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Elemental Limits of Detection in 5iO, and SRM Matrices Using Mining Analysis -rvffie The Niton6) XL3r GOt.l.ill+ Scrics x-ray fluor:escencc {XRF)anall.zcr is the utrtirnate choice in features ar-rd perfornrance. l['he chart below details the sensitivity, or LODsr, of the Niton XI-3r GOLDD+ Serics using mining analysis for an Sit), rnatrix, a typical soil rnatrix iSiO,
^LJf
\J\rvvv
. rrst
tE;J TilIf
ff
fl5t ffllgflf
lllE:l,D
t;\ s''
*,'*-s.
,1-
Y ".. i" "i"l
l .'*.
with Ca/Fe). and SRh,l nlxtrix"
\
60s per
Tipe Matrix
Ba
filter wlout He
SRM
I
si0,
35
12
sb
$n
i sio,nr**cu l+sl tl
45
1ri
I
tc
cd
Pd
I
5 PVS 3
Ag
Mc
Nb Zr
J
3 3 3
$r
fib
8i
As 5e Au
Pb
q
I'i lul
t5l tt ll
It lJl
lul tt
l:l i'l
iul
|"i I'ol
| 'u
Limits ol detecfian {L0Ds} are dependenl on th* fcllawing facfars:
" Testing time
2A
t0
. inrerierenceslmalrrx
. Levei nf st:tistical rantid*nr;c
LCDs are c:leulated as lhree standard
lA/sl
ais
J
3 5
deviaticns {99.7!;" confid ence intervalJ for each element. using 60-sacond
analysis times per irlter.
Please Nate:
5 3 5 5 3
0ngcing researclr arrti aCvancene*ls
rn our Niton XLSI
fi0LDD+ Series
anelyzers will lead to rontinuai
!mpr*vement in many oithe values
detaried in this chan. Contact a
Therna Fishr:r Scienti{ir r:ffice or your
local representative {or the latest periormance spectliratir:ns, Acir:ai analysis tjme is based on your requirements, antj, in mast
cases, shorter times wili give you
t6
E
10
Zn
Cu
I
12
Iili
Co Fe
25
?fl
Mn
Gr
1'
60
2A 10 10
I rsn tl lNiAl lasl tt
l:ol
it
l10 ioni t--l I rs tt 15 |
tl
Irsl lt
20
l
10 60
I
|
15
the detection iimits you require.
3il
I
Fnr example, if analysis time lvas red
Lr
ed iron,. 60 sccorrrls/iilter to
100
l5 secondslfrlel tl
el lhe detecticn
N/A
85
?q
I
lim;ts oi:tained wculd be twice the values shown in the chart. Similarly,
zisiq Thertt Fishet
Scientt{tt irc.
Ti
Ca K
50 40
I'oi
I tl
50*
nr+ JJ 220"
i'ol
130
increasing the anslysis tir* wiil
redlce the detection limits
by the
35
sqilare fcot of the increased time. fuS
s0
I
A;i tights ftseivaf.
Ai! Iadaaarts arc lhe
-f!,e;ftio
yapeftr
if
Fisfier
affd
cl s
P
Sr,tr;lfc l+r
il:
60 |
I I
st;hsidiarlx.
afr IV
I I
I I
I
Spd4siiE\s, |erns atid pritiig tre subi5t io eh1flJe.
Not ai! praiiucts ere avaliahle
ii all L.aililtiffi. Please con$u{t yo$ !6al ffles rearresffitatire
fsr details.
si
AI Mg
r3u l^^^* I tua' NIA I N1A*
500
3500
I rrrra I ro luu-l tttgCI 175*l { I ooo i ,ro. ttl
jvn|ru'a"I
|
rllA
Appficaticri-steri{ir
N/A
NIA
N/A = Not applicabie
|
I I I
75 ! 175 I 300 | N/A I
I I I I I
S5"
1.
freititi:n
ar,l ?rr,cs.jlre isr t,ls I'jetrillinatiril
90t
230*
iletertjon ljrx,t 4S CFR, Parr 136, Appendi;< B. Revisirn 1.'i1. U.S. Environrnental Protectirn Agency. U.S. Governmenl Prinlirg 0llice: W{rh;ngtOn, itc,1ss5.
cl tlie llethad *!
NiA*
1000. 2000"
*t{44ez;.orlzgro
750"
1000
6000
| 1500" |
500"
2500
I
I
$500
| |
I
Element fist slraurn is no1 exhaustive. Fnr limits
o1 Jstection for elements nnt shown, please contact a Therms Fisher Scientific office or ylur local representattve.
"L0Ds drsplayed with the use of helium.
Thermo Scientific Portahte XRF Analyzers for Rare Earth Elements
Elemental Limits of Detection in
sio,
and sRM Matriies using MiningAnalysis
Thcrmo screnrific prrtalrle XRF analyzer:s are availalllc lvith 1,1;'1 choic:e rf cxciratior optio's, providi*g the oprimai e ,lnfig'rflti,,n f'r vour ana11'1ical needs. l'hc correlation cocfiir icnrs anti rr.pe arahiliry data for the key elernenrs in rare earth eremenr (REE) cre analysi.s demonstrate .the excellent accuracy a'd precision ,f borh rhe irandhcld rhcrmo seicntific ;r-iro' XLp ,iz2lt and thc Nirono XI-.]r (l{)l.Di)+ r-ra}- fluorescence {xRF) anah.zrrs. Th.- ch:rrr belou, derails the sensitivity. or LOI)si, rf rhe Niron XL3t coLDIJ+ and the Niton XLp -522K using nrining analvsis for an SiO, matrix, These are oprimal values and rvrll deg'ade srighdv rvirh real world materials, depending on the rlrher elernents present iir the sample.
te
i,
"q;
t{*igh; "
Limits of detection {l0Ds} are depefident on the follcwing factors:
. Testrng tim
e
. lnterf erenc esr'natlix . Levei oistatistital coniirience
60s per {ilter
dcut
He
Flements
Niton
XLI
Yttrium (Yl*
Lanthanum {La}* Cerium {Ge}* Praseodymium {Pr}* Neodymium {ltldl* Samarium {$m} Europium (Eul
5
50 60
G0LDD+ |
L0Ds are calculaled as ihree siandarri devrattcns 199.7% cnn{idencc intcrvell
Uiton Xtp 52ZK
1r
25 40 30
for each element, using 60,second
analysis times per fiite
r.
Please Note:
0ngoing research and advancemenrs
in our instrument technology will lead
qn
,5U
to contiflual improvement in many NA NA NA
4U
ofthe values deiailed
40 60
in this chart Contait youf local Thermo Scientrfic p0rta bie xRF analyzer representative
Gadolinium {Gd}
.Mslhe'-d$
emiic.Ni@nlton'
Te*ium {Tbl
Dysprosium {Dy}
for the latest performance
NA NA
40
80
specilicaiians.
Element lrst shown is not exhaustive- For limits of deteciron tor elements not shouln, please rontact your local Titermo Suientjfj! pcrtable XRF analyzer rslrreseiltaltvc. High Y concentration may suggest the presence of high concentrations of healy RFE, such as Gd. Tb, and Dy.
Your detecticn limit requirements
will
drctate the actual analysts time. For
exarrple, rf analysis time was reduced from
60
secondslfiiter to
seconds/
filter, then the detection limits obtained
n0ptional elenents avatlable on a Niton XL3r G0LDD+ analyzer.
fl/ould be twrce the values shown the chart. Simiiarly, incrsasing the
rn
analysis iime wjil reduce the detection limits bv the sq uare ioot of the
increased time.
NA -- Not applicable
@2012
ftHno fisher
Saaottfulnt
,4!l ftShrs
EffivAl,
are
A{I.xlsna*s
propary tf
SciBntifrt
the fhvno fisher
ht.
and
its
iratliitte lo !h! teletniind!!ot: ile,-"rtipt) Litnit,40 CFfi. Fart 1 3E, ^t1etitj{i AppenrJix B. Revisi0r 1.11. tJ.S. Eitvirollental Protectron Ageitcy. US. Govenrferil Pftnlirg
Deiitiiitn
ihe
a;:,1
il
sirbs?lsres
0fticer \ry:shington.
i:,
gg:.
.9ttn:fiuticns, ierns ani
-v
piiti,
{e
skbjpat to e lrJ,ge.
f\hi s!! sretiutis *e available il1 a!! mEb 6. Pkase cffiult yLnrlgrat sles r4l.wtat;re
':
fsdetals.
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