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XRD Presentation

X-ray Diffraction (XRD) is an analytical technique used to determine crystal structure, phase identification, and crystallite size through the constructive interference of monochromatic X-rays with crystalline samples, governed by Bragg's Law. Key components of XRD instrumentation include an X-ray tube, sample holder, goniometer, detector, and software, with various scan types such as θ-2θ and Grazing Incidence XRD. While XRD is non-destructive and provides reliable quantitative analysis, it is limited to crystalline materials and may require sample preparation.

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9 views8 pages

XRD Presentation

X-ray Diffraction (XRD) is an analytical technique used to determine crystal structure, phase identification, and crystallite size through the constructive interference of monochromatic X-rays with crystalline samples, governed by Bragg's Law. Key components of XRD instrumentation include an X-ray tube, sample holder, goniometer, detector, and software, with various scan types such as θ-2θ and Grazing Incidence XRD. While XRD is non-destructive and provides reliable quantitative analysis, it is limited to crystalline materials and may require sample preparation.

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X-ray Diffraction (XRD)

• Principles, Instrumentation, and Applications


Introduction to XRD
• • XRD is a powerful analytical technique to
determine:
• - Crystal structure
• - Phase identification
• - Crystallite size
• - Lattice parameters
• • Based on constructive interference of
monochromatic X-rays and a crystalline
sample
Basic Principle of XRD
• • Governed by Bragg’s Law:
• nλ = 2d sin θ
• - n = order of diffraction
• - λ = wavelength of incident X-ray
• - d = interplanar spacing
• - θ = angle of incidence
• • Constructive interference occurs when
Bragg’s law is satisfied
XRD Instrumentation
• • Key components:
• - X-ray tube (Cu Kα most common)
• - Sample holder
• - Goniometer
• - Detector
• - Computer/software
Types of XRD Scans
• • θ-2θ Scan (most common)
• • Rocking Curve
• • Pole Figure
• • Grazing Incidence XRD (GIXRD)
Applications of XRD
• • Identification of crystalline phases
• • Determination of unit cell dimensions
• • Estimation of crystallite size and strain
• • Analysis of thin films and coatings
• • Quality control in manufacturing
Advantages and Limitations
• Advantages:
• • Non-destructive
• • Fast and reliable
• • Quantitative analysis possible

• Limitations:
• • Only crystalline materials
• • Sample preparation may be required
• • Less sensitive for amorphous phases
Conclusion
• • XRD is essential for materials
characterization
• • Provides structural, compositional, and
phase information
• • Widely used in research and industry

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