{"id":"https://openalex.org/W4411050633","doi":"https://doi.org/10.1587/elex.22.20250269","title":"SiC MOSFET <i><b>V</b><sub>th</sub></i> sampling circuit design based on JEP183A","display_name":"SiC MOSFET <i><b>V</b><sub>th</sub></i> sampling circuit design based on JEP183A","publication_year":2025,"publication_date":"2025-06-05","ids":{"openalex":"https://openalex.org/W4411050633","doi":"https://doi.org/10.1587/elex.22.20250269"},"language":"en","primary_location":{"id":"doi:10.1587/elex.22.20250269","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250269","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250269/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250269/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100656829","display_name":"Tianyang Wang","orcid":"https://orcid.org/0000-0002-5973-547X"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianyang Wang","raw_affiliation_strings":["School of Automotive Engineering, Harbin Institute of Technology"],"affiliations":[{"raw_affiliation_string":"School of Automotive Engineering, Harbin Institute of Technology","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100350283","display_name":"Qi Li","orcid":"https://orcid.org/0000-0003-3768-6491"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Li","raw_affiliation_strings":["School of Automotive Engineering, Harbin Institute of Technology"],"affiliations":[{"raw_affiliation_string":"School of Automotive Engineering, Harbin Institute of Technology","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089438704","display_name":"Dafang Wang","orcid":"https://orcid.org/0000-0002-4699-8764"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dafang Wang","raw_affiliation_strings":["Qingdao Research Institute of Harbin Institute of Technology (Weihai)","School of Automotive Engineering, Harbin Institute of Technology","Qingdao Research Institute of Harbin Institute of Technology(Weihai)"],"affiliations":[{"raw_affiliation_string":"Qingdao Research Institute of Harbin Institute of Technology (Weihai)","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"School of Automotive Engineering, Harbin Institute of Technology","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Qingdao Research Institute of Harbin Institute of Technology(Weihai)","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032289362","display_name":"Bao Liu","orcid":"https://orcid.org/0000-0003-4062-4320"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bao Liu","raw_affiliation_strings":["School of Automotive Engineering, Harbin Institute of Technology"],"affiliations":[{"raw_affiliation_string":"School of Automotive Engineering, Harbin Institute of Technology","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032102087","display_name":"J.H. Zhao","orcid":"https://orcid.org/0009-0003-4283-8709"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhuan Zhao","raw_affiliation_strings":["School of Automotive Engineering, Harbin Institute of Technology"],"affiliations":[{"raw_affiliation_string":"School of Automotive Engineering, Harbin Institute of Technology","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100656829"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10286575,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"14","first_page":"20250269","last_page":"20250269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.7067999839782715,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.7067999839782715,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.696399986743927,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.6100000143051147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.584142804145813},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4195539057254791},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4144912362098694},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3657878041267395},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18067488074302673},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11494150757789612},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11396756768226624}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.584142804145813},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4195539057254791},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4144912362098694},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3657878041267395},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18067488074302673},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11494150757789612},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11396756768226624},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.22.20250269","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250269","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250269/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.22.20250269","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.22.20250269","pdf_url":"https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_22.20250269/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G948295268","display_name":null,"funder_award_id":"52072098","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335581","display_name":"Young Scientists Fund","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4411050633.pdf","grobid_xml":"https://content.openalex.org/works/W4411050633.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1582527544","https://openalex.org/W1969165531","https://openalex.org/W1994023440","https://openalex.org/W2005192532","https://openalex.org/W2061077875","https://openalex.org/W2082429731","https://openalex.org/W2307829466","https://openalex.org/W2747182495","https://openalex.org/W2969215200","https://openalex.org/W3037691531","https://openalex.org/W3083994225","https://openalex.org/W3107834609","https://openalex.org/W3117242829","https://openalex.org/W3147483666","https://openalex.org/W3166457930","https://openalex.org/W3177483120","https://openalex.org/W3203477332","https://openalex.org/W4293652760","https://openalex.org/W4376606702","https://openalex.org/W4382197014","https://openalex.org/W4391237080","https://openalex.org/W4391946932","https://openalex.org/W4393216296","https://openalex.org/W4399340507","https://openalex.org/W4404457658"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"The":[0],"threshold":[1],"voltage":[2],"(Vth)":[3],"is":[4,56,100],"a":[5,16,30,39,43],"crucial":[6],"indicator":[7],"in":[8,34,58],"determining":[9],"the":[10,13,22,53,68,72,77,83,88,96,103,113,117,144,150],"health":[11],"of":[12,15,32,91,95,105,108,131,149],"gate":[14],"power":[17],"semiconductor.":[18],"In":[19],"response":[20],"to":[21,143],"challenges":[23],"posed":[24],"by":[25],"low":[26],"measurement":[27,45],"accuracy":[28,130],"and":[29,80],"lack":[31],"standardization":[33],"SiC":[35,48,109],"MOSFET":[36,49,110],"Vth":[37,50,73,97,123,160],"test,":[38],"design":[40],"scheme":[41],"for":[42,47,71,82,159],"high-precision":[44],"circuit":[46,84,99],"based":[51],"on":[52,67],"JEP183A":[54,69,151],"standard":[55],"proposed":[57,118],"this":[59],"paper.":[60],"Firstly,":[61],"an":[62,155],"initial":[63],"analysis":[64],"was":[65],"conducted":[66],"requirements":[70],"sampling":[74,98],"circuit,":[75],"identifying":[76],"functional":[78,93],"modules":[79],"components":[81],"implementation.":[85],"Secondly,":[86],"Then":[87],"operational":[89],"principle":[90],"each":[92],"module":[94],"described.":[101],"Finally,":[102],"testing":[104],"three":[106],"sets":[107],"devices":[111],"from":[112],"same":[114],"batch":[115],"verified":[116],"circuit.":[119],"Experimental":[120],"results":[121],"demonstrate":[122],"repeatability":[124],"error":[125],"below":[126],"4.7%":[127],"with":[128],"absolute":[129],"\u00b10.01":[132],"V":[133,136],"under":[134],"3":[135],"drain-source":[137],"bias":[138],"conditions.":[139],"This":[140],"paper":[141],"contributes":[142],"first":[145],"reproducible":[146],"hardware":[147],"implementation":[148],"standard,":[152],"thus":[153],"providing":[154],"effective":[156],"test":[157],"tool":[158],"measurements.":[161]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-06-06T00:00:00"}