Enhancing Fault Emulation of Transient Faults by Separating Combinational and Sequential Fault Propagation - Ralph Nyberg; Johann Heyszl; Dietmar Heinz; Georg Sigl (Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016, 2016)

An Assembler Driven Verification Methodology (ADVM) - John S. MacBeth; Dietmar Heinz; Ken Gray (CoRR, 2007)

An Assembler Driven Verification Methodology (ADVM) - John S. MacBeth; Dietmar Heinz; Ken Gray (2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France, 2004)