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Foisal Ahmed
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2020 – today
- 2023
- [c6]Foisal Ahmed, Maksim Jenihhin:
Holistic IJTAG-based External and Internal Fault Monitoring in UAVs. LATS 2023: 1-6 - [e1]Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek:
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. IEEE 2023, ISBN 979-8-3503-3277-3 [contents] - [i4]Tanvir Ahmad Tarique, Foisal Ahmed, Maksim Jenihhin, Liakot Ali:
Unsupervised Recycled FPGA Detection Using Symmetry Analysis. CoRR abs/2303.01807 (2023) - [i3]Foisal Ahmed, Maksim Jenihhin:
Holistic IJTAG-based External and Internal Fault Monitoring in UAVs. CoRR abs/2303.01816 (2023) - 2022
- [j3]Foisal Ahmed, Maksim Jenihhin:
A Survey on UAV Computing Platforms: A Hardware Reliability Perspective. Sensors 22(16): 6286 (2022) - [c5]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. LATS 2022: 1-6 - [i2]Yuya Isaka, Michihiro Shintani, Foisal Ahmed, Michiko Inoue:
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection. CoRR abs/2204.02159 (2022) - [i1]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. CoRR abs/2212.09356 (2022) - 2021
- [j2]Foisal Ahmed, Michihiro Shintani, Michiko Inoue:
Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(8): 1626-1639 (2021) - [c4]Yuya Isaka, Foisal Ahmed, Michihiro Shintani, Michiko Inoue:
Unsupervised Recycled FPGA Detection Based on Direct Density Ratio Estimation. IOLTS 2021: 1-6 - [c3]Foisal Ahmed, Michihiro Shintani, Michiko Inoue:
Study on High-Accuracy and Low-Cost Recycled FPGA Detection. ITC 2021: 133-142 - 2020
- [j1]Foisal Ahmed, Michihiro Shintani, Michiko Inoue:
Cost-Efficient Recycled FPGA Detection through Statistical Performance Characterization Framework. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 103-A(9): 1045-1053 (2020)
2010 – 2019
- 2019
- [c2]Foisal Ahmed, Michihiro Shintani, Michiko Inoue:
Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling. ETS 2019: 1-2 - [c1]Foisal Ahmed, Michihiro Shintani, Michiko Inoue:
Low Cost Recycled FPGA Detection Using Virtual Probe Technique. ITC-Asia 2019: 103-108
Coauthor Index
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