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Mauro Ciappa
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2020 – today
- 2021
- [c5]Mauro Ciappa, Marco Pocaterra
:
Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation. IRPS 2021: 1-8 - 2020
- [c4]Mauro Ciappa, Marco Pocaterra
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources. IRPS 2020: 1-7
2010 – 2019
- 2018
- [j49]Mauro Ciappa, Paolo Cova, Gaudenzio Meneghesso, Francesco Iannuzzo
Editorial. Microelectron. Reliab. 88-90: 1 (2018) - [j48]Mauro Ciappa, Ying Pang, Chenchen Sun:
Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. Microelectron. Reliab. 88-90: 476-481 (2018) - [j47]Ying Pang, Mauro Ciappa:
Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays. Microelectron. Reliab. 88-90: 992-997 (2018) - 2017
- [j46]Franc Dugal, Mauro Ciappa:
Reliability investigation of the copper-zinc system for solid diffusion bonding in power modules. Microelectron. Reliab. 76-77: 460-464 (2017) - 2016
- [j45]Francesco Iannuzzo
Reliability issues in power electronics. Microelectron. Reliab. 58: 1-2 (2016) - [j44]Hiroshi Suzuki, Mauro Ciappa:
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of types I and II. Microelectron. Reliab. 58: 12-16 (2016) - [j43]Takuo Kikuchi, Mauro Ciappa:
Modeling the threshold voltage instability in SiC MOSFETs by multiphonon-assisted tunneling. Microelectron. Reliab. 58: 33-38 (2016) - 2015
- [j42]Mauro Ciappa, Alessandro Blascovich:
Reliability odometer for real-time and in situ lifetime measurement of power devices. Microelectron. Reliab. 55(9-10): 1351-1356 (2015) - [j41]Hiroshi Suzuki, Mauro Ciappa:
TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition. Microelectron. Reliab. 55(9-10): 1976-1980 (2015) - 2014
- [j40]Franc Dugal, Mauro Ciappa:
Study of thermal cycling and temperature aging on PbSnAg die attach solder joints for high power modules. Microelectron. Reliab. 54(9-10): 1856-1861 (2014) - [j39]Mauro Ciappa, Alexey Yu. Illarionov, Emre Ilgünsatiroglu:
Exact 3D simulation of Scanning Electron Microscopy images of semiconductor devices in the presence of electric and magnetic fields. Microelectron. Reliab. 54(9-10): 2081-2087 (2014) - [j38]Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov:
Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range. Microelectron. Reliab. 54(9-10): 2123-2127 (2014) - [c3]Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov, F. Filosomi, C. Santini:
Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy. ESSDERC 2014: 357-360 - 2013
- [j37]Emre Ilgünsatiroglu, Alexey Yu. Illarionov, Mauro Ciappa:
Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications. Microelectron. Reliab. 53(9-11): 1381-1386 (2013) - [j36]Franc Dugal, Mauro Ciappa:
Avoiding misleading artefacts in metallurgical preparation of die attach solder joints in high power modules. Microelectron. Reliab. 53(9-11): 1403-1408 (2013) - [j35]Takuo Kikuchi, Mauro Ciappa:
A new two-dimensional TCAD model for threshold instability in silicon carbide MOSFETs. Microelectron. Reliab. 53(9-11): 1730-1734 (2013) - 2012
- [j34]Mauro Ciappa, Paolo Cova
Editorial. Microelectron. Reliab. 52(9-10): 1751-1752 (2012) - [j33]Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov:
Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies. Microelectron. Reliab. 52(9-10): 2139-2143 (2012) - [j32]Satoshi Ono, Mauro Ciappa, Shigeru Hiura, Wolfgang Fichtner:
Electro-thermal simulation in the time domain of GaN HEMT for RF switch-mode amplifier. Microelectron. Reliab. 52(9-10): 2224-2227 (2012) - 2011
- [j31]Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner:
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. J. Electron. Test. 27(1): 19-30 (2011) - [j30]Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner:
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications. Microelectron. Reliab. 51(9-11): 1479-1483 (2011) - [j29]Aniello Esposito, Mauro Ciappa, Wolfgang Fichtner:
Synthesis of scanning electron microscopy images by high performance computing for the metrology of advanced CMOS processes. Microelectron. Reliab. 51(9-11): 1673-1678 (2011) - 2010
- [j28]Mauro Ciappa, Alexander Koschik, Maurizio Dapor
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy. Microelectron. Reliab. 50(9-11): 1407-1412 (2010) - [j27]Yuji Sasaki, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner:
Accurate extraction of the mechanical properties of thin films by nanoindentation for the design of reliable MEMS. Microelectron. Reliab. 50(9-11): 1621-1625 (2010) - [j26]Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, M. Hommel, Wolfgang Fichtner:
A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters. Microelectron. Reliab. 50(9-11): 1750-1757 (2010) - [c2]Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. ETS 2010: 170-174
2000 – 2009
- 2009
- [j25]Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner:
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectron. Reliab. 49(9-11): 972-976 (2009) - [j24]Haruka Kubo, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner:
Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices. Microelectron. Reliab. 49(9-11): 1278-1282 (2009) - [j23]Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner:
A new built-in screening methodology to achieve zero defects in the automotive environment. Microelectron. Reliab. 49(9-11): 1334-1340 (2009) - [c1]Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. ETS 2009: 67-72 - 2008
- [j22]Alberto Castellazzi
Novel simulation approach for transient analysis and reliable thermal management of power devices. Microelectron. Reliab. 48(8-9): 1500-1504 (2008) - 2007
- [j21]Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner:
SCR operation mode of diode strings for ESD protection. Microelectron. Reliab. 47(7): 1044-1053 (2007) - [j20]Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectron. Reliab. 47(9-11): 1343-1348 (2007) - [j19]Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner:
Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectron. Reliab. 47(9-11): 1707-1712 (2007) - [j18]Alberto Castellazzi
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectron. Reliab. 47(9-11): 1713-1718 (2007) - [j17]Jesús Urresti-Ibañez
Robustness test and failure analysis of IGBT modules during turn-off. Microelectron. Reliab. 47(9-11): 1725-1729 (2007) - 2006
- [j16]Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner:
Characterization of photonic devices by secondary electron potential contrast. Microelectron. Reliab. 46(9-11): 1536-1541 (2006) - [j15]Alberto Castellazzi
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectron. Reliab. 46(9-11): 1754-1759 (2006) - [j14]Davide Barlini, Mauro Ciappa, Alberto Castellazzi
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectron. Reliab. 46(9-11): 1772-1777 (2006) - 2005
- [j13]Mauro Ciappa:
Lifetime prediction on the base of mission profiles. Microelectron. Reliab. 45(9-11): 1293-1298 (2005) - [j12]Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner:
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectron. Reliab. 45(9-11): 1499-1504 (2005) - [j11]Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner:
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. Microelectron. Reliab. 45(9-11): 1532-1537 (2005) - [j10]Mauro Ciappa, Wolfgang Fichtner, T. Kojima, Y. Yamada, Y. Nishibe:
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles. Microelectron. Reliab. 45(9-11): 1694-1699 (2005) - 2004
- [j9]Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner:
2D Dopant Profiling on 4H Silicon Carbide P+N Junction by Scanning Capacitance and Scanning Electron Microscopy. Microelectron. Reliab. 44(9-11): 1681-1686 (2004) - [j8]Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner, Elisa Ricci
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques. Microelectron. Reliab. 44(9-11): 1703-1708 (2004) - [j7]Chiara Corvasce, Mauro Ciappa, Davide Barlini, S. Sponton, Gaudenzio Meneghesso
Characterization of self-heating effects in semiconductor resistors during transmission line pulses. Microelectron. Reliab. 44(9-11): 1873-1878 (2004) - 2003
- [j6]Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner:
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. Microelectron. Reliab. 43(9-11): 1651-1656 (2003) - [j5]Giovanna Mura
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43(9-11): 1771-1776 (2003) - 2002
- [j4]Mauro Ciappa:
Selected failure mechanisms of modern power modules. Microelectron. Reliab. 42(4-5): 653-667 (2002) - [j3]Mauro Ciappa, Flavio Carbognani, Paolo Cova
A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors. Microelectron. Reliab. 42(9-11): 1653-1658 (2002) - [j2]Maria Stangoni, Mauro Ciappa, Marco Buzzo, Markus Leicht, Wolfgang Fichtner:
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectron. Reliab. 42(9-11): 1701-1706 (2002) - 2001
- [j1]H. Yabuhara, Mauro Ciappa, Wolfgang Fichtner:
Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications. Microelectron. Reliab. 41(9-10): 1459-1463 (2001)
Coauthor Index
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