{"id":"https://openalex.org/W4293256909","doi":"https://doi.org/10.1142/1390","title":"Software Reliability Modelling","display_name":"Software Reliability Modelling","publication_year":1991,"publication_date":"1991-10-01","ids":{"openalex":"https://openalex.org/W4293256909","doi":"https://doi.org/10.1142/1390"},"language":"en","primary_location":{"id":"doi:10.1142/1390","is_oa":false,"landing_page_url":"https://doi.org/10.1142/1390","pdf_url":null,"source":{"id":"https://openalex.org/S4210189942","display_name":"Series on quality, reliability and engineering statistics","issn_l":"1793-0723","issn":["1793-0723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Series on Quality, Reliability and Engineering Statistics","raw_type":"monograph"},"type":"book","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070592593","display_name":"Min Xie","orcid":"https://orcid.org/0000-0002-8500-8364"},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"Min Xie","raw_affiliation_strings":["Linkoping UniversitySweden"],"affiliations":[{"raw_affiliation_string":"Linkoping UniversitySweden","institution_ids":["https://openalex.org/I102134673"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5070592593"],"corresponding_institution_ids":["https://openalex.org/I102134673"],"apc_list":null,"apc_paid":null,"fwci":1.6027,"has_fulltext":false,"cited_by_count":350,"citation_normalized_percentile":{"value":0.8362069,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9311000108718872,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6466848850250244},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5378406047821045},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5373702049255371},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.530802309513092},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3725346326828003},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.32802703976631165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20512154698371887},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.18748152256011963},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.1423083245754242},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05453982949256897}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6466848850250244},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5378406047821045},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5373702049255371},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.530802309513092},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3725346326828003},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.32802703976631165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20512154698371887},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.18748152256011963},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1423083245754242},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05453982949256897},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1142/1390","is_oa":false,"landing_page_url":"https://doi.org/10.1142/1390","pdf_url":null,"source":{"id":"https://openalex.org/S4210189942","display_name":"Series on quality, reliability and engineering statistics","issn_l":"1793-0723","issn":["1793-0723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Series on Quality, Reliability and Engineering Statistics","raw_type":"monograph"},{"id":"pmh:oai:cds.cern.ch:231383","is_oa":false,"landing_page_url":"http://cds.cern.ch/record/231383","pdf_url":null,"source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W1607054433"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":13},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":12},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":12},{"year":2015,"cited_by_count":14},{"year":2014,"cited_by_count":25},{"year":2013,"cited_by_count":18},{"year":2012,"cited_by_count":15}],"updated_date":"2026-04-12T07:58:50.170612","created_date":"2025-10-10T00:00:00"}