anticipated that bi-directional PROCHOT# would only be asserted
for very short periods of time when running the most power intensive applications. An
under-designed thermal solution that is not able to prevent excessive assertion of
PROCHOT# in the anticipated ambient environment may cause a noticeable
performance loss. Refer to the Voltage Regulator-Down (VRD) 10.1 Design Guide for
Desktop Socket 775 for details on implementing the bi-directional PROCHOT# feature.
FORCEPR# can be used to thermally protect other system components. To use the VR
as an example, when the FORCEPR# pin is asserted, the TCC circuit in the processor
(both cores) will activate, reducing the current consumption of the processor and the
corresponding temperature of the VR.
Note that assertion of the FORCEPR# does not automatically assert PROCHOT#. As
mentioned previously, the PROCHOT# signal is asserted when a high temperature
situation is detected. A minimum pulse width of 500 µs is recommend when the
FORCEPR# is asserted by the system. Sustained activation of the FORCEPR# pin may
cause noticeable platform performance degradation.
One application is the thermal protection of voltage regulators (VR). System designers
can create a circuit to monitor the VR temperature and activate the TCC when the
temperature limit of the VR is reached. By asserting FORCEPR# (pulled-low) and
activating the TCC, the VR can cool down as a result of reduced processor power
consumption. FORCEPR# can allow VR thermal designs to target maximum sustained
current instead of maximum current. Systems should still provide proper cooling for the
VR, and rely on FORCEPR# only as a backup in case of system cooling failure. The
system thermal design should allow the power delivery circuitry to operate within its
temperature specification even while the processor is operating at its Thermal Design
Power. With a properly designed and characterized thermal solution, it is anticipated
that FORCEPR# would only be asserted for very short periods of time when running the
most power intensive applications. An under-designed thermal solution that is not able
to prevent excessive assertion of FORCEPR# in the anticipated ambient environment
may cause a noticeable performance loss. Refer to the Voltage Regulator-Down (VRD)
10.1 Design Guide for Desktop Socket 775 for details on implementing the FORCEPR#
feature.
Datasheet 87
Thermal Specifications and Design Considerations
The purpose of this feature is to support acoustic optimization through fan speed
control. Contact your Intel representative for further details and documentation.
NOTES:
1. Intel does not support or recommend operation of the thermal diode under reverse bias.
2. Characterized across a range of 50 – 80 °C.
3. Not 100% tested. Specified by design characterization.
4. The ideality factor, n, represents the deviation from ideal diode behavior as exemplified by
the diode equation:
IFW = IS * (e qVD/nkT –1)
where IS = saturation current, q = electronic charge, VD = voltage across the diode, k = Boltzmann
Constant, and T = absolute temperature (Kelvin).
88 Datasheet
Thermal Specifications and Design Considerations
5. The series resistance, RT, is provided to allow for a more accurate measurement of the
junction temperature. RT, as defined, includes the lands of the processor but does not
include any socket resistance or board trace resistance between the socket and the
external remote diode thermal sensor. RT can be used by remote diode thermal sensors
with automatic series resistance cancellation to calibrate out this error term. Another
application is that a temperature offset can be manually calculated and programmed into
an offset register in the remote diode thermal sensors as exemplified by the equation:
Terror = [RT * (N-1) * IFWmin] / [nk/q * ln N]
where Terror = sensor temperature error, N = sensor current ratio, k = Boltzmann Constant, q = electronic
charge.
NOTES:
1. Intel does not support or recommend operation of the thermal diode under reverse bias.
2. Same as IFW in Table 29
3. Characterizedacross a range of 50 – 80 °C.
4. Not 100% tested. Specified by design characterization.
5. The ideality factor, nQ, represents the deviation from ideal transistor model behavior as
exemplified by the equation for the collector current:
IC = IS * (e qVBE/nQkT
–1)
Where IS = saturation current, q = electronic charge, VBE = voltage across the transistor base emitter
junction (same nodes as VD), k = Boltzmann Constant, and T = absolute temperature (Kelvin).
6. The series resistance, RT, provided in the Diode Model Table (Table 29) can be used for
more accurate readings as needed.
Where Terror(nf) is the offset in degrees C, Tmeasured is in Kelvin, nactual is the measured
ideality of the diode, and ntrim is the diode ideality assumed by the temperature
sensing device.
Datasheet 89
Thermal Specifications and Design Considerations
calculated. This Thermal Diode Offset value will be programmed into the new diode
correction MSR and when added to the Thermal Diode Base value can be used to
correct temperatures read by diode based temperature sensing devices.
If the ntrim value used to calculate the Thermal Diode Offset differs from the ntrim value
used in a temperature sensing device, the Terror(nf) may not be accurate. If desired, the
Thermal Diode Offset can be adjusted by calculating nactual and then recalculating the
offset using the actual ntrim as defined in the temperature sensor manufacturers'
datasheet.
The Diode_Base value and ntrim used to calculate the Diode_Correction_Offset are
listed in Table 31.
Signal
Signal Name Land Number
Description
§ §§
90 Datasheet
Features
6 Features
6.1 Power-On Configuration Options
Several configuration options can be configured by hardware. The processor samples
the hardware configuration at reset, on the active-to-inactive transition of RESET#. For
specifications on these options, please refer to Table 33.
The sampled information configures the processor for subsequent operation. These
configuration options cannot be changed except by another reset. All resets reconfigure
the processor; for reset purposes, the processor does not distinguish between a
"warm" reset and a "power-on" reset.
NOTES:
1. Asserting this signal during RESET# will select the corresponding option.
2. Address signals not identified in this table as configuration options should not be asserted
during RESET#.
3. This mode is not tested
Datasheet 91
Features
rte K#
Snoop Snoop
se C L
d
As TP
STPCLK# STPCLK# Event Event
S
Asserted De-asserted Occurs Serviced
se #
d
as LK
rte
e- C
D TP
S
Enhanced HALT Snoop or HALT
Snoop State
BCLK running
Service snoops to caches
The Enhanced HALT state is a lower power state as compared to the Stop Grant State.
The return from a System Management Interrupt (SMI) handler can be to either
Normal Mode or the HALT Power Down state. See the Intel Architecture Software
Developer's Manual, Volume III: System Programmer's Guide for more information.
92 Datasheet
Features
The return from a System Management Interrupt (SMI) handler can be to either
Normal Mode or the HALT Power Down state. See the Intel Architecture Software
Developer's Manual, Volume III: System Programmer's Guide for more information.
The system can generate a STPCLK# while the processor is in the HALT Power Down
state. When the system deasserts the STPCLK# interrupt, the processor will return
execution to the HALT state.
While in HALT Power Down state, the processor will process bus snoops.
The processor will automatically transition to a lower frequency and voltage operating
point before entering the Enhanced HALT state. Note that the processor FSB frequency
is not altered; only the internal core frequency is changed. When entering the low
power state, the processor will first switch to the lower bus ratio and then transition to
the lower VID.
While in Enhanced HALT state, the processor will process bus snoops.
The processor exits the Enhanced HALT state when a break event occurs. When the
processor exits the Enhanced HALT state, it will first transition the VID to the original
value and then change the bus ratio back to the original value.
Since the GTL+ signals receive power from the FSB, these signals should not be driven
(allowing the level to return to VTT) for minimum power drawn by the termination
resistors in this state. In addition, all other input signals on the FSB should be driven to
the inactive state.
BINIT# will not be serviced while the processor is in Stop Grant state. The event will be
latched and can be serviced by software upon exit from the Stop Grant state.
RESET# will cause the processor to immediately initialize itself, but the processor will
stay in Stop-Grant state. A transition back to the Normal state will occur with the de-
assertion of the STPCLK# signal.
A transition to the Grant Snoop state will occur when the processor detects a snoop on
the FSB (see Section 6.2.4).
While in the Stop-Grant State, SMI#, INIT#, BINIT# and LINT[1:0] will be latched by
the processor, and only serviced when the processor returns to the Normal State. Only
one occurrence of each event will be recognized upon return to the Normal state.
Datasheet 93
Features
§§
94 Datasheet
Boxed Processor Specifications
Note: Drawings in this section reflect only the specifications on the Intel boxed processor
product. These dimensions should not be used as a generic keep-out zone for all
cooling solutions. It is the system designers’ responsibility to consider their proprietary
cooling solution when designing to the required keep-out zone on their system
platforms and chassis. Refer to the Intel® Pentium® D Processor, Intel® Pentium®
Processor Extreme Edition, and Intel® Pentium® 4 Processor Thermal and Mechanical
Design Guidelines for further guidance.
Figure 17. Mechanical Representation of the Boxed Processor
NOTE: The airflow of the fan heatsink is into the center and out of the sides of the fan heatsink.
Datasheet 95
Boxed Processor Specifications
Clearance is required around the fan heatsink to ensure unimpeded airflow for proper
cooling. The physical space requirements and dimensions for the boxed processor with
assembled fan heatsink are shown in Figure 18 (Side View), and Figure 19 (Top View).
The airspace requirements for the boxed processor fan heatsink must also be
incorporated into new baseboard and system designs. Airspace requirements are
shown in Figure 23 and Figure 24. Note that some figures have centerlines shown
(marked with alphabetic designations) to clarify relative dimensioning.
Figure 18. Space Requirements for the Boxed Processor (Side View: applies to all four
side views)
95.0
[3.74]
81.3
[3.2]
10.0 25.0
[0.39] [0.98]
B d P Sid Vi
Figure 19. Space Requirements for the Boxed Processor (Top View)
95.0
[3.74]
95.0
[3.74]
NOTES:
1. Diagram does not show the attached hardware for the clip design and is provided only as a
mechanical representation.
96 Datasheet
Boxed Processor Specifications
Figure 20. Space Requirements for the Boxed Processor (Overall View)
The fan heatsink receives a PWM signal from the motherboard from the fourth pin of
the connector labeled as CONTROL.
Note: The boxed processor’s fan heatsink requires a constant +12 V supplied to pin 2 and
does not support variable voltage control or 3-pin PWM control.
Datasheet 97
Boxed Processor Specifications
The power header on the baseboard must be positioned to allow the fan heatsink power
cable to reach it. The power header identification and location should be documented in
the platform documentation, or on the system board itself. Figure 22 shows the
location of the fan power connector relative to the processor socket. The baseboard
power header should be positioned within 4.33 inches from the center of the processor
socket.
Figure 21. Boxed Processor Fan Heatsink Power Cable Connector Description
1 2 3 4
NOTES:
1. Baseboard should pull this pin up to 5 V with a resistor.
2. Open Drain Type, Pulse Width Modulated.
3. Fan will have a pull-up resistor to 4.75 V, maximum is 5.25 V.
98 Datasheet
Boxed Processor Specifications
R110
[4.33]
B
Note: The processor fan is the primary source of airflow for cooling the Vcc voltage regulator.
Dedicated voltage regulator cooling components may be necessary if the selected fan is
not capable of keeping regulator components below maximum rated temperatures.
Datasheet 99
Boxed Processor Specifications
§§
100 Datasheet
Balanced Technology Extended (BTX) Boxed Processor Specifications
Note: Unless otherwise noted, all figures in this chapter are dimensioned in millimeters and
inches [in brackets].
Note: Drawings in this section reflect only the specifications on the Intel boxed processor
product. These dimensions should not be used as a generic keep-out zone for all
cooling solutions. It is the system designers’ responsibility to consider their proprietary
cooling solution when designing to the required keep-out zone on their system
platforms and chassis. Refer to the Intel® Pentium® D Processor, Intel® Pentium®
Processor Extreme Edition, and Intel® Pentium® 4 Processor Thermal and Mechanical
Design Guidelines for further guidance.
Figure 25. Mechanical Representation of the Boxed Processor with a Type I TMA
NOTE: The duct, clip, heatsink and fan can differ from this drawing representation but
the basic shape and size will remain the same.
Datasheet 101
Balanced Technology Extended (BTX) Boxed Processor Specifications
Figure 26. Mechanical Representation of the Boxed Processor with a Type II TMA
NOTE: The duct, clip, heatsink and fan can differ from this drawing representation but
the basic shape and size will remain the same.
102 Datasheet
Balanced Technology Extended (BTX) Boxed Processor Specifications
Figure 27. Requirements for the Balanced Technology Extended (BTX) Type I Keep-out
Volumes
NOTE: Diagram does not show the attached hardware for the clip design and is provided only as a
mechanical representation.
Datasheet 103
Balanced Technology Extended (BTX) Boxed Processor Specifications
Figure 28. Requirements for the Balanced Technology Extended (BTX) Type II Keep-out
Volume
NOTE: Diagram does not show the attached hardware for the clip design and is provided only as a
mechanical representation.
104 Datasheet
Balanced Technology Extended (BTX) Boxed Processor Specifications
See the Support and Retention Module (SRM) External Design Requirements
Document, Balanced Technology Extended (BTX) System Design Guide, and the Intel®
Pentium® D Processor, Intel® Pentium® Processor Extreme Edition, and Intel®
Pentium® 4 Processor Thermal and Mechanical Design Guidelines for more detailed
information regarding the support and retention module and chassis interface and
keepout zones. Figure 29 illustrates the assembly stack including the SRM.
Figure 29. Assembly Stack Including the Support and Retention Module
T he rm a l M od u le A ssem bly
• H ea tsin k & Fan
• C lip
• S tructural D uct
M othe rboard
SRM
C ha ssis P an
The TMA outputs a SENSE signal, which is an open- collector output that pulses at a
rate of 2 pulses per fan revolution. A baseboard pull-up resistor provides VOH to match
the system board-mounted fan speed monitor requirements, if applicable. Use of the
SENSE signal is optional. If the SENSE signal is not used, pin 3 of the connector should
be tied to GND.
The TMA receives a Pulse Width Modulation (PWM) signal from the motherboard from
the 4th pin of the connector labeled as CONTROL.
Datasheet 105
Balanced Technology Extended (BTX) Boxed Processor Specifications
Note: The boxed processor’s TMA requires a constant +12 V supplied to pin 2 and does not
support variable voltage control or 3-pin PWM control.
The power header on the baseboard must be positioned to allow the TMA power cable
to reach it. The power header identification and location should be documented in the
platform documentation, or on the system board itself. Figure 31 shows the location of
the fan power connector relative to the processor socket. The baseboard power header
should be positioned within 4.33 inches from the center of the processor socket.
1 2 3 4
NOTES:
1. Baseboard should pull this pin up to 5 V with a resistor.
2. Open Drain Type, Pulse Width Modulated.
3. Fan will have a pull-up resistor to 4.75 V, maximum 5.25 V
106 Datasheet
Balanced Technology Extended (BTX) Boxed Processor Specifications
Figure 31. Balanced Technology Extended (BTX) Mainboard Power Header Placement
(Hatched Area)
Datasheet 107
Balanced Technology Extended (BTX) Boxed Processor Specifications
In addition, Type I TMA must be used with Type I chassis only and Type II TMA with
Type II chassis only. Type I TMA will not fit in a Type II chassis due to the height
difference. In the event a Type II TMA is installed in a Type I chassis, the gasket on the
chassis will not seal against the Type II TMA and poor acoustic performance will occur
as a result.
Note: The motherboard must supply a constant +12 V to the processor’s power header to
ensure proper operation of the variable speed fan for the boxed processor (refer to
Table 36) for the specific requirements).
Increasing Fan
Speed & Noise
X Y Z
108 Datasheet
Balanced Technology Extended (BTX) Boxed Processor Specifications
Table 36. TMA Set Points for 3-wire operation of BTX Type I and Type II Boxed
Processors
Boxed Processor
TMA Set Point Boxed Processor Fan Speed Notes
(ºC)
NOTES:
1. Set point variance is approximately ±1°C from Thermal Module Assembly to Thermal
Module Assembly.
As processor power has increased, the required thermal solutions have generated
increasingly more noise. Intel has added an option to the boxed processor that allows
system integrators to have a quieter system in the most common usage.
The 4-wire PWM controlled fan in the TMA solution provides better control over chassis
acoustics. It allows better granularity of fan speed and lowers overall fan speed than a
voltage-controlled fan. Fan RPM is modulated through the use of an ASIC located on
the motherboard that sends out a PWM control signal to the 4th pin of the connector
labeled as CONTROL. The fan speed is based on a combination of actual processor
temperature and thermistor temperature.
If the 4-wire PWM controlled fan in the TMA solution is connected to a 3-pin baseboard
processor fan header it will default back to a thermistor controlled mode, allowing
compatibility with existing 3-pin baseboard designs. Under thermistor controlled mode,
the fan RPM is automatically varied based on the Tinlet temperature measured by a
thermistor located at the fan inlet.
For more details on specific motherboard requirements for 4-wire based fan speed
control see the Intel® Pentium® D Processor, Intel® Pentium® Processor Extreme
Edition, and Intel® Pentium® 4 Processor Thermal and Mechanical Design Guidelines.
§§
Datasheet 109
Balanced Technology Extended (BTX) Boxed Processor Specifications
110 Datasheet
Debug Tools Specifications
Due to the complexity of the processor systems, the LAI is critical in providing the
ability to probe and capture FSB signals. There are two sets of considerations to keep in
mind when designing a processor system that can make use of an LAI: mechanical and
electrical.
§§
Datasheet 111
Debug Tools Specifications
112 Datasheet