PD -93906D
IRFP2907
AUTOMOTIVE MOSFET
HEXFET Power MOSFET
Typical Applications
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Benefits
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Integrated Starter Alternator
42 Volts Automotive Electrical Systems
Advanced Process Technology
Ultra Low On-Resistance
Dynamic dv/dt Rating
175C Operating Temperature
Fast Switching
Repetitive Avalanche Allowed up to Tjmax
RDS(on) = 4.5m
Absolute Maximum Ratings
VGS
EAS
IAR
EAR
dv/dt
TJ
TSTG
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Pulsed Drain Current
Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 seconds
Mounting Torque, 6-32 or M3 screw
TO-247AC
G
Gate
Drain
Source
Parameter
ID @ TC = 25C
ID @ TC = 100C
IDM
PD @TC = 25C
ID = 209A
Description
Specifically designed for Automotive applications, this
Stripe Planar design of HEXFET Power MOSFETs
utilizes the lastest processing techniques to achieve
extremely low on-resistance per silicon area.
Additional features of this HEXFET power MOSFET
are a 175C junction operating temperature, fast
switching speed and improved repetitive avalanche
rating. These benefits combine to make this design an
extremely efficient and reliable device for use in
Automotive applications and a wide variety of other
applications.
VDSS = 75V
Max.
Units
209
148
840
470
3.1
20
1970
See Fig.12a, 12b, 15, 16
5.0
-55 to + 175
A
W
W/C
V
mJ
A
mJ
V/ns
C
300 (1.6mm from case )
10 lbfin (1.1Nm)
Thermal Resistance
Parameter
RJC
RCS
RJA
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Junction-to-Case
Case-to-Sink, Flat, Greased Surface
Junction-to-Ambient
Typ.
Max.
Units
0.24
0.32
40
C/W
1
08/08/11
IRFP2907
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
RDS(on)
VGS(th)
gfs
Parameter
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
Forward Transconductance
Qg
Qgs
Qgd
td(on)
tr
td(off)
tf
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain ("Miller") Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Min.
75
2.0
130
Typ.
0.085
3.6
410
92
140
23
190
130
130
IDSS
Drain-to-Source Leakage Current
LD
Internal Drain Inductance
5.0
LS
Internal Source Inductance
13
Ciss
Coss
Crss
Coss
Coss
Coss eff.
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Output Capacitance
Output Capacitance
Effective Output Capacitance
13000
2100
500
9780
1360
2320
V(BR)DSS
V(BR)DSS/TJ
IGSS
Max. Units
Conditions
V
VGS = 0V, ID = 250A
V/C Reference to 25C, ID = 1mA
4.5
m VGS = 10V, ID = 125A
4.0
V
VDS = 10V, ID = 250A
S
VDS = 25V, ID = 125A
20
VDS = 75V, VGS = 0V
A
250
VDS = 60V, VGS = 0V, TJ = 150C
200
VGS = 20V
nA
-200
VGS = -20V
620
ID = 125A
140
nC
VDS = 60V
210
VGS = 10V
VDD = 38V
ID = 125A
ns
RG = 1.2
VGS = 10V
D
Between lead,
6mm (0.25in.)
nH
G
from package
and center of die contact
S
VGS = 0V
pF
VDS = 25V
= 1.0MHz, See Fig. 5
VGS = 0V, VDS = 1.0V, = 1.0MHz
VGS = 0V, VDS = 60V, = 1.0MHz
VGS = 0V, VDS = 0V to 60V
Source-Drain Ratings and Characteristics
IS
ISM
VSD
trr
Qrr
ton
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse RecoveryCharge
Forward Turn-On Time
Min. Typ. Max. Units
Conditions
D
MOSFET symbol
209
showing the
A
G
integral reverse
840
S
p-n junction diode.
1.3
V
TJ = 25C, IS = 125A, VGS = 0V
140 210
ns
TJ = 25C, IF = 125A
880 1320 nC
di/dt = 100A/s
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
Starting TJ = 25C, L = 0.25mH
RG = 25, IAS = 125A. (See Figure 12).
ISD 125A, di/dt 260A/s, VDD V(BR)DSS,
TJ 175C
Pulse width 400s; duty cycle 2%.
Coss eff. is a fixed capacitance that gives the same charging time
as Coss while VDS is rising from 0 to 80% VDSS .
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 90A.
Limited by T Jmax , see Fig.12a, 12b, 15, 16 for typical repetitive
avalanche performance.
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IRFP2907
1000
1000
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
TOP
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
TOP
100
10
4.5V
20s PULSE WIDTH
TJ = 25 C
1
0.1
10
4.5V
10
0.1
100
Fig 1. Typical Output Characteristics
RDS(on) , Drain-to-Source On Resistance
(Normalized)
I D , Drain-to-Source Current (A)
3.0
TJ = 175 C
100
TJ = 25 C
10
V DS = 25V
20s PULSE WIDTH
6.0
7.0
8.0
9.0
VGS , Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
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10
100
Fig 2. Typical Output Characteristics
1000
5.0
VDS , Drain-to-Source Voltage (V)
VDS , Drain-to-Source Voltage (V)
1
4.0
20s PULSE WIDTH
TJ = 175 C
10.0
ID = 209A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20 0
VGS = 10V
20 40 60 80 100 120 140 160 180
TJ , Junction Temperature ( C)
Fig 4. Normalized On-Resistance
Vs. Temperature
IRFP2907
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
C, Capacitance(pF)
16000
Coss = Cds + Cgd
Ciss
12000
8000
4000
Coss
VGS , Gate-to-Source Voltage (V)
20
20000
ID = 125A
VDS = 60V
VDS = 37V
16
12
FOR TEST CIRCUIT
SEE FIGURE 13
Crss
0
1
10
100
ID, Drain-to-Source Current (A)
ISD , Reverse Drain Current (A)
400
500
600
700
10000
1000
TJ = 175 C
10
TJ = 25 C
1
V GS = 0 V
0.5
1.0
1.5
2.0
2.5
VSD ,Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode
Forward Voltage
300
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
0.1
0.0
200
QG , Total Gate Charge (nC)
VDS, Drain-to-Source Voltage (V)
100
100
3.0
OPERATION IN THIS AREA LIMITED
BY RDS(on)
1000
100
100sec
10
1msec
Tc = 25C
Tj = 175C
Single Pulse
10msec
DC
0.1
0.1
10
100
1000
VDS, Drain-to-Source Voltage (V)
Fig 8. Maximum Safe Operating Area
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IRFP2907
240
200
ID , Drain Current (A)
RD
VDS
LIMITED BY PACKAGE
VGS
D.U.T.
RG
-VDD
160
10V
120
Pulse Width 1 s
Duty Factor 0.1 %
80
Fig 10a. Switching Time Test Circuit
40
VDS
90%
25
50
75
100
125
150
TC , Case Temperature ( C)
175
10%
VGS
Fig 9. Maximum Drain Current Vs.
Case Temperature
td(on)
tr
t d(off)
tf
Fig 10b. Switching Time Waveforms
Thermal Response ( Z thJC ) C/W
D = 0.50
0.1
0.20
0.10
0.05
0.01
0.02
0.01
SINGLE PULSE
( THERMAL RESPONSE )
0.001
0.0001
1E-006
1E-005
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRFP2907
D.U.T
RG
+
- VDD
IAS
20V
0.01
tp
ID
51A
88A
BOTTOM 125A
TOP
4000
DRIVER
VDS
EAS , Single Pulse Avalanche Energy (mJ)
5000
15V
3000
2000
Fig 12a. Unclamped Inductive Test Circuit
V(BR)DSS
1000
tp
25
50
75
100
125
150
175
Starting TJ , Junction Temperature ( C)
I AS
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Fig 12b. Unclamped Inductive Waveforms
QG
10 V
QGS
QGD
4.0
VG
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50K
12V
.2F
VGS(th) , Variace ( V )
3.5
3.0
ID = 250A
2.5
2.0
1.5
.3F
D.U.T.
+
V
- DS
1.0
-75 -50 -25
VGS
25
50
75
100 125 150 175
T J , Temperature ( C )
3mA
IG
ID
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
Fig 14. Threshold Voltage Vs. Temperature
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IRFP2907
1000
Avalanche Current (A)
Duty Cycle = Single Pulse
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming Tj = 25C due to
avalanche losses
0.01
100
0.05
0.10
10
1
1.0E-08
1.0E-07
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
EAR , Avalanche Energy (mJ)
2000
TOP
Single Pulse
BOTTOM 10% Duty Cycle
ID = 125A
1600
1200
800
400
0
25
50
75
100
125
150
Starting T J , Junction Temperature (C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
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Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T jmax. This is validated for
every part type.
2. Safe operation in Avalanche is allowed as long asT jmax is
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. PD (ave) = Average power dissipation per single
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. Iav = Allowable avalanche current.
7. T = Allowable rise in junction temperature, not to exceed
Tjmax (assumed as 25C in Figure 15, 16).
tav = Average time in avalanche.
175
D = Duty cycle in avalanche = tav f
ZthJC(D, tav ) = Transient thermal resistance, see figure 11)
PD (ave) = 1/2 ( 1.3BVIav) = DT/ ZthJC
Iav = 2DT/ [1.3BVZth]
EAS (AR) = PD (ave)tav
IRFP2907
Peak Diode Recovery dv/dt Test Circuit
+
D.U.T*
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
RG
dv/dt controlled by RG
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
VGS
+
-
VDD
Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D=
P.W.
Period
[VGS=10V ] ***
D.U.T. ISD Waveform
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
Body Diode
[VDD]
Forward Drop
Inductor Curent
Ripple 5%
[ISD ]
*** VGS = 5.0V for Logic Level and 3V Drive Devices
Fig 17. For N-channel HEXFET power MOSFETs
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IRFP2907
TO-247AC Package Outline
Dimensions are shown in millimeters (inches)
TO-247AC Part Marking Information
EXAMPLE: T HIS IS AN IRFPE30
WITH AS SEMBLY
LOT CODE 5657
AS S EMBLED ON WW 35, 2001
IN THE AS SEMBLY LINE "H"
Note: "P" in as s embly line pos ition
indicates "Lead-Free"
INTERNAT IONAL
RECT IFIER
LOGO
PART NUMBER
IRFPE30
56
135H
57
AS S EMBLY
LOT CODE
DATE CODE
YEAR 1 = 2001
WEEK 35
LINE H
TO-247AC package is not recommended for Surface Mount Application.
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
Data and specifications subject to change without notice.
This product has been designed and qualified for the Automotive[Q101] market.
Qualification Standards can be found on IRs Web site.
IR WORLD HEADQUARTERS: 101N.Sepulveda Blvd, El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 08/2011
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