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Grigor Tshagharyan
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2020 – today
- 2024
- [j1]Mahta Mayahinia
, Mehdi Baradaran Tahoori
Testing for Electromigration in Sub-5-nm FinFET Memories. IEEE Des. Test 41(6): 54-61 (2024) - [c20]Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. ITC 2024: 46-50 - [c19]Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS 2024: 1-5 - 2023
- [c18]Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS 2023: 1-4 - [c17]Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC 2023: 383-387 - [c16]Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC 2023: 388-392 - [c15]Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS 2023: 1-4 - [c14]Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang:
An Efficient External Memory Test Solution: Case Study for HPC Application. VTS 2023: 1-4 - 2022
- [c13]Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan:
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC 2022: 650-655 - [c12]Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee:
Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS 2022: 1
2010 – 2019
- 2019
- [c11]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan:
Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS 2019: 80-83 - [c10]S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan:
Innovative Practices on In-System Test and Reliability of Memories. VTS 2019: 1 - 2018
- [c9]Davit Hayrapetyan, Aleksandr Manukvan, Grigor Tshagharyan:
Implementation of Memory Static, Coupling and Dynamic Fault Models at the Register Transfer Level. EWDTS 2018: 1-4 - [c8]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian:
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC 2018: 1-10 - [c7]Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC 2018: 1-10 - 2017
- [c6]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS 2017: 1-4 - [c5]Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
An effective functional safety solution for automotive systems-on-chip. ITC 2017: 1-10 - 2016
- [c4]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Securing test infrastructure of system-on-chips. EWDTS 2016: 1-4 - 2015
- [c3]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS 2015: 1-4 - [c2]Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian:
Impact of parameter variations on FinFET faults. VTS 2015: 1-4 - 2014
- [c1]Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian:
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS 2014: 1-6
Coauthor Index
aka: Gurgen Harutyunyan
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