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Yutaka Higashiguchi

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2000 – 2009

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2002
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Kinuko Mishiro, Shigeo Ishikawa, Mitsunori Abe, Toshio Kumai, Yutaka Higashiguchi, Ken-ichiro Tsubone:
Effect of the drop impact on BGA/CSP package reliability. Microelectron. Reliab. 42(1): 77-82 (2002)

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