Optimization for simulation of WL-CSP subjected to drop-test with plasticity behavior. - Coq, Cédric Le; Tougui, Adellah; Stempin, Marie-Pascale; Barreau, Laurent (Microelectron. Reliab., 2011)

Experimental study of WL-CSP reliability subjected to a four-point bend-test. - Coq, Cédric Le; Tougui, Adellah; Stempin, Marie-Pascale; Barreau, Laurent (Microelectron. Reliab., 2010)