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Norhayati Soin
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2020 – today
- 2020
- [j11]Badariah Bais
, Norliana Yusof
Development and Characterization of Freestanding Poly (Methyl Methacrylate)/Monolayer Graphene Membrane. IEEE Access 8: 29702-29710 (2020) - [j10]Maizan Muhamad
On Wafer Noise Figure De-Embedding Method for CMOS Differential LNA. IEICE Trans. Electron. 103-C(7): 335-340 (2020)
2010 – 2019
- 2019
- [j9]Li-Ya Ma
Comprehensive Study on RF-MEMS Switches Used for 5G Scenario. IEEE Access 7: 107506-107522 (2019) - [j8]Anuar Jaafar
Delay performance due to thermal variation on field-programmable gate array via the adoption of a stable ring oscillator. IET Comput. Digit. Tech. 13(5): 405-413 (2019) - 2016
- [c3]Siti Hajar Abd Rahman, Norhayati Soin, Fatimah Ibrahim
Design of graphene-based MEMS intracranial pressure sensor. MeMeA 2016: 1-5 - 2014
- [j7]Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang
Energy distribution of positive charges in high-k dielectric. Microelectron. Reliab. 54(9-10): 2329-2333 (2014) - [j6]Yasmin Abdul Wahab
Defects evolution involving interface dispersion approaches in high-k/metal-gate deep-submicron CMOS. Microelectron. Reliab. 54(9-10): 2334-2338 (2014) - [j5]Mohamed Mounir Mahmoud
Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(5): 691-703 (2014) - 2013
- [j4]Tzer Hwai Gilbert Thio
Theoretical development and critical analysis of burst frequency equations for passive valves on centrifugal microfluidic platforms. Medical Biol. Eng. Comput. 51(5): 525-535 (2013) - [c2]Tzer Hwai Gilbert Thio
Multi-level 3D implementation of thermo-pneumatic pumping on centrifugal microfluidic CD platforms. EMBC 2013: 5513-5516 - 2012
- [j3]Yasmin Abdul Wahab
Reduction of annealed-induced wafer defects in dual-damascene copper interconnects. Microelectron. Reliab. 52(9-10): 1975-1980 (2012) - [j2]I. Izuddin, M. H. Kamaruddin, Anis Nurashikin Nordin
Trench DMOS interface trap characterization by three-terminal charge pumping measurement. Microelectron. Reliab. 52(12): 2914-2919 (2012) - 2010
- [j1]Sharifah Wan Muhamad Hatta, Norhayati Soin, D. Abd Hadi, Jianfu Zhang
NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. Microelectron. Reliab. 50(9-11): 1283-1289 (2010) - [c1]Siong Kiong Teng, Norhayati Soin:
Low power clock gates optimization for clock tree distribution. ISQED 2010: 488-492
Coauthor Index
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