Igbt Ikw75n60h3
Igbt Ikw75n60h3
IKW75N60H3
600V high speed switching series third generation
Data sheet
Features: C
Applications:
1
• Pin 1 - gate 2
3
• Pin 2 & backside - collector
• Pin 3 - emitter
Table of Contents
Description .......................................................................................................................................................................... 2
Table of Contents .............................................................................................................................................................. 3
Maximum ratings ............................................................................................................................................................... 4
Thermal Resistance .......................................................................................................................................................... 4
Electrical Characteristics ................................................................................................................................................. 5
Electrical Characteristics diagrams ............................................................................................................................... 7
Package Drawing ............................................................................................................................................................1
.4
Testing Conditions .......................................................................................................................................................... 15
Revision History ...............................................................................................................................................................1
.6
Disclaimer......................................................................................................................................................................... 16
Maximum ratings
Parameter Symbol Value Unit
Collector-emitter voltage Vc) 600 V
DC collector current, limited by T vj,ęY1)
Tc = 25°C Ic 80.0 A
Tc = 100°C 75.0
Pulsed collector current, tp limited by Tvj,ęY Icp,j, 225.0 A
Turn off safe operating area Vc) ≤ 600V, Tvj ≤ 175°C - 225.0 A
Diode forward current, limited by Tvj,ęY
Tc = 25°C IF 80.0 A
Tc = 100°C 50.0
Diode pulsed current, tp limited by Tvj,ęY IFp,j, 150.0 A
Gate-emitter voltage VF) ±20 V
Short circuit withstand time
VF) = 15.0V, Vcc ≤ 400V
Allowed number of short circuits < 1000 tçc µs
Time between short circuits: ≥ 1.0s
Tvj = 150°C 5
Power dissipation Tc = 25°C Ptot 428.0 W
Operating junction temperature Tvj -40...+175 °C
Storage temperature T,tg -55...+150 °C
Soldering temperature,
°C
wave soldering 1.6 mm (0.063 in.) from case for 10s 260
Mounting torque, M3 screw
M 0.6 Nm
Maximum of mounting processes: 3
Thermal Resistance
Parameter Symbol Conditions Max. Value Unit
Characteristic
IGBT thermal resistance,
Rtµçj-c) 0.35 K/W
junction - case
Diode thermal resistance,
Rtµçj-c) 0.80 K/W
junction - case
Thermal resistance Rtµçj-ę) 40 K/W
junction - ambient
90
80
100
70
Ic, COLLECTOR CURRENT [A]
100µs
40
200µs
30 500µs
Tc=80° 1 DC
20 Tc=110°
10
0 0.1
1 10 100 1 10 100 1000
f, SWITCHING FREQUENCY [kHz] Vc), COLLECTOR-EMITTER VOLTAGE [V]
Figure 1. Collector current as a function of switching Figure 2. Forward bias safe operating area
frequency (D=0, Tc=25°C, Tj≤175°C; VF)=15V)
(Tj≤175°C, D =0.5, V c)=400V, V F)=15/0V,
RF=5,2M)
450 90
400 80
350 70
Ptot, POWER DISSIPATION [W]
300 60
250 50
200 40
150 30
100 20
50 10
0 0
25 50 75 100 125 150 175 25 50 75 100 125 150 175
Tc, CASE TEMPERATURE [°C] Tc, CASE TEMPERATURE [°C]
Figure 3. Power dissipation as a function of case Figure 4. Collector current as a function of case
temperature temperature
(Tj≤175°C) (V F)≥15V, Tj≤175°C)
200 200
17V 17V
9V 9V
100 100
7V 7V
5V 5V
75 75
50 50
25 25
0 0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
Vc), COLLECTOR-EMITTER VOLTAGE [V] Vc), COLLECTOR-EMITTER VOLTAGE [V]
Figure 5. Typical output characteristic Figure 6. Typical output characteristic
(Tj=25°C) (Tj=175°C)
250 4.0
Tj=25°C Ic=37.5A
Tj=175°C Ic=75A
Ic=150A
Vc)ç,ęt), COLLECTOR-EMITTER SATURATION [A]
3.5
200
Ic, COLLECTOR CURRENT [A]
3.0
150
2.5
100
2.0
50
1.5
0 1.0
5 6 7 8 9 10 11 12 0 25 50 75 100 125 150 175
V F), GATE-EMITTER VOLTAGE [V] Tj, JUNCTION TEMPERATURE [°C]
Figure 7. Typical transfer characteristic Figure 8. Typical collector-emitter saturation voltage
(Vc)=20V) as a function of junction temperature
(VF)=15V)
tqçoçç)
tç
tqço,)
t,
tqçoçç)
1000
tç
tqço,)
t,
t, SWITCHING TIMES [ns]
100
10 10
15 30 45 60 75 90 105 120 135 150 2 7 12 17 22 27 32
Ic, COLLECTOR CURRENT [A] RF, GATE RESISTOR [M]
Figure 9. Typical switching times as a function of Figure 10. Typical switching times as a function of
collector current gate resistor
(ind. load, Tj=175°C, Vc)=400V, (ind. load, Tj=175°C, Vc)=400V,
V F)=15/0V, RF=5,2M, test circuit in Fig. E) V F)=15/0V, Ic=75A, test circuit in Fig. E)
6.0
typ.
min.
VF)çtµ), GATE-EMITTER THRESHOLD VOLTAGE [V]
5.5 max.
tqçoçç)
tç 5.0
tqço,)
t, SWITCHING TIMES [ns]
t,
4.5
100
4.0
3.5
3.0
2.5
10 2.0
25 50 75 100 125 150 175 0 25 50 75 100 125 150 175
Tj, JUNCTION TEMPERATURE [°C] Tj, JUNCTION TEMPERATURE [°C]
Figure 11. Typical switching times as a function of Figure 12. Gate-emitter threshold voltage as a
junction temperature function of junction temperature
(ind. load, Vc)=400V, V F)=15/0V, (Ic=1,2mA)
Ic=75A, RF=5,2M, test circuit in Fig. E)
18 16
Eoçç Eoçç
Eo, Eo,
16 Et, 14 Et,
E, SWITCHING ENERGY LOSSES [mJ]
12
10
10
8
8
6
6
4
4
2 2
0 0
10 30 50 70 90 110 130 150 2 7 12 17 22 27 32
Ic, COLLECTOR CURRENT [A] RF, GATE RESISTOR [M]
Figure 13. Typical switching energy losses as a Figure 14. Typical switching energy losses as a
function of collector current function of gate resistor
(ind. load, Tj=175°C, Vc)=400V, (ind. load, Tj=175°C, Vc)=400V,
V F)=15/0V, RF=5,2M, test circuit in Fig. V F)=15/0V, Ic=75A, test circuit in Fig. E)
E)
7 8
Eoçç Eoçç
Eo, Eo,
Et, Et,
7
6
E, SWITCHING ENERGY LOSSES [mJ]
6
5
3
3
2
2
1 1
25 50 75 100 125 150 175 200 250 300 350 400 450
Tj, JUNCTION TEMPERATURE [°C] Vc), COLLECTOR-EMITTER VOLTAGE [V]
Figure 15. Typical switching energy losses as a Figure 16. Typical switching energy losses as a
function of junction temperature function of collector emitter voltage
(ind load, V c)=400V, V F)=15/0V, Ic=75A, (ind. load, Tj=175°C, VF)=15/0V, Ic=75A,
RF=5,2M, test circuit in Fig. E) RF=5,2M, test circuit in Fig. E)
16 1E+4
120V
480V
14
VF), GATE-EMITTER VOLTAGE [V]
12
Ci,,
Co,,
C, CAPACITANCE [pF]
C,,,
10
8 1000
0 100
0 100 200 300 400 500 0 5 10 15 20 25 30
QF), GATE CHARGE [nC] Vc), COLLECTOR-EMITTER VOLTAGE [V]
Figure 17. Typical gate charge Figure 18. Typical capacitance as a function of
(Ic=75A) collector-emitter voltage
(V F)=0V, f=1MHz)
1300 15
Icççc), SHORT CIRCUIT COLLECTOR CURRENT [A]
1200
tçc, SHORT CIRCUIT WITHSTAND TIME [µs]
1100 12
1000
900 9
800
700 6
600
500 3
400
300 0
12 13 14 15 16 17 18 19 20 10 11 12 13 14 15
V F), GATE-EMITTER VOLTAGE [V] V F), GATE-EMITTER VOLTAGE [V]
Figure 19. Typical short circuit collector current as a Figure 20. Short circuit withstand time as a function
function of gate-emitter voltage of gate-emitter voltage
(Vc)≤400V, start atTj=25°C) (Vc)≤400V, start at Tj≤150°C)
1
Ztµtc, TRANSIENT THERMAL IMPEDANCE [K/W]
0.01
0.01
i: 1 2 3 4 i: 1 2 3 4 5
ri[K/W]: 0.029 0.0509 0.0733 0.1968 ri[K/W]: 0.07228401 0.1019218 0.1401017 0.2213981 0.2642944
τ i[s]: 1.2E-4 8.2E-4 9.3E-3 0.115504 τi[s]: 9.4E-6 1.3E-4 1.5E-3 0.02221235 0.3064102
0.001 0.001
1E-6 1E-5 1E-4 0.001 0.01 0.1 1 1E-7 1E-6 1E-5 1E-4 0.001 0.01 0.1 1
tp, PULSE WIDTH [s] tp, PULSE WIDTH [s]
Figure 21. IGBT transient thermal impedance Figure 22. Diode transient thermal impedance as a
(D=tp/T) function of pulse width
(D=tp/T)
600 5
Tj=25°C, IF = 50A Tj=25°C, IF = 50A
Tj=175°C, IF = 50A Tj=175°C, IF = 50A
500
Q,,, REVERSE RECOVERY CHARGE [µC]
4
t,,, REVERSE RECOVERY TIME [ns]
400
300
200
1
100
0 0
400 500 600 700 800 900 1000 1100 1200 400 500 600 700 800 900 1000
diF/dt, DIODE CURRENT SLOPE [A/µs] diF/dt, DIODE CURRENT SLOPE [A/µs]
Figure 23. Typical reverse recovery time as a Figure 24. Typical reverse recovery charge as a
function of diode current slope function of diode current slope
(VR=400V) (VR=400V)
35 0
Tj=25°C, IF = 50A Tj=25°C, IF = 50A
Tj=175°C, IF = 50A Tj=175°C, IF = 50A
I,,, REVERSE RECOVERY CURRENT [A]
30 -40
20 -120
15 -160
10 -200
400 500 600 700 800 900 1000 400 500 600 700 800 900 1000
diF/dt, DIODE CURRENT SLOPE [A/µs] diF/dt, DIODE CURRENT SLOPE [A/µs]
Figure 25. Typical reverse recovery current as a Figure 26. Typical diode peak rate of fall of reverse
function of diode current slope recovery current as a function of diode
(VR=400V) current slope
(V R=400V)
200 2.5
Tj=25°C IF=10A
Tj=175°C IF=25A
180 IF=50A
IF=100A
160 2.0
VF, FORWARD VOLTAGE [V]
IF, FORWARD CURRENT [A]
140
120 1.5
100
80 1.0
60
40 0.5
20
0 0.0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 0 25 50 75 100 125 150 175
V F, FORWARD VOLTAGE [V] Tj, JUNCTION TEMPERATURE [°C]
Figure 27. Typical diode forward current as a Figure 28. Typical diode forward voltage as a
function of forward voltage function of junction temperature
PG-TO247-3
Revision History
IKW75N60H3
Published by
Infineon Technologies AG
81726 Munich, Germany
81726 München, Germany
© 2011 Infineon Technologies AG
All Rights Reserved.
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respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the
application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including
without limitation, warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon
Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question,
please contact the nearest Infineon Technologies Office.
The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or
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if a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and
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fail, it is reasonable to assume that the health of the user or other persons may be endangered.