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Martin Versen
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2020 – today
- 2023
- [c9]Maximilian Wohlschläger, Nina Leiter, Maximilian Dietlmeier, Martin G. J. Löder, Martin Versen, Christian Laforsch:
Comparison of Two Classification Methods Trained with FD-FLIM Data to Identify and Distinguish Plastics from Environmental Materials. IJCNN 2023: 1-9 - [c8]Nina Leiter, Maximilian Dietlmeier, Maximilian Wohlschläger, Martin G. J. Löder, Martin Versen, Christian Laforsch:
Development of a Neural Network for Automatic Classification of Post-Consumer Wood Using Rapid-FLIM. SAS 2023: 1-6 - [c7]Nina Leiter, Maximilian Wohlschläger, Maximilian Dietlmeier, Martin Versen, Martin G. J. Löder, Christian Laforsch:
Comparative Analysis of Fluorescence Properties of Post-Consumer Wood Using FD-FLIM. SAS 2023: 1-6 - [c6]Maximilian Wohlschläger, Yamna Khan, Nina Leiter, Martin Versen, Martin G. J. Löder, Christian Laforsch:
Combining BLOB-Detection and MLP to Detect and Identify Plastics in an Environmental Matrix. SAS 2023: 1-5 - 2022
- [c5]Georgekutty Jose Maniyattu, Eldho Geegy, Nina Leiter, Maximilian Wohlschläger, Martin Versen, Christian Laforsch:
Development of a neural network to identify plastics using Fluorescence Lifetime Imaging Microscopy. SAS 2022: 1-6
2010 – 2019
- 2019
- [c4]Maximilian Wohlschläger, Martin Versen, Heinz Langhals:
A method for sorting of plastics with an apparatus specific quantum efficiency approach. SAS 2019: 1-6 - 2017
- [j2]Martin Versen, W. Ernst, Prince Gulati:
A row hammer pattern analysis of DDR2 SDRAM. Microelectron. Reliab. 76-77: 64-67 (2017) - 2015
- [j1]Martin Versen, W. Ernst, G. Singh, Prince Gulati:
Test setup for reliability studies of DDR2 SDRAM. Microelectron. Reliab. 55(9-10): 1395-1399 (2015) - 2014
- [c3]Martin Versen, Stefan Kipfelsberger:
Introduction to microcomputer technology with the MSP430 Launch Pad in remote labs. EDUCON 2014: 202-205
2000 – 2009
- 2008
- [c2]Martin Versen, Achim Schramm, Jan Schnepp, Dorina Diaconescu:
Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices. DATE 2008: 776-779 - 2006
- [c1]Martin Versen, Achim Schramm, Daewon Lee, Ronny Schneider:
Address Decoder Test and Verification by Generalization of Application Fail Sequences. MBMV 2006: 261-265
Coauthor Index
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