Low-Power 3-Axis Accelerometer Guide
Low-Power 3-Axis Accelerometer Guide
Key Features
• Supply voltage, 1.62V to 3.6V
• For 3x3x0.9 mm LGA-10 package
• User selectable range, ±2g, ±4g, ±8g, ±16g
• User selectable data output rate
• Digital I2C output interface
• 14 bit resolution
• Low power consumption
• 1 Programmable interrupt generator with independent function for motion detection
• Free-fall detection
• Embedded self-test function
• Factory programmable offset and sensitivity
• RoHS compliant
Applications
• User interface for mobile phone and PMP
• Display orientation
• Gesture recognition
• Active/inactive monitoring
• Free-fall detection
• Double/ Click recognition
• Power management
• Vibration monitoring
• Inclination and tilt sensing
• Pedometer
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Product Overview
The da380 sensor is the low power high performance capacitive three-axis linear accelerometer developed by
micro-machined technology. The device is available in a 3x3x0.9 mm land grid array (LGA) and it is guaranteed
to operate over an extended temperature range from -40°C to +85°C. The sensor element is fabricated by single
crystal silicon with DRIE process and is protected by hermetically sealed silicon cap from the environment. The
device features user selectable full scale of ±2g/ ±4g/ ±8g/ ±16g measurement range with data output rate from
1Hz to 1 kHz with signal condition, temperature compensation, self-test, motion detection imbedded. The da380
has a self-test mode for user to check the functioning of the sensor and a power-down mode that makes it good for
handset power management. Flexible interrupt provided greatly simplify the algorithm for various motion status
detections. Standard I2C interface is used to communicate with the chip.
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Content
1 Block diagram and pin description ............................................................................................................................. 9
1.1 Block diagram ............................................................................................................................................. 9
1.2 Pin description............................................................................................................................................ 9
2 Mechanical and electrical specifications .................................................................................................................. 11
2.1 Mechanical characteristics ....................................................................................................................... 11
2.2 Electrical characteristics ........................................................................................................................... 12
2.3 Absolute maximum ratings....................................................................................................................... 13
3 Communication interface ......................................................................................................................................... 14
3.1 Communication interface Electrical specification .................................................................................... 14
3.1.1 I2CElectrical specification ................................................................................................................. 14
3.2 Digital interface operation........................................................................................................................ 15
3.2.1 I2C Operation.................................................................................................................................... 15
4 Terminology and functionality.................................................................................................................................. 17
4.1 Terminology .............................................................................................................................................. 17
4.1.1 Sensitivity ......................................................................................................................................... 17
4.1.2 Zero-g level ....................................................................................................................................... 17
4.2 Functionality ............................................................................................................................................. 17
4.2.1 Power mode ..................................................................................................................................... 17
4.2.2 Sensor data ....................................................................................................................................... 18
4.2.3 Self-test............................................................................................................................................. 18
4.2.4 Offset compensation ........................................................................................................................ 19
4.2.5 Factory calibration ............................................................................................................................ 19
4.3 Interrupt controller................................................................................................................................... 19
4.3.1 General features ............................................................................................................................... 19
4.3.2 Mapping............................................................................................................................................ 21
4.3.3 Electrical behavior (INT to open-drive or push-pull) ........................................................................ 21
4.3.4 New data interrupt ........................................................................................................................... 21
4.3.5 Active detection................................................................................................................................ 21
4.3.6 Tap detection .................................................................................................................................... 21
4.3.7 Orientation recognition .................................................................................................................... 23
4.3.8 Freefall interrupt............................................................................................................................... 24
5 Application hints....................................................................................................................................................... 26
6 Register mapping...................................................................................................................................................... 27
7 Registers description ................................................................................................................................................ 29
7.1 I2C Configuration (00H) ............................................................................................................................ 29
7.2 CHIPID (01h) ............................................................................................................................................. 29
7.3 ACC_X_LSB (02H) , ACC_X_MSB (03H) ..................................................................................................... 29
7.4 ACC_Y_LSB (04H) , ACC_Y_MSB (05H)...................................................................................................... 29
7.5 ACC_Z_LSB (06H) , ACC_Z_MSB (07H)...................................................................................................... 30
7.6 MOTION_FLAG (09H)................................................................................................................................ 30
7.7 NEWDATA_FLAG (0AH) ............................................................................................................................ 30
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List of tables
Table 1. Pin description ............................................................................................................................................ 10
Table 2. Mechanical characteristic ........................................................................................................................... 11
Table 3. Electrical characteristics.............................................................................................................................. 12
Table 4. Absolute maximum ratings ......................................................................................................................... 13
Table 5. Electrical specification of the I2C interface pins ......................................................................................... 14
Table 6. I2C Address ................................................................................................................................................. 15
Table 7. SAD+Read/Write patterns ........................................................................................................................... 15
Table 8. Transfer when master is writing one byte to slave ..................................................................................... 15
Table 9. Transfer when master is writing multiple bytes to slave............................................................................. 16
Table 10. Transfer when master is receiving (reading) one byte of data from slave ................................................ 16
Table 11. Transfer when master is receiving (reading) multiple bytes of data from slave ....................................... 16
Table 12. Self-test difference values ......................................................................................................................... 19
Table 13. Interrupt mode selection .......................................................................................................................... 19
Table 14. meaning of ‘orient’ bits in symmetric mode............................................................................................. 23
Table 15. meaning of ‘orient’ bits in high-asymmetric mode................................................................................... 23
Table 16. meaning of ‘orient’ bits in low-asymmetric mode.................................................................................... 24
Table 17. blocking conditions for orientation recognition ....................................................................................... 24
Table 18. Register address map ................................................................................................................................ 27
Table 19. I2C Configuration register ......................................................................................................................... 29
Table 20. I2C Configuration description ................................................................................................................... 29
Table 21. WHO_AM_I register .................................................................................................................................. 29
Table 22. Acc_x_lsb register ..................................................................................................................................... 29
Table 23. Acc_x_msb register ................................................................................................................................... 29
Table 24. Acc_y_lsb register ..................................................................................................................................... 29
Table 25. Acc_y_msb register ................................................................................................................................... 30
Table 26. Acc_z_lsb register ..................................................................................................................................... 30
Table 27. Acc_z_msb register ................................................................................................................................... 30
Table 28. Motion_interrupt register ......................................................................................................................... 30
Table 29. Motion_interrupt register description ...................................................................................................... 30
Table 30. Data_interrupt register ............................................................................................................................. 30
Table 31. Data_interrupt register description .......................................................................................................... 30
Table 32. Tap & active status register ....................................................................................................................... 31
Table 33. Tap & active status register description .................................................................................................... 31
Table 34. Orientation status register ........................................................................................................................ 31
Table 35. Orientation status register description ..................................................................................................... 31
Table 36. G-range register ........................................................................................................................................ 32
Table 37. G-range register description ..................................................................................................................... 32
Table 38. ODR and Axis disable register ................................................................................................................... 32
Table 39. ODR and Axis disable register description ................................................................................................ 32
Table 40. Power Mode & BW register ...................................................................................................................... 33
Table 41. Power Mode & BW register description ................................................................................................... 33
Table 42. Swap & Polarity register ............................................................................................................................ 33
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List of figures
Figure 1 Block Diagram .............................................................................................................................................. 9
Figure 2 Pin Connections ........................................................................................................................................... 9
Figure 3 I2C Slave timing diagram ........................................................................................................................... 14
Figure 4 I2C Protocol ................................................................................................................................................ 15
Figure 5 power mode............................................................................................................................................... 18
Figure 6 Interrupt mode .......................................................................................................................................... 20
Figure 7 Timing of Tap detection ............................................................................................................................. 22
Figure 8 Definition of vector components .............................................................................................................. 23
Figure 9 da380 I2C Electrical connection ................................................................................................................ 26
Figure 10 10 Pin LGA Mechanical data and package dimensions ........................................................................... 44
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Top=25℃,
current consumption in low
Idd_lp ODR=250Hz, 2 uA
power mode
BW=500Hz
current consumption in
Idd_sm Top=25℃ 0.7 uA
suspend mode
Digital high level input
VIH I2C 0.7*Vdd_IO V
voltage
Digital low level input
VIL I2C 0.3*Vdd_IO V
voltage
VOH high level output voltage 0.9*Vdd_IO V
VOL Low level output voltage 0.1*Vdd_IO V
BW System bandwidth 1.95 500 Hz
ODR Output data rate 1 1000 Hz
Wake-up
twu From stand-by 1 ms
time
Start-up
tsu From power off 3 ms
time
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Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device under these conditions is not implied. Exposure to
maximum rating conditions for extended periods may affect device reliability.
This is a mechanical shock sensitive device, improper handling can cause permanent damages to the part.
This is an ESD sensitive device, improper handling can cause permanent damages to the part.
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3 Communication interface
The figure below shows the definition of the I2C timing given in Table5:
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I2C bus uses SCL and SDA as signal lines. Both lines are connected to VDDIO externally via pull-up resistors so that
they are pulled high when the bus is free. The I2C device address of da380 is shown below.
0 1 0 0 1 1 1 0/1
The I2C interface protocol has special bus signal conditions. Start (S), stop (P) and binary data conditions are shown
below. At start condition, SCL is high and SDA has a falling edge. Then the slave address is sent. After the 7 address
bits, the direction control bit R/W selects the read or write operation. When a slave device recognizes that it is being
addressed, it should acknowledge by pulling SDA low in the ninth SCL (ACK) cycle.
At stop condition, SCL is also high, but SDA has a rising edge. Data must be held stable at SDA when SCL is high.
Data can change value at SDA only when SCL is low.
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Table 10. Transfer when master is receiving (reading) one byte of data from slave
Master S SAD+W SUB SR SAD+R NMASK P
Slave SAK SAK SAK DATA
Table 11. Transfer when master is receiving (reading) multiple bytes of data from slave
Master S SAD+W SUB SR SAD+R MAK MAK NMASK P
Slave SAK SAK SAK DATA DATA DATA
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4.1 Terminology
4.1.1 Sensitivity
Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1 g acceleration to it. As the
sensor can measure DC accelerations this can be done easily by pointing the axis of interest towards the center of
the earth, noting the output value, rotating the sensor by 180 degrees (pointing to the sky) and noting the output
value again. By doing so, ±1 g acceleration is applied to the sensor. Subtract the larger output value from the
smaller one, and dividing the result by 2, leads to the actual sensitivity of the sensor. This value changes very
little over temperature and also time. The sensitivity tolerance describes the range of sensitivities of a large
population of sensors.
Zero-g level offset (TyOff) describes the deviation of an actual output signal from the ideal output signal if no
acceleration is present. A sensor in a steady state on a horizontal surface measure 0 g in X axis and 0 g in Y axis
whereas the Z axis measure 1 g. The output is ideally in the middle of the dynamic range of the sensor (content of
output data registers are 00h, data expressed as 2’s complement number). A deviation from ideal value in this
case is called Zero-g offset. Offset is to some extent a result of stress to MEMS sensor and therefore the offset can
slightly change after mounting the sensor onto a printed circuit board or exposing it to extensive mechanical stress.
Offset changes little over temperature; see “Zero-g level change vs. temperature”. The Zero-g level tolerance
(TyOff) describes the standard deviation of the range of Zero-g levels of a population of sensors.
4.2 Functionality
The da380 has three different power modes. Besides normal mode, which represents the fully operational state of the
device, there are two special energy saving modes: low-power mode and suspend mode.
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Normal
mode
In normal mode, all parts of the electronic circuit are held powered-up and data acquisition is performed continuously.
In suspend mode, the whole analog part, including the oscillator, Ana LDO, Dig LDO and Drive Buffer are all powered
down, no data acquisition is performed and the only supported operation is to read/write the registers. Suspend mode is
entered by writing ‘11’ or ‘10’ to the ‘power_mode’ bits.
In low power mode, the device is periodically switching between a sleep phase and a wake-up phase. The wake-up
phase essentially corresponding to operation in normal mode with complete power-up of the circuitry. During the sleep
phase the analog part except the oscillator is powered down.
During the wake-up phase, if a enabled interrupt is detected, the device stays in the wake-up phase as long as the
interrupt condition endures (non-latched interrupt), or until the latch time expires (temporary interrupt), or until the
interrupt is reset (latched interrupt). If no interrupt detected, the device enters the sleep phase.
The width of acceleration data is 14bits given in two’s complement representation. The 14bits for each axis are split
into an MSB part (one byte containing bits 13 to 6) and an LSB lower part (one byte containing bits 5 to 0 and a
new_data flag).
4.2.3 Self-test
This feature permits to check the sensor functionality by applying electrostatic forces to the sensor core instead of
external accelerations. By actually deflecting the seismic mass, the entire signal path of the sensor can be tested.
Activating the self-test results in a static offset of the acceleration data; any external acceleration or gravitational force
applied to the sensor during active self-test will be observed in the output as a superposition of both acceleration and
self-test signal.
The self-test is activated individually for each axis by writing 1 to the register ‘self_test_en’bits. It is possible to control
the direction of the deflection though bit ‘selt_test_sign’ for each axis. The excitation occurs in positive (negative)
direction if ‘self_test_sign’ = ‘0b’ (‘1b’).
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In order to ensure a proper interpretation of the self-test signal it is recommended to perform the self-test for both
directions and then to calculate the difference of the resulting acceleration values. Table12 show the difference for each
axis.
User performed offset calibration is released to users to compensate the after-board-mount offset, which can also
compensate the 0-g offset from +/-500mg to +/-2.93mg.
The IC interface is factory calibrated for sensitivity (So) and Zero-g level (TyOff). The trimming values are
stored inside the device in a nonvolatile memory. The trimming parameters are downloaded into the registers after
da380 reset (POR or software reset). This allows using the device without further calibration.
Interrupt engines are integrated in the da380. If the condition of an enabled interrupt is fulfilled, the corresponding
status bit is set to 1 and the selected interrupt pin is activated. There is one interrupt pin, INT; interrupts can be freely
mapped to this pin.
An interrupt is cleared depending on the selected interrupt mode, which is common to all interrupts. There are three
different interrupt modes: non-latched, latched and temporary. The mode is selected by the ‘latch_int’ bits according to
table18.
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An interrupt is generated if its activation condition is met. It can’t be cleared as long as the activation condition is
fulfilled. In the non-latched mode the interrupt status bit and the selected pin INT are cleared as soon as the activation
condition is no more valid. Exceptions to this behavior are the new data and orientation, which are automatically reset
after a fixed time.
In the latched mode an asserted interrupt status and the selected pin are cleared by writing 1 to bit ‘reset_int’. If the
activation condition still holds when it is cleared, the interrupt status is asserted again with the next change of the
acceleration registers.
In the temporary mode an asserted interrupt and selected pin are cleared after a defined period of time. The behavior of
the different interrupt modes is shown in figure10.
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4.3.2 Mapping
The mapping of interrupts to the interrupt pins is done by registers ‘interrupt_mapping’ (0x19 and 0x1a), setting
int_inttyp to 1 can map this type interrupt to INT pin.
The interrupt pin can be configured to show desired electrical behavior. The ‘active’ level for each pin is set by register
bit int_lvl, if int_lvl = 0, then the pin INT is 0 active. Also the electric type of the interrupt pin can be selected. By
setting int_od = 1, the interrupt pin output type can be set to be open-drive.
This interrupt serves for synchronous reading of acceleration data. It is generated after an acceleration data was
calculated. The interrupt is cleared automatically before the next acceleration data is ready.
Active detection uses the slope between successive acceleration signals to detect changes in motion. An interrupt is
generated when the slope (absolute value of acceleration difference) exceeds a preset threshold. The threshold is set
with the value of register ‘active_th’ with the LSB corresponding to 16 LSB of acceleration data, that is 3.9mg in
2g-range, 7.8mg in 4g-range, 15.6mg in 8g-range and 31.3mg in 16g-range. And the maximum value is 1g in 2g-range,
2g in 4g-range, 4g in 8g-range and 8g in 16g-range.
The time difference between the successive acceleration signals depends is fixed to 1ms.
Active detection can be enabled (disabled) for each axis separately by writing ‘1’ to bits ‘active_en_x/y/z’. The active
interrupt is generated if the slope of any of the enabled axes exceeds the threshold for [‘active_dur’+1] consecutive
times. As soon as the slopes of all enabled axes fall below this threshold for [‘active_dur’+1] consecutive times, the
interrupt is cleared unless the interrupt signal is latched.
The interrupt status is stored in bit ‘active_int’. The bit ‘active_first_x/y/z’ record which axis triggered the active
interrupt first and the sign of this acceleration data that triggered the interrupt is recorded in the bit ‘active_sign’.
Tap detection has a functional similarity with a common laptop touch-pad or clicking keys of a computer mouse. A tap
event is detected if a pre-defined pattern of the acceleration slope is fulfilled at least for one axis. Two different tap
events are distinguished: A single tap is a single event within a certain time, followed by a certain quiet time. A double
tap consists a first such event followed by a second event within a defined time.
Single tap interrupt is enabled by writing 1 to bit ‘s_tap_int_en’ and double tap interrupt is enabled by writing 1 to bit
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‘d_tap_int_en’. The status of the single tap interrupt is stored in bit ‘s_tap_int’ and the status of the double tap interrupt
is stored in bit ‘d_tap_int’.
The slope threshold for detecting a tap event is set by bits “tap_th” with the LSB corresponding to 256LSB of
acceleration data that is 62.5mg in 2g-range, 125mg in 4g-range, 250mg in 8g-range, 500mg in 16g-range. And the
maximum value equals to the full scale in each range.
The parameter ‘tap_shock’ and ‘tap_quiet’ apply to both single and double tap detection, while ‘tap_dur’ applies to
double detection only. Within the duration of ‘tap_shock’ any slope exceeding ‘tap_th’ after the first event is ignored,
within the duration of ‘tap_quiet’ there must be no slope exceeding ‘tap_th’, otherwise the first event will be cancelled.
A single tap is detected and the single tap interrupt is generated after the combination durations of ‘tap_shock’ and
‘tap_quiet’, if the corresponding slope conditions are fulfilled. The interrupt is cleared after a delay in non-latched
mode.
A double tap is detected and the double tap interrupt is generated if an event fulfilling the conditions for a single tap
occurs within the set duration in ‘tap_dur’ after the completion of the first tap event. The interrupt is cleared after a
delay in non-latched mode.
The sign of the slope of the first tap which triggered the interrupt is stored in bit ‘tap_sign’ (0 means positive, 1 means
negative). The axis which triggered the interrupt is indicated by bits ‘tap_first_x/y/z’.
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The orientation recognition feature informs on an orientation change of sensor with respect to the gravitation field
vector ‘g’. The measured acceleration vector components with respect to the gravitation field are defined as shown in
figure 8.
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In the preceding tables, the parameter ‘hyst’ stands for a hysteresis which can be selected by bits ‘orient_hyst’. 1LSB of
‘orient_hyst’ always corresponds to 62.5mg in any g-range. The MSB of ‘orient’ bits contains information about the
direction of the z-axis. It is set to 0(1) if ac_z>=0 (acc_z<0). The hysteresis for z axis is fixed to 0.2g.
The orient interrupt is enabled by writing ‘orient_en’ bit. The interrupt is generated if the value of ‘orient’ has changed.
It is automatically cleared after one stable period of the orient value in non-latched mode. In temporary latched or
latched mode, the orient value is kept fixed as long as the interrupt persists. After cleaning the interrupt, the ‘orient’
will updated with the next following value change.
The change of the ‘orient’ value and the generation of the interrupt can be blocked according to conditions selected by
setting the value of bits ‘orient_blocking’ as described by table17.
This interrupt is based on the comparison of acceleration data against a low-g threshold. The interrupt is enabled by
writing 1 to the bit ‘freefall_en’. There are two modes available: single mode’ and sum mode. In single mode the
acceleration of each axis is compared with the threshold. In sum mode, the sum of absolute values of all accelerations
|acc_x| + |acc_y| + |acc_z| is compared with the threshold. The mode is selected by the bit ‘freefall_mode’. The freefall
threshold is set through the ‘freefall_th’ bits with 1 LSB corresponding to an acceleration of 7.81mg. A hysteresis can
be selected by setting the ‘freefall_hy’ bits with 1 LSB corresponding to 125mg.
The freefall interrupt is generated if the absolute values of the acceleration of all axes or their sum are lower than the
threshold for at least the time defined by ‘freefall_dur’ bits. The interrupt is reset if the absolute value of at least one
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axis or the sum is higher than the threshold plus the hysteresis for at least one data acquisition. The interrupt status is
stored in bit ‘freefall_int’.
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5 Application hints
The device core is supplied through Vdd line while the I/O pads are supplied through Vdd_IO line. Power supply
decoupling capacitors (100 nF ceramic) should be placed as near as possible to VDD of the device (common
design practice).
The functionality of the device and the measured acceleration data is selectable and accessible through the I2C
interface. The functions, the threshold and the timing of the interrupt pin INT can be completely programmed by
the user through the I2C interface.
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6 Register mapping
The table given below provides a listing of the 8 bit registers embedded in the device and the related addresses:
Table 18. Register address map
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7 Registers description
X-axis acceleration data, the value is expressed in two complement byte and are left justified.
Y-axis acceleration data, the value is expressed in two complement byte and are left justified.
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Z-axis acceleration data, the value is expressed in two complement byte and are left justified.
S_tap_int 0:no single tap interrupt;1: single tap interrupt has occurred
D_tap_int 0:no double tap interrupt;1: double tap interrupt has occurred
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LSB = 2mg
duration time range from 2ms to 512ms
default: 20ms
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100:250ms
101:375ms
110:500ms
111:700ms
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10: low-asymmetrical
11:synmmetrical
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8 Package information
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9 Revision history
Table 94. Document revision history
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