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Chanmin Su
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2020 – today
- 2024
- [j4]Shenghang Zhai
, Jialin Shi
High-Speed Near-Surface Tracking for Fast Atomic Force Microscope Scan Switching Based on the Squeeze Film Damping Effect. IEEE Trans. Ind. Electron. 71(2): 2060-2069 (2024) - [j3]Shenghang Zhai
AFM Vibration Noise Reduction via Squeeze-Film-Damping-Effect Sensing Method. IEEE Trans. Instrum. Meas. 73: 1-11 (2024) - 2023
- [j2]Huiyao Shi
Spatial Vibration and Displacement Measurement Through Single-Point Continuous and Interval Scanning Laser Doppler Vibrometer. IEEE Trans. Instrum. Meas. 72: 1-11 (2023) - [j1]Shenghang Zhai
Noncontact Subnanometer Resolution Displacement Sensing With Wide Bandwidth Based on Squeeze Film Damping Effect. IEEE Trans. Instrum. Meas. 72: 1-11 (2023) - 2022
- [c10]Si Tang, Jialin Shi, Huiyao Shi, Kaixuan Wang, Chanmin Su, Lianqing Liu:
Non-destructive Two-Dimensional Motion Measurement of Cardiomyocytes Based on Hough Transform. ICIRA (2) 2022: 559-567 - [c9]Huiyao Shi, Jialin Shi, Kaixuan Wang, Si Tang, Chanmin Su, Lianqing Liu:
Theoretical Calculation and Analysis of Microdroplet Evaporation on Micropipette Force Sensor. ICIRA (4) 2022: 617-625 - 2021
- [c8]Si Tang, Jialin Shi, Huiyao Shi, Peng Yu, Chanmin Su, Lianqing Liu
Micro-nano Scale Longitudinal Displacement Measurement of Microspheres Based on Digital Holography. ICIRA (2) 2021: 283-291
2010 – 2019
- 2019
- [c7]Jingren Wang, Qingze Zou, Chanmin Su:
Rapid Broadband Discrete Nanomechanical Mapping on Atomic Force Microscope. ACC 2019: 2227-2232 - [c6]Tianwei Li, Qingze Zou, Jonathan Singer, Chanmin Su:
Adaptive Simultaneous Topography and Broadband Nanomechanical Mapping of Heterogeneous Materials on Atomic Force Microscope. ACC 2019: 3129-3134
2000 – 2009
- 2009
- [c5]Ruiguo Yang
Motion controller for the Atomic Force Microscopy based nanomanipulation system. IROS 2009: 1339-1344 - 2008
- [c4]Ying Wu, Qingze Zou, Chanmin Su:
A current cycle feedback iterative learning control approach to AFM imaging. ACC 2008: 2040-2045 - [c3]Sergey Belikov, Jian Shi, Chanmin Su:
AFM image based pattern detection for adaptive drift compensation and positioning at the nanometer scale. ACC 2008: 2046-2051 - 2007
- [c2]Kyong-Soo Kim, Qingze Zou, Chanmin Su:
Iteration-based Scan-Trajectory Design and Control with Output-Oscillation Minimization: Atomic Force Microscope Example. ACC 2007: 4227-4233 - 2006
- [c1]Jiangbo Zhang, Ning Xi, Guangyong Li
Atomic Force Microscopy Sensing Using Multiple Modes. IROS 2006: 3928-3933
Coauthor Index
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