IoT: Source of test challenges - Erik Jan Marinissen; Yervant Zorian; Mario Konijnenburg; Chih-Tsun Huang; Ping-Hsuan Hsieh; Peter Cockburn; Jeroen Delvaux; Vladimir Rozic; Bohan Yang; Dave Singelée; Ingrid Verbauwhede; Cedric Mayor; et al. (21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016, 2016)