Non-destructive Testing & Evaluation of Materials - Tools for Flaw and Damage
assessment of components
                                                  MTL7160: Fracture and Fatigue
                                                              Lecture-4: 06.04.22
Amitava Mitra                                                             amitra@iitj.ac.in
Visiting Professor, Department of Physics &
Professor In-charge, Office of Infrastructure Engineering
Indian Institute of Technology Jodhpur, Karwar,
Jodhpur-342037
Advances in Ultrasonics
      Time-Of-Flight-Diffraction (TOFD) Technique
       Phased Array Ultrasonic Technique
 Diffraction
 Diffraction refers to the bending of waves around an edge of an object
 Light has very short wavelength. So small objects or gaps can affect the
  direction .
 Have you ever wondered why you can hear someone who is round the
  corner of a building, long before you see them?
 Sound waves bend around objects of similar size to their wavelength
 The wall above has similar size to sound wavelength– The effect of bending
  is called diffraction
Diffraction
 Diffraction
        The incoming wave falls on the defect.
                                                  Incident
                                                  wave
                                                               Diffracted waves
                                                                                  • All directions
                                                                                  • Low energy
                                      Reflected
                                       wave                          FLAW         • Independent of
  Each point of the defect                                                          incidence angle
  generates new elementary
  spherical waves called
  diffraction
                                                  Diffracted waves
 Signals Obtained at the receiving end
      • Signals Received
          • Lateral wave
          • Subsurface
          • Back-wall echo
          • Mode converted (shear wave) echo
      • Define top and bottom part of flaw
 Signals Obtained at the receiving end
      • Signals Received
           Lateral wave
           Subsurface
           Back-wall echo
           Mode converted (shear wave) echo
      • Define top and bottom part of flaw
 TOFD: Typical Setup
                        Transmitter                       Receiver
                                       Lateral wave
                                                       Upper tip
                                                      Lower tip
                                                  Back-wall reflection
 A-Scan Signals
       Transmitter
                                                                Receiver
                              Lateral wave
                                         Back-wall reflection
                     LW                                         BW
                          Upper tip    Lower tip
 Upper Surface Breaking Crack
              Transmitter        Lateral wave is blocked                          Receiver
                                                           Back-wall reflection
                                                                                  BW
                   No Lateral wave
                                                Crack tip
                         a
The 1st signal time is related to the under-skin wave:
                          TL= 2S/C                           ………(1)
The 2nd signal time is related to the diffraction from the upper tip of the defect:
                         T1 = 2(S2+d2)1/2/C                 ………(2)
The 3rd signal is related to the lower tip of the defect :
                           T2 = 2(S2 + (d+a)2)1/2/C          ……….(3)
The 4th signal is related to the signal that arrives from the back wall:
                           Tbw = 2(S2 + H2 )1/2/C            ………..(4)
                        aa
Solving Eqn.-(1), (2), (3) the defect’s depth (d) & the defect’s length (a) can be
calculated by knowing the distance between the two probes (2S) and the
velocity of sound (C) in the medium
The defect’s depth is
                         d= ½(c2T12 – 4s2)1/2              (5)
The defect’s length is calculated from
                         a= ½ (c2T22 – 4s2)1/2 – d         (6)
 Near Surface Crack
                       2
                           1   2
 Back Wall Surface Breaking Crack
              Transmitter
                                                                        Receiver
                                     Lateral wave
                                               Back wall echo blocked
                            LW
                                                              No back wall
                                                    Tip          echo
 Concave Root
                               1
                                                    2
                       2                        3
                           3
                 Distortion of back-wall echo
 Horizontal Planar Defect
              Transmitter
                                                                           Receiver
                                         Lateral wave
                                                        Reflected signal
                                                    Back wall reflection
                             LW                                            BW
                                  Reflection echo
 Lack of Fusion – Inter pass
                                        1
                                2
                                    3
 Porosity
                                            1
             2        1
                                                2
                  3
 Porosity may
  image in many
  forms whether
  individual or
  cluster
Advantages of TOFD Technique
• Wide coverage area using a pair of transducers
• Accurate flaw sizing; amplitude-independent
• Sizing technique using time-of-flight information
• On-line volume inspection - very fast scanning
• Sensitive to a variety of defects
• Amplitude-insensitive - acoustical coupling less critical
Phased Array Ultrasonic
Phased Array Probes
                                 linear array probe can sweep
Monocrystal single-angle         the focused beam through the
inspection requires multiangle   appropriate region of the
scans and probe movement         component without probe
                                 movement
       Conventional UT                         Phased Array UT
 Conventional ultrasonic              Phased array probes typically
transducers for NDT commonly          consist of a transducer assembly with
consist of either a single active     from 16 to as many as 256 small
element that both generates and       individual elements that can each be
receives high frequency sound         pulsed separately. These may be
waves, or two paired elements, one    arranged in a strip (linear array), a
for transmitting and one for          ring (annular array), a circular matrix
receiving.                            (circular array), or a more complex
                                      shape.
 Conventional UT have single          Phased array systems can sweep a
refracted angles or can focus at a    sound beam through a range of
specific depth. Imaging is possible   refracted angles or along a linear
by scanning using the physical        path, or dynamically focus at a number
movement of probe or sample           of different depths, thus increasing
                                      both flexibility and capability in
                                      inspection setups.
     Similarity between conventional UT and Phased array
In conventional & phased array probes may be designed for direct
contact use, as part of an angle beam assembly with a wedge, or for
immersion use with sound coupling through a water path.
 Transducer frequencies are most commonly in the range from 2 to 10
MHz.
 Both include a sophisticated computer-based instrumentation that
capable of driving the multi-element probe, receiving and digitizing the
returning echoes, and plotting that echo information in various standard
formats.
Linear scanning
The individual transducer elements are activated from one side to the
other with constant phasing. Without moving the probe or work piece can
be scanned in the plane of the linearly arranged elements.
Steering
 Introducing time delay between the firing of each element , a wave front
can be generated obliquely to the surface,
 Due to the additional use of a wedge delay, transversal waves are
reverberated in the preferential direction predetermined by the wedge
angle. The sound field can also be steered in the range of 35 to 75°, which
is typical for the weld inspection.
                                                 Delay
Focusing
 The sound field of a phased array can be focussed in two ways.
   (1) If all the transducer elements are activated in parallel, a sound
   field is created which is identical to that of a single element probe
   with the same transducer size.
        This results in the maximum near field length N.
         Reduced near field length (N) obtain with reduction of number of
        transducer elements connected in parallel.
    (2) Phased activation of the transducer elements from outside to
    inside, thus creating a forced, concave wave front with a preferred
    focus: the near field length is reduced in a similar manner to the
    effect of a lens..
In Phased Array UT
  Scanning, steering and focussing can be combined almost arbitrarily.
   Maximum of flexibility in terms of sound field control can be
  achieved,.
  Ultrasonic testing becomes faster and hence more economical.