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Wanli Jiang
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2020 – today
- 2024
- [c12]Trung Pham, Mehran Maghoumi, Wanli Jiang, Bala Siva Sashank Jujjavarapu, Mehdi Sajjadi, Xin Liu, Hsuan-Chu Lin, Bor-Jeng Chen, Giang Truong, Chao Fang, Junghyun Kwon, Minwoo Park:
NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self Driving. WACV 2024: 7361-7370 - 2023
- [i2]Trung Pham, Mehran Maghoumi, Wanli Jiang, Bala Siva Sashank Jujjavarapu, Mehdi Sajjadi, Xin Liu, Hsuan-Chu Lin, Bor-Jeng Chen, Giang Truong, Chao Fang, Junghyun Kwon, Minwoo Park:
NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self Driving. CoRR abs/2303.12976 (2023) - 2022
- [c11]Yichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon:
Confidence Propagation Cluster: Unleash Full Potential of Object Detectors. CVPR 2022: 1141-1151 - 2021
- [i1]Yichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon, Siyi Li:
Confidence Propagation Cluster: Unleash Full Potential of Object Detectors. CoRR abs/2112.00342 (2021) - 2020
- [j5]Aomei Li, Wanli Jiang, Po Ma, Jiahui Guo, Weihua Yuan, Dehui Dai:
A real-time matching algorithm using sparse matrix. Int. J. Grid Util. Comput. 11(1): 1-9 (2020)
2010 – 2019
- 2017
- [c10]Zhaoxuan Fan, Tianwei Lin, Xu Zhao, Wanli Jiang, Tao Xu, Ming Yang:
An Online Approach for Gesture Recognition Toward Real-World Applications. ICIG (1) 2017: 262-272 - 2016
- [c9]Wanli Jiang, Dehui Xu, Bin Xiong, Yuelin Wang, Duan Feng:
Silicon cavity resonator based on locally resonant phononic crystal. IEEE SENSORS 2016: 1-3
2000 – 2009
- 2003
- [j4]Wanli Jiang, Eric Peterson:
Performance Comparison of VLV, ULV, and ECR Tests. J. Electron. Test. 19(2): 137-147 (2003) - [c8]Wanli Jiang, Eric Peterson, Bob Robotka:
Effectiveness Improvement of ECR Tests. ITC 2003: 699-708 - 2002
- [j3]Wanli Jiang, Bapiraju Vinnakota:
Statistical threshold formulation for dynamic Idd test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 694-705 (2002) - [c7]Wanli Jiang, Eric Peterson:
Performance Comparison of VLV, ULV, and ECR Tests. VTS 2002: 31-36 - 2001
- [j2]Wanli Jiang, Bapiraju Vinnakota:
Defect-oriented test scheduling. IEEE Trans. Very Large Scale Integr. Syst. 9(3): 427-438 (2001) - [c6]Eric Peterson, Wanli Jiang:
Practical application of energy consumption ratio test. ITC 2001: 386-394 - 2000
- [j1]Wanli Jiang, Bapiraju Vinnakota:
IC test using the energy consumption ratio. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(1): 129-141 (2000)
1990 – 1999
- 1999
- [c5]Wanli Jiang, Bapiraju Vinnakota:
IC Test Using the Energy Consumption Ratio. DAC 1999: 976-981 - [c4]Wanli Jiang, Bapiraju Vinnakota:
Statistical threshold formulation for dynamic I_dd test. ITC 1999: 57-66 - [c3]Wanli Jiang, Bapiraju Vinnakota:
Defect-Oriented Test Scheduling. VTS 1999: 433-439 - 1998
- [c2]Dechang Sun, Bapiraju Vinnakota, Wanli Jiang:
Fast State Verification. DAC 1998: 619-624 - [c1]Bapiraju Vinnakota, Wanli Jiang, Dechang Sun:
Process-tolerant test with energy consumption ratio. ITC 1998: 1027-1036
Coauthor Index
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