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BibTeX records: Shi-Jie Wen
@inproceedings{DBLP:conf/irps/PieperCXDKBWFCEB24,
author = {Nicholas J. Pieper and
M. Chun and
Yoni Xiong and
H. M. Dattilo and
Jenna B. Kronenberg and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Rita Fung and
D. Chan and
C. Escobar and
Bharat L. Bhuva},
title = {Total-Ionizing Dose Damage from X-Ray {PCB} Inspection Systems},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
TX, USA, April 14-18, 2024},
pages = {1--7},
publisher = {{IEEE}},
year = {2024},
url = {https://doi.org/10.1109/IRPS48228.2024.10529337},
doi = {10.1109/IRPS48228.2024.10529337},
timestamp = {Fri, 31 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PieperCXDKBWFCEB24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OhCLWYPB23,
author = {Hyeongseok Oh and
Myungsun Chun and
Jiwon Lee and
Shi{-}Jie Wen and
Nick Yu and
Byung{-}Gun Park and
Sanghyeon Baeg},
title = {Write Recovery Time Degradation by Thermal Neutrons in {DDR4} {DRAM}
Components},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117935},
doi = {10.1109/IRPS48203.2023.10117935},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/OhCLWYPB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiongFPBNBDWWFB22,
author = {Yoni Xiong and
Alexandra Feeley and
Nicholas J. Pieper and
Dennis R. Ball and
Balaji Narasimham and
John Brockman and
N. A. Dodds and
S. A. Wender and
Shi{-}Jie Wen and
Rita Fung and
Bharat L. Bhuva},
title = {Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology
for the Terrestrial Environment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764523},
doi = {10.1109/IRPS48227.2022.9764523},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XiongFPBNBDWWFB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itsc/KangMGWD22,
author = {Zhuangwei Kang and
Ayan Mukhopadhyay and
Aniruddha Gokhale and
Shi{-}Jie Wen and
Abhishek Dubey},
title = {Traffic Anomaly Detection Via Conditional Normalizing Flow},
booktitle = {25th {IEEE} International Conference on Intelligent Transportation
Systems, {ITSC} 2022, Macau, China, October 8-12, 2022},
pages = {2563--2570},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITSC55140.2022.9922061},
doi = {10.1109/ITSC55140.2022.9922061},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itsc/KangMGWD22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2206-14597,
author = {Zhuangwei Kang and
Ayan Mukhopadhyay and
Aniruddha Gokhale and
Shi{-}Jie Wen and
Abhishek Dubey},
title = {Generative Anomaly Detection for Time Series Datasets},
journal = {CoRR},
volume = {abs/2206.14597},
year = {2022},
url = {https://doi.org/10.48550/arXiv.2206.14597},
doi = {10.48550/ARXIV.2206.14597},
eprinttype = {arXiv},
eprint = {2206.14597},
timestamp = {Mon, 04 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-2206-14597.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/access/YunPBBW21,
author = {Donghyuk Yun and
Myungsang Park and
GeunYong Bak and
Sanghyeon Baeg and
Shi{-}Jie Wen},
title = {Exploitations of Multiple Rows Hammering and Retention Time Interactions
in {DRAM} Using X-Ray Radiation},
journal = {{IEEE} Access},
volume = {9},
pages = {137514--137523},
year = {2021},
url = {https://doi.org/10.1109/ACCESS.2021.3117601},
doi = {10.1109/ACCESS.2021.3117601},
timestamp = {Wed, 03 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/access/YunPBBW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/percom/BasakSWD21,
author = {Sanchita Basak and
Saptarshi Sengupta and
Shi{-}Jie Wen and
Abhishek Dubey},
title = {Spatio-temporal {AI} inference engine for estimating hard disk reliability},
journal = {Pervasive Mob. Comput.},
volume = {70},
pages = {101283},
year = {2021},
url = {https://doi.org/10.1016/j.pmcj.2020.101283},
doi = {10.1016/J.PMCJ.2020.101283},
timestamp = {Mon, 03 Mar 2025 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/percom/BasakSWD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiongFMBWF21,
author = {Yoni Xiong and
Alexandra Feeley and
Lloyd W. Massengill and
Bharat L. Bhuva and
Shi{-}Jie Wen and
Rita Fung},
title = {Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors
at the 7-nm Node},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405128},
doi = {10.1109/IRPS46558.2021.9405128},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XiongFMBWF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CaoXWFNMB20,
author = {Jingchen Cao and
Lyuan Xu and
Shi{-}Jie Wen and
Rita Fung and
Balaji Narasimham and
Lloyd W. Massengill and
Bharat L. Bhuva},
title = {Temperature Dependence of Single-Event Transient Pulse Widths for
7-nm Bulk FinFET Technology},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9129254},
doi = {10.1109/IRPS45951.2020.9129254},
timestamp = {Wed, 20 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/CaoXWFNMB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GoloubevWARBGT20,
author = {Dmitry Goloubev and
Shi{-}Jie Wen and
Donald Allen and
Ranjani Ram and
Firdous Bano and
Nithin Guruswamy and
James Turman},
title = {Use of Silicon-based Sensors for System Reliability Prediction},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128945},
doi = {10.1109/IRPS45951.2020.9128945},
timestamp = {Wed, 20 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/GoloubevWARBGT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KellerAWWFC20,
author = {Andrew M. Keller and
Jared Anderson and
Michael J. Wirthlin and
Shi{-}Jie Wen and
Rita Fung and
Conner Chambers},
title = {Using Partial Duplication With Compare to Detect Radiation-Induced
Failure in a Commercial FPGA-Based Networking System},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128839},
doi = {10.1109/IRPS45951.2020.9128839},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KellerAWWFC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XuCBCFWFB20,
author = {Lyuan Xu and
Jingchen Cao and
John Brockman and
Carlo Cazzaniga and
Christopher Frost and
Shi{-}Jie Wen and
Rita Fung and
Bharat L. Bhuva},
title = {Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128360},
doi = {10.1109/IRPS45951.2020.9128360},
timestamp = {Thu, 21 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/XuCBCFWFB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XuCWFMBB20,
author = {Lyuan Xu and
Jingchen Cao and
Shi{-}Jie Wen and
Rita Fung and
Jamie Markevitch and
Dennis R. Ball and
Bharat L. Bhuva},
title = {High-Current State triggered by Operating-Frequency Change},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--4},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128948},
doi = {10.1109/IRPS45951.2020.9128948},
timestamp = {Wed, 20 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/XuCWFMBB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/KunduLWWK19,
author = {Somnath Kundu and
Muqing Liu and
Shi{-}Jie Wen and
Richard Wong and
Chris H. Kim},
title = {A Fully Integrated Digital {LDO} With Built-In Adaptive Sampling and
Active Voltage Positioning Using a Beat-Frequency Quantizer},
journal = {{IEEE} J. Solid State Circuits},
volume = {54},
number = {1},
pages = {109--120},
year = {2019},
url = {https://doi.org/10.1109/JSSC.2018.2870558},
doi = {10.1109/JSSC.2018.2870558},
timestamp = {Thu, 30 Apr 2026 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jssc/KunduLWWK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CaoXBWWNM19,
author = {Jingchen Cao and
Lyuan Xu and
Bharat L. Bhuva and
Shi{-}Jie Wen and
Richard Wong and
Balaji Narasimham and
Lloyd W. Massengill},
title = {Alpha Particle Soft-Error Rates for {D-FF} Designs in 16-Nm and 7-Nm
Bulk FinFET Technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--5},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720556},
doi = {10.1109/IRPS.2019.8720556},
timestamp = {Wed, 21 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CaoXBWWNM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XuCBCWWM19,
author = {Lyuan Xu and
Jingchen Cao and
Bharat L. Bhuva and
Indranil Chatterjee and
Shi{-}Jie Wen and
Richard Wong and
Lloyd W. Massengill},
title = {Single-Event Upset Responses of Dual- and Triple-Well {D} Flip-Flop
Designs in 7-nm Bulk FinFET Technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--5},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720514},
doi = {10.1109/IRPS.2019.8720514},
timestamp = {Wed, 21 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XuCBCWWM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimPBYPBWW18,
author = {Chul Seung Lim and
Kyungbae Park and
GeunYong Bak and
Donghyuk Yun and
Myungsang Park and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Study of proton radiation effect to row hammer fault in {DDR4} SDRAMs},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {85--90},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.018},
doi = {10.1016/J.MICROREL.2017.11.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimPBYPBWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiCNCWLCKSGBWW18,
author = {Yuanqing Li and
Li Chen and
Issam Nofal and
Mo Chen and
Haibin Wang and
Rui Liu and
Qingyu Chen and
Milos Krstic and
Shuting Shi and
Gang Guo and
Sang H. Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Modeling and analysis of single-event transient sensitivity of a 65{\unicode{8239}}nm
clock tree},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {24--32},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.016},
doi = {10.1016/J.MICROREL.2018.05.016},
timestamp = {Sun, 17 Aug 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LezonWDWB18,
author = {Kurt J. Lezon and
Shi{-}Jie Wen and
Y.{-}F. Dan and
Richard Wong and
Bharat L. Bhuva},
title = {Single-event effects on optical transceiver},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353693},
doi = {10.1109/IRPS.2018.8353693},
timestamp = {Wed, 21 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LezonWDWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isscc/KunduLWWK18,
author = {Somnath Kundu and
Muqing Liu and
Richard Wong and
Shi{-}Jie Wen and
Chris H. Kim},
title = {A fully integrated 40pF output capacitor beat-frequency-quantizer-based
digital {LDO} with built-in adaptive sampling and active voltage positioning},
booktitle = {2018 {IEEE} International Solid-State Circuits Conference, {ISSCC}
2018, San Francisco, CA, USA, February 11-15, 2018},
pages = {308--310},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ISSCC.2018.8310307},
doi = {10.1109/ISSCC.2018.8310307},
timestamp = {Thu, 30 Apr 2026 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isscc/KunduLWWK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeBHW17,
author = {Hosung Lee and
Sanghyeon Baeg and
Nelson Hua and
Shi{-}Jie Wen},
title = {Temporal and frequency characteristic analysis of margin-related failures
caused by an intermittent nano-scale fracture of the solder ball in
a {BGA} package device},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {88--99},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.010},
doi = {10.1016/J.MICROREL.2016.12.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeBHW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/asicon/LuoEWWC17,
author = {Yi Luo and
Adrian Evans and
Shi{-}Jie Wen and
Rick Wong and
GengSheng Chen},
editor = {Yajie Qin and
Zhiliang Hong and
Ting{-}Ao Tang},
title = {{IZIP:} In-place zero overhead interconnect protection via {PIP} redundancy},
booktitle = {12th {IEEE} International Conference on ASIC, {ASICON} 2017, Guiyang,
China, October 25-28, 2017},
pages = {565--568},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ASICON.2017.8252538},
doi = {10.1109/ASICON.2017.8252538},
timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
biburl = {https://dblp.org/rec/conf/asicon/LuoEWWC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
author = {Issam Nofal and
Adrian Evans and
Anlin He and
Gang Guo and
Yuanqing Li and
Li Chen and
Rui Liu and
Haibin Wang and
Mo Chen and
Sang H. Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {{BPPT} - Bulk potential protection technique for hardened sequentials},
booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
pages = {28--32},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/IOLTS.2017.8046194},
doi = {10.1109/IOLTS.2017.8046194},
timestamp = {Sun, 17 Aug 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/KhanWB16,
author = {Saqib A. Khan and
Shi{-}Jie Wen and
Sanghyeon Baeg},
title = {Assessing alpha-particle-induced {SEU} sensitivity of flip-chip bonded
{SRAM} using high energy irradiation},
journal = {{IEICE} Electron. Express},
volume = {13},
number = {17},
pages = {20160627},
year = {2016},
url = {https://doi.org/10.1587/elex.13.20160627},
doi = {10.1587/ELEX.13.20160627},
timestamp = {Fri, 12 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieiceee/KhanWB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/KhanWB16a,
author = {Saqib A. Khan and
Shi{-}Jie Wen and
Sanghyeon Baeg},
title = {Erratum: Assessing alpha-particle-induced {SEU} sensitivity of flip-chip
bonded {SRAM} using high energy irradiation {[IEICE} Electronics Express
Vol. 13 {(2016)} No. 17 pp. 20160627]},
journal = {{IEICE} Electron. Express},
volume = {13},
number = {19},
pages = {20168001},
year = {2016},
url = {https://doi.org/10.1587/elex.13.20168001},
doi = {10.1587/ELEX.13.20168001},
timestamp = {Fri, 12 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieiceee/KhanWB16a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/WangEWWC15,
author = {Sheng Wang and
Adrian Evans and
Shi{-}Jie Wen and
Rick Wong and
GengSheng Chen},
title = {New insights into the impact of SEUs in {FPGA} CRAMs},
journal = {{IEICE} Electron. Express},
volume = {12},
number = {6},
pages = {20150110},
year = {2015},
url = {https://doi.org/10.1587/elex.12.20150110},
doi = {10.1587/ELEX.12.20150110},
timestamp = {Fri, 12 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieiceee/WangEWWC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BakLLPBWWS15,
author = {GeunYong Bak and
Soonyoung Lee and
Hosung Lee and
Kyungbae Park and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong and
Charlie Slayman},
title = {Logic soft error study with 800-MHz {DDR3} SDRAMs in 3x nm using proton
and neutron beams},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112832},
doi = {10.1109/IRPS.2015.7112832},
timestamp = {Tue, 24 Mar 2026 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/BakLLPBWWS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MahatmeBGAXMVNS15,
author = {Nihaar N. Mahatme and
Bharat L. Bhuva and
Nelson J. Gaspard and
T. Assis and
Y. Xu and
P. Marcoux and
M. Vilchis and
Balaji Narasimham and
A. Shih and
Shi{-}Jie Wen and
Rick Wong and
N. Tam and
M. Shroff and
S. Koyoma and
A. Oates},
title = {Terrestrial {SER} characterization for nanoscale technologies: {A}
comparative study},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112731},
doi = {10.1109/IRPS.2015.7112731},
timestamp = {Sun, 21 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MahatmeBGAXMVNS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiuEWLCWWF15,
author = {Rui Liu and
Adrian Evans and
Qiong Wu and
Yuanqing Li and
Li Chen and
Shi{-}Jie Wen and
Rick Wong and
Rita Fung},
title = {Analysis of advanced circuits for {SET} measurement},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {7},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112827},
doi = {10.1109/IRPS.2015.7112827},
timestamp = {Wed, 26 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LiuEWLCWWF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenHSGCWWVB14,
author = {Yi Ren and
Anlin He and
Shuting Shi and
Gang Guo and
Li Chen and
Shi{-}Jie Wen and
Richard Wong and
N. W. van Vonno and
Bharat L. Bhuva},
title = {Single-Event Transient Measurements on a {DC/DC} Pulse Width Modulator
Using Heavy Ion, Proton, and Pulsed Laser},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {149--154},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5431-7},
doi = {10.1007/S10836-013-5431-7},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenHSGCWWVB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangLCLBWWFB14,
author = {Haibin Wang and
Mulong Li and
Li Chen and
Rui Liu and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong and
Rita Fung and
Jinshun Bi},
title = {Single Event Resilient Dynamic Logic Designs},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {751--761},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5492-2},
doi = {10.1007/S10836-014-5492-2},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WangLCLBWWFB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiaoFW14,
author = {Jiajia Jiao and
Yuzhuo Fu and
Shi{-}Jie Wen},
title = {Accelerated assessment of fine-grain {AVF} in NoC using a Multi-Cell
Upsets considered fault injection},
journal = {Microelectron. Reliab.},
volume = {54},
number = {11},
pages = {2629--2640},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.06.008},
doi = {10.1016/J.MICROREL.2014.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiaoFW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/XieCLEAWW14,
author = {Hao Xie and
Li Chen and
Rui Liu and
Adrian Evans and
Dan Alexandrescu and
Shi{-}Jie Wen and
Rick Wong},
title = {New approaches for synthesis of redundant combinatorial logic for
selective fault tolerance},
booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
pages = {62--68},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IOLTS.2014.6873673},
doi = {10.1109/IOLTS.2014.6873673},
timestamp = {Wed, 26 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/XieCLEAWW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangRCGWHBWS13,
author = {Zhichao Zhang and
Yi Ren and
Li Chen and
Nelson J. Gaspard and
Arthur F. Witulski and
W. Timothy Holman and
Bharat L. Bhuva and
Shi{-}Jie Wen and
Ramaswami Sammynaiken},
title = {A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event
Transients},
journal = {J. Electron. Test.},
volume = {29},
number = {2},
pages = {249--253},
year = {2013},
url = {https://doi.org/10.1007/s10836-013-5364-1},
doi = {10.1007/S10836-013-5364-1},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangRCGWHBWS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenSCWGGWWV13,
author = {Yi Ren and
Shuting Shi and
Li Chen and
Haibin Wang and
L.{-}J. Gao and
Gang Guo and
Shi{-}Jie Wen and
Richard Wong and
N. W. van Vonno},
title = {Correlation of Heavy-Ion and Laser Testing on a {DC/DC} {PWM} Controller},
journal = {J. Electron. Test.},
volume = {29},
number = {4},
pages = {609--616},
year = {2013},
url = {https://doi.org/10.1007/s10836-013-5379-7},
doi = {10.1007/S10836-013-5379-7},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenSCWGGWWV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/MaestroRBWW13,
author = {Juan Antonio Maestro and
Pedro Reviriego and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Soft error tolerant Content Addressable Memories (CAMs) using error
detection codes and duplication},
journal = {Microprocess. Microsystems},
volume = {37},
number = {8-D},
pages = {1103--1107},
year = {2013},
url = {https://doi.org/10.1016/j.micpro.2013.10.003},
doi = {10.1016/J.MICPRO.2013.10.003},
timestamp = {Sat, 31 May 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mam/MaestroRBWW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/asicon/WongFW13,
author = {Richard Wong and
Rita Fung and
Shi{-}Jie Wen},
title = {Networking industry trends in {ESD} protection for high speed IOs},
booktitle = {{IEEE} 10th International Conference on ASIC, {ASICON} 2013, Shenzhen,
China, October 28-31, 2013},
pages = {1--4},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ASICON.2013.6811955},
doi = {10.1109/ASICON.2013.6811955},
timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
biburl = {https://dblp.org/rec/conf/asicon/WongFW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/PontarelliOEW13,
author = {Salvatore Pontarelli and
Marco Ottavi and
Adrian Evans and
Shi{-}Jie Wen},
editor = {Enrico Macii},
title = {Error detection in ternary CAMs using bloom filters},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {1474--1479},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.300},
doi = {10.7873/DATE.2013.300},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/PontarelliOEW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpga/WirthlinJWHWW13,
author = {Michael J. Wirthlin and
Joshua E. Jensen and
Alex Wilson and
William Howes and
Shi{-}Jie Wen and
Rick Wong},
editor = {Brad L. Hutchings and
Vaughn Betz},
title = {Placement of repair circuits for in-field {FPGA} repair},
booktitle = {The 2013 {ACM/SIGDA} International Symposium on Field Programmable
Gate Arrays, {FPGA} '13, Monterey, CA, USA, February 11-13, 2013},
pages = {115--124},
publisher = {{ACM}},
year = {2013},
url = {https://doi.org/10.1145/2435264.2435286},
doi = {10.1145/2435264.2435286},
timestamp = {Sun, 19 Jan 2025 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fpga/WirthlinJWHWW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/EvansNWA13,
author = {Adrian Evans and
Michael Nicolaidis and
Shi{-}Jie Wen and
Thiago Asis},
title = {Clustering techniques and statistical fault injection for selective
mitigation of SEUs in flip-flops},
booktitle = {International Symposium on Quality Electronic Design, {ISQED} 2013,
Santa Clara, CA, USA, March 4-6, 2013},
pages = {727--732},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ISQED.2013.6523691},
doi = {10.1109/ISQED.2013.6523691},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/EvansNWA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/prdc/XieCEWW13,
author = {Hao Xie and
Li Chen and
Adrian Evans and
Shi{-}Jie Wen and
Rick Wong},
title = {Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance},
booktitle = {{IEEE} 19th Pacific Rim International Symposium on Dependable Computing,
{PRDC} 2013, Vancouver, BC, Canada, December 2-4, 2013},
pages = {128--129},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/PRDC.2013.26},
doi = {10.1109/PRDC.2013.26},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/prdc/XieCEWW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenFCWWVWB12,
author = {Yi Ren and
L. Fan and
Li Chen and
Shi{-}Jie Wen and
Richard Wong and
N. W. van Vonno and
Arthur F. Witulski and
Bharat L. Bhuva},
title = {Single-Event Effects Analysis of a Pulse Width Modulator {IC} in a
{DC/DC} Converter},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {877--883},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5338-8},
doi = {10.1007/S10836-012-5338-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenFCWWVWB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/RennieLSBJWW12,
author = {David Rennie and
David Li and
Manoj Sachdev and
Bharat L. Bhuva and
Srikanth Jagannathan and
Shi{-}Jie Wen and
Richard Wong},
title = {Performance, Metastability, and Soft-Error Robustness Trade-offs for
Flip-Flops in 40 nm {CMOS}},
journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
volume = {59-I},
number = {8},
pages = {1626--1634},
year = {2012},
url = {https://doi.org/10.1109/TCSI.2012.2206505},
doi = {10.1109/TCSI.2012.2206505},
timestamp = {Tue, 26 Aug 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcas/RennieLSBJWW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpt/LeeCJSWWH12,
author = {Ju{-}Yueh Lee and
Cheng{-}Ru Chang and
Naifeng Jing and
Juexiao Su and
Shi{-}Jie Wen and
Rick Wong and
Lei He},
title = {Heterogeneous configuration memory scrubbing for soft error mitigation
in FPGAs},
booktitle = {2012 International Conference on Field-Programmable Technology, {FPT}
2012, Seoul, Korea (South), December 10-12, 2012},
pages = {23--28},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/FPT.2012.6412105},
doi = {10.1109/FPT.2012.6412105},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/fpt/LeeCJSWWH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/EvansNWAC12,
author = {Adrian Evans and
Michael Nicolaidis and
Shi{-}Jie Wen and
Dan Alexandrescu and
Enrico Costenaro},
title = {{RIIF} - Reliability information interchange format},
booktitle = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
Sitges, Spain, June 27-29, 2012},
pages = {103--108},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/IOLTS.2012.6313849},
doi = {10.1109/IOLTS.2012.6313849},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/EvansNWAC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/LiuWZFWLTFZWW11,
author = {Jian Liu and
Xin Wang and
Hui Zhao and
Qiang Fang and
Albert Z. Wang and
Lin Lin and
He Tang and
Siqiang Fan and
Bin Zhao and
Shi{-}Jie Wen and
Richard Wong},
title = {Design and Analysis of Low-Voltage Low-Parasitic {ESD} Protection
for {RF} ICs in {CMOS}},
journal = {{IEEE} J. Solid State Circuits},
volume = {46},
number = {5},
pages = {1100--1110},
year = {2011},
url = {https://doi.org/10.1109/JSSC.2011.2118290},
doi = {10.1109/JSSC.2011.2118290},
timestamp = {Tue, 11 Nov 2025 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/jssc/LiuWZFWLTFZWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/MaestroRBWW11,
author = {Juan Antonio Maestro and
Pedro Reviriego and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Mitigating the effects of large multiple cell upsets (MCUs) in memories},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {16},
number = {4},
pages = {45:1--45:10},
year = {2011},
url = {https://doi.org/10.1145/2003695.2003705},
doi = {10.1145/2003695.2003705},
timestamp = {Sat, 31 May 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/todaes/MaestroRBWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/RennieLSBJWW11,
author = {David Rennie and
David Li and
Manoj Sachdev and
Bharat L. Bhuva and
Srikanth Jagannathan and
Shi{-}Jie Wen and
Rick Wong},
editor = {Rakesh Patel and
Tom Andre and
Aurangzeb Khan},
title = {Performance, metastability and soft-error robustness tradeoffs for
flip-flops in 40nm {CMOS}},
booktitle = {2011 {IEEE} Custom Integrated Circuits Conference, {CICC} 2011, San
Jose, CA, USA, Sept. 19-21, 2011},
pages = {1--4},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/CICC.2011.6055415},
doi = {10.1109/CICC.2011.6055415},
timestamp = {Tue, 26 Aug 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/cicc/RennieLSBJWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GhahroodiZWW11,
author = {Massoud Mokhtarpour Ghahroodi and
Mark Zwolinski and
Rick Wong and
Shi{-}Jie Wen},
title = {Timing Vulnerability Factors of Ultra Deep-sub-micron {CMOS}},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {202},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.40},
doi = {10.1109/ETS.2011.40},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/GhahroodiZWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/JingLFHMWWH11,
author = {Naifeng Jing and
Ju{-}Yueh Lee and
Zhe Feng and
Weifeng He and
Zhigang Mao and
Shi{-}Jie Wen and
Rick Wong and
Lei He},
title = {Quantitative {SEU} Fault Evaluation for SRAM-Based {FPGA} Architectures
and Synthesis Algorithms},
booktitle = {International Conference on Field Programmable Logic and Applications,
{FPL} 2011, September 5-7, Chania, Crete, Greece},
pages = {282--285},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/FPL.2011.57},
doi = {10.1109/FPL.2011.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fpl/JingLFHMWWH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/JungBWW11,
author = {Changmin Jung and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Design method of NOR-type comparison circuit in {CAM} with ground
bounce noise considerations},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic
Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011},
pages = {390--397},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ISQED.2011.5770756},
doi = {10.1109/ISQED.2011.5770756},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/JungBWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/BaegWW10,
author = {Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Minimizing Soft Errors in {TCAM} Devices: {A} Probabilistic Approach
to Determining Scrubbing Intervals},
journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
volume = {57-I},
number = {4},
pages = {814--822},
year = {2010},
url = {https://doi.org/10.1109/TCSI.2009.2025856},
doi = {10.1109/TCSI.2009.2025856},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcas/BaegWW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/WenAP08,
author = {Shi{-}Jie Wen and
Dan Alexandrescu and
Renaud Perez},
title = {A Systematical Method of Quantifying {SEU} {FIT}},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.62},
doi = {10.1109/IOLTS.2008.62},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/WenAP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/LeroyGSBWW08,
author = {Damien Leroy and
R{\'{e}}mi Gaillard and
Erwin Sch{\"{a}}fer and
Cyrille Beltrando and
Shi{-}Jie Wen and
Richard Wong},
title = {Variation of {SRAM} Alpha-Induced Soft Error Rate with Technology
Node},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {253--257},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.38},
doi = {10.1109/IOLTS.2008.38},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/LeroyGSBWW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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