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Salvador Bracho
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2010 – 2019
- 2014
- [c11]Jose Angel Miguel, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Modeling of faulty implantable MEMS pressure sensors. ICM 2014: 80-83 - 2013
- [j10]Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Behavioral model of folded and interpolated ADCs for test evaluation - Case study: Structural DfT method. Microelectron. J. 44(5): 382-392 (2013) - 2011
- [j9]Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor. J. Electron. Test. 27(2): 177-192 (2011) - [c10]Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho:
Design-for-Test method for high-speed ADCs: Behavioral description and optimization. DDECS 2011: 35-40 - 2010
- [c9]Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Test of embedded analog circuits based on a built-in current sensor. ETS 2010: 164-169 - [c8]Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Test Based on Built-In Current Sensors for Mixed-Signal Circuits. DoCEIS 2010: 523-530 - [c7]Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho:
Structural DfT Strategy for High-Speed ADCs. DoCEIS 2010: 531-538
2000 – 2009
- 2007
- [c6]Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Structural DfT Approach on Folded ADCs. ICECS 2007: 226-229 - 2005
- [j8]Yolanda Lechuga, Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho:
Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors. J. Electron. Test. 21(6): 583-598 (2005) - [j7]Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Test of a switched-capacitor ADC by a built-in charge sensor. Microelectron. J. 36(12): 1064-1072 (2005) - [j6]Francisco J. Azcondo, Christian Brañas, Rosario Casanueva, Salvador Bracho:
Power-mode-controlled power-factor corrector for electronic ballast. IEEE Trans. Ind. Electron. 52(1): 56-65 (2005) - [c5]Mar Martínez, Salvador Bracho:
Design of a Microelectronic Circuits Course Using Interactive Methods. MSE 2005: 23-24 - 2004
- [j5]Christian Brañas, Francisco J. Azcondo, Salvador Bracho:
Study of output power variation due to component tolerances in LCsCp resonant inverters applied to HPS lamp control. IEEE Trans. Ind. Electron. 51(1): 122-131 (2004) - 2002
- [c4]Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho:
Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics. DATE 2002: 205-211 - [c3]Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho:
Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits. LATW 2002: 180-185 - 2001
- [c2]Miguel Angel Allende, Román Mozuelos, Mar Martínez, Salvador Bracho:
On Line IC Test Course With Distance Access to Test Equipment. LATW 2001 - 2000
- [j4]Christian Brañas, Francisco J. Azcondo, Salvador Bracho:
Contributions to the design and control of LCsCp resonant inverters to drive high-power HPS lamps. IEEE Trans. Ind. Electron. 47(4): 796-808 (2000)
1990 – 1999
- 1999
- [j3]María José López, Mar Martínez, Salvador Bracho:
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata. J. Electron. Test. 14(3): 245-258 (1999) - 1996
- [j2]Javier Argüelles, Salvador Bracho:
Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current. J. Electron. Test. 9(1-2): 89-107 (1996) - 1995
- [c1]Javier Argüelles, María José López, J. Blanco, Mar Martínez, Salvador Bracho:
Iddt testing of continuous-time filters. VTS 1995: 101-107 - 1990
- [j1]M. Martinez, N. P. Cagigal, Salvador Bracho:
Arithmetical logical unit design for a processor with BILBO techniques: Functional simulation and test strategies. Microprocessing and Microprogramming 28(1-5): 109-115 (1990)
Coauthor Index
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