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Hyung-Ock Kim
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2010 – 2019
- 2015
- [c10]Sungmin Bae, Hyung-Ock Kim, Jung Yun Choi, Jaehong Park:
Coarse-grained Structural Placement for a Synthesized Parallel Multiplier. ISPD 2015: 17-24 - 2013
- [c9]Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker
, Subhasish Mitra
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC 2013: 1-4 - [c8]Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra
Early-life-failure detection using SAT-based ATPG. ITC 2013: 1-10 - 2012
- [c7]Chungki Oh, Hyung-Ock Kim, Jun Seomun, Wook Kim, Jaehan Jeon, Kyung Tae Do, Hyo-Sig Won, Kee Sup Kim:
Thermal-aware body bias modulation for high performance mobile core. ISOCC 2012: 147-150 - 2010
- [j4]Hyung-Ock Kim, Bong Hyun Lee, Jong-Tae Kim, Jung Yun Choi, Kyu-Myung Choi, Youngsoo Shin:
Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 18(3): 505-509 (2010)
2000 – 2009
- 2009
- [j3]Youngsoo Shin, Seungwhun Paik, Hyung-Ock Kim:
Semicustom Design of Zigzag Power-Gated Circuits in Standard Cell Elements. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(3): 327-339 (2009) - 2007
- [j2]Hyung-Ock Kim, Youngsoo Shin:
Semicustom Design Methodology of Power Gated Circuits for Low Leakage Applications. IEEE Trans. Circuits Syst. II Express Briefs 54-II(6): 512-516 (2007) - [j1]Youngsoo Shin, Sewan Heo
Supply Switching With Ground Collapse: Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits. IEEE Trans. Very Large Scale Integr. Syst. 15(7): 758-766 (2007) - [c6]Youngsoo Shin, Sewan Heo, Hyung-Ock Kim, Jung Yun Choi:
Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits. ASP-DAC 2007: 654-659 - [c5]Youngsoo Shin, Hyung-Ock Kim:
Cell-Based Semicustom Design of Zigzag Power Gating Circuits. ISQED 2007: 527-532 - 2006
- [c4]Hyung-Ock Kim, Youngsoo Shin:
Analysis and optimization of gate leakage current of power gating circuits. ASP-DAC 2006: 565-569 - [c3]Hyung-Ock Kim, Youngsoo Shin, Hyuk Kim, Iksoo Eo:
Physical design methodology of power gating circuits for standard-cell-based design. DAC 2006: 109-112 - 2005
- [c2]Hyung-Ock Kim, Youngsoo Shin:
Power-aware slack distribution for hierarchical VLSI design. ISCAS (4) 2005: 4150-4153 - [c1]Youngsoo Shin, Hyung-Ock Kim:
Analysis of power consumption in VLSI global interconnects. ISCAS (5) 2005: 4713-4716
Coauthor Index
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