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Jerzy Rutkowski
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2020 – today
- 2021
- [c27]Ewa Lach
, Damian Grzechca
Analysis of Semestral Progress in Higher Technical Education with HMM Models. ICCS (3) 2021: 214-228
2010 – 2019
- 2018
- [c26]Katarzyna Moscinska, Jerzy Rutkowski:
Effective computer-assisted assessment: Challenges and solutions. EDUCON 2018: 969-978 - 2014
- [c25]Jerzy Rutkowski:
Flipped Classroom - From Experiment to Practice. IDT/IIMSS/STET 2014: 565-574 - 2012
- [c24]Katarzyna Moscinska, Jerzy Rutkowski:
Rethinking e-assessment in a core engineering course. EDUCON 2012: 1-4 - 2011
- [c23]Jerzy Rutkowski, Katarzyna Moscinska:
Blended engineering course - Electric Circuit Theory case study. ISCAS 2011: 333-336 - 2010
- [c22]Piotr Kyziol, Jerzy Rutkowski, Damian Grzechca
Testing analog electronic circuits using N-terminal network. DDECS 2010: 177-180 - [c21]Damian Grzechca
PCA application to frequency reduction for fault diagnosis in analog and mixed electronic circuit. ISCAS 2010: 1919-1922
2000 – 2009
- 2009
- [c20]Piotr Jantos, Damian Grzechca
Global parametric faults identification with the use of Differential Evolution. DDECS 2009: 222-225 - [c19]Piotr Kyziol, Damian Grzechca
Multidimensional search space for catastrophic faults diagnosis in analog electronic circuits. ECCTD 2009: 555-558 - [c18]Piotr Jantos, Damian Grzechca
A global parametric faults diagnosis with the use of artificial neural networks. ECCTD 2009: 651-654 - [c17]Lukas Chruszczyk
Specialised aperiodic excitation and wavelet transform improves analogue fault diagnosis. ECCTD 2009: 655-658 - 2008
- [c16]Lukas Chruszczyk
Excitation optimization in fault diagnosis of analog electronic circuits. DDECS 2008: 279-282 - [c15]Piotr Jantos, Damian Grzechca
The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features. DDECS 2008: 299-303 - [c14]Lukas Chruszczyk
Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. ICECS 2008: 242-246 - [p1]Piotr Jantos, Damian Grzechca
Gene Expression Programming-Based Method of Optimal Frequency Set Determination for Purpose of Analogue Circuits' Diagnosis. Computer Recognition Systems 2 2008: 794-801 - 2007
- [j2]Tomasz Golonek
Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection. IEEE Trans. Circuits Syst. II Express Briefs 54-II(2): 117-121 (2007) - [c13]Tomasz Golonek, Damian Grzechca, Jerzy Rutkowski:
Evolutionary System for Analog Test Frequencies Selection with Fuzzy Initialization. DDECS 2007: 353-356 - [c12]Andrzej Pulka
A common-sense based approach to the automated test-point selection in fault diagnosis. ECCTD 2007: 838-841 - [c11]Damian Grzechca
Simulated Annealing with Fuzzy Fitness Function for Test Frequencies Selection. FUZZ-IEEE 2007: 1-6 - [c10]Damian Grzechca
The Use of Simulated Annealing with Fuzzy Objective Function to Optimal Frequency Selection for Analog Circuit Diagnosis. ICECS 2007: 899-902 - 2006
- [c9]Tomasz Golonek, Damian Grzechca, Jerzy Rutkowski:
Application of genetic programming to edge detector design. ISCAS 2006 - [c8]Damian Grzechca, Tomasz Golonek, Jerzy Rutkowski:
Analog fault AC dictionary creation - the fuzzy set approach. ISCAS 2006 - [c7]Bartlomiej Puchalski, Lukasz Zielinski, Jerzy Rutkowski:
Use of granular method to design centering. ISCAS 2006 - [c6]Lukasz Zielinski, Bartlomiej Puchalski, Jerzy Rutkowski:
Yield enhancement by means of evolutionary computation techniques. ISCAS 2006 - 2004
- [j1]Janusz A. Starzyk, Dong Liu, Zhi-Hong Liu, Dale E. Nelson, Jerzy Rutkowski:
Entropy-based optimum test points selection for analog fault dictionary techniques. IEEE Trans. Instrum. Meas. 53(3): 754-761 (2004) - [c5]Jerzy Rutkowski, Katarzyna Moscinska, Piotr Klosowski:
Computer Assisted and Web-based Learning Techniques in Electronics and Telecommunication Education Process. CATE 2004: 60-65 - [c4]Lukasz Zielinski, Jerzy Rutkowski:
Design Centering and Tolerancing with Utilization of Evolutionary Techniques. WSC 2004: 91-98 - 2002
- [c3]Damian Grzechca
Adaptive algorithm for analog fault based on a sensitivity matrix and the fuzzy set theory. ICECS 2002: 649-652 - 2000
- [c2]Jerzy Rutkowski, Jan Machniewski:
Integer-code DC fault dictionary. ISCAS 2000: 713-716
1990 – 1999
- 1994
- [c1]Jerzy Rutkowski:
A Two-Stage Neural Network DC Fault Dictionary. ISCAS 1994: 299-302
Coauthor Index
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