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180 views15 pagesJis C 3660-1-4
Common test methods for insulating and sheathing materials of electric and optical cables -
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JIS
JAPANESE
INDUSTRIAL
STANDARD
Translated and Published by
Japanese Standards Association
JIS C 3660-1-4:2»
(IEC 60811-1-4:1985/ Amd. 1:193 /Amd.2:2001)
(CMA)
Common test methods for insulating
and sheathing materials of electric
and optical cables—Part 1-4 :
Methods for general application—
Test at low temperature
ICS_29.035.01; 29.060.20
Reference num! ber : JIS C 3660-1-4 : 2003 (E)
PROTECTED BY COPYRIGHT 9s C 3660-1-4 : 2003 (IEC 60811-1-4 : 1985/Amd.1 : 1993/Amd.2 : 2001)
Foreword
This translation has been made based on the original Japanese Industrial Standard revised by the Minister of Beonomy,
‘Trade and Industry through deliberations at the Japanese Industrial Standards Committee, as the result of proposal for
revision of Japanose Industrial Standard submitted by The Japancse Electrie Wire & Cable Makers’ Association (JCMA)
with the draft being attached, based on the provision of Article 12 Clause 1 of the Industrial Standardization Law appli-
table to the case of revision by the provision af Artile 14
Consequently JIS C $660-1-4 : 1998 is replaced with this Standard,
‘This rovision has been made based on TEC 60811-1-4 : 1985 Common test methods for insulating and sheathing materi
als of electric and optical eables—Part 1-4 : Methods for general application—Teet at low temperature for the purposes of
making it easier to compare this Standard with International Standard; to prepare Japanese Industrial Standard co
orming with International Stendaré; and to propose a draft of an International Standard which is based on Japanese
Industrial Standard
Attention is drawn to the possibility that some parts of this Standard may conflict with a patent right, application for a
patent after opening to the public, utility model right or application for registration of utility model after opening to the
public which have technical properties. ‘The relevant Minister and the Japanese Industrial Standards Committee are
not responsible for identifying the patent right, application for a patent after opening to the public, utility model right or
application for registration of utility model after opening to the public which have the said technical properties.
IS C 3660 consists of the following parts and eections under the general title Common test methods for insulating and
sheathing materials of electric and optical cables:
Part 1-1: Methods for general application—Measurement of thickness and overall dimensions-—Tests for determining
‘the mechanical properties
Part 1-2: Methods for general application—Thermal ageing methods
Part 1-3 : Methods for general application—Methods for determining the density—Water absorption tests—Shrinkage test
Part 1-4 : Methods for general application—Test at low temperature
Part 2-1 : Methods specifi to elastomerie compounds-—Ozone resistance, hot set and mineral oil immersion tests
Part 3-1 : Methods specific o PVC compounds—Pressure test at high temperature-—Test for resistance to cracking
Part 3: Methods specific to PVC compounds—Section 2 Loss of mass test—Thermal stability test
Part 4: Methods specific to polyethylene and polypropylene compounds—Section 1 : Resistance to environmental stress
cracking—Wrapping test after thermal ageing in air—Measurement of melt flow index--Carbor black and or mineral
filler content measurement in PE
Part 4: Methods specific to polyethylene and polypropylene compounds—Section 2: Elongation at break after pre-con
ditioning—Wrapping test after pre-conditioning—Wrapping test after thermal ageing in air—Measurement of mass in
tcrease—Long-term stability test (Appendis A)—Test method for copper-catalysed oxidative degradation (Appendix B)
Part 5: Methods specific to flling compounds—Section 1 : Drop point—Separation ofoilLower temperature britleness—
Total acid number—Absonce Lo corrosive components-—Permittivity at 23 °C—-D.C. resistivity at 23 °C and 100 °C.
Date of Establishment: 1998-03-20
Date of Revision: 2003-09-20
Date of Public Notice in Official Gazette: 2003-09-22
Investigated by: Japanese Industri
Standards Board
‘Technical Committee on Electricity Technology
Standards Committee
JIS C 3660-1-4:2003, First English edition published in 2004-07
Translated and published by: Japanese Standards Association
41-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN
In the event of any doubts arising as to the contents,
the original JIS is to be the final authority.
© JSA 2004
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced of
utilized in any form or by any means, electronic or mechanical, including photocopying and
‘microfilm, without permission in writing from the publisher.
Printed in Japan
PROTECTED BY COPYRIGHT C 3660-1-4 : 2003 (IEC 60811-1-4 : 1985/Amd. 1 : 1993/Amd.2 : 2001)
Contents
Introduction ...
1 General... 1
1.1 Scope a
1.2 Normative reference ...ccnsnnnennn 1
2 Test values... 2
3 Applicability ... : 2
4 Type tests and other tests een 2
5 Pre-conditioning... 2
6 — Test temperature .. 2
7 Median value....... 2
8 — Tests at low temperature 2
8.1 Bending test at low temperature for insulations .. 2
8.2 Bending test at low temperature for sheaths 4
8.3. Elongation test at low temperature for insulations 4
8.4 Elongation test at low temperature for sheaths ccccucennsnnnenenen 6
8.5 Impact test at low temperature for PVC insulations and sheaths 6
a
PROTECTED BY COPYRIGHT JAPANESE INDUSTRIAL STANDARD JIS C 3660-1-4 : 2003
(LEC 60811-1-4 : 1985/Amd. 1 : 1993/Amd.2 : 2001)
Common test methods for insulating
and sheathing materials of electric and
optical cables—Part 1-4: Methods for
general application—Test at low
temperature
Introduction This Standard is the Japanese Industrial Standard prepared based
on IEC 60811-1-4 Common test methods for insulating and sheathing materials of
electric and optical cables—Part 1-4 : Methods for general application—Test at low
temperature published in 1985 as the first edition, Amendment 1 (1993) and Amend-
ment 2 (2001) without modifying their technical contents.
Portions underlined with dots are the matters not stated in the original Interna-
tional Standard.
1 General
1.1 Scope This Standard specifies the test method to be used for testing poly-
meric insulating and sheathing materials of electric cables for power distribution
and telecommunications including cables used on ships and in offshore applications.
This Standard gives the methods for tests at low temperature which apply to PVC
and PE compounds.
NOTE: The International Standards corresponding to this Standard are given
below.
In addition, symbols which denote the degree of correspondence in
the contents between the relevant International Standard and JIS are
IDT (identical), MOD (modified), and NEQ (not equivalent) according to
ISO/MEC Guide 21.
IEC 60811-1-4: 1985 Common test methods for insulating and sheath
ing materials of electric and optical cables—Part 1-4 : Methods for
general application—Test at low temperature, Amendment 1 (1993)
and Amendment 2 (2001) (IDT)
1.2 Normative reference The following standard contains provisions which,
through reference in this Standard, constitute provisions of this Standard. If the
indication of the year of publication is given to this referred standard, only the edi-
tion of indicated year constitutes the provision of this Standard but the revision and
amendment made thereafter do not apply. The normative reference without the
indication of the year of coming into effect apply limiting only to the most recent
edition (including amendments).
JIS C 3660-1-1 Common test methods for insulating and sheathing materials of
electric and optical cables—Part 1-1 : Methods for general appli-
cation—Measurement of thickness and overall dimensions—Tests
for determining the mechanical properties
PROTECTED BY COPYRIGHT 2
C 3660-1-4 : 2003 (IEC 60811-1-4 : 1985/Amd. 1 : 1993/Amd.2 : 2001)
NOTE: IEC 60811-1-1 : 1993 Common test methods for insulating and sheathing
materials of electric and optical cables—Part 1-1 : Methods for general
application—Measurement of thickness and overall dimensions—Tests
for determining the mechanical properties and Amendment 1 (2001)
are identical with the said Standard.
2 Test values Full test conditions (such as temperatures, durations, ete.) and full
test requirements are not specified in this Standard; it is intended that they should
be specified by the standard dealing with the relevant type of cable.
Any test requirements which are given in this Standard may be modified by the
relevant cable standard to suit the needs of a particular type of cable.
3 Applicability Conditioning values and testing parameters are specified for the
most common types of insulating and sheathing compounds and of cables, wire and
cords.
4 Type tests and other tests The test methods described in this Standard are
intended, in the first instance, to be used for type tests. In certain tests, where
there are essential differences between the conditions for type tests and those for
more frequent tests, such as routine tests, these differences are indicated.
5 Pre-conditioning All the tests shall be carried out not less than 16 h after the
extrusion or vulcanization (or cross-linking), if any, of the insulating or sheathing
compounds.
6 Test temperature Tests shall be carried out at the temperature specified in
the relevant cable standard.
7 Median value When several test results have been obtained and ordered in an
increasing or decreasing succession, the median value is the middle value if the num-
ber of available values is odd, and is the mean of the two middle values if the number
is even.
8 Tests at low temperature
8.1 Bending test at low temperature for insulations
8.1.1 General This test is intended in general for cores of circular cross-section
having an external diameter up to and including 12.5 mm and for sector-shaped cores
when it is not possible to prepare dumb-bells.
If required by the standard for the type of cable, the test shall be carried out on
the cores exceeding 12.5 mm. Otherwise, the insulation of the cores exceeding 12.5 mm
shall be subjected to the elongation test described in 8.3.
8.1.2 Sampling and preparation of test pieces Each core to be tested shall be
represented by two samples of suitable length. After removal of the coverings, if
any, the samples shall be used as test pieces.
PROTECTED BY COPYRIGHT 3
C 3660-1-4 : 2003 (IEC 60811-1-4 : 1985/Amd. 1 : 1993/Amd.2 : 2001)
8.1.3 Apparatus The apparatus recommended for this test is represented in fig-
ure 1, with explanations. It consists essentially of one revolving mandrel and guid-
ing devices for the test pieces.
Other single-mandrel apparatus, substantially equivalent to the one represented
in figure 1, may also be used.
The apparatus shall be held in a suitable low temperature cabinet before and
during the test.
8.1.4 Procedure The test piece shall be fixed in the apparatus, as shown in figure 1.
‘The apparatus with the test piece in position shall be maintained in the suitable
low temperature cabinet at the specified temperature for a period of not less than 16 h.
The cooling period of 16 h includes the time necessary for cooling down the appara-
tus.
If the apparatus has been pre-cooled, a shorter cooling period is permissible, but
not less than 4 h provided that the samples have attained the prescribed test tem-
perature. If the apparatus and test specimens have been pre-cooled, a cooling time
of 1h after each test piece has been fixed to the apparatus is sufficient.
At the end of the prescribed time, the mandrel shall be rotated, complying with
the conditions specified in 8.1.5, the test piece being guided so that it is bent tautly
round the mandrel in a close helix. In the case of sector-shaped test pieces, the
circular “back” part of the test piece shall be in contact with the mandrel.
Afterwards, the test piece, still on the mandrel, shall be allowed to attain ap-
proximately ambient temperature.
8.1.5 Test conditions The cooling and test temperature shall be as specified for
the type of compound in the relevant standard for the type of cable.
The diameter of the mandrel shall be between 4 and 5 times the diameter of the
test piece (see below).
The mandrel shall be uniformly rotated at a rate of one revolution in about 5 s
and the number of turns shall be as specified in table 1.
‘The actual diameter of each test piece shall be measured by either a vernier cal-
liper or a measuring tape. For sector-shaped test pieces, the minor axis is taken as
the parameter equivalent to the diameter for determining the mandrel diameter and
the number of turns.
For flat cords, the mandrel diameter shall be based on the minor axis dimension
of the test piece, which is wound on with its minor axis perpendicular to the mandrel.
Table 1 Number of turns of mandrel
Overall diameter (d) of the test piece | Number of turns
(mm)
ds25 10
25