{"id":"https://openalex.org/W2074454122","doi":"https://doi.org/10.1109/cis.2014.154","title":"A Codebook Based Background Subtraction Method for Image Defects Detection","display_name":"A Codebook Based Background Subtraction Method for Image Defects Detection","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W2074454122","doi":"https://doi.org/10.1109/cis.2014.154","mag":"2074454122"},"language":"en","primary_location":{"id":"doi:10.1109/cis.2014.154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cis.2014.154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Tenth International Conference on Computational Intelligence and Security","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071971878","display_name":"Lianjun Zhang","orcid":"https://orcid.org/0009-0008-4787-5396"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lianjun Zhang","raw_affiliation_strings":["Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]},{"raw_affiliation_string":"Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102027564","display_name":"Yao Lu","orcid":"https://orcid.org/0000-0001-9004-9569"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Lu","raw_affiliation_strings":["Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]},{"raw_affiliation_string":"Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079002598","display_name":"Mukai Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mukai Chen","raw_affiliation_strings":["Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]},{"raw_affiliation_string":"Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052096691","display_name":"Wencai Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wencai Zou","raw_affiliation_strings":["Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Laboratory of Intelligent Information Technology, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]},{"raw_affiliation_string":"Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5071971878"],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.18718768,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"704","last_page":"706"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/background-subtraction","display_name":"Background subtraction","score":0.9577559232711792},{"id":"https://openalex.org/keywords/codebook","display_name":"Codebook","score":0.9480608105659485},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7918654084205627},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7201007604598999},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7133308053016663},{"id":"https://openalex.org/keywords/foreground-detection","display_name":"Foreground detection","score":0.683750331401825},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.673855185508728},{"id":"https://openalex.org/keywords/background-image","display_name":"Background image","score":0.6679680347442627},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.546924352645874},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5020270347595215},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4056926965713501}],"concepts":[{"id":"https://openalex.org/C32653426","wikidata":"https://www.wikidata.org/wiki/Q3813641","display_name":"Background subtraction","level":3,"score":0.9577559232711792},{"id":"https://openalex.org/C127759330","wikidata":"https://www.wikidata.org/wiki/Q637416","display_name":"Codebook","level":2,"score":0.9480608105659485},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7918654084205627},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7201007604598999},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7133308053016663},{"id":"https://openalex.org/C2779769447","wikidata":"https://www.wikidata.org/wiki/Q3813641","display_name":"Foreground detection","level":4,"score":0.683750331401825},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.673855185508728},{"id":"https://openalex.org/C3019635856","wikidata":"https://www.wikidata.org/wiki/Q1619726","display_name":"Background image","level":3,"score":0.6679680347442627},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.546924352645874},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5020270347595215},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4056926965713501}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cis.2014.154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cis.2014.154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 Tenth International Conference on Computational Intelligence and Security","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2092609388","https://openalex.org/W2097946161","https://openalex.org/W2098305432","https://openalex.org/W2102625004","https://openalex.org/W2109925328","https://openalex.org/W2121274305","https://openalex.org/W2125867201","https://openalex.org/W2158604775","https://openalex.org/W2160544350","https://openalex.org/W4246218351"],"related_works":["https://openalex.org/W2282723021","https://openalex.org/W2123129869","https://openalex.org/W2188430267","https://openalex.org/W4309442235","https://openalex.org/W4226212444","https://openalex.org/W3138277141","https://openalex.org/W2055234710","https://openalex.org/W2979792331","https://openalex.org/W1976932551","https://openalex.org/W1987287817"],"abstract_inverted_index":{"Detection":[0],"of":[1,32,72],"defects":[2],"in":[3,7,24,39,69,77],"printing":[4,82],"is":[5,13,75,84],"important":[6],"precise":[8],"print":[9],"industry.":[10],"The":[11,36,80],"problem":[12,31],"almost":[14],"equal":[15],"to":[16,41],"detecting":[17],"the":[18,29,43,52,89],"foreground":[19],"objectives":[20],"from":[21],"cluttered":[22],"background":[23,33,48,53,61,87],"video":[25],"surveillance.":[26],"It":[27],"has":[28],"same":[30],"minor":[34],"motions.":[35],"difficulty":[37],"lies":[38],"how":[40],"detect":[42],"unknown":[44],"flaws":[45],"under":[46],"complicated":[47],"effectively.":[49],"Inspired":[50],"by":[51],"modeling":[54,62,67],"approaches":[55],"for":[56],"moving":[57],"objects":[58],"detection,":[59],"a":[60],"method":[63,68],"based":[64],"on":[65],"Codebook":[66],"defect":[70],"detection":[71],"printed":[73],"image":[74],"suggested":[76],"this":[78],"paper.":[79],"wished":[81],"pattern":[83],"defined":[85,94],"as":[86,95],"and":[88],"exceptional":[90],"flaw":[91],"pixels":[92],"are":[93],"foreground.":[96]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}