Case Study of Advanced Diagnostic Techniques for Multi Port Register File - Uma Srinivasan; William V. Huott; Chad Adams; Pete Freiburger; Franco Stellari; Peilin Song; Phong Tran; Dave Albert (28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019, 2019)

IBM z14™: 14nm microprocessor for the next-generation mainframe - Christopher J. Berry; James D. Warnock; John Isakson; John Badar; Brian Bell; Frank Malgioglio; Guenter Mayer; Dina Hamid; Jesse Surprise; David Wolpert; Ofer Geva; Bill Huott; et al. (2018 IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, CA, USA, February 11-15, 2018, 2018)

Circuit and Physical Design Implementation of the Microprocessor Chip for the zEnterprise System - James D. Warnock; Yiu-Hing Chan; Sean M. Carey; Huajun Wen; Patrick J. Meaney; Guenter Gerwig; Howard H. Smith; Yuen H. Chan; John Davis; Paul Bunce; Antonio Pelella; Daniel Rodko; et al. (IEEE J. Solid State Circuits, 2012)

A 5.2GHz microprocessor chip for the IBM zEnterprise™ system - James D. Warnock; Y. Chan; William V. Huott; Sean M. Carey; Michael F. Fee; Huajun Wen; Mary Jo Saccamango; Frank Malgioglio; Patrick J. Meaney; Donald W. Plass; Yuen H. Chan; Mark D. Mayo; et al. (IEEE International Solid-State Circuits Conference, ISSCC 2011, Digest of Technical Papers, San Francisco, CA, USA, 20-24 February, 2011, 2011)

Testing the IBM Power 7™ 4 GHz eight core microprocessor - James Crafts; David Bogdan; Dennis Conti; Donato O. Forlenza; Orazio P. Forlenza; William V. Huott; Mary P. Kusko; Edward Seymour; Timothy Taylor; Brian Walsh (2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, 2010)

On-chip Timing Uncertainty Measurements on IBM Microprocessors - Robert L. Franch; Phillip J. Restle; James K. Norman; William V. Huott; Joshua Friedrich; R. Dixon; Steve Weitzel; K. van Goor; Gerard Salem (2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008)

Design of the Power6 Microprocessor - Joshua Friedrich; Bradley D. McCredie; Norman K. James; Bill Huott; Brian W. Curran; Eric Fluhr; Gaurav Mittal; Eddie Chan; Yuen H. Chan; Donald W. Plass; Sam G. Chu; Hung Q. Le; et al. (2007 IEEE International Solid-State Circuits Conference, ISSCC 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007, 2007)

Comparison of Split-Versus Connected-Core Supplies in the POWER6 Microprocessor - Norman K. James; Phillip J. Restle; Joshua Friedrich; Bill Huott; Bradley D. McCredie (2007 IEEE International Solid-State Circuits Conference, ISSCC 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007, 2007)

On-chip timing uncertainty measurements on IBM microprocessors - Robert L. Franch; Phillip J. Restle; James K. Norman; William V. Huott; Joshua Friedrich; R. Dixon; Steve Weitzel; K. van Goor; Gerard Salem (2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, 2007)

A 5.6GHz 64kB Dual-Read Data Cache for the POWER6TM Processor - John Davis; Don Plass; Paul Bunce; Yuen H. Chan; Antonio Pelella; Rajiv V. Joshi; A. Chen; William V. Huott; Thomas J. Knips; Pradip Patel; K. Lo; Eric Fluhr (2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006, 2006)

An advanced optical diagnostic technique of IBM z990 eServer microprocessor - Peilin Song; Franco Stellari; Bill Huott; Otto Wagner; Uma Srinivasan; Yuen H. Chan; Rick Rizzolo; H. J. Nam; James P. Eckhardt; Timothy G. McNamara; Ching-Lung Tong; Alan J. Weger; et al. (Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, 2005)

Diagnosis in Modern Design to Volume - The Tip of the Iceberg - William V. Huott (Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, 2003)

99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor - Mary P. Kusko; Bryan J. Robbins; Timothy J. Koprowski; William V. Huott (Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001, 2001)

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA) - William V. Huott; Moyra K. McManus; Daniel R. Knebel; Steve Steen; Dennis Manzer; Pia N. Sanda; Steven C. Wilson; Yuen H. Chan; Antonio Pelella; Stanislav Polonsky (Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999, 1999)

Testing the 500-MHz IBM S/390 Microprocessor - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Mary P. Kusko; Bryan J. Robbins (IEEE Des. Test Comput., 1998)

Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip - Mary P. Kusko; Bryan J. Robbins; Thomas J. Snethen; Peilin Song; Thomas G. Foote; William V. Huott (Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, 1998)

Circuit design techniques for the high-performance CMOS IBM S/390 Parallel Enterprise Server G4 microprocessor - Leon J. Sigal; James D. Warnock; Brian W. Curran; Yuen H. Chan; Peter J. Camporese; Mark D. Mayo; William V. Huott; Daniel R. Knebel; Ching-Te Chuang; James P. Eckhardt; Philip T. Wu (IBM J. Res. Dev., 1997)

Advanced microprocessor test strategy and methodology - William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko; Stephen Pateras; Dale E. Hoffman; Timothy G. McNamara; Thomas J. Snethen (IBM J. Res. Dev., 1997)

A 4.1-ns compact 54 exttimes54-b multiplier utilizing sign-select Booth encoders - Charles F. Webb; Carl J. Anderson; Leon J. Sigal; Kenneth L. Shepard; John S. Liptay; James D. Warnock; Brian W. Curran; Barry Krumm; Mark D. Mayo; Peter J. Camporese; Eric M. Schwarz; Mark S. Farrell; et al. (IEEE J. Solid State Circuits, 1997)

Testing the 400-MHz IBM Generation-4 CMOS Chip - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko (Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, 1997)