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TechDebt@ICSE 2023: Melbourne, Australia
- 2023 ACM/IEEE International Conference on Technical Debt (TechDebt), Melbourne, Australia, May 14-15, 2023. IEEE 2023, ISBN 979-8-3503-1194-5
- Gregory Wilder II, Riley Miyamoto, Samuel Watson, Rick Kazman, Anthony Peruma:
An Exploratory Study on the Occurrence of Self-Admitted Technical Debt in Android Apps. 1-10 - Yikun Li, Mohamed Soliman, Paris Avgeriou:
Automatically Identifying Relations Between Self-Admitted Technical Debt Across Different Sources. 11-21 - Mohammad Sadegh Sheikhaei, Yuan Tian:
Automated Self-Admitted Technical Debt Tracking at Commit-Level: A Language-independent Approach. 22-26 - Lorenz Graf-Vlachy, Stefan Wagner:
The Type to Take Out a Loan? A Study of Developer Personality and Technical Debt. 27-36 - William Aiken, Paul Kiyambu Mvula, Paula Branco, Guy-Vincent Jourdan, Mehrdad Sabetzadeh, Herna L. Viktor:
Measuring Improvement of F1-Scores in Detection of Self-Admitted Technical Debt. 37-41 - Fandi Bi, Birgit Vogel-Heuser, Fengmin Du, Nils Hanich, Ennuri Cho:
Technical Debt Contagiousness Metrics for Measurement and Prioritization in Mechatronics. 42-51 - Markus Finke, Thomas Neff, Tobias Reichl:
How to introduce TD Management into a Software Development Process - A Practical Approach. 52-61 - Wuxia Jin, Yuyun Zhang, Jiaowei Shang, Yi Hou, Ming Fan, Ting Liu:
Identifying Code Changes for Architecture Decay via a Metric Forest Structure. 62-71 - Lakmal Silva, Michael Unterkalmsteiner, Krzysztof Wnuk:
Towards identifying and minimizing customer-facing documentation debt. 72-81 - Domenico Gigante, Fabiano Pecorelli, Vita Santa Barletta, Andrea Janes, Valentina Lenarduzzi, Davide Taibi, Maria Teresa Baldassarre:
Resolving Security Issues via Quality-Oriented Refactoring: A User Study. 82-91 - Daniel Skryseth, Karthik Shivashankar, Ildikó Pilán, Antonio Martini:
Technical Debt Classification in Issue Trackers using Natural Language Processing based on Transformers. 92-101 - Nikolaos Nikolaidis, Apostolos Ampatzoglou, Alexander Chatzigeorgiou, Nikolaos Mittas, Evdokimos I. Konstantinidis, Panagiotis D. Bamidis:
Exploring the Effect of Various Maintenance Activities on the Accumulation of TD Principal. 102-111
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