Bruker AXS

S2 RANGER
Spectrometry Solutions

think forward

EDXRF

S2 RANGER Leading
the performance class

Time is money!
And so as not to take up too much of your time, we have done
something slightly unusual. We have placed a short description
of users who will not purchase our system right at the beginning
of this brochure. If you nd yourself here, then we part ways now
and thank you for spending a moment.

Here is the short check:

You can stop reading if you are not interested in reliable,
stable results.
Also please lay this brochure aside if you are only interested in
investigating a single element or a single sample type, both today
and for the next ten years.
If you are merely looking for the cheapest system and you do
not care about actual operating costs, stop reading right here.
If you like working your way through fat manuals or enjoy never
ending training lessons, you can close the brochure at this point,
please.

So, youre still reading!

Excellent, then we sincerely welcome you to the performance
class. Our S2 RANGER is obviously just the right solution for you
and your demanding elemental analysis applications.

S2 RANGER with sample changer and tray for 28 samples

S2 RANGER with sample changer and tray for 28 samples

S2 RANGER with single sample loading

TouchControl

Rugged design

Industry certified

Integrated printer

Magnetic gripper

Adjustable screen

All-in-one system

XFlash detector

Fully protected

Automatic loading

Manual loading

Small sample chamber

This is how easy multielement

analysis can be.
What do you think of when you hear the term multielement
analysis? Inserting a sample into a spectrometer, moving to
the computer, programming it with a whole series of measurement conditions, and interpreting a confusing table of
numbers? If so, you are quite right with other systems,
that is how X-ray uorescence (XRF) usually works.

Say goodbye to
extensive instruction
and welcome
to TouchControl

With TouchControl XRF works better and easier by far.

Simply insert your sample, start your measurement on the
integrated touchscreen and get color-coded results.
TouchControl means no time-consuming training, no need
for fat manuals, no tangled cables, and no complicated
setups just efcient work and excellent results right away.
TouchControl is as easy as 1-2-3. Here are the three steps to
successful elemental analysis:

1.

First, insert your sample and

select the desired application.
It goes without saying that the
list of applications can be configured freely. You determine the
access rights of users to specific
applications.

2.

3.

Next, type in relevant sample

information. The name of the
sample is sufficient, but the
sample quantity or information
on the sample preparation can
be specified if you like.

Last, start the measurement

simply by touching the screen
and get your results. With a
sample changer you can
automate the analysis of
up to 28 samples.

Results

Free language selection

English, German, French,
Spanish, Portuguese,
Russian, Chinese

Tailored results for process

and quality control

The measurement results that you receive on the

touchscreen are tailored exactly to your needs. In addition
to concentrations, ratios and totals can be automatically
displayed for production control. And if quality control sets
quantitative limits for a sample, the sample status is indicated by a trafc light symbol, showing red, yellow or green.

Maximum data integrity due

to user access levels

Now you know everything you need for your daily work
with the S2 RANGER!

No training required

This is how clearly analysis results can

be presented.

1
1 Name a new standard
2 Select units ppm or %

Tailoring your own

system made easy
We have already shown you how fast and simple your
daily work can be thanks to TouchControl. But what about
calibration, the selection of measurement parameters,
analyzing standards and setting up drift corrections?
Or, to put it in different terms, how can the S2 RANGER
be adapted to special tasks? Two options: you can either
rely on us and use one of our special, ready-made application
packages, or you can create your own application.
The requirements of the cement industry, petrochemistry
and geology are each entirely different. This is precisely why
we have developed a tool of unparalleled exibility for the
creation of your own application, tailored according to your
standards: SPECTRA EDX.

Convenient
data input

Tree-guided workflow

3 Type concentrations of
standards T for trace and B
for bulk matrix

Standards

Import & export of

composition data

4 Data import and export

Definition of sample
preparation

Integrated analytical
intelligence

1 Automatically generated
measurement ranges for
different elements

Best excitation voltage

preselected
1

2 Total measurement time and

atmosphere (He, vacuum or air)

Measurement

4 Consistency check of the

measurement settings

Fixed current or fixed

count rate settings

This is how easy it can be to create

individual applications.
1 Toggle between selected
elements

Lets start with the rst step: dening the standards,

which will serve as references for the measurement.
Simply enter the names of the standards, the concentrations
of the elements and the sample quantity and preparation
parameters. The information is stored in a database and
can be reused any time.

2 X-ray intensity without

corrections

Next step: setting up the measurement. Based on your

inputs, SPECTRA EDX automatically proposes a measurement method, which already takes into account all the
information and covers the range of elements required.
You can simply adopt this method, or adapt it to your special
requirements. The process continues in the same simple
way: insert standards and start measuring.
As you have probably guessed, now comes step three:
calibrating the system. The calibration curve is calculated
for each element. Numerous tools are available even for the
most sophisticated calibrations. SPECTRA EDX can correct
matrix effects via theoretical, empirical and variable alphas.
You can modify your calibration settings whenever you like
and check the effects on the calibration curve.
Lastly, to have your application appear as a button on
the integrated touchscreen, simply give it a name.
And thats it!
8

Optimized filter settings

4 modes air, vacuum,
reduced and atmospheric He

3 Edit predefined measurement

ranges or create a new one

Step by step the SPECTRA EDX guides you to your goal:

fast, easily and reliably, like a navigation system.

Fast spreadsheet editing

State-of-the-art
fundamental parameter
evaluation

Direct correlation of
intensity vs. concentration

Calibration
Correction for line overlaps

3 Intensity with corrections

applied

Internal standard

4 Standard deviation of the

calibration in ppm

Theoretical, fixed and

variable alphas

1 Name the button for the

application

Easy TouchControl
integration

One-button methods
2 Change sample shape and
color for loader display

Application

Color-coded quality limits

3 Consistency check of the

application
4 Save and create the
touchscreen button

Variable sample preparations

Automatic module calculation

4
2

Highest excitation power in

benchtop EDXRF class

How does X-ray Fluorescence (XRF) work?

Bromine atom

Ejected electron
N
M
L
K

X-ray fluorescence K
X-ray

X-ray fluorescence K

The sample is bombarded with

X-rays. This excites the sample
to generate X-ray uorescence.
The X-rays shoot individual
electrons out of the atoms of
the elements, primarily out of
the inner atomic shells K and L.
The resulting vacancies are lled
up again by electrons from
higher energy shells. The excess
energy of these electrons is
then emitted in the form of
X-ray uorescence radiation.
This radiation is characteristic for
each element like a ngerprint
and virtually independent of
the atoms chemical bond.
The intensity of the radiation is
proportional to the concentration
of the element in the sample.

Sample
X-ray fluorescence

Filter wheel

X-ray tube, 50 W
XFlash detector
10

The S2 RANGER uses a 50 W

X-ray tube to directly excite the
X-ray uorescence in a sample.
By specifying the high voltage
and choosing a lter, an
elemental or energy range is
selected. In order to analyze
lighter elements, the sample
chamber is either evacuated by
means of an integrated vacuum
pump or it is ooded with
helium. The XFlash detects the
X-ray uorescence radiation of
the sample. The multi-channel
analyzer divides up the different
energies and accumulates
counts to form an intensity vs.
energy spectrum.

Unrivalled XFlash detector 145 eV

with 100 000 cps at Mn K
Peltier cooled SDD technology
Smallest sample chamber for
instant switch and lowest
He consumption

Not to overwhelm you with technical details or confuse you

with cryptic jargon, sufce to say that, if there were a world
champion in the category performance, functionality and
quality of results, it would be S2 RANGER!

50 watts of pure X-ray power.

Our S2 RANGER applies up to 50 watts of X-ray power
directly to the sample. This has the following advantages:
no need for moving parts such as primary optics or
monochromators,
elements at very low concentration levels are excited,
and higher intensity sets the stage for maximum precision.

Award-winning XFlash technology.

Thanks to our outstanding XFlash detector we are in a position
to fully exploit the entire output of the 50 W X-ray tube and can
convert this into stability and sensitivity.
Owing to its Silicon Drift Detector (SDD) technology, the
XFlash is empowered for maximum count rates and the best
possible energy resolution:

Energy-dispersive XRF with the S2 RANGER

X-ray

XFlash detector best

resolution and count
rate can get the most
out of 50 W power

50 W X-ray source

High count rates facilitate reliable results very fast.

High count rates minimize statistical errors and lead to very
accurate results.
Optimal energy resolution permits different elements to
be clearly separated and guarantees that even traces can
be detected alongside the main components.
Due to Peltier cooling, no liquid nitrogen is required for
cooling; this minimizes hassle and signicantly reduces
operating costs.

Reduced to the max S2 RANGER.

Award-winning XFlash technology

The small sample chamber of our S2 RANGER has three

crucial advantages:
short beam path means maximum intensity at the detector,
fast evacuation with the integrated vacuum pump ensures
high sample throughput,
and in the case of liquid samples, only the sample chamber
needs to be lled with helium, thereby cutting operating
costs.
Thats it for the technological basis of our S2 RANGER and the
secret of our success but the best is yet to come.
11

Fully equipped benchtop

analyzer with minimum
space requirements
Perfectly matching components for reliable operation
GLP/GMP compliant user
access level control
IQ/OQ procedures for norm
compliant analysis

S2 RANGER all in one

integrated PC, printer,
vacuum pump and
touchscreen monitor
Do you remember the good old days when you worked
with a "really big" spectrometer? Back then you didn't just
have a monitor, mouse and keyboard, you also had an external PC, a separate printer and a noisy vacuum pump. And as
if that werent enough, all of this had to be purchased, set
up, installed and maintained.
If you are wondering why such peripherals are missing in
our pictures of the S2 RANGER, you do not need to conjure
them up, because they are already built in: A complete PC,
touchscreen, printer and vacuum pump. Everything you
need, truly an all-in-one machine!

What are the advantages of the

all-in-one design?
Firstly, all you really need to operate the S2 RANGER is a
standard power outlet and, if necessary, helium gas for
liquid samples. This means no extra devices, no extra costs,
no extra time and effort, and no extra risk!

All-in-one design

Secondly, all the components of our S2 RANGER work

together perfectly and are well protected inside the housing.
After all, you must be able to rely 100% on your analytical
results.
To ensure your trust that the system stays that way, we
have designed the S2 RANGER as a robust standalone system. Regardless of whether it is in the laboratory, directly
next to the furnace or in a remote mine, our S2 RANGER
never lets you down.

Status display

Language selection

Thermal printer

Sample changer

Vacuum chamber

Integrated
PC

Integrated
Touchscreen

Integrated
Printer

Integrated
Vacuum System

Windows XP with
user access rights

Easy operation
no training required

Direct printout of
sample report

Integrated vacuum pump for

light elements measurement

TCP/IP interface for

network integration

Free language
selection

Customizable layout

Lowest He consumption
for liquid samples

Hard disk for secure

data storage

Database for results

Small chamber for

fast evacuation or
gas exchange

DVD writer for backup

Spectrum for
results check

Separate sample changer

for continuous loading

Status display
User management
and access levels

Although it is self-sufcient, you always have complete

control of your S2 RANGER, anywhere in the world. This is
because your S2 RANGER is fully network capable. You can
therefore access all results and system controls via the
Internet or Intranet. If need be, our service staff can
remotely check your S2 RANGER, identify problems at
an early stage and take preventive action.
12

13

Flexible multielement analysis full range of elements

measured

We have already shown you the insides of an S2 RANGER.

Now we will show you how to discover the insides of your
sample with the S2 RANGER.

S2 RANGER one for all

all kinds of samples,
all elements and
all concentrations from
ppm to 100 %
General Requirement
Advanced Requirement

The X-ray uorescence (XRF) analysis provides

very precise answers to two crucial analytical
questions: Which elements and how much
of them does your sample contain?

Qualitative identification of
elements by line position
EQUA ALL the universal
calibration for standardless
analysis
Best quantitative results with
standard based calibrations

If you have a sample of unknown composition, as a rule

you will proceed as follows with your S2 RANGER: Insert
sample, start multielement analysis and thats it! Was that
too fast for you? Ok, here it is in a little more detail.
Using the S2 RANGER the entire XRF spectrum of
the sample is measured at once. The excellent energy
resolution of the XFlash detector permits all of the elements
from sodium to uranium to be measured and clearly
separated from one another. This means that with a single
measurement you receive a reliable qualitative multielement
analysis of your sample. We now know which elements
are present in your sample, but still not the amounts.

EQUA ALL the universal calibration with

variable alphas for quantitative results.
S2 RANGER
Performance
Long term
stability
Low
detection
limit
All
concentrations
Multielement
analysis
Universal
standardless
calibration
Standard
based
calibration
Ease-of-use

14

Cement

Minerals &
Mining

Geology

Metals

Slags &
Foundry

Chemistry

Pharmaceuticals

Petrochemistry

Thanks to EQUA ALL software you can pull off the feat
of qualitative multielement analysis and, at the same time,
get quantitative results from a completely unknown sample.
EQUA ALL is the method for standardless analysis and is
included with your S2 RANGER. It comprises a unique
universal calibration created by us by means of innumerable
certied standards. The interaction of the various elements
the so-called matrix effect is corrected with the aid of
the variable alphas thus enabling the intensities to be
correlated directly with the element concentrations.
Voil: the quantitative multielement analysis of an
unknown sample has been achieved!

Top performance and long term stability with

your own calibration.
If you know exactly which element and how much of it
your sample must contain, then you require above all
maximum accuracy and maximum stability. The high
precision quantitative analysis of a sample requires rst
and foremost for the S2 RANGER to be calibrated with
standards. This is the best way to get the most out of your
system. As a result you obtain a measurement method of
your own, ready to be used on your touchscreen.

Element selection on the touchscreen

Besides individual calibration, here two good friends

guarantee success: our 50 W X-ray tube and our XFlash
detector. Their excellent performance not only brings about
unparalleled stability, it also permits reliable quantication
of the concentrations of elements down to a few ppm.

15

Prepared Samples

Analytical Results
Presentation variations

Pressing
5 min

So many samples,
so little time

As you already know, one main advantage of the XRF is that

almost all elements of the periodic table can be measured
quickly and easily in all concentrations. However, one thing
is clear:

Pressed pellets

EDXRF Spectra

Glass beads

Printout

Sample cups

Results table

Metal cuts

Lines in SPECTRA EDX

Melting
10 min

Good quality samples are the basis of good

measurement results!
This sounds reasonable but other analytical methods keep
silent on this subject. Why is that so?
Quite simply, the way to good samples is signicantly
easier, more reliable and hence considerably cheaper using
XRF analysis. The advantage of XRF over other methods is
its ability to handle a wide variety of samples, including
powders, liquids and solids. Unlike other methods, there
is no need for elaborate dilution, digestion, or enrichment,
nor must the instrument be recalibrated constantly.
Nevertheless, even for XRF samples must be selected
and prepared correctly. This begins with representative
sampling, goes through homogenization and ends with
a smooth measuring surface.

Sample preparation

Direct analysis of solids,

powders and liquids
Save method no hazardous
materials needed

Dripping
15 sec

So you can see that, unlike other methods, sample

preparation for XRF is by no means sorcery. But if you still
need a little help, we do not leave you out in the cold. We
are glad to advise you on selecting the correct equipment
and setting up sample preparation geared for your material.
Ultimately, you obtain optimal procedures that your staff can
follow and perfect results, measurement after measurement. After all this is what counts!

Polishing
1 min

Lowest cost of operation

Simple recipes for reliable
results
16

19

Fast and easy with

pressed pellets

Prepared Samples

Analytical Results
Presentation variations

Most accurate results

with glass beads
Cup loading for loose
powders and liquids

Pressing
5 min

Solids with clean and

smooth surfaces

Use weighed amount

of sample

Add grinding tablets

Mill in grinding vessel

Finished powder
material

Pour powder into

sample press

Get pressed pellet

Sample preparation
simple recipes, not
rocket science
We are by no means telling you a secret if we point out that
the most frequent form of sample preparation for XRF is the
creation of pressed pellets. The reason for this is clear, since
the method is ingeniously simple and fast: Weigh out sample material, grind and press it, and put the pressed pellet
into the S2 RANGER. To ensure that you obtain reliable and
reproducible results, all you have to do is, nd the right
recipe and then stick to it every time!

Pressed pellets

EDXRF Spectra

Glass beads

Printout

Sample cups

Results table

Metal cuts

Lines in SPECTRA EDX

Melting
10 min

Pour ux melting
agent into mortar

Weigh sample
amount

Add sample to ux
material

Mix sample and ux

Pour material into

crucible

Heat crucible in
melting furnace

Casting mold with

nished glass bead

To obtain the most accurate results for major and minor

components you can melt the powder together with a
uxing agent. After it cools down you have a glass disk of
homogeneous composition.

Dripping
15 sec
Cover bottom of liquid
cup with transparent
lm

Preparation of liquid samples is the easiest of all. For this

purpose you use a cup covered with a transparent plastic
lm. Fill the cup with the predened quantity of liquid and
then place the cup into the S2 RANGER. By the way, this
method is also ideal for loose powder.

Check for holes

Pipette sample
amount to dened
weight

Lastly, here is the preparation method for all solid samples

such as metals or ceramics: cut, mill, grind or polish anything that creates a smooth and clean sample surface is
ne. If the sample already has an appropriate surface, you
can insert and measure it.
So you can see that sample preparation for XRF analysis
is certainly not alchemy. Rather it involves following simple
recipes. For your convenience and with a little magic, it
can also be fully automated.

17

Polishing
1 min
Clamp metal cut

Check sample height

at molding cutter

Mill

Check surface

19

External cooling water

Power requirements

Automation

Network

Printer

Operation Modes

Helium flushing

Vacuum pump

Detector

Primary beam filters

X-ray tube

TouchControl

Sample changer
(optional)

Sample preparation

Sample size

Sample types

Concentration range

Elemental range

65 cm (25.4) x 80 cm (31.3) x 60 cm (23.4), 96 kg (211 lbs)

(height x width x depth, weight)

No cooling water

110/240 V, 50/60 Hz, max. consumption 1 kVA

Data exchange to LIMS possible

Built-in modem and Ethernet port

Integrated thermal printer

Vacuum for solids, helium flushing for liquids and loose powders, air ( > Ti)

Integrated extra helium supply required

Integrated

XFlash Silicon Drift Detector

Resolution <145 eV at Mn K and 100 000 cps
Peltier cooled (no need for liquid nitrogen)

9-position automatic filter changer

Pd anode
Max. power 50 W, max. voltage 50 kV, max. current 2 mA

Integrated 12 TFT touchscreen

28-position tablet
Constant loading during measurements
Up to 40 mm (1.56) and height, max. weight 200 g

Direct, sample cups, pressed pellets, and fused beads

Liquids, loose powders: up to 50 ml

Solids: 40 mm (1.56) ring for sample changer
Solids: 75 mm (3) for manual loading

Powders, solids and liquids

From ppm to 100 %

Sodium to uranium (Na-U)

Technical Data

Dimensions

Bruker AXS Inc.

Quality & safety

Bruker AXS GmbH

Madison, WI, USA

Phone +1 (800) 234-XRAY
Phone +1 (608) 276-3000
Fax
+1 (608) 276-3006
info@bruker-axs.com

DIN EN ISO 9001:2000

CE certified
Meets Safety Category No. 3 as defined by the EN954-1 standard,
and the requirements defined by the DIN 54113 standard.

www.bruker-axs.com

Karlsruhe, Germany
Phone +49 (7 21) 5 95-28 88
Fax +49 (7 21) 5 95-45 87
info@bruker-axs.de

All configurations and specifications are subject to change without notice. Order No. DOC-B80-EXS006. 2008 Bruker AXS. Printed in Germany.
www.aim.de 01832