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Vinod K. Agarwal
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1990 – 1999
- 1999
- [c35]Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal:
Correct diagnosis of almost all faulty units in a multiprocessor system. ISCAS (6) 1999: 161-164 - [c34]Vinod K. Agarwal:
Invited Talk: Embedded Test for Systems-on-a-Chip. VLSI Design 1999 - [c33]Vinod K. Agarwal:
VTS 1999 Keynote Address Embedded Test OR External Test. VTS 1999: 2-7 - 1998
- [j39]Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal:
Correct Diagnosis of Almost All Faulty Units in a Multiprocessor System. J. Circuits Syst. Comput. 8(4): 473-481 (1998) - [j38]Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman:
Diagnosis of clustered faults and wafer testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(2): 136-148 (1998) - 1997
- [c32]Vinod K. Agarwal:
Embedded Test and Measurement Critical for Deep Submicron Technology. Asian Test Symposium 1997: 2 - 1995
- [j37]Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt:
A Specification-Driven Architectural Design Environment. Computer 28(6): 26-35 (1995) - [j36]Vinod K. Agarwal:
VTS 1994 Panel Report on BIST for Consumer Products. IEEE Des. Test Comput. 12(1): 12- (1995) - [j35]D. Lambidonis, Vinod K. Agarwal, André Ivanov, Dhiren Xavier:
A quasi-optimal scheduling of intermediate signatures for multiple signature analysis compaction testing schemes. J. Electron. Test. 6(1): 75-84 (1995) - [j34]D. Lambidonis, André Ivanov, Vinod K. Agarwal:
Fast signature computation for BIST linear compactors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(8): 1037-1044 (1995) - [j33]Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge, Krishnaiyan Thulasiraman:
A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing. IEEE Trans. Parallel Distributed Syst. 6(4): 363-372 (1995) - [c31]Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes:
Distributed Probabilistic Diagnosis of MCMs on Large Area. ITC 1995: 208-216 - 1994
- [j32]Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal:
Diagnosis of t/(t+1)-Diagnosable Systems. SIAM J. Comput. 23(5): 895-905 (1994) - [j31]Laurence E. LaForge, Kaiyuan Huang, Vinod K. Agarwal:
Almost Sure Diagnosis of Almost Every Good Element. IEEE Trans. Computers 43(3): 295-305 (1994) - [c30]Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt:
DASE: An Environment for System Level Telecommunication Design Exploration and Modelling. CAST 1994: 302-318 - [c29]Guoning Liao, Erik R. Altman, Vinod K. Agarwal, Guang R. Gao:
A Comparative Study of Multiprocessor List Scheduling Heuristics. HICSS (1) 1994: 68-77 - [c28]Morie E. Malowany, Gordon W. Roberts, Vinod K. Agarwal:
VAMP: A Hierarchical Framework for Design for Manufacturability. ISCAS 1994: 141-144 - [c27]Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal:
Performance of Interconnection Network in Multithreaded Architectures. PARLE 1994: 823-826 - 1993
- [j30]Robert P. Treuer, Vinod K. Agarwal:
Built-In Self-Diagnosis for Repairable Embedded RAMs. IEEE Des. Test Comput. 10(2): 24-33 (1993) - [j29]Anindya Das, Krishnaiyan Thulasiraman, K. B. Lakshmanan, Vinod K. Agarwal:
Distributed Fault diagnosis of a Ring of Processors. Parallel Process. Lett. 3: 195-204 (1993) - [j28]Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal, K. B. Lakshmanan:
Multiprocessor Fault Diagnosis Under Local Constraints. IEEE Trans. Computers 42(8): 984-988 (1993) - [c26]Erik R. Altman, Vinod K. Agarwal, Guang R. Gao:
A Novel Methodology Using Genetic Algorithms for the Design of Caches and Cache Replacement Policy. ICGA 1993: 392-399 - [c25]Robert P. Treuer, Vinod K. Agarwal:
Fault Location Algorithms for Repairable Embedded. ITC 1993: 825-834 - [c24]Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt:
The design of a library support system for a telecommunication system synthesis environment. RSP 1993: 120-131 - [c23]Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal:
Analysis of Multithreaded Multiprocessors with Distributed Shared Memory. SPDP 1993: 114-121 - 1992
- [j27]Arun K. Somani, Vinod K. Agarwal:
Distributed Diagnosis Algorithms for Regular Interconnected Structures. IEEE Trans. Computers 41(7): 899-906 (1992) - [j26]Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal:
Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 16-25 (1992) - [j25]Abu S. M. Hassan, Vinod K. Agarwal, Benoit Nadeau-Dostie, Janusz Rajski:
BIST of PCB interconnects using boundary-scan architecture. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(10): 1278-1288 (1992) - [j24]Vinod K. Agarwal, André Ivanov:
Computing the probability of undetected error for shortened cyclic codes. IEEE Trans. Commun. 40(3): 494-499 (1992) - [c22]Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge:
Wafer Testing with Pairwise Comparisons. FTCS 1992: 374-383 - [c21]Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal:
Performance Evaluation of Latency Tolerant Architectures. ICCI 1992: 183-186 - [c20]Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt:
A system level synthesis framework for computer architectures. RSP 1992: 94-111 - 1991
- [j23]Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal:
Diagnosis of T/S-Diagnosable Systems. J. Circuits Syst. Comput. 1(4): 353-372 (1991) - [j22]André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams:
Iterative algorithms for computing aliasing probabilities. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(2): 260-265 (1991) - [c19]D. Lambidonis, André Ivanov, Vinod K. Agarwal:
Fast Signature Computation for Linear Compactors. ITC 1991: 808-817 - 1990
- [j21]Benoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal:
Serial Interfacing for Embedded-Memory Testing. IEEE Des. Test Comput. 7(2): 52-63 (1990) - [j20]Yervant Zorian, Vinod K. Agarwal:
Optimizing error masking in BIST by output data modification. J. Electron. Test. 1(1): 59-71 (1990) - [c18]Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie:
A new procedure for weighted random built-in self-test. ITC 1990: 660-669
1980 – 1989
- 1989
- [j19]Arun K. Somani, Vinod K. Agarwal, David Avis:
On the Complexity of Single Fault Set Diagnosability and Diagnosis Problems. IEEE Trans. Computers 38(2): 195-201 (1989) - [j18]André Ivanov, Vinod K. Agarwal:
An analysis of the probabilistic behavior of linear feedback signature registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(10): 1074-1088 (1989) - [c17]Arun K. Somani, Vinod K. Agarwal:
Distributed syndrome decoding for regular interconnected structures. FTCS 1989: 70-77 - [c16]Robert C. Aitken, Vinod K. Agarwal:
A diagnosis method using pseudo-random vectors without intermediate signatures. ICCAD 1989: 574-577 - [c15]Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal:
: Experiments on Aliasing in Signature Analysis Registers. ITC 1989: 344-354 - [c14]Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski, Benoit Nadeau-Dostie:
Testing of Glue Logic Interconnects Using Boundary Scan Architecture. ITC 1989: 700-711 - [c13]Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal, K. B. Lakshmanan:
t/s-Diagnosable Systems: A Characterization and Diagnosis Algorithm. WG 1989: 34-45 - 1988
- [j17]Michael C. Howells, Vinod K. Agarwal:
A Reconfiguration Scheme for Yield Enhancement of Large Area Binary Tree Architectures. IEEE Trans. Computers 37(4): 463-468 (1988) - [j16]André Ivanov, Vinod K. Agarwal:
Dynamic testability measures for ATPG. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(5): 598-608 (1988) - [c12]André Ivanov, Vinod K. Agarwal:
An iterative technique for calculating aliasing probability of linear feedback signature registers. FTCS 1988: 70-75 - [c11]Robert C. Aitken, Vinod K. Agarwal:
Aliasing probability of non-exhaustive randomized syndrome tests. ICCAD 1988: 232-235 - [c10]Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski:
Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. ITC 1988: 126-137 - [c9]Henry Cox, André Ivanov, Vinod K. Agarwal, Janusz Rajski:
On Multiple Fault Coverage and Aliasing Probability Measures. ITC 1988: 314-321 - 1987
- [j15]Janusz Rajski, Vinod K. Agarwal:
Testing and Applications of Inverter-Free PLAs. IEEE Des. Test 4(6): 30-40 (1987) - [j14]Robert P. Treuer, Vinod K. Agarwal, Hideo Fujiwara:
A New Built-In Self-Test Design for PLA's with High Fault Coverage and Low Overhead. IEEE Trans. Computers 36(3): 369-373 (1987) - [j13]Arun K. Somani, Vinod K. Agarwal, David Avis:
A Generalized Theory for System Level Diagnosis. IEEE Trans. Computers 36(5): 538-546 (1987) - 1986
- [j12]Yvon Savaria, Jeremiah F. Hayes, Nicholas C. Rumin, Vinod K. Agarwal:
A Theory for the Design of Soft-Error-Tolerant VLSI Circuits. IEEE J. Sel. Areas Commun. 4(1): 15-23 (1986) - [j11]A. S. Mahmudul Hassan, Vinod K. Agarwal:
A Fault-Tolerant Modular Architecture for Binary Trees. IEEE Trans. Computers 35(4): 356-361 (1986) - [j10]Michel R. Dagenais, Vinod K. Agarwal, Nicholas C. Rumin:
McBOOLE: A New Procedure for Exact Logic Minimization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 229-238 (1986) - [c8]André Ivanov, Vinod K. Agarwal:
Testability Measures : What Do They Do for ATPG ? ITC 1986: 129-139 - 1985
- [j9]Robert P. Treuer, Hideo Fujiwara, Vinod K. Agarwal:
Implementing a Built-In Self-Test PLA Design. IEEE Des. Test 2(2): 37-48 (1985) - [j8]Arun K. Somani, Vinod K. Agarwal:
An Efficient Unsorted VLSI Dictionary Machine. IEEE Trans. Computers 34(9): 841-852 (1985) - [c7]Michel R. Dagenais, Vinod K. Agarwal, Nicholas C. Rumin:
The McBOOLE logic minimizer. DAC 1985: 667-673 - [c6]Vinod K. Agarwal, Janusz Rajski:
Testing Properties and Applications of Inverter-Free PLA's. ITC 1985: 500-507 - 1984
- [j7]Jacek Jachner, Vinod K. Agarwal:
Data Flow Anomaly Detection. IEEE Trans. Software Eng. 10(4): 432-437 (1984) - [c5]Arun K. Somani
, Vinod K. Agarwal:
An Efficient VLSI Dictionary Machine. ISCA 1984: 142-150 - [c4]Yervant Zorian, Vinod K. Agarwal:
Higher Certainty of Error Coverage by Output Data Modification. ITC 1984: 140-147 - [c3]Yvon Savaria, Vinod K. Agarwal, Nicholas C. Rumin, Jeremiah F. Hayes:
A Design for Machines with Built-In Tolerance to Soft Errors. ITC 1984: 649-659 - 1983
- [c2]Michael G. Lamoureux, Vinod K. Agarwal:
Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis. ITC 1983: 129-137 - 1981
- [j6]Vinod K. Agarwal, Andy S. F. Fung:
Multiple Fault Testing of Large Circuits by Single Fault Test Sets. IEEE Trans. Computers 30(11): 855-865 (1981) - 1980
- [j5]Vinod K. Agarwal, Gerald M. Masson:
Generic Fault Characterizations for Table Look-Up Coverage Bounding. IEEE Trans. Computers 29(4): 288-299 (1980) - [j4]Vinod K. Agarwal:
Multiple Fault Detection in Programmable Logic Arrays. IEEE Trans. Computers 29(6): 518-522 (1980) - [c1]S. S. S. P. Rao, Vinod K. Agarwal:
A microprocessor based tea dryer controller. SIGSMALL 1980: 137-149
1970 – 1979
- 1979
- [j3]Vinod K. Agarwal, Gerald M. Masson:
A Functional Form Approach to Test Set Coverage in Tree Networks. IEEE Trans. Computers 28(1): 50-52 (1979) - [j2]Vinod K. Agarwal, Gerald M. Masson:
Recursive Coverage Projection of Test Sets. IEEE Trans. Computers 28(11): 865-870 (1979) - 1977
- [j1]Vinod K. Agarwal, Gerald M. Masson:
Resolution-Oriented Fault Interrelationships in Combinational Logic Networks. IEEE Trans. Computers 26(11): 1170-1175 (1977)
Coauthor Index
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