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Eiji Morifoji

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2000 – 2009

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2002
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  - https://dblp.org/rec/journals/mr/KrishnanKMMBL02
Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li:
Series resistance degradation due to NBTI in PMOSFET. Microelectron. Reliab. 42(9-11): 1433-1438 (2002)

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