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Test Object - Device Settings

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Substation/Bay:
Substation: Substation address:
Bay: Bay address:
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Device:
Name/description: Test Object Manufacturer:
Device type: Device address:
Serial/model number:
Additional info 1:
Additional info 2:

Hardware Configuration
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Test Equipment
Type Serial Number
CMC256plus
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Hardware Check
Performed At Result Details
Not yet performed

OC STG1 AND STG2:

Test Object - Overcurrent Parameters
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General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No
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Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes OC STG-1 IEC Definite Time 1.00 Iref 0.30 s 0.95 Non Directional
Yes OC STG-2 IEC Definite Time 5.00 Iref 0.10 s 0.95 Non Directional

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Test Module
Name: OMICRON Overcurrent Version: 4.20
Test Start: 29-Sep-2024 16:02:02 Test End: 29-Sep-2024 16:02:20
User Name: Manager:
Company:

Test Settings:
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Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a
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Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-E OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L2-E OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L3-E OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L1-L2 OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L2-L3 OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L3-L1 OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L1-L2-L3 OC STG-1 2.000 2.000 A n/a 300.0 ms 260.0 ms 340.0 ms
L1-E OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
L2-E OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
L3-E OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
L1-L2 OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
L2-L3 OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
L3-L1 OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
L1-L2-L3 OC STG-2 2.000 10.00 A n/a 100.0 ms 60.00 ms 140.0 ms
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Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Bin. in 1 1
Bin. in 2 X
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Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
L1-E n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
L2-E n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
L3-E n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
L1-L2 n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
L2-L3 n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
L3-L1 n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
L1-L2-L3 n/a 50.00 ms 1.000 A 950.0 mA 1.050 A 950.0 m
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Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-E OC STG-1 2.000 2.000 A n/a 300.0 ms 280.0 ms -6.667 % No Passed
L2-E OC STG-1 2.000 2.000 A n/a 300.0 ms 320.0 ms 6.667 % No Passed
L3-E OC STG-1 2.000 2.000 A n/a 300.0 ms 280.0 ms -6.667 % No Passed
L1-L2 OC STG-1 2.000 2.000 A n/a 300.0 ms 320.0 ms 6.667 % No Passed
L2-L3 OC STG-1 2.000 2.000 A n/a 300.0 ms 280.0 ms -6.667 % No Passed
L3-L1 OC STG-1 2.000 2.000 A n/a 300.0 ms 320.0 ms 6.667 % No Passed
L1-L2-L3 OC STG-1 2.000 2.000 A n/a 300.0 ms 280.0 ms -6.667 % No Passed
L1-E OC STG-2 2.000 10.00 A n/a 100.0 ms 120.0 ms 20.00 % No Passed
L2-E OC STG-2 2.000 10.00 A n/a 100.0 ms 80.00 ms -20.00 % No Passed
L3-E OC STG-2 2.000 10.00 A n/a 100.0 ms 120.0 ms 20.00 % No Passed
L1-L2 OC STG-2 2.000 10.00 A n/a 100.0 ms 80.00 ms -20.00 % No Passed
L2-L3 OC STG-2 2.000 10.00 A n/a 100.0 ms 120.0 ms 20.00 % No Passed
L3-L1 OC STG-2 2.000 10.00 A n/a 100.0 ms 80.00 ms -20.00 % No Passed
L1-L2-L3 OC STG-2 2.000 10.00 A n/a 100.0 ms 120.0 ms 20.00 % No Passed
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Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
L1-E n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
L2-E n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
L3-E n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
L1-L2 n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
L2-L3 n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
L3-L1 n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
L1-L2-L3 n/a 1.000 A n/a n/a 950.0 m n/a n/a No pick-up
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State:
21 out of 21 points tested.
14 points passed.
7 points failed.

Test performed offline: Test results are simulated!

General Assessment: Test failed!

EF STG1 AND STG-2:

Test Object - Overcurrent Parameters
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General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No
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Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EF STG-1 IEC Definite Time 0.20 Iref 0.30 s 0.95 Non Directional
Yes EF STG-2 IEC Definite Time 1.50 Iref 0.10 s 0.95 Non Directional

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Test Module
Name: OMICRON Overcurrent Version: 4.20
Test Start: 29-Sep-2024 16:02:25 Test End: 29-Sep-2024 16:02:33
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a
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Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-E EF STG-1 2.000 400.0 m A n/a 300.0 ms 260.0 ms 340.0 ms
L2-E EF STG-1 2.000 400.0 m A n/a 300.0 ms 260.0 ms 340.0 ms
L3-E EF STG-1 2.000 400.0 m A n/a 300.0 ms 260.0 ms 340.0 ms
L1-E EF STG-2 2.000 3.000 A n/a 100.0 ms 60.00 ms 140.0 ms
L2-E EF STG-2 2.000 3.000 A n/a 100.0 ms 60.00 ms 140.0 ms
L3-E EF STG-2 2.000 3.000 A n/a 100.0 ms 60.00 ms 140.0 ms
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Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Bin. in 1 1
Bin. in 2 X
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Pick-up / Drop-off Test:
Type Angle Resolution I Pick-up Reset Ratio
nom min max nom
L1-E n/a 50.00 ms 200.0 mA 150.0 mA 250.0 mA 950.0 m
L2-E n/a 50.00 ms 200.0 mA 150.0 mA 250.0 mA 950.0 m
L3-E n/a 50.00 ms 200.0 mA 150.0 mA 250.0 mA 950.0 m
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Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-E EF STG-1 2.000 400.0 m A n/a 300.0 ms 280.0 ms -6.667 % No Passed
L2-E EF STG-1 2.000 400.0 m A n/a 300.0 ms 320.0 ms 6.667 % No Passed
L3-E EF STG-1 2.000 400.0 m A n/a 300.0 ms 280.0 ms -6.667 % No Passed
L1-E EF STG-2 2.000 3.000 A n/a 100.0 ms 120.0 ms 20.00 % No Passed
L2-E EF STG-2 2.000 3.000 A n/a 100.0 ms 80.00 ms -20.00 % No Passed
L3-E EF STG-2 2.000 3.000 A n/a 100.0 ms 120.0 ms 20.00 % No Passed
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Pick-up / Drop-off Test Results:
Type Angle I Pick-up I Drop-off Reset Ratio Result
nom act act nom act Error
L1-E n/a 200.0 m A n/a n/a 950.0 m n/a n/a No pick-up
L2-E n/a 200.0 m A n/a n/a 950.0 m n/a n/a No pick-up
L3-E n/a 200.0 m A n/a n/a 950.0 m n/a n/a No pick-up
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State:
9 out of 9 points tested.
6 points passed.
3 points failed.

Test performed offline: Test results are simulated!

General Assessment: Test failed!