SeFAR: Semi-supervised Fine-grained Action Recognition with Temporal Perturbation and Learning Stabilization. - Huang, Yongle; Chen, Haodong; Xu, Zhenbang; Jia, Zihan; Sun, Haozhou; Shao, Dian (CoRR, 2025)

GaussianVTON: 3D Human Virtual Try-ON via Multi-Stage Gaussian Splatting Editing with Image Prompting. - Chen, Haodong; Huang, Yongle; Huang, Haojian; Ge, Xiangsheng; Shao, Dian (CoRR, 2024)

Characterization on the thermal field inside IGBT cells during switching based on TCAD modeling and Thermoreflectance imaging. - Ma, Xiao; Huang, Yongle; Xiao, Fei; Luo, Yifei; Han, Tongyao (Microelectron. J., 2023)

Fatigue Mechanism of Die-Attach Joints in IGBTs Under Low-Amplitude Temperature Swings Based on 3D Electro-Thermal-Mechanical FE Simulations. - Huang, Yongle; Deng, Hongfei; Luo, Yifei; Xiao, Fei; Liu, Binli; Tang, Xin (IEEE Trans. Ind. Electron., 2021)

Temperature monitoring inside IGBT modules at forward bias from the cross section and its finite element analysis. - Huang, Yongle; Luo, Yifei; Xiao, Fei; Liu, Binli (Microelectron. Reliab., 2018)