WAVEline

Roughness and Contour Metrology

Industrial metrology

Metrology from Jenoptik

for your quality control
We deliver solutions that help you optimize your manu-

matic measurement combined with our global sales

facturing process regarding qualitative and economic

and service support network brings us close to you,

objectives.

our customers, enabling us to provide optimal support

as a reliable partner.

We are one of the leading international specialists

in high-precision, tactile and non-tactile production

Our team is looking forward to your inquiry!

metrology.
Our services range from complete solutions for diffe-

Jenoptik Sharing Excellence

rent measuring tasks such as the inspection of surface

and form as well as determining dimensions, throughout every phase of the production process including
final inspection or in the metrology lab.
Our decades of experience in tactile, optical and pneu-

Surface roughness measurement on a wide range of surfaces

Ground surfaces

Turned surfaces

Lasered surfaces

Honed surfaces

Textured surfaces

Roughness and contour metrology

State-of-the-art roughness
and contour measurement
WAVELINE measuring systems offer you extensive evaluation possibilities for surface measurement
also possible in combination, depending on the system.

Tactile roughness measurement

Tactile contour measurement

Optical surface inspection

Roughness parameters

Angle

Crosshatch angles

Core roughness parameters

Radius

Area of blowholes

Profile parameters

Distance

Radius

Waviness parameters

Parallelism

Laser honing structures

Motif parameters

Crowning

JIS parameters

Gothic arcs

Topography evaluation

Edge geometries

Dominant waviness

Line profile

Twist parameters

Threads
Diameter

Wide range of evaluation possibilities in contour measurement

Rauheits- und Konturenmesstechnik

Roughness measurement

Contour measurement

Get better measurements

with versatility

with professional metrology

Whether mobile or stationary, manual or automated,

WAVELINE solutions are the direct result of decades

for simple or complex measuring tasks we supply

of experience and extensive expertise. They stand out

you with measuring systems that are tailored to your

from other products on the market thanks to measu-

needs.

rements performed in accordance with international

standards, simple operation, and professional evaluati-

in day-to-day operations

on of the measured values.

Our robust and high-precision solutions provide

absolutely precise results in environments close to

with modern technology

production. Our systems are easy to operate thanks to

Mobile WAVELINE solutions feature wireless Bluetooth

an intuitive software interface.

technology allowing an almost limitless range of applications. In contour measurement, digital probing systems

with flexibility

ensure reliable measurement results without analog

The WAVELINE systems can be optimally configured

limitations.

to suit a wide range of requirements as needed,

with exchangeable probe arms and a comprehensive

with innovative probing systems

range of accessories. As a result, these systems are

Thanks to intelligent probing systems, the correct

also suitable for different measuring tasks on flexible

measuring conditions are automatically set for contour

production lines

measurements. It is also possible to measure with dual

tip probe arms for top/bottom measurements.

Rauheits- und Konturenmesstechnik

Combined roughness and contour measurement

Surface inspection

Tailored to your needs

You have the choice. Our product range consists of mobile surface measuring instruments, stationary measuring
systems for manual and automated roughness, contour, topography or twist measurement, combined systems for
roughness and contour measurements, as well as measuring instruments for cylinder bores. We also offer measuring stations tailored to meeting your specific measuring requirements.
.

Short description

Page

W5, W10 and W20 Mobile roughness measuring instruments

6 11

Systems

EVOVIS mobile

Control and evaluation software for

12 13

mobile roughness measuring systems

T8000 and

Stationary roughness and/or contour mea- 16 23

C8000

surement with separate probing systems

surfscan and

Combined roughness and contour measure- 24 27

nanoscan

ment with one probing system

EVOVIS

Control and evaluation software for

28 33

stationary surface measuring systems

POU, waveslide,

Individual solutions for production related 44 47

wavemove

roughness and contour measurement

toposcan

Surface inspection in cylinder bores

48 49

TOPOWIN

Control and evaluation software for

50 51

surface inspection

W5

Small but powerful portable,

reliable roughness measurement
Measurementlogwith
measuringconditions

Easy-Paper-Loading

Function keys

Large color
display

Easy operation
with click wheel

Wireless
data transfer

Wireless data transfer

Central start button

Patented probe cover with

measurement position lighting

Extendable tripod legs

HOMMEL-ETAMIC W5 with optional printer HOMMEL-ETAMIC P5

Highlights HOMMEL-ETAMIC W5
Portable and battery-supplied

USB port with Windows-compatible Easily exchangeable probes

Compact and light in design

data format and battery charging

Easy, intuitive handling with click

function

wheel and graphical user interface

Features Bluetooth technology for
wireless data transfer and printing

No calibration necessary
Battery capacity for up to 800
measurements

Storage capacity for 5 measuring

programs with measuring conditions
Optional printer P5 for documentation of the measurement results
on the spot

W5

Mobile measurement
Universal roughness measuring instrument for
use on the production line, on machine tools or
in incoming goods inspection
Ideal for measurements on big workpieces
Measurement in all possible measuring positions,
including on perpendicular surfaces or overhead
Precise workpiece support, even on small shafts
Secure positioning and stable workpiece support on precisely
ground support shafts on the underside of the measuring device
Vee-block rest for small shafts with a diameter of 10 mm and
above for reliable centering on the correct measuring position;
can also be used as probe protection for bores with a diameter
of 12 mm and above
Exchangeable probes
Probes for a range of different measuring tasks
Probe cover to protect probe from damaging
Measurement position lighting to view the exact
measurement position

Tolerance evaluation
Colored display of measurement results depending on
the tolerance evaluation
Assessment of measurement results at a glance

Log created directly on site: optional P5 printer

Compact thermal printer with Bluetooth technology
Long battery life for mobile measurement documentation
Paper easy to insert thanks to the Easy Paper Loading function
Measuring conditions, parameters, tolerance evaluation,
roughness profile and Abbott curve can be printed off individually
or in combination depending on the measurement program

Model

Probe

Parameters

Printer

Transverse Profile/ma- Tolerance

probing
terial ratio

Statistics

Measuring Roughness
programs standard

W5

with skid

23

optional

no

no

no

yes

optional

W10

Flexible, precise roughness

measurement without boundaries
Integrated printer for
V groove for
Integrated
roughnessstandard documentation on the spot small shafts

Patented robe cover with measurement

position lighting, easily exchangeable
skid roughness probes

Extendable tripod legs

Large color touchscreen

with function keys

Rest and
barrel jack

Wireless data
transfer

HOMMEL-ETAMIC W10

Highlights HOMMEL-ETAMIC W10

Mobile and battery-supplied, with
cable-free traverse unit
Usable as stationary instrument
Modern, intuitive operation via
color touchsreen
Wireless data transfer via
Bluetooth interface

Measurement of all common rough- Immediate verification of the

ness parameters according
to international standards
Integrated printer for documentation of the measurement results
on the spot
Easy changing of the skid probes

W10 via the integrated roughness standard

Integrated barrel jack for
traverse unit
Storage capacity for 7
measuring programs

W10

Integrated, exchangeable roughness standard

Safely stored in the basic unit
Immediate verification of the measuring instrument on site
Stable measurement configuration
Measuring program specifically for verification of the
measuring instrument with predefined nominal values

Transverse probing
90 tilting of the probe for measurements in grooves and
incisions or between collars
Probing of the surface transversely to the traverse direction
without complex conversion

Integrated rest and barrel jack

Secure storage of the traverse unit
Protection of the probe
Continuous operational readiness of the traverse
unit thanks to the automatic battery charging function

Measurement in all positions

Measurement of small workpieces in overhead position
Contact to the workpiece is made by precisely polished shafts
on the bottom side of the traverse unit
3-point support on the back side of the traverse unit for
secure positioning when measuring perpendicular surfaces

Integrated height adjustment

Extendable tripod legs for adjusting the traverse unit
to the height of small workpieces
Easily adaptable to the desired measuring position

Model

Probe

Parameters

Printer

Transverse Profile/ma- Tolerance

probing
terial ratio

W10

with skid

40

integrated yes

yes

yes

Statistics

Measuring Roughness
programs standard

yes

integrated

W20

Mobile roughness, waviness and

profile measurement in production
Integrated
Integrated printer for
V groove for
roughnessstandard documentation on the spotsmall shafts
Easily exchangeable
skidless probes

Central start button

Click wheel for

inclination adjustment

Large color touchscreen

and function keys

HOMMEL-ETAMIC W20

Highlights HOMMEL-ETAMIC W20

Modern, intuitive operation via
color touchscreen
Skidless probing system for measurement of all common roughness,

Compact and easy to operate

Integrated printer for immediate
documentation
Immediate verification of the

Easily exchangeable probes for

skidless measurements
7 measuring programs plus 1 specifically for verification of the device

waviness and profile parameters

measuring instrument thanks to the Automatic probe positioning to

according to international standards

integrated roughness standard

10

avoid unnecessary adjustments

W20

Traverse unit for skidless measurement

Integrated start button enables one-handed user control
High-precision linear guide
Variable measurement speed
Software assisted alignment of the reference plane
Measurement in all positions (also overhead)
For all our skidless probes
Motorized lowering of the probe
Automatic positioning of the stylus tip on the workpiece
surface and setting of the preselected measuring range
Automatic lifting of the stylus tip at the end of the
measurement to avoid accidental damage during mobile use

Mobile reference plane measurements

High-precision roughness, waviness and profile
measurement in mobile operation
Performs reference plane measurements and determines
the unfiltered P as well as W parameters
Suitable for measurement of sealing surfaces

Context sensitive operation via touchscreen

Function keys for the 4 basic functions
Extensive possibilities for tolerance evaluation
Fast and comfortable input of additional data via touchscreen
Clear display of the measurement results
Results display: parameters, profile view, interactive Abott curve,
extensive statistics functions
Integrated thermal printer
For documentation of the measurement results on the spot
Easy-Paper-Loading function
Printing of measurement results with tolerance evaluation,
profiles, Abott curve, additional information, statistics

Model

Probe

Parameters

Printer

Transverse Profile/ma- Tolerance

probing
terial ratio

W20

skidless

68

integrated no

yes

yes

Statistics

Measuring Roughness
programs standard

yes

integrated
11

EVOVIS mobile

EVOVIS mobile: professional

evaluation and simple operation
of mobile measuring instruments

The optional EVOVIS mobile software is specifically designed for operation with mobile measuring instruments.
In online mode, the mobile measuring instrument is directly controlled by the software and turns into a stationary
measuring station. In offline mode, the locally measured parameters and profile data saved in the measuring
instrument are transferred and evaluated on the PC.

Highlights HOMMEL-ETAMIC EVOVIS mobile

Clear, user-friendly operating structure
Remote operation of W5, W10 and W20
Individual test plan creation
Integrated help with the parameters
Wizard for selecting the measuring conditions
Import and subsequent processing of profiles
and parameters
Open design of the print log
Electronic archiving of reports with PDF printout

12

All common roughness and waviness parameters in

accordance with ISO 4287 and other ISO and national
standards (ASME, DIN, JIS, Motif, etc.)
Continuous further development of the software in
line with new standards/changes in standards
Optional: qs-STAT data export interface
(description page 31)
Optional: evaluation of dominant waviness according
to VDA 2007 (description page 33)

Customer
Jenoptik
Order
A-42BE
Operator
Schmidt
Comment

EVOVIS mobile

Workpiece
W32-AC33
Drawing number
Z-12344
Serial number
S122

Name

Unit

Ra
Rz
Rmax

Lower limit value

m
m
m

Upper limit value

0,00
0,00
0,00

1,50
5,80
14,00

Value

Bar chart

1,01
5,95
7,50

Roughness profile

Z [m]
3
2
1
0
-1
-2
-3
-4
0,40

1,20

Name

2,00

Unit

Ra
Rz
Rmax

2,80

3,60

4,40

X [mm]

Traverse leng
4,80 mm

f:
OFF
Xz linear measurement position1 Speed:
0,50 mm/s

Evaluation conditions
c:
0,80 mm

Lower limit value

m
m
m

Upper limit value

0,00
0,00
0,00

1,50
5,80
14,00

Value

Bar chart

1,10
5,58
7,14

Roughness profile

Z [m]
3
2
1

Free design of print forms

0
-1
-2

Log editor for free positioning and processing

-3
-4
0,40

1,20

Unit

Ra
Rz
Rmax

2,80

3,60

4,40

X [mm]

Traverse leng
4,80 mm

f:
OFF
Xz linear measurement position1 Speed:
0,50 mm/s

Evaluation conditions
c:
0,80 mm

Name

2,00

Lower limit value

m
m
m

Upper limit value

0,00
0,00
0,00

1,50
5,80
14,00

Value

Customization of log templates

Part data can be provided for the measurement

Bar chart

1,08
5,49
7,03

and displayed in the log

Roughness profile

Z [m]
3

of the contents from the test plan

For displaying on screen, for storing as a

1
0
-1

PDF file and for printing out

-2
-3
-4
0,40

Evaluation conditions
c:
0,80 mm
03.11.2014 15:33:07

1,20

2,00

2,80

3,60

4,40

X [mm]

Traverse leng
4,80 mm

f:
OFF
Xz linear measurement position1 Speed:
0,50 mm/s
Hommel-Etamic W10

EVOVIS 1.42.0.0

Multiprint log

Multiprint log for documentation of several

measurements on one page

Seite 1/1

Defined test plan types

Online measurement with remote operation
and control of the measuring instrument
Importing of raw profiles stored on the mobile
measuring instrument for further evaluation
and logging
Importing and display of the measurement results
(parameters) stored on the mobile measuring instrument for logging
Evaluation display

Interactive profile analysis

Numerous options for adjusting the display

Parameters, result values, tolerances, tolerance
violations as a value or bar chart

Measurement and evaluation in online mode

13

Accessories for mobile instruments

Height stands and accessories

Height stand HS300

Printer paper

Turns the mobile measuring instrument into a stationary

Set of 10 rolls of thermal paper for P5, W10 and W20.

measuring configuration. 300 mm height measuring

Paper width 57 mm, paper length approx. 11 m.

stand with 180 tilting device for precise positioning of

Art.no. 256 016

the roughness probe on the workpiece surface.

HS300 Art.no. 1004 7611
Adapter W5, W10

Art.no. 1004 9843

Adapter W20

Art.no. 1005 1747

Tilting device for W5, W10

Art.no. 1005 1140

Probe stop for W5 and W10

Adjustable pendulum stroke limitation of the
roughness probe.
Art.no. 1006 8896

Roller adapter for W5 and W10

For simple and reliable roughness measurement
Measuring station

directly on roller surfaces. Adjustable for roller diameters

Granite plate with T-groove 400 x 280 mm;

100-180 mm and 180-500 mm.

height measuring range 300 mm

Art.no. 1005 5622

with tilting device 180.

Art.no. 999 011

Magnetic holder for W5 and W10

Enables magnetic fixing of the measuring device/traverse unit on the workpiece surface.
Art.no. 1006 8578

More accessories such as probe extensions, measuring tables

and vee-blocks on pages 40 and 42.

14

Skid roughness probes

Long-term stable skid probes

All skidded probes have a robust housing and a reliable connector. They are calibrated straight from the factory
and provide long term stability thanks to a dual spool system in the inductive converter.

T1E one skid probe

TKO 50 one skid probe

For measurement on flat surfaces, on shafts and in bores.

Offset skid for bores from 2 mm diameter.

Skid radius lengthwise/transverse 30/1.95 mm

Skid radius lengthwise/transverse 30/0.925 mm

Measuring range

100 m

Measuring range

50 m

With 2 m/90 stylus tip

Art.no. 240 005

With 2 m/90 stylus tip

Art.no. 224 444

With 5 m/90 stylus tip

Art.no. 240 000

With 5 m/90 stylus tip

Art.no. M0435 023

Oil resistant with 2 m/90 stylus tip Art.no. 1000 8327

240087 TK050

Oil resistant with 5 m/90 stylus tip Art.no. 240 008

90

T1E one skid probe with transverse skid

22
17.5

For length and transverse measurement on flat surfaces,

44

Skid radius lengthwise/transverse 30/30 mm

1.85

10.5

on shafts and in bores.

TKO 50

Measuring range

100 m

With 2 m/90 stylus tip

Art.no. 1002 0277

T1K one skid probe

With 5 m/90 stylus tip

Art.no. 240 022

For measurement on concave and convex surfaces.

T3E one skid probe

Skid radius lengthwise/transverse 0.2/3.95 mm;

With large measuring range for very rough surfaces.

Skid depth

3 mm

Skid radius lengthwise/transverse 30/1.95 mm

Measuring range

100 m

Measuring range

300 m

With 2 m/60 stylus tip

Art.no. 257 413

With 5 m/90 stylus tip

Art.no. 243 961

With 5 m/90 stylus tip

Art.no. 256 504

T1 K

256504

67

21.9

3.9

3.3

10.5

13.5

22.5

1.9

1.8

64.5

T1E and T3E

T1K

TKPK 100 two skid probe

For measurement on cold-rolled sheets (EN 10049).
Wear-reduced skids with DLC coating.
100 m

With 5 m/90 stylus tip

Art.no. 235 730

8.5

Measuring range

10.5

Skid radius lengthwise/transverse 50/3 mm

2.3
62.7

TKPK 100

Dimensioning in drawings in mm.

15

T8000 R

Universally applicable
roughness measuring system

HOMMEL-ETAMIC T8000 R120-400 with optional wavecontrol basic control panel and measuring table MT1 XYO

The PC-based T8000 R measuring instruments are

Highlights HOMMEL-ETAMIC T8000 R

designed for demanding tasks in professional rough-

High-precision traverse unit for skidless measurement

ness metrology. Each one meets international stan-

Modular structure

dards and can be used both in production and in the

PC-based evaluation unit

metrology lab.

Robust Gauss filter according to ISO/TS 16610-31

Its state of the art design allows varying expansion

Many special parameters from the automotive industry

levels of the measuring station configuration and offers

upgrade possibilities for both topography and contour
measurement

16

T8000 R

The probe can be swiveled 90 for measurements

The roughness probe is attached either to the drive bar

on recessed surfaces or between collars. The surface

or underneath the traverse unit. This guarantees

is scanned perpendicular to the traversing direction

maximum flexibility for use in a wide range of

without complex conversion.

measuring tasks.

HOMMEL-ETAMIC T8000 R system features

Calculation of all common roughness, waviness
and profile parameters
Continuous further development of the software
with regard to new standards/changes in standards
Traverse length 120 mm for roughness and
waviness measurement
Suitable for measurement positions with difficult access

Stable and robust motorized measuring column

for automatic probe positioning
Universally usable roughness probe with exchangeable probe arms for different measuring tasks and
special applications
User friendly software with individual measuring
programs and clearly arranged operating structure

thanks to the positioning accuracy of the drive bar

Model

Vert.measuring range*

Min.
resolution*

Measuring range/ Vertical

hor. resolution
travel

Granite plate

Topography Twist
option
option

Contour
option

T8000 R120-400

300 or
600 m

1 nm or
2 nm

120 mm/0.1 m

400 mm

780 x 500 mm

yes

yes

yes

T8000 R120-800

300 or
600 m

1 nm or
2 nm

120 mm/0.1 m

800 mm

1000 x 500 mm

yes

yes

yes

* Smallest measuring range and depending on roughness probe

17

C8000 digital

Compact and precise contour

measuring systems

HOMMEL-ETAMIC C8000-400 digital with optional measuring table MT1 XYO and vee-block

Our contour measuring systems are equipped with digi-

Highlights HOMMEL-ETAMIC C8000 digital

tal, high-resolution linear scales in the Z and X direction

Maximum vertical measurement range: 60 mm

so that they are free of negative, analog variables.

Interactive control of the measuring station

High level of continuous measuring accuracy

The C8000 digital contour measuring stations boast an

thanks to digital measuring system

optimum price/performance ratio and are designed for

Powerful analysis software

high-precision contour measurement.

Processing of several profiles

18

C8000 digital

The C8000 digital contour measuring stations feature

Motorized probe arm lift and stroke limitation

a modern, digital measuring system. The resolution

Quick release fastener for simple probe arm change

remains high throughout the entire measuring cycle

Manual probing force adjustment

and provides maximum repeatability and measurement

Automatic measurement runs

accuracy even with critical contour features.

HOMMEL-ETAMIC C8000 digital system features

Vertical measuring range/resolution: 60 mm/50 nm
wavecontour digital probing system with digital
linear scales in the Z and X-axis

Wide range of easy-to-replace probe arms

for various applications
Compact measuring station configuration

Large measuring volume

for all standard contour measuring tasks

Wizard for easy system calibration

Model

Vert.
Min.
Measuring range/ Vertical
measuring resolution horizontal
travel
range
resolution

Granite plate

Top/bottom Roughness Topo- Twist

measurement option
graphy option
option
option

C8000-400 digital

60 mm

50 nm

120 mm/0.1 m

400 mm

780 x 500 mm

no

no

no

no

C8000-800 digital

60 mm

50 nm

120 mm/0.1 m

800 mm

1000 x 500 mm

no

no

no

no

Contour measuring systems that can be upgraded to additional roughness measurement

T8000 C120-400 digital

60 mm

50 nm

120 mm/0.1 m

400 mm

780 x 500 mm

no

yes

yes*

yes*

T8000 C200-800 digital

60 mm

50 nm

200 mm/0.01 m

800 mm

1000 x 500 mm

no

yes

yes*

yes*

* In conjunction with the optional roughness measurement

19

C8000 digiscan

Contour measuring systems with

electronic probe arm recognition

HOMMEL-ETAMIC T8000 C120-400 digiscan with optional measuring table MT1 XYO and vee-block

The C8000 digiscan contour measuring systems

Highlights HOMMEL-ETAMIC C8000 digiscan

provide state-of-the-art technology, assuring safety

Vertical measurement range: 60 or 90 mm

in the design of the test processes, as well as ease of

Electronic probe arm detection using RFID technology

operation and fully reliable measuring results.

Optional top/bottom probing as well as diameter

and thread measurement

Thanks to intelligent probe arms, the contour probe

Reliable measurement of small geometric features

system detects which probe arm is installed and auto-

Extensive analysis functions

matically loads the correct system measuring conditions.

This helps prevent operational errors from occurring.

20

C8000 digiscan

The probe arms with magnetic

Automatic setting of the measuring conditions

Dual-tip probe arms enable

holder and electronic probe

Electronic probing force setting

optional top/bottom probing

arm identification are auto-

Electronically dampened lowering of the

in one measuring run and are

matically assigned to the right

measuring program.

stylus tip to prevent stylus tip defects

Automatic measurement runs

used to determine the inside

diameter.

HOMMEL-ETAMIC C8000 digiscan system features

Vertical measuring range/resolution:
60 or 90 mm/50 or 75 nm
wavecontour digiscan probing system
with automatic probe arm detection
The use of RFID technology eliminates the need
to manage probe arms manually

Motorized probe arm lifting/lowering

Adjustable stroke limit
Automatic measuring and evaluation
Processing of several profiles
Probe arms can be quickly replaced for different
measuring tasks

Model

Vert.
Min.
Measuring range/ Vertical
measuring resolution horizontal
travel
range
resolution

Granite plate

Top/bottom Roughness Topo- Twist

measurement option
graphy option
option
option

C8000-400 digiscan

60/90 mm 50/75 nm 120 mm/0.1 m

400 mm 780 x 500 mm

yes

no

no

no

C8000-800 digiscan

60/90 mm 50/75 nm 120 mm/0.1 m

800 mm 1000 x 500 mm

yes

no

no

no

Contour measuring systems that can be upgraded to additional roughness measurement

T8000 C120-400 digiscan 60/90 mm 50/75 nm 120 mm/0.1 m

400 mm 780 x 500 mm

yes

yes

yes*

yes*

T8000 C200-800 digiscan 60/90 mm 50/75 nm 200 mm/0.01 m

800 mm 1000 x 500 mm

yes

yes

yes*

yes*

* In conjunction with the optional roughness measurement

21

T8000 RC

Combined roughness and

contour measuring systems

HOMMEL-ETAMIC T8000 RC120-800 digital with optional wavecontrol basic control panel, measuring table MT1 XYO and vee-block

The optimum combination for roughness and contour

Highlights HOMMEL-ETAMIC T8000 RC

measurement is provided by the intelligent integration

Universal roughness and contour measuring system

of both measurement systems. Roughness and contour

Easily interchangeable probing systems

are evaluated by two separate probing systems.

Roughness measurement over the whole

traverse length

The drive bar positions the roughness probe even in

difficult to access measuring positions. The contour
probe is easy to change and can be operated parallel
to the roughness probe if necessary.

22

Automatic measuring runs with motorized

lowering/lifting of the probe
Attachment of the roughness probe either to the
drive bar or underneath the traverse unit

T8000 RC

The T8000 RC digiscan offers a large measuring stroke

A broad range of roughness probes, accessories

for complex contour measurements. Probe arms with

and software options allow for a wide variety of

magnetic holder are easy to replace and allow flexible

applications. For example, topography features can

extension of the vertical measuring range.

be specified as an option.

HOMMEL-ETAMIC T8000 RC system features

Uniform user interface for roughness and
contour evaluations

Traverse unit with high guiding accuracy and digital

glass scale for exact measurement results

Calculation of all common roughness, waviness

and profile parameters

Stable and robust motorized measuring column for

automatic probe positioning

Evaluation of geometric characteristics such as

distances, angles and radii

Digital probing systems for contour measurement:

wavecontour digital with quick fastener or

Traverse length 120 mm for roughness, waviness

and contour measurements

wavecontour digiscan with magnetic holder for

fast and secure changing of the probe arms

Evaluation of roughness and contour characteristics

in one measurement log

Model

Vert. measuring
range*

Min.
resolution*

Measuring range/ Vertical

hor. resolution
travel

Granite plate

Topography Twist
option
option

T8000 RC120-400 digital

R: 300 or 600 m
C: 60 mm

R: 1 or 2 nm
C: 50 nm

120 mm/0.1 m

400 mm

780 x 500 mm

yes

yes

T8000 RC120-800 digital

R: 300 or 600 m
C: 60 mm

R: 1 or 2 nm
C: 50 nm

120 mm/0.1 m

800 mm

1000 x 500 mm

yes

yes

T8000 RC120-400 digiscan

R: 300 or 600 m
C: 60/90 mm

R: 1 or 2 nm
C: 50/75 nm

120 mm/0.1 m

400 mm

780 x 500 mm

yes

yes

T8000 RC120-800 digiscan

R: 300 or 600 m
C: 60/90 mm

R: 1 or 2 nm
C: 50/75 nm

120 mm/0.1 m

800 mm

1000 x 500 mm

yes

yes

* R = roughness, C = contour
23

surfscan

High resolution roughness and

contour measurement in one run

HOMMEL-ETAMIC surfscan with optional vee-block

Roughness and contours are recorded simultaneously

Highlights HOMMEL-ETAMIC surfscan

with a high-resolution, digital probing system. As a re-

Time-saving thanks to simultaneous measurement

sult, this measuring system provides the optimal solution

of roughness and contour

for demanding measuring applications in the metrology

Highest repeatability even for critical measuring tasks

lab and in production. The geometric characteristics and

Time-consuming alignment of the reference plane is

roughness parameters are evaluated in one run.

no longer necessary when measuring roughness

With its extraordinary price/performance ratio, this sys-

RFID technology for automatic detection of the probe

tem offers application possibilities that are usually only

arms and setting of the correct measuring parameters

covered by much more complex laboratory systems.

24

surfscan

Precision probe arm positio-

Probe arms are quick and easy to replace thanks

The large measuring stroke

ning allows automatic measu-

to magnetic mounting points. Additionally,

and wide range of probe arms

rement runs to be performed

probe arm installation is automatically detec-

for specific measurement tasks

even on small workpieces

ted using RFID technology and assigned to the

open up a variety of application

and in small bores.

correct measuring task by the software.

possibilities.

HOMMEL-ETAMIC surfscan system features

Universal measuring station for quality control in
production or in the metrology lab

The wide measuring range means there is no need to

align the probing system with the workpiece surface

Modular system design for individual configurations

Intuitive, easy-to-use software for integrated
evaluation of roughness and contour features
in a customizable measurement log

Magnetic probe arm holder for fast and secure

changing of the probe arms
Extensive software functions for the evaluation
of roughness and contour

Only one probing system for roughness and contour

Roughness measurement on inclined or curved surfaces
with a resolution of 6 nm in the 6 mm measuring range

Can be extended with other probing systems, e.g. to

enlarge the contour measuring range with the wavecontour digital/digiscan probing systems or with roughness probes for specific roughness measurement tasks

Model

Vert. measuring range

Min.
resolution

Measuring range/ Vertical

hor. resolution
travel

Granite plate

Topography Twist
option
option

surfscan 120-400

6 or 12 mm

6 or 12 nm

120 mm/0.1 m

400 mm

780 x 500 mm

yes

yes

surfscan 120-800

6 or 12 mm

6 or 12 nm

120 mm/0.1 m

800 mm

1000 x 500 mm

yes

yes

25

nanoscan 855

Simultaneous roughness and contour

measurement in the nanometer range

HOMMEL-ETAMIC nanoscan 855 with optional contour standard KN8

The nanoscan 855 offers two measuring systems in one,

Highlights HOMMEL-ETAMIC nanoscan 855

ensuring universal, flexible use for all measurement tasks

RFID technology with

in the field of surface measuring technology saving time

and money.

automatic setting of probe force

and measuring conditions
automatic assignment of probe arms

With its high resolution, large presence and highly accura-

to each measuring task

te straightness guide, this exceptionally precise measuring

Highly precise probe positioning

system is suitable for the finest of surface roughness fea-

Top/bottom or inner/outer measurement

tures as well as for determining micro-geometric features

Thread measurement with automatic evaluation

or contours with a large presence.

26

nanoscan 855

The combined measurement

Dual-tip probe arms with double stylus tips

The entire system is calibra-

and evaluation of roughness

enable automated measurement in the conven-

ted via a ball standard and an

and contour is automated in

tional and overhead position. As a result, it is

automated measurement run.

a single measuring run.

possible to determine the diameter of bores.

HOMMEL-ETAMIC nanoscan 855 system features

Ultra-precision, opto-mechanical measuring system
with high resolution and large measuring range for
measurements on curved or inclined surfaces
Ergonomic measuring station design with integrated
granite plate and active level regulation
Automatic measuring runs thanks to fast, CNCcontrolled measuring axes for highest productivity
New evaluation possibilities: top/bottom measurement, inside diameters, parallelism and angularity of
geometric elements from several profiles

Topography measurement with optional Y-axis and

large measuring stroke as well as high resolution
Easy calibration method with only one sphere standard and an automatic calibration measuring run
Precise, magnetic probe arm holder for fast and secure changing of probe arms; insertion either in down
or up probing direction
Extensive range of probe arms for a large range of
measuring tasks
Optional cover for reducing environmental influences

Model

Vert. measuring
range*

Min. resolution*

Measuring range/
hor. resolution

Vertical
travel

Granite plate

Topography
option

nanoscan 855

24 or 48 mm

0.6/1.2 nm

200 mm/0.01 m

550 mm

850 x 600 mm

yes

27

EVOVIS

EVOVIS evaluation software

for roughness and contour
EVOVIS software is easy to use and offers a standardized interface for roughness and contour measurement, regardless of the configuration of the device.
Simple icons, supported by comprehensive help functions, allow the operator to use the efficient measurement and evaluation tools according to their own
requirements.
In the workpiece-specific test plan, several measuring
Measuring station control

tasks can be summarized using different measuring

conditions, ensuring that all of the features to be
checked remain in one overview and are documented
in the same log.

Highlights HOMMEL-ETAMIC EVOVIS for

roughness measurement and evaluation
Interactive profile analysis functions for evaluating
surface parameters
Evaluation of the measurement results in accordance
with tolerance specifics displayed in a compact form
Measuring station control: all of the information
in one view, reliable operation of all manual and
Profile analysis of roughness and waviness

automatic functions
Individual test plan creation
Wizard for selecting the measuring conditions
All common roughness and waviness parameters in
accordance with ISO 4287 and other ISO and national standards (DIN, JIS, Motif, etc.)
Robust Gaussian filter in accordance with
ISO/TS 16610-31
Optionally can be extended to include function-oriented parameters such as dominant waviness (VDA
2007), twist parameters (MBN 31007-07) and other
factory standard-specific parameters
Open design of the print log
Electronic archiving of logs with PDF printout

Wizard for selection of measuring conditions

28

and automatic save function

EVOVIS

EVOVIS is the quick and reliable way to evaluate geometric features of workpieces, such as radii, angles or
distances.
Additional evaluation tools are offered by
the line profile deviation with variable tolerance range,
the comparison option with stored nominal profiles, as
well as the automatic evaluation of complex geometric
elements such as Gothic arcs or workpiece edges.
Contour evaluation

Precision fitting methods, various options for forming

help elements, and definition options for the coordinate origin also enable complex evaluations to be
performed.

Highlights HOMMEL-ETAMIC EVOVIS for

contour measurement and evaluation
Intelligent measuring station control
Individual test plan creation
Processing of several profiles/features in one test plan
Icon-based contour features for quick test
plan creation
Help elements such as references, points, lines
Gothic arcs

or co-ordinate systems
Automatic alignment functions of the
measured profile
Automatic evaluation run with clear workflow
Powerful zoom functions
Automatically generated results table
Graphic representation of line profile deviations
with variable tolerance range
Morphological filter
Evaluation of complex geometric elements
such as Gothic arcs or edge geometries
Open design of print logs
Electronic archiving of logs with PDF printout
and automatic save function

Nominal-actual comparison with profile deviation

29

EVOVIS

Combined evaluation of
roughness and contour
EVOVIS supports innovative, combined, measurement

Highlights HOMMEL-ETAMIC EVOVIS for com-

systems and enables the integrated evaluation of

bined roughness and contour measuring systems

roughness and contour characteristics.

Interactive roughness evaluation on the

contour profile

The evaluation of roughness parameters can be deter-

Roughness evaluation on straight lines,

mined interactively anywhere in the contour profile.

The roughness profile can also be shown graphically.

inclines and radii segments

Individual definition of evaluation length and
filter setting for the roughness evaluation

Additionally the roughness and contour characteristics

Retrospective roughness evaluation possible

can be displayed in a table and can also be evaluated

statistically.

Johnson Corp.

Contour 1

Contour 1

Roughness 1

Individual design of print logs:

dimensions and roughness parameters evaluated simultaneously

30

on measured profiles

EVOVIS

Software options for

EVOVIS
Automatic runs: CNC control
A CNC measuring run needs a lot less time than
a manual measurement sequence and supplies
operator-independent, reproducible results.
This option allows complex CNC runs and evaluations
to be programmed quickly and easily. The run commands are selected via mouse click and the necessary
parameters are automatically set. The created program
run is displayed clearly in a graphic workflow.
CNC control

qs-STAT data export interface

The data export interface supports the Q-DAS ASCII
transfer format for the exchange of quality information
via Q-DAS software modules. Predefined parameter
sets and the possible use of predefined catalogs
simplify set-up of the data interface.
The interface is certified by Q-DAS according to
AQDEF specifications (Automotive Quality Data
Exchange Format).

qs-STAT data export

31

HOMMEL MAP

Topography evaluation:
option for roughness measurement
HOMMEL MAP 3D topography analysis software offers

HOMMEL MAP basic

extensive evaluation possibilities for profile and surface

Document management

data. Both the T8000 and the nanoscan can be up-

Interactive studies of 3D objects

graded for topography measurement. A Y positioner

2D parameters according to ISO 4287

is necessary in addition to the software (see page 42).

Distance measurement, step height evaluation

Highlights HOMMEL-ETAMIC HOMMEL MAP

HOMMEL MAP expert

Intuitive structure of the analysis documents

basic functions plus

Pre-processing of the measured data:

Evaluation of profile series

alignment, filtering and form removal

Automatic recalculation after changing
evaluation steps

Rk parameters, Motif parameters,

2D parameters automotive
3D parameters

Extensive online help

Joining of multiple profiles

Standards for evaluation of 2D parameters

FFT analysis, frequency spectrum and autocorrelation

ISO/TS 25178 standard for 3D parameters

Morphological filtering on 3D objects

(only HOMMEL MAP expert and premium)

Difference between two surfaces

Extensive metrological and scientific filter possibilities

Extensive graphic and analytical studies

HOMMEL MAP premium

expert functions plus

Depending on the requirements, HOMMEL MAP 3D

Extensive studies of surface series

evaluation software is available in three different versi-

Studies on binary surfaces (grains)

ons each one adding greater capabilities than the last.

Multilayer surfaces

Topography evaluation

32

EVOVIS

WDSm Horizontale Welligkeitskenngre

Die aus dem Amplitudenspektrum des WD-Profils ermittelte mittlere horizontale
Gre der Profilelemente (mittlere Periodenlnge der dominanten Welligkeit).

Other options for

roughness measurement

WDSm Horizontale Welligkeitskenngre

Die aus dem Amplitudenspektrum des WD-Profils ermittelte mittlere horizontale

Gre der Profilelemente (mittlere Periodenlnge der dominanten Welligkeit).

WDSm Horizontale Welligkeitskenngre

Die
dem Amplitudenspektrum
des WD-Profils ermittelte mittlere horizontale
85 - Horizontale
Welligkeitskenngre
Abb. aus
Gre der Profilelemente (mittlere Periodenlnge der dominanten Welligkeit).

Dominant waviness according to VDA 2007

WDt Gesamthhe der Profile
Abb. 85 - Horizontale
Vertikale
Differenz Welligkeitskenngre
zwischen dem hchsten und tiefsten Punkt der WD-Profile
innerhalb der Auswertestrecke

The primary profile is checked for dominant waviness.

The evaluation method automatically recognizes any
existing periodic characteristics, extracts the waviness

WDt Gesamthhe der Profile

Vertikale
Differenz Welligkeitskenngre
zwischen dem hchsten und tiefsten Punkt der WD-Profile
Abb. 85 - Horizontale
Horizontal
waviness parameter WDSm
innerhalb der Auswertestrecke

profile (WD profile) and derives the parameters WDSm,

WDt and WDc.

WDt Gesamthhe der Profile

Vertikale
Differenz zwischen
dem hchsten und tiefsten Punkt der WD-Profile
des WD-Profils
Abb. 86 - Gesamthhe
innerhalb der Auswertestrecke

The following functional behavior can be tested, for

WDc Mittlere Hhe der Profilelemente

example, with the dominant waviness analysis:

Die mittleren Hhen der Profilelemente WDc der Welligkeitsprofile WD sind die
Mittelwerte aus den vertikalen Differenzen der hchsten und tiefsten Punkte der
des WD-Profils
Abb. 86 - Gesamthhe
Profilelemente
der Messtrecke in Anlehnung an DIN EN ISO 4287
Total
profile innerhalb
height WDt
Abschnitt 4.1.4

WDc

WDc Mittlere Hhe der Profilelemente

Die mittleren Hhen der Profilelemente WDc der Welligkeitsprofile WD sind die
Mittelwerte aus den vertikalen Differenzen der hchsten und tiefsten Punkte der
Abb. 86 - Gesamthhe
des WD-Profils
Profilelemente
innerhalb
der Messtrecke in Anlehnung an DIN EN ISO 4287
Abschnitt 4.1.4

WDc

Static tightness
Dynamic tightness
Noise emission
Avoidance of increased wear or malfunctions
Pre-processing conditions

WDc Mittlere Hhe der Profilelemente

Die mittleren Hhen der Profilelemente WDc der Welligkeitsprofile WD sind die
Mittelwerte aus den vertikalen Differenzen der hchsten und tiefsten Punkte der
Abb. 87 - Mittlere
Hhe of
der profile
Profilelemente
Profilelemente
innerhalb
der Messtrecke
in Anlehnung
an DIN EN ISO 4287
Medium
height
elements
WDc
Abschnitt 4.1.4

WDc

Rauheitsmesstechnik in der Praxis

81

Abb. 87 - Mittlere Hhe der Profilelemente

Rauheitsmesstechnik in der Praxis

Twist evaluation according to MBN 31 007-07

81

Twist structures at sealing surfaces occur during the

machining process and impair the sealing function

Abb. 87 - Mittlere Hhe der Profilelemente

Rauheitsmesstechnik in der Praxis

between the shaft and the sealing ring.

81

The most important properties of these surface

structures are measured three-dimensionally and the
parameters relevant to the tightness determined:

Measured surface with twist structure

Number of threads

DG

Twist depth

Dt [m]

Period length

DP [mm]

Feed cross section

DF [m]

Feed cross section per revolution DFu [m/r]

Contact length

DLu [%]

Twist angle

D []

TwistLive analysis method (patented)

With this modern analysis method the normal measurement time may be reduced by up to 75%. During
the measuring process, a results forecast of the twist
Twist parameters

parameters is already possible live !

For twist measurement, the optional rotary traverse
unit (see page 41) is required.

33

Skidless probe sets for roughness measurement

Probe sets for roughness parameters

The TKU probe sets are versatile to use because they replace up to three conventional standard probes and therefore offer a low-cost alternative. The probe sets can be extended at any time with additional probe arms.
The probe sets contain
Basic probe, skid (TKU 300/600 only), probe protection
TS1 probe arms for bores
TS2 probe arm (TKU 300/600 only)
TS1T probe arm for grooves
TS1D probe arm for collars and faces
TKU 100 probe set 100 m
With 2 m stylus tip

Art.no. 256 658

With 5 m stylus tip

Art.no. 256 500

TKU 300/600 probe set 300/600 m

With 2 m stylus tip

Art.no. 256 657

With 5 m stylus tip

Art.no. 230 450

TKU 300/600 probe set

TS1 or TS2 probe arm

34

For bores from 4 or 5 mm diameter;

Art.no. 240 805

TS1 with 5 m/90 stylus tip

Art.no. 230 475

TS2 with 2 m/90 stylus tip

Art.no. 240 156

TS2 with 5 m/90 stylus tip

Art.no. 230 480

3.1

TS1 with 2 m/90 stylus tip

1.9

max. horizontal tracing depth 33 or 78 mm.

0.75

TS1T probe arm

34

For grooves with max. vertical/horizontal tracing

depth of 10/33 mm.
Art.no. 256 624

With 5 m/90 stylus tip

Art.no. 231 289

TS1D probe arm

11.2

With 2 m/90 stylus tip

12.4

0.75

0.13

For collars, directly on end faces and bores from 5 mm

34

diameter; distance from end face to probing point

75

Art.no. 240 160

With 5 m/60 stylus tip

Art.no. 231 291

3.1

With 2 m/60 stylus tip

1.9

0.2 mm; max. horizontal tracing depth 33 mm.

Dimensioning in drawings in mm. Pages 34 39 excerpt from our extensive

range of available probes and probe arms. Additional models on demand.

34

Skidless probe sets for roughness measurement

Probe sets with magnetic adapter

The TKU 300 TSM probe arm set includes a magnetic adapter with 3-point support for fast and easy change out
of the probe arms. In case of collision, the probe arm detaches itself from the roughness probe and thus prevents
damage of the probe arm or roughness probe. The
included probe arms cover the most common
roughness measuring tasks.
The probe set contains
Basic probe with magnetic adapter
TSM1 probe arm for bores
TSM1T probe arm for grooves
TSM1D probe arm for collars and faces
TKU 300 TSM probe set 300 m
With 2 m/90 stylus tip

Art.no. 1005 9997

With 5 m/90 stylus tip

Art.no. 1006 5082

TKU 300 TSM probe set

TSM1 probe arm

For bores from 4 mm diameter;
max. horizontal tracing depth 33 mm.

3.2

Art.no. 1005 4119

1.9

With 5 m/90 stylus tip

40

Art.no. 1006 0616

90

With 2 m/90 stylus tip

TSM1T probe arm

For grooves with max. vertical/horizontal tracing
depth of 10/33 mm.
Art.no. 1006 5084

With 5 m/90 stylus tip

90

Art.no. 1005 9283

10.4

With 2 m/90 stylus tip

12.9

40

TSM1D probe arm

40

For collars, directly on end faces and bores from 5 mm

75

diameter; distance from end face to probing point

Art.no. 1005 9103

With 5 m/60 stylus tip

Art.no. 1006 5085

3.252

With 2 m/60 stylus tip

1.9

0.2 mm; max. horizontal tracing depth 33 mm.

Dimensioning in drawings in mm.

35

Skidless probes for roughness measurement

Skidless probes for roughness,

waviness and profile
With a measuring range of 300 or 100 m and precise ruby bearings, the TKL probes are particularly well suited
for fine roughness measurements. The probes are factory calibrated and provide long-term stability thanks to their
dual spool system in the inductive converter.
TKL 300L probe
Standard probe for measurements of R, W and P profiles
on plain surfaces, shafts and in bores from 4 mm.
Measuring range

300 m

Max. horizontal tracing depth 30 mm

With 2 m/90 stylus tip

Art.no. 1000 4132

With 5 m/90 stylus tip

Art.no. 243 588

TKLK 100/5 probe

For measurements in small bores from 1 mm.

0.25

100 m

Max. horizontal tracing depth 5 mm

Art.no. 233 280

With 5 m/90 stylus tip

Art.no. M0 435 035

1.0

With 2 m/90 stylus tip

0.2

Measuring range

17

78.5

TKLT 100/17 probe

For measurements in grooves or on recessed surfaces.
Measuring range

100 m

Vertical/horizontal tracing depth

13/17 mm

With 2 m/90 stylus tip

Art.no. 552 726

With 5 m/90 stylus tip

Art.no. 224 835

TKLQ 100/17 probe

With specific bearing for transverse measurements,
100 m

Max. horizontal tracing depth 17 mm

With 2 m/90 stylus tip

Art.no. 231 207

With 5 m/90 stylus tip

Art.no. 1004 4932

11.5
0.2

Measuring range

3.7

e.g. in grooves or between collars.

17.5
72

Dimensioning in drawings in mm.

36

Contour probes for C8000 / T8000 C digital

wavecontour digital probe arms

for contour measurement
TA-60 probe arm with carbide tip
For profile recording on very fine to coarse structures.
Carbide stylus tip

Art.no. 232 586

42

Art.no. 243 700

32

Probe arm

9
79 0

170

175

TA-60 probe arm with ruby ball

For measurements on radii or when mechanical
Art.no. 256 497

Ruby ball stylus tip

Art.no. IM02 4743

Adapter stylus tip

Art.no. 230 695

32

Probe arm

22

pre-filtering is desired.

230

TA-60 probe arm for transverse measurements

Inner profile, e.g. internal gears, are made accessible by
Art.no. 256 785

Stylus tip

Art.no. 284 039

22

Probe arm

32

the transverse arm of 32.5 mm.

79

90

170
175

TA-60 probe arm for bores

90

With a maximum tracing depth of 35.8 mm.

79

Art.no. 256 565

Stylus tip

Art.no. M0 445 036

Bores from 4 mm

Art.no. 1000 2710

2.9

Probe arm

4.4

For bores from 4.5 mm diameter.

35.8
35.8
170.9

Stylus tips with ruby ball

Art.no. IM05 1212

Stylus tip 0.25 mm

Art.no. IM05 1342

Stylus tip 0.5 mm

Art.no. IM02 4743

Stylus tip 1 mm

Art.no. IM05 1208

Stylus tip 1.5 mm

Art.no. IM06 3935

10

10

22

Art.no. 230 695

Stylus tip extension

M2

Adapter M2 for stylus tip

Dimensioning in drawings in mm.

37

Contour probes for C8000 / T8000 C digiscan

wavecontour digiscan contour probe

arms with magnetic coupling
TD-60 standard probe arm
With carbide tip for profile recording on very
fine to coarse structures or with ruby ball for
measurements on radii or if mechanical prefiltering is required.
Carbide probe arm

Art.no. 1005 7599

Carbide stylus tip

Art.no. 1005 3157

Ruby ball probe arm

Art.no. 1005 7670

Ruby ball stylus tip

Art.no. 1005 0760

TD-90 probe arm at 1.5 times the length

For 90 mm measuring range.
Carbide probe arm

Art.no. 1005 7685

Carbide stylus tip

Art.no. 1005 3157

Ruby ball probe arm

Art.no. 1006 2155

Ruby ball stylus tip

Art.no. 230 695

TD-60 probe arm for bores

Max. horizontal tracing depth 150 mm.
For bores from 12 mm.
Probe arm

Art.no. 1005 2855

Stylus tip

Art.no. 244799

Max. horizontal tracing depth 39 mm.

For bores from 7 mm.
Probe arm

Art.no. 1005 8268

TD-60 dual-tip probe arms

For inner/outer measurement or top/bottom
measuring.
T5 carbide probe arm

Art.no. 1005 8278

Stylus tip

Art.no. 1005 4412

T10 carbide probe arm Art.no. 1005 8293

Stylus tip

Art.no. 1005 4413

T12 ruby ball probe arm Art.no. 1005 7699

Stylus tip

Art.no. 1005 5974

Dimensioning in drawings in mm.

38

Combined roughness and contour probes for surfscan and nanoscan

Probe arms for combined roughness

and contour measurement
WCN1 probe arm
With diamond tip for bores from 6.5 mm diameter.
Max. horizontal tracing depth 60 mm
Art.no. 1005 5687

90

1.75

5.25

With 2 m/60 stylus tip

63.25

WCN1 probe arm for bores

With carbide tip for measurement of fine contours
in bores.

63.25

Art.no. 1005 6630

With 20 m/22 stylus tip

79

Max. vert./hor. tracing depth 4,5/60 mm

1.006

Max. vert./hor. tracing depth 5/60 mm

Art.no 1005 5890

90

With 20 m/22 stylus tip

63.25

With carbide dual-tip.

90

WCN1 probe arm with dual-tip

10

With diamond dual-tip.

With 2 m/60 stylus tip

Art.no. 1004 6152

10

Max. vert./hor. tracing depth 10/60 mm

WCNT1 probe arm

With diamond tip for measurement in grooves

63.25

or on recessed surfaces.

90

WCN1T probe arm

13

Art.no. 1005 5688

16.5

With 2 m/60 stylus tip

90

Max. horizontal tracing depth 13/60 mm

With carbide tip.

63.25

Art.no. 1006 6658

13 mm
Art.no. 553 734
7

With 20 m/15 stylus tip

90

Max. vertical tracing depth

25.5

With 20 m/15 stylus tip

25,5

25 mm

90

Max. vertical tracing depth

With ruby ball.

Max. vertical tracing depth
With ruby ball 0.5 mm

7 mm

Art.no. 1002 6503

Dimensioning in drawings in mm.

39

Accessories for stationary roughness instruments

Accessories for adapting the probing

system to the measuring task
PHZ skid probe holder
For holding skid probes because the skid of the probe
must adapt to the form deviation of a surface. The skid
therefore forms the reference plane for the roughness
measurement. All roughness parameters are measured
with skid probes.

Art.no. 240 211

FHZ skidless probe holder

To hold skidless probes so that the stylus tip can
measure the form deviations correctly. Skidless
probes are used to determine roughness, waviness and
form deviations.

Art.no. 240 215

FHZ rotatable skidless probe holder

Rotatable by 360 in steps of 15.
For measurements overhead and on vertical surfaces.

Art.no. 244 891

AZZ probe extensions

Also suitable for mobile roughness measuring devices.
55 mm

Art.no. M0 435 041

100 mm

Art.no. M0 435 042

150 mm

Art.no. M0 435 043

200 mm

Art.no. M0 435 044

HAA holder
Twist-protected holder for fixed alignment of the
roughness probe.
HAA150

40

Art.no. M0 435 127

Accessories for stationary instruments

Probe adapter
Enables the operation of roughness probes under the
traverse unit, alternatively to position on the drive bar.

Art.no. 240 754

Rotary traverse unit waverotor

For roughness measurements on cylindrical workpieces
in circumferential direction. Workpiece held by chuck or
optional clamping jaws.

Art.no. 999 061

wavecontrol basic control panel

For convenient one-handed user control of the
measuring system. Function keys for the most
frequent operating functions; joystick for fine
control of the axis movements; emergency stop
switch close at hand.

Art.no. 1002 5181

GTR instrument table

With integrated granite plate on passive damping
elements; undercabinet for accommodating the
PC, printer and measuring instrument electronics.
Max. load 300 kg.
GTR4 for 780 x 500 mm granite plate Art. no. 235 626
GTR5 for 1000 x 500 mm granite plate Art. no. 239 303
Damping elements with active level regulation
Optional for benchtop or instrument tables.
For 780 x 500 or 1000 x 500 mm granite plates.
Regulates the horizontal alignment of the
granite plate; automatic and independent of
the workpiece weight.
LC-25 for GTR4

Art. no. 1003 8970

LC-50 for GTR5

Art. no. 1003 8509

LC-25 benchtop version for

GTR4 instrument table

780 x 500 mm granite plate Art. no. 240 785

41

Accessories for mobile and stationary instruments

Accessories for holding of workpieces

Measuring tables

Parallel vises

For holding and positioning workpieces. Two coordi-

Two small pairs of vees in the clamping jaws enable

nates adjustable 12.5 mm; rotatable: 5 around

clamping of right-angled and cylindrical workpieces in

the vertical axis.

horizontal or vertical position.

MT1: 160 x 160 mm contact surface

M32

Art. no. IM05 0968

XYO axis

Art. no. M0 435 276

M50

Art. no. IM05 0965

XY axis

Art. no. M0 435 273

MT2: 100 x 100 mm contact surface

XYO axis

Art. no. M0 435 278

MT2

With flexible foot:

MT1

M32/GF32

Art. no. IM05 0966

M50/GF50

Art. no. IM05 0963

Vee-block
Four different sized, finely ground vees ensure a
holding range of shafts and round workpieces with
diameters between 1 and 150 mm.
Art. no. M0 435 084

Y positioner
With motor drive for recording of topographies or for
automatic positioning transversely to the probing direction. Load capacity approx. 30 kg. Guiding accuracy

Angle vise

approx. 5 m. Max. trace width 50 mm. Smallest step

Completely precision ground. Angle adjustment in

size 2.0 m, optional with manual fine adjustment in

two axes with Nonius scale and screw for fine adjust-

X/Y direction with a manual adjustment way of 25 mm.

ment. Horizontal swivel range 360, vertical swivel

160 x 160 mm support area.

range 60. Jaw width 70 mm, clamping range 80 mm.

Y positioner

Art. no. 1005 2547

Y positioner
with fine adjustment

42

Art. no. 1005 2599

Art. no. 1002 7036

Standards

Permanent measuring accuracy

The accuracy can change unnoticed due to constant use and associated wear. The device must therefore be
calibrated regularly using measurement calibration standards, as meaningful and accurate results can only be
generated if the measuring instruments are calibrated accordingly.
Surface inspection standards

DAkkS-DKD calibration laboratory

To check surface measuring systems with the

At our EN ISO/IEC 17025 accredited, vibration-free and

profile method:

air-conditioned DAkks-DKD calibration laboratory we

Depth setting standard in polished glass with

conduct fundamental and application based research

grooves of differing depths for determining the

and perform calibration processes on your standards.

vertical amplification and the repeatability

Geometry standard in glass or nickel (hard or extra

This ensures direct tracing of the gaging compo-

hard coating) with uniform groove profile for che-

nents to the Federal Physical-Technical Institute (PTB,

cking the entire measurement system

Physikalisch-Technische Bundesanstalt) and guarantees

Roughness standard in steel with irregular surface

measurements and calibrations at the highest technical

profile replicated from practice for checking the

standard for measuring.

entire measuring system

If a standard cannot be calibrated, a new one can be
KN8 contour standard

obtained directly from any of our manufacturing

Compliant with VDI/VDE Directive 2629.

facilities. Simple factory calibration certificates and test

Measurement features: radii, angles, horizontal

reports for non-accredited parameters are also availab-

and vertical distances

le. We also carry out capability tests for demanding

Vertical measuring range: 4.5 mm/7.5 mm

measurement tasks.

Horizontal measuring range: max. 82 mm

Including holder and DAkkS-DKD calibration certificate.

Our range of calibration services

Art. no. 1000 1678

Our DAkkS-DKD accreditation includes the measurement of variables such as roughness, profile depth,

Twist standards

roundness, straightness, and parallelism as well as

For verification of twist measuring systems.

contour standards and roughness measurement instru-

Calibrated parameters: Dt, DP, DG and D.

ments. Within this scope we offer:

Including test report.

Art. no. 1001 6265

DAkkS-DKD calibration certificates

for roughness standards
for contour standards
for form standards
for cam shaft standards

43

POU

Manual surface finish measurement

right where you need it
Point of Use metrology equipment is tailored for roughness measurements, on a wide variety of workpieces, utilizing application specific designs. These systems deliver safe and repeatable positioning of the measuring devices,
at pre-defined measurement locations, even for hard to access areas. As an example, Point of Use bore gages
(B30) are designed with an adjustable depth ring that allows positioning of the probe at pre-determined depths.

Measurement in bores

Measurement on plane surfaces

Measurement on shafts

The HOMMEL-ETAMIC B30

The HOMMEL-ETAMIC T30 is designed

The HOMMEL-ETAMIC S30 is

measures roughness in bores,

to measure roughness on a wide variety

intended for shaft measure-

using customized I.D. tooling

of plane surfaces using pre-made templates

ment, using unique scissoring

with built in wireless surface

to accurately position the traverse unit on

technology to accurately positi-

testers.

the workpiece.

on the wireless traverse unit.

Highlights HOMMEL-ETAMIC POU

Secure and accurate positioning of
the traverse unit on the workpiece
Repeatable measurement results due
to template positioning
Unique scissoring technology for
shaft type workpieces

Skidded or skidless probing systems

Included roughness standards for
measuring system verification
Ideal for work pieces such as engine blocks,
cylinder heads, valve bodies or housings,
as well as crank shafts, cam shafts and
connecting rods

44

waveslide

Individual, semi-automatic
production measuring stations
HOMMEL-ETAMIC waveslide measuring stations are individually tailored to suit specific measurement tasks.
They are based on proven T8000 system components and provide reliable, semi-automatic measurements in
the manufacturing environment. The measuring systems are extremely robust and operate with high precision.
The workpiece is positioned manually via guided air slides and the measuring process is fully automated.

The HOMMEL-ETAMIC waveslide measures

roughness on shaft-type or cubic workpieces
that are positioned manually via a measuring
table with air slides.

Highlights HOMMEL-ETAMIC waveslide

Simple, manual positioning of the workpiece
via air slides
For medium to large cubic or shaft-type workpieces
Manual operation
For roughness and contour measuring tasks

45

wavemove

Time-saving measurement in production:

fully automated measuring systems
The HOMMEL-ETAMIC wavemove measuring stations allow individual, CNC-controlled, fully automated roughness and contour measurements to be performed directly on the production line. These stations are based on the
T8000 platform and are enhanced with CNC axes and workpiece fixtures specific to the part. This enables them to
perform complex measuring tasks on cubic or wave-shaped workpieces in a fully automated process.

Highlights HOMMEL-ETAMIC wavemove

Automated surface measurements for workpiecespecific applications
High degree of automation
Robust measuring stations suitable for production
Transfer of the measurement results to programs
such as qs-STAT

Flexible system concept for a wide range

of applications

46

Simple measurement program creation

Up to eight independent CNC axes operating
simultaneously
Workpiece carrier with automatic identification
of the workpiece
Extensive safety equipment
Advanced technology for a high degree of reliability

wavemove

The calibration of the measurement system is automa-

The probe is swiveled by 90 for roughness measure-

ted via integrated roughness and contour standards.

ments on pin bearings.

Application example: HOMMEL-ETAMIC wavemove for crank shafts

Fully automated measurement of roughness
and twist on crank shaft bearings

Automated axes for::

- X/Y-axis travel movement of the measuring column

Optional contour measurement, e.g. of groove radii

- Vertical positioning of the traverse unit (Z-axis)

Workpiece held between tips using carrier disk

- Rotary drive for rotation of the crank shaft

and tailstock
System check via integrated roughness and
contour standards

- Motorized tilt unit for the traverse unit

- Optional: CNC-controlled rotation module for lateral
probing or measurement in the overhead position

Application example:
HOMMEL-ETAMIC wavemove
for cubic workpieces
Fully automated measurement of roughness and
contour on cylinder heads and blocks
Workpiece-specific fixing device with optional
workpiece carrier detection
Various fixing devices enable flexible use for
different workpieces
Twist and tilt axis for workpiece positioning
Extensive safety devices for monitoring the
workpiece
Optional light curtain to protect operating
personnel

47

toposcan

Surface inspection system

for cylinder bores

HOMMEL-ETAMIC toposcan OR150 with mobile workstation

The toposcan is the ideal inspection system for fast,

Highlights HOMMEL-ETAMIC toposcan

precise, and reliable testing of finely machined (e.g.

Mobile use thanks to its light weight

honed) surfaces of cylinder bores during motor pro-

Ergonomic design for comfortable operation

duction as well as development and tests.

Easy adaptation to different bore diameters

High optical zoom, up to 210 times for

Optical testing of surface structure characteristics and

tactile measurement of surface roughness is carried out
using a compact measuring probe.

48

finest structures
Automatic determination of crosshatch angle

toposcan

The toposcan OR150 offers a lighting unit and a rough-

Thanks to the ergonomic design of the control ele-

ness probe for determining all relevant surface charac-

ments, operation of the toposcan system is easy and

teristics. The roughness standard allows for immediate

secure. The mobile workstation simplifies its flexible use

verification of the measuring system. The centering plate

in the production environment.

is adapted to the diameter of the cylinder bore.

HOMMEL-ETAMIC toposcan at a glance

All important functions, such as motorized axial positioning, zoom and focus setting as well as lighting

Manual radial probe positioning

Complete evaluation of the cylinder surface thanks
to optical inspection and roughness measurement

regulation, are carried out using the computer

Basic model for optical testing and advanced model
for additional tactile roughness measurement
Immediate display of the cylinder bore surface on the
computer screen

at any position
Mobile workstation for easy transport in the
production environment
For cylinder bores from 60 mm diameter

Model

Diameter*

Measurement
height

Scan-/
Roughness
Tabletop
measuring mode measurement model

Workstation
model

toposcan O150 or O210

60-110 mm

150 or
210 mm

yes

no

yes

yes

toposcan OR150 or OR210

60-110 mm

150 or
210 mm

yes

yes

yes

yes

* Further diameters on demand

49

TOPOWIN

Control and evaluation

software for toposcan

Measurement functions, main window

Main window, crosshatch angle

The user-friendly TOPOWIN software can be operated intuitively and offers a standardized interface for optical
surface inspection and roughness measurement.

Highlights HOMMEL-ETAMIC TOPOWIN

Clear, well-arranged user interface
Optical inspection with zoom microscope
High optical zoom, 30 to 210 times
Imaging of a plateau-honed surface
Display of finest structures of new surfaces
High inspection rates and user-independent results
thanks to automated measuring runs

50

Immediate display of the roughness profile and the

results of the preset characteristics
Local correlation of optical inspection and tactile
roughness measurement
Continuous development of the software in regards
to new standards

TOPOWIN

Customer
Kunde
Demo
2014
Smith Corp.

Test
Plan
Test Plan
demo
2014.rpg
motor14.rpg

Messsystem
Measuring System
HOMMEL-ETAMIC
toposcan
HOMMEL-ETAMIC toposcan

Werkstuek
Workpiece
44 Zyl
Motorblock
cylinder
motor block

Serial Number
Seriennummer
88 150
201
88
1501010
201

Workpiece
Werkstueck
Nr.
4711
4711

Order Number
Auftrag
Demo
123 4782014
001

Bediener
Operator
Gayko
Schmidt
Johnson

SW-Version
SW version
7.60
7.60
Date: 2014/04/02
02.04.2014
Date
Time: 15:47 15:47
Time

Vielen Dank fuer Ihr Interesse an unserem HOMMEL-ETAMIC toposcan

Measuring
Conditions
Messbedingungen

Results
Roughness
Evaluation
Ergebnisse
Rauheit

Results
Optical Evaluation
Ergebnisse
Optik

JENOPTIK Industrial Metrology Germany GmbH

JENOPTIK
Industrial Metrology GmbH

Results
Laser Structures
Ergebnisse

Lasertaschen
HOMMEL-ETAMIC
HOMMEL-ETAMIC
TURBO
WAVE
TURBO WAVE
V7.60 V7.60
Messbedingungen
Measuring Conditions
Taster
:
Probe:
Messbereich :
Measurig range:
Taststrecke :
Traverse length:
Lc
/ Ls:

T1E
T1E
80 m
80 m
4.80 mm
4.80 mm
300

Lc/Ls: 300

10.0

Rz
Rz
Mr1
Mr1
Mr2
Mr2
CV(70.0
CV(70,0 %) %)
Rpk
Rpk
Rk
Rk
Rvk
Rvk

7.92 m
7.92

m
%
%
0.55681m/m
0.55681
m3/m2
0.52 m
0.52 m
2.03 m
2.03 m
3.23 m
6.4 %6.4

79.3 79.3
%

3.23 m

Angle
47.40Gr
Las O O
Winkel
47.40GradLas
Radius
mm Las
Radius
1.97 1.97
mr
Las U U
Abstand
mm T-L
Distance
1.20 1.20
mr
T-L
T-AH
Flche
Surface
0.63 0.63m/U
m
T-AH
T-AV
Toleranzfeld Honwinkel ---.-Tolerance range honing angle
---.-T-AV
T-V
T-V
T-Br

mm
mm
mm
---.-----.-- mm
---.-- mm
---.----.-- mm
---.----.-- m
---.-----.----.-----.--

T-Br

profile ausgerichtet
filter ISO 11562
= 0.800
mmLc = 0.800 mm
R-R Profil
Filter Lc
ISO
11562

0.0

Alte Tuttlinger Straen 20

Mr.
Hendrik GAYKO
78056 VS-Schwenningen
Alte Tuttlinger Strasse 20
Germany
D-78056 VS-Schwenningen
Germany

---.-----.--

Phone

+49 7720 602-0

Fax +49
+49 (0)7720
7720 602-123 602 580
Tel
Fax +49 (0)7720 602 123
Internet www.jenoptik.com/metrology

---.--

web: www.jenoptik.com

Material ratio R profile

Materialanteil
R-Profil

Simple documentation

0.0
[m]
-10.0
ProbeT1E
T1E
Taster
Angle
Winkel

Lt =
mm/s mm/s
Lt
=4.80
4.80mm
mm vt =Vt0.50
= 0.50

47.40
47.40Grad

Radius
Radius

1.971.97
mm

mm

4.804.80
Distance
Abstand

The numerical and graphical output of the roughness

[m]
11.0
0%
1.20
mm mm
1.20

20%

40%

Surface
Flche

60%

80% 100%

0.630.63m/U
m/r

parameters and the profiles can be combined with the

image evaluations in one report to provide compact
and informative documentation. Documentation can

Logging

either be archived as a printout or a PDF file.

qs-STAT data export interface (optional)
The data export interface supports the Q-DAS ASCII
transfer format for the exchange of quality information
via Q-DAS software modules. Predefined parameter
sets and the possible use of predefined catalogs simplify
set-up of the data interface. The interface is certified by
Q-DAS according to AQDEF specifications (Automotive
Quality Data Exchange Format).
Laser pocket structures: measurement and evaluation of laser-structured surfaces (optional)
In combustion engines, grooves can be cut into the
upper reverse area of the piston with a laser to reduce

Roughness measurement: immediate profile display

wear rates, which creates a higher oil pressure volume

for improved lubrication of the piston rings.
This software module makes it easy to determine the
geometric dimensions of the laser pocket structures.
A measuring assistant guides the user through the
measuring process.
Automatic runs: CNC control (optional)
Automatic positioning at preselected inspection
heights, which are then used to automatically carry out
a sequence of several cross hatch angles or roughness
measurements.

Determination of laser pocket structures

51

Technical data

Technical data stationary roughness and/or contour measuring systems (pages 16 27)
Roughness measurement

Contour measurement

HOMMEL-ETAMIC

T8000 R120-400 /
T8000 R120-800

C8000-400 digital /
C8000-800 digital

T8000 C120-400 digital /

T8000 C200-800 digital

C8000-400 digiscan /
C8000-800 digiscan

T8000 C120-400 digiscan /

T8000 C200-800 digiscan

Probing system

roughness probe TKU 300/600

wavecontour digital

wavecontour digital

wavecontour digiscan

wavecontour digiscan

Measuring range
Resolution
Probe arm identification
Probe force setting
Top/bottom measurement
Measuring stroke limitation

300 m or 6005) m
1 nm or 2 nm1)

60 mm
50 nm

0 20 mN

programmable

60 mm
50 nm

0 20 mN

programmable

60 or 904) mm
50 or 754) nm
electronic, RFID
electronic
optional
programmable

60 or 904) mm
50 or 754) nm
electronic, RFID
electronic
optional
programmable

Probe arm
Stylus tip
Mounting

diamond 2 m/90
exchangeable6)

carbide 20 m
quick fastener

carbide 20 m
quick fastener

carbide 20 m
magnetic holder

carbide 20 m
magnetic holder

Traverse unit
Measuring range (traverse length)
Resolution
Measurement speed vt
Positioning speed
Straightness accuracy

120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm

120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm

120 mm / 200 mm
0.1 m / 0.01 m
0.1 3 mm/s
max. 3 mm/s / max. 9 mm/s
0.4 m/120 mm /
0.8 m/200 mm

120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm

120 mm / 200 mm
0.1 m / 0.01 m
0.1 3 mm/s
max. 3 mm/s / max. 9 mm/s
0.4 m/120 mm /
0.8 m/200 mm

Measuring column
Vertical travel
Auto-null function
Positioning repeatability
Travel spreed

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

Measuring station
Granite plate (L x W x H)
Damping
Instrument table (L x W x H)
Working table (L x W x H)

Power supply: 100-240 V AC 50/60 Hz; operating temperature: +18 to +25 C, relative humidity max. 85 %, without condensation ( T 2 C/h); storage temperature: +10 to 50 C.
1) In smallest measuring range
2) Optional passive damping or optional active level control
3) Optional instrument tables (except nanoscan) (L x W x H): GTR4 2000 x 800 x 700 mm or GTR5 2200 x 800 x 700 mm
4) 1.5 fold probe arm length
5) 2 fold probe arm length
6) Optional: magnetic holder with collision protection

Characteristics roughness measurement with EVOVIS (page 28)

Characteristic

Description

Measuring range/resolution

8 m/1 nm; 16 m/2 nm; 80 m/10 nm; 400 m/50 nm

Metric system

m/inch selectable

Filter: cut-offs

0.08/0.25/0.8/2.5/8 [mm], selectable in -2 to +1 cut-off steps; variable from 0.001 80 in 0.001 steps

EN ISO 11562, part 1

Gauss (M1) digital filter [mm], cut-offs 0.08/0.25/0.8/2.5/8

EN ISO 13565-1

2-fold Gauss (M2) Rk parameters, cut-offs 0.08/0.25/0.8/2.5/8

ISO/TS 16610-31

robust Gauss filter; cut-offs 0.08/0.25/0.8/2.5/8

ISO/TS 11610-21

linear Gauss filter

ISO/TS 16610-22

linear Spline filter

ISO 3274/11562

short-wave cut-off s, selectable in c or manually

Measurement speed vt

lt 0.05/0.15/0.5 mm/s; variable from 0.01 2 mm/s in 0.01 steps

Traverse length lt

0.48/1.5/ 4.8/15/48 mm or variable from 0.1 120/200 mm (depending on traverse unit)

Evaluation length ln

0.4/1.25/4/12.5/40 mm or variable cut-offs

Cut-off [mm]

0.08/0.25/0.8/2.5/8

Parameters EN ISO 4287:2010

- Roughness
- Profile
- Waviness

Rt, Ra, Rz, Rp, Rv, Rq, RSm, Rc, Rsk, Rku, Rq, Rmr, C(Rmr), Rmr(c), Rdc
Pt, Pa, Pz, Pp, Pv, Pq, PSm, Pc, Psk, Pku, Pq, Pmr, C(Pmr), Pmr(c), Pdc
Wt, Wa, Wz, Wp, Wv, Wq, WSm, Wc, Wsk, Wku, Wq, Wmr, C(Wmr), Wmr(c), Wdc

Core roughness parameters EN ISO 13565-2

Rpk, Rk, Rvk, Mr1, Mr2, Vo, Rpk*, Rvk*, A1, A2

Motif parameters EN ISO 12085

R, Rx, AR, Nr, W, Wx, AW, Wte, Nw

Roughness parameters JIS B-0601

Rz-JIS

Roughness parameters EN 10049

and SEP 1941

Ra, RPc
Wsa, Wca

Roughness parameters obsolete standards ISO 4287:1987, DIN 4762

Rmax, RzISO, D, a, q, L0

Roughness parameters Daimler standard MBN 31 007

R3z, Rp3z, R3zm

Waviness parameters VDA 2007 (optional)

WDSm, WDt, WDc

Twist parameters Daimler standard MBN 31 007-07 (optional)

DG, Dt, DP, DF, DFu, DLu, D

52

Technical data

Combined roughness and contour measurement

T8000 RC120-400 digital /
T8000 RC120-800 digital

T8000 RC120-400 digiscan /

T8000 RC120-800 digiscan

surfscan 120-400 /
surfscan 120-800

nanoscan 855

roughness probe TKU 300/600

wavecontour digital
R: 300 m or 600 m; C: 60 mm
R: 1 nm or 2 nm1); C: 50 nm

R: ; C: 0 20 mN

programmable

roughness probe TKU 300/600;

wavecontour digiscan
R: 300 m or 600 m; C: 60 or 904) mm
R: 1 nm or 2 nm1); C: 50 or 754) nm
R: ; C: electronic, RFID
R: ; C: electronic
optional
programmable

roughness and contour combined

6 or 125) mm
6 or 125) nm
electronic, RFID
electronic
optional
programmable

roughness and contour combined,

opto-mechanical
24 or 485) mm
0.6 or 1.25) nm
electronic, RFID
electronic
yes
programmable

R: 2 m/90; C: carbide 20 m
R: exchangeable6); C: quick fastener

R: 2 m/90; C: carbide 20 m
R: exchangeable6); C: m
agnetic holder

diamond 2 m/60; ruby ball 1 mm

magnetic holder with collision protection

diamond 2 m/60; ruby ball 1 mm; carbide 20 m

magnetic holder with collision protection

120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm

120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm

120 mm
0.1 10 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm

200 mm
0.01 m
0.1 3 mm/s
max. 9 mm/s
0.4 m/200 mm

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s

400 mm / 800 mm
in Z-, programmable
10 m
0.1 12 mm/s / 0.1 50 mm/s

550 mm
in Z+/Z-, programmable
10 m
0.1 50 mm/s

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

780 x 500 x 100 mm /

1000 x 500 x 140 mm
optional2)
optional3)

850 x 600 x 140 mm

active level control with damping function
1190 x 800 x 780 mm
810 x 800 x 780mm

Technical data surface inspection systems (pages 48 49)

HOMMEL-ETAMIC

toposcan O150 / O210

toposcan OR150 / OR210

Diameter*

60 110 mm

60 110 mm

Axial measurement height

150 / 210 mm

150 / 210 mm

Optical zoom

30 210 times (on the screen)

30 210 times (on the screen)

Test zone (approx.)

40 times: 5.1 x 3.8 mm; 100 times: 2.0 x 1.5 mm; 210 times: 0.9 x 0.7 mm

40 times: 5.1 x 3.8 mm; 100 times: 2.0 x 1.5 mm; 210 times: 0.9 x 0.7 mm

Resolution CCD camera

1360 (H) x 1024 (V)

1360 (H) x 1024 (V)

Presentation on the screen

752 (H) x 582 (V)

752 (H) x 582 (V)

Illumination

18 LEDs individually switchable; 2 channel dimmable

18 LEDs individually switchable; 2 channel dimmable

Axial position

motor-driven

motor-driven

Radial position

manual

manual

Focus adjustment

motor-driven

motor-driven

Operating modes

optical surface inspection

optical surface inspection

tactile roughness measurement

Optical evaluation

hone angle; stroke reversal radius; spaces/width of grooves; detection of

blow holes and pores; tolerance zone (angle); laser structure (optional)

hone angle; stroke reversal radius; spaces/width of grooves; detection of

blow holes and pores; tolerance zone (angle); laser structure (optional)

Roughness evaluation
Parameters EN ISO 4287
Parameters EN ISO 13565-1, -2
Parameters Motif EN ISO 12085
ASME B46
JIS B601
EN 10049
Daimler MBN 31007

Ra, Rz, Rmax, Rt, Rq, RSm, Rmr(c)[%], Rmr(c)[m], Rp

Rk, Rpk, Rvk, Mr1, Mr2, A1, A2
R, AR, Rx
Rpm
Rz-JIS
RPc
R3z

Probe

inductive skid probe T1E 5 m/90

Traverse length according to ISO/JIS

1.5/4.8/15 mm

Cut-off (ISO/JIS)

0.25/0.8/2.5 mm

Measurement speed vt

0.15/0.5/1 mm/s; return speed 3 mm/s

Logging

axial height of view; set magnification; date/time; parts identification

axial height of view; set magnification; date/time; parts identification

Dimensions (L x W x H), weight

Inspection system
Workstation

110 x 90 x 640 mm, 5.2 kg** / 110 x 90 x 760 mm, 5.4 kg**
650 x 800 x 1180, 70 kg (with PC)

110 x 90 x 640 mm, 5.5 kg** / 110 x 90 x 760 mm, 5.7 kg**
650 x 800 x 1180, 70 kg (with PC)

Power supply 100-240 V AC 50/60 Hz; power consumption 200 W; operating temperature +5 to +40 C without condensation.
* Further diameters on demand
** Including 80 mm centering plate

53

Technical data

HOMMEL-ETAMIC

W5

W10

W20

Measuring principle

profile method, calibrated

profile method, calibrated

profile method, calibrated

Total deviation as per DIN 4772

class 1

class 1

class 1

Traverse unit
Suitable probes
Tracing length
Probing direction
Probing range
Control elements

integrated into basic unit

skid probe
17 mm
axial
over 360
integrated start button

LV17
skid probe
17 mm
axial, transverse probing
over 360
integrated start button

waveline 20
skidless probe
20 mm
axial
over 360
integrated start button, inclination reference level

Probe (standard)

T1E, 2 m/90

T1E, 2 m/90

TKL 300L, 2 m/90

Measuring range/resolution

100 m/6 nm*

100 m/6 nm*

300 m/12 nm*

Traverse length lt
according to ISO/JIS
according to Motif
max.

1.5/4.8/15 mm
0.64/3.2/16 mm
17.5 mm

1.5/4.8/15 mm
0.64/3.2/16 mm
17.5 mm

1.5/4.8/15 mm
0.64/3.2/16 mm
20 mm

Cut-off according to
EN ISO 4288/JIS B601

0.25/0.8/2.5 mm

0.08/0.25/0.8/2.5/8 mm

0.08/0.25/0.8/2.5/8 mm

Sampling length lr

1 to 5 selectable

1 to n (max. traverse length)

1 to n (max. traverse length)

Filter

EN ISO 11562: Gauss filter

EN ISO 16610-21: Gauss filter
EN ISO 13565-1: filter for Rk parameters
EN ISO 3274: s filter

EN ISO 11562: Gauss filter

EN ISO 16610-21: Gauss filter
EN ISO 13565-1: filter for Rk parameters
EN ISO 3274: s filter

EN ISO 11562: Gauss filter

EN ISO 16610-21: Gauss filter
EN ISO 13565-1: filter for Rk parameters
EN ISO 3274: s filter

Measurement speed vt

0.15/0.5/1 mm/s; return speed 3 mm/s

0.15/0.5/1 mm/s; return speed 3 mm/s

0.15/0.5/1 mm/s; return speed 3 mm/s

Display

2 TFT color display

4,3 TFT color display with touchscreen function

4,3 TFT color display with touchscreen function

Roughness and profile parameters

EN ISO 4287

23 parameters
Ra, Rz, Rmax, Rt, Rq, RSm, Rmr(c)[%],
Rmr(c)[m], Rp

40 parameters
Ra, Rz, Rmax, Rt, Rq, RSm, Rc, Rp, Rv, Rsk, Rku, Rdc,
Rdq, RzISO, Rmr, Rmr(c), C(Rmr)

EN ISO 13565-1, -2
Motif EN ISO 12085
ASME B46.1
JIS B601 (2001)
EN 10049
Daimler MBN 31007
Specific parameters

Rk, Rpk, Rvk, Mr1, Mr2, A1, A2

R, AR, Rx
Rpm
Rz-JIS
RPc
R3z

Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*, Vo0.001
R, AR, Rx, CR, CF, CL, Nr
Rp, Rpm
Rz-JIS
RPc
R3z
Sealing parameter Rmr (factor*parameter)

68 parameters
Ra, Rz, Rmax, Rt, Rq, RSm, Rc, Rp, Rv, Rsk, Rku, Rdc,
Rdq, RzISO, Rmr, Rmr(c), C(Rmr), Pt, Pz, Pa, Pc, Pp,
Pv, PSm, Pq, PSk, Pku, Pdq, Pdc, Pmr, Pmr(c), C(Pmr)
Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*
R, AR, Rx, CR, CF, CL, Nr
Rp, Rpm
Rz-JIS
RPc
R3z
Sealing parameter Rmr (factor*parameter)

Waviness parameters
EN ISO 4287
Motif EN ISO 12085

Wt, Wz, Wa, Wp, Wv, WSm, Wq, WSk, Wku, Wdq, Wc
W, Wx, Aw

Battery (basic unit)

Lithium-ion battery, up to 800 measuring cycles

(no printout, lt 4.8 mm), full charge approx. 4 h

Lithium-ion battery, up to 800 measuring cycles

(no printout, lt 4.8 mm), full charge approx. 4 h

Lithium-ion battery, up to 800 measuring cycles

(no printout, lt 4.8 mm), full charge approx. 6 h

Measuring programs

7 plus 1 for system verification

7 plus 1 for system verification

Data memory (per measuring program)

max. 2000 measuring data records/parameters

and 500 profile data records

max. 2000 measuring data records/parameters

and 500 profile data records

max. 2000 measuring data records/parameters

and 500 profile data records

Interfaces

USB, Bluetooth wireless technology

USB, Bluetooth wireless technology

USB

Dimensions (L x W x H), weight

Basic unit
Traverse unit

approx. 50 x 63 x 128 mm, 270 g

integrated into basic unit

227 x 225 x 70 mm, 980 g

LV17: 151 x 50 x 55 mm, 275 g

227 x 225 x 70 mm, 1080 g

waveline 20: 245 x 54 x 75 mm, 1100 g

optional printer P5
static thermal print lines
57 0.5 mm/48 mm
= 31 mm
8 points/mm, 384 points/line
measuring conditions, parameters, roughness
profile, Abott curve
battery pack, 1500 mAh
Bluetooth wireless technology

integrated
static thermal print lines
57 0.5 mm/48 mm
= 31 mm
8 points/mm, 384 points/line
measuring conditions, parameters, roughness
profile, Abott curve, statistics
via basic unit
via basic unit

integrated
static thermal print lines
57 0.5 mm/48 mm
= 31 mm
8 points/mm, 384 points/line
measuring conditions, parameters, roughness
profile, Abott curve, statistics
via basic unit
via basic unit

Printer
Printing method
Paper/printing width
Paper roll
Resolution
Printing functions
Battery
Interfaces

Description surface standards (page 43)

Standard

Ra

Rz

Rmax

Art.no.

With DAkkSDKD calibration

Type EN
ISO 5436-1

Comments

Geometry standard nickel

Geometry standard hard RNDH1
Geometry standard hard RNDH2
Geometry standard hard RNDH3
Geometry standard hard RNDH3 for W10/W20
Geometry standard extra hard RNDX1
Geometry standard extra hard RNDX2
Geometry standard extra hard RNDX3

approx. 0.5 m
approx. 1 m
approx. 3 m
approx. 3 m
approx. 0.5 m
approx. 1 m
approx. 3 m

approx. 1.6 m
approx. 3 m
approx. 10 m
approx. 10 m
approx. 1.6 m
approx. 3 m
approx. 10 m

approx. 1.6 m
approx. 3 m
approx. 10 m
approx. 10 m
approx. 1.6 m
approx. 3 m
approx. 10 m

256 314
231 498
230 292
1006 6899
256 318
256 125
233 213

1000 7576
233 234
233 232

1000 7589
256 143
233 233

type C
type C
type C
type C
type C
type C
type C

RSm 0.1 mm
RSm 0.1 mm
RSm 0.1 mm
RSM 0.1 mm
RSm 0.1 mm
RSm 0.1 mm
RSm 0.1 mm

Geometry standard glass

Geometry standard GN DIN I
Geometry standard GN DIN II

approx. 0.3 m
approx. 0.7 m

approx. 1.1 m
approx. 2.5 m

approx. 1.15 m
approx. 2.6 m

230 744
226 251

230 832
224 935

type C
type C

RSm approx. 0.08 mm

RSm approx. 0.12 mm

Roughness standards
Roughness standard step 1
Roughness standard step 2
Roughness standard step 3
Set of roughness standards (steps 1 3)
Roughness standard super fine step 2
Roughness standard super fine step 3
Roughness standard ISO 10049, step 2
Roughness standard ISO 10049, step 3

approx. 0.2 m
approx. 0.5 m
approx. 1.5 m
approx. 0.2/0.5/1.5 m
approx. 0.05 m
approx. 0.08 m
approx. 1.25 m
approx. 1.9 m

approx. 1.5 m
approx. 3 m
approx. 8.54 m
approx. 1.5/3/8.5 m
approx. 0.3 m
approx. 0.45 m
approx. 6.1 m
approx. 9 m

approx. 2 m
approx. 4 m
approx. 9.5 m
approx. 2/4/9.5 m
approx. 0.4 m
approx. 0.6 m

1000 7524
1000 7525
1000 7526
1000 7527
1007 1807
1007 1808
1000 7486
1000 7453

type D
type D
type D
type D
type D
type D
type D
type D

Rpk, Rk, Rvk, Mr1, Mr2

Rpk, Rk, Rvk, Mr1, Mr2
Rpk, Rk, Rvk, Mr1, Mr2
Rpk, Rk, Rvk, Mr1, Mr2
Rpk, Rk, Rvk, Mr1, Mr2
Rpk, Rk, Rvk, Mr1, Mr2
RPc approx. 64 1/cm
RPc approx. 64 1/cm

Depth setting standard

Setting standard 3 grooves
Depth setting standard EN9 (groove approx. 9 m)

226 252

1000 7540
224 937

type A
type A

Pt approx. 1/4/9 m
Pt approx. 9 m

54

Power supply: 100-240 V AC 50/60 Hz; operating temperature: +5 C to +40 C, relative humidity max. 85 %, without condensation ( T 2 C/h); storage temperature: -20 C to +50 C.
* Depending on probe used

Technical data mobile roughness measuring systems (pages 6 11)

Product lines

Excellent industrial metrology

WAVELINE

Roughness and Contour Metrology

FORMLINE
Form Metrology

Mobile, manual and automated measuring instru-

Manual and CNC-controlled systems for measuring

ments for determining roughness, contour, topogra-

form, position and twist, combined form and rough-

phy and twist; combined systems for roughness and

ness instrumentation, form measurement systems for

contour measurements; optical surface inspection

cylinder bores, spindle m

easuring machines, crank

for cylinder bores and customized solutions.

shaft and cam shaft measuring machines and workpiece-specific solutions.

OPTICLINE

Optical Shaft Metrology

GAGELINE

Dimensional Metrology

Optical measuring systems for determining dimen-

Pre-process, in-process and post-process measuring

sions, form, position and geometric elements on

systems for measuring dimensions via tactile, pneu-

concentric workpieces. Can be used offline, or as an

matic or optical technologies, including manual,

automated SPC measuring station within the produc-

semi and fully automatic systems, final inspection

tion chain and as a customized solution for work-

machines and individual in-line systems, plus sys-

piece-specific requirements.

tems for optical surface inspection.

MOVOLINE
In-Process Metrology

SERVICELINE
Services Worldwide

Digital measuring heads, control devices and

Metrological services including training, application

accessories for tactile in-process measurements

studies and start-up support, relocation services,

of diameter, position and length in machine tools,

production monitoring, (remote) services and cali-

all aimed at controlling the machining process of

bration, repairs and spare parts/replacement service,

machine tools.

measuring program generation and measurement

process optimization.
55

Jenoptik Industrial Metrology Germany GmbH

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78056 VS-Schwenningen
Germany
Phone +49 7720 602-0

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Copyright JENOPTIK Industrial Metrology Germany GmbH. All rights reserved. Subject to change without notice. The photos may show options and are not legally binding.

1007 2148

05/2016

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