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Robbert van Herpen
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2010 – 2019
- 2016
- [j4]Robbert van Herpen, Okko H. Bosgra, Tom Oomen:
Bi-Orthonormal Polynomial Basis Function Framework With Applications in System Identification. IEEE Trans. Autom. Control. 61(11): 3285-3300 (2016) - 2014
- [j3]Robbert van Herpen, Tom Oomen, Maarten Steinbuch:
Optimally conditioned instrumental variable approach for frequency-domain system identification. Autom. 50(9): 2281-2293 (2014) - [j2]Tom Oomen, Robbert van Herpen, Sander Quist, Marc M. J. van de Wal, Okko H. Bosgra, Maarten Steinbuch:
Connecting System Identification and Robust Control for Next-Generation Motion Control of a Wafer Stage. IEEE Trans. Control. Syst. Technol. 22(1): 102-118 (2014) - [c8]Robbert van Herpen, Tom Oomen, Edward Kikken, Marc M. J. van de Wal, Wouter H. T. M. Aangenent, Maarten Steinbuch:
Exploiting additional actuators and sensors for nano-positioning robust motion control. ACC 2014: 984-990 - 2013
- [c7]Frank Boeren, Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra:
Enhancing performance through multivariable weighting function design in ℋ- loop-shaping: with application to a motion system. ACC 2013: 6039-6044 - 2012
- [c6]Tom Oomen, Robbert van Herpen, Sander Quist, Marc M. J. van de Wal, Okko H. Bosgra, Maarten Steinbuch:
Next-generation wafer stage motion control: Connecting system identification and robust control. ACC 2012: 2455-2460 - [c5]Robbert van Herpen, Tom Oomen, Okko H. Bosgra:
Bi-orthonormal basis functions for improved frequency-domain system identification. CDC 2012: 3451-3456 - 2011
- [c4]Robbert van Herpen, Tom Oomen, Okko H. Bosgra:
A robust-control-relevant perspective on model order selection. ACC 2011: 1224-1229 - [c3]Tom Oomen, Erik Grassens, Ferdinand Hendriks, Robbert van Herpen, Okko H. Bosgra:
Inferential motion control: Identification and robust control with unmeasured performance variables. CDC/ECC 2011: 964-969 - 2010
- [c2]Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra:
Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage. ACC 2010: 3493-3499 - [c1]Tom Oomen, Sander Quist, Robbert van Herpen, Okko H. Bosgra:
Identification and visualization of robust-control-relevant model sets with application to an industrial wafer stage. CDC 2010: 5530-5535
2000 – 2009
- 2009
- [j1]Markus Koitka, Olaf Kahrs, Robbert van Herpen, Veit Hagenmeyer:
SISO-Closed-Loop Identifikation: Eine Toolbox für den Einsatz in der industriellen Praxis (SISO-Closed-Loop Identification: A Toolbox Ready-to-Use in Industrial Practice). Autom. 57(4): 177-186 (2009)
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