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Lee Coulbeck

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2020 – today

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2021
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  - conf/iecon/WangWCLG21
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  - https://dblp.org/rec/conf/iecon/WangWCLG21
Zhongxu Wang, Yangang Wang, Lee Coulbeck, Xiang Li, Wei Gong:
Substrate Solder Crack Evaluation and Modelling of Power Module under Passive Cycling. IECON 2021: 1-6

2010 – 2019

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2013
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Chunlin Zhu, Ian Deviny, Ben Yu, Lee Coulbeck, Gary Liu, Jim Thomson:
Optimization of p-emitter/n-buffer using laser annealing technique in IGBT design. IECON 2013: 1130-1135
2012
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  - journals/mr/AhmedSCCJ12
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Ashraf Ahmed, Yasaman Shadrokh, Lee Coulbeck, Alberto Castellazzi, C. Mark Johnson:
A closed-loop IGBT non-destructive tester. Microelectron. Reliab. 52(9-10): 2358-2362 (2012)

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