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Kouji Ichikawa
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2010 – 2019
- 2018
- [j6]Kazuyuki Sakata, Takashi Hasegawa, Kouji Ichikawa, Toshiki Kanamoto:
Impact of mutual inductance on timing in nano-scale SoC. IEICE Electron. Express 15(11): 20180376 (2018) - 2014
- [j5]Kumpei Yoshikawa, Kouji Ichikawa, Makoto Nagata:
AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model. IEICE Trans. Electron. 97-C(4): 264-271 (2014) - 2013
- [c2]Akitaka Murata, Shuji Agatsuma, Daisaku Ikoma, Kouji Ichikawa, Takahiro Tsuda, Makoto Nagata, Kumpei Yoshikawa, Yuuki Araga, Yuji Harada:
Noise analysis using on-chip waveform monitor in bandgap voltage references. EMC Compo 2013: 226-231 - 2012
- [j4]Kumpei Yoshikawa, Yuta Sasaki, Kouji Ichikawa, Yoshiyuki Saito, Makoto Nagata:
Co-simulation of On-Chip and On-Board AC Power Noise of CMOS Digital Circuits. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 95-A(12): 2284-2291 (2012) - 2010
- [j3]Takanori Uno, Kouji Ichikawa, Yuichi Mabuchi, Atsushi Nakamura, Yuji Okazaki, Hideki Asai:
An Approach for Practical Use of Common-Mode Noise Reduction Technique for In-Vehicle Electronic Equipment. IEICE Trans. Commun. 93-B(7): 1788-1796 (2010)
2000 – 2009
- 2008
- [j2]Kouji Ichikawa, Yuki Takahashi, Yukihiko Sakurai, Takahiro Tsuda, Isao Iwase, Makoto Nagata:
Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation. IEICE Trans. Electron. 91-C(6): 936-944 (2008) - 2007
- [j1]Kouji Ichikawa, Yuki Takahashi, Makoto Nagata:
Experimental Verification of Power Supply Noise Modeling for EMI Analysis through On-Board and On-Chip Noise Measurements. IEICE Trans. Electron. 90-C(6): 1282-1290 (2007)
1990 – 1999
- 1995
- [c1]Hitoshi Urabe, Makoto Tsugita, Kouji Ichikawa:
Image-designing and Color Management for Digital Still Camera and Printer System. CIC 1995: 178-181
Coauthor Index
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