Safety-Guided Test Generation for Structural Faults - Xuanyi Tan; Dhruv Thapar; Deepesh Sahoo; Arjun Chaudhuri; Sanmitra Banerjee; Krishnendu Chakrabarty; Rubin A. Parekhji (IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024, 2024)

Machine Learning Based Network Coverage Guidance System - Srikanth Chandar; Muvazima Mansoor; Mohina Ahmadi; Hrishikesh Badve; Deepesh Sahoo; Bharath Katragadda (CoRR, 2020)