CMV4000
CMV4000
Document
Published by
ams OSRAM Group
Datasheet
DS000728
CMV4000
Global Shutter CMOS Image Sensor for Machine
Vision
v6-00 • 2023-Aug-04
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Content Guide
Content Guide
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General Description
1 General Description
The CMV4000 is a high sensitivity, pipelined global shutter CMOS image sensor with 2048 x 2048
pixel resolution capable of HD format. Pipelining allows exposure during read out. The state-of-the-art
pixel architecture offers true correlated double sampling (CDS) reducing the fixed pattern noise and
dark noise significantly. The imager features 16 LVDS channels each running at 480 Mbps resulting in
a 180 fps frame rate at full resolution at 10-bit per pixel. A 12-bit mode is available at reduced frame
rate. Driving and read-out are programmed over a serial peripheral interface. An internal timing
generator produces the signals needed for read-out and exposure control of the image sensor.
External exposure triggering remains possible.
Figure 1:
Added Value of Using CMV4000
Benefits Features
1.2 Applications
● Machine vision
● 3D imaging
● Motion capture
● Bar and 2D code scanning
● Intelligent traffic systems
● Video and broadcast
● Biometrics
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General Description
Figure 2:
Functional Blocks of CMV4000
External driving
signals
Sequencer
Input clock
Pixel array
2048 x 2048 active pixels
...
Analog Front End
SPI
(gain, offset, ADCs)
SPI signals
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Ordering Information
2 Ordering Information
Figure 3:
Ordering Code Information
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Ordering Information
Figure 4:
Differences Between Versions
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Absolute Maximum Ratings
Figure 5
Absolute Maximum Ratings of CMV4000
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Electrical Characteristics
4 Electrical Characteristics
All limits are guaranteed. The parameters with Min and Max values are guaranteed with production
tests or SQC (Statistical Quality Control) methods.
Figure 6:
Electrical Characteristics of CMV4000
Power Supplies
Digital supply
VDD20 2.05 2.1 2.15 V
LVDS, ADC
Analog supply
VDD33 3.2 3.3 3.4 V
ADC, PGA
Analog pixel
VDDPIX 2.9 3.0 3.1 V
supply
Analog pixel reset
Vres_h 3.2 3.3 3.4 V
supply
Readout @ Version2 380 mA
IDD20 Supply current
Readout @ Version3 360 mA
Readout @ Version2 65 mA
IDD33 Supply current
Readout @ Version3 90 mA
Readout @ Version2 20 mA
IDDPIX Supply current
Readout @ Version3 20 mA
Ires_h Supply current Readout 15 mA
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Electrical Characteristics
Differential output
VOD Steady State, RL = 100 Ω 247 350 454 mV
voltage
Difference in VOD
between
∆VOD Steady State, RL = 100 Ω 50 mV
complementary
output states
Common mode
VOC(1) Steady State, RL = 100 Ω 1.26 1.37 1.50 V
voltage
Difference in VOC
between
∆VOC Steady State, RL = 100 Ω 50 mV
complementary
output states
Output short circuit
IOS,GND VOUTP=VOUTN=GND 24 mA
current to ground
Output short circuit
IOS,PN VOUTP=VOUTN 12 mA
current
Differential input
VID Steady state 100 350 600 mV
voltage
Receiver input
VIC Steady state 0.0 2.4 V
range
CLK_IN 5 48 MHz
(1) Voc is dependent on the 2.1 V supply voltage; therefore, these values differ from the TIA/EIA-644A spec.
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Specification Overview
5 Specification Overview
Below are the typical electro-optical specifications of CMV4000. These are typical values with typical
supplies at room temperature.
Figure 7:
Electro-Optical Characteristics
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Specification Overview
When a color sensor is used an IR-cutoff filter should be placed in the optical path of the sensor.
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Specification Overview
Figure 8:
Transmittance Curve Offer D263 Cover Plain Glass
100
90
80
70
Transmittance [%]
60
50
40
30
20
10
0
300 400 500 600 700 800 900 1000 1100
Wavelength [nm]
Figure 9:
Transmittance Curve for D263 AR Coated Glass
100
90
80
70
Transmittance [%]
60
50
40
30
20
10
0
300 400 500 600 700 800 900 1000 1100
Wavelength [nm]
When a color version of the CMV4000 is used, the color filters are applied in a Bayer pattern. The
color version of the CMV4000 always has micro lenses. The typical spectral response of the CMV with
color filters and D263 cover glass is shown in Figure 10. The use of an IR cut-off filter in the optical
path of the CMV4000 image sensor is necessary to obtain good color separation when using light with
an NIR component. The typical spectral response of a monochrome CMV4000 with microlenses can
be found in Figure 10 as well.
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Specification Overview
Figure 10:
Typical Spectral Response of CMV4000 with RGB Color Filters and D263 Cover Glass and
Mono
70
Blue_v2
Green1_v2
60 Green2_v2
Red_v2
50 Mono E5
QE [%]
40
30
20
10
0
400 500 600 700 800 900 1000
Wavelength [nm]
A variation from the standard CMV4000 image sensors is processed on 12 µm epi (E12) Si wafers.
The thicker epi-layer wafer starting material increases significantly the QE for wavelengths above
600 nm. Around 900 nm the QE is about doubled and increases from 8% to 16%. This is shown in
Figure 11.
Figure 11:
Response of E12 Devices and Normal Devices
70
Mono E5
Mono E12
60
50
QE [%]
40
30
20
10
0
400 500 600 700 800 900 1000
Wavelength [nm]
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Specification Overview
The typical angular response for a CMV4000 sensor can be seen in Figure 12. The data includes the
horizontal and vertical angles.
Figure 12:
Horizontal and Vertical Angular Response
100
Horizontal
90
Vertical
80
Relative Response [%]
70
60
50
40
30
20
10
0
-50 -30 -10 10 30 50
Angle [°]
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Functional Description
6 Functional Description
The pixel array consists of 2048 x 2048 square global shutter pixels with a pitch of 5.5 µm (5.5 μm x
5.5 μm). This results in an optical area of close to 1 optical inch (16 mm). This means that off-the
shelve C-mount lenses can be used.
The pixels are designed to achieve maximum sensitivity with low noise and low PLS specifications.
Micro lenses are placed on top of the pixels for improved fill factor and quantum efficiency (>50%).
The analog front end consists of 2 major parts, a column amplifier block and a column ADC block.
The column amplifier prepares the pixel signal for the column ADC and applies analog gain if desired
(programmable using the SPI interface). The column ADC converts the analog pixel value to a 10-bit
or 12-bit value. A digital offset can also be applied to the output of the column ADC’s. All gain and
offset settings can be programmed using the SPI interface.
The LVDS block converts the digital data coming from the column ADC into standard serial LVDS data
running at maximum 480 Mbps. The sensor has 18 LVDS output pairs:
● 16 Data channels
● 1 Control channel
● 1 Clock channel
The 16 data channels are used to transfer 10-bit or 12-bit data words from sensor to receiver. The
output clock channel transports a DDR clock, synchronous to the data on the other LVDS channels.
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Functional Description
This clock can be used at the receiving end to sample the data. The data on the control channel
contains status information on the validity of the data on the data channels, among other useful sensor
status information. Details on the LVDS timing can be found in chapter 6.3.
LVDS requires parallel termination at the receiver side. So between LVDS_CLK_P (pin D1) and
LVDS_CLK_N (pin D2) should be an external 100 Ω resistor. Also all the LVDS outputs should all be
externally terminated at the receiver side. See the TIA/EIA-644A standard for details.
6.1.4 Sequencer
The on-chip sequencer will generate all required control signals to operate the sensor from only a few
external control clocks. This sequencer can be activated and programmed through the SPI interface. A
detailed description of the SPI registers and sensor (sequencer) programming can be found in chapter
6.4 of this document.
The SPI interface is used to load the sequencer registers with data. The data in these registers is used
by the sequencer while driving and reading out the image sensor. Features like windowing,
subsampling, gain and offset are programmed using this interface. The data in the on-chip registers
can also be read back for test and debug of the surrounding system. Chapter 6.2.8 contains more
details on SPI programming and timing.
A 16-bit digital temperature sensor is included in the image sensor and can be controlled by the SPI-
interface. The on-chip temperature can be obtained by reading out the registers with address 126 and
127 (in burst mode, see chapter SPI R for more details on this mode).
A calibration of the temperature sensor is needed for absolute temperature measurements per device
because the offset differs from device to device. The temperature sensor requires a running input
clock (CLK_IN), the other functions of the image sensor can be operational or in standby mode. The
output value of the sensor is dependent on the input clock. A typical temperature sensor output vs.
temperature curve at 40 MHz can be found in Figure 13. The die temperature will be about
10 °C~15 °C higher than ambient temperature. The ceramic package has about the same temperature
as the die.
𝑓 [𝑀𝐻𝑧]
The typical (offset) value of the temperature sensor at 0 °C would be: 1000 ∗ DN. This offset
40
40
can differ per device. A typical slope would be around 0.3 ∗ °C/DN.
𝑓[𝑀𝐻𝑧]
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Functional Description
Figure 13:
Typical Output of the Temperature Sensor of the CMV4000
1400
1200
1000
Digital output (DN)
800
600
400
200
0
-40 -20 0 20 40 60 80
Temperature (C)
Figure 14:
Location of the Temperature Sensor
Pixel (0,0)
Optical center
3.19mm
Temp. sensor
6.51mm
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Functional Description
To power the sensor, eight externally generated supplies are required as listed in Figure 6.
Figure 15:
Different Power Supplies
The power figures are measured at 48 MHz CLK_IN speed in 16 channels mode while constantly
grabbing images. When idle, the sensor will consume about 30% less energy. Reducing the amount of
output channels will reduce power consumption of the VDD20 supply and will have the biggest impact
on the power consumption.
The recommended values for the different power supplies are shown in Figure 6.
All variations on the VDD33 and VDDPIX can contribute to variations (noise) on the analog pixel
signal, which is seen as noise in the image. During the camera design, precautions have to be taken
to supply the sensor with very stable supply voltages to avoid this additional noise.
Because of the peak currents, decoupling is advised. Place large decoupling capacitors directly at the
output of the voltage regulator to filter low noise and improve peak current supply. We advise 1x
330 µF electrolytic, 1x 33 µF tantalum and a 10 µF ceramic capacitor per supply, directly at the output
of the regulator.
Place small decoupling capacitors as close as possible to the sensor between supply pins and ground.
We advise 1x 4.7 µF and 1x 100 nF ceramic capacitor per power supply pin (see pin list) and 1x
100 µF ceramic capacitor per power supply plane (VDD20, VDDPIX, VDD33). Vres_h does not need a
100 µF capacitor. See pin list for exact pin numbers for every supply. Analog and digital ground can be
tied together.
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Functional Description
6.2.2 Biasing
For optimal performance, some pins need to be decoupled to ground or to VDD. Please refer to the
pin list for a detailed description for every pin and the appropriate decoupling if applicable.
Figure 16 gives an overview of the external pins used to drive the sensor. The digital signals are
sampled on the rising edge of the CLK_IN, therefore the length of the signal applied to an input should
be at least 1 CLK_IN period to assure it has been detected. All digital I/O’s have a capacitance of 2 pF
max.
Figure 16:
Digital Input Pins Description
The high-speed LVDS input clock (LVDS_CLK_N/P) defines the output data rate of the CMV4000.
The master clock (CLK_IN) must be 10 or 12 times slower depending on the programmed bit mode
setting. The maximum data rate of the output is 480 Mbps which results in a LVDS_CLK_N/P of
480 MHz and a CLK_IN of 48 MHz in 10-bit mode and 40 MHz in 12-bit mode. The minimum
frequencies are 5 MHz for CLK_IN and 50 MHz for LVDS_CLK_N/P. Any frequency between the
minimum and maximum can be applied by the user and will result in a corresponding output data rate,
like shown in Figure 17.
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Functional Description
Figure 17:
Output Data Rate Depending on the CLK_IN and Bit Mode
The rising edge LVDS input clock can have a limited delay with respect to the rising edge of the
master input clock, depending on clock speed. In Figure 18, the skew limits are shown for different
clock speeds and for an LVDS clock that rises before and after the master input clock. To assure
proper working of the sensor, the skew of the LVDS clock should always fall within these limits, shown
as the green area.
Figure 18:
LVDS Clock Delay Versus Master Clock
CLK_IN
LVDS_CLK 1145
480MHz
600
LVDS_CLK 1240
450MHz
580
LVDS_CLK 1400
400MHz
780
LVDS_CLK 1680
350MHz
660
LVDS_CLK
300MHz
LVDS_CLK
250MHz
640
LVDS_CLK
200MHz
680
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Functional Description
To simplify the calculation, we will assume that the exposure time is shorter than the read-out time and
that the sensor is operating at default settings, taking a full resolution 10-bit image at 48 MHz through
16 outputs. This means that the frame rate will be defined only by the read-out time because the
exposure time happens in parallel with the read-out time. The read-out time is defined by:
● Output clock speed: Max 240 MHz
● ADC mode: 10 or 12-bit
● Number of lines read-out
● Number of LVDS outputs used: Max 16 outputs
If any of these parameters is changed, it will have an impact on the frame rate. In default operation
this will result in 180 fps. The total read-out time is composed of two parts: FOT (frame overhead time)
and the image read-out time.
Equation 1:
16
𝐹𝑂𝑇 = (𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ + (2 ∗ )) ∗ 129 ∗ 𝑚𝑎𝑠𝑡𝑒𝑟 𝑐𝑙𝑜𝑐𝑘 𝑝𝑒𝑟𝑖𝑜𝑑
#𝑜𝑢𝑡𝑝𝑢𝑡𝑠 𝑢𝑠𝑒𝑑
With fot_length (register 73) at its default value of 20, this results in 59.125 µs frame overhead time.
Equation 2:
16
𝐼𝑚𝑎𝑔𝑒 𝑟𝑒𝑎𝑑 − 𝑜𝑢𝑡 𝑡𝑖𝑚𝑒 = (129 ∗ 𝑚𝑎𝑠𝑡𝑒𝑟 𝑐𝑙𝑜𝑐𝑘 𝑝𝑒𝑟𝑖𝑜𝑑 ∗ ) ∗ 𝑛𝑟_𝑙𝑖𝑛𝑒𝑠
#𝑜𝑢𝑡𝑝𝑢𝑡𝑠 𝑢𝑠𝑒𝑑
Reading out a full resolution image, this results in 5.504 ms image read-out time.
The total read-out time is now the sum of the FOT and the image read-out time, which results in
59.125 µs + 5.504 ms or 5.5631 ms to read out a single full resolution image. The frame rate is thus
180 fps.
Figure 19 gives some examples of how the frame rate increases when reading out a smaller frame in
10-bit mode.
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Functional Description
Figure 19:
Frame Rate for Different Frame Size
Figure 20:
Frame Period
Frame period
FRAME_REQ
When the exposure time is greater than the read-out time, the frame rate is mostly defined by the
exposure time itself (because the exposure time would be much longer than the FOT).
The sequence, shown in Figure 21 should be followed when the CMV4000 is started up in default
output mode (480 Mbps, 10-bit resolution). There is no specific startup sequence for the power
supplies needed.
Figure 21:
Start-Up Sequence for 480 Mbps @ 10-Bit
Supply
CLK_IN
1μs
SYS_RES_N
FRAME_REQ
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Functional Description
The master clock CLK_IN (48 MHz for 480 Mbps in 10-bit mode) should start after the rise time of the
supplies. The external reset pin should be released at least 1 μs after the supplies are stable. The first
frame can be requested 1 μs after the reset pin has been released.
If the register settings need to be changed (e.g. when using 12-bit mode), this can be done through an
SPI upload 1 µs after the rising edge on the SYS_RES_N pin, as described in Figure 22. In this case
the FRAME_REQ pulse must not be sent until after the SPI upload is completed, plus a settling time.
This settling time is to ensure that the changes programmed in the SPI upload have taken effect
before an image is captured. The main factor that determines this settling time is a change in ADC
gain, because the voltage over the ramp capacitor has to settle. For typical applications, where the
ADC gain is changed from the default value of 32 to a value that saturates the ADC output (40 to 45 at
48 MHz), the settling time is 7 ms. In extreme cases, when the ADC gain is changed from default to
maximum, the settling time can increase to 20 ms.
Figure 22:
Start-Up Sequence for 12-Bit Mode
Supply
CLK_IN
1μs
SYS_RES_N
Settling time
FRAME_REQ
If a sensor reset is necessary while the sensor is running the sequence in Figure 23 should be
followed. The on-board sequencer will be reset and all programming registers will return to their
default start-up values when a falling edge is detected on the SYS_RES_N pin. As with the start-up
sequence, there is a minimum time of 1 μs plus a settling time needed before a FRAME_REQ pulse
can be sent, to allow the gain settings to settle at their default value.
Figure 23:
Reset Sequence
CLK_IN
FRAME_REQ
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Functional Description
When register settings are uploaded after the reset (e.g. when changing the bit mode), the sequence
of Figure 24 should be followed.
Figure 24:
Reset Sequence When Changing Bit Mode
CLK_IN
1μs
SYS_RES_N
1ms
FRAME_REQ
Programming the sensor is done by writing the appropriate values to the on-board registers. These
registers can be written over a simple serial interface (SPI). The data written to the programming
registers can also be read out over this same SPI interface.
The details of the timing and data format are described in following paragraphs.
SPI Write
The timing to write data over the SPI interface can be found in Figure 25.
Figure 25:
SPI Write Timing
½ CLK 1 CLK
SPI_EN
SPI_CLK
SPI_IN C=’1' A6 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0
The data is sampled by the CMV4000 on the rising edge of the SPI_CLK. The SPI_CLK has a
maximum frequency of 48 MHz. The SPI_EN signal has to be high for half a clock period before the
first data bit is sampled. After the last data bit is sent, SPI_EN has to remain high for 1 clock period
and SPI_CLK has to receive a final falling edge to complete the write operation.
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Functional Description
● 7 address bits: These bits form the address of the programming register that needs to be
written. The address is sent MSB first.
● 8 data bits: These bits form the actual data that will be written in the register selected with the
address bits. The data is written MSB first.
When several sensor registers need to be written, the timing above can be repeated with SPI_EN
remaining high all the time. See the Figure 26 for an example of 2 registers being written in burst.
Figure 26:
SPI Write Timing for 2 Registers in Burst
½ CLK 1 CLK
SPI_EN
SPI_CLK
All registers should be updated during IDLE time. The sensor is not IDLE during a frame burst
(between start of integration of first frame and read-out of last pixel of last frame).
Registers 35-38, 40-69, 100-103 can be updated during IDLE or FOT. Registers 1-34 and 70-71 can
always be updated but it is recommended to update these during IDLE or FOT to minimize image
effects. Registers 78-79 can always be updated without disrupting the imaging process.
SPI Read
The timing to read data from the registers over the SPI interface can be found in Figure 27.
Figure 27:
SPI Read Timing
½ CLK 1 CLK
SPI_EN
SPI_CLK
SPI_IN C=’0' A6 A5 A4 A3 A2 A1 A0
SPI_OUT D7 D6 D5 D4 D3 D2 D1 D0
To indicate a read action over the SPI interface, the control bit on the SPI_IN pin is made ‘0’. The
address of the register being read out is sent immediately after this control bit (MSB first). After the
LSB of the address bits, the data is launched on the SPI_OUT pin on the falling edge of the SPI_CLK.
This means that the data should be sampled by the receiving system on the rising edge of the
SPI_CLK. The data comes over the SPI_OUT with MSB first. When reading out the temperature
sensor over the SPI, addresses 126 and 127 should de read-out in burst mode (keep SPI_EN high).
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Functional Description
After starting up the sensor (see 6.2.6), a number of frames can be requested by sending a
FRAME_REQ pulse. The number of frames can be set by programming the appropriate register
(addresses 70 and 71). The default number of frames to be grabbed is 1.
In internal-exposure-time mode, the exposure time will start after this FRAME_REQ pulse. In the
external-exposure-time mode, the read-out will start after the FRAME_REQ pulse. Both modes are
explained into detail in following paragraphs.
In this mode, the exposure time is set by programming the appropriate registers (address 42-44).
After the high state of the FRAME_REQ pulse is detected, the exposure time will start after a delay of
133 clock cycles, see AN16 – Exposure timings for all timing details. When the exposure time ends
(as programmed in the registers), the pixels are being sampled and prepared for read-out. This
sequence is called the frame overhead time (FOT). Immediately after the FOT, the frame is read-out
automatically. If more than one frame is requested, the exposure of the next frame starts already
during the read-out of the previous one (see Figure 28).
Figure 28:
Request for 2 Frames in Internal- Exposure-Time Mode
FRAME_REQ
Figure 29:
Two Requests for 1 Frame in Internal Exposure Mode(1)
FRAME_REQ
When the exposure time is shorter than the read-out time, the FOT and read-out of the next frame will
start immediately after the read-out of the previous frame. Keep in mind that the next FRAME_REQ
pulse has to occur after the FOT of the current frame. For an exact calculation of the exposure time,
see chapter 6.4.1.
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Functional Description
When a new FRAME_REQ is applied, the exposure of the next frame will be delayed so that the FOT
begins right after the read-out time of the current frame.
Figure 30:
Request for 2 Frames in Internal Exposure Mode with Exposure Time < Read-Out Time
FRAME_REQ
Figure 31:
Two Requests for 1 Frame in Internal Exposure Mode(1)
FRAME_REQ
If the exposure time is shorter than the read-out time, keep in mind that when you apply a next
FRAME_REQ pulse during the read-out of the current frame, the exposure of that new frame will start
immediately. Therefore, you have to keep enough time between the two FRAME_REQ pulses so the
read-out times do not overlap. If the FOT of the next frame starts during the read-out of the current
frame, that read-out will be aborted immediately, as shown in Figure 32. If the exposure time is longer
than the read-out time, the read-out times of two consecutive frames cannot overlap and will not cause
a problem. The minimum time between two FRAME_REQ pulses is given by Equation 3:
Equation 3:
𝑚𝑖𝑛. 𝑡𝑖𝑚𝑒 = 𝑒𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒 + 𝐹𝑂𝑇 + (𝑅𝑒𝑎𝑑𝑜𝑢𝑡 𝑡𝑖𝑚𝑒 − 𝐸𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒) = 𝐹𝑂𝑇 + 𝑅𝑒𝑎𝑑𝑜𝑢𝑡 𝑡𝑖𝑚𝑒
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Functional Description
Figure 32:
The Timing Effect of Two Requests for 1 Frame in Internal Exposure Mode
FRAME_REQ
FRAME_REQ
FRAME_REQ
The exposure time can also be programmed externally by using the T_EXP1 input pin. This mode
needs to be enabled by setting the appropriate register (address 41). In this case, the exposure starts
when a high state is detected on the T_EXP1 pin. When a high state is detected on the FRAME_REQ
input, the exposure time stops and the read-out will start automatically. A new exposure can start by
sending a pulse to the T_EXP1 pin during or after the read-out of the previous frame. The minimum
time between T_EXP1 and FRAME_REQ is 1 master clock cycle, the minimum time between
FRAME_REQ and T_EXP1 pulse is FOT. For an exact calculation of the exposure time see chapter
6.4.1.
Figure 33:
Request for 2 Frames Using External-Exposure-Time Mode
T_EXP1
FRAME_REQ
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Functional Description
The sensor has LVDS (low voltage differential signaling) outputs to transport the image data to the
surrounding system. Next to 16 data channels, the sensor also has two other LVDS channels for
control and synchronization of the image data. In total, the sensor has 18 LVDS output pairs (2 pins
for each LVDS channel):
● 16 Data channels
● 1 Control channel
● 1 Clock channel
This means that a total of 36 pins of the CMV4000 are used for the LVDS outputs (32 for data + 2 for
LVDS clock + 2 for control channel). See the pin list for the exact pin numbers of the LVDS outputs.
The 16 data channels are used to transfer the 10-bit or 12-bit pixel data from the sensor to the
receiver in the surrounding system.
The output clock channel transports a clock, synchronous to the data on the other LVDS channels.
This clock can be used at the receiving end to sample the data. This clock is a DDR clock which
means that the frequency will be half of the output data rate. When 480 Mbps output data rate is used,
the LVDS output clock will be 240 MHz.
The data on the control channel contains status information on the validity of the data on the data
channels. Information on the control channel is grouped in 10-bit or 12-bit words that are transferred
synchronous to the 16 data channels.
Figure 34 and Figure 35 show the timing for transfer of 10-bit and 12-bit pixel data over one LVDS
output. To make the timing more clear, the figures show only the p-channel of each LVDS pair. The
data is transferred LSB first, with the transfer of bit D0 during the high phase of the DDR output clock
OUTCLK.
Figure 34:
10-Bit Pixel Data on an LVDS Channel
T1
OUTCLK_P
OUTX_P D8 D9 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D0 D1 D2 D3
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Functional Description
The time ‘T1’ in Figure 34 is 1/10th of the period of the CLK_IN input clock. If a frequency of 48 MHz is
used for CLK_IN (max in 10-bit mode), this results in a 240 MHz OUTCLK frequency.
Figure 35:
12-Bit Pixel Data on an LVDS Channel
T2
OUTCLK_P
The time ‘T2’ in Figure 35 is 1/12th of the period of the CLK_IN input clock. If a frequency of 40 MHz is
used for CLK_IN (max in 12-bit mode), this results in a 240 MHz OUTCLK frequency.
The read-out of image data is grouped in bursts of 128 pixels per channel. Each pixel is either 10 or
12 bits of data (see chapter 6.3.2). One complete pixel period equals one period of the master clock
input. For details on pixel remapping and pixel vs. channel location please see chapter 6.3.4 of this
document. An overhead time exists between two bursts of 128 pixels. This overhead time has the
same length of one pixel read-out (i.e. the length of 10 or 12 bits at the selected data rate or one
master clock period). For details on how to program the sequencer for different output modes, see
chapter 6.5.1.
10-Bit Mode
In this section, the read-out timing for the default 10-bit mode is explained. In this mode the maximum
frame rate of 180 fps can be reached.
For simplification, the timing for only one LVDS channel is shown in every case in the following
paragraphs:
● 16 Output channels
● 8 Output channels
● 4 Output channels
● 2 Output channels
16 Output Channels:
By default, all 16 data output channels are used to transmit the image data. This means that an entire
row of image data is transferred in one slot of 128 pixel periods (16 x 128 = 2048). This results in a
maximum frame rate of 180 fps.
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Functional Description
Figure 36:
Output Timing in Default 16 Channels Mode
8 Output Channels:
When only 8 LVDS output channels are used, the read-out of one row takes (2 x 128) + (2 x 1) master
clock periods. The maximum frame rate is reduced with a factor of 2 compared to 16 channels mode.
Figure 37:
Output Timing in 8 Channels Mode
Row 1 Row 2
4 Output Channels:
When only 4 LVDS output channels are used, the read-out of one row takes (4 x 128) + (4 x 1) master
clock periods. The maximum frame rate is reduce with a factor of 4 compared to 16 channels mode.
Figure 38:
Output Timing in 4 Channels Mode
DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128
Row 1 Row 2
2 Output Channels:
When only 2 LVDS output channels are used, the read-out of one row takes (8 x 128) + (8 x 1) master
clock periods. The maximum frame rate is reduced with a factor of 8 compared to 16 channels mode.
Figure 39:
Output Timing in 2 Channels Mode
IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128
Row 1 Row 2
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Functional Description
12-Bit Mode
In 12-bit mode, the analog-to-digital conversion takes 4x longer to complete. This causes the frame
rate to drop to 37.5 fps when 40 MHz is used for CLK_IN. Due to this extra conversion time, the
sensor automatically multiplexes to 4 outputs when 12-bit is used.
For simplification, the timing for only one LVDS channel is shown in every case in the following
paragraphs:
● 4 Output Channels
● 2 Output Channels
4 Output Channels:
By default, the CMV4000 uses only 4 LVDS output channels in 12-bit mode. This means that the read-
out of one row takes 516 (4 x 128) + (4 x 1) master clock periods.
Figure 40:
Output Timing in 4 Channels Mode
DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128
Row 1 Row 2
2 Output Channels:
When only 2 LVDS output channels are used, the read-out of one row takes (8 x 128) + (8 x 1) master
clock periods. The maximum frame rate is reduced with a factor of 2 compared to 4 channels mode.
Figure 41:
Output Timing in 2 Channels Mode
IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128
Row 1 Row 2
Depending on the number of output channels, the pixels are read out by different channels and come
out at a different moment in time. With the details from the next sections, the end user is able to remap
the pixel values at the output to their correct image array location.
16 Outputs:
Figure 42 shows the location of the image pixels versus the output channel of the image sensor.
16 bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is
read out in one burst. The amount of rows that will be read out depends on the value in the
corresponding register. By default there are 2048 rows being read out.
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Functional Description
Figure 42:
Pixel Remapping for 16 Output Channels
Row 1 Row 2
8 Outputs:
When only 8 outputs are used, the pixel data is placed on the outputs as detailed in Figure 43.
8 bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is
read out in two bursts. The time needed to read out one row is doubled compared to when 16 outputs
are used. Channel 2, 4, 6…16 are not being used in this mode, so they can be turned off by setting
the correct bits in the register with addresses 80-82. Turning off these channels will reduce the power
consumption of the chip.
The amount of rows that will be read out can be set in the register. By default 2048 rows are read out.
Figure 43:
Pixel Remapping for 8 Output Channels
Row 1
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Functional Description
4 Outputs:
When only 4 outputs are used, the pixel data is placed on the outputs as detailed in Figure 44. 4
bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is read
out in four bursts. The time needed to read out one row is 4x longer compared to when 16 outputs are
used. Only channel 1, 5, 9 and 13 are being used in this mode, so the remaining channels can be
turned off by setting the correct bits in the register with addresses 80-82. Turning off these channels
will reduce the power consumption of the chip.
The amount of rows that will be read out can be set in the register. By default 2048 rows are read out.
Figure 44:
Pixel Remapping for 4 Output Channels
Channel 1 IDLE Pixel 0 to 127 Pixel 128 to 255 Pixel 256 to 383 Pixel 384 to 511
Channel 5 IDLE Pixel 512 to 639 Pixel 640 to 767 Pixel 768 to 895 Pixel 896 to 1023
Channel 9 IDLE Pixel 1024 to 1151 Pixel 1152 to 1279 Pixel 1280 to 1407 Pixel 1408 to 1535
Channel 13 IDLE Pixel 1536 to 1663 Pixel 1664 to 1791 Pixel 1792 to 1919 Pixel 1920 to 2047
Row 1
2 Outputs:
When only 2 outputs are used, the pixel data is placed on the outputs as detailed in Figure 45.
2 bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is
read out in 8 bursts. The time needed to read out one row is 8x longer compared to when 16 outputs
are used. Only channels 1 and 9 are being used in this mode, so the remaining channels can be
turned off by setting the correct bits in the register with addresses 80-82. Turning off these channels
will reduce the power consumption of the chip.
The amount of rows that will be read out can be set in the register. By default 2048 rows are read out.
Figure 45:
Pixel Remapping for 2 Output Channels
Channel 1 IDLE Pixel 0 to 127 Pixel 128 to 255 Pixel 256 to 383 Pixel 384 to 511 Pixel 512 to 639 Pixel 640 to 767 Pixel 768 to 895 Pixel 896 to 1023
Channel 9 IDLE Pixel 1024 to 1151 Pixel 1152 to 1279 Pixel 1280 to 1407 Pixel 1408 to 1535 Pixel 1536 to 1663 Pixel 1664 to 1791 Pixel 1792 to 1919 Pixel 1920 to 2047
Row 1
Overview:
All outputs are always used to send data, but if you use less than 16 channels, some channels will
have duplicate data. For example if you multiplex to 4 channels, outputs 6, 7 and 8 will have identical
data as output 5.
Figure 46 shows an overview of which channel data is on which output at a certain output mode.
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Functional Description
Figure 46:
Overview Channel Data – Output Mode
The CMV4000 has one LVDS output channel dedicated for the valid data synchronization and timing
of the output channels. The end user must use this channel to know when valid image data or training
data is available on the data output channels.
The control channel transfers status information in 10-bit or 12-bit word format. Every bit of the word
has a specific function.
Figure 47:
Function of the Individual Bits
(1) The status bits are purely informational. These bits are not required to know when the data is valid. The DVAL, LVAL
and FVAL signals are sufficient to know when to sample the image data.
INTE1/2 will be low when FOT is high, so the exposure during the small 0.43*reg73 overlap (see
formulas in 6.4.1), will not be visible in the INTE1/2 bits.
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Functional Description
Pins H2 (TDIG1) and G2 (TDIG2) can be programmed to map the state of control channel bits [0]
(DVAL), [1] (LVAL), [2] (FVAL), [6] (INTE1) or [7] (INTE2) with registers 108 (T_dig1) and 109
(T_dig2).
Figure 48:
Register 108/109 Value
0 INTE1 INTE1
1 INTE2 INTE2
2 DVAL DVAL
3 LVAL LVAL
4 FVAL FVAL
The first three bits of the control word must be used to identify valid data and the read-out status.
Figure 49 shows the timing of the DVAL, LVAL and FVAL bits of the control channel with an example
of the read-out of a frame of 3 rows (default is 2048 rows). In the example the default mode of 16
outputs is in 10-bit mode.
Figure 49:
DVAL, LVAL and FVAL Timing in 16 Outputs Mode
DVAL
LVAL
FVAL
When only 8 outputs are used, the line read-out time is 2x longer. The control channel takes this into
account and the timing in this mode are shown in Figure 50 and Figure 51. The timing extrapolates
identically for 4 and 2 outputs.
Figure 50:
DVAL, LVAL and FVAL Timing in 8 Outputs Mode
DVAL
LVAL
FVAL
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Functional Description
Figure 51:
Detailed Timings of the Control Channel (8 outputs, 3 lines window)
FOT [5]
INTE1 [6]
INTE2 [7]
CTRL_OUT 10 0000 0000 10 1100 0000 10 001 0 0 000 10 000x xxxx 10 110x xxxx 10 1100 0000 10 001 0 0 000 10 000x xxxx 10 0000 0000
Read-out 1
Frames
cycle
Exposure 2
DVAL
LVAL
FVAL
SLOT
ROW
FOT
INTE1
INTE2
To synchronize the receiving side with the LVDS outputs of the CMV4000, a known data pattern can
be put on the output channels. This pattern “trains” the LVDS receiver of the surrounding system to
achieve correct word alignment of the image data. This training pattern is put on all 16 output channels
when no valid image data is being sent, even in between bursts of 128 pixels. The training pattern is a
10-bit or 12-bit word that replaces the pixel data. The sensor has a 12-bit sequencer register (address
78-79) that can be used to change the contents of the 12-bit training pattern.
The control channel does not send a training pattern, because it is used to send control information at
all time. Word alignment can be done on this channel when the sensor is idle (not exposing or sending
image data). In this case all bits of the control word are zero, except for bit [9] (= 0010 0000 0000 or
512 decimal).
Figure 52 shows the location of the training pattern (TP) on the data channels when the sensor is idle
and when reading out 3 rows. The default mode of 16 outputs is selected.
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Functional Description
Figure 52:
Training Pattern Location in the Data and Control Channels
LVAL
FVAL
Data
Training pattern TP 128 TP 128 TP 128
channels
Control 0010 0000 0000 Control information
channel
The exposure time can be programmed in two ways, externally or internally. Externally, the exposure
time is defined as the time between the rising edge of T_EXP1 and the rising edge of FRAME_REQ
(see External Exposure Time for more details). Internally, the exposure time is set by uploading the
desired value to the corresponding sequencer register.
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Functional Description
Figure 53:
Time Settings of Exposure Mode
To calculate back from actual exposure time to the register value for internal exposure can use the
following formula (exposure time and clk_per should have the same time unit):
𝑒𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒
𝐸𝑥𝑝_𝑡𝑖𝑚𝑒 = − 0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟
For very short integration times, the fot_length should be lowered to 10 and the maximum clock speed
should be used. In internal exposure mode, the shortest exposure time is limited by the exp_time
register, when this is set to 1, the shortest exposure time is 25.8 µs, or 14.24 µs for fot_length = 10.
In external exposure mode, the time between T_EXP1 and FRAME_REQ can be as short as one
clock cycle, reducing the shortest exposure time even more to 23.14 µs, or 11.58 µs for fot_length =
10.
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Functional Description
The sensor has different ways to achieve high optical dynamic range in the grabbed image.
● Interleaved read-out: The odd and even rows have a different exposure time.
● Piecewise linear response: Pixels respond to light with a piecewise linear response curve.
● Multi-frame read-out: Different frames are read-out with increasing exposure time.
All the HDR modes mentioned above can be used in both the internal and external exposure time
mode.
Interleaved Read-Out
In this HDR mode, the odd and even rows of the image sensors will have a different exposure time.
This mode can be enabled by setting the register Exp_dual.
Figure 54:
Interleaved Read-Out – HDR Mode Enabling
The surrounding system can combine the image of the odd rows with the image of the even rows
which results in a high dynamic range image. In this image, very bright and very dark objects are
made visible without clipping. The Figure 55 gives an overview of the registers involved in the
interleaved read-out when the internal exposure mode is selected.
Figure 55:
Interleaved Read-Out – HDR Mode Timing
If Exp_dual = ‘1’
Defines the exposure time for the even
rows according following formula:
42[7:0]
Exp_time 43[7:0] 2048 129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
44[7:0] + 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)
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Functional Description
If Exp_dual = ‘1’
Defines the exposure time for the odd
rows according following formula:
56[7:0]
Exp_time2 57[7:0] 2048 129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
58[7:0] + 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒2)
When the external exposure mode and interleaved read-out are selected, the different exposure times
are achieved by using the T_EXP1 and T_EXP2 input pins. T_EXP1 defines the exposure time for the
even lines, while T_EXP2 defines the exposure time for the odd lines. See Figure 56 for more details.
Figure 56:
Interleaved Read-Out in External Exposure Mode
FRAME_REQ
When a color sensor is used, the sequencer should be programmed to make sure it takes the Bayer
pattern into account when doing interleaved read-out. This can be done by setting the appropriate
register to ‘0’.
Figure 57:
Mono or Color Register Selection
The CMV4000 has the possibility to achieve a high optical dynamic range by using a piecewise linear
response. This feature will clip illuminated pixels, which reach a programmable voltage, while leaving
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Functional Description
the darker pixels untouched. The clipping level can be adjusted 2 times within one exposure time to
achieve a maximum of 3 slopes in the response curve, as shown in Figure 58.
Figure 58:
Piecewise Linear Response Details
Vhigh
Vlow3
Vlow2
Vlow1
Exposure kneepoint 2
Exposure kneepoint 1
Total exposure time
In Figure 58, the red lines represent a pixel on which a large amount of light is falling. The blue line
represents a pixel on which less light is falling. The bright pixel is held to a programmable voltage for a
programmable time during the exposure time. This happens two times to make sure that at the end of
the exposure time the pixel is not saturated. The darker pixel is not influenced and will have a normal
response. The Vlow voltages and different exposure times are programmable using the sequencer
registers. Using this feature, a response as detailed in Figure 59 can be achieved. The placement of
the knee points on the X-axis is controlled by the Vlow programming, while the slope of the segments
is controlled by the programmed exposure times.
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Functional Description
Figure 59:
Piecewise Linear Response
Saturation
level
Kneepoint 1
Output signal
Kneepoint 2
# of electrons
The following registers need to be programmed when a piecewise linear response in internal exposure
mode is desired.
Figure 60:
Piecewise Linear Response with Internal Exposure Mode Register Settings
42[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_time 43[7:0] 2048
+ 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)
44[7:0]
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Functional Description
48[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_kp1 49[7:0] 1
+ 𝐸𝑥𝑝_𝑘𝑝1)
50[7:0]
51[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_kp2 52[7:0] 1
+ 𝐸𝑥𝑝_𝑘𝑝2)
53[7:0]
When external exposure time is used and a piecewise linear response is desired, the following
registers should be programmed. Note that the combination of the piecewise linear response and
interleaved read-out is not possible.
Figure 61:
Piecewise Linear Response with External Exposure Mode Register Settings
The timing that needs to be applied in this external exposure mode looks like the one shown in
Figure 62.
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Functional Description
Figure 62:
Timing of External Exposure Mode
T_EXP1
FRAME_REQ
Total exposure time
Exposure kp2
Exposure kp1
Multi-Frame Read-Out
The sensor has the possibility to read-out multiple frames with increasing exposure time for each
frame. The exposure time step and number of frames can be programmed using the appropriate
registers. The frames grabbed in this mode, can be combined to create one high dynamic range
image. This combination needs to be made by the receiving system.
The following registers should be used when this multi-frame read-out is selected. This mode only
works with internal exposure time setting.
Figure 63:
Multi-Frame Read-Out Mode Register Settings
Register
Register Name Default Value Description of the Value
Address
42[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_time 43[7:0] 2048
+ 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)
44[7:0]
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Functional Description
Register
Register Name Default Value Description of the Value
Address
6.4.3 Windowing
To limit the amount of data or to increase the frame rate of the sensor, windowing in Y direction is
possible. The number of lines and start address can be set by programming the appropriate registers.
The CMV4000 has the possibility to read-out multiple (max = 8) predefined sub windows in one read-
out cycle. The default mode is to read-out one window with the full frame size (2048 x 2048).
Single Window
When a single window is read out, the start address and size can be uploaded in the corresponding
registers. The default start address is 0 and the default size is 2048 (full frame), like shown in
Figure 64 and Figure 65.
Figure 64:
Single Window Register Settings
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Functional Description
Figure 65:
Window Structure
2048
start1
2048
Number_lines
Multiple Window
The CMV4000 can read out a maximum of 8 different sub windows in one read-out cycle. The location
and length of these sub windows must be programmed in the correct registers. The total number of
lines to be read-out (sum of all windows) needs to be specified in the Number_lines register. The
registers which need to be programmed for the multiple windows can be found in Figure 66. The
default values will result in one window with 2048 lines to be read out.
Figure 66:
Multiple Window Register Settings
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Functional Description
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Figure 67:
Example of 4 Multiple Frames Read-Out
2048
start1
Number_lines1
start2
2048
Number_lines2
start3
Number_lines3
start4
Number_lines4
The image coming out of the image sensor can be flipped in X (per channel) and/or Y direction. When
no flipping is enabled, the pixel in the upper left corner of the screen - (pixel (0,0) - is read out first.
When flipping in Y is enabled, the bottom left pixel (0,2047) is read out first instead of the top left pixel
(0,0). When flipping in X is enabled, only the pixels within a channel are mirrored, not the channels
themselves. Therefore, the first row to be read out is pixel (1023,0) to pixel (0,0) in channel 1 and pixel
(2047,0) to pixel (1024,0) in channel 2.
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Functional Description
Figure 68:
Image Flipping
Image flipping in Y
2048x2048 2048x2048
Pixel (0,0) Pixel (1023,0) Pixel (1024,0) Pixel (2047,0) Pixel (1023,0) Pixel (0,0) Pixel (2047,0) Pixel (1024,0)
Image flipping in X
CH1 CH2 CH1 CH2
(1024x2048) (1024x2048) (1024x2048) (1024x2048)
Using 2 output
channels
Figure 69:
Image Flipping Register Settings
0: No image flipping
1: Image flipping in X
Image_flipping 40[1:0] 0
2: Image flipping in Y
3: Image flipping in X and Y
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Functional Description
To maintain the same field of view but reduce the amount of data coming out of the sensor, a
subsampling mode is implemented on the chip. Different subsampling schemes can be programmed
by setting the appropriate registers. These subsampling schemes can take into account whether a
color or monochrome sensor is used to preserve the Bayer pattern information. A distinction is made
between a simple and advanced mode (can be used for color devices). Subsampling can be enabled
in every windowing mode.
Simple Subsampling
Figure 70:
Simple Subsampling Register Settings
Figure 71:
Subsampling Examples (skip 4x and skip 1x)
Sub_s = 4 Sub_s = 1
Sub_a = 4 Sub_a = 1
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Functional Description
Advanced Subsampling
When a color sensor is used, the subsampling scheme should take into account that a Bayer color
filter is applied on the sensor. This Bayer pattern should be preserved when subsampling is used. This
means that the number of rows to be skipped should always be a multiple of two. An advanced
subsampling scheme can be programmed to achieve these requirements. Of course, this advanced
subsampling scheme can also be programmed in a monochrome sensor. See Figure 72 for more
details.
Figure 72:
Advanced Subsampling Register Settings
Figure 73 shows two subsampling examples (skip 4x and skip 2x) in advanced mode.
Figure 73:
Subsampling Examples in Advanced Mode (skip 4x and skip2x)
Sub_s = 0 Sub_s = 0
Sub_a = 4 Sub_a = 2
When internal exposure mode is selected, the number of frames sent by the sensor after a frame
request can be programmed in the corresponding sequencer register.
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Functional Description
Figure 74:
Number of Frames Register Settings
The number of LVDS channels can be selected by programming the appropriate sequencer register.
The pixel remapping scheme and the read-out timing for each mode can be found in chapter 6.3 of
this document.
Figure 75:
Different Output Modes Register Settings
0: 16 outputs
1: 8 outputs
Output_mode 72[1:0] 0
2: 4 outputs
3: 2 outputs
As detailed in chapter 6.3.6, a training pattern is sent over the LVDS data channels whenever no valid
image data is sent. This training pattern can be programmed using the sequencer register. The
training patter register settings are shown in Figure 76.
Figure 76:
Training Pattern Register Settings
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Functional Description
Information
Enable PLL
When using the internal PLL it is no longer required to input a high speed LVDS clock; the internal PLL
will create it itself depending on the register settings and the master input clock. Default the internal
PLL is used. You can bypass and disable the PLL with the following settings. Please note that when
disabling the PLL, the LVDS clock input must be enabled for the sensor to operate and the LVDS
receiver current must have a value greater than 0.
Figure 77:
Enable PLL Register Settings
Data Rate
During start-up or after a sequencer reset, the data rate can be changed if a lower speed than
480 Mbps is desired. This can be done by applying a lower master input clock (CLK_IN) to the sensor
and uploading a new value in the PLL registers. See chapter 6.2.4 for more details on the input clock.
See section 6.2.6 and 6.2.7 for details on how and when the data rate can be changed.
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Functional Description
Figure 78:
PLL Configure for Different CLK_IN Speed
The CMV4000 has the possibility to send 12 bits or 10 bits per pixel. The end user can select the
desired resolution by programming the corresponding sequencer register. Always keep Bit_mode and
ADC_Resolution in the same bit mode. This is shown in Figure 79.
Figure 79:
Bit Mode and ADC Resolution Register Settings for Version 2
Version 3 of this image sensor offers an ADC resolution of 11 bits. Since this version have a stable
PLL, when changing the bit mode, the PLL bit mode must be changed like showed in Figure 80.
Figure 80:
Bit Mode and ADC Resolution Register Settings for Version 3
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Functional Description
10-bit: Set to 8
PLL_load 117[7:0] 8
12-bit: Set to 4
10-bit: Set to 9
PLL_div 116[3:0] 9
12-bit: Set to 11
Information
During start-up or after a sequencer reset, the data rate can be changed if a lower speed than
480 Mbps is desired. This can be done by applying a lower master input clock (CLK_IN) and high
speed LVDS clock (LVDS_CLK_N/P) to the sensor. See chapter 6.2.4 for more details on the input
clock and chapter 6.2.5 for details on how the data rate can be changed. No registers have to be
changed when using a data rate different from 480 Mbps.
The power consumption of the CMV4000 can be decreased by disabling the LVDS data channels
when they are not used (in 8, 4 or 2 outputs mode). The power will decrease with approximately
18mW per channel. So reducing the outputs from 16 to 4 will save you about 216 mW or 33%. This is
the main source for power saving. Other settings (such as bitrate, fps, temperature …) will have very
little to no effect on the total power consumption.
Figure 81:
Power Control Register Settings
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Functional Description
Decreasing the master clock frequency and thereby the LVDS clock frequency will also decrease
power consumption albeit little. Decreasing the LVDS_CLK frequency from 480 MHz to 128 MHz will
decrease power consumption with about 25 mW. All power savings will happen on the VDD20 supply.
Other settings or factors have little to no effect on the power consumption.
Offset
A digital offset can be applied to the output signal. This dark level offset can be programmed by setting
the desired value in the sequencer register. The 14-bit register value is a 2-complement number,
allowing to have a positive and a negative offset (from 8191 to -8192). The ADC itself has a fixed
offset of 70.
So the dark-level @ output = 70 + Offset (in 2’s complement). For example register value 16323 (11
1111 1100 0011) equals -61 in 2’s complement. The default dark-level is thus set at 70 -61 = 9 digital
numbers.
Figure 82:
Offset
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Functional Description
Gain
An analog gain and ADC gain can be applied to the output signal. The analog gain is applied by a
PGA in every column. The digital gain is applied by the ADC.
Information
Depending on the sensor version, there is a slight difference in the register settings. Therefore,
depending on the sensor version the user should follow Figure 83 for version 2 and Figure 84 for
version 3.
Figure 83:
Gain Settings for Version 2
102[1:0]
0: x1 gain
PGA_gain 102[1:0] 0 1: x1.2 gain
2: x1.4 gain
3: x1.6 gain
Defines the slope of the ADC ramp, a
ADC_gain 103[7:0] 32
higher value equals more gain.
Figure 84:
Gain Settings for Version 3
102[1:0]
0: x1 gain
1: x1.2 gain
102[1:0] 2: x1.4 gain
PGA_gain 121[0] 0
3: x1.6 gain
121[0]
0: gain is defined in 102[1:0]
1: gain in 102[1:0] is amplified by 2
Defines the slope of the ADC ramp, a
ADC_gain 103[7:0] 32
higher value equals more gain.
The ADC gain is dependent on the master clock. A slower clock signal means a higher ADC_gain
register value for an actual ADC gain of 1x. Also at higher register values, the actual ADC gain will
increase in bigger steps. So fine-tuning the ADC gain is easier at lower register values.
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Functional Description
Figure 85:
Typical Graphs of Gain Setting
100
10
Actual ADC gain
48MHz
0.1
40MHz
30Mhz
25MHz
20MHz
10MHz
0.01
0 10 20 30 ADC Register Value 40 50 60 70
Information
When the appropriate SPI register is set, the 16 first columns will be put to an electrical black
reference. This electrical black reference can be used to reduce the row noise and/or track black level.
Figure 86:
Black Columns
0 : Disable
Black_col_en 121[1] 0
1 : Enable
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Functional Description
Information
When the exposure of an image frame is started while a previous image frame is read out this action
may become visible in the image frame currently read out. The effect is visible in the line addressed
for read-out at the moment the exposure of the next image frame starts. Depending on the moment
when the exposure starts within the line read-out time, this will result in a bright or dark offset for the
addressed line. This horizontal line artifact is due to the cross-talk of the global transfer gate pulse on
the column read-out.
This problem is solved by changing the sequencer timing. At the moment the global transfer is pulsed,
a programmable number of dummy rows can be inserted in the read-out. This means that the transfer
pulse crosstalk does not influence valid data rows.
The exact internal impact of the new timing depends on the read-out and exposure modes (PLR,
internal or external exposure control…). Externally, the only impact is that the DVAL and LVAL outputs
are not pulsed for a number of row periods. The external system should always monitor the DVAL,
LVAL and FVAL pulses to know when valid pixels, lines and frames become available. Figure 87
shows the timing (in case of 2 dummy rows).
Figure 87:
Timing of DVAL, LVAL and FVAL to Avoid Horizontal Line Artifact
By default, no dummy rows are inserted in the read-out. The dummy rows are enabled by loading the
appropriate values to the register inte_sync and dummy.
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Functional Description
Figure 88:
Dummy Rows
Information
Note that the register ‘dummy’ sets the number of dummy rows (one row corresponds to one LVAL
pulse). In multiplex modes, there are several timing slots within a single row read-out. In case dual
exposure is used, the dummy rows are generated for both transfer pulse toggles.
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Register Description
7 Register Description
The Figure 89 gives an overview of all the sensor registers. The registers with the remark “Do not
change” should not be changed unless advised in chapter 6.4.
Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]
Do not
0 0
change
1 0 Number_lines [7:0]
2 8 Number lines [15:8]
3 0 Start1[7:0]
4 0 Start1[15:8]
5 0 Start2[7:0]
6 0 Start2[15:8]
7 0 Start3[7:0]
8 0 Start3[15:8]
9 0 Start4[7:0]
10 0 Start4[15:8]
11 0 Start5[7:0]
12 0 Start5[15:8]
13 0 Start6[7:0]
14 0 Start6[15:8]
15 0 Start7[7:0]
16 0 Start7[15:8]
17 0 Start8[7:0]
18 0 Start8[15:8]
19 0 Number_lines1[7:0]
20 0 Number_lines1[15:8]
21 0 Number_lines2[7:0]
22 0 Number_lines2[15:8]
23 0 Number_lines3[7:0]
24 0 Number_lines3[15:8]
25 0 Number_lines4[7:0]
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Register Description
Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]
26 0 Number_lines4[15:8]
27 0 Number_lines5[7:0]
28 0 Number_lines5[15:8]
29 0 Number_lines6[7:0]
30 0 Number_lines6[15:8]
31 0 Number_lines7[7:0]
32 0 Number_lines7[15:8]
33 0 Number_lines8[7:0]
34 0 Number_lines8[15:8]
35 0 Sub_s[7:0]
36 0 Sub_s[15:8]
37 0 Sub_a[7:0]
38 0 Sub_a[15:8]
39 1 mono
40 0 Image_flipping[1:0]
Inte_s Exp_
41 0 Exp_ ext Set to 4
ync(1) dual
42 0 Exp_time[7:0]
43 8 Exp_time[15:8]
44 0 Exp_time[23:16]
45 0 Exp_step[7:0]
46 0 Exp_step[15:8]
47 0 Exp_step[23:16]
48 1 Exp_kp1[7:0]
49 0 Exp_kp1[15:8]
50 0 Exp_kp1[23:16]
51 1 Exp_kp2[7:0]
52 0 Exp_kp2[15:8]
53 0 Exp_kp2[23:16]
54 1 Nr_slopes[1:0]
55 1 Exp_seq[7:0]
56 0 Exp_time2[7:0]
57 8 Exp_time2[15:8]
58 0 Exp_time2[23:16]
59 0 Exp_step2[7:0]
60 0 Exp_step2[15:8]
61 0 Exp_step2[23:16]
Do not
62 1
change
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Register Description
Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]
Do not
63 0
change
Do not
64 0
change
Do not
65 1
change
Do not
66 0
change
Do not
67 0
change
Do not
68 1
change
69 1 Exp2_seq[7:0]
70 1 Number_frames [7:0]
71 0 Number_frames[15:8]
72 0 Output_mode[1:0]
Can be
lowered
V2: 0 to 10,
73 fot_length[7:0]
V3: 20 see
chapter
6.4.1
74 8 i_lvds_rec[3:0](1)
Do not
75 8
change
Do not
76 8
change
V2: Do
not
Col_cali change
77 3 ADC_calib(1)
b(1)
V3:Set
to 0
78 85 Training_pattern[7:0]
79 0 Training pattern [11:8]
80 255 Channel_en[7:0]
81 255 Channel_en[15:8]
V2: Set
to 7
82 3 Channel_en [18:16] V3: See
chapter
6.5.6
Can be
lowered
to 4 for
83 8 i_lvds[3:0] meeting
EMC
standard
s
84 8 I_col[3:0] Set to 4
85 8 I_col_prech[3:0] Set to 1
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Register Description
Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]
V2: Do
not
86 8 change
V3: Set
to 14
V2: Do
not
87 8 I_amp[3:0](1) change
V3:Set
to 12
Set to
88 96 Vtf_l1[6:0]
64
89 96 Vlow2[6:0]
90 96 Vlow3[6:0]
Set to
91 96 Vres_low[6:0]
64
Do not
92 96
change
Do not
93 96
change
Set to
94 96 V_prech[6:0]
101
Set to
95 96 V_ref[6:0]
106
Do not
96 96
change
Do not
97 96
change
See
98 96 Vramp1[6:0]
7.2.1
See
99 96 Vramp2[6:0]
7.2.1
See
100 195 Offset[7:0]
7.2.1
See
101 63 Offset[13:8]
7.2.1
V3:Set
102 0 PGA_gain[1:0]
to 1
See
103 32 ADC_gain[7:0]
7.2.1
Do not
104 8
change
Do not
105 8
change
Do not
106 8
change
Do not
107 8
change
108 0 T_dig1[3:0]
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Register Description
Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]
109 1 T_dig2[3:0]
Do not
110 0
change
111 1 Bit_ mode
112 0 ADC_resolution [1:0]
V2: Do
113 1 pll_ enable(1) not
change
V2: Do
114 0 PLL_IN_FRE [1:0] (1) not
change
Only V2:
115 0 Config 2
Set to 1
V2: 32 V2: Do
PLL_
116 V3: PLL_OUT_FRE[2:0](1) PLL_div[3:0](1) not
range(1)
217 change
Only V2:
117 8 Config 1
Set to 1
117 8 PLL_load[7:0] Only V3
V2: Do
not
118 0 Dummy[7:0] change
V3:Set
to 1
Do not
119 0
change
Do not
120 0
change
V2: Do
Black_c PGA_
121 0 not
ol_en(1) gain[0] (1)
change
Do not
122 0
change
V2: Do
not
V2: 0
123 V_blacksun[5:0] (1) change
V3: 64
V3:Set
to 98
Do not
124 0
change
Do not
125 xx(2)
change
126 0 Temp[7:0]
127 0 Temp[15:8]
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Register Description
(1) Only applicable to Version3. Those bits are not existing in Version2 and do not change.
(2) The Register 125 can be used to verify which version of sensor is used.
Figure 90:
Register 125 – Sensor Version
64 CMV4000 V2
67 CMV4000 V3
Information
Depending on the sensor version, there is a slight difference in the register settings. Therefore, the
user should follow Figure 91 for version 2 and Figure 92 for version 3.
Figure 91:
Recommended Registers for Version 2
82[2:0] Channel_en 7
84[3:0] I_col 4
85[3:0] I_col_prech 1
88[6:0] Vtf_l1 64
91[6:0] Vres_low 64
94[6:0] V_precharge 101
95[6:0] V_ref 106
115[0] Config2 1
117[0] Config1 1
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Register Description
Figure 92:
Recommended Registers for Version 3
Due to processing differences, the response and optical performance may differ slightly from sensor to
sensor. To adjust this difference in response, the following registers in should be tuned from sensor to
sensor.
Information
Depending on the sensor version, there is a slight difference in the register settings. Therefore, the
user should follow Figure 93 for version 2 and Figure 94 for version 3.
Figure 93:
Optical Performance Registers for Version 2
103[7:0] ADC_GAIN 32 40 - 55
98[6:0] V_ramp1 96 102 - 115
99[6:0] V_ramp2 96 102 - 115
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Register Description
Figure 94:
Optical Performance Registers for Version 3
To optimize the sensor response and minimize noise, the following procedure should be followed for
each sensor:
1. Start by programming all registers with the recommended values from the datasheet.
2. Take fully dark images with short exposure and calibrate the offset register so no pixel clips in
black (< 0DN).
3. When column non-uniformities are observed in the dark image, a calibration of the V_ramp1
and V_ramp2 registers is necessary. These registers set the starting voltage of the ramp used
by the column ramp ADC, so adjusting this value will improve column CDS (correlated double
sampling) which will reduce the column FPN. Both values should be adjusted together and
should always have the same value.
4. Now take images with light and normal exposure. If the image isn’t saturated increase the light
or the exposure time until all pixels reach a constant value. If not all pixels saturate at 1023
(meaning that the non-linear part of the pixel voltage is in the ADC input range), increase the
ADC gain/range setting until they do. The PGA amplifier can also be used at this stage.
5. The dark offset level may have shifted when doing ADC calibration, so repeat step 2.
6. To compensate gain differences between sensors, choose a fixed light setting or exposure time
at which the sensor shows a grey image about 50% of its swing (512 at 10-bit). Now tweak the
ADC setting per sensor so that all sensors will have the same average grey value of about 512.
This way all sensors will behave about the same to the same amount of light.
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Application Information
8 Application Information
Figure 95:
RGB Bayer Pattern Order
R G R G R G R G
G B G B G B G B
R G R G R G R G
G B G B G B G B
R G R G R G R G
G B G B G B G B
R G R G R G R G
G B G B G B G B
R G R G
G B G B
R G R G
G B G B
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Application Information
Figure 96:
Typical Response Curve
1200
1000
800
Output [DN]
600
400
200
0
0 500 1000 1500 2000 2500 3000 3500
8.3 Pinout
Pins that are marked optional are not strictly required for sensor operation, they are test pins or pins
that are only required for using a certain feature. When these pins are not used, they can be left
floating. When the sensor is configured for multiplexing and not all 16 LVDS channels are used for
read-out, the unused output channels can also be left floating. Analog and digital ground can be tied
together.
Figure 97:
Pinout in Detail
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Application Information
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Application Information
G2 N.E. TDIG2 Test pin for digital signals (optional) Digital output
H2 77 TDIG1 Test pin for digital signals (optional) Digital output
A6 8 GND Ground pin Ground
A12 22 GND Ground pin Ground
C1 28 GND Ground pin Ground
C6 38 GND Ground pin Ground
C12 47 GND Ground pin Ground
E3 56 GND Ground pin Ground
E5 64 GND Ground pin Ground
E9 73 GND Ground pin Ground
F1 81 GND Ground pin Ground
F12 87 GND Ground pin Ground
H7 92 GND Ground pin Ground
D1 79 LVDS_CLK_P LVDS positive input clock LVDS input
D2 78 LVDS_CLK_N LVDS negative input clock LVDS input
B11 25 OUTCLK_N LVDS negative clock output channel LVDS output
B12 26 OUTCLK_P LVDS positive clock output channel LVDS output
B1 2 OUTCTR_N LVDS negative control output channel LVDS output
B2 3 OUTCTR_P LVDS positive control output channel LVDS output
C2 4 OUT1_N LVDS negative data output channel 1 LVDS output
C3 5 OUT1_P LVDS positive data output channel 1 LVDS output
A2 6 OUT2_N LVDS negative data output channel 2 LVDS output
A3 7 OUT2_P LVDS positive data output channel 2 LVDS output
D3 91 OUT3_N LVDS negative data output channel 3 LVDS output
D4 90 OUT3_P LVDS positive data output channel 3 LVDS output
B3 89 OUT4_N LVDS negative data output channel 4 LVDS output
B4 88 OUT4_P LVDS positive data output channel 4 LVDS output
A4 10 OUT5_N LVDS negative data output channel 5 LVDS output
A5 11 OUT5_P LVDS positive data output channel 5 LVDS output
C4 86 OUT6_N LVDS negative data output channel 6 LVDS output
C5 85 OUT6_P LVDS positive data output channel 6 LVDS output
B5 12 OUT7_N LVDS negative data output channel 7 LVDS output
B6 13 OUT7_P LVDS positive data output channel 7 LVDS output
D5 83 OUT8_N LVDS negative data output channel 8 LVDS output
D6 82 OUT8_P LVDS positive data output channel 8 LVDS output
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Application Information
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Application Information
Figure 98:
µPGA and LGA Pinout
1 2 3 4 5 6 7 8 9 10 11 12
H VDD33 TDIG1 T_EXP1 SPI_CLK SYS_RES_N VDD33 GND Vres_L Vtf_l3 COL_PC LVDS DIO2
G VDDPIX TDIG2 T_EXP2 SPI_EN CMD_P CMD_N Tana Vtf_l1 Col_amp ADC Vbgap VDDPIX
FRAME_ CMD_P_
F GND
REQ
SPI_IN SPI_OUT
INV
Vpch_H Vres_H Vtf_l2 Col_load Ramp DIO1 GND
E CLK_IN VDD33 GND VDD20 GND VDDPIX VDD20 VDD20 GND SG_ADC Vramp1 Vramp2
LVDS_ LVDS_
D CLK_P CLK_N
OUT3_N OUT3_P OUT8_N OUT8_P OUT9_N OUT9_P OUT14_N OUT14_P VREF REF_ADC
C GND OUT1_N OUT1_P OUT6_N OUT6_P GND VDD20 OUT11_N OUT11_P OUT16_N OUT16_P GND
A OUT2_N OUT2_P OUT5_N OUT5_P GND VDD20 OUT12_N OUT12_P OUT15_N OUT15_P GND
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Application Information
Figure 99:
LCC Pinout
CMD_P_INV
SYS_RES_N
SPI_OUT
Col_amp
Col_load
SPI_CLK
CMD_N
COL_PC
CMD_P
T_EXP2
Vres_H
SPI_EN
VDD20
VDD33
SPI_IN
Vpc_H
Vres_L
Vtf_l3
Vtf_l2
Vtf_l1
Ramp
GND
GND
GND
GND
Tana
ADC
47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73
VDDPIX 46 74 VDDPIX
Vbgap 45 75 T_EXP1
LVDS 44 76 FRAME_REQ
VREF 43 77 TDIG1
REF_ADC 42 78 LVDS_CLK_N
SG_ADC 41 79 LVDS_CLK_P
Vramp1 40 80 CLK_IN
Vramp2 39 81 GND
GND 38 82 OUT8_P
VDD20 37 83 OUT8_N
OUT9_N 36 84 VDD20
OUT9_P 35 85 OUT6_P
OUT12_N 34 86 OUT6_N
OUT12_P 33 87 GND
OUT14_N 32 88 OUT4_P
OUT14_P 31 89 OUT4_N
OUT15_N 30 90 OUT3_P
OUT15_P 29 91 OUT3_N
GND 28 92 GND
27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
OUTCTR_N
OUTCTR_P
OUTCLK_N
OUTCLK_P
OUT16_N
OUT13_N
OUT11_N
OUT10_N
OUT16_P
OUT13_P
OUT11_P
OUT10_P
OUT7_N
OUT5_N
OUT2_N
OUT1_N
OUT7_P
OUT5_P
OUT2_P
OUT1_P
VDDPIX
VDD33
VDD20
VDD20
VDD33
GND
GND
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Package Drawings & Markings
Figure 100:
µPGA Package Drawing
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Package Drawings & Markings
Figure 101:
Assembly Drawing µPGA
3.69±0.10
Pixel (0,0)
18.06 ±0.10
9.32±0.10 Optical center
9.84±0.10
1.760 ±0.130
3.69±0.10
Pixel (0,0)
H
1 2 3 4 5 6 7 8 9 10 11 12
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Package Drawings & Markings
Figure 102:
LCC Package Drawing
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Package Drawings & Markings
Figure 103:
Assembly Drawing LCC
3.69±0.10
Pixel (0,0)
18.06 ±0.10
9.32±0.10 Optical center
9.84±0.10
1.495 ±0.130
74
3.69±0.10 46
75 Pixel (0,0)
45
80
40
85
35
90
30
92
28
1 5 10 15 20 25 27
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Soldering & Storage Information
Figure 104:
Wave Solder Profile
Max 10 s
260
Temperature (C)
25
Time (s)
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Soldering & Storage Information
Figure 105:
Reflow Soldering Graph
60 to 80
seconds
10 to 20
sec
245
Temperature (C)
220
200
150
60 to 180
seconds
25
Maximum 6 min
Time (s)
Datasheet • PUBLIC
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Revision Information
11 Revision Information
Product Preview Pre-Development Information in this datasheet is based on product ideas in the planning phase
of development. All specifications are design goals without any warranty and
are subject to change without notice
Preliminary Datasheet Pre-Production Information in this datasheet is based on products in the design, validation or
qualification phase of development. The performance and parameters shown
in this document are preliminary without any warranty and are subject to
change without notice
Datasheet Production Information in this datasheet is based on products in ramp-up to full production
or full production which conform to specifications in accordance with the terms
of ams-OSRAM AG standard warranty as given in the General Terms of Trade
Other Definitions
Draft / Preliminary:
The draft / preliminary status of a document indicates that the content is still under internal review and subject to change without
notice. ams-OSRAM AG does not give any warranties as to the accuracy or completeness of information included in a draft /
preliminary version of a document and shall have no liability for the consequences of use of such information.
Short Datasheet:
A short datasheet is intended for quick reference only, it is an extract from a full datasheet with the same product number(s) and
title. For detailed and full information always see the relevant full datasheet. In case of any inconsistency or conflict with the
short datasheet, the full datasheet shall prevail.
Corrected equation 2 21
● Page and figure numbers for the previous version may differ from page and figure numbers in the current revision.
● Correction of typographical errors is not explicitly mentioned.
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Legal Information
12 Legal Information
Copyright & Disclaimer
Copyright ams-OSRAM AG, Tobelbader Strasse 30, 8141 Premstaetten, Austria-Europe. Trademarks Registered. All rights
reserved. The material herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written
consent of the copyright owner.
Devices sold by ams-OSRAM AG are covered by the warranty and patent indemnification provisions appearing in its General
Terms of Trade. ams-OSRAM AG makes no warranty, express, statutory, implied, or by description regarding the information
set forth herein. ams-OSRAM AG reserves the right to change specifications and prices at any time and without notice.
Therefore, prior to designing this product into a system, it is necessary to check with ams-OSRAM AG for current information.
This product is intended for use in commercial applications. Applications requiring extended temperature range, unusual
environmental requirements, or high reliability applications, such as military, medical life-support or life-sustaining equipment are
specifically not recommended without additional processing by ams-OSRAM AG for each application. This product is provided
by ams-OSRAM AG “AS IS” and any express or implied warranties, including, but not limited to the implied warranties of
merchantability and fitness for a particular purpose are disclaimed.
ams-OSRAM AG shall not be liable to recipient or any third party for any damages, including but not limited to personal injury,
property damage, loss of profits, loss of use, interruption of business or indirect, special, incidental or consequential damages,
of any kind, in connection with or arising out of the furnishing, performance or use of the technical data herein. No obligation or
liability to recipient or any third party shall arise or flow out of ams-OSRAM AG rendering of technical or other services.
Product and functional safety devices/applications or medical devices/applications:
ams-OSRAM AG components are not developed, constructed or tested for the application as safety relevant component or for
the application in medical devices. ams-OSRAM AG products are not qualified at module and system level for such application.
In case buyer – or customer supplied by buyer – considers using ams-OSRAM AG components in product safety
devices/applications or medical devices/applications, buyer and/or customer has to inform the local sales partner of ams-
OSRAM AG immediately and ams-OSRAM AG and buyer and /or customer will analyze and coordinate the customer-specific
request between ams-OSRAM AG and buyer and/or customer.
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