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CMV4000

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16 views86 pages

CMV4000

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Product

Document

Published by
ams OSRAM Group
Datasheet
DS000728

CMV4000
Global Shutter CMOS Image Sensor for Machine
Vision

v6-00 • 2023-Aug-04
Document Feedback CMV4000
Content Guide

Content Guide

1 General Description ...................... 3 8.1 Color Filter .................................................. 70


8.2 Response Curve ......................................... 71
1.1 Key Benefits & Features............................... 3 8.3 Pinout.......................................................... 71
1.2 Applications .................................................. 3
1.3 Block Diagram .............................................. 4 9 Package Drawings & Markings ... 77
2 Ordering Information .................... 5 9.1 95 Pins µPGA and LGA .............................. 77
9.2 92 Pins LCC ............................................... 79
3 Absolute Maximum Ratings ......... 7
10 Soldering & Storage Information 81
4 Electrical Characteristics.............. 8
10.1 Manual Soldering ........................................ 81
5 Specification Overview ............... 10 10.2 Wave Soldering .......................................... 81
10.3 Reflow Soldering ........................................ 82
5.1 Spectral Characteristics ............................. 11 10.4 Additional Recommendation....................... 82
6 Functional Description................ 15 11 Revision Information ................... 83
6.1 Sensor Architecture .................................... 15
12 Legal Information ......................... 84
6.2 Operating the Sensor ................................. 18
6.3 Sensor Readout Format ............................. 29
6.4 Configuring Exposure and Readout ........... 38
6.5 Configuring Output Data Format ................ 53
6.6 Configuring On-Chip Data .......................... 57
7 Register Description ................... 62
7.1 Register Overview ...................................... 62
7.2 Recommended Register Settings............... 67
8 Application Information .............. 70

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General Description

1 General Description
The CMV4000 is a high sensitivity, pipelined global shutter CMOS image sensor with 2048 x 2048
pixel resolution capable of HD format. Pipelining allows exposure during read out. The state-of-the-art
pixel architecture offers true correlated double sampling (CDS) reducing the fixed pattern noise and
dark noise significantly. The imager features 16 LVDS channels each running at 480 Mbps resulting in
a 180 fps frame rate at full resolution at 10-bit per pixel. A 12-bit mode is available at reduced frame
rate. Driving and read-out are programmed over a serial peripheral interface. An internal timing
generator produces the signals needed for read-out and exposure control of the image sensor.
External exposure triggering remains possible.

1.1 Key Benefits & Features


The benefits and features of CMV4000, Global Shutter CMOS Image Sensor for Machine Vision are
listed below:

Figure 1:
Added Value of Using CMV4000

Benefits Features

Global shutter with excellent parasitic light


Freeze moving objects
sensitivity of 1/50000
Track moving objects accurately and high
High speed 180 fps
inspection rate
Easy HW design Pin compatible to CMV2000
Choose between maximum frame rate (10-bit) or
Selectable ADC Resolution
better image quality (12-bit)
High dynamic range mode with dual exposure
See bright and dark objects at the same time
and piecewise linear response option

1.2 Applications
● Machine vision
● 3D imaging
● Motion capture
● Bar and 2D code scanning
● Intelligent traffic systems
● Video and broadcast
● Biometrics

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General Description

1.3 Block Diagram


The functional blocks of this device are shown below:

Figure 2:
Functional Blocks of CMV4000

External driving
signals
Sequencer

Input clock
Pixel array
2048 x 2048 active pixels

...
Analog Front End
SPI
(gain, offset, ADCs)
SPI signals

Temp LVDS LVDS ... LVDS LVDS


Sensor
16, 8, 4 or 2 outputs

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Ordering Information

2 Ordering Information

Marking Mono/Color Glass Type Package Delivery Quantity


CMV4000-2E12M1PP Mono Plain glass PGA 40 pcs/tray
CMV4000-2E5M1PA Mono AR coated PGA 40 pcs/tray
CMV4000-2E5C1PA Color AR coated PGA 40 pcs/tray
CMV4000-2E5C1PP Color Plain glass PGA 40 pcs/tray
CMV4000-2E5M1LP Mono Plain glass LGA 40 pcs/tray
CMV4000-2E5C1LP Color Plain glass LGA 40 pcs/tray
CMV4000-2E5M1PP Mono Plain glass PGA 40 pcs/tray
CMV4000-2E12M1LP Mono Plain glass LGA 40 pcs/tray
CMV4000-3E12M1LP Mono Plain glass LGA 40 pcs/tray
CMV4000-3E12M1PP Mono Plain glass PGA 40 pcs/tray
CMV4000-3E5C1CA Color AR coated LCC 40 pcs/tray
CMV4000-3E5C1LP Color Plain glass LGA 40 pcs/tray
CMV4000-3E5C1PP Color Plain glass PGA 40 pcs/tray
CMV4000-3E5M0PN Mono Removable glass PGA 40 pcs/tray
CMV4000-3E5M1CA Mono AR coated LCC 40 pcs/tray
CMV4000-3E5M1LP Mono Plain glass LGA 40 pcs/tray
CMV4000-3E5M1PA Mono AR coated PGA 40 pcs/tray
CMV4000-3E5M1PN Mono Removable glass PGA 40 pcs/tray
CMV4000-3E5M1PP Mono Plain glass PGA 40 pcs/tray

Figure 3:
Ordering Code Information

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Ordering Information

Figure 4:
Differences Between Versions

Topic Version2 Version3


PLL Improved PLL
PGA Additional gain steps
Horizontal line effect can be avoided by
There shall not be a line read out when inserting dummy lines at the moment
Horizontal line effect
exposure starts the exposure of the next frame is
started.
Avoiding effect with reduction of the
Black sun effect Actively removing effect
brightness of light falling on the sensor
Enable by setting the appropriate SPI
Electrical black columns
register for reducing the row noise.
The registers addresses and contents are different from version to version. See
Register settings chapter 7 “Register Description”. Version 3 has different recommended register
settings than version 2.
Improved integration single shot mode
Integration in single shot mode
to reduce horizontal line artifact.
The images showing some pattern, if
pixel value is lower than 150DN.
Vertical PRNU pattern Correction can be done with applying a
gain correction to each column, which
compensates the FPN.
This can be solved by increasing gain
to clip the response in its linear part.
Column patterns in the non-linear part
of the response curve But setting it too high can cause a drop
in saturation value and full well
capacity.

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Absolute Maximum Ratings

3 Absolute Maximum Ratings


Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to
the device. These are stress ratings only. Functional operation of the device at these or any other
conditions beyond those indicated under “Operating Conditions” is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.

Figure 5
Absolute Maximum Ratings of CMV4000

Symbol Parameter Min Max Unit Comments


Electrical Parameters
VDD20 Digital supply LVDS, ADC 2 2.2 V
VDD33 Analog Supply ADC, PGA 3 3.6 V
VDDPIX Analog Pixel Supply 2.3 3.6 V
Vres_h Analog Pixel Reset Supply 3.0 3.6 V
Continuous Power Dissipation (TA = 70 °C)
PT Continuous Power Dissipation 4.2 W At max. frame rate
Electrostatic Discharge
ESDHBM Electrostatic Discharge HBM ±2 kV JS-001-2014
Temperature Ranges and Storage Conditions
TJ Operating Junction Temperature -30 70 °C
TSTRG Storage Temperature Range 20 40 °C
Relative Humidity (non-
RHNC 30 60 %
condensing)

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Electrical Characteristics

4 Electrical Characteristics
All limits are guaranteed. The parameters with Min and Max values are guaranteed with production
tests or SQC (Statistical Quality Control) methods.

Figure 6:
Electrical Characteristics of CMV4000

Symbol Parameter Conditions Min Typ Max Unit

Power Supplies

Digital supply
VDD20 2.05 2.1 2.15 V
LVDS, ADC
Analog supply
VDD33 3.2 3.3 3.4 V
ADC, PGA
Analog pixel
VDDPIX 2.9 3.0 3.1 V
supply
Analog pixel reset
Vres_h 3.2 3.3 3.4 V
supply
Readout @ Version2 380 mA
IDD20 Supply current
Readout @ Version3 360 mA
Readout @ Version2 65 mA
IDD33 Supply current
Readout @ Version3 90 mA
Readout @ Version2 20 mA
IDDPIX Supply current
Readout @ Version3 20 mA
Ires_h Supply current Readout 15 mA

Power Version2 790 mW


P20
consumption Version3 750 mW

Power Version2 220 mW


P33
consumption Version3 300 mW
Power
PPIX 60 mW
consumption
Power
Pres_h 50 mW
consumption

Digital I/O CMOS/TTL DC

High level input


VIH 2.0 VDD33 V
voltage
Low level input
VIL GND 0.8 V
voltage

High level output VDD=3.3 V


VOH 2.4 V
voltage IOH=-2 mA

Low level output VDD=3.3 V


VOL 0.4 V
voltage IOL=2 mA
Ci Input load 2 pF

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Electrical Characteristics

Symbol Parameter Conditions Min Typ Max Unit


Co Output load 2 pF
fCLK_IN CLK_IN frequency 5 48 MHz

TIA/EIA-644A LVDS - DRIVER SPECIFICATIONS (OUTX_N/P, OUTCLK_N/P, OUTCTR_N/P)

Differential output
VOD Steady State, RL = 100 Ω 247 350 454 mV
voltage
Difference in VOD
between
∆VOD Steady State, RL = 100 Ω 50 mV
complementary
output states
Common mode
VOC(1) Steady State, RL = 100 Ω 1.26 1.37 1.50 V
voltage
Difference in VOC
between
∆VOC Steady State, RL = 100 Ω 50 mV
complementary
output states
Output short circuit
IOS,GND VOUTP=VOUTN=GND 24 mA
current to ground
Output short circuit
IOS,PN VOUTP=VOUTN 12 mA
current

TIA/EIA-644A LVDS-RECEIVER SPECIFICATIONS (LVDS_CLK_N/P)

Differential input
VID Steady state 100 350 600 mV
voltage
Receiver input
VIC Steady state 0.0 2.4 V
range

Receiver input VINP|INN=1.2V±50mV, 0≤


IID 20 µA
current VINP|INN≤2.4V
Receiver input
∆IID |IINP – IINN| 6 µA
current difference
Timing

CLK_IN 5 48 MHz

LVDS_CLK_N/P 50 480 MHz


SPI_CLK 48 MHz

(1) Voc is dependent on the 2.1 V supply voltage; therefore, these values differ from the TIA/EIA-644A spec.

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Specification Overview

5 Specification Overview
Below are the typical electro-optical specifications of CMV4000. These are typical values with typical
supplies at room temperature.

Figure 7:
Electro-Optical Characteristics

Specification Value Comment


Effective pixels 2048 x 2048
Pixel pitch 5.5 x 5.5 µm2
Optical format 1”
Full well charge 13.5 ke- Pinned photodiode pixel
-
Conversion gain 0.075 LSB/e 10-bit mode, unity gain
5.56 V/lux.s
Sensitivity With microlenses @ 550 nm
0.27 A/W
Temporal noise Pipelined global shutter (GS) with correlated double sampling (CDS).
13 e-
(analog domain) Read noise
Dynamic range 60 dB
Allows fixed pattern noise correction and reset (kTC) noise canceling
Pixel type Global shutter pixel
through correlated double sampling.
Pipelined global
Shutter type Exposure of next image during read-out of the previous image.
shutter
Parasitic light sensitivity - <1/50 000
Shutter efficiency >99.998%
Color filters Optional RGB Bayer pattern
Micro lenses Yes
Fill Factor 42% w/o micro lens
QE * FF 60% @ 550 nm with micro lenses.
@ 25°C die temperature. The dark current doubles with every 6.5 °C
Dark current signal 125 e-/s
increase
DSNU 3 LSB/s 10-bit mode
Fixed pattern noise <1 LSB RMS <0.1% of full swing, 10-bit mode
PRNU <1% RMS of signal
Each data output running @ 480 Mbit/s.
LVDS Output channel 16
8, 4 and 2 outputs selectable at reduced frame rate
Using a 10 bit/pixel and 480 Mbit/s LVDS.
Frame rate 180 frames/s
Higher frame rate possible in row windowing mode.
Timing generation On-chip Possibility to control exposure time through external pin.
PGA Yes 4 analog gain settings
Window coordinates, Timing parameters, Gain & offset, Exposure
Programmable registers Sensor parameters
time, flipped read-out in X and Y direction …

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Specification Overview

Specification Value Comment


Multi-frame read-out
Successive frames are read out with increasing exposure times. The
with different exposure
final image is a combination (externally) of these frames.
time
Interleaved exposure times for different rows: Odd rows (double
Supported HDR modes Interleaved integration rows for color) have a different exposure compared to even rows
times (double rows for color). Final image is a combination of the two
(through interpolation).
Piecewise linear
Response curve with two knee points.
response
ADC 10-bit/12-bit Column ADC
Interface LVDS Serial output data + synchronization signals
LVDS = 1.8 V
I/O logic levels
Dig. I/O = 3.3 V
2.0 V LVDS, ADC
Supply voltages 3.0 V Pixel array supply
3.3 V Dig. I/O, SPI, PGA
CLK_IN Between 5 and 48 MHz
Clock inputs LVDS_CLK_N/P Between 50 and 480 MHz, LVDS
SPI_CLK Max. 48 MHz
Power 550 mW to 1200 mW Actual wattage is dependent on the used configuration
µPGA (95 pins)
Custom ceramic
Package LGA (95 pins)
package
LCC (92 pins)
Dark current and noise performance will degrade at higher
Operating range -30 °C to 70 °C
temperature
Cover glass D263 Plain or AR glass, no IR cut-off filter on color devices
Class 1A HBM
ESD
Class 4C CDM
RoHS Compliant

5.1 Spectral Characteristics


The cover glass of the CMV4000 is plain D263 glass with a transmittance as shown in Figure 8.
Refraction index of the glass is 1.52.

When a color sensor is used an IR-cutoff filter should be placed in the optical path of the sensor.

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Specification Overview

Figure 8:
Transmittance Curve Offer D263 Cover Plain Glass

100

90

80

70
Transmittance [%]

60

50

40

30

20

10

0
300 400 500 600 700 800 900 1000 1100
Wavelength [nm]

Figure 9:
Transmittance Curve for D263 AR Coated Glass

100

90

80

70
Transmittance [%]

60

50

40

30

20

10

0
300 400 500 600 700 800 900 1000 1100

Wavelength [nm]

When a color version of the CMV4000 is used, the color filters are applied in a Bayer pattern. The
color version of the CMV4000 always has micro lenses. The typical spectral response of the CMV with
color filters and D263 cover glass is shown in Figure 10. The use of an IR cut-off filter in the optical
path of the CMV4000 image sensor is necessary to obtain good color separation when using light with
an NIR component. The typical spectral response of a monochrome CMV4000 with microlenses can
be found in Figure 10 as well.

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Specification Overview

Figure 10:
Typical Spectral Response of CMV4000 with RGB Color Filters and D263 Cover Glass and
Mono

70
Blue_v2

Green1_v2
60 Green2_v2

Red_v2

50 Mono E5
QE [%]

40

30

20

10

0
400 500 600 700 800 900 1000
Wavelength [nm]

A variation from the standard CMV4000 image sensors is processed on 12 µm epi (E12) Si wafers.
The thicker epi-layer wafer starting material increases significantly the QE for wavelengths above
600 nm. Around 900 nm the QE is about doubled and increases from 8% to 16%. This is shown in
Figure 11.

Figure 11:
Response of E12 Devices and Normal Devices

70
Mono E5

Mono E12
60

50
QE [%]

40

30

20

10

0
400 500 600 700 800 900 1000
Wavelength [nm]

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Specification Overview

The typical angular response for a CMV4000 sensor can be seen in Figure 12. The data includes the
horizontal and vertical angles.

Figure 12:
Horizontal and Vertical Angular Response

100
Horizontal
90
Vertical
80
Relative Response [%]

70

60

50

40

30

20

10

0
-50 -30 -10 10 30 50
Angle [°]

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Functional Description

6 Functional Description

6.1 Sensor Architecture


Figure 2 shows the image sensor architecture. The internal sequencer generates the necessary
signals for image acquisition. The image is stored in the pixel (global shutter) and is then read out
sequentially, row-by-row. On the pixel output, an analog gain is possible. The pixel values then passes
to a column ADC cell, in which ADC conversion is performed. The digital signals are then read out
over multiple LVDS channels. Each LVDS channel reads out 128 adjacent columns of the array. In the
Y-direction, rows of interest are selected through a row-decoder which allows a flexible windowing.
Control registers are foreseen for the programming of the sensor. These register parameters are
uploaded via a four-wire SPI interface. A temperature sensor which can be read out over the SPI
interface is also included.

6.1.1 Pixel Array

The pixel array consists of 2048 x 2048 square global shutter pixels with a pitch of 5.5 µm (5.5 μm x
5.5 μm). This results in an optical area of close to 1 optical inch (16 mm). This means that off-the
shelve C-mount lenses can be used.

The pixels are designed to achieve maximum sensitivity with low noise and low PLS specifications.
Micro lenses are placed on top of the pixels for improved fill factor and quantum efficiency (>50%).

6.1.2 Analog Front End

The analog front end consists of 2 major parts, a column amplifier block and a column ADC block.

The column amplifier prepares the pixel signal for the column ADC and applies analog gain if desired
(programmable using the SPI interface). The column ADC converts the analog pixel value to a 10-bit
or 12-bit value. A digital offset can also be applied to the output of the column ADC’s. All gain and
offset settings can be programmed using the SPI interface.

6.1.3 LVDS Block

The LVDS block converts the digital data coming from the column ADC into standard serial LVDS data
running at maximum 480 Mbps. The sensor has 18 LVDS output pairs:
● 16 Data channels
● 1 Control channel
● 1 Clock channel

The 16 data channels are used to transfer 10-bit or 12-bit data words from sensor to receiver. The
output clock channel transports a DDR clock, synchronous to the data on the other LVDS channels.

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Functional Description

This clock can be used at the receiving end to sample the data. The data on the control channel
contains status information on the validity of the data on the data channels, among other useful sensor
status information. Details on the LVDS timing can be found in chapter 6.3.

LVDS requires parallel termination at the receiver side. So between LVDS_CLK_P (pin D1) and
LVDS_CLK_N (pin D2) should be an external 100 Ω resistor. Also all the LVDS outputs should all be
externally terminated at the receiver side. See the TIA/EIA-644A standard for details.

6.1.4 Sequencer

The on-chip sequencer will generate all required control signals to operate the sensor from only a few
external control clocks. This sequencer can be activated and programmed through the SPI interface. A
detailed description of the SPI registers and sensor (sequencer) programming can be found in chapter
6.4 of this document.

6.1.5 SPI Interface

The SPI interface is used to load the sequencer registers with data. The data in these registers is used
by the sequencer while driving and reading out the image sensor. Features like windowing,
subsampling, gain and offset are programmed using this interface. The data in the on-chip registers
can also be read back for test and debug of the surrounding system. Chapter 6.2.8 contains more
details on SPI programming and timing.

6.1.6 Temperature Sensor

A 16-bit digital temperature sensor is included in the image sensor and can be controlled by the SPI-
interface. The on-chip temperature can be obtained by reading out the registers with address 126 and
127 (in burst mode, see chapter SPI R for more details on this mode).

A calibration of the temperature sensor is needed for absolute temperature measurements per device
because the offset differs from device to device. The temperature sensor requires a running input
clock (CLK_IN), the other functions of the image sensor can be operational or in standby mode. The
output value of the sensor is dependent on the input clock. A typical temperature sensor output vs.
temperature curve at 40 MHz can be found in Figure 13. The die temperature will be about
10 °C~15 °C higher than ambient temperature. The ceramic package has about the same temperature
as the die.

𝑓 [𝑀𝐻𝑧]
The typical (offset) value of the temperature sensor at 0 °C would be: 1000 ∗ DN. This offset
40
40
can differ per device. A typical slope would be around 0.3 ∗ °C/DN.
𝑓[𝑀𝐻𝑧]

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Functional Description

Figure 13:
Typical Output of the Temperature Sensor of the CMV4000

1400

1200

1000
Digital output (DN)
800

600

400

200

0
-40 -20 0 20 40 60 80
Temperature (C)

Figure 14:
Location of the Temperature Sensor

Pixel (0,0)

Optical center

3.19mm
Temp. sensor

6.51mm

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Functional Description

6.2 Operating the Sensor


This section explains how to connect and power the sensor, as well as basic recipes of how to
configure the sensor in a certain operation mode.

6.2.1 Power Supplies

To power the sensor, eight externally generated supplies are required as listed in Figure 6.

Figure 15:
Different Power Supplies

Supply Name Usage Description

VDD20 LVDS, ADC Digital supply


VDD33 Dig. I/O, PGA, SPI, ADC Analog supply
VDDPIX Pixel array power supply Analog pixel supply
Vres_h Pixel reset pulse Analog pixel reset supply

The power figures are measured at 48 MHz CLK_IN speed in 16 channels mode while constantly
grabbing images. When idle, the sensor will consume about 30% less energy. Reducing the amount of
output channels will reduce power consumption of the VDD20 supply and will have the biggest impact
on the power consumption.

The recommended values for the different power supplies are shown in Figure 6.

All variations on the VDD33 and VDDPIX can contribute to variations (noise) on the analog pixel
signal, which is seen as noise in the image. During the camera design, precautions have to be taken
to supply the sensor with very stable supply voltages to avoid this additional noise.

Because of the peak currents, decoupling is advised. Place large decoupling capacitors directly at the
output of the voltage regulator to filter low noise and improve peak current supply. We advise 1x
330 µF electrolytic, 1x 33 µF tantalum and a 10 µF ceramic capacitor per supply, directly at the output
of the regulator.

Place small decoupling capacitors as close as possible to the sensor between supply pins and ground.
We advise 1x 4.7 µF and 1x 100 nF ceramic capacitor per power supply pin (see pin list) and 1x
100 µF ceramic capacitor per power supply plane (VDD20, VDDPIX, VDD33). Vres_h does not need a
100 µF capacitor. See pin list for exact pin numbers for every supply. Analog and digital ground can be
tied together.

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Functional Description

6.2.2 Biasing

For optimal performance, some pins need to be decoupled to ground or to VDD. Please refer to the
pin list for a detailed description for every pin and the appropriate decoupling if applicable.

6.2.3 Digital Input Pins

Figure 16 gives an overview of the external pins used to drive the sensor. The digital signals are
sampled on the rising edge of the CLK_IN, therefore the length of the signal applied to an input should
be at least 1 CLK_IN period to assure it has been detected. All digital I/O’s have a capacitance of 2 pF
max.

Figure 16:
Digital Input Pins Description

Pin Name Description

CLK_IN Master input clock


LVDS_CLK_N/P High speed LVDS input clock
SYS_RES_N System reset pin, active low signal. Resets the on-board sequencer and must be
kept low during start-up. This signal should be at least one period of CLK_IN
long to assure detection on the rising edge of CLK_IN.
FRAME_REQ Frame request pin. When a high level is detected on this pin the programmed
number of frames is captured and sent by the sensor. This signal should be at
least one period of CLK_IN long to assure detection on the rising edge of
CLK_IN.
SPI_IN Data input pin for the SPI interface. The data to program the image sensor is
sent over this pin.
SPI_EN SPI enable pin. When this pin is high the data should be written/read on the SPI
SPI_CLK SPI clock. This is the clock on which the SPI runs
T_EXP1 Input pin to program the exposure time externally. Optional
T_EXP2 Input pin to program the exposure time externally in HDR mode. Optional

6.2.4 Input Clock

The high-speed LVDS input clock (LVDS_CLK_N/P) defines the output data rate of the CMV4000.
The master clock (CLK_IN) must be 10 or 12 times slower depending on the programmed bit mode
setting. The maximum data rate of the output is 480 Mbps which results in a LVDS_CLK_N/P of
480 MHz and a CLK_IN of 48 MHz in 10-bit mode and 40 MHz in 12-bit mode. The minimum
frequencies are 5 MHz for CLK_IN and 50 MHz for LVDS_CLK_N/P. Any frequency between the
minimum and maximum can be applied by the user and will result in a corresponding output data rate,
like shown in Figure 17.

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Functional Description

Figure 17:
Output Data Rate Depending on the CLK_IN and Bit Mode

CLK_IN LVDS_CLK 10-Bit LVDS_CLK 12-Bit

5 MHz 50 MHz 60 MHz


40 MHz 400 MHz 480 MHz
48 MHz 480 MHz N/A

The rising edge LVDS input clock can have a limited delay with respect to the rising edge of the
master input clock, depending on clock speed. In Figure 18, the skew limits are shown for different
clock speeds and for an LVDS clock that rises before and after the master input clock. To assure
proper working of the sensor, the skew of the LVDS clock should always fall within these limits, shown
as the green area.

Figure 18:
LVDS Clock Delay Versus Master Clock

CLK_IN

LVDS_CLK 1145
480MHz
600

LVDS_CLK 1240
450MHz
580

LVDS_CLK 1400
400MHz
780

LVDS_CLK 1680
350MHz
660

LVDS_CLK
300MHz

LVDS_CLK
250MHz
640

LVDS_CLK
200MHz
680

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Functional Description

6.2.5 Frame Rate Calculation

The frame rate is defined by 2 main factors.


● Exposure time
● Read-out time

To simplify the calculation, we will assume that the exposure time is shorter than the read-out time and
that the sensor is operating at default settings, taking a full resolution 10-bit image at 48 MHz through
16 outputs. This means that the frame rate will be defined only by the read-out time because the
exposure time happens in parallel with the read-out time. The read-out time is defined by:
● Output clock speed: Max 240 MHz
● ADC mode: 10 or 12-bit
● Number of lines read-out
● Number of LVDS outputs used: Max 16 outputs

If any of these parameters is changed, it will have an impact on the frame rate. In default operation
this will result in 180 fps. The total read-out time is composed of two parts: FOT (frame overhead time)
and the image read-out time.

The FOT is defined as shown in Equation 1:

Equation 1:

16
𝐹𝑂𝑇 = (𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ + (2 ∗ )) ∗ 129 ∗ 𝑚𝑎𝑠𝑡𝑒𝑟 𝑐𝑙𝑜𝑐𝑘 𝑝𝑒𝑟𝑖𝑜𝑑
#𝑜𝑢𝑡𝑝𝑢𝑡𝑠 𝑢𝑠𝑒𝑑

With fot_length (register 73) at its default value of 20, this results in 59.125 µs frame overhead time.

The image read-out time is defined as shown in Equation 2:

Equation 2:

16
𝐼𝑚𝑎𝑔𝑒 𝑟𝑒𝑎𝑑 − 𝑜𝑢𝑡 𝑡𝑖𝑚𝑒 = (129 ∗ 𝑚𝑎𝑠𝑡𝑒𝑟 𝑐𝑙𝑜𝑐𝑘 𝑝𝑒𝑟𝑖𝑜𝑑 ∗ ) ∗ 𝑛𝑟_𝑙𝑖𝑛𝑒𝑠
#𝑜𝑢𝑡𝑝𝑢𝑡𝑠 𝑢𝑠𝑒𝑑

Reading out a full resolution image, this results in 5.504 ms image read-out time.

The total read-out time is now the sum of the FOT and the image read-out time, which results in
59.125 µs + 5.504 ms or 5.5631 ms to read out a single full resolution image. The frame rate is thus
180 fps.

Figure 19 gives some examples of how the frame rate increases when reading out a smaller frame in
10-bit mode.

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Functional Description

Figure 19:
Frame Rate for Different Frame Size

Number of Columns Number of Lines Frame Rate

2048 2048 180


2048 1024 356
2048 70 4044

Figure 20 shows the frame period for 2 consecutive frame cycle.

Figure 20:
Frame Period

Frame period
FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

When the exposure time is greater than the read-out time, the frame rate is mostly defined by the
exposure time itself (because the exposure time would be much longer than the FOT).

6.2.6 Start-Up Sequence

The sequence, shown in Figure 21 should be followed when the CMV4000 is started up in default
output mode (480 Mbps, 10-bit resolution). There is no specific startup sequence for the power
supplies needed.

Figure 21:
Start-Up Sequence for 480 Mbps @ 10-Bit

Stable time 1μs

Supply

CLK_IN

1μs
SYS_RES_N

FRAME_REQ

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Functional Description

The master clock CLK_IN (48 MHz for 480 Mbps in 10-bit mode) should start after the rise time of the
supplies. The external reset pin should be released at least 1 μs after the supplies are stable. The first
frame can be requested 1 μs after the reset pin has been released.

If the register settings need to be changed (e.g. when using 12-bit mode), this can be done through an
SPI upload 1 µs after the rising edge on the SYS_RES_N pin, as described in Figure 22. In this case
the FRAME_REQ pulse must not be sent until after the SPI upload is completed, plus a settling time.
This settling time is to ensure that the changes programmed in the SPI upload have taken effect
before an image is captured. The main factor that determines this settling time is a change in ADC
gain, because the voltage over the ramp capacitor has to settle. For typical applications, where the
ADC gain is changed from the default value of 32 to a value that saturates the ADC output (40 to 45 at
48 MHz), the settling time is 7 ms. In extreme cases, when the ADC gain is changed from default to
maximum, the settling time can increase to 20 ms.

Figure 22:
Start-Up Sequence for 12-Bit Mode

Stable time 1μs

Supply

CLK_IN

1μs
SYS_RES_N

Settling time
FRAME_REQ

SPI upload SPI upload

6.2.7 Reset Sequence

If a sensor reset is necessary while the sensor is running the sequence in Figure 23 should be
followed. The on-board sequencer will be reset and all programming registers will return to their
default start-up values when a falling edge is detected on the SYS_RES_N pin. As with the start-up
sequence, there is a minimum time of 1 μs plus a settling time needed before a FRAME_REQ pulse
can be sent, to allow the gain settings to settle at their default value.

Figure 23:
Reset Sequence

CLK_IN

1µs Settling time


SYS_RES_N

FRAME_REQ

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Functional Description

When register settings are uploaded after the reset (e.g. when changing the bit mode), the sequence
of Figure 24 should be followed.

Figure 24:
Reset Sequence When Changing Bit Mode

CLK_IN

1μs
SYS_RES_N

1ms
FRAME_REQ

SPI upload SPI settings

6.2.8 SPI Programming

Programming the sensor is done by writing the appropriate values to the on-board registers. These
registers can be written over a simple serial interface (SPI). The data written to the programming
registers can also be read out over this same SPI interface.

The details of the timing and data format are described in following paragraphs.

SPI Write

The timing to write data over the SPI interface can be found in Figure 25.

Figure 25:
SPI Write Timing

½ CLK 1 CLK
SPI_EN

SPI_CLK

SPI_IN C=’1' A6 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0

The data is sampled by the CMV4000 on the rising edge of the SPI_CLK. The SPI_CLK has a
maximum frequency of 48 MHz. The SPI_EN signal has to be high for half a clock period before the
first data bit is sampled. After the last data bit is sent, SPI_EN has to remain high for 1 clock period
and SPI_CLK has to receive a final falling edge to complete the write operation.

One write action contains 16 bits:


● One control bit: First bit to be sent, indicates whether a read (‘0’) or write (‘1’) will occur on the
SPI interface.

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Functional Description

● 7 address bits: These bits form the address of the programming register that needs to be
written. The address is sent MSB first.
● 8 data bits: These bits form the actual data that will be written in the register selected with the
address bits. The data is written MSB first.

When several sensor registers need to be written, the timing above can be repeated with SPI_EN
remaining high all the time. See the Figure 26 for an example of 2 registers being written in burst.

Figure 26:
SPI Write Timing for 2 Registers in Burst

½ CLK 1 CLK
SPI_EN

SPI_CLK

SPI_IN C=’1' A6 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 C=’1' A6 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0

All registers should be updated during IDLE time. The sensor is not IDLE during a frame burst
(between start of integration of first frame and read-out of last pixel of last frame).

Registers 35-38, 40-69, 100-103 can be updated during IDLE or FOT. Registers 1-34 and 70-71 can
always be updated but it is recommended to update these during IDLE or FOT to minimize image
effects. Registers 78-79 can always be updated without disrupting the imaging process.

SPI Read

The timing to read data from the registers over the SPI interface can be found in Figure 27.

Figure 27:
SPI Read Timing

½ CLK 1 CLK
SPI_EN

SPI_CLK

SPI_IN C=’0' A6 A5 A4 A3 A2 A1 A0

SPI_OUT D7 D6 D5 D4 D3 D2 D1 D0

To indicate a read action over the SPI interface, the control bit on the SPI_IN pin is made ‘0’. The
address of the register being read out is sent immediately after this control bit (MSB first). After the
LSB of the address bits, the data is launched on the SPI_OUT pin on the falling edge of the SPI_CLK.
This means that the data should be sampled by the receiving system on the rising edge of the
SPI_CLK. The data comes over the SPI_OUT with MSB first. When reading out the temperature
sensor over the SPI, addresses 126 and 127 should de read-out in burst mode (keep SPI_EN high).

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6.2.9 Requesting a Frame

After starting up the sensor (see 6.2.6), a number of frames can be requested by sending a
FRAME_REQ pulse. The number of frames can be set by programming the appropriate register
(addresses 70 and 71). The default number of frames to be grabbed is 1.

In internal-exposure-time mode, the exposure time will start after this FRAME_REQ pulse. In the
external-exposure-time mode, the read-out will start after the FRAME_REQ pulse. Both modes are
explained into detail in following paragraphs.

Internal Exposure Control

In this mode, the exposure time is set by programming the appropriate registers (address 42-44).

After the high state of the FRAME_REQ pulse is detected, the exposure time will start after a delay of
133 clock cycles, see AN16 – Exposure timings for all timing details. When the exposure time ends
(as programmed in the registers), the pixels are being sampled and prepared for read-out. This
sequence is called the frame overhead time (FOT). Immediately after the FOT, the frame is read-out
automatically. If more than one frame is requested, the exposure of the next frame starts already
during the read-out of the previous one (see Figure 28).

Figure 28:
Request for 2 Frames in Internal- Exposure-Time Mode

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

Figure 29:
Two Requests for 1 Frame in Internal Exposure Mode(1)

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

(1) This request form is just applicable to Version 3.

When the exposure time is shorter than the read-out time, the FOT and read-out of the next frame will
start immediately after the read-out of the previous frame. Keep in mind that the next FRAME_REQ
pulse has to occur after the FOT of the current frame. For an exact calculation of the exposure time,
see chapter 6.4.1.

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When a new FRAME_REQ is applied, the exposure of the next frame will be delayed so that the FOT
begins right after the read-out time of the current frame.

Figure 30:
Request for 2 Frames in Internal Exposure Mode with Exposure Time < Read-Out Time

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

Figure 31:
Two Requests for 1 Frame in Internal Exposure Mode(1)

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

(1) Only applicable for Version 3.

Timing Calculation for Version2:

If the exposure time is shorter than the read-out time, keep in mind that when you apply a next
FRAME_REQ pulse during the read-out of the current frame, the exposure of that new frame will start
immediately. Therefore, you have to keep enough time between the two FRAME_REQ pulses so the
read-out times do not overlap. If the FOT of the next frame starts during the read-out of the current
frame, that read-out will be aborted immediately, as shown in Figure 32. If the exposure time is longer
than the read-out time, the read-out times of two consecutive frames cannot overlap and will not cause
a problem. The minimum time between two FRAME_REQ pulses is given by Equation 3:

Equation 3:

𝑚𝑖𝑛. 𝑡𝑖𝑚𝑒 = 𝑒𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒 + 𝐹𝑂𝑇 + (𝑅𝑒𝑎𝑑𝑜𝑢𝑡 𝑡𝑖𝑚𝑒 − 𝐸𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒) = 𝐹𝑂𝑇 + 𝑅𝑒𝑎𝑑𝑜𝑢𝑡 𝑡𝑖𝑚𝑒

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Functional Description

Figure 32:
The Timing Effect of Two Requests for 1 Frame in Internal Exposure Mode

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time Lost ROT

Frame2_cycle Exposure time FOT Read-out time

External Exposure Time

The exposure time can also be programmed externally by using the T_EXP1 input pin. This mode
needs to be enabled by setting the appropriate register (address 41). In this case, the exposure starts
when a high state is detected on the T_EXP1 pin. When a high state is detected on the FRAME_REQ
input, the exposure time stops and the read-out will start automatically. A new exposure can start by
sending a pulse to the T_EXP1 pin during or after the read-out of the previous frame. The minimum
time between T_EXP1 and FRAME_REQ is 1 master clock cycle, the minimum time between
FRAME_REQ and T_EXP1 pulse is FOT. For an exact calculation of the exposure time see chapter
6.4.1.

Figure 33:
Request for 2 Frames Using External-Exposure-Time Mode

T_EXP1

FRAME_REQ

Frame1_cycle Exposure time FOT Read-out time

Frame2_cycle Exposure time FOT Read-out time

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Functional Description

6.3 Sensor Readout Format

6.3.1 LVDS Data Outputs

The sensor has LVDS (low voltage differential signaling) outputs to transport the image data to the
surrounding system. Next to 16 data channels, the sensor also has two other LVDS channels for
control and synchronization of the image data. In total, the sensor has 18 LVDS output pairs (2 pins
for each LVDS channel):
● 16 Data channels
● 1 Control channel
● 1 Clock channel

This means that a total of 36 pins of the CMV4000 are used for the LVDS outputs (32 for data + 2 for
LVDS clock + 2 for control channel). See the pin list for the exact pin numbers of the LVDS outputs.

The 16 data channels are used to transfer the 10-bit or 12-bit pixel data from the sensor to the
receiver in the surrounding system.

The output clock channel transports a clock, synchronous to the data on the other LVDS channels.
This clock can be used at the receiving end to sample the data. This clock is a DDR clock which
means that the frequency will be half of the output data rate. When 480 Mbps output data rate is used,
the LVDS output clock will be 240 MHz.

The data on the control channel contains status information on the validity of the data on the data
channels. Information on the control channel is grouped in 10-bit or 12-bit words that are transferred
synchronous to the 16 data channels.

6.3.2 Low-Level Pixel Timing

Figure 34 and Figure 35 show the timing for transfer of 10-bit and 12-bit pixel data over one LVDS
output. To make the timing more clear, the figures show only the p-channel of each LVDS pair. The
data is transferred LSB first, with the transfer of bit D0 during the high phase of the DDR output clock
OUTCLK.

Figure 34:
10-Bit Pixel Data on an LVDS Channel

T1
OUTCLK_P

OUTX_P D8 D9 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D0 D1 D2 D3

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The time ‘T1’ in Figure 34 is 1/10th of the period of the CLK_IN input clock. If a frequency of 48 MHz is
used for CLK_IN (max in 10-bit mode), this results in a 240 MHz OUTCLK frequency.

Figure 35:
12-Bit Pixel Data on an LVDS Channel

T2
OUTCLK_P

OUTX_P D10 D11 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D0 D1

The time ‘T2’ in Figure 35 is 1/12th of the period of the CLK_IN input clock. If a frequency of 40 MHz is
used for CLK_IN (max in 12-bit mode), this results in a 240 MHz OUTCLK frequency.

6.3.3 Read-Out Timing

The read-out of image data is grouped in bursts of 128 pixels per channel. Each pixel is either 10 or
12 bits of data (see chapter 6.3.2). One complete pixel period equals one period of the master clock
input. For details on pixel remapping and pixel vs. channel location please see chapter 6.3.4 of this
document. An overhead time exists between two bursts of 128 pixels. This overhead time has the
same length of one pixel read-out (i.e. the length of 10 or 12 bits at the selected data rate or one
master clock period). For details on how to program the sequencer for different output modes, see
chapter 6.5.1.

10-Bit Mode

In this section, the read-out timing for the default 10-bit mode is explained. In this mode the maximum
frame rate of 180 fps can be reached.

For simplification, the timing for only one LVDS channel is shown in every case in the following
paragraphs:
● 16 Output channels
● 8 Output channels
● 4 Output channels
● 2 Output channels

16 Output Channels:

By default, all 16 data output channels are used to transmit the image data. This means that an entire
row of image data is transferred in one slot of 128 pixel periods (16 x 128 = 2048). This results in a
maximum frame rate of 180 fps.

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Figure 36:
Output Timing in Default 16 Channels Mode

DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128

Row 1 Row 2 Row 3 Row 4

8 Output Channels:

When only 8 LVDS output channels are used, the read-out of one row takes (2 x 128) + (2 x 1) master
clock periods. The maximum frame rate is reduced with a factor of 2 compared to 16 channels mode.

Figure 37:
Output Timing in 8 Channels Mode

DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128

Row 1 Row 2

4 Output Channels:

When only 4 LVDS output channels are used, the read-out of one row takes (4 x 128) + (4 x 1) master
clock periods. The maximum frame rate is reduce with a factor of 4 compared to 16 channels mode.

Figure 38:
Output Timing in 4 Channels Mode

DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128

Row 1 Row 2

2 Output Channels:

When only 2 LVDS output channels are used, the read-out of one row takes (8 x 128) + (8 x 1) master
clock periods. The maximum frame rate is reduced with a factor of 8 compared to 16 channels mode.

Figure 39:
Output Timing in 2 Channels Mode

IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128

Row 1 Row 2

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Functional Description

12-Bit Mode

In 12-bit mode, the analog-to-digital conversion takes 4x longer to complete. This causes the frame
rate to drop to 37.5 fps when 40 MHz is used for CLK_IN. Due to this extra conversion time, the
sensor automatically multiplexes to 4 outputs when 12-bit is used.

For simplification, the timing for only one LVDS channel is shown in every case in the following
paragraphs:
● 4 Output Channels
● 2 Output Channels

4 Output Channels:

By default, the CMV4000 uses only 4 LVDS output channels in 12-bit mode. This means that the read-
out of one row takes 516 (4 x 128) + (4 x 1) master clock periods.

Figure 40:
Output Timing in 4 Channels Mode

DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128

Row 1 Row 2

2 Output Channels:

When only 2 LVDS output channels are used, the read-out of one row takes (8 x 128) + (8 x 1) master
clock periods. The maximum frame rate is reduced with a factor of 2 compared to 4 channels mode.

Figure 41:
Output Timing in 2 Channels Mode

IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128 OH 128

Row 1 Row 2

6.3.4 Pixel Remapping

Depending on the number of output channels, the pixels are read out by different channels and come
out at a different moment in time. With the details from the next sections, the end user is able to remap
the pixel values at the output to their correct image array location.

16 Outputs:

Figure 42 shows the location of the image pixels versus the output channel of the image sensor.

16 bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is
read out in one burst. The amount of rows that will be read out depends on the value in the
corresponding register. By default there are 2048 rows being read out.

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Functional Description

Figure 42:
Pixel Remapping for 16 Output Channels

Channel 1 IDLE Pixel 0 to 127 Pixel 0 to 127

Channel 2 IDLE Pixel 128 to 255 Pixel 128 to 255

Channel 3 IDLE Pixel 256 to 383 Pixel 256 to 383

Channel 15 IDLE Pixel 1792 to 1919 Pixel 1792 to 1919

Channel 16 IDLE Pixel 1920 to 2047 Pixel 1920 to 2047

Row 1 Row 2

8 Outputs:

When only 8 outputs are used, the pixel data is placed on the outputs as detailed in Figure 43.
8 bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is
read out in two bursts. The time needed to read out one row is doubled compared to when 16 outputs
are used. Channel 2, 4, 6…16 are not being used in this mode, so they can be turned off by setting
the correct bits in the register with addresses 80-82. Turning off these channels will reduce the power
consumption of the chip.

The amount of rows that will be read out can be set in the register. By default 2048 rows are read out.

Figure 43:
Pixel Remapping for 8 Output Channels

Channel 1 IDLE Pixel 0 to 127 Pixel 128 to 255

Channel 3 IDLE Pixel 256 to 383 Pixel 384 to 511

Channel 5 IDLE Pixel 512 to 639 Pixel 640 to 767

Channel 13 IDLE Pixel 1536 to 1663 Pixel 1664 to 1791

Channel 15 IDLE Pixel 1792 to 1919 Pixel 1920 to 2047

Row 1

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4 Outputs:

When only 4 outputs are used, the pixel data is placed on the outputs as detailed in Figure 44. 4
bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is read
out in four bursts. The time needed to read out one row is 4x longer compared to when 16 outputs are
used. Only channel 1, 5, 9 and 13 are being used in this mode, so the remaining channels can be
turned off by setting the correct bits in the register with addresses 80-82. Turning off these channels
will reduce the power consumption of the chip.

The amount of rows that will be read out can be set in the register. By default 2048 rows are read out.

Figure 44:
Pixel Remapping for 4 Output Channels

Channel 1 IDLE Pixel 0 to 127 Pixel 128 to 255 Pixel 256 to 383 Pixel 384 to 511

Channel 5 IDLE Pixel 512 to 639 Pixel 640 to 767 Pixel 768 to 895 Pixel 896 to 1023

Channel 9 IDLE Pixel 1024 to 1151 Pixel 1152 to 1279 Pixel 1280 to 1407 Pixel 1408 to 1535

Channel 13 IDLE Pixel 1536 to 1663 Pixel 1664 to 1791 Pixel 1792 to 1919 Pixel 1920 to 2047

Row 1

2 Outputs:

When only 2 outputs are used, the pixel data is placed on the outputs as detailed in Figure 45.
2 bursts of 128 pixels happen in parallel on the data outputs. This means that one complete row is
read out in 8 bursts. The time needed to read out one row is 8x longer compared to when 16 outputs
are used. Only channels 1 and 9 are being used in this mode, so the remaining channels can be
turned off by setting the correct bits in the register with addresses 80-82. Turning off these channels
will reduce the power consumption of the chip.

The amount of rows that will be read out can be set in the register. By default 2048 rows are read out.

Figure 45:
Pixel Remapping for 2 Output Channels

Channel 1 IDLE Pixel 0 to 127 Pixel 128 to 255 Pixel 256 to 383 Pixel 384 to 511 Pixel 512 to 639 Pixel 640 to 767 Pixel 768 to 895 Pixel 896 to 1023

Channel 9 IDLE Pixel 1024 to 1151 Pixel 1152 to 1279 Pixel 1280 to 1407 Pixel 1408 to 1535 Pixel 1536 to 1663 Pixel 1664 to 1791 Pixel 1792 to 1919 Pixel 1920 to 2047

Row 1

Overview:

All outputs are always used to send data, but if you use less than 16 channels, some channels will
have duplicate data. For example if you multiplex to 4 channels, outputs 6, 7 and 8 will have identical
data as output 5.

Figure 46 shows an overview of which channel data is on which output at a certain output mode.

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Functional Description

Figure 46:
Overview Channel Data – Output Mode

6.3.5 Control Channel

The CMV4000 has one LVDS output channel dedicated for the valid data synchronization and timing
of the output channels. The end user must use this channel to know when valid image data or training
data is available on the data output channels.

The control channel transfers status information in 10-bit or 12-bit word format. Every bit of the word
has a specific function.

Figure 47:
Function of the Individual Bits

Bit Function Description

[0] DVAL Indicates valid pixel data on the outputs


[1] LVAL Indicates validity of the read-out of a row
[2] FVAL Indicates the validity of the read-out of a frame
[3] SLOT Indicates the overhead period before 128-pixel bursts (*)
[4] ROW Indicates the overhead period before the read-out of a row(1)
[5] FOT Indicates when the sensor is in FOT (sampling of image data in pixels)(1)
[6] INTE1 Indicates when pixels of integration block 1 are integrating(1)
[7] INTE2 Indicates when pixels of integration block 2 are integrating(1)
[8] ‘0’ Constant zero
[9] ‘1’ Constant one
[10] ‘0’ Constant zero
[11] ‘0’ Constant zero

(1) The status bits are purely informational. These bits are not required to know when the data is valid. The DVAL, LVAL
and FVAL signals are sufficient to know when to sample the image data.

INTE1/2 will be low when FOT is high, so the exposure during the small 0.43*reg73 overlap (see
formulas in 6.4.1), will not be visible in the INTE1/2 bits.

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Functional Description

Pins H2 (TDIG1) and G2 (TDIG2) can be programmed to map the state of control channel bits [0]
(DVAL), [1] (LVAL), [2] (FVAL), [6] (INTE1) or [7] (INTE2) with registers 108 (T_dig1) and 109
(T_dig2).

Figure 48:
Register 108/109 Value

Register 108/109 Value TDIG1 TDIG2

0 INTE1 INTE1
1 INTE2 INTE2
2 DVAL DVAL
3 LVAL LVAL
4 FVAL FVAL

DVAL, LVAL, FVAL

The first three bits of the control word must be used to identify valid data and the read-out status.

Figure 49 shows the timing of the DVAL, LVAL and FVAL bits of the control channel with an example
of the read-out of a frame of 3 rows (default is 2048 rows). In the example the default mode of 16
outputs is in 10-bit mode.

Figure 49:
DVAL, LVAL and FVAL Timing in 16 Outputs Mode

DATA_OUT IDLE OH 128 OH 128 OH 128

DVAL

LVAL

FVAL

When only 8 outputs are used, the line read-out time is 2x longer. The control channel takes this into
account and the timing in this mode are shown in Figure 50 and Figure 51. The timing extrapolates
identically for 4 and 2 outputs.

Figure 50:
DVAL, LVAL and FVAL Timing in 8 Outputs Mode

DATA_OUT IDLE OH 128 OH 128 OH 128 OH 128 OH 128 OH 128

DVAL

LVAL

FVAL

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Figure 51:
Detailed Timings of the Control Channel (8 outputs, 3 lines window)

Frames Exposure 1 FOT Read-out 1


cycle
Exposure 2 FOT Read-out 2

DVAL [0] Data Data

LVAL [1] Data Data

FVAL [2] Data Data

SLOT [3] Data Data

ROW [4] Data Data

FOT [5]

INTE1 [6]

INTE2 [7]

CTRL_OUT 10 0000 0000 10 1100 0000 10 001 0 0 000 10 000x xxxx 10 110x xxxx 10 1100 0000 10 001 0 0 000 10 000x xxxx 10 0000 0000

DATA_OUT Training Pattern Data Training Data Training Pattern

Read-out 1
Frames
cycle
Exposure 2

DATA_OUT OH 128 OH 128 OH 128 OH 128 OH 128 OH 128

DVAL

LVAL

FVAL

SLOT

ROW

FOT

INTE1

INTE2

10 0001 10 0000 10 0001 10 0000 10 000 1 10 110 0


CTRL_OUT 1000 10 0000 0111 1110 10 0000 0111 1100 10 0000 0111 1110 10 0000 0111 001 1 10 0000 0111 10 1100 0111 111 0 10 1100 0111

10 bit, 8 outputs, single window of 3 lines

6.3.6 Training Data

To synchronize the receiving side with the LVDS outputs of the CMV4000, a known data pattern can
be put on the output channels. This pattern “trains” the LVDS receiver of the surrounding system to
achieve correct word alignment of the image data. This training pattern is put on all 16 output channels
when no valid image data is being sent, even in between bursts of 128 pixels. The training pattern is a
10-bit or 12-bit word that replaces the pixel data. The sensor has a 12-bit sequencer register (address
78-79) that can be used to change the contents of the 12-bit training pattern.

The control channel does not send a training pattern, because it is used to send control information at
all time. Word alignment can be done on this channel when the sensor is idle (not exposing or sending
image data). In this case all bits of the control word are zero, except for bit [9] (= 0010 0000 0000 or
512 decimal).

Figure 52 shows the location of the training pattern (TP) on the data channels when the sensor is idle
and when reading out 3 rows. The default mode of 16 outputs is selected.

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Figure 52:
Training Pattern Location in the Data and Control Channels

Sensor in idle mode


DVAL

LVAL

FVAL

Data
Training pattern TP 128 TP 128 TP 128
channels
Control 0010 0000 0000 Control information
channel

6.4 Configuring Exposure and Readout


This section explains how the CMV4000 can be programmed using the on-board sequencer registers.

6.4.1 Exposure Modes

The exposure time can be programmed in two ways, externally or internally. Externally, the exposure
time is defined as the time between the rising edge of T_EXP1 and the rising edge of FRAME_REQ
(see External Exposure Time for more details). Internally, the exposure time is set by uploading the
desired value to the corresponding sequencer register.

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Figure 53:
Time Settings of Exposure Mode

Register Name Register Address Default Value Description of the Value

0: Value in Exp_time register defines


exposure time
Exp_ext 41[0] 0 1: Time between T_EXP1 and
FRAME_REQ pulses defines exposure
time
If Exp_ext = 0:
Defines the exposure time according to
the following formula:

129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ


+ 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)

Where clk_per is the period of the master


42[7:0] input clock and fot_length is the value in
Exp_time 43[7:0] 2048 register 73.
44[7:0]
If Exp_ext = 1:
The exposure time is:

129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ)


+ 𝑒𝑥𝑡𝑒𝑟𝑛𝑎𝑙 𝑒𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒

Where external exposure time is the time


between T_EXP1 and FRAME_REQ.

To calculate back from actual exposure time to the register value for internal exposure can use the
following formula (exposure time and clk_per should have the same time unit):

𝑒𝑥𝑝𝑜𝑠𝑢𝑟𝑒 𝑡𝑖𝑚𝑒
𝐸𝑥𝑝_𝑡𝑖𝑚𝑒 = − 0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟

For very short integration times, the fot_length should be lowered to 10 and the maximum clock speed
should be used. In internal exposure mode, the shortest exposure time is limited by the exp_time
register, when this is set to 1, the shortest exposure time is 25.8 µs, or 14.24 µs for fot_length = 10.

In external exposure mode, the time between T_EXP1 and FRAME_REQ can be as short as one
clock cycle, reducing the shortest exposure time even more to 23.14 µs, or 11.58 µs for fot_length =
10.

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6.4.2 High Dynamic Range Modes

The sensor has different ways to achieve high optical dynamic range in the grabbed image.
● Interleaved read-out: The odd and even rows have a different exposure time.
● Piecewise linear response: Pixels respond to light with a piecewise linear response curve.
● Multi-frame read-out: Different frames are read-out with increasing exposure time.

All the HDR modes mentioned above can be used in both the internal and external exposure time
mode.

Interleaved Read-Out

In this HDR mode, the odd and even rows of the image sensors will have a different exposure time.
This mode can be enabled by setting the register Exp_dual.

Figure 54:
Interleaved Read-Out – HDR Mode Enabling

Register Name Register Address Default Value Description of the Value

0: Interleaved exposure mode disabled


Exp_dual 41[1] 0
1: Interleaved exposure mode enabled

The surrounding system can combine the image of the odd rows with the image of the even rows
which results in a high dynamic range image. In this image, very bright and very dark objects are
made visible without clipping. The Figure 55 gives an overview of the registers involved in the
interleaved read-out when the internal exposure mode is selected.

Figure 55:
Interleaved Read-Out – HDR Mode Timing

Register Name Register Address Default Value Description of the Value

If Exp_dual = ‘1’
Defines the exposure time for the even
rows according following formula:
42[7:0]
Exp_time 43[7:0] 2048 129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
44[7:0] + 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)

Where clk_per is the period of the


master input clock.

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Register Name Register Address Default Value Description of the Value

If Exp_dual = ‘1’
Defines the exposure time for the odd
rows according following formula:
56[7:0]
Exp_time2 57[7:0] 2048 129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
58[7:0] + 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒2)

Where clk_per is the period of the


master input clock.

When the external exposure mode and interleaved read-out are selected, the different exposure times
are achieved by using the T_EXP1 and T_EXP2 input pins. T_EXP1 defines the exposure time for the
even lines, while T_EXP2 defines the exposure time for the odd lines. See Figure 56 for more details.

Figure 56:
Interleaved Read-Out in External Exposure Mode

Exposure time even rows


T_EXP1

Exposure time odd rows


T_EXP2

FRAME_REQ

When a color sensor is used, the sequencer should be programmed to make sure it takes the Bayer
pattern into account when doing interleaved read-out. This can be done by setting the appropriate
register to ‘0’.

Figure 57:
Mono or Color Register Selection

Register Name Register Address Default Value Description of the Value

0: Color sensor is used


mono 39[0] 1
1: Monochrome sensor is used

Piecewise Linear Response

The CMV4000 has the possibility to achieve a high optical dynamic range by using a piecewise linear
response. This feature will clip illuminated pixels, which reach a programmable voltage, while leaving

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Functional Description

the darker pixels untouched. The clipping level can be adjusted 2 times within one exposure time to
achieve a maximum of 3 slopes in the response curve, as shown in Figure 58.

Figure 58:
Piecewise Linear Response Details

Pixel reset Pixel sample

Vhigh

Vlow3

Vlow2

Vlow1
Exposure kneepoint 2
Exposure kneepoint 1
Total exposure time

In Figure 58, the red lines represent a pixel on which a large amount of light is falling. The blue line
represents a pixel on which less light is falling. The bright pixel is held to a programmable voltage for a
programmable time during the exposure time. This happens two times to make sure that at the end of
the exposure time the pixel is not saturated. The darker pixel is not influenced and will have a normal
response. The Vlow voltages and different exposure times are programmable using the sequencer
registers. Using this feature, a response as detailed in Figure 59 can be achieved. The placement of
the knee points on the X-axis is controlled by the Vlow programming, while the slope of the segments
is controlled by the programmed exposure times.

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Figure 59:
Piecewise Linear Response

Saturation
level

Kneepoint 1
Output signal

Kneepoint 2

# of electrons

Piecewise Linear Response with INTERNAL Exposure Mode:

The following registers need to be programmed when a piecewise linear response in internal exposure
mode is desired.

Figure 60:
Piecewise Linear Response with Internal Exposure Mode Register Settings

Register Name Register Address Default Value Description of the Value

Defines the total exposure time


according following formula:

42[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_time 43[7:0] 2048
+ 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)
44[7:0]

Where clk_per is the period of the


master input clock.
Defines the number of slopes (min=1,
Nr_slopes 54[1:0] 1
max=3).

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Register Name Register Address Default Value Description of the Value

Defines the exposure time of kneepoint


1. Formula:

48[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_kp1 49[7:0] 1
+ 𝐸𝑥𝑝_𝑘𝑝1)
50[7:0]

Where clk_per is the period of the


master input clock.
Defines the exposure time of kneepoint
2. Formula:

51[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_kp2 52[7:0] 1
+ 𝐸𝑥𝑝_𝑘𝑝2)
53[7:0]

Where clk_per is the period of the


master input clock.
Defines the Vlow3 voltage (DAC
setting).
Vlow3 90[6:0] 96
Bit [6] = Enable
Bit[5:0] = Vlow3 value
Defines the Vlow2 voltage (DAC
setting).
Vlow2 89[6:0] 96
Bit [6] = Enable
Bit[5:0] = Vlow2 value

Piecewise Linear Response with EXTERNAL Exposure Mode:

When external exposure time is used and a piecewise linear response is desired, the following
registers should be programmed. Note that the combination of the piecewise linear response and
interleaved read-out is not possible.

Figure 61:
Piecewise Linear Response with External Exposure Mode Register Settings

Register Name Register Address Default Value Description of the Value

Nr_slopes 54[1:0] 1 Defines the number of slopes (min=1,


max=3).
Vlow3 90[6:0] 96 Defines the Vlow3 voltage (DAC setting).
Vlow2 89[6:0] 96 Defines the Vlow2 voltage (DAC setting).

The timing that needs to be applied in this external exposure mode looks like the one shown in
Figure 62.

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Figure 62:
Timing of External Exposure Mode

T_EXP1

FRAME_REQ
Total exposure time
Exposure kp2
Exposure kp1

Multi-Frame Read-Out

The sensor has the possibility to read-out multiple frames with increasing exposure time for each
frame. The exposure time step and number of frames can be programmed using the appropriate
registers. The frames grabbed in this mode, can be combined to create one high dynamic range
image. This combination needs to be made by the receiving system.

The following registers should be used when this multi-frame read-out is selected. This mode only
works with internal exposure time setting.

Figure 63:
Multi-Frame Read-Out Mode Register Settings

Register
Register Name Default Value Description of the Value
Address

Defines the exposure time of the first frame


in the sequence. Formula:

42[7:0]
129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ
Exp_time 43[7:0] 2048
+ 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒)
44[7:0]

Where clk_per is the period of the master


input clock.

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Register
Register Name Default Value Description of the Value
Address

Defines the step size for the increasing


exposure times in multi-frame read-out.
This value will be added to Exp_time per
frame. So the exposure time for the nth
45[7:0] frame is:
Exp_step 46[7:0] 0
47[7:0] 129 ∗ 𝑐𝑙𝑘_𝑝𝑒𝑟(0.43 ∗ 𝑓𝑜𝑡_𝑙𝑒𝑛𝑔𝑡ℎ + 𝐸𝑥𝑝_𝑡𝑖𝑚𝑒
+ (𝑛 − 1) ∗ 𝐸𝑥𝑝_𝑠𝑡𝑒𝑝 )

Where clk_per is the period of the master


input clock and n is the nth frame.
Defines the number of frames to be read-
Exp_seq 55[7:0] 1 out in multi-frame mode (min = 1, max =
255).

6.4.3 Windowing

To limit the amount of data or to increase the frame rate of the sensor, windowing in Y direction is
possible. The number of lines and start address can be set by programming the appropriate registers.
The CMV4000 has the possibility to read-out multiple (max = 8) predefined sub windows in one read-
out cycle. The default mode is to read-out one window with the full frame size (2048 x 2048).

Single Window

When a single window is read out, the start address and size can be uploaded in the corresponding
registers. The default start address is 0 and the default size is 2048 (full frame), like shown in
Figure 64 and Figure 65.

Figure 64:
Single Window Register Settings

Register Name Register Address Default Value Description of the Value

3[7:0] Defines the start address of the window


start1 0
4[7:0] in Y (min = 0, max = 2047)
1[7:0] Defines the number of lines read-out by
Number_lines 2048
2[7:0] the sensor (min = 1, max = 2048)

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Figure 65:
Window Structure

2048

start1
2048

Number_lines

Multiple Window

The CMV4000 can read out a maximum of 8 different sub windows in one read-out cycle. The location
and length of these sub windows must be programmed in the correct registers. The total number of
lines to be read-out (sum of all windows) needs to be specified in the Number_lines register. The
registers which need to be programmed for the multiple windows can be found in Figure 66. The
default values will result in one window with 2048 lines to be read out.

Figure 66:
Multiple Window Register Settings

Register Name Register Address Default Value Description of the Value

Defines the total number of lines read-


1[7:0]
Number_lines 2048 out by the sensor
2[7:0]
(min = 1, max = 2048)
3[7:0] Defines the start address of the first
start1 0
4[7:0] window in Y (min = 0, max = 2047)
19[7:0] Defines the number of lines of the first
Number_lines1 0
20[7:0] window (min = 1, max = 2048)

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Register Name Register Address Default Value Description of the Value

5[7:0] Defines the start address of the second


start2 0
6[7:0] window in Y (min = 0, max = 2047)
21[7:0] Defines the number of lines of the
Number_lines2 0
22[7:0] second window (min = 1, max = 2048)
Defines the start address of the third
7[7:0]
start3 0 window in Y
8[7:0]
(min = 0, max = 2047)
Defines the number of lines of the third
23[7:0]
Number_lines3 0 window
24[7:0]
(min = 1, max = 2048)
9[7:0] Defines the start address of the fourth
start4 0
10[7:0] window in Y (min = 0, max = 2047)
Defines the number of lines of the
25[7:0]
Number_lines4 0 fourth window
26[7:0]
(min = 1, max = 2048)
Defines the start address of the fifth
11[7:0]
start5 0 window in Y
12[7:0]
(min = 0, max = 2047)
Defines the number of lines of the fifth
27[7:0]
Number_lines5 0 window
28[7:0]
(min = 1, max = 2048)
Defines the start address of the sixth
13[7:0]
start6 0 window in Y
14[7:0]
(min = 0, max = 2047)
Defines the number of lines of the sixth
29[7:0]
Number_lines6 0 window
30[7:0]
(min = 1, max = 2048)
15[7:0] Defines the start address of the seventh
start7 0
16[7:0] window in Y (min = 0, max = 2047)
31[7:0] Defines the number of lines of the
Number_lines7 0
32[7:0] seventh window (min = 1, max = 2048)
17[7:0] Defines the start address of the eighth
start8 0
18[7:0] window in Y (min = 0, max = 2047)
Defines the number of lines of the
33[7:0]
Number_lines8 0 eighth window
34[7:0]
(min = 1, max = 2048)

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Figure 67:
Example of 4 Multiple Frames Read-Out

2048

start1

Number_lines1

start2
2048

Number_lines2

start3
Number_lines3

start4

Number_lines4

Number_lines = Number_lines1 + Number_lines2 + Number_lines3 + Number_lines4

6.4.4 Image Flipping

The image coming out of the image sensor can be flipped in X (per channel) and/or Y direction. When
no flipping is enabled, the pixel in the upper left corner of the screen - (pixel (0,0) - is read out first.
When flipping in Y is enabled, the bottom left pixel (0,2047) is read out first instead of the top left pixel
(0,0). When flipping in X is enabled, only the pixels within a channel are mirrored, not the channels
themselves. Therefore, the first row to be read out is pixel (1023,0) to pixel (0,0) in channel 1 and pixel
(2047,0) to pixel (1024,0) in channel 2.

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Figure 68:
Image Flipping

Pixel (column, row)

Pixel (0,0) Pixel (2047,0) Pixel (0,2047) Pixel (2047,2047)

Image flipping in Y
2048x2048 2048x2048

Pixel (0,2047) Pixel (2047,2047) Pixel (0,0) Pixel (2047,0)

Pixel (0,0) Pixel (1023,0) Pixel (1024,0) Pixel (2047,0) Pixel (1023,0) Pixel (0,0) Pixel (2047,0) Pixel (1024,0)

Image flipping in X
CH1 CH2 CH1 CH2
(1024x2048) (1024x2048) (1024x2048) (1024x2048)
Using 2 output
channels

Pixel Pixel Pixel Pixel Pixel Pixel Pixel Pixel


(0,2047) (1023,2047) (1024,2047) (2047,2047) (1023,2047) (0,2047) (2047,2047) (1024,2047)

The following registers are involved in image flipping:

Figure 69:
Image Flipping Register Settings

Register Name Register Address Default Value Description of the Value

0: No image flipping
1: Image flipping in X
Image_flipping 40[1:0] 0
2: Image flipping in Y
3: Image flipping in X and Y

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6.4.5 Image Subsampling

To maintain the same field of view but reduce the amount of data coming out of the sensor, a
subsampling mode is implemented on the chip. Different subsampling schemes can be programmed
by setting the appropriate registers. These subsampling schemes can take into account whether a
color or monochrome sensor is used to preserve the Bayer pattern information. A distinction is made
between a simple and advanced mode (can be used for color devices). Subsampling can be enabled
in every windowing mode.

The following paragraphs describe the registers involved in subsampling in detail.

Simple Subsampling

Figure 70:
Simple Subsampling Register Settings

Register Name Register Address Default Value Description of the Value

1[7:0] Defines the total number of lines read-


Number_lines 2048
2[7:0] out by the sensor (min = 1, max = 2048)
35[7:0] Number of rows to skip
Sub_s 0
36[7:0] (min = 0, max = 2046)
37[7:0]
Sub_a 0 Identical to Sub_s
38[7:0]

Figure 71 shows two subsampling examples (skip 4x and skip 1x).

Figure 71:
Subsampling Examples (skip 4x and skip 1x)

Sub_s = 4 Sub_s = 1
Sub_a = 4 Sub_a = 1

Number_lines = sum of red lines Number_lines = sum of red lines

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Advanced Subsampling

When a color sensor is used, the subsampling scheme should take into account that a Bayer color
filter is applied on the sensor. This Bayer pattern should be preserved when subsampling is used. This
means that the number of rows to be skipped should always be a multiple of two. An advanced
subsampling scheme can be programmed to achieve these requirements. Of course, this advanced
subsampling scheme can also be programmed in a monochrome sensor. See Figure 72 for more
details.

Figure 72:
Advanced Subsampling Register Settings

Register Name Register Address Default Value Description of the Value

1[7:0] Defines the total number of lines read-


Number_lines 2048
2[7:0] out by the sensor (min = 1, max = 2048)
35[7:0]
Sub_s 0 Should be ‘0’ at all times
36[7:0]
37[7:0] Number of rows to skip, it should be an
Sub_a 0
38[7:0] even number between (0 and 2046).

Figure 73 shows two subsampling examples (skip 4x and skip 2x) in advanced mode.

Figure 73:
Subsampling Examples in Advanced Mode (skip 4x and skip2x)

Sub_s = 0 Sub_s = 0
Sub_a = 4 Sub_a = 2

Number_lines = sum of red lines Number_lines = sum of red lines

6.4.6 Number of Frames

When internal exposure mode is selected, the number of frames sent by the sensor after a frame
request can be programmed in the corresponding sequencer register.

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Figure 74:
Number of Frames Register Settings

Register Name Register Address Default Value Description of the Value

Defines the number of frames grabbed


70[7:0] and sent by the image sensor in
Number_frames 1
71[7:0] internal exposure mode
(min =1, max = 65535)

6.5 Configuring Output Data Format

6.5.1 Output Mode

The number of LVDS channels can be selected by programming the appropriate sequencer register.
The pixel remapping scheme and the read-out timing for each mode can be found in chapter 6.3 of
this document.

Figure 75:
Different Output Modes Register Settings

Register Name Register Address Default Value Description of the Value

0: 16 outputs
1: 8 outputs
Output_mode 72[1:0] 0
2: 4 outputs
3: 2 outputs

6.5.2 Training Pattern

As detailed in chapter 6.3.6, a training pattern is sent over the LVDS data channels whenever no valid
image data is sent. This training pattern can be programmed using the sequencer register. The
training patter register settings are shown in Figure 76.

Figure 76:
Training Pattern Register Settings

Register Name Register Address Default Value Description of the Value

The 12 LSBs of this 16-bit word are


78[7:0]
Training_pattern 85 sent in 12-bit mode. In 10-bit mode
79[3:0]
the 10 LSBs are sent.

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6.5.3 Internal PLL

Information

This chapter is just applicable for Version 3.

Enable PLL

When using the internal PLL it is no longer required to input a high speed LVDS clock; the internal PLL
will create it itself depending on the register settings and the master input clock. Default the internal
PLL is used. You can bypass and disable the PLL with the following settings. Please note that when
disabling the PLL, the LVDS clock input must be enabled for the sensor to operate and the LVDS
receiver current must have a value greater than 0.

Figure 77:
Enable PLL Register Settings

Register Name Register Address Default Value Description of the Value

0: Disables the PLL, saving some power


Pll_enable 113[0] 1
1: Enables the PLL
0: Use the internal PLL
Pll_bypass 115[0] 0 1: Bypass the internal PLL, use when
disabling PLL
0: Disables the LVDS clock input
LVDS clock
82[2] 0 1: Enables the LVDS clock input, use
input enable
when disabling PLL
0: Disables current for LVDS receiver
i_lvds_rec 74[3:0] 8 1-15: Increases the current for the LVDS
receiver, use when disabling PLL

Data Rate

During start-up or after a sequencer reset, the data rate can be changed if a lower speed than
480 Mbps is desired. This can be done by applying a lower master input clock (CLK_IN) to the sensor
and uploading a new value in the PLL registers. See chapter 6.2.4 for more details on the input clock.
See section 6.2.6 and 6.2.7 for details on how and when the data rate can be changed.

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Functional Description

Figure 78:
PLL Configure for Different CLK_IN Speed

CLK_IN Range [MHz] PLL_RANGE PLL_OUT_FRE PLL_IN_FRE

From – To 116[7] 116[6:4] 114[1:0]


48 – 30 1 5 0
30 – 20 0 1 0
20 – 15 1 1 1
15 – 10 0 2 1
10 – 7.5 1 2 3
7.5 – 5 0 0 3

6.5.4 10-bit or 12-bit Mode

The CMV4000 has the possibility to send 12 bits or 10 bits per pixel. The end user can select the
desired resolution by programming the corresponding sequencer register. Always keep Bit_mode and
ADC_Resolution in the same bit mode. This is shown in Figure 79.

Figure 79:
Bit Mode and ADC Resolution Register Settings for Version 2

Register Name Register Address Default Value Description of the Value

0: 12 bits per pixel


Bit_mode 111[0] 1
1: 10 bits per pixel
0: 10 bits per pixel
ADC_Resolution 112[1:0] 0
2: 12 bits per pixel

Version 3 of this image sensor offers an ADC resolution of 11 bits. Since this version have a stable
PLL, when changing the bit mode, the PLL bit mode must be changed like showed in Figure 80.

Figure 80:
Bit Mode and ADC Resolution Register Settings for Version 3

Register Name Register Address Default Value Description of the Value

0: 12 bits per pixel


Bit_mode 111[0] 1
1: 10 bits per pixel
0: 10 bits per pixel
ADC_Resolution 112[1:0] 0 1: 11 bits per pixel
2: 12 bits per pixel

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Functional Description

Register Name Register Address Default Value Description of the Value

10-bit: Set to 8
PLL_load 117[7:0] 8
12-bit: Set to 4
10-bit: Set to 9
PLL_div 116[3:0] 9
12-bit: Set to 11

6.5.5 Data Rate

Information

This is only applicable for Version 2.

During start-up or after a sequencer reset, the data rate can be changed if a lower speed than
480 Mbps is desired. This can be done by applying a lower master input clock (CLK_IN) and high
speed LVDS clock (LVDS_CLK_N/P) to the sensor. See chapter 6.2.4 for more details on the input
clock and chapter 6.2.5 for details on how the data rate can be changed. No registers have to be
changed when using a data rate different from 480 Mbps.

6.5.6 Power Control

The power consumption of the CMV4000 can be decreased by disabling the LVDS data channels
when they are not used (in 8, 4 or 2 outputs mode). The power will decrease with approximately
18mW per channel. So reducing the outputs from 16 to 4 will save you about 216 mW or 33%. This is
the main source for power saving. Other settings (such as bitrate, fps, temperature …) will have very
little to no effect on the total power consumption.

Figure 81:
Power Control Register Settings

Register Name Register Address Default Value Description of the Value

Bits 0-15 enable/disable the data output


channels
Bit 16 enables/disables the clock channel
80[7:0] Bit 17 enables/disables the control
Channel_en 81[7:0] All ‘1’ channel
82[2:0] Bit 18 enables/disables the LVDS clock
input (version 3 only)
0: Disabled
1: Enabled

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Functional Description

Decreasing the master clock frequency and thereby the LVDS clock frequency will also decrease
power consumption albeit little. Decreasing the LVDS_CLK frequency from 480 MHz to 128 MHz will
decrease power consumption with about 25 mW. All power savings will happen on the VDD20 supply.
Other settings or factors have little to no effect on the power consumption.

6.6 Configuring On-Chip Data

6.6.1 Offset and Gain

Offset

A digital offset can be applied to the output signal. This dark level offset can be programmed by setting
the desired value in the sequencer register. The 14-bit register value is a 2-complement number,
allowing to have a positive and a negative offset (from 8191 to -8192). The ADC itself has a fixed
offset of 70.

So the dark-level @ output = 70 + Offset (in 2’s complement). For example register value 16323 (11
1111 1100 0011) equals -61 in 2’s complement. The default dark-level is thus set at 70 -61 = 9 digital
numbers.

Figure 82:
Offset

Register Name Register Address Default Value Description of the Value

Defines the dark level offset applied to


the output signal (min = 0, max = 16383).
The value is in 2’s complement:
Decimal Binary 2’s Comp.
0 00 0000 0000 0
0000
1 00 0000 0000 1
0001
100[7:0] … … …
Offset 16323
101[5:0] 8191 01 1111 1111 8191
1111
8192 10 0000 0000 -8192
0000
8193 10 0000 0000 -8191
0001
… … …
16383 11 1111 1111 -1
1111

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Functional Description

Gain

An analog gain and ADC gain can be applied to the output signal. The analog gain is applied by a
PGA in every column. The digital gain is applied by the ADC.

Information

Depending on the sensor version, there is a slight difference in the register settings. Therefore,
depending on the sensor version the user should follow Figure 83 for version 2 and Figure 84 for
version 3.

Figure 83:
Gain Settings for Version 2

Register Name Register Address Default Value Description of the Value

102[1:0]
0: x1 gain
PGA_gain 102[1:0] 0 1: x1.2 gain
2: x1.4 gain
3: x1.6 gain
Defines the slope of the ADC ramp, a
ADC_gain 103[7:0] 32
higher value equals more gain.

Figure 84:
Gain Settings for Version 3

Register Name Register Address Default Value Description of the Value

102[1:0]
0: x1 gain
1: x1.2 gain
102[1:0] 2: x1.4 gain
PGA_gain 121[0] 0
3: x1.6 gain
121[0]
0: gain is defined in 102[1:0]
1: gain in 102[1:0] is amplified by 2
Defines the slope of the ADC ramp, a
ADC_gain 103[7:0] 32
higher value equals more gain.

The ADC gain is dependent on the master clock. A slower clock signal means a higher ADC_gain
register value for an actual ADC gain of 1x. Also at higher register values, the actual ADC gain will
increase in bigger steps. So fine-tuning the ADC gain is easier at lower register values.

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Functional Description

Figure 85:
Typical Graphs of Gain Setting

100

10
Actual ADC gain

48MHz
0.1
40MHz

30Mhz

25MHz

20MHz

10MHz

0.01
0 10 20 30 ADC Register Value 40 50 60 70

6.6.2 Black Reference Columns

Information

This chapter is just applicable for Version 3.

When the appropriate SPI register is set, the 16 first columns will be put to an electrical black
reference. This electrical black reference can be used to reduce the row noise and/or track black level.

Figure 86:
Black Columns

Register Name Register Address Default Value Description of the Value

0 : Disable
Black_col_en 121[1] 0
1 : Enable

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Functional Description

6.6.3 Horizontal Line Effect During Exposure Start

Information

This chapter is just applicable for Version 3.

When the exposure of an image frame is started while a previous image frame is read out this action
may become visible in the image frame currently read out. The effect is visible in the line addressed
for read-out at the moment the exposure of the next image frame starts. Depending on the moment
when the exposure starts within the line read-out time, this will result in a bright or dark offset for the
addressed line. This horizontal line artifact is due to the cross-talk of the global transfer gate pulse on
the column read-out.

This problem is solved by changing the sequencer timing. At the moment the global transfer is pulsed,
a programmable number of dummy rows can be inserted in the read-out. This means that the transfer
pulse crosstalk does not influence valid data rows.

The exact internal impact of the new timing depends on the read-out and exposure modes (PLR,
internal or external exposure control…). Externally, the only impact is that the DVAL and LVAL outputs
are not pulsed for a number of row periods. The external system should always monitor the DVAL,
LVAL and FVAL pulses to know when valid pixels, lines and frames become available. Figure 87
shows the timing (in case of 2 dummy rows).

Figure 87:
Timing of DVAL, LVAL and FVAL to Avoid Horizontal Line Artifact

By default, no dummy rows are inserted in the read-out. The dummy rows are enabled by loading the
appropriate values to the register inte_sync and dummy.

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Functional Description

Figure 88:
Dummy Rows

Register Name Register Address Default Value Description of the Value

Inte_sync 41[2] 0 Must be set to 1 if Dummy is not 0


Dummy 118[7:0] 0 Sets the number of dummy rows

Information

Note that the register ‘dummy’ sets the number of dummy rows (one row corresponds to one LVAL
pulse). In multiplex modes, there are several timing slots within a single row read-out. In case dual
exposure is used, the dummy rows are generated for both transfer pulse toggles.

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Register Description

7 Register Description
The Figure 89 gives an overview of all the sensor registers. The registers with the remark “Do not
change” should not be changed unless advised in chapter 6.4.

7.1 Register Overview


Figure 89:
Register Overview

Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]

Do not
0 0
change
1 0 Number_lines [7:0]
2 8 Number lines [15:8]
3 0 Start1[7:0]
4 0 Start1[15:8]
5 0 Start2[7:0]
6 0 Start2[15:8]
7 0 Start3[7:0]
8 0 Start3[15:8]
9 0 Start4[7:0]
10 0 Start4[15:8]
11 0 Start5[7:0]
12 0 Start5[15:8]
13 0 Start6[7:0]
14 0 Start6[15:8]
15 0 Start7[7:0]
16 0 Start7[15:8]
17 0 Start8[7:0]
18 0 Start8[15:8]
19 0 Number_lines1[7:0]
20 0 Number_lines1[15:8]
21 0 Number_lines2[7:0]
22 0 Number_lines2[15:8]
23 0 Number_lines3[7:0]
24 0 Number_lines3[15:8]
25 0 Number_lines4[7:0]

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Register Description

Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]

26 0 Number_lines4[15:8]
27 0 Number_lines5[7:0]
28 0 Number_lines5[15:8]
29 0 Number_lines6[7:0]
30 0 Number_lines6[15:8]
31 0 Number_lines7[7:0]
32 0 Number_lines7[15:8]
33 0 Number_lines8[7:0]
34 0 Number_lines8[15:8]
35 0 Sub_s[7:0]
36 0 Sub_s[15:8]
37 0 Sub_a[7:0]
38 0 Sub_a[15:8]
39 1 mono

40 0 Image_flipping[1:0]

Inte_s Exp_
41 0 Exp_ ext Set to 4
ync(1) dual
42 0 Exp_time[7:0]
43 8 Exp_time[15:8]
44 0 Exp_time[23:16]
45 0 Exp_step[7:0]
46 0 Exp_step[15:8]
47 0 Exp_step[23:16]
48 1 Exp_kp1[7:0]
49 0 Exp_kp1[15:8]
50 0 Exp_kp1[23:16]
51 1 Exp_kp2[7:0]
52 0 Exp_kp2[15:8]
53 0 Exp_kp2[23:16]
54 1 Nr_slopes[1:0]
55 1 Exp_seq[7:0]
56 0 Exp_time2[7:0]
57 8 Exp_time2[15:8]
58 0 Exp_time2[23:16]
59 0 Exp_step2[7:0]
60 0 Exp_step2[15:8]
61 0 Exp_step2[23:16]
Do not
62 1
change

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Register Description

Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]

Do not
63 0
change
Do not
64 0
change
Do not
65 1
change
Do not
66 0
change
Do not
67 0
change
Do not
68 1
change
69 1 Exp2_seq[7:0]
70 1 Number_frames [7:0]
71 0 Number_frames[15:8]
72 0 Output_mode[1:0]
Can be
lowered
V2: 0 to 10,
73 fot_length[7:0]
V3: 20 see
chapter
6.4.1
74 8 i_lvds_rec[3:0](1)
Do not
75 8
change
Do not
76 8
change
V2: Do
not
Col_cali change
77 3 ADC_calib(1)
b(1)
V3:Set
to 0
78 85 Training_pattern[7:0]
79 0 Training pattern [11:8]
80 255 Channel_en[7:0]
81 255 Channel_en[15:8]
V2: Set
to 7
82 3 Channel_en [18:16] V3: See
chapter
6.5.6
Can be
lowered
to 4 for
83 8 i_lvds[3:0] meeting
EMC
standard
s
84 8 I_col[3:0] Set to 4
85 8 I_col_prech[3:0] Set to 1

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Register Description

Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]

V2: Do
not
86 8 change
V3: Set
to 14
V2: Do
not
87 8 I_amp[3:0](1) change
V3:Set
to 12
Set to
88 96 Vtf_l1[6:0]
64
89 96 Vlow2[6:0]
90 96 Vlow3[6:0]
Set to
91 96 Vres_low[6:0]
64
Do not
92 96
change
Do not
93 96
change
Set to
94 96 V_prech[6:0]
101
Set to
95 96 V_ref[6:0]
106
Do not
96 96
change
Do not
97 96
change
See
98 96 Vramp1[6:0]
7.2.1
See
99 96 Vramp2[6:0]
7.2.1
See
100 195 Offset[7:0]
7.2.1
See
101 63 Offset[13:8]
7.2.1
V3:Set
102 0 PGA_gain[1:0]
to 1
See
103 32 ADC_gain[7:0]
7.2.1
Do not
104 8
change
Do not
105 8
change
Do not
106 8
change
Do not
107 8
change
108 0 T_dig1[3:0]

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Register Description

Value Remark
Address Default
bit[7] bit[6] bit[5] bit[4] bit[3] bit[2] bit[1] bit[0]

109 1 T_dig2[3:0]
Do not
110 0
change
111 1 Bit_ mode
112 0 ADC_resolution [1:0]
V2: Do
113 1 pll_ enable(1) not
change
V2: Do
114 0 PLL_IN_FRE [1:0] (1) not
change
Only V2:
115 0 Config 2
Set to 1

115 0 pll_bypass Only V3

V2: 32 V2: Do
PLL_
116 V3: PLL_OUT_FRE[2:0](1) PLL_div[3:0](1) not
range(1)
217 change
Only V2:
117 8 Config 1
Set to 1
117 8 PLL_load[7:0] Only V3
V2: Do
not
118 0 Dummy[7:0] change
V3:Set
to 1
Do not
119 0
change
Do not
120 0
change
V2: Do
Black_c PGA_
121 0 not
ol_en(1) gain[0] (1)
change
Do not
122 0
change
V2: Do
not
V2: 0
123 V_blacksun[5:0] (1) change
V3: 64
V3:Set
to 98
Do not
124 0
change
Do not
125 xx(2)
change

126 0 Temp[7:0]

127 0 Temp[15:8]

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Register Description

(1) Only applicable to Version3. Those bits are not existing in Version2 and do not change.
(2) The Register 125 can be used to verify which version of sensor is used.

Figure 90:
Register 125 – Sensor Version

Value Sensor Type

64 CMV4000 V2
67 CMV4000 V3

7.2 Recommended Register Settings


The following table gives an overview of the registers, which have a required value that is different
from their default start-up value. We strongly recommend to load these register settings after start-up
and before grabbing an image.

Information

Depending on the sensor version, there is a slight difference in the register settings. Therefore, the
user should follow Figure 91 for version 2 and Figure 92 for version 3.

Figure 91:
Recommended Registers for Version 2

Address Name Required Value

82[2:0] Channel_en 7
84[3:0] I_col 4
85[3:0] I_col_prech 1
88[6:0] Vtf_l1 64
91[6:0] Vres_low 64
94[6:0] V_precharge 101
95[6:0] V_ref 106
115[0] Config2 1
117[0] Config1 1

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Register Description

Figure 92:
Recommended Registers for Version 3

Address Name Required Value

41[2:0] Inte_sync Exp_dual Exp_ext 4


77[1:0] Col_calib ADC_calib 0
84[3:0] I_col 4
85[3:0] I_col_prech 1
86[3:0] I_adc 14
87[3:0] I_amp 12
88[6:0] Vtf_l1 64
91[6:0] Vres_low 64
94[6:0] V_prech 101
95[6:0] V_ref 106
102[1:0] PGA 1
118[7:0] Dummy 1
123[5:0] V_blacksun 98

7.2.1 Adjusting Register for Optimal Performance

Due to processing differences, the response and optical performance may differ slightly from sensor to
sensor. To adjust this difference in response, the following registers in should be tuned from sensor to
sensor.

Information

Depending on the sensor version, there is a slight difference in the register settings. Therefore, the
user should follow Figure 93 for version 2 and Figure 94 for version 3.

Figure 93:
Optical Performance Registers for Version 2

Address Name Required Value Valid Range

103[7:0] ADC_GAIN 32 40 - 55
98[6:0] V_ramp1 96 102 - 115
99[6:0] V_ramp2 96 102 - 115

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Register Description

Address Name Required Value Valid Range

100[7:0] Offset 16323 0 - 16383

Figure 94:
Optical Performance Registers for Version 3

Address Name Required Value Valid Range

103[7:0] ADC_GAIN See Gain chapter 0 - 63


98[6:0] V_ramp1 109 102 - 115
99[6:0] V_ramp2 109 102 - 115
100[7:0]
Offset 16323 0 - 16383
101[5:0]

To optimize the sensor response and minimize noise, the following procedure should be followed for
each sensor:
1. Start by programming all registers with the recommended values from the datasheet.
2. Take fully dark images with short exposure and calibrate the offset register so no pixel clips in
black (< 0DN).
3. When column non-uniformities are observed in the dark image, a calibration of the V_ramp1
and V_ramp2 registers is necessary. These registers set the starting voltage of the ramp used
by the column ramp ADC, so adjusting this value will improve column CDS (correlated double
sampling) which will reduce the column FPN. Both values should be adjusted together and
should always have the same value.
4. Now take images with light and normal exposure. If the image isn’t saturated increase the light
or the exposure time until all pixels reach a constant value. If not all pixels saturate at 1023
(meaning that the non-linear part of the pixel voltage is in the ADC input range), increase the
ADC gain/range setting until they do. The PGA amplifier can also be used at this stage.
5. The dark offset level may have shifted when doing ADC calibration, so repeat step 2.
6. To compensate gain differences between sensors, choose a fixed light setting or exposure time
at which the sensor shows a grey image about 50% of its swing (512 at 10-bit). Now tweak the
ADC setting per sensor so that all sensors will have the same average grey value of about 512.
This way all sensors will behave about the same to the same amount of light.

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Application Information

8 Application Information

8.1 Color Filter


An RGB Bayer pattern is used on the CMV4000 image sensor. The order of the RGB filter can be
found in the Figure 95. With Y-flipping off (reg40 = 0), pixel (0,0) at the top left is read out first and has
a red filter. When Y-flipping is on, pixel (0,2047) is read out first and has a green filter. For X-flipping
the address of the first read pixel depends on the output channels used.

Figure 95:
RGB Bayer Pattern Order

Pixel (0,0) Pixel (2047,0)

R G R G R G R G
G B G B G B G B
R G R G R G R G
G B G B G B G B

R G R G R G R G
G B G B G B G B
R G R G R G R G
G B G B G B G B

Pixel (0,2047) Pixel (2047,2047)

R G R G
G B G B
R G R G
G B G B

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Application Information

8.2 Response Curve


Figure 96 shows a typical response curve of integration time (or light input) versus the average output
value of the sensor.

Figure 96:
Typical Response Curve

1200

1000

800
Output [DN]

600

400

200

0
0 500 1000 1500 2000 2500 3000 3500

Integration Time [line times]

8.3 Pinout
Pins that are marked optional are not strictly required for sensor operation, they are test pins or pins
that are only required for using a certain feature. When these pins are not used, they can be left
floating. When the sensor is configured for multiplexing and not all 16 LVDS channels are used for
read-out, the unused output channels can also be left floating. Analog and digital ground can be tied
together.

8.3.1 Pinning List

Figure 97:
Pinout in Detail

µPGA LCC Pin Name Description Type

G7 60 Tana Test pin for analog signals (optional) Analog output


Reference for ADC testing (decouple with
D12 42 REF_ADC Bias
100 nF to ground)

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Application Information

µPGA LCC Pin Name Description Type

Signal for ADC testing (decouple with


E10 41 SG_ADC Bias
100 nF to ground)
Start voltage first ramp (decouple with
E11 40 Vramp1 Bias
100 nF to ground)
Start voltage second ramp (decouple with
E12 39 Vramp2 Bias
100 nF to ground)
Precharge high voltage (decouple with
F6 62 Vpch_H Bias
100 nF to ground)
Reset low voltage (decouple with 100 nF to
H8 57 Vres_L Bias
ground)
Transfer low voltage 2 (decouple with
F8 54 Vtf_l2 Bias
100 nF to ground)
Transfer low voltage 3 (decouple with
H9 53 Vtf_l3 Bias
100 nF to ground)
Reference for column amps (decouple with
D11 43 VREF Bias
100 nF to ground)
F9 51 Col_load Decouple with 100 nF to ground Bias
G9 52 Col_amp Decouple with 100 nF to ground Bias
G6 63 CMD_N Decouple with 100 nF to ground Bias
G11 45 Vbgap Decouple with 100 nF to ground Bias
H10 50 COL_PC Decouple with 100 nF to ground Bias
H11 44 LVDS Decouple with 100 nF to ground Bias
G5 66 CMD_P Decouple with 100 nF to VDD33 Bias
F5 65 CMD_P_INV Decouple with 100 nF to VDD33 Bias
F10 48 ramp Decouple with 100 nF to VDD33 Bias
G10 49 ADC Decouple with 100 nF to VDD33 Bias
G8 55 Vtf_l1 Transfer low voltage 1 (connect to ground) Bias
H5 67 SYS_RES_N Input pin for sequencer reset Digital input
E1 80 CLK_IN Master input clock Digital input
F2 76 FRAME_REQ Frame request pin Digital input
Input pin for external exposure mode
G3 72 T_EXP2 Digital input
(optional)
Input pin for external exposure mode
H3 75 T_EXP1 Digital input
(optional)
G4 69 SPI_EN SPI enable input pin Digital input
H4 70 SPI_CLK SPI clock input pin Digital input
F3 71 SPI_IN SPI data input pin Digital input
F4 68 SPI_OUT SPI data output pin Digital output

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Application Information

µPGA LCC Pin Name Description Type

G2 N.E. TDIG2 Test pin for digital signals (optional) Digital output
H2 77 TDIG1 Test pin for digital signals (optional) Digital output
A6 8 GND Ground pin Ground
A12 22 GND Ground pin Ground
C1 28 GND Ground pin Ground
C6 38 GND Ground pin Ground
C12 47 GND Ground pin Ground
E3 56 GND Ground pin Ground
E5 64 GND Ground pin Ground
E9 73 GND Ground pin Ground
F1 81 GND Ground pin Ground
F12 87 GND Ground pin Ground
H7 92 GND Ground pin Ground
D1 79 LVDS_CLK_P LVDS positive input clock LVDS input
D2 78 LVDS_CLK_N LVDS negative input clock LVDS input
B11 25 OUTCLK_N LVDS negative clock output channel LVDS output
B12 26 OUTCLK_P LVDS positive clock output channel LVDS output
B1 2 OUTCTR_N LVDS negative control output channel LVDS output
B2 3 OUTCTR_P LVDS positive control output channel LVDS output
C2 4 OUT1_N LVDS negative data output channel 1 LVDS output
C3 5 OUT1_P LVDS positive data output channel 1 LVDS output
A2 6 OUT2_N LVDS negative data output channel 2 LVDS output
A3 7 OUT2_P LVDS positive data output channel 2 LVDS output
D3 91 OUT3_N LVDS negative data output channel 3 LVDS output
D4 90 OUT3_P LVDS positive data output channel 3 LVDS output
B3 89 OUT4_N LVDS negative data output channel 4 LVDS output
B4 88 OUT4_P LVDS positive data output channel 4 LVDS output
A4 10 OUT5_N LVDS negative data output channel 5 LVDS output
A5 11 OUT5_P LVDS positive data output channel 5 LVDS output
C4 86 OUT6_N LVDS negative data output channel 6 LVDS output
C5 85 OUT6_P LVDS positive data output channel 6 LVDS output
B5 12 OUT7_N LVDS negative data output channel 7 LVDS output
B6 13 OUT7_P LVDS positive data output channel 7 LVDS output
D5 83 OUT8_N LVDS negative data output channel 8 LVDS output
D6 82 OUT8_P LVDS positive data output channel 8 LVDS output

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Application Information

µPGA LCC Pin Name Description Type

D7 36 OUT9_N LVDS negative data output channel 9 LVDS output


D8 35 OUT9_P LVDS positive data output channel 9 LVDS output
B7 15 OUT10_N LVDS negative data output channel 10 LVDS output
B8 16 OUT10_P LVDS positive data output channel 10 LVDS output
C8 17 OUT11_N LVDS negative data output channel 11 LVDS output
C9 18 OUT11_P LVDS positive data output channel 11 LVDS output
A8 34 OUT12_N LVDS negative data output channel 12 LVDS output
A9 33 OUT12_P LVDS positive data output channel 12 LVDS output
B9 19 OUT13_N LVDS negative data output channel 13 LVDS output
B10 20 OUT13_P LVDS positive data output channel 13 LVDS output
D9 32 OUT14_N LVDS negative data output channel 14 LVDS output
D10 31 OUT14_P LVDS positive data output channel 14 LVDS output
A10 30 OUT15_N LVDS negative data output channel 15 LVDS output
A11 29 OUT15_P LVDS positive data output channel 15 LVDS output
C10 23 OUT16_N LVDS negative data output channel 16 LVDS output
C11 24 OUT16_P LVDS positive data output channel 16 LVDS output
A7 9 VDD20 2.1 V supply Supply
C7 21 VDD20 2.1 V supply Supply
E4 37 VDD20 2.1 V supply Supply
E7 59 VDD20 2.1 V supply Supply
E8 84 VDD20 2.1 V supply Supply
E6 14 VDDPIX 3.0 V supply Supply
G1 46 VDDPIX 3.0 V supply Supply
G12 74 VDDPIX 3.0 V supply Supply
F7 58 Vres_H 3.3 V supply Supply
E2 1 VDD33 3.3 V supply Supply
H1 27 VDD33 3.3 V supply Supply
H6 61 VDD33 3.3 V supply Supply
F11 N.E.(1) DIO1 Diode 1 for test (not connected) Test
H12 N.E.(1) DIO2 Diode 2 for test (not connected) Test

(1) Not equipped.

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Application Information

8.3.2 µPGA and LGA Pinout

This is the pin layout as seen from the top.

Figure 98:
µPGA and LGA Pinout

1 2 3 4 5 6 7 8 9 10 11 12

H VDD33 TDIG1 T_EXP1 SPI_CLK SYS_RES_N VDD33 GND Vres_L Vtf_l3 COL_PC LVDS DIO2

G VDDPIX TDIG2 T_EXP2 SPI_EN CMD_P CMD_N Tana Vtf_l1 Col_amp ADC Vbgap VDDPIX

FRAME_ CMD_P_
F GND
REQ
SPI_IN SPI_OUT
INV
Vpch_H Vres_H Vtf_l2 Col_load Ramp DIO1 GND

E CLK_IN VDD33 GND VDD20 GND VDDPIX VDD20 VDD20 GND SG_ADC Vramp1 Vramp2

LVDS_ LVDS_
D CLK_P CLK_N
OUT3_N OUT3_P OUT8_N OUT8_P OUT9_N OUT9_P OUT14_N OUT14_P VREF REF_ADC

C GND OUT1_N OUT1_P OUT6_N OUT6_P GND VDD20 OUT11_N OUT11_P OUT16_N OUT16_P GND

OUT OUT OUT OUT


B CTR_N CTR_P
OUT4_N OUT4_P OUT7_N OUT7_P OUT10_N OUT10_P OUT13_N OUT13_P
CLK_N CLK_P

A OUT2_N OUT2_P OUT5_N OUT5_P GND VDD20 OUT12_N OUT12_P OUT15_N OUT15_P GND

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Application Information

8.3.3 LCC Pinout

Figure 99:
LCC Pinout

CMD_P_INV

SYS_RES_N
SPI_OUT
Col_amp
Col_load

SPI_CLK
CMD_N
COL_PC

CMD_P

T_EXP2
Vres_H

SPI_EN
VDD20

VDD33

SPI_IN
Vpc_H
Vres_L
Vtf_l3
Vtf_l2
Vtf_l1
Ramp
GND

GND

GND

GND
Tana
ADC

47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73

VDDPIX 46 74 VDDPIX

Vbgap 45 75 T_EXP1

LVDS 44 76 FRAME_REQ

VREF 43 77 TDIG1

REF_ADC 42 78 LVDS_CLK_N

SG_ADC 41 79 LVDS_CLK_P

Vramp1 40 80 CLK_IN

Vramp2 39 81 GND

GND 38 82 OUT8_P

VDD20 37 83 OUT8_N

OUT9_N 36 84 VDD20

OUT9_P 35 85 OUT6_P

OUT12_N 34 86 OUT6_N

OUT12_P 33 87 GND

OUT14_N 32 88 OUT4_P

OUT14_P 31 89 OUT4_N

OUT15_N 30 90 OUT3_P

OUT15_P 29 91 OUT3_N

GND 28 92 GND
27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
OUTCTR_N
OUTCTR_P
OUTCLK_N
OUTCLK_P

OUT16_N

OUT13_N

OUT11_N

OUT10_N
OUT16_P

OUT13_P

OUT11_P

OUT10_P

OUT7_N

OUT5_N

OUT2_N

OUT1_N
OUT7_P

OUT5_P

OUT2_P

OUT1_P
VDDPIX
VDD33

VDD20

VDD20

VDD33
GND

GND

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Package Drawings & Markings

9 Package Drawings & Markings

9.1 95 Pins µPGA and LGA


All dimensions are in millimeter. The LGA package (SMD) is identical to the µPGA but without the
through-hole pins.

Figure 100:
µPGA Package Drawing

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Package Drawings & Markings

9.1.1 Assembly Drawing µPGA

All dimensions are in millimeter.

Figure 101:
Assembly Drawing µPGA

TOP VIEW CROSS SECTION


3.18±0.10 0.760±0.130 0.55 ±0.05

3.69±0.10
Pixel (0,0)

18.06 ±0.10
9.32±0.10 Optical center

9.84±0.10

1.760 ±0.130

TRANSPARANT TOP VIEW


3.18±0.10
Rotation of die ref. outside of package: ± 0.5°
Tilt of die ref. die attach area: ± 0.2°

3.69±0.10
Pixel (0,0)
H

1 2 3 4 5 6 7 8 9 10 11 12

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Package Drawings & Markings

9.2 92 Pins LCC


All dimensions are in millimeter.

Figure 102:
LCC Package Drawing

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Package Drawings & Markings

9.2.1 Assembly Drawing LCC

All dimensions are in millimeter.

Figure 103:
Assembly Drawing LCC

TOP VIEW CROSS SECTION


3.18±0.10 0.760±0.130 0.55 ±0.05

3.69±0.10
Pixel (0,0)

18.06 ±0.10
9.32±0.10 Optical center

9.84±0.10

1.495 ±0.130

3.18±0.10 TRANSPARANT TOP VIEW


73 70 65 60 55 50 47
Rotation of die ref. outside of package: ±0.5°
Tilt of die ref. die attach area: ±0.2°

74
3.69±0.10 46
75 Pixel (0,0)
45

80
40

85
35

90
30

92
28

1 5 10 15 20 25 27

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Soldering & Storage Information

10 Soldering & Storage Information


CMV4000 is not shipped in a moisture barrier package. When reflow soldering, a dry bake needs to be
performed upfront! For soldering information, follow Standard J-STD-020. If the temperature/time
profile exceeds these recommendations, damage to the image sensor can occur.

10.1 Manual Soldering


Use partial heating method and use a soldering iron with temperature control. The soldering iron tip
temperature is not to exceed 350 ºC with 270 °C maximum pin temperature, 2 seconds maximum
duration per pin. Avoid global heating of the ceramic package during soldering. Failure to do so may
alter device performance and reliability.

10.2 Wave Soldering


Wave soldering is possible but not recommended. Solder dipping can cause damage to the glass and
harm the imaging capability of the device. See Figure 104 for the wave soldering profile.

Figure 104:
Wave Solder Profile

Max 10 s

260
Temperature (C)

25

Time (s)

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Soldering & Storage Information

10.3 Reflow Soldering


Figure 105 shows the maximum recommended thermal profile for a reflow soldering system. If the
temperature/time profile exceeds these recommendations, damage to the image sensor can occur.

Figure 105:
Reflow Soldering Graph

60 to 80
seconds

10 to 20
sec
245
Temperature (C)

220

200

150
60 to 180
seconds

25
Maximum 6 min
Time (s)

10.4 Additional Recommendation


Image sensors with filter arrays (CFA) and micro-lens are especially sensitive to high temperatures.
Prolonged heating at elevated temperatures may result in deterioration of the performance of the
sensor. Best solution will be flow soldering or manual soldering of a socket (through hole) and plug in
the sensor at latest stage of the assembly/test process.

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Revision Information

11 Revision Information

Document Status Product Status Definition

Product Preview Pre-Development Information in this datasheet is based on product ideas in the planning phase
of development. All specifications are design goals without any warranty and
are subject to change without notice

Preliminary Datasheet Pre-Production Information in this datasheet is based on products in the design, validation or
qualification phase of development. The performance and parameters shown
in this document are preliminary without any warranty and are subject to
change without notice

Datasheet Production Information in this datasheet is based on products in ramp-up to full production
or full production which conform to specifications in accordance with the terms
of ams-OSRAM AG standard warranty as given in the General Terms of Trade

Other Definitions
Draft / Preliminary:
The draft / preliminary status of a document indicates that the content is still under internal review and subject to change without
notice. ams-OSRAM AG does not give any warranties as to the accuracy or completeness of information included in a draft /
preliminary version of a document and shall have no liability for the consequences of use of such information.
Short Datasheet:
A short datasheet is intended for quick reference only, it is an extract from a full datasheet with the same product number(s) and
title. For detailed and full information always see the relevant full datasheet. In case of any inconsistency or conflict with the
short datasheet, the full datasheet shall prevail.

Changes from previous version to current revision v6-00 Page

Corrected equation 2 21

● Page and figure numbers for the previous version may differ from page and figure numbers in the current revision.
● Correction of typographical errors is not explicitly mentioned.

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Legal Information

12 Legal Information
Copyright & Disclaimer
Copyright ams-OSRAM AG, Tobelbader Strasse 30, 8141 Premstaetten, Austria-Europe. Trademarks Registered. All rights
reserved. The material herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written
consent of the copyright owner.
Devices sold by ams-OSRAM AG are covered by the warranty and patent indemnification provisions appearing in its General
Terms of Trade. ams-OSRAM AG makes no warranty, express, statutory, implied, or by description regarding the information
set forth herein. ams-OSRAM AG reserves the right to change specifications and prices at any time and without notice.
Therefore, prior to designing this product into a system, it is necessary to check with ams-OSRAM AG for current information.
This product is intended for use in commercial applications. Applications requiring extended temperature range, unusual
environmental requirements, or high reliability applications, such as military, medical life-support or life-sustaining equipment are
specifically not recommended without additional processing by ams-OSRAM AG for each application. This product is provided
by ams-OSRAM AG “AS IS” and any express or implied warranties, including, but not limited to the implied warranties of
merchantability and fitness for a particular purpose are disclaimed.
ams-OSRAM AG shall not be liable to recipient or any third party for any damages, including but not limited to personal injury,
property damage, loss of profits, loss of use, interruption of business or indirect, special, incidental or consequential damages,
of any kind, in connection with or arising out of the furnishing, performance or use of the technical data herein. No obligation or
liability to recipient or any third party shall arise or flow out of ams-OSRAM AG rendering of technical or other services.
Product and functional safety devices/applications or medical devices/applications:
ams-OSRAM AG components are not developed, constructed or tested for the application as safety relevant component or for
the application in medical devices. ams-OSRAM AG products are not qualified at module and system level for such application.
In case buyer – or customer supplied by buyer – considers using ams-OSRAM AG components in product safety
devices/applications or medical devices/applications, buyer and/or customer has to inform the local sales partner of ams-
OSRAM AG immediately and ams-OSRAM AG and buyer and /or customer will analyze and coordinate the customer-specific
request between ams-OSRAM AG and buyer and/or customer.

ams OSRAM Semiconductor RoHS Compliance Statement


RoHS Compliant: The term RoHS compliant means that ams-OSRAM AG semiconductor products fully comply with current
RoHS directives. Our semiconductor products do not contain any chemicals for all 6 substance categories plus additional 4
substance categories (per amendment EU 2015/863), including the requirement that lead not exceed 0.1% by weight in
homogeneous materials.
Important Information: The information provided in this statement represents ams-OSRAM AG knowledge and belief as of the
date that it is provided. ams-OSRAM AG bases its knowledge and belief on information provided by third parties, and makes no
representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third
parties. ams-OSRAM AG has taken and continues to take reasonable steps to provide representative and accurate information
but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. ams-OSRAM AG
and ams-OSRAM AG suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.

Headquarters Please visit our website at ams-osram.com


ams-OSRAM AG For information about our products go to Products
Tobelbader Strasse 30 For technical support use our Technical Support Form
8141 Premstaetten For feedback about this document use Document Feedback
Austria, Europe For sales offices and branches go to Sales Offices / Branches
Tel: +43 (0) 3136 500 0 For distributors and sales representatives go to Channel Partners
Tel: +43 (0) 3136 500 0

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Authorized Distributor

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CMV4000-3E5C1PP CMV4000-2E5M1PP CMV4000-2E5C1PP CMV4000-3E5M1PP CMV4000-2E12M1PP


CMV4000-3E12M1PP CMV4000-3E5M1PA CMV4000-3E5M1PN CMV4000-3E5M1LP CMV4000-3E12M1LP
CMV4000-3E5C1LP CMV4000-3E5M1CA CMV4000-3E5C1CA CMV4000-3E5M0PN CMV4000-2E5M1LP

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