{"id":"https://openalex.org/W3008494238","doi":"https://doi.org/10.1109/itc44170.2019.9000172","title":"Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation","display_name":"Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3008494238","doi":"https://doi.org/10.1109/itc44170.2019.9000172","mag":"3008494238"},"language":"en","primary_location":{"id":"doi:10.1109/itc44170.2019.9000172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000172","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038187283","display_name":"Mengyun Liu","orcid":"https://orcid.org/0000-0002-6476-3061"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mengyun Liu","raw_affiliation_strings":["School of Electrical and Computer Engineering, Duke University,Durham,NC,USA","School of Electrical and Computer Engineering, Duke University, Durham, NC, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Duke University,Durham,NC,USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["School of Electrical and Computer Engineering, Duke University,Durham,NC,USA","School of Electrical and Computer Engineering, Duke University, Durham, NC, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Duke University,Durham,NC,USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["School of Electrical and Computer Engineering, Duke University,Durham,NC,USA","School of Electrical and Computer Engineering, Duke University, Durham, NC, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Duke University,Durham,NC,USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014106133","display_name":"Xinli Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xinli Gu","raw_affiliation_strings":["Huawei R&D,Santa Clara,CA,USA","Huawei R&D, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Huawei R&D,Santa Clara,CA,USA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Huawei R&D, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210146936"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5038187283"],"corresponding_institution_ids":["https://openalex.org/I170897317"],"apc_list":null,"apc_paid":null,"fwci":1.545,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.8674891,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"10","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/workflow","display_name":"Workflow","score":0.729096531867981},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7087762355804443},{"id":"https://openalex.org/keywords/domain-adaptation","display_name":"Domain adaptation","score":0.7055108547210693},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6113080978393555},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5589975714683533},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5345659852027893},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5117961764335632},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.5013518333435059},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4922598898410797},{"id":"https://openalex.org/keywords/transfer-of-learning","display_name":"Transfer of learning","score":0.4855751395225525},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.48277631402015686},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4328208267688751},{"id":"https://openalex.org/keywords/domain-knowledge","display_name":"Domain knowledge","score":0.4235537350177765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18682998418807983},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.09180915355682373},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08289968967437744}],"concepts":[{"id":"https://openalex.org/C177212765","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Workflow","level":2,"score":0.729096531867981},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7087762355804443},{"id":"https://openalex.org/C2776434776","wikidata":"https://www.wikidata.org/wiki/Q19246213","display_name":"Domain adaptation","level":3,"score":0.7055108547210693},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6113080978393555},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5589975714683533},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5345659852027893},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5117961764335632},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.5013518333435059},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4922598898410797},{"id":"https://openalex.org/C150899416","wikidata":"https://www.wikidata.org/wiki/Q1820378","display_name":"Transfer of learning","level":2,"score":0.4855751395225525},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.48277631402015686},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4328208267688751},{"id":"https://openalex.org/C207685749","wikidata":"https://www.wikidata.org/wiki/Q2088941","display_name":"Domain knowledge","level":2,"score":0.4235537350177765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18682998418807983},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.09180915355682373},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08289968967437744},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc44170.2019.9000172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000172","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W169052826","https://openalex.org/W189742998","https://openalex.org/W767201593","https://openalex.org/W1544582518","https://openalex.org/W1565176903","https://openalex.org/W1834646128","https://openalex.org/W1848260265","https://openalex.org/W1988117229","https://openalex.org/W2004087388","https://openalex.org/W2006246460","https://openalex.org/W2087977130","https://openalex.org/W2114656739","https://openalex.org/W2115677675","https://openalex.org/W2119884533","https://openalex.org/W2120354757","https://openalex.org/W2132898581","https://openalex.org/W2155858138","https://openalex.org/W2165698076","https://openalex.org/W2168344315","https://openalex.org/W2170612786","https://openalex.org/W2294202617","https://openalex.org/W2295598076","https://openalex.org/W2422697180","https://openalex.org/W2524537451","https://openalex.org/W2576461191","https://openalex.org/W2740361506","https://openalex.org/W2794493912","https://openalex.org/W2907380995","https://openalex.org/W2935674075","https://openalex.org/W2949280493","https://openalex.org/W2953265577","https://openalex.org/W2962350212","https://openalex.org/W2988680766","https://openalex.org/W3007501395","https://openalex.org/W3102476541","https://openalex.org/W3146885639","https://openalex.org/W6606879723","https://openalex.org/W6607672814","https://openalex.org/W6639113993","https://openalex.org/W6679847558","https://openalex.org/W6683124652","https://openalex.org/W6684642658","https://openalex.org/W6732480270","https://openalex.org/W6765879745"],"related_works":["https://openalex.org/W3080655457","https://openalex.org/W3166286441","https://openalex.org/W3214142563","https://openalex.org/W3136267388","https://openalex.org/W3186065094","https://openalex.org/W4287263085","https://openalex.org/W3093803318","https://openalex.org/W3095487414","https://openalex.org/W3204418343","https://openalex.org/W4390401377"],"abstract_inverted_index":{"High":[0],"integration":[1],"densities":[2],"and":[3,62,105,136,145,158],"design":[4],"complexity":[5],"make":[6],"board-level":[7,70],"functional":[8,17,148],"fault":[9,149],"identification":[10,150],"extremely":[11],"difficult.":[12],"Machine-learning":[13],"techniques":[14],"can":[15],"identify":[16],"faults":[18],"with":[19,140],"high":[20,32],"accuracy,":[21],"but":[22],"they":[23],"require":[24],"a":[25,46,56,69,83,87,95,115,118,147],"large":[26],"volume":[27,156],"of":[28,40,52,59,111,176],"data":[29,61],"to":[30,77,86,99,168],"achieve":[31],"prediction":[33],"accuracy.":[34,179],"This":[35],"drawback":[36],"limits":[37],"the":[38,49,79,91,101,108,112,134,137,163,170,177],"effectiveness":[39],"traditional":[41],"machine-learning":[42],"algorithms":[43,129],"for":[44],"training":[45],"model":[47],"in":[48,90,155,162,174],"early":[50],"stage":[51],"manufacturing,":[53],"when":[54],"only":[55],"limited":[57],"amount":[58],"fail":[60],"repair":[63],"records":[64],"are":[65,166],"available.":[66],"We":[67],"propose":[68],"diagnosis":[71,178],"workflow":[72],"that":[73],"utilizes":[74],"domain":[75,120,127],"adaptation":[76,121,128],"transfer":[78],"knowledge":[80],"learned":[81],"from":[82,132],"mature":[84,135],"board":[85,89,161],"new":[88,138,160],"ramp-up":[92,164],"phase.":[93],"First,":[94],"metric":[96],"is":[97,123],"designed":[98,142],"evaluate":[100],"similarity":[102],"between":[103],"products,":[104],"based":[106],"on":[107],"calculated":[109],"value":[110],"similarity,":[113],"either":[114],"homogeneous":[116],"or":[117],"heterogeneous":[119],"algorithm":[122],"selected.":[124],"Second,":[125],"these":[126],"utilize":[130],"information":[131],"both":[133],"boards":[139,154],"carefully":[141],"domain-alignment":[143],"rules":[144],"train":[146],"classifier.":[151],"Three":[152],"complex":[153],"production":[157],"one":[159],"phase":[165],"used":[167],"validate":[169],"proposed":[171],"domain-adaptation":[172],"approach":[173],"terms":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3}],"updated_date":"2026-03-28T06:11:35.319607","created_date":"2025-10-10T00:00:00"}